TWI625604B - Transmissive laser direct imaging system - Google Patents

Transmissive laser direct imaging system Download PDF

Info

Publication number
TWI625604B
TWI625604B TW105143997A TW105143997A TWI625604B TW I625604 B TWI625604 B TW I625604B TW 105143997 A TW105143997 A TW 105143997A TW 105143997 A TW105143997 A TW 105143997A TW I625604 B TWI625604 B TW I625604B
Authority
TW
Taiwan
Prior art keywords
laser
substrate
beams
exposure device
penetrating
Prior art date
Application number
TW105143997A
Other languages
Chinese (zh)
Other versions
TW201823871A (en
Inventor
洪國書
吳松峻
廖述政
張明宏
Original Assignee
旭東機械工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 旭東機械工業股份有限公司 filed Critical 旭東機械工業股份有限公司
Priority to TW105143997A priority Critical patent/TWI625604B/en
Priority to CN201710057512.5A priority patent/CN108255020A/en
Priority to CN201711203316.0A priority patent/CN108255021A/en
Application granted granted Critical
Publication of TWI625604B publication Critical patent/TWI625604B/en
Publication of TW201823871A publication Critical patent/TW201823871A/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2051Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
    • G03F7/2053Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using a laser
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70383Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70383Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
    • G03F7/704Scanned exposure beam, e.g. raster-, rotary- and vector scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

本發明係關於一種穿透式雷射直接成像系統,其主要包括可在一Y方向上相對位移的一載台及一雷射曝光裝置,且在位移過程中,該雷射曝光裝置可在一X方向上對該載台上之基板進行掃描,以在該基板上形成一潛像圖案。詳言之,該雷射曝光裝置具有一雷射模組,其包括一線性雷射光源及一穿透式掃描器。該線性雷射光源之長度方向傾斜於X方向。該穿透式掃描器具有一多稜鏡,其轉軸平行於該線性雷射光源之長度方向。此外,該轉動的過程中,該多稜鏡之刻面允許每一雷射光束穿透並在該基板上形成傾斜的一條狀曝光光斑,且相鄰之兩雷射光束所形成之曝光光斑在X方向上之投影存在部分重疊。 The present invention relates to a penetrating laser direct imaging system, which mainly includes a stage and a laser exposure device that can be relatively displaced in a Y direction, and during the displacement process, the laser exposure device can be Scan the substrate on the stage in the X direction to form a latent image pattern on the substrate. In detail, the laser exposure device has a laser module, which includes a linear laser light source and a penetrating scanner. The length direction of the linear laser light source is inclined to the X direction. The transmissive scanner has a plurality of chirps, and its rotation axis is parallel to the length direction of the linear laser light source. In addition, during the rotation, the multiple facets allow each laser beam to penetrate and form an oblique stripe of exposure spots on the substrate, and the exposure spots formed by two adjacent laser beams are at There is some overlap in the projections in the X direction.

Description

穿透式雷射直接成像系統 Penetrating laser direct imaging system

本發明係關於一種雷射直接成像系統(Laser Direct Imaging System,LDI),尤其是一種利用線性掃描方式成像之雷射直接成像系統。 The invention relates to a Laser Direct Imaging System (LDI), in particular to a laser direct imaging system that uses linear scanning imaging.

近年來,在印刷電路板(PCB)之製程中對精密度之要求不斷提高,使得傳統接觸印刷製程逐漸無法符合要求。對此,許多印刷電路板廠商轉而使用直接成像系統(LDI system)以解決良率及產出率的問題。相較於傳統的微影技術,此雷射直接成像系統能在不使用光罩的情況下,而在電路板之電路圖案資料送入電腦後即可直接在基板上寫入對應所需的電路圖案以製造電路板,至此不僅精密度大幅提升,兼能有效降低生產成本。 In recent years, the requirements for precision in the manufacturing process of printed circuit boards (PCBs) have been increasing, making the traditional contact printing process gradually unable to meet the requirements. In response, many printed circuit board manufacturers have switched to the direct imaging system (LDI system) to solve the problem of yield and yield. Compared with the traditional lithography technology, this laser direct imaging system can directly write the corresponding circuit on the substrate after the circuit pattern data of the circuit board is sent to the computer without using a photomask. Patterns are used to manufacture circuit boards, which not only greatly improves precision, but also effectively reduces production costs.

台灣專利第523968號揭露一種直接雷射成像系統,其能在無光罩使用下,直接在一基板表面上形成一潛影圖案(latent image)。其中,該直接雷射成像系統主要包括一雷射光源及設於該雷射光源與基板之間的一反射式掃描器。該雷射光源用以輸出一載有影像資訊的雷射光束。該反射式掃描器具有一多面鏡,其在轉動時對基板進行掃描,以形成該潛影圖案。 Taiwan Patent No. 523968 discloses a direct laser imaging system that can form a latent image directly on a substrate surface without the use of a mask. The direct laser imaging system mainly includes a laser light source and a reflective scanner disposed between the laser light source and the substrate. The laser light source is used for outputting a laser beam carrying image information. The reflective scanner has a polygon mirror, which scans the substrate when rotating to form the latent image pattern.

值得注意的是,傳統反射式的掃描方法會產生諸多缺點。首先,如第十一圖所示,在使用反射式多面鏡9時,基板4的高度變化會造成聚焦點F3、F4的位置偏移,連帶影響其潛影圖案 之成像品質。再者,如第十二圖所示,傳統鏡面91對雷射光束92之聚焦點F會因為鏡面91轉動角度而有所不同,導致基板4成像時產生影像周圍失焦的情形。為改善此諸多缺點,前述台灣專利所示之直接雷射影像系統即是在該反射式掃描器與基板之間的光學路徑上設置一平場聚焦透鏡(F-theta lens)來補正,藉以提高成像品質。 It is worth noting that traditional reflective scanning methods have many disadvantages. First, as shown in Figure 11, when the reflective polygon mirror 9 is used, the change in the height of the substrate 4 will cause the position of the focus points F3 and F4 to shift, which will affect its latent image pattern. Image quality. Furthermore, as shown in FIG. 12, the focal point F of the conventional mirror surface 91 on the laser beam 92 is different due to the rotation angle of the mirror surface 91, which causes the out-of-focus situation around the image when the substrate 4 is imaged. In order to improve these shortcomings, the direct laser imaging system shown in the aforementioned Taiwan patent is to set a F-theta lens on the optical path between the reflective scanner and the substrate to correct it, thereby improving imaging. quality.

有別於以往之反射式雷射直接成像系統,本發明提供一種新的穿透式雷射直接成像系統,藉由其穿透式的掃描器來直接成像,可以避免反射式掃描器的失焦或焦點偏移等問題,且其所搭配的光學系統也得以大幅簡化,得以大幅降低設備成本。此外,本發明穿透式雷射直接成像系統之雷射曝光裝置係採用成排之多顆雷射二極體的線性掃描方式,更可以大幅提高掃描速度。 Different from the conventional reflective laser direct imaging system, the present invention provides a new penetrating laser direct imaging system. By using the penetrating scanner for direct imaging, the defocus of the reflective scanner can be avoided. Or focus shift, and the optical system is greatly simplified to significantly reduce equipment costs. In addition, the laser exposure device of the penetrating laser direct imaging system of the present invention adopts a linear scanning method of a plurality of laser diodes in a row, which can greatly increase the scanning speed.

具體而言,本發明穿透式雷射直接成像系統主要包括一載台及一雷射曝光裝置。該載台係供承載一基板,該基板塗佈有一感光層。該雷射曝光裝置可與該載台於一Y方向上相對位移,且能在相對位移的過程中在一X方向對該基板之感光層線性掃描,以在該感光層上形成一潛像圖案。 Specifically, the penetrating laser direct imaging system of the present invention mainly includes a carrier and a laser exposure device. The stage is used for carrying a substrate, and the substrate is coated with a photosensitive layer. The laser exposure device can be relatively displaced with the stage in a Y direction, and can linearly scan the photosensitive layer of the substrate in an X direction during the relative displacement to form a latent image pattern on the photosensitive layer. .

詳言之,該雷射曝光裝置具有一第一雷射模組,該第一雷射模組主要包括一線性雷射光源、一光學組件及一穿透式掃描器。該線性雷射光源包括複數雷射二極體,沿其長度方向間隔排列,用以輸出相互平行的多道雷射光束,且該線性雷射光源之長度方向傾斜於X方向。該光學組件具有複數聚焦透鏡單元,用以分別對應地將該些雷射光束聚焦至該基板。該穿透式掃描器具有可轉動的一多稜鏡,該多稜鏡之轉軸平行於該線性雷射光源之長度方向,且具有多個刻面,供該些雷射光束射入,其中該多稜鏡之每一刻面皆能使每一條入射的雷射光束產生偏折,並經該多稜鏡之折射後平行出光,並在轉動一角度後在該基板的感光層的一斜向掃描路徑上 形成一條狀曝光光斑,且相鄰之兩雷射光束所形成之條狀曝光光斑在X方向上之投影存在部分重疊。 In detail, the laser exposure device has a first laser module. The first laser module mainly includes a linear laser light source, an optical component, and a penetrating scanner. The linear laser light source includes a plurality of laser diodes arranged at intervals along its length direction to output a plurality of laser beams parallel to each other, and the length direction of the linear laser light source is inclined to the X direction. The optical component has a plurality of focusing lens units for respectively focusing the laser beams on the substrate. The transmissive scanner has a plurality of beams that can rotate, and the rotation axis of the plurality of beams is parallel to the length direction of the linear laser light source, and has multiple facets for the laser beams to enter. Each facet of the multiple beams can deflect each incident laser beam, and then output the light in parallel after being refracted by the multiple beams, and scan the oblique direction of the photosensitive layer of the substrate after rotating an angle. On the path A stripe-shaped exposure spot is formed, and the projections of the stripe-shaped exposure spot formed by two adjacent laser beams in the X direction partially overlap.

較佳地,該雷射曝光裝置更包括一第二雷射模組,其結構相同於該第一雷射模組,其中該第一雷射模組之最後一道雷射光束所形成之條狀曝光光斑與該第二雷射模組之第一道雷射光束所形成之條狀曝光光斑在X方向上之投影存在部分重疊。 Preferably, the laser exposure device further includes a second laser module having the same structure as the first laser module, wherein a stripe formed by a last laser beam of the first laser module The exposure spot and the projection of the stripe-shaped exposure spot formed by the first laser beam of the second laser module in the X direction partially overlap.

較佳地,該雷射曝光裝置的第一雷射模組更包括一水冷卻系統,用以對該第一雷射模組之線性雷射光源進行散熱。 Preferably, the first laser module of the laser exposure device further includes a water cooling system for cooling the linear laser light source of the first laser module.

較佳地,該雷射曝光裝置的第一雷射模組之每一聚焦透鏡單元包括一鏡筒及設於該鏡筒內的一聚焦透鏡,且該鏡筒恰軸向套設於對應之雷射二極體的一基座上。 Preferably, each focusing lens unit of the first laser module of the laser exposure device includes a lens barrel and a focusing lens provided in the lens barrel, and the lens barrel is sleeved on the corresponding axial axis. A laser diode on a base.

較佳地,該多稜鏡係設於該光學組件之該些聚焦透鏡與該載台之間的一光學路徑上。 Preferably, the plurality of frames are disposed on an optical path between the focusing lenses of the optical component and the stage.

