ATE149683T1 - Gaszelle mit konstantem druck - Google Patents
Gaszelle mit konstantem druckInfo
- Publication number
- ATE149683T1 ATE149683T1 AT93918413T AT93918413T ATE149683T1 AT E149683 T1 ATE149683 T1 AT E149683T1 AT 93918413 T AT93918413 T AT 93918413T AT 93918413 T AT93918413 T AT 93918413T AT E149683 T1 ATE149683 T1 AT E149683T1
- Authority
- AT
- Austria
- Prior art keywords
- gas
- gas cell
- pressure
- constant pressure
- pressure gas
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
- G01N2021/151—Gas blown
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/391—Intracavity sample
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/651—Cuvettes therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
- G01N2021/8578—Gaseous flow
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/121—Correction signals
- G01N2201/1218—Correction signals for pressure variations
Landscapes
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Optical Measuring Cells (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/922,874 US5245405A (en) | 1990-05-11 | 1992-07-31 | Constant pressure gas cell |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE149683T1 true ATE149683T1 (de) | 1997-03-15 |
Family
ID=25447691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT93918413T ATE149683T1 (de) | 1992-07-31 | 1993-07-27 | Gaszelle mit konstantem druck |
Country Status (7)
Country | Link |
---|---|
US (1) | US5245405A (de) |
EP (1) | EP0653057B1 (de) |
JP (1) | JPH08500180A (de) |
AT (1) | ATE149683T1 (de) |
CA (1) | CA2140534A1 (de) |
DE (1) | DE69308566T2 (de) |
WO (1) | WO1994003794A1 (de) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5452084A (en) * | 1993-03-29 | 1995-09-19 | Albion Instruments, Inc. | Method and apparatus for zero-calibration of a raman spectroscopy system |
US5533512A (en) * | 1994-03-18 | 1996-07-09 | Ohmeda Inc. | Method and apparatus for detection of venous air emboli |
US5521703A (en) * | 1994-10-17 | 1996-05-28 | Albion Instruments, Inc. | Diode laser pumped Raman gas analysis system with reflective hollow tube gas cell |
US5596404A (en) * | 1994-12-30 | 1997-01-21 | Albion Instruments, Inc. | Raman gas analysis system with flexible web and differential thread for precision optical alignment |
US5650856A (en) * | 1995-06-16 | 1997-07-22 | Brown University Research Foundation | Fiber laser intra-cavity spectroscope |
US5703683A (en) * | 1996-05-28 | 1997-12-30 | Ohmeda Inc. | Extruded wobble plate optical alignment device |
US5929981A (en) * | 1996-06-18 | 1999-07-27 | Ohmeda Inc. | System for monitoring contamination of optical elements in a Raman gas analyzer |
US5673109A (en) * | 1996-07-10 | 1997-09-30 | Ohmeda Inc. | System and method for increasing the efficiency of a raman gas analysis system |
US6222860B1 (en) | 1999-01-07 | 2001-04-24 | Hewlett-Packard Company | Laser system tolerating disturbances using multiple modes |
US6646386B1 (en) * | 1999-07-20 | 2003-11-11 | Tokyo Electron Limited | Stabilized oscillator circuit for plasma density measurement |
US6741944B1 (en) * | 1999-07-20 | 2004-05-25 | Tokyo Electron Limited | Electron density measurement and plasma process control system using a microwave oscillator locked to an open resonator containing the plasma |
US6861844B1 (en) | 1999-07-21 | 2005-03-01 | Tokyo Electron Limited | Electron density measurement and plasma process control system using changes in the resonant frequency of an open resonator containing the plasma |
US6516656B1 (en) | 1999-12-28 | 2003-02-11 | Honda Giken Kogyo Kabushiki Kaisha | System for vehicle emission sampling and measurement |
US6346142B1 (en) | 1999-12-28 | 2002-02-12 | Honda Giken Kogyo Kabushiki Kaisha | System for removing water from a gaseous sample |
US8994947B2 (en) * | 2001-03-19 | 2015-03-31 | Pranalytica, Inc. | Diagnostic method for high sensitivity detection of component concentrations in human gas emissions |
US20040142484A1 (en) | 2002-09-30 | 2004-07-22 | Intel Corporation | Spectroscopic analysis system and method |
US7749446B2 (en) * | 2004-10-02 | 2010-07-06 | Peterman Jr John William | Optimized gas cell |
