US20080049542A1 - Address counter for nonvolatile memory device - Google Patents

Address counter for nonvolatile memory device Download PDF

Info

Publication number
US20080049542A1
US20080049542A1 US11/829,580 US82958007A US2008049542A1 US 20080049542 A1 US20080049542 A1 US 20080049542A1 US 82958007 A US82958007 A US 82958007A US 2008049542 A1 US2008049542 A1 US 2008049542A1
Authority
US
United States
Prior art keywords
address
add
during
bus
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/829,580
Inventor
Hyungsang Lee
Dae Sik Song
Jacopo Mulatti
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
SK Hynix Inc
STMicroelectronics Asia Pacific Pte Ltd
Original Assignee
STMicroelectronics SRL
Hynix Semiconductor Inc
STMicroelectronics Asia Pacific Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL, Hynix Semiconductor Inc, STMicroelectronics Asia Pacific Pte Ltd filed Critical STMicroelectronics SRL
Publication of US20080049542A1 publication Critical patent/US20080049542A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/04Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/08Address circuits; Decoders; Word-line control circuits

Definitions

  • the present invention relates to nonvolatile memory devices, and more particularly, to an address counter for setting a memory location to a selected page in the nonvolatile memory device.
  • An example nonvolatile memory is a NAND flash memory device.
  • a page mode nonvolatile memory device includes a counter for controlling the addressing of memory locations in the selected page.
  • the address counter starts from the value that is input thereto by the user during a specific command, and as illustrated in the data path flow scheme of FIG. 1 , during read operations the value assumed by the address counter selects the memory location from which data is output. This is while during a program operation the value assumed by the address counter selects the memory location where data will be written.
  • the address counter plays an important role, and represents a critical component of the device. To better illustrate the technical problems to be addressed, a brief review of the manner in which the address counter functions during a read sequence and a program sequence follows.
  • a read command (00h)
  • four address cycles for the example taken into consideration
  • a read confirm command (30h).
  • the internal address counter is initialized by the issuance of the four address cycles, and after this busy state the internal address counter is incremented at every toggling of the external read enable signal REN.
  • the internal address counter loads input data I/O into the correct position according to the number of the ALE cycle.
  • the read-confirm command (30h) is issued, the memory device enters a busy state.
  • the memory cell array is accessed and information stored in the page selected by the row address is read and stored into a data register commonly referred to as page buffer.
  • the external user will toggle the REN read enable command for outputting data read from the page buffer.
  • Data is accessed on a byte or word base such that for any new RE toggling the column address counter will be incremented to select consecutive data stored in the selected page.
  • the following are issued to the memory device in order to enter a program mode: the program command (80h) followed by four address input cycles (for the considered sample case) are issued to the memory device, serial data is loaded in the page buffer, and the program-confirm command (10h).
  • the internal address counter is initialized by the four address cycles, and subsequently, the counter is incremented at every toggling of the write enable signal WEN during the data cycles. During each ALE cycle, the internal address counter controls the loading of input address bits in the correct positions, according to the number of the ALE cycle.
  • the external command LOADADD is applied on a pad of the memory device.
  • the ADD signal is cleared when RESET_ADD is high, or briefly H.
  • At the rising edge of the signal address counter CK_ADD internally generated by the input logic circuitry of the counting flip flop (F/F) of the elementary cell or module of the address counter, latches an ADD value which is either: 1) LOADADD, when ENLOAD is H, or 2)(CARRY xor ADD) when ENCOUNT is H and ENLOAD is L.
  • ADD maintains the logical value previously set in the flip flop F/F.
  • ADD represents a Counted Address Value (all ADD values constitute a first internal address bus).
  • ADD_A is a second Internal address bus that is generated from the ADD values of the first internal address bus to implement a pipeline arrangement for internal simultaneous multiple data transfers.
  • CK_ADD is logically equal to REN (CLK_SEL01), and the internal column counter value (ADD) is incremented by every new pulse of the REN signal.
  • Erase Verify is performed to verify whether all cells of a selected block have been erased. To check this condition, an internal algorithm is executed, which downloads cell information in the page buffer and checks whether the data stored in the page buffer data are all 1 on a byte-by-byte bases. For this purpose, column addresses are scanned from beginning to end.
  • WEN — 1CK is a signal whose function is to skip address counter increments during the first data cycle. The reason why such a WEN — 1CK signal is used during data cycle is that when loading program data into the page buffer, the first data is to be loaded at the address set during the ALE cycle. Therefore, it is necessary to skip incrementing the address counter during the first WEN pulse of data cycle. Of course, the address counter value ADD is incremented by WEN — 1CK starting from the WEN pulse of the second data cycle.
  • a parallel processing scheme of data transfer is adopted. This is generally referred to as pipelining.
  • FIG. 5 an example of a pipeline for a read operation is depicted.
  • the example pipeline is for the case of transferring two data in parallel. Therefore, two internal address buses, and two internal data buses are implemented.
  • the counted address that is the ADD values stored in the gain or counting flip-flops F/F, that compose the Address Counter in FIG. 4 , is the address counter information that forms a first internal address bus (ADD).
  • Another or second internal address bus (ADD-A) is generated by using an adder according to the circuit diagram of FIG. 4 relative to an elementary (or module) of the Address Counter.
  • the internal address buses BUSO, 1 [n:1] also changes. Because there is no bit[ 0 ] in the internal address bus BUS 1 , the latter is updated every other RE pulse.
  • the internal address bus BUS represents the adder result (ADD-A) of the counted address (ADD). This fact implies the occurrence of glitches on the internal address buses BUS 0 , 1 during the portion indicated by the symbol (*) in FIG. 5 (i.e., the falling edge of RE) because of different timing delays in adding the result of a counted address for each bit of the internal address bus bit.
  • the specifications require the user to issue a pointer (50h) to access a spare area before performing a read operation or a program operation. Therefore, it is known whether the user is going to access spare area or not before the input of an address.
  • the spare area of each page is generally 16 bytes or 8 words. Therefore, when the external user inputs an address through a certain number of ALE cycles to access the spare area, only addresses (or more precisely the address bits) [3:0] (also indicated thereinafter with the short-hand notation A[3:0]) of the column address are available. Other address bits A[7:4] are discarded regardless of the users full address that has been input.
  • the spare area on each page is 64 bytes or 32 words.
  • the sequence of ALE cycles inputs an address in the spare area, only the address bits [5:0] among the column address bits are available. The other address bits[10:6] are to be discarded regardless (XS mode).
  • an object of the present invention is to reduce the glitch problem associated with address counters for nonvolatile memory devices.
  • an additional address latching flip-flop is provided for loading each externally applied memory address bit at the rising edge of an external address loading clock signal. This may be peformed during ALE cycles to be successively transferred from the address loading flip flops to the main address counting flip flops of the address counter cell or module.
  • an internal address bus may be generated by adding respective internal address values bus driving flip flops in each bit cell (module) of the address counter, and controlled by the values stored in the leading and main flip flops through a control logic.
  • FIG. 1 is a data path flow scheme of a nonvolatile NAND type memory according to the prior art.
  • FIG. 2 illustrates a read sequence according to the prior art.
  • FIG. 3 illustrates a program sequence according to the prior art.
  • FIG. 4 shows a cell of a common internal counter architecture, and related clock conditions according to the prior art.
  • FIG. 5 illustrates an example of a pipeline implemented for a read operation according to the prior art.
  • FIG. 6 illustrates the behavior of an internal address counter for accessing a spare area in a memory device having a small page organization (256MX8) according to the prior art.
  • FIG. 7 illustrates the program sequence for accessing a spare area in a memory device having a large page organization (1GX8) according to the prior art.
  • FIG. 8A is a basic circuit diagram of the address counter according to the present invention.
  • FIG. 8B shows a pipeline implementation in a cell of the address counter of FIG. 8A .
  • FIG. 9 illustrates the behavior of the address counter for a read operation according to the present invention.
  • FIG. 10 illustrates the behavior of the address counter for a program operation according to the present invention.
  • FIG. 11 illustrates the behavior of the address counter when accessing a spare area in a memory device having a large page organization (1GX8) during a program operation according to the present invention.
  • ENLOAD ‘H’ during ALE cycles AX_INC_2 In order to make a pipeline for a read operation, a value LOADADD + 2 must initially be loaded in the Internal Address F/F of the Internal Address BUS ADD_A0 of the novel Address Counter architecture.
  • AX_LOAD11 For the Address Counting F/F[10:6], AX_LOAD11 is the Address[11] value among the start address bit values input by the user. For the Address Counting F/F[5:0], AX_LOAD11 is fixed to ‘L’.
  • AX_INC_1 In order to make a pipeline for a read operation, a value LOADADD + 1 must be loaded in the Internal Address F/F off the Internal Address BUS ADD_A1 of the novel Address Counter architecture.
  • Address Loading F/F Is the added F/F of each cell or module of the novel Address Counter for storing Address data input through the PAD when ALE is high and WEN is low.
  • Address Counting Is the main F/F of the basic F/F Address Counter architecture. The value stored in the Address Loading F/F is loaded in the main Address Counting F/F to set the start address value according to the user's input with LOAD_UPDATE ‘H’. Once the Address Counting F/F has loaded the value stored in the Address Loading F/F, the address may start to be incremented by CK_ADD.
  • ADD_A output of Adder The number of ADD_A values depends on the capacity of device(1Gbit Large page 26, 512M Large Page 25). ADD_A corresponds to Internal Address BUS0 of FIG. 5. Internal Address output of Adder. That is ADD_A BUS0[n:1] values. The width of Internal Address BUS0 depends on the capacity of device(1Gbit Large page 26, 512M Large Page 25). Internal Address The Counted Address values[n:1], BUS1[n:1] That is the ADD values The width of Internal Address BUS1 depends on the capacity of device(1Gbit Large page 26, 512M Large Page 25). ADD_A0 Corresponds with the Internal Address BUS0[n:1] of FIG. 5. That is one internal address to make a read pipeline. ADD_A1 Corresponds with the Internal Address BUS1[n:1] of FIG. 5. That is the other internal address to make a pipeline.
  • address loading of externally input address values and their storing in the main address counting flip flop of the address counter is handled in two distinct flip-flops F/F 1 and F/F 2 , respectively, for each cell of the address counter.
  • the counter is realized by coupling together a plurality of cells of FIG. 8B such that the bit CARRY generated by a cell is fed to the cell that follows in the cascade.
  • the address loading flip-flop F/F 1 stores the externally input address bit during ALE cycles.
  • the signal CK_LOAD is equal to WEN signal only during ALE cycles.
  • the address bit value is updated in the address loading F/F 1 by CK_LOAD, and corresponds to a bit of the address input by the external user.
  • bit value or counted address value ADD in the main or address counting flip-flop F/F 2 of a cell of the address counter is eventually updated to correspond to the bit in the address loading flip flop F/F 1 at the rising of CK_ADD during the read confirm cycle (30h).
  • the full counted address given by the multibit bus of all the ADD bit values of the cells of the address counter is incremented by two compared to the full address loaded in the address loading flip flops F/F 1 of all the cells of the address counter.
  • the pipelining can be implemented with the illustrated address counter of FIG. 8A as illustrated in FIG. 8B , which depicts a cell of the cascade of cells of the counter.
  • FIG. 8B illustrates a cell of the cascade of cells that forms the address counter. This also includes the circuitry for implementing a pipeline identified in the circled area.
  • the internal address buses BUS 0 and BUS 1 are updated to the bit values A[27:1] assumed by the cells of the internal address counter. This is according to the value A[c 0 ] of the address counting flip flop F/F of the first cell of the of the internal address counter.
  • the page buffer of the memory device is no longer directly connected to a counter that accomplishes the addition on the fly.
  • the page buffer will receive the new latched address bits at the rising edge of CK_ADD after the addition has already been completed. Therefore, the risk of glitches is reduced.
  • CK_LOAD corresponds to the WEN signal only during an ALE cycle.
  • the input address values LOADADD are updated in the address loading flip flops F/F 1 at the rising edge of CK_LOAD.
  • the main F/F 2 or address counting flip flops are updated to the values in the address loading flip flops F/F 1 at the rising of CK_ADD during the first toggling of the input WEN of a data cycle.
  • LOAD_UPDATE is high and READCTRL_CLE is low and CK_ADD corresponds to WEN. Therefore, the address counting flip flops F/F 2 of the cell can be updated to the loaded address bits present in the address loading flip flops F/F 1 of the cell.
  • the column address is incremented and the internal address buses BUS 0 and BUS 1 are updated to the counted address [27:1] according to the value of the first cell [ 0 ] of the internal address counter.
  • the address counter values are updated to the loaded address Values during the first WEN cycle of data cycle This is similar to a confirm cycle for read operation.
  • the spare area address is loaded in the address loading flip flops F/F 1 by CK_LOAD.
  • AX_LOAD 11 becomes high and it is possible to update the address bits A 6 -A 10 to 00000 while the other address bits correspond to those of the input address in order to ensure a correct counter operation.

