AT280657B - Method and device for non-destructive, micrographic examination of metal workpieces through reproductions - Google Patents

Method and device for non-destructive, micrographic examination of metal workpieces through reproductions

Info

Publication number
AT280657B
AT280657B AT123866A AT123866A AT280657B AT 280657 B AT280657 B AT 280657B AT 123866 A AT123866 A AT 123866A AT 123866 A AT123866 A AT 123866A AT 280657 B AT280657 B AT 280657B
Authority
AT
Austria
Prior art keywords
reproductions
destructive
metal workpieces
micrographic examination
micrographic
Prior art date
Application number
AT123866A
Other languages
German (de)
Inventor
Mario Dr Giannoni
Original Assignee
Italsider Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Italsider Spa filed Critical Italsider Spa
Application granted granted Critical
Publication of AT280657B publication Critical patent/AT280657B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B1/00Measuring instruments characterised by the selection of material therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
AT123866A 1965-02-10 1966-02-10 Method and device for non-destructive, micrographic examination of metal workpieces through reproductions AT280657B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT326565 1965-02-10

Publications (1)

Publication Number Publication Date
AT280657B true AT280657B (en) 1970-04-27

Family

ID=11104532

Family Applications (1)

Application Number Title Priority Date Filing Date
AT123866A AT280657B (en) 1965-02-10 1966-02-10 Method and device for non-destructive, micrographic examination of metal workpieces through reproductions

Country Status (7)

Country Link
AT (1) AT280657B (en)
BE (1) BE675754A (en)
DE (1) DE1573580B1 (en)
ES (1) ES322799A1 (en)
GB (1) GB1081832A (en)
NL (1) NL6601669A (en)
SE (1) SE303619B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103969117B (en) * 2014-04-25 2016-02-17 攀钢集团成都钢钒有限公司 Leeb Hardness Tester detection fixture and Leeb Hardness Tester pick-up unit

Also Published As

Publication number Publication date
DE1573580B1 (en) 1970-11-05
ES322799A1 (en) 1966-11-16
BE675754A (en) 1966-05-16
GB1081832A (en) 1967-09-06
NL6601669A (en) 1966-08-11
SE303619B (en) 1968-09-02

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Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee