AT351631B - CIRCUIT ARRANGEMENT FOR DYNAMIC TESTING OF RELAYS WITH TEST IMPULSES - Google Patents

CIRCUIT ARRANGEMENT FOR DYNAMIC TESTING OF RELAYS WITH TEST IMPULSES

Info

Publication number
AT351631B
AT351631B AT688273A AT688273A AT351631B AT 351631 B AT351631 B AT 351631B AT 688273 A AT688273 A AT 688273A AT 688273 A AT688273 A AT 688273A AT 351631 B AT351631 B AT 351631B
Authority
AT
Austria
Prior art keywords
relays
circuit arrangement
dynamic testing
test impulses
impulses
Prior art date
Application number
AT688273A
Other languages
German (de)
Other versions
ATA688273A (en
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of ATA688273A publication Critical patent/ATA688273A/en
Application granted granted Critical
Publication of AT351631B publication Critical patent/AT351631B/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q1/00—Details of selecting apparatus or arrangements
    • H04Q1/18—Electrical details
    • H04Q1/20—Testing circuits or apparatus; Circuits or apparatus for detecting, indicating, or signalling faults or troubles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Emergency Protection Circuit Devices (AREA)
AT688273A 1972-08-29 1973-08-06 CIRCUIT ARRANGEMENT FOR DYNAMIC TESTING OF RELAYS WITH TEST IMPULSES AT351631B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19722242418 DE2242418C2 (en) 1972-08-29 1972-08-29 Circuit arrangement for dynamic testing of relays with test pulses

Publications (2)

Publication Number Publication Date
ATA688273A ATA688273A (en) 1979-01-15
AT351631B true AT351631B (en) 1979-08-10

Family

ID=5854862

Family Applications (1)

Application Number Title Priority Date Filing Date
AT688273A AT351631B (en) 1972-08-29 1973-08-06 CIRCUIT ARRANGEMENT FOR DYNAMIC TESTING OF RELAYS WITH TEST IMPULSES

Country Status (11)

Country Link
JP (1) JPS4960866A (en)
AT (1) AT351631B (en)
BE (1) BE804170A (en)
CH (1) CH574609A5 (en)
DE (1) DE2242418C2 (en)
FR (1) FR2198145A1 (en)
GB (1) GB1439993A (en)
IT (1) IT993032B (en)
LU (1) LU68311A1 (en)
NL (1) NL161886C (en)
SE (1) SE382261B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2704289C2 (en) * 1977-02-02 1985-06-27 Siemens AG, 1000 Berlin und 8000 München Circuit arrangement for testing relay windings
JPS5780573A (en) * 1980-11-07 1982-05-20 Mitsubishi Electric Corp Tester for relay
CN115951207B (en) * 2022-12-24 2023-08-01 北京市科通电子继电器总厂有限公司 Testing circuit and system of solid state relay

Also Published As

Publication number Publication date
GB1439993A (en) 1976-06-16
CH574609A5 (en) 1976-04-15
DE2242418A1 (en) 1974-03-07
NL161886B (en) 1979-10-15
DE2242418B1 (en) 1974-03-07
BE804170A (en) 1974-02-28
LU68311A1 (en) 1973-10-30
IT993032B (en) 1975-09-30
SE382261B (en) 1976-01-19
ATA688273A (en) 1979-01-15
NL7311841A (en) 1974-03-04
NL161886C (en) 1980-03-17
DE2242418C2 (en) 1975-03-27
JPS4960866A (en) 1974-06-13
FR2198145A1 (en) 1974-03-29

Similar Documents

Publication Publication Date Title
AT317442B (en) Test device
CH517483A (en) Probe for removing varicose veins
IT949829B (en) DEVICE FOR TESTING PRINTED CIRCUITS
AT338890B (en) CIRCUIT ARRANGEMENT FOR DETECTING SIGNAL FAILURES
IT985862B (en) ELECTROCHEMICAL ANALYZER
AT326277B (en) TEST PAPERS FOR DETECTION OF BILIRUBIN
CH505389A (en) Device for measuring rotary movements
SE457118B (en) PROCEDURES FOR YTIMMUNOLOGICAL TESTING
JPS5619425A (en) Dynamic balance tester
SE381102B (en) TEST DEVICE FOR DETERMINATION OF ASCORBIC ACID IN VETSKOR
ATA683373A (en) CIRCUIT ARRANGEMENT FOR ADJUSTING THE CARRIER PHASE IN THE CASE OF TRANSMISSION OF SIGNALS
CH518683A (en) Device for testing cigarettes
AT351631B (en) CIRCUIT ARRANGEMENT FOR DYNAMIC TESTING OF RELAYS WITH TEST IMPULSES
CH512065A (en) Testing device
CH528185A (en) Circuit arrangement for switching through measurement voltages
BR7308942D0 (en) CAPACITOR WITH TESTED CONTACT
AT324539B (en) TEST DEVICE FOR FINDING ACUPUNCTURE POINTS
CH550402A (en) INDICATOR FOR DETECTION OF NICKEL IONS.
CH511647A (en) Testing device for mainly rotationally symmetrical parts
SE382352B (en) TEST DEVICE
SE382126B (en) CONTROL CIRCUIT TEST CONTROL CIRCUIT
AT322004B (en) CIRCUIT ARRANGEMENT FOR GENERATING PULSE GROUPS
BR7207694D0 (en) NEW RELAY TESTING EQUIPMENT
CH485198A (en) Recording device for recording rows of points
CH537022A (en) Synthetic test circuitry

Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties