ATE240529T1 - Breitband-isolationseinrichtung - Google Patents
Breitband-isolationseinrichtungInfo
- Publication number
- ATE240529T1 ATE240529T1 AT98960663T AT98960663T ATE240529T1 AT E240529 T1 ATE240529 T1 AT E240529T1 AT 98960663 T AT98960663 T AT 98960663T AT 98960663 T AT98960663 T AT 98960663T AT E240529 T1 ATE240529 T1 AT E240529T1
- Authority
- AT
- Austria
- Prior art keywords
- optical
- transmitter unit
- signal
- electro
- microprocessor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Element Separation (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Microwave Amplifiers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/988,865 US6028423A (en) | 1997-12-11 | 1997-12-11 | Isolation instrument for electrical testing |
PCT/US1998/025612 WO1999030172A2 (en) | 1997-12-11 | 1998-12-03 | Wideband isolation system |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE240529T1 true ATE240529T1 (de) | 2003-05-15 |
Family
ID=25534557
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT98960663T ATE240529T1 (de) | 1997-12-11 | 1998-12-03 | Breitband-isolationseinrichtung |
Country Status (6)
Country | Link |
---|---|
US (1) | US6028423A (de) |
EP (1) | EP1038185B1 (de) |
AT (1) | ATE240529T1 (de) |
AU (1) | AU1621099A (de) |
DE (1) | DE69814681T2 (de) |
WO (1) | WO1999030172A2 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6446867B1 (en) * | 1995-11-22 | 2002-09-10 | Jorge Sanchez | Electro-optic interface system and method of operation |
US6494370B1 (en) * | 1997-12-11 | 2002-12-17 | Ceyx Technologies | Electro-optic system controller and method of operation |
DE19823587A1 (de) * | 1998-05-27 | 1999-12-02 | Alcatel Sa | Optische Verbindung sowie Verbindungseinheit zum Austausch von Daten zwischen Geräten |
US6219812B1 (en) * | 1998-06-11 | 2001-04-17 | Sun Microsystems, Inc. | Apparatus and method for interfacing boundary-scan circuitry with DTL output drivers |
US6529020B1 (en) | 2000-11-15 | 2003-03-04 | Ge Fanuc Automation North America, Inc. | Methods and systems for automated emissions measuring |
US20020178319A1 (en) * | 2001-05-24 | 2002-11-28 | Jorge Sanchez-Olea | Optical bus arrangement for computer system |
AU2002360703A1 (en) * | 2001-12-27 | 2003-07-24 | Ceyx Technologies, Inc. | Laser optics integrated control system and method of operation |
AU2003202238A1 (en) | 2003-01-08 | 2004-08-10 | Ceyx Technologies, Inc. | Apparatus and method for measurement of dynamic laser signals |
US7035167B2 (en) * | 2003-09-11 | 2006-04-25 | General Phosphorix | Seismic sensor |
US7049843B2 (en) * | 2004-03-10 | 2006-05-23 | Tektronix, Inc. | Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages |
US8244234B2 (en) * | 2007-08-01 | 2012-08-14 | Research In Motion Limited | System and method of measuring total radiated power from mobile wireless communications device |
JP5049887B2 (ja) * | 2008-03-05 | 2012-10-17 | 株式会社フジクラ | 光伝送装置 |
US20120313655A1 (en) * | 2011-06-10 | 2012-12-13 | Associated Research, Inc. | Electrical test equipment having switchable intermediate-voltage line- leakage and run test power source |
US9453868B2 (en) | 2012-03-23 | 2016-09-27 | Mitsubishi Electric Corporation | Test device, test method, and program |
US9209593B2 (en) * | 2013-12-18 | 2015-12-08 | Tektronix, Inc. | Method of controlling electro-optical probe gain and sensitivity |
CN104007339A (zh) * | 2014-05-16 | 2014-08-27 | 中国空间技术研究院 | 一种采用远距离传输方式的光电耦合器电参数在线测试系统及其方法 |
RU2556033C1 (ru) * | 2014-05-29 | 2015-07-10 | Общество с ограниченной ответственностью Научно-производственное предприятие "ЭКРА" | Способ автоматического ограничения повышения напряжения высоковольтного оборудования |
WO2015185133A1 (en) * | 2014-06-04 | 2015-12-10 | Telefonaktiebolaget L M Ericsson (Publ) | An optical electrical measurement system, a measurement probe and a method therefor |
US10060981B2 (en) * | 2014-12-03 | 2018-08-28 | Power ProbeTeK, LLC | Diagnostic circuit test device |
US10067165B2 (en) | 2015-09-04 | 2018-09-04 | Ford Global Technologies, Llc | Isolated differential voltage probe for EMI noise source |
US10274542B1 (en) * | 2018-11-27 | 2019-04-30 | Professional Generator Testers LLC | Electrical generator testing appliance |
US11630131B2 (en) * | 2021-07-14 | 2023-04-18 | The United States Of America As Represented By The Secretary Of The Army | Electrically-isolated high-voltage sensor with low power dissipation |
CN113917213B (zh) * | 2021-09-17 | 2024-04-12 | 威凯检测技术有限公司 | 一种用于核查传导骚扰抗扰度测试系统的电压表 |
EP4280480A1 (de) * | 2022-05-18 | 2023-11-22 | FenztraQ GmbH | Vorrichtung, system und verfahren zum testen einer kommunikationsvorrichtung |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3346811A (en) * | 1964-02-24 | 1967-10-10 | Allis Chalmers Mfg Co | Means for sensing conditions in high potential region and for transmitting such intelligence by light means to low potential regions |
SE413808B (sv) * | 1978-09-22 | 1980-06-23 | Asea Ab | Metdon for overforing av metsignaler via en optisk lenk |
US4290297A (en) * | 1979-05-14 | 1981-09-22 | Rousemount Inc. | Optically coupled calibrator for transmitters |
US4734873A (en) * | 1984-02-02 | 1988-03-29 | Honeywell Inc. | Method of digital process variable transmitter calibration and a process variable transmitter system utilizing the same |
US4677536A (en) * | 1986-03-17 | 1987-06-30 | Tektronix, Inc. | AC Current sensing circuit |
US4758779A (en) * | 1986-04-07 | 1988-07-19 | Tektronix, Inc. | Probe body for an electrical measurement system |
JP3175935B2 (ja) * | 1987-09-30 | 2001-06-11 | 株式会社東芝 | 光ファイバ応用センサ |
US4939446A (en) * | 1988-03-30 | 1990-07-03 | Rogers Wesley A | Voltage transmission link for testing EMI susceptibility of a device or circuits |
US4875006A (en) * | 1988-09-01 | 1989-10-17 | Photon Dynamics, Inc. | Ultra-high-speed digital test system using electro-optic signal sampling |
US5107202A (en) * | 1989-10-23 | 1992-04-21 | Trustees Of Princeton University | Fiber optic current monitor for high-voltage applications |
US4996478A (en) * | 1990-01-05 | 1991-02-26 | Tektronix, Inc. | Apparatus for connecting an IC device to a test system |
US5181026A (en) * | 1990-01-12 | 1993-01-19 | Granville Group, Inc., The | Power transmission line monitoring system |
US5136237A (en) * | 1991-01-29 | 1992-08-04 | Tektronix, Inc. | Double insulated floating high voltage test probe |
US5414345A (en) * | 1991-04-29 | 1995-05-09 | Electronic Development, Inc. | Apparatus and method for low cost electromagnetic field susceptibility testing |
US5164662A (en) * | 1991-07-22 | 1992-11-17 | Westinghouse Electric Corp. | Detection of radio frequency emissions |
US5311116A (en) * | 1992-04-02 | 1994-05-10 | Electronic Development, Inc. | Multi-channel electromagnetically transparent voltage waveform monitor link |
JPH06222087A (ja) * | 1993-01-27 | 1994-08-12 | Hamamatsu Photonics Kk | 電圧検出装置 |
DE19507809C2 (de) * | 1995-03-06 | 1998-05-20 | Gunter Dipl Ing Langer | Meßverfahren zur Erfassung pulsförmiger Störgrößen |
DE29514423U1 (de) * | 1995-09-08 | 1995-11-02 | Langer, Gunter, Dipl.-Ing., 01728 Bannewitz | EMV-Kompaktsensor |
-
1997
- 1997-12-11 US US08/988,865 patent/US6028423A/en not_active Expired - Lifetime
-
1998
- 1998-12-03 AT AT98960663T patent/ATE240529T1/de not_active IP Right Cessation
- 1998-12-03 DE DE69814681T patent/DE69814681T2/de not_active Expired - Lifetime
- 1998-12-03 AU AU16210/99A patent/AU1621099A/en not_active Abandoned
- 1998-12-03 WO PCT/US1998/025612 patent/WO1999030172A2/en active IP Right Grant
- 1998-12-03 EP EP98960663A patent/EP1038185B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69814681D1 (de) | 2003-06-18 |
US6028423A (en) | 2000-02-22 |
EP1038185B1 (de) | 2003-05-14 |
WO1999030172B1 (en) | 1999-11-11 |
EP1038185A2 (de) | 2000-09-27 |
WO1999030172A3 (en) | 1999-10-07 |
WO1999030172A2 (en) | 1999-06-17 |
DE69814681T2 (de) | 2004-04-01 |
AU1621099A (en) | 1999-06-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |