ATE267415T1 - Qualitatsüberwachung bei einer fertigung - Google Patents

Qualitatsüberwachung bei einer fertigung

Info

Publication number
ATE267415T1
ATE267415T1 AT00908934T AT00908934T ATE267415T1 AT E267415 T1 ATE267415 T1 AT E267415T1 AT 00908934 T AT00908934 T AT 00908934T AT 00908934 T AT00908934 T AT 00908934T AT E267415 T1 ATE267415 T1 AT E267415T1
Authority
AT
Austria
Prior art keywords
average value
manufacturing
product
random sample
determining
Prior art date
Application number
AT00908934T
Other languages
German (de)
English (en)
Inventor
Richard Oechsner
Thomas Tschaftary
Piotr Strzyzewski
Lothar Pfitzner
Claus Schneider
Peter Hennig
Original Assignee
Fraunhofer Ges Forschung
X Fab Semiconductor Foundries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19902795A external-priority patent/DE19902795A1/de
Application filed by Fraunhofer Ges Forschung, X Fab Semiconductor Foundries filed Critical Fraunhofer Ges Forschung
Application granted granted Critical
Publication of ATE267415T1 publication Critical patent/ATE267415T1/de

Links

Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14—Quality control systems
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Factory Administration (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
AT00908934T 1999-01-15 2000-01-17 Qualitatsüberwachung bei einer fertigung ATE267415T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE19901410 1999-01-15
DE19901486 1999-01-17
DE19902795A DE19902795A1 (de) 1999-01-15 1999-01-25 Qualitätsüberwachung bei einer Fertigung mit breitem Produktspektrum
PCT/DE2000/000144 WO2000042480A1 (de) 1999-01-15 2000-01-17 Qualitatsüberwachung bei einer fertigung

Publications (1)

Publication Number Publication Date
ATE267415T1 true ATE267415T1 (de) 2004-06-15

Family

ID=27218921

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00908934T ATE267415T1 (de) 1999-01-15 2000-01-17 Qualitatsüberwachung bei einer fertigung

Country Status (5)

Country Link
US (1) US6622101B1 (enExample)
EP (1) EP1145088B1 (enExample)
JP (1) JP2002535744A (enExample)
AT (1) ATE267415T1 (enExample)
WO (1) WO2000042480A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG96658A1 (en) * 2001-11-08 2003-06-16 Sony Electronics Singapore Pte Dynamic quality control method
TWI286285B (en) * 2002-08-08 2007-09-01 Hon Hai Prec Ind Co Ltd A system and method for measuring an object
US6781096B2 (en) * 2002-08-09 2004-08-24 Matrix Innovations, Llc Apparatus and method for pattern-based control of a system
DE10253700B4 (de) * 2002-11-18 2005-11-17 Siemens Ag Verfahren zum Durchführen einer Qualitätskontrolle für einen Analyseprozess und Verwendung des Verfahrens
WO2005024795A2 (en) * 2003-09-05 2005-03-17 Sensitech Inc. Using location event information for supply chain process analysis
EP1542108A1 (de) * 2003-12-12 2005-06-15 Siemens Aktiengesellschaft Verfahren zur Überwachung einer technischen Einrichtung
US7465417B2 (en) * 2004-07-19 2008-12-16 Baxter International Inc. Parametric injection molding system and method
US20070091325A1 (en) * 2005-01-07 2007-04-26 Mehrdad Nikoonahad Multi-channel optical metrology
JP4207915B2 (ja) * 2005-01-24 2009-01-14 オムロン株式会社 品質変動表示装置、品質変動表示方法、品質変動表示プログラム及び該プログラムを記録した記録媒体
US7489980B2 (en) * 2005-08-09 2009-02-10 International Business Machines Corporation Factory level and tool level advanced process control systems integration implementation
US7113845B1 (en) 2005-08-09 2006-09-26 International Business Machines Corporation Integration of factory level and tool level advanced process control systems
JP2007102189A (ja) * 2005-09-07 2007-04-19 Ricoh Co Ltd 色ずれ補正装置、色ずれ補正方法、画像形成装置、色ずれ補正プログラム及び記録媒体
US20070067125A1 (en) * 2005-09-14 2007-03-22 Baptiste Guivarch Procedure of expertise of exhaustibility, of efficiency and of the feasibility of systems of traceability put in place on an industrial site, notably in the agro-food sector
US8374234B2 (en) * 2006-09-29 2013-02-12 Francis S. J. Munoz Digital scaling
JP6193916B2 (ja) 2015-05-25 2017-09-06 ファナック株式会社 射出成形システム
US10606254B2 (en) * 2016-09-14 2020-03-31 Emerson Process Management Power & Water Solutions, Inc. Method for improving process/equipment fault diagnosis
FR3101175B1 (fr) * 2019-09-24 2023-11-17 Thales Sa Procédé d'analyse de qualité de produits au moyen d'un banc de test, produit programme d'ordinateur et dispositif d'analyse associés

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4873623A (en) 1985-04-30 1989-10-10 Prometrix Corporation Process control interface with simultaneously displayed three level dynamic menu
US4967381A (en) 1985-04-30 1990-10-30 Prometrix Corporation Process control interface system for managing measurement data
US4679137A (en) 1985-04-30 1987-07-07 Prometrix Corporation Process control interface system for designer and operator
US4951190A (en) 1985-04-30 1990-08-21 Prometrix Corporation Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system
US4805089A (en) 1985-04-30 1989-02-14 Prometrix Corporation Process control interface system for managing measurement data
US4843538A (en) 1985-04-30 1989-06-27 Prometrix Corporation Multi-level dynamic menu which suppresses display of items previously designated as non-selectable
US5225998A (en) 1990-03-26 1993-07-06 At&T Bell Laboratories Quality control using multi-process performance analysis
US5479340A (en) * 1993-09-20 1995-12-26 Sematech, Inc. Real time control of plasma etch utilizing multivariate statistical analysis
US5440478A (en) * 1994-02-22 1995-08-08 Mercer Forge Company Process control method for improving manufacturing operations
GB9404536D0 (en) 1994-03-09 1994-04-20 Kodak Ltd Process verification in photographic processes
US5715181A (en) 1995-04-03 1998-02-03 Horst; Robert L. Isogrammetric analysis method for high-yield processes
GB2303720B (en) * 1995-07-25 2000-03-08 Kodak Ltd Reject Analysis
GB2309800B (en) 1996-02-03 1999-07-28 Kodak Ltd A method of controlling the effect of raw materials on manufacturability
TW364956B (en) 1996-10-21 1999-07-21 Nxp Bv Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products
JP3897922B2 (ja) * 1998-12-15 2007-03-28 株式会社東芝 半導体装置の製造方法、及びコンピュ−タ読取り可能な記録媒体

Also Published As

Publication number Publication date
WO2000042480A1 (de) 2000-07-20
US6622101B1 (en) 2003-09-16
JP2002535744A (ja) 2002-10-22
EP1145088B1 (de) 2004-05-19
EP1145088A1 (de) 2001-10-17

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