US7333197B2 (en) * | 2004-11-17 | 2008-02-19 | Honeywell International Inc. | Raman detection based flow cytometer |
DE102005040661B3 (de) * | 2005-08-26 | 2006-12-28 | Leica Microsystems Semiconductor Gmbh | Koordinatenmessvorrichtung |
EP2175889A1 (de) * | 2007-07-02 | 2010-04-21 | CaridianBCT Biotechnologies, LLC | Gerät zur photoreduktion von verunreinigungen in blut und blutprodukten mit kalibrationsmitteln |
US8794049B1 (en) * | 2011-01-26 | 2014-08-05 | Marci Norkin | Real-time monitor for wine fermentation |
GB2465173B (en) * | 2008-11-06 | 2011-06-29 | Nviro Cleantech Ltd | Fluid decontamination apparatus and method |
EP2496379B1 (de) * | 2009-11-03 | 2017-01-04 | The Secretary, Department Of Atomic Energy, Govt. of India | Verfahren zur herstellung auf niobium basierender supraleitender hochfrequenzresonatoren durch laserschweissen |
WO2013154732A1 (en) * | 2012-04-11 | 2013-10-17 | President And Fellows Of Harvard College | Buffer gas cooling and mixture analysis |
JP2014228276A (ja) * | 2013-05-17 | 2014-12-08 | アズビル株式会社 | 粒子検出装置及び粒子の検出方法 |
US11175218B2 (en) * | 2017-04-21 | 2021-11-16 | Shimadzu Corporation | Flow cell and detector equipped with the flow cell |
DK3781929T3 (da) * | 2018-04-20 | 2022-09-12 | Flo2R Aps | Gasanalysatorsystem |
MX2021000001A (es) * | 2018-07-03 | 2021-02-18 | Global Analyzer Systems Ltd | Celda de sensor optico de alta finura, auto alineada. |
US20200378892A1 (en) * | 2019-05-28 | 2020-12-03 | Si-Ware Systems | Integrated device for fluid analysis |
CN115184100B (zh) * | 2022-09-08 | 2022-11-25 | 江苏永信医疗科技有限公司 | 一种低紊流手术室空气质量监测取样装置及其使用方法 |
Family Cites Families (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3519356A (en) * | 1967-04-07 | 1970-07-07 | Sperry Rand Corp | Ring laser flow meter with means to compensate for changes of refractive index of the flowing medium |
US3515482A (en) * | 1967-06-27 | 1970-06-02 | Us Navy | Aerosol photometer with improved electronic circuitry |
NL7013121A (de) * | 1969-09-17 | 1971-03-19 | ||
US3833305A (en) * | 1969-09-17 | 1974-09-03 | Commercial Electronics Inc | Gas analyzing apparatus |
US3826577A (en) * | 1972-12-07 | 1974-07-30 | Commercial Electronics Inc | Gas analyzing apparatus |
US3998557A (en) * | 1974-06-03 | 1976-12-21 | Massachusetts Institute Of Technology | Gas detector |
US4071298A (en) * | 1974-06-27 | 1978-01-31 | Stanford Research Institute | Laser Raman/fluorescent device for analyzing airborne particles |
US4068125A (en) * | 1975-02-18 | 1978-01-10 | Diax Corporation | Laser absorption spectroscopy employing varying absorption conditions |
US4044257A (en) * | 1975-02-20 | 1977-08-23 | Diax Corporation | Retention time chromatograph employing an IR absorption spectrographic detector |
US4113386A (en) * | 1976-09-20 | 1978-09-12 | Climet Instruments Company | Photometer |
US4225243A (en) * | 1978-06-26 | 1980-09-30 | Measurex Corporation | Gas measuring apparatus with standardization means, and method therefor |
US4277131A (en) * | 1980-01-29 | 1981-07-07 | The United States Of America As Represented By The Administrator Of The United States Environmental Protection Agency | Antifouling window assembly |
US4302206A (en) * | 1980-10-31 | 1981-11-24 | Olin Corporation | Apparatus and process for analysis of gaseous nitrogen trichloride |
US4413911A (en) * | 1981-04-24 | 1983-11-08 | Measurex Corporation | Gas analyzer with fluid curtain |
US4515274A (en) * | 1981-12-02 | 1985-05-07 | Coulter Corporation | Particle analyzing and sorting apparatus |
US4443072A (en) * | 1982-04-05 | 1984-04-17 | The United States Of America As Represented By The United States Department Of Energy | Purged window apparatus utilizing heated purge gas |
US4544273A (en) * | 1983-07-29 | 1985-10-01 | Particulate Instruments | Smoke opacity meter |
GB2148487B (en) * | 1983-10-13 | 1987-01-14 | Perkins Engines Group | Apparatus for measuring smoke density |
US4594715A (en) * | 1983-11-17 | 1986-06-10 | Particle Measuring Systems, Inc. | Laser with stabilized external passive cavity |
JPS60233536A (ja) * | 1984-05-04 | 1985-11-20 | Nippon Soken Inc | 光透過式黒煙濃度測定器 |
US4924097A (en) * | 1984-06-22 | 1990-05-08 | Georgia Tech Rss. Corp | Monodisperse aerosol generator for use with infrared spectrometry |
JPS6162739A (ja) * | 1984-09-03 | 1986-03-31 | Sanki Eng Co Ltd | クリ−ントンネル |
DE3513501A1 (de) * | 1985-04-16 | 1986-10-16 | Rofin-Sinar Laser GmbH, 2000 Hamburg | Laserschweissgeraet |
SU1376011A1 (ru) * | 1985-06-25 | 1988-02-23 | Всесоюзный научно-исследовательский геологоразведочный нефтяной институт | Безокошечна кювета дл спектрального газохроматографического детектировани |
DE3526458A1 (de) * | 1985-07-24 | 1987-01-29 | Grundig Emv | Einrichtung zur optischen truebungsmessung von gasen |
US4648714A (en) * | 1985-09-11 | 1987-03-10 | University Of Utah | Molecular gas analysis by Raman scattering in intracavity laser configuration |
US4676639A (en) * | 1986-01-22 | 1987-06-30 | Biomaterials International, Inc. | Gas cell for raman scattering analysis by laser means |
US4786188A (en) * | 1986-02-27 | 1988-11-22 | Rosemont Inc. | Purge air system for a combustion instrument |
US4654226A (en) * | 1986-03-03 | 1987-03-31 | The University Of Delaware | Apparatus and method for photochemical vapor deposition |
US4701096A (en) * | 1986-03-05 | 1987-10-20 | Btu Engineering Corporation | Wafer handling station |
NL8600998A (nl) * | 1986-04-19 | 1987-11-16 | Nederlandse Gasunie Nv | Werkwijze voor het bepalen van een fysische eigenschap van een medium. |
US4746215A (en) * | 1986-04-24 | 1988-05-24 | Pacific Scientific Company | Particle counter air inlet assembly |
US4672620A (en) * | 1986-05-14 | 1987-06-09 | Spectra-Physics, Inc. | Fast axial flow carbon dioxide laser |
US4784491A (en) * | 1986-06-03 | 1988-11-15 | General Electric Company | System to protect optics against dirty environments |
JPS6396541A (ja) * | 1986-10-14 | 1988-04-27 | Sanyo Electric Co Ltd | ガス濃度測定装置 |
US4787750A (en) * | 1987-04-08 | 1988-11-29 | Westinghouse Electric Corp. | Gas spectrometer construction having an improved alignment feature |
EP0286088B1 (de) * | 1987-04-08 | 1994-09-14 | Hitachi, Ltd. | Vorrichtung mit einer scheideförmigen Durchflusszelle |
US4845426A (en) * | 1987-05-20 | 1989-07-04 | Signatone Corporation | Temperature conditioner for tests of unpackaged semiconductors |
US4846102A (en) * | 1987-06-24 | 1989-07-11 | Epsilon Technology, Inc. | Reaction chambers for CVD systems |
US4840226A (en) * | 1987-08-10 | 1989-06-20 | The United States Of America As Represented By The United States Department Of Energy | Corrosive resistant heat exchanger |
US4784486A (en) * | 1987-10-06 | 1988-11-15 | Albion Instruments | Multi-channel molecular gas analysis by laser-activated Raman light scattering |
US4837443A (en) * | 1987-10-15 | 1989-06-06 | The Perkin-Elmer Corporation | Guard ring for a differentially pumped seal apparatus |
JPH01109243A (ja) * | 1987-10-21 | 1989-04-26 | Ishikawajima Harima Heavy Ind Co Ltd | ガス分析測定装置 |
US4940327A (en) * | 1988-10-25 | 1990-07-10 | Trc Companies Inc. | Method and apparatus for real time asbestos aerosol monitoring |
US5011286A (en) * | 1989-08-03 | 1991-04-30 | Met One, Inc. | Multisensor particle counter utilizing a single energy source |
-
1992
- 1992-07-31 US US07/922,874 patent/US5245405A/en not_active Expired - Lifetime
-
1993
- 1993-07-27 WO PCT/US1993/007042 patent/WO1994003794A1/en active IP Right Grant
- 1993-07-27 AT AT93918413T patent/ATE149683T1/de active
- 1993-07-27 EP EP93918413A patent/EP0653057B1/de not_active Expired - Lifetime
- 1993-07-27 DE DE69308566T patent/DE69308566T2/de not_active Expired - Fee Related
- 1993-07-27 JP JP6505386A patent/JPH08500180A/ja active Pending
- 1993-07-27 CA CA002140534A patent/CA2140534A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO1994003794A1 (en) | 1994-02-17 |
CA2140534A1 (en) | 1994-02-17 |
US5245405A (en) | 1993-09-14 |
JPH08500180A (ja) | 1996-01-09 |
EP0653057B1 (de) | 1997-03-05 |
EP0653057A1 (de) | 1995-05-17 |
DE69308566T2 (de) | 1997-06-12 |
DE69308566D1 (de) | 1997-04-10 |
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