USD365584S - Semiconductor manufacturing device - Google Patents

Semiconductor manufacturing device Download PDF

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Publication number
USD365584S
USD365584S US29/024,005 US2400594F USD365584S US D365584 S USD365584 S US D365584S US 2400594 F US2400594 F US 2400594F US D365584 S USD365584 S US D365584S
Authority
US
United States
Prior art keywords
semiconductor manufacturing
manufacturing device
view
semiconductor
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/024,005
Inventor
Tatsuya Nakagome
Takashi Tozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Tokyo Electron Yamanashi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd, Tokyo Electron Yamanashi Ltd filed Critical Tokyo Electron Ltd
Assigned to TOKYO ELECTRON KABUSHIKI KAISHA, TOKYO ELECTRON YAMANASHI KABUSHIKI KAISHA reassignment TOKYO ELECTRON KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NAKAGOME, TATSUYA, TOZAWA, TAKASHI
Application granted granted Critical
Publication of USD365584S publication Critical patent/USD365584S/en
Assigned to TOKYO ELECTRON KABUSHIKI KAISHA reassignment TOKYO ELECTRON KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TOKYO ELECTRON YAMANASHI KABUSHIKI KAISHA
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front view of a semiconductor manufacturing device showing my new design;
FIG. 2 is a rear view thereof;
FIG. 3 is a right side view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a top view thereof; and,
FIG. 6 is a bottom view thereof.

Claims (1)

  1. The ornamental design for a semiconductor manufacturing device, as shown.
US29/024,005 1993-12-15 1994-06-06 Semiconductor manufacturing device Expired - Lifetime USD365584S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3797093 1993-12-15
JP5-37970 1993-12-15

Publications (1)

Publication Number Publication Date
USD365584S true USD365584S (en) 1995-12-26

Family

ID=65032025

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/024,005 Expired - Lifetime USD365584S (en) 1993-12-15 1994-06-06 Semiconductor manufacturing device

Country Status (1)

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US (1) USD365584S (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD415184S (en) * 1998-01-30 1999-10-12 Tokyo Electron Limited Apparatus for manufacturing a semiconductor for a liquid crystal display
USD415776S (en) * 1998-01-30 1999-10-26 Tokyo Electron Limited Apparatus for manufacturing a semiconductor for a liquid crystal display
USD426785S (en) * 1999-07-09 2000-06-20 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD427088S (en) * 1999-07-09 2000-06-27 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD905140S1 (en) * 2019-02-13 2020-12-15 Gf Machining Solutions Ag Milling machine
USD905139S1 (en) * 2019-02-13 2020-12-15 Agie Charmilles Sa Electrical discharge machine
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD415184S (en) * 1998-01-30 1999-10-12 Tokyo Electron Limited Apparatus for manufacturing a semiconductor for a liquid crystal display
USD415776S (en) * 1998-01-30 1999-10-26 Tokyo Electron Limited Apparatus for manufacturing a semiconductor for a liquid crystal display
USD426785S (en) * 1999-07-09 2000-06-20 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD427088S (en) * 1999-07-09 2000-06-27 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD905140S1 (en) * 2019-02-13 2020-12-15 Gf Machining Solutions Ag Milling machine
USD905139S1 (en) * 2019-02-13 2020-12-15 Agie Charmilles Sa Electrical discharge machine
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus

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