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)

Abstract

An address counter for a nonvolatile memory device includes a cascade of cells. Each cell includes an address counting flip-flop that is updated to a value of every newly counted address bit, or latches a column address bit value input by an external user of the memory device during ALE cycles for addressing a start memory location on a selected page. Each cell further includes an additional address loading flip-flop for loading the column address bit value input during ALE cycles for addressing the start memory location on the selected page during the ALE cycles. A logic circuit updates the address counting flip flop to the address bit value during a read confirm cycle in a read sequence, and during a first data input cycle in a program sequence.

Description

    FIELD OF THE INVENTION
  • The present invention relates to nonvolatile memory devices, and more particularly, to an address counter for setting a memory location to a selected page in the nonvolatile memory device. An example nonvolatile memory is a NAND flash memory device.
  • BACKGROUND OF THE INVENTION
  • A page mode nonvolatile memory device includes a counter for controlling the addressing of memory locations in the selected page. The address counter starts from the value that is input thereto by the user during a specific command, and as illustrated in the data path flow scheme of FIG. 1, during read operations the value assumed by the address counter selects the memory location from which data is output. This is while during a program operation the value assumed by the address counter selects the memory location where data will be written.
  • The address counter plays an important role, and represents a critical component of the device. To better illustrate the technical problems to be addressed, a brief review of the manner in which the address counter functions during a read sequence and a program sequence follows.
  • Referring to the read sequence depicted in FIG. 2, the following are issued to the memory device in order to enter a read mode: a read command (00h), four address cycles (for the example taken into consideration) and a read confirm command (30h).
  • The internal address counter is initialized by the issuance of the four address cycles, and after this busy state the internal address counter is incremented at every toggling of the external read enable signal REN.
  • During each address latching cycle ALE, the internal address counter loads input data I/O into the correct position according to the number of the ALE cycle. When the read-confirm command (30h) is issued, the memory device enters a busy state. The memory cell array is accessed and information stored in the page selected by the row address is read and stored into a data register commonly referred to as page buffer.
  • After this busy state has ended, the external user will toggle the REN read enable command for outputting data read from the page buffer. Data is accessed on a byte or word base such that for any new RE toggling the column address counter will be incremented to select consecutive data stored in the selected page.
  • Referring to FIG. 3, the following are issued to the memory device in order to enter a program mode: the program command (80h) followed by four address input cycles (for the considered sample case) are issued to the memory device, serial data is loaded in the page buffer, and the program-confirm command (10h).
  • The internal address counter is initialized by the four address cycles, and subsequently, the counter is incremented at every toggling of the write enable signal WEN during the data cycles. During each ALE cycle, the internal address counter controls the loading of input address bits in the correct positions, according to the number of the ALE cycle.
  • When the last address cycle is issued, the row address (A27-A12) is frozen while the column address (A11-A0) is incremented at every toggling of the WEN signal during the data cycles in order to load input data in the page buffer in a consecutive mode. An elementary cell of an internal address counter as typically realized for implementing the above described algorithms for read and program operations is shown in FIG. 4.
  • The external command LOADADD is applied on a pad of the memory device. The ADD signal is cleared when RESET_ADD is high, or briefly H. At the rising edge of the signal address counter CK_ADD, internally generated by the input logic circuitry of the counting flip flop (F/F) of the elementary cell or module of the address counter, latches an ADD value which is either: 1) LOADADD, when ENLOAD is H, or 2)(CARRY xor ADD) when ENCOUNT is H and ENLOAD is L.
  • In all other cases, the ADD value maintains the logical value previously set in the flip flop F/F. ADD represents a Counted Address Value (all ADD values constitute a first internal address bus).
  • ADD_A is a second Internal address bus that is generated from the ADD values of the first internal address bus to implement a pipeline arrangement for internal simultaneous multiple data transfers.
  • ENLOAD is high when the memory device loads PAD data as address values during the ALE cycles. If ENLOAD is high, CK_ADD is logically equal to WEN (CLK_SEL=00) and the ADD value is latched according to its PAD value.
  • After the busy state triggered by a read command sequence has ended, the user reads data from the page buffer by toggling REN. In this case, CK_ADD is logically equal to REN (CLK_SEL01), and the internal column counter value (ADD) is incremented by every new pulse of the REN signal.
  • Erase Verify is performed to verify whether all cells of a selected block have been erased. To check this condition, an internal algorithm is executed, which downloads cell information in the page buffer and checks whether the data stored in the page buffer data are all 1 on a byte-by-byte bases. For this purpose, column addresses are scanned from beginning to end. During Erase Verify, CK_ADD is equal to Erase_verify_ck (CLK_SEL=10) that is generated during the execution of the erase verify algorithm, and the ADD value is incremented at every new Erase_verify_ck pulse.
  • During execution of data cycles, the address counter needs to be incremented by WEN. Therefore, CK_ADD is equal to WEN_ICK (CLK_SEL=11) and the internal address counter value ADD is incremented at every WEN toggling. WEN1CK is a signal whose function is to skip address counter increments during the first data cycle. The reason why such a WEN1CK signal is used during data cycle is that when loading program data into the page buffer, the first data is to be loaded at the address set during the ALE cycle. Therefore, it is necessary to skip incrementing the address counter during the first WEN pulse of data cycle. Of course, the address counter value ADD is incremented by WEN1CK starting from the WEN pulse of the second data cycle.
  • To get a sufficient timing margin for loading data from I/O in the page buffer (or for transferring data from the page buffer to I/O pads), a parallel processing scheme of data transfer is adopted. This is generally referred to as pipelining. In the following FIG. 5 an example of a pipeline for a read operation is depicted.
  • The example pipeline is for the case of transferring two data in parallel. Therefore, two internal address buses, and two internal data buses are implemented. As described in the previous section, the counted address that is the ADD values stored in the gain or counting flip-flops F/F, that compose the Address Counter in FIG. 4, is the address counter information that forms a first internal address bus (ADD). Another or second internal address bus (ADD-A) is generated by using an adder according to the circuit diagram of FIG. 4 relative to an elementary (or module) of the Address Counter.
  • In the shown pipeline, whenever the counted address ADD changes, the internal address buses BUSO,1[n:1] also changes. Because there is no bit[0] in the internal address bus BUS1, the latter is updated every other RE pulse. The internal address bus BUS represents the adder result (ADD-A) of the counted address (ADD). This fact implies the occurrence of glitches on the internal address buses BUS0,1 during the portion indicated by the symbol (*) in FIG. 5 (i.e., the falling edge of RE) because of different timing delays in adding the result of a counted address for each bit of the internal address bus bit.
  • The values of BUS0,1 during the (*) portion of RE in FIG. 5 is unstable because they are changing during such an interval of time. Therefore, they are considered as unknown. On the other hand, these are as other internal address buses are directly connected to the page buffer and to the redundancy block. Therefore, whenever the buses BUS0,1 have glitches, redundancy will be evaluated for changing address values. Moreover, the addressing of the page buffer will also suffer instabilities. The more the duration of these instabilities (i.e., the * portion of RE in FIG. 5) is reduced, the more stable the operation of the page buffer and of the redundancy block will be.
  • Typically, in the case of a NAND Flash of small page size organization, the specifications require the user to issue a pointer (50h) to access a spare area before performing a read operation or a program operation. Therefore, it is known whether the user is going to access spare area or not before the input of an address.
  • In case of a small page organization of the memory, the spare area of each page is generally 16 bytes or 8 words. Therefore, when the external user inputs an address through a certain number of ALE cycles to access the spare area, only addresses (or more precisely the address bits) [3:0] (also indicated thereinafter with the short-hand notation A[3:0]) of the column address are available. Other address bits A[7:4] are discarded regardless of the users full address that has been input.
  • From the point of view of the address counter design, it is necessary to fix the address bits A[7:4] either to low or high state to ensure correct operation of the counter. In a memory with a small page organization, this is possible because of the above described pointer requisite. In contrast, in case of a large page organization of the memory device, there is no pointer command for accessing the spare area of the memory device, and to do so the user needs to input the address bit All set to high logic value (X8 mode).
  • Commonly, in case of a large page organization, the spare area on each page is 64 bytes or 32 words. When the user, through the sequence of ALE cycles, inputs an address in the spare area, only the address bits [5:0] among the column address bits are available. The other address bits[10:6] are to be discarded regardless (XS mode).
  • Referring to FIG. 7, there is no chance to set A[10:6] to a low logic value because the information All that indicates that the access is to the spare area comes after the address bits A[10:6] have been input. Therefore, the address bits A[10:6] will be different according to the user's input, and because of this the design of the internal counter is generally more complicated to handle this situation.
  • SUMMARY OF THE INVENTION
  • In view of the foregoing background, an object of the present invention is to reduce the glitch problem associated with address counters for nonvolatile memory devices.
  • This and other objects, advantages and features in accordance with the invention are provided based on a modified address counter architecture. In each elementary cell or module of the address counter, an additional address latching flip-flop is provided for loading each externally applied memory address bit at the rising edge of an external address loading clock signal. This may be peformed during ALE cycles to be successively transferred from the address loading flip flops to the main address counting flip flops of the address counter cell or module.
  • In this way, the generation of glitches because of different timing delays in adding the counted address values may be prevented by separately controlling the loading of the external address, and the counting thereof by the address counting flip-flop of the cell.
  • Moreover, instead of employing an adder as in prior art architectures to generate at least a second internal address bus based on the address bus values output by the Internal Address Counter, for implementing a pipeline according to a preferred embodiment, an internal address bus (or buses) may be generated by adding respective internal address values bus driving flip flops in each bit cell (module) of the address counter, and controlled by the values stored in the leading and main flip flops through a control logic.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a data path flow scheme of a nonvolatile NAND type memory according to the prior art.
