ATE218760T1 - Elektrisches verbindungskontaktsystem - Google Patents

Elektrisches verbindungskontaktsystem

Info

Publication number
ATE218760T1
ATE218760T1 AT95309283T AT95309283T ATE218760T1 AT E218760 T1 ATE218760 T1 AT E218760T1 AT 95309283 T AT95309283 T AT 95309283T AT 95309283 T AT95309283 T AT 95309283T AT E218760 T1 ATE218760 T1 AT E218760T1
Authority
AT
Austria
Prior art keywords
contact
elastomeric element
housing
lead
trough
Prior art date
Application number
AT95309283T
Other languages
English (en)
Inventor
David A Johnson
Original Assignee
Johnstech Int Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnstech Int Corp filed Critical Johnstech Int Corp
Application granted granted Critical
Publication of ATE218760T1 publication Critical patent/ATE218760T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
    • H05K7/103—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers
    • H05K7/1046—J-shaped leads
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Cable Accessories (AREA)
  • Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
  • Conductive Materials (AREA)
  • Multi-Conductor Connections (AREA)
AT95309283T 1994-12-22 1995-12-20 Elektrisches verbindungskontaktsystem ATE218760T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/362,206 US5634801A (en) 1991-01-09 1994-12-22 Electrical interconnect contact system

Publications (1)

Publication Number Publication Date
ATE218760T1 true ATE218760T1 (de) 2002-06-15

Family

ID=23425121

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95309283T ATE218760T1 (de) 1994-12-22 1995-12-20 Elektrisches verbindungskontaktsystem

Country Status (8)

Country Link
US (1) US5634801A (de)
EP (1) EP0718917B1 (de)
JP (1) JP2788622B2 (de)
AT (1) ATE218760T1 (de)
DE (1) DE69526912T2 (de)
DK (1) DK0718917T3 (de)
ES (1) ES2177615T3 (de)
PT (1) PT718917E (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5634801A (en) 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5947749A (en) * 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
MY128129A (en) * 1997-09-16 2007-01-31 Tan Yin Leong Electrical contactor for testing integrated circuit devices
PT1038186E (pt) * 1998-10-10 2005-08-31 Un-Young Chung Tomada de teste
US6350153B1 (en) 2000-06-16 2002-02-26 Leeno Ind Inc Electrical connector for connecting an integrated circuit to a printed circuit board
JP3578708B2 (ja) * 2000-08-28 2004-10-20 Ｎｅｃセミコンダクターズ九州株式会社 Ｉｃソケット
US6302727B1 (en) 2000-09-08 2001-10-16 Telefonaktiebolaget, L.M. Ericsson Multi-axis connectors and electronic devices incorporating same
US6558181B2 (en) 2000-12-29 2003-05-06 Intel Corporation System and method for package socket with embedded power and ground planes
US6854981B2 (en) * 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) * 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
US20060019508A1 (en) * 2004-04-27 2006-01-26 Ronmee Industrial Corporation Terminal formation for socket employed on CPU
JP4905872B2 (ja) * 2005-02-18 2012-03-28 日本発條株式会社 導電性接触子ユニット
US7445465B2 (en) * 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7639026B2 (en) * 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US20080293308A1 (en) * 2007-05-24 2008-11-27 Tribotek, Inc. Pivoting wafer connector
JP2009043591A (ja) * 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット
US7806699B2 (en) * 2008-01-31 2010-10-05 Methode Electornics, Inc. Wound coil compression connector
US7547215B1 (en) 2008-01-31 2009-06-16 Methode Electronics, Inc. Round connector with spring helix
US7794235B2 (en) 2008-01-31 2010-09-14 Methode Electronics, Inc. Continuous wireform connector
US7806737B2 (en) * 2008-02-04 2010-10-05 Methode Electronics, Inc. Stamped beam connector
JP5029969B2 (ja) * 2008-11-12 2012-09-19 山一電機株式会社 電気接続装置
DE102010019955A1 (de) 2010-02-03 2011-08-04 Eutegra Ag, 60325 Elektrische Kontaktiereinrichtung
US9274141B1 (en) 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
USD727269S1 (en) 2014-01-29 2015-04-21 Johnstech International Corporation Articulating contact pin
US9354251B2 (en) * 2014-02-25 2016-05-31 Titan Semiconductor Tool, LLC Integrated circuit (IC) test socket using Kelvin bridge
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
DE102015115657B3 (de) * 2015-09-17 2017-02-09 Harting Ag & Co. Kg elektrisches Kontaktelement

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DE2119567C2 (de) * 1970-05-05 1983-07-14 International Computers Ltd., London Elektrische Verbindungsvorrichtung und Verfahren zu ihrer Herstellung
GB1539470A (en) * 1975-11-13 1979-01-31 Tektronix Inc Electrical connector
JPS5555985U (de) * 1978-10-12 1980-04-16
JPS568081U (de) * 1979-06-29 1981-01-23
JPS56116282A (en) * 1980-02-19 1981-09-11 Sharp Kk Electronic part with plural terminals
FR2477324A1 (fr) * 1980-02-28 1981-09-04 Dassault Electronique Dispositif de contact electrique pour appareil de traitement de cartes electroniques
FR2495846A1 (fr) * 1980-12-05 1982-06-11 Cii Honeywell Bull Dispositif de connexion electrique a haute densite de contacts
US4506938A (en) * 1982-07-06 1985-03-26 At&T Bell Laboratories Integrated circuit chip carrier mounting arrangement
US4598246A (en) * 1982-09-08 1986-07-01 Pylon Company, Inc. Printed circuit board tester having a flex and wiping action free vacuum actuated edge connector
US4511197A (en) * 1983-08-01 1985-04-16 Amp Incorporated High density contact assembly
US4686467A (en) * 1984-03-21 1987-08-11 Dit-Mco International Corp. Circuit board testing system
US4866374A (en) * 1984-10-12 1989-09-12 Daymarc Corporation Contactor assembly for testing integrated circuits
US4633175A (en) * 1984-11-23 1986-12-30 Avx Corporation Testing method and apparatus for electronic components
US4593961A (en) * 1984-12-20 1986-06-10 Amp Incorporated Electrical compression connector
US4634199A (en) * 1985-01-22 1987-01-06 Itt Corporation Connector assembly for making multiple connections in a thin space
US4664458A (en) * 1985-09-19 1987-05-12 C W Industries Printed circuit board connector
US4793814A (en) * 1986-07-21 1988-12-27 Rogers Corporation Electrical circuit board interconnect
EP0255541A4 (de) * 1986-01-15 1988-04-26 Rogers Corp Verbindng von elektrischen schaltplatten.
US4943768A (en) * 1986-12-12 1990-07-24 Mitsubishi Denki Kabushiki Kaisha Testing device for electrical circuit boards
US4835464A (en) * 1987-04-23 1989-05-30 Micro Component Technology, Inc. Decoupling apparatus for use with integrated circuit tester
US4800335A (en) * 1987-05-28 1989-01-24 Zenith Electronics Corporation Test fixture for circuit components on circuit boards
US4870353A (en) * 1987-12-30 1989-09-26 Hewlett-Packard Pre-loaded compression spring assembly
US4950980A (en) * 1988-07-29 1990-08-21 Pfaff Wayne Test socket for electronic device packages
US4929892A (en) * 1989-02-09 1990-05-29 Hughes Aircraft Company Process for electrically testing a component in transit to assembly and component test chuck
US4998886A (en) * 1989-07-07 1991-03-12 Teledyne Kinetics High density stacking connector
US5049084A (en) * 1989-12-05 1991-09-17 Rogers Corporation Electrical circuit board interconnect
US5207584A (en) * 1991-01-09 1993-05-04 Johnson David A Electrical interconnect contact system
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5388996A (en) * 1991-01-09 1995-02-14 Johnson; David A. Electrical interconnect contact system
US5634801A (en) 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5139427A (en) * 1991-09-23 1992-08-18 Amp Incorporated Planar array connector and flexible contact therefor
US5137456A (en) * 1991-11-04 1992-08-11 International Business Machines Corporation High density, separable connector and contact for use therein
JP2807171B2 (ja) * 1993-05-03 1998-10-08 デビット エー．ジョンソン 電気的相互接続コンタクト装置
US5336094A (en) * 1993-06-30 1994-08-09 Johnstech International Corporation Apparatus for interconnecting electrical contacts

Also Published As

Publication number Publication date
DK0718917T3 (da) 2002-10-07
DE69526912D1 (de) 2002-07-11
EP0718917A2 (de) 1996-06-26
DE69526912T2 (de) 2003-03-20
EP0718917A3 (de) 1997-07-09
US5634801A (en) 1997-06-03
JPH08236237A (ja) 1996-09-13
EP0718917B1 (de) 2002-06-05
PT718917E (pt) 2002-11-29
ES2177615T3 (es) 2002-12-16
JP2788622B2 (ja) 1998-08-20

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee