ATE285122T1 - CCD IMAGE RECORDING DEVICE WITH MULTIPLY REGISTER - Google Patents
CCD IMAGE RECORDING DEVICE WITH MULTIPLY REGISTERInfo
- Publication number
- ATE285122T1 ATE285122T1 AT98301428T AT98301428T ATE285122T1 AT E285122 T1 ATE285122 T1 AT E285122T1 AT 98301428 T AT98301428 T AT 98301428T AT 98301428 T AT98301428 T AT 98301428T AT E285122 T1 ATE285122 T1 AT E285122T1
- Authority
- AT
- Austria
- Prior art keywords
- register
- charge
- electrodes
- drive pulses
- multiplication
- Prior art date
Links
- 230000003321 amplification Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 238000003199 nucleic acid amplification method Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14806—Structural or functional details thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/72—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors using frame transfer [FT]
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
- Heat Treatment Of Strip Materials And Filament Materials (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
In a CCD imager 1, charge is accumulated in pixels of an image area 2 representative of the intensity of incident radiation and is subsequently transferred to a store section 3 and then on a row by row basis to an output register 4 by applying suitable drive pulses to electrodes 7 and 8. Signal charge in the output register 4 is transferred to a multiplication register 5 by drive pulses applied to electrodes 9 and 10 to give charge transfer in the direction shown by the arrows. One or more drive pulses applied to the electrodes of the multiplication register 5 are of sufficiently large amplitude to produce high field regions in the register element to cause signal multiplication by impact ionisation. This gives a low noise amplification of the signal charge, the multiplied signal charge being detected at charge detection circuit 6. <IMAGE>
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9705986A GB2323471B (en) | 1997-03-22 | 1997-03-22 | CCd imagers |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE285122T1 true ATE285122T1 (en) | 2005-01-15 |
Family
ID=10809702
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT98301428T ATE285122T1 (en) | 1997-03-22 | 1998-02-26 | CCD IMAGE RECORDING DEVICE WITH MULTIPLY REGISTER |
Country Status (6)
Country | Link |
---|---|
US (1) | US6444968B1 (en) |
EP (1) | EP0866501B1 (en) |
JP (1) | JP3862850B2 (en) |
AT (1) | ATE285122T1 (en) |
DE (1) | DE69828099T2 (en) |
GB (1) | GB2323471B (en) |
Families Citing this family (65)
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---|---|---|---|---|
JP4173575B2 (en) * | 1998-01-16 | 2008-10-29 | 浜松ホトニクス株式会社 | Imaging device |
GB9828166D0 (en) * | 1998-12-22 | 1999-02-17 | Eev Ltd | Imaging apparatus |
US6278142B1 (en) * | 1999-08-30 | 2001-08-21 | Isetex, Inc | Semiconductor image intensifier |
EP1152469B1 (en) * | 2000-04-28 | 2015-12-02 | Texas Instruments Japan Limited | High dynamic range charge readout system |
US7420605B2 (en) | 2001-01-18 | 2008-09-02 | E2V Technologies (Uk) Limited | Solid state imager arrangements |
GB2371403B (en) * | 2001-01-18 | 2005-07-27 | Marconi Applied Techn Ltd | Solid state imager arrangements |
US7139023B2 (en) * | 2001-03-12 | 2006-11-21 | Texas Instruments Incorporated | High dynamic range charge readout system |
US7190400B2 (en) * | 2001-06-04 | 2007-03-13 | Texas Instruments Incorporated | Charge multiplier with logarithmic dynamic range compression implemented in charge domain |
US6784412B2 (en) * | 2001-08-29 | 2004-08-31 | Texas Instruments Incorporated | Compact image sensor layout with charge multiplying register |
US6895077B2 (en) | 2001-11-21 | 2005-05-17 | University Of Massachusetts Medical Center | System and method for x-ray fluoroscopic imaging |
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US7436494B1 (en) | 2003-03-28 | 2008-10-14 | Irvine Sensors Corp. | Three-dimensional ladar module with alignment reference insert circuitry |
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US7078670B2 (en) * | 2003-09-15 | 2006-07-18 | Imagerlabs, Inc. | Low noise charge gain circuit and CCD using same |
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GB2413007A (en) * | 2004-04-07 | 2005-10-12 | E2V Tech Uk Ltd | Multiplication register for amplifying signal charge |
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US7378634B2 (en) * | 2004-07-27 | 2008-05-27 | Sarnoff Corporation | Imaging methods and apparatus having extended dynamic range |
US7522205B2 (en) * | 2004-09-10 | 2009-04-21 | Eastman Kodak Company | Image sensor with charge multiplication |
JP4807259B2 (en) | 2004-10-07 | 2011-11-02 | 株式会社島津製作所 | IMAGING ELEMENT, IMAGING DEVICE USING SAME, AND MANUFACTURING METHOD FOR MANUFACTURING IMAGING ELEMENT |
EP1817573A4 (en) * | 2004-10-18 | 2010-02-10 | Univ Macquarie | Fluorescence detection |
DE102004051201A1 (en) * | 2004-10-20 | 2006-05-11 | Leica Microsystems Cms Gmbh | EMCCD detector and a spectrometer and a microscope with an EMCCD detector |
US7391000B2 (en) | 2004-10-20 | 2008-06-24 | Leica Microsystems Cms Gmbh | EMCCD detector, as well as a spectrometer and a microscope having an EMCCD detector |
GB0501149D0 (en) * | 2005-01-20 | 2005-02-23 | Andor Technology Plc | Automatic calibration of electron multiplying CCds |
GB0503827D0 (en) | 2005-02-24 | 2005-04-06 | E2V Tech Uk Ltd | Enhanced spectral range imaging sensor |
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DE102005025641A1 (en) | 2005-06-03 | 2006-12-07 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Radiation detector for detecting low-intensity radiation |
GB2429521A (en) | 2005-08-18 | 2007-02-28 | E2V Tech | CCD device for time resolved spectroscopy |
GB2431538B (en) * | 2005-10-24 | 2010-12-22 | E2V Tech | CCD device |
JP2007175294A (en) * | 2005-12-28 | 2007-07-12 | Ge Medical Systems Global Technology Co Llc | Image sensor and the control method and x-ray detector and x-ray ct apparatus |
DE102006000976A1 (en) * | 2006-01-07 | 2007-07-12 | Leica Microsystems Cms Gmbh | Photosensor-chip e.g. charge coupled device-chip, calibrating device for use with laser scanning microscope, has controlling and/or regulating unit to determine and correct variances of light-sensitive units illuminated by light source |
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JP4835836B2 (en) | 2006-03-30 | 2011-12-14 | 日本電気株式会社 | Electron multiplication gain calibration mechanism and electron multiplication gain calibration method |
JP4759444B2 (en) * | 2006-06-05 | 2011-08-31 | 富士フイルム株式会社 | Method for driving CCD type solid-state imaging device, solid-state imaging device |
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US7485840B2 (en) | 2007-02-08 | 2009-02-03 | Dalsa Corporation | Semiconductor charge multiplication amplifier device and semiconductor image sensor provided with such an amplifier device |
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JP4851388B2 (en) | 2007-05-16 | 2012-01-11 | 浜松ホトニクス株式会社 | Imaging device |
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US7755685B2 (en) * | 2007-09-28 | 2010-07-13 | Sarnoff Corporation | Electron multiplication CMOS imager |
JP5438331B2 (en) * | 2009-01-30 | 2014-03-12 | 浜松ホトニクス株式会社 | Solid-state imaging device |
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JP5335459B2 (en) * | 2009-01-30 | 2013-11-06 | 浜松ホトニクス株式会社 | Solid-state image sensor with built-in electron multiplication function |
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JP2011243781A (en) | 2010-05-19 | 2011-12-01 | Hamamatsu Photonics Kk | Quantum cascade laser |
US8493491B2 (en) | 2010-12-14 | 2013-07-23 | Truesense Imaging, Inc. | Methods for processing an image captured by an image sensor having multiple output channels |
US8493492B2 (en) | 2010-12-14 | 2013-07-23 | Truesense Imaging, Inc. | Method of producing an image with pixel signals produced by an image sensor that includes multiple output channels |
US8773564B2 (en) | 2010-12-14 | 2014-07-08 | Truesense Imaging, Inc. | Image sensor with charge multiplication |
US8553126B2 (en) | 2010-12-14 | 2013-10-08 | Truesense Imaging, Inc. | Image sensor with charge multiplication |
US8479374B2 (en) | 2010-12-14 | 2013-07-09 | Truesense Imaging, Inc. | Method of producing an image sensor having multiple output channels |
US8800130B2 (en) | 2011-05-25 | 2014-08-12 | Truesense Imaging, Inc. | Methods for producing image sensors having multi-purpose architecture |
US8773563B2 (en) | 2011-05-25 | 2014-07-08 | Truesense Imaging, Inc. | Multi-purpose architecture for CCD image sensors |
US8411189B2 (en) | 2011-05-25 | 2013-04-02 | Truesense Imaging, Inc. | Multi-purpose architecture for CCD image sensors |
US9453914B2 (en) * | 2011-09-08 | 2016-09-27 | Continental Advanced Lidar Solutions Us, Inc. | Terrain mapping LADAR system |
GB2549330A (en) * | 2016-04-15 | 2017-10-18 | Teledyne E2V (Uk) Ltd | Image sensor |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3761744A (en) * | 1971-12-02 | 1973-09-25 | Bell Telephone Labor Inc | Semiconductor charge transfer devices |
JPS6233399A (en) | 1985-08-05 | 1987-02-13 | Hitachi Ltd | Ccd delay line |
JPS6386672A (en) * | 1986-09-30 | 1988-04-18 | Nec Corp | Conversion method for density of ccd image sensor |
US4912536A (en) * | 1988-04-15 | 1990-03-27 | Northrop Corporation | Charge accumulation and multiplication photodetector |
GB8901200D0 (en) * | 1989-01-19 | 1989-03-15 | Eev Ltd | Camera using imaging array |
DE69231482T2 (en) * | 1991-07-11 | 2001-05-10 | Texas Instruments Inc | Charge multiplication detector (CMD) suitable for a CCD image sensor with a small pixel size |
US5236871A (en) * | 1992-04-29 | 1993-08-17 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method for producing a hybridization of detector array and integrated circuit for readout |
JPH05335549A (en) * | 1992-06-01 | 1993-12-17 | Matsushita Electric Ind Co Ltd | Solid state image sensor and driving method therefor |
US5665959A (en) | 1995-01-13 | 1997-09-09 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Adminstration | Solid-state image sensor with focal-plane digital photon-counting pixel array |
-
1997
- 1997-03-22 GB GB9705986A patent/GB2323471B/en not_active Expired - Lifetime
-
1998
- 1998-02-26 DE DE69828099T patent/DE69828099T2/en not_active Expired - Lifetime
- 1998-02-26 AT AT98301428T patent/ATE285122T1/en active
- 1998-02-26 EP EP98301428A patent/EP0866501B1/en not_active Expired - Lifetime
- 1998-03-17 JP JP06648698A patent/JP3862850B2/en not_active Expired - Lifetime
-
2000
- 2000-11-20 US US09/715,029 patent/US6444968B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB2323471A (en) | 1998-09-23 |
GB2323471B (en) | 2002-04-17 |
EP0866501B1 (en) | 2004-12-15 |
EP0866501A1 (en) | 1998-09-23 |
DE69828099D1 (en) | 2005-01-20 |
GB9705986D0 (en) | 1997-05-07 |
DE69828099T2 (en) | 2005-11-03 |
JPH10304256A (en) | 1998-11-13 |
US6444968B1 (en) | 2002-09-03 |
JP3862850B2 (en) | 2006-12-27 |
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Legal Events
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UEP | Publication of translation of european patent specification |
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