  • FIG. 2 illustrates a read sequence according to the prior art.
  • FIG. 3 illustrates a program sequence according to the prior art.
  • FIG. 4 shows a cell of a common internal counter architecture, and related clock conditions according to the prior art.
  • FIG. 5 illustrates an example of a pipeline implemented for a read operation according to the prior art.
  • FIG. 6 illustrates the behavior of an internal address counter for accessing a spare area in a memory device having a small page organization (256MX8) according to the prior art.
  • FIG. 7 illustrates the program sequence for accessing a spare area in a memory device having a large page organization (1GX8) according to the prior art.
  • FIG. 8A is a basic circuit diagram of the address counter according to the present invention.
  • FIG. 8B shows a pipeline implementation in a cell of the address counter of FIG. 8A.
  • FIG. 9 illustrates the behavior of the address counter for a read operation according to the present invention.
  • FIG. 10 illustrates the behavior of the address counter for a program operation according to the present invention.
  • FIG. 11 illustrates the behavior of the address counter when accessing a spare area in a memory device having a large page organization (1GX8) during a program operation according to the present invention.
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • In describing the features of the illustrated architecture of an internal (column) address counter compared to those in the known architecture of FIG. 5, the following TABLE 1 on the meanings of the numerous signal labels and circuit labels used in the drawings and in this description may be of assistance to the reader
  • TABLE 1
    CLE Command Latch Enable.
    ALE Address Latch Enable.
    R/B! Ready/Busy.
    WEN Negate of Write Enable
    REN Negate of Read Enable
    I/O0~7 Data Inputs/Outputs
    Erase_verify_ck Clock that is generated when
    executing the erase verify
    algorithm
    WEN AFTER ALE cycle WEN signal after ALE cycle. That
    is, WEN cycle for pure data load.
    CARRY[n] the logic result of CARRY[n − 1] and
    ADD(Q)[n − 1]
    LOADADD Address data input from PAD during
    ALE cycle. It is the start address
    requested by the user.
    ENCOUNT ‘H’ when the Address Counting
    F/F(of the Main Counter) should be
    incremented at rising edge of
    every CK_ADD.
    LOAD_UPDATE ‘H’ when initially the value of
    the Address Loading F/F is loaded
    in the Address Counting F/F(of
    the Main Counter cell or module)
    to set the start address according
    to the user's input.
    ENLOAD ‘H’ during ALE cycles
    AX_INC_2 In order to make a pipeline for a
    read operation, a value LOADADD + 2
    must initially be loaded in the
    Internal Address F/F of the
    Internal Address BUS ADD_A0 of the
    novel Address Counter
    architecture.
    READCTRL_CLE ‘H’ when READ confirm (30 h) is
    input.
    AX_LOAD11 For the Address Counting
    F/F[10:6], AX_LOAD11 is the
    Address[11] value among the start
    address bit values input by the
    user. For the Address Counting
    F/F[5:0], AX_LOAD11 is fixed to
    ‘L’.
    AX_INC_1 In order to make a pipeline for a
    read operation, a value LOADADD + 1
    must be loaded in the Internal
    Address F/F off the Internal
    Address BUS ADD_A1 of the novel
    Address Counter architecture.
    AX_LOAD0 Address[0] value among the start
    address bit values input by the
    user.
    CK_LOAD Corresponds to the WEN signal when
    ALE is high
    Address Loading F/F Is the added F/F of each cell or
    module of the novel Address
    Counter for storing Address data
    input through the PAD when ALE is
    high and WEN is low.
    Address Counting Is the main F/F of the basic
    F/F Address Counter architecture. The
    value stored in the Address
    Loading F/F is loaded in the main
    Address Counting F/F to set the
    start address value according to
    the user's input with LOAD_UPDATE
    ‘H’.
    Once the Address Counting F/F has
    loaded the value stored in the
    Address Loading F/F, the address
    may start to be incremented by
    CK_ADD.
    ADD output value of any of the Address
    Counting F/F that compose the
    Address Counter
    ADD[0] The counted address value of the
    Address Counting F/F[0]
    Counted Address The values stored in the Address
    value Counting F/F that compose the
    Address Counter. The number of
    Address Counting F/F depend on the
    capacity of device (for 1Gbit
    (Large) page, the number is 27,
    for a 512M (Large) Page, the
    number is 26)
    Adder In prior art architectures, it
    adds ADDs values to make a
    pipeline. In FIG. 5, Internal
    Address BUS0 is Counted Address
    value[n:1] + Counted Address
    value[0], whilst Internal Address
    BUS1 is Counted Address
    value[n:1].
    ADD_A output of Adder. The number of
    ADD_A values depends on the
    capacity of device(1Gbit Large
    page 26, 512M Large Page 25).
    ADD_A corresponds to Internal
    Address BUS0 of FIG. 5.
    Internal Address output of Adder. That is ADD_A
    BUS0[n:1] values. The width of Internal
    Address BUS0 depends on the
    capacity of device(1Gbit Large
    page 26, 512M Large Page 25).
    Internal Address The Counted Address values[n:1],
    BUS1[n:1] That is the ADD values The width
    of Internal Address BUS1 depends
    on the capacity of device(1Gbit
    Large page 26, 512M Large Page
    25).
    ADD_A0 Corresponds with the Internal
    Address BUS0[n:1] of FIG. 5. That
    is one internal address to make a
    read pipeline.
    ADD_A1 Corresponds with the Internal
    Address BUS1[n:1] of FIG. 5. That
    is the other internal address to
    make a pipeline.
  • With reference to the diagram of FIG. 8A, address loading of externally input address values and their storing in the main address counting flip flop of the address counter is handled in two distinct flip-flops F/F1 and F/F2, respectively, for each cell of the address counter.
  • The counter is realized by coupling together a plurality of cells of FIG. 8B such that the bit CARRY generated by a cell is fed to the cell that follows in the cascade.
  • The address loading flip-flop F/F1 stores the externally input address bit during ALE cycles.
  • The functioning of the illustrated address counter for carrying out a read operation is as follows.
  • The signal CK_LOAD is equal to WEN signal only during ALE cycles. The address bit value is updated in the address loading F/F1 by CK_LOAD, and corresponds to a bit of the address input by the external user.
  • The bit value or counted address value ADD in the main or address counting flip-flop F/F2 of a cell of the address counter is eventually updated to correspond to the bit in the address loading flip flop F/F1 at the rising of CK_ADD during the read confirm cycle (30h).
  • At this time, in order to support a pipeline operation as the one depicted in FIG. 5, the full counted address given by the multibit bus of all the ADD bit values of the cells of the address counter is incremented by two compared to the full address loaded in the address loading flip flops F/F1 of all the cells of the address counter. This “increment by two” of the loaded address (AX_INC 2=Q_LOAD_int[11:0]+2) takes place before LOAD_UPDATE. In other words, this is before the loaded externally input address becomes stored into the main counted flip flops F/F2 of the address counter.
  • Therefore, in a read operation, the signal READCTRL_CLE becomes high and the counted address value (ADD) can be updated to the incremented by two addresses at the rising edge of CK_ADD when LOAD_UPDATE=high (i.e., during the read confirm cycle (30h)).
  • The pipelining can be implemented with the illustrated address counter of FIG. 8A as illustrated in FIG. 8B, which depicts a cell of the cascade of cells of the counter.
  • FIG. 8B illustrates a cell of the cascade of cells that forms the address counter. This also includes the circuitry for implementing a pipeline identified in the circled area.
  • When the internal address counter is incremented at every toggling of the RE signal, the internal address buses BUS0 and BUS1 are updated to the bit values A[27:1] assumed by the cells of the internal address counter. This is according to the value A[c0] of the address counting flip flop F/F of the first cell of the of the internal address counter.
  • This behavior is a key feature of the pipelining of the illustrated address counter because the page buffer, contrary to what happens in the prior art architectures of the address counter, is no longer directly connected to an address counter that implements the addition. On the contrary, in the new architecture, the page buffer will receive new address values latched in the address loading flip flops at the rising edge of the CK_ADD signal. That is, after the adding by two of the input address has been already completed (AX_INC 2=Q_LOAD_int[11:0]+2). Therefore, the risk of occurrence of glitches is significantly reduced compared to the known architectures.
  • Focusing on the circuitry for implementing a pipeline in the labeled circle, internal address buses BUS0 and BUS1 are updated to “load address+1” and “load address”, respectively, at the same moment when the main address counter value ADD is finally updated to the “incremented-by-two” value of the externally input address previously latched in the address loading flip flops of the cells of the counter. That is, this value is Ax_INC 2=Q_LOAD_int[11:0]+2. The value of the internal signal AX_INC 1 of the pipelining circuitry is AX_INC 1=Q_LOAD_int[11:0]+1.
  • Thereafter, when the internal address counter is incremented by every RE signal toggling, the internal address buses BUS0 and BUS1 are updated to the address ADD stored in the internal address counter main address counting flip flops [27:1] This depends from the value of the first bit cell [0] of the internal address counter.
  • With the illustrated architecture, the page buffer of the memory device is no longer directly connected to a counter that accomplishes the addition on the fly. On the contrary, the page buffer will receive the new latched address bits at the rising edge of CK_ADD after the addition has already been completed. Therefore, the risk of glitches is reduced.
  • CK_LOAD corresponds to the WEN signal only during an ALE cycle.
  • The input address values LOADADD are updated in the address loading flip flops F/F1 at the rising edge of CK_LOAD.
  • The main F/F2 or address counting flip flops are updated to the values in the address loading flip flops F/F1 at the rising of CK_ADD during the first toggling of the input WEN of a data cycle.
  • There is no need to increment the address at the first rising edge of the WEN signal during a data cycle. Therefore, the first rising edge of WEN can be exploited for updating the main address counting flip flops F/F2 to the address bits input during the ALE cycles.
  • During a first WEN cycle, LOAD_UPDATE is high and READCTRL_CLE is low and CK_ADD corresponds to WEN. Therefore, the address counting flip flops F/F2 of the cell can be updated to the loaded address bits present in the address loading flip flops F/F1 of the cell.
  • From the second WEN cycle onward, the column address is incremented and the internal address buses BUS0 and BUS1 are updated to the counted address [27:1] according to the value of the first cell [0] of the internal address counter.
  • As shown in FIG. 11 for a program operation, the address counter values are updated to the loaded address Values during the first WEN cycle of data cycle This is similar to a confirm cycle for read operation.
  • Therefore, when the external user inputs an address through ALE cycles, accessing a spare area of the array, the spare area address is loaded in the address loading flip flops F/F1 by CK_LOAD.
  • As explained above in discussing the counting problem of known address counters, in XS mode, the spare area access in case of a large page organization is addressed through the bit [11] (X8 mode).
  • Therefore, with the illustrated architecture, when the user sets the input address bit [11] to high, during the ALE cycles, AX_LOAD11 becomes high and it is possible to update the address bits A6-A10 to 00000 while the other address bits correspond to those of the input address in order to ensure a correct counter operation.

Claims (3)

1. An address counter for a nonvolatile memory device comprising a memory cell array and a page buffer for storing data read from a selected memory array page and to be read therefrom starting from an addressed memory array location during a read sequence and during data input cycles to the device to be written starting from an addressed memory array location during a program sequence, the address counter comprising a cascade of elementary cells each including an address counting flip-flop (F/F2) that is updated to the value of every newly counted address bit (ADD) or latches a column address bit value (ADD) input by an external user of the memory device during ALE cycles for addressing said start memory location on the selected page at the rising edge of a clock signal (CK_ADD) generated by an input logic circuitry managing external user's commands, and a carry signal (CARRY) propagation logic circuit along the cascaded elementary cells that form the address counter, characterized in that each elementary cell of the address counter further comprises:
an additional address loading flip-flop (F/F1) for loading such a column address bit value (LOADADD) input by an external user of the memory device during ALE cycles for addressing a start memory location on a selected page at the rising edge of said clock signal (CK_LOAD) during ALE cycles;
logic circuit means for updating said address counting flip flop (F/F2) at the rising edge of said clock signal (CK_ADD) to said address bit value (LOADADD) input by an external user of the memory device during ALE cycles for addressing a start memory location on the selected page when is active an internally generated control signal (ENLOAD) that is raised during a read confirm cycle (30h) in a read sequence, and during a first data input cycle (D0), in a program sequence.
2. The address counter of claim 1,
including circuit means for implementing a parallel data transfer scheme (pipeline), by generating, from each new counted address in the cells of said address counter, two distinct counted address buses (BUS0, BUS1), the second (BUS1) of which is without the first bit [0] and is updated every other toggling of an external user's read enable clock signal (RE) or write enable clock signal (WE) during a read or a program sequence, respectively, said circuit means of each cell of the address counter comprising first and second address buses (BUS0, BUS1) driving flip flops (F/F3, F/F4) and related circuit for updating the address bit content of said driving flip flops (F/F3, F/F4) at every change of the counted address in the address counting flip flop (F/F2) of cells of the address counter at the rising edge of the logic AND signal of said clock signal (CK_ADD) with the negate of the first bit value (ADD[0]) of the new counted address, for the first internal bus (BUS0), and with the direct first bit value (ADD[0 ]) of the new counted address, for the second internal bus (BUS1).
3. The address counter of claim 2, wherein during a read sequence said updating circuit of the bus driving flip flops (F/F3, F/F4) respectively updates one to the loaded externally input address value plus one and the other to the externally input address value at the instant the counted address in the counting flip flops (F/F2) of the address counter is incremented-by-two at the rising edge of the clock signal (CK_ADD) and thereafter, upon incrementing the address counter at every toggling of an external user's read enable command (RE), said internal address bus driving flip flops (F/F3, F/F4) are updated according to said first bit value (ADD[0]) of every new counted address.
US11/829,580 2006-07-28 2007-07-27 Address counter for nonvolatile memory device Abandoned US20080049542A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06425535.9 2006-07-28
EP06425535A EP1884955A1 (en) 2006-07-28 2006-07-28 Address counter for nonvolatile memory device

Publications (1)

Publication Number Publication Date
US20080049542A1 true US20080049542A1 (en) 2008-02-28

Family

ID=37682703

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/829,527 Active 2027-08-08 US7558152B2 (en) 2006-07-28 2007-07-27 Address counter for nonvolatile memory device
US11/829,580 Abandoned US20080049542A1 (en) 2006-07-28 2007-07-27 Address counter for nonvolatile memory device

Family Applications Before (1)

Application Number Title Priority Date Filing Date
US11/829,527 Active 2027-08-08 US7558152B2 (en) 2006-07-28 2007-07-27 Address counter for nonvolatile memory device

Country Status (2)

Country Link
US (2) US7558152B2 (en)
EP (1) EP1884955A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080028182A1 (en) * 2006-07-28 2008-01-31 Stmicroelectronics S.R.I. Address counter for nonvolatile memory device
US8489807B2 (en) 2010-12-03 2013-07-16 International Business Machines Corporation Techniques for performing refresh operations in high-density memories
US8539146B2 (en) 2011-11-28 2013-09-17 International Business Machines Corporation Apparatus for scheduling memory refresh operations including power states
US10505563B1 (en) * 2018-10-26 2019-12-10 EMC IP Holding Company LLC Techniques for optimizing entropy computations
US11079962B2 (en) * 2014-07-02 2021-08-03 Pure Storage, Inc. Addressable non-volatile random access memory

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8243523B2 (en) * 2010-03-09 2012-08-14 Micron Technology, Inc. Sensing operations in a memory device
KR101080206B1 (en) 2010-04-30 2011-11-07 주식회사 하이닉스반도체 Address output timing control circuit of semiconductor apparatus
KR20140082173A (en) * 2012-12-24 2014-07-02 에스케이하이닉스 주식회사 Address Counting Circuit and Semiconductor Apparatus Using the same
FR3020712B1 (en) * 2014-04-30 2017-09-01 Proton World Int Nv BIDIRECTIONAL COUNTER IN FLASH MEMORY

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5841721A (en) * 1994-09-03 1998-11-24 Samsung Electronics Co., Ltd Multi-block erase and verification circuit in a nonvolatile semiconductor memory device and a method thereof
US20030031065A1 (en) * 2001-08-10 2003-02-13 Akira Maruyama Non-volatile semiconductor integrated circuit
US6965526B2 (en) * 2003-02-10 2005-11-15 Stmicroelectronics Sa. Sectored flash memory comprising means for controlling and for refreshing memory cells
US20060109735A1 (en) * 2004-11-19 2006-05-25 Khaled Fekih-Romdhane Flexible internal address counting method and apparatus
US20080028182A1 (en) * 2006-07-28 2008-01-31 Stmicroelectronics S.R.I. Address counter for nonvolatile memory device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5721839A (en) * 1995-10-13 1998-02-24 Compaq Computer Corporation Apparatus and method for synchronously providing a fullness indication of a dual ported buffer situated between two asynchronous buses
EP1126467B1 (en) * 2000-02-14 2009-04-08 STMicroelectronics S.r.l. Synchronous counter for electronic memories

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5841721A (en) * 1994-09-03 1998-11-24 Samsung Electronics Co., Ltd Multi-block erase and verification circuit in a nonvolatile semiconductor memory device and a method thereof
US20030031065A1 (en) * 2001-08-10 2003-02-13 Akira Maruyama Non-volatile semiconductor integrated circuit
US6771559B2 (en) * 2001-08-10 2004-08-03 Seiko Epson Corporation Non-volatile semiconductor integrated circuit
US6965526B2 (en) * 2003-02-10 2005-11-15 Stmicroelectronics Sa. Sectored flash memory comprising means for controlling and for refreshing memory cells
US20060109735A1 (en) * 2004-11-19 2006-05-25 Khaled Fekih-Romdhane Flexible internal address counting method and apparatus
US7164613B2 (en) * 2004-11-19 2007-01-16 Infineon Technologies Ag Flexible internal address counting method and apparatus
US20080028182A1 (en) * 2006-07-28 2008-01-31 Stmicroelectronics S.R.I. Address counter for nonvolatile memory device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080028182A1 (en) * 2006-07-28 2008-01-31 Stmicroelectronics S.R.I. Address counter for nonvolatile memory device
US7558152B2 (en) * 2006-07-28 2009-07-07 Hyungsang Lee Address counter for nonvolatile memory device
US8489807B2 (en) 2010-12-03 2013-07-16 International Business Machines Corporation Techniques for performing refresh operations in high-density memories
US8539146B2 (en) 2011-11-28 2013-09-17 International Business Machines Corporation Apparatus for scheduling memory refresh operations including power states
US11079962B2 (en) * 2014-07-02 2021-08-03 Pure Storage, Inc. Addressable non-volatile random access memory
US10505563B1 (en) * 2018-10-26 2019-12-10 EMC IP Holding Company LLC Techniques for optimizing entropy computations

Also Published As

Publication number Publication date
US7558152B2 (en) 2009-07-07
EP1884955A1 (en) 2008-02-06
US20080028182A1 (en) 2008-01-31

Similar Documents

Publication Publication Date Title
US7558152B2 (en) Address counter for nonvolatile memory device
US7227777B2 (en) Mode selection in a flash memory device
US6903971B2 (en) Non-volatile semiconductor memory device
US6751129B1 (en) Efficient read, write methods for multi-state memory
US7652922B2 (en) Multiple independent serial link memory
US5422856A (en) Non-volatile memory programming at arbitrary timing based on current requirements
US6845053B2 (en) Power throughput adjustment in flash memory
US7640398B2 (en) High-speed interface for high-density flash with two levels of pipelined cache
KR100498508B1 (en) Dual buffering memory system for reducing data transmission time and control method thereof
US8456917B1 (en) Logic circuit for a semiconductor memory device, and method of managing an operation in the semiconductor memory device
CN107305788B (en) Memory and method for reading memory by error correction coding
JP3324666B2 (en) Nonvolatile semiconductor memory device
US20010008490A1 (en) Semiconductor integrated circuit
US6622201B1 (en) Chained array of sequential access memories enabling continuous read
EP1435624B1 (en) Fast page programming architecture and method in a non-volatile memory device with an SPI interface
JP4209708B2 (en) Semiconductor memory device
US6360295B1 (en) Serially loadable digital electronic memory and method of loading the same
US6662279B2 (en) DQ mask to force internal data to mask external data in a flash memory
US6996697B2 (en) Method of writing a group of data bytes in a memory and memory device
JPH11120778A (en) Nonvolatile memory built-in microcomputer
KR0180117B1 (en) Non-volatile semiconductor memory

Legal Events

Date Code Title Description
STCB Information on status: application discontinuation

Free format text: EXPRESSLY ABANDONED -- DURING EXAMINATION