ATE166972T1 - Steuersystem für abtastsonde - Google Patents

Steuersystem für abtastsonde

Info

Publication number
ATE166972T1
ATE166972T1 AT92101379T AT92101379T ATE166972T1 AT E166972 T1 ATE166972 T1 AT E166972T1 AT 92101379 T AT92101379 T AT 92101379T AT 92101379 T AT92101379 T AT 92101379T AT E166972 T1 ATE166972 T1 AT E166972T1
Authority
AT
Austria
Prior art keywords
probe
control system
predetermined direction
physical phenomenon
scanning probe
Prior art date
Application number
AT92101379T
Other languages
English (en)
Inventor
Shun-Ichi Shido
Toshihiko Miyazaki
Kunihiro Sakai
Takahiro Oguchi
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP02934991A external-priority patent/JP3169227B2/ja
Priority claimed from JP2935091A external-priority patent/JPH04252904A/ja
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE166972T1 publication Critical patent/ATE166972T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/02—Coarse scanning or positioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process
    • Y10S977/851—Particular movement or positioning of scanning tip

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Vehicle Body Suspensions (AREA)
  • Microscoopes, Condenser (AREA)
AT92101379T 1991-01-29 1992-01-28 Steuersystem für abtastsonde ATE166972T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP02934991A JP3169227B2 (ja) 1991-01-29 1991-01-29 探針移動装置
JP2935091A JPH04252904A (ja) 1991-01-29 1991-01-29 探針移動装置

Publications (1)

Publication Number Publication Date
ATE166972T1 true ATE166972T1 (de) 1998-06-15

Family

ID=26367539

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92101379T ATE166972T1 (de) 1991-01-29 1992-01-28 Steuersystem für abtastsonde

Country Status (5)

Country Link
US (1) US5414690A (de)
EP (1) EP0497288B1 (de)
AT (1) ATE166972T1 (de)
CA (1) CA2059990C (de)
DE (1) DE69225724T2 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3053986B2 (ja) * 1993-01-21 2000-06-19 キヤノン株式会社 記録再生装置
US6353219B1 (en) 1994-07-28 2002-03-05 Victor B. Kley Object inspection and/or modification system and method
US6339217B1 (en) * 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
WO1998034092A2 (en) * 1997-01-21 1998-08-06 Rave, L.L.C. Object inspection and/or modification system and method
US5751683A (en) * 1995-07-24 1998-05-12 General Nanotechnology, L.L.C. Nanometer scale data storage device and associated positioning system
US6520005B2 (en) * 1994-12-22 2003-02-18 Kla-Tencor Corporation System for sensing a sample
US5948972A (en) * 1994-12-22 1999-09-07 Kla-Tencor Corporation Dual stage instrument for scanning a specimen
US5614712A (en) * 1995-03-24 1997-03-25 Quesant Instrument Corporation Method of engaging the scanning probe of a scanning probe microscope with a sample surface
US5874668A (en) 1995-10-24 1999-02-23 Arch Development Corporation Atomic force microscope for biological specimens
US5773824A (en) * 1997-04-23 1998-06-30 International Business Machines Corporation Method for improving measurement accuracy using active lateral scanning control of a probe
US5801381A (en) * 1997-05-21 1998-09-01 International Business Machines Corporation Method for protecting a probe tip using active lateral scanning control
US5902928A (en) * 1997-06-02 1999-05-11 International Business Machines Corporation Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator
US6787768B1 (en) 2001-03-08 2004-09-07 General Nanotechnology Llc Method and apparatus for tool and tip design for nanomachining and measurement
US6802646B1 (en) * 2001-04-30 2004-10-12 General Nanotechnology Llc Low-friction moving interfaces in micromachines and nanomachines
US6923044B1 (en) 2001-03-08 2005-08-02 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US6752008B1 (en) 2001-03-08 2004-06-22 General Nanotechnology Llc Method and apparatus for scanning in scanning probe microscopy and presenting results
US7196328B1 (en) 2001-03-08 2007-03-27 General Nanotechnology Llc Nanomachining method and apparatus
US6518570B1 (en) 1998-04-03 2003-02-11 Brookhaven Science Associates Sensing mode atomic force microscope
WO2000020823A2 (en) * 1998-10-07 2000-04-13 Massachusetts Institute Of Technology Atomic force microscope for profiling high aspect ratio samples
EP1196939A4 (de) * 1999-07-01 2002-09-18 Gen Nanotechnology Llc Vorrichtung und verfahren zur untersuchung und/oder veränderungsobjekt
US6473708B1 (en) * 1999-12-20 2002-10-29 Bechtel Bwxt Idaho, Llc Device and method for self-verifying temperature measurement and control
US6931710B2 (en) * 2001-01-30 2005-08-23 General Nanotechnology Llc Manufacturing of micro-objects such as miniature diamond tool tips
US7253407B1 (en) 2001-03-08 2007-08-07 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US7053369B1 (en) 2001-10-19 2006-05-30 Rave Llc Scan data collection for better overall data accuracy
US6813937B2 (en) 2001-11-28 2004-11-09 General Nanotechnology Llc Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
JP2005538855A (ja) * 2002-09-09 2005-12-22 ジェネラル ナノテクノロジー エルエルシー 走査型プローブ顕微鏡の流体送達
GB0801900D0 (en) * 2008-02-01 2008-03-12 Imp Innovations Ltd Scanning probe microscopy

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2556491B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 記録装置及び記録法
JP2556492B2 (ja) * 1986-12-24 1996-11-20 キヤノン株式会社 再生装置及び再生法
DE3752099T2 (de) * 1986-12-24 1997-11-13 Canon Kk Aufzeichnungsgerät und Wiedergabegerät
EP0307211A3 (de) * 1987-09-10 1991-05-15 Seiko Instruments Inc. Speicher-Lesegerät
EP0338083B1 (de) * 1987-10-09 1995-02-22 Hitachi, Ltd. Rastertunnelmikroskop mit einer Vorrichtung zum Berichtigen von Oberflächendaten
JP2936545B2 (ja) * 1988-06-24 1999-08-23 株式会社日立製作所 走査プローブ顕微鏡
US5229606A (en) * 1989-06-05 1993-07-20 Digital Instruments, Inc. Jumping probe microscope
US5059793A (en) * 1989-10-04 1991-10-22 Olympus Optical Co., Ltd. Scanning tunneling microscope having proper servo control function

Also Published As

Publication number Publication date
EP0497288B1 (de) 1998-06-03
CA2059990C (en) 1997-11-25
EP0497288A2 (de) 1992-08-05
DE69225724D1 (de) 1998-07-09
DE69225724T2 (de) 1999-01-14
EP0497288A3 (en) 1993-04-14
CA2059990A1 (en) 1992-07-30
US5414690A (en) 1995-05-09

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