100‧‧‧穿透式雷射直接成像系統 100‧‧‧ penetrating laser direct imaging system

1‧‧‧機台 1‧‧‧machine

11‧‧‧載台 11‧‧‧ carrier

12‧‧‧龍門 12‧‧‧ Dragon Gate

2‧‧‧雷射曝光裝置 2‧‧‧laser exposure device

3‧‧‧控制單元 3‧‧‧control unit

4‧‧‧基板 4‧‧‧ substrate

41‧‧‧感光層 41‧‧‧Photosensitive layer

5‧‧‧第一雷射模組 5‧‧‧The first laser module

51‧‧‧線性雷射光源 51‧‧‧Linear laser light source

510‧‧‧雷射二極體 510‧‧‧laser diode

511/511a/511b/511l‧‧‧雷射光束 511 / 511a / 511b / 511l‧‧‧laser beam

512‧‧‧基座 512‧‧‧ base

513‧‧‧舟架 513‧‧‧boat rack

52‧‧‧光學組件 52‧‧‧Optical components

520‧‧‧聚焦透鏡單元 520‧‧‧Focus lens unit

521‧‧‧鏡筒 521‧‧‧Mirror Tube

522‧‧‧聚焦透鏡 522‧‧‧Focus lens

53‧‧‧穿透式掃描器 53‧‧‧ Penetrating Scanner

531‧‧‧多稜鏡 531‧‧‧ more than

532‧‧‧馬達 532‧‧‧Motor

533‧‧‧刻面 533‧‧‧ facet

54‧‧‧水冷卻系統 54‧‧‧Water cooling system

6‧‧‧第二雷射模組 6‧‧‧Second Laser Module

9‧‧‧多面鏡 9‧‧‧ polygon mirror

91‧‧‧鏡面 91‧‧‧Mirror

92‧‧‧雷射光束 92‧‧‧laser beam

第一圖係本發明穿透式雷射直接成像系統的立體結構示意圖。 The first figure is a schematic diagram of the three-dimensional structure of the penetrating laser direct imaging system of the present invention.

第二圖係第一圖之穿透式雷射直接成像系統中之雷射曝光裝置之立體結構示意圖。 The second figure is a schematic diagram of the three-dimensional structure of the laser exposure device in the penetrating laser direct imaging system of the first figure.

第三圖係第二圖的一局部放大示意圖。 The third diagram is a partially enlarged schematic diagram of the second diagram.

第四圖係第二圖之雷射曝光裝置的兩雷射模組與基板之俯視平面示意圖。 The fourth figure is a schematic plan view of two laser modules and a substrate of the laser exposure device of the second figure.

第五圖係第二圖之雷射曝光裝置的其中一雷射模組之立體結構示意圖。 The fifth figure is a schematic diagram of the three-dimensional structure of a laser module of the laser exposure device in the second figure.

第六圖係第五圖之雷射模組之部分斷面結構示意圖。 The sixth figure is a partial cross-sectional structure diagram of the laser module in the fifth figure.

第七圖係第六圖中沿著VII-VII線剖切的一斷面示意圖。 The seventh figure is a schematic sectional view taken along the line VII-VII in the sixth figure.

第八A至八C圖係顯示本發明之多稜鏡掃描器在轉動一角度時使得雷射光束在基板上形成一條狀雷射光斑的過程。 The eighth diagrams A through C show the process of the laser beam forming a laser spot on the substrate when the multi-scanner scanner of the present invention rotates an angle.

第九圖係在X-Y坐標軸上呈現該雷射曝光裝置所形成之條狀雷射光斑的示意圖。 The ninth figure is a schematic view showing the stripe laser spot formed by the laser exposure device on the X-Y coordinate axis.

第十圖係顯示本發明之多稜鏡掃描器在掃描時雷射光束能垂直入射基板表面,不因基板高度變化而造成聚焦點偏移。 The tenth figure shows that the laser beam of the multi-scanner scanner of the present invention can vertically enter the surface of the substrate during scanning, without causing the focus point to shift due to the change of the substrate height.

第十一圖係顯示習知多面鏡掃描器在進行雷射光束掃描時因基板高度變化造成聚焦點偏移的情形。 The eleventh figure shows a situation in which the focus point is shifted due to a change in the substrate height when the conventional polygon scanner is scanning a laser beam.

第十二圖係顯示習知鏡面因轉動角度不同在反射雷射光束時造成影像周圍失焦的情形。 The twelfth figure shows the situation where the conventional mirror surface is out of focus when the laser beam is reflected due to different rotation angles.

第一至十圖係顯示本發明穿透式雷射直接成像系統100的一個較佳實施例,用以將一數位圖案資訊直接寫入一基板4,以在該基板4表面的一感光層41(第八圖)形成一潛像圖案。如第一圖所示,該穿透式雷射直接成像系統100大致包括一機台1、一雷射曝光裝置2及一控制單元3。該雷射曝光裝置2係設於該機台1的一龍門12上。該機台1具有一載台11,供承載該基板4。 The first to tenth drawings show a preferred embodiment of the penetrating laser direct imaging system 100 of the present invention, which is used to directly write a digital pattern information into a substrate 4 to form a photosensitive layer 41 on the surface of the substrate 4 (Eighth Figure) A latent image pattern is formed. As shown in the first figure, the penetrating laser direct imaging system 100 generally includes a machine 1, a laser exposure device 2, and a control unit 3. The laser exposure device 2 is disposed on a gantry 12 of the machine 1. The machine 1 has a carrier 11 for carrying the substrate 4.

具體而言,該載台11連同其上之基板4可沿一Y方向前進,而與該龍門12上之該雷射曝光裝置2相對位移。此外,該雷射曝光裝置2能在與該載台11相對位移的過程中,使得該基板之感光層41在X方向上的每個位置點皆能受到該雷射曝光裝置2之選擇性曝光,以在該感光層41上形成二維之潛像圖案(未顯示)。該潛像圖案可經由後續的一顯影製程而在該基板4上被具象化。 Specifically, the stage 11 and the substrate 4 thereon can be advanced in a Y direction, and are relatively displaced from the laser exposure device 2 on the gantry 12. In addition, the laser exposure device 2 can make each position of the photosensitive layer 41 of the substrate in the X direction be selectively exposed by the laser exposure device 2 during the relative displacement with the stage 11. To form a two-dimensional latent image pattern (not shown) on the photosensitive layer 41. The latent image pattern can be embodied on the substrate 4 through a subsequent development process.

第二圖係顯示第一圖中之該雷射曝光裝置2與該基板4的位置關係示意圖。其中,該雷射曝光裝置2具有結構完全相同的一第一雷射模組5及一第二雷射模組6。如第四圖之平面圖所示,該第一及第二雷射模組5、6彼此相互平行,但傾斜於該基板4的前進方向(也就是Y方向)。 The second diagram is a schematic diagram showing the positional relationship between the laser exposure device 2 and the substrate 4 in the first diagram. The laser exposure device 2 includes a first laser module 5 and a second laser module 6 having the same structure. As shown in the plan view of the fourth figure, the first and second laser modules 5 and 6 are parallel to each other, but inclined to the advancing direction of the substrate 4 (that is, the Y direction).

為簡化起見,今僅以該第一雷射模組5為例說明, 該第二雷射模組6之結構得比照該第一雷射模組5之結構。如第五及六圖所示,該第一雷射模組5包括一線性雷射光源51、一光學組件52、一穿透式掃描器53及一水冷卻系統54。其中,該線性雷射光源51之長度方向(M)傾斜於X方向(如第四圖所示),且包括複數雷射二極體510(如第六圖所示),沿該線性雷射光源51之長度方向(M)間隔排列,用以輸出相互平行的多道雷射光束511。同樣地,該光學組件52具有成排沿該線性雷射光源51之長度方向(M)設置的複數聚焦透鏡單元520,用以分別對應地將該些雷射光束511聚焦至該基板4。每一聚焦透鏡單元520包括一鏡筒521及設於該鏡筒521內的聚焦透鏡522。如第七圖所示,該鏡筒521恰軸向套設於對應之雷射二極體510的一基座512上,而該基座512復再被固定於一舟架513上。如此,可以省去每一個雷射二極體510與對應之聚焦透鏡522之間原本在光學軸上需要彼此繁複精準的對位問題。如第五圖所示,該水冷卻系統54係連接該線性雷射光源51之該些舟架513,用以對該線性雷射光源51之該些雷射二極體510進行散熱,以防止過熱失效。 For simplicity, this first laser module 5 is used as an example for illustration. The structure of the second laser module 6 is comparable to the structure of the first laser module 5. As shown in the fifth and sixth figures, the first laser module 5 includes a linear laser light source 51, an optical component 52, a penetrating scanner 53, and a water cooling system 54. The length direction (M) of the linear laser light source 51 is inclined to the X direction (as shown in the fourth figure), and includes a complex laser diode 510 (as shown in the sixth figure). The light sources 51 are arranged at intervals in the length direction (M) to output a plurality of laser beams 511 parallel to each other. Similarly, the optical component 52 has a plurality of focusing lens units 520 arranged in a row along the length direction (M) of the linear laser light source 51 to respectively focus the laser beams 511 to the substrate 4 correspondingly. Each focusing lens unit 520 includes a lens barrel 521 and a focusing lens 522 disposed in the lens barrel 521. As shown in the seventh figure, the lens barrel 521 is axially sleeved on a base 512 of the corresponding laser diode 510, and the base 512 is further fixed on a boat frame 513. In this way, it is possible to eliminate the need for complicated and precise alignment between each laser diode 510 and the corresponding focusing lens 522 on the optical axis. As shown in the fifth figure, the water cooling system 54 is connected to the boat racks 513 of the linear laser light source 51 to dissipate the laser diodes 510 of the linear laser light source 51 to prevent heat. Overheating failure.

復參閱第六圖,該穿透式掃描器53具有一多稜鏡531及用以驅使該多稜鏡531轉動的一馬達532。該多稜鏡531之轉軸平行於該線性雷射光源51之長度方向(M),且該多稜鏡531具有多個刻面533,供該些雷射光束511射入。如第八A圖所示,該多稜鏡531之每一刻面533皆能使每一條入射的雷射光束511產生偏折,並經該多稜鏡531之折射後平行出光,並在轉動一角度後(如第八C圖)在該基板4的感光層41的一斜向掃描路徑(N)上形成一條狀曝光光斑S。 Referring again to the sixth figure, the penetrating scanner 53 has a multi-roller 531 and a motor 532 for driving the multi-roller 531 to rotate. The axis of rotation of the multiple beams 531 is parallel to the length direction (M) of the linear laser light source 51, and the multiple beams 531 has a plurality of facets 533 for the laser beams 511 to enter. As shown in FIG. 8A, each facet 533 of the multi-roller 531 can deflect each incident laser beam 511 and emit light in parallel after being refracted by the multi-roller 531. After the angle (as shown in FIG. 8C), a stripe-shaped exposure spot S is formed on an oblique scanning path (N) of the photosensitive layer 41 of the substrate 4.

參閱第三圖之放大圖所示,相鄰之兩雷射光束511a、511b所形成之條狀曝光光斑S11、S12在X方向上之投影存在部分重疊。同樣地,如第九圖所示,相鄰兩雷射模組5、6所產生之條狀雷射光斑也存在部分重疊,其中該第一雷射模組5之最後一道雷射光束511l所形成之條狀曝光光斑S1N與該第二雷射模組6之第一道 雷射光束611a所形成之條狀曝光光斑S21在X方向上之投影存在部分重疊。換言之,該第一雷射模組5的該些雷射二極體510確實能夠在X方向上對該基板4之感光層41的不同位置曝光,且在該基板4前進被掃描的過程中,該控制單元3(第一圖)可控制該雷射曝光裝置2之該些雷射二極體510的開關,並使得每一曝光光斑或未曝光的位置形成該潛像圖案的一畫素點,且相鄰畫素點不會產生空白間隙。此外,如第十圖所示,本發明之穿透式掃描器53之多稜鏡531更具有對焦精準之優點,雷射光束在經過該多稜鏡531之折射後,基板4的高度變化並不會造成聚焦點F1、F2的位置偏移。 Referring to the enlarged view of the third figure, the projections in the X direction of the stripe exposure spots S 11 and S 12 formed by two adjacent laser beams 511 a and 511 b partially overlap. Similarly, as shown in the ninth figure, the stripe laser spots generated by two adjacent laser modules 5 and 6 also partially overlap, and the last laser beam 5111 of the first laser module 5 is partially overlapped. The projected stripe exposure spot S 1N and the projection of the stripe exposure spot S 21 formed by the first laser beam 611 a of the second laser module 6 in the X direction are partially overlapped. In other words, the laser diodes 510 of the first laser module 5 can indeed be exposed to different positions of the photosensitive layer 41 of the substrate 4 in the X direction, and during the progress of the substrate 4 being scanned, The control unit 3 (first picture) can control the switches of the laser diodes 510 of the laser exposure device 2 and make each exposure spot or unexposed position form a pixel point of the latent image pattern. , And there will be no blank gap between adjacent pixel points. In addition, as shown in the tenth figure, the 稜鏡 531 of the penetrating scanner 53 of the present invention has the advantage of accurate focusing. After the laser beam is refracted by the 稜鏡 531, the height of the substrate 4 changes and The position of the focus points F 1 and F 2 will not be shifted.

藉由上述設置,本發明之穿透式雷射直接成像系統藉由其穿透式的掃描器來直接成像,可以避免反射式掃描器的失焦或焦點偏移等問題,且其所搭配的光學系統也得以大幅簡化,得以大幅降低設備成本。此外,本發明穿透式雷射直接成像系統之雷射曝光裝置係採用成排之多顆雷射二極體的線性掃描方式,更可以大幅提高掃描速度。 With the above setting, the penetrating laser direct imaging system of the present invention directly images through its penetrating scanner, which can avoid problems such as out-of-focus or focus shift of the reflective scanner, and its matching The optical system has also been greatly simplified, which can significantly reduce equipment costs. In addition, the laser exposure device of the penetrating laser direct imaging system of the present invention adopts a linear scanning method of a plurality of laser diodes in a row, which can greatly increase the scanning speed.

無論如何,任何人都可以從上述例子的說明獲得足夠教導,並據而了解本發明內容確實不同於先前技術,且具有產業上之利用性,及足具進步性。是本發明確已符合專利要件,爰依法提出申請。 In any case, anyone can get enough teaching from the description of the above examples, and understand that the content of the present invention is indeed different from the prior art, and has industrial applicability and is sufficiently progressive. It is true that the present invention has met the patent requirements, and the application was filed according to law.

Claims (5)

一種穿透式雷射直接成像系統,包括: 一載台,供承載一基板,該基板塗佈有一感光層; 一雷射曝光裝置,可與該載台於一Y方向上相對位移,且在位移過程中,該載台上之基板的感光層在一X方向上的位置點也能受到該雷射曝光裝置之選擇性曝光,以構成一潛像圖案,其中該雷射曝光裝置具有一第一雷射模組,該第一雷射模組包括: 一線性雷射光源,包括沿其長度方向間隔排列之複數雷射二極體,用以輸出相互平行的多道雷射光束,其中該線性雷射光源之長度方向傾斜於X方向; 一光學組件,具有複數聚焦透鏡單元,用以分別對應地將該些雷射光束聚焦至該基板;及 一穿透式掃描器,具有可轉動的一多稜鏡,該多稜鏡之轉軸平行於該線性雷射光源之長度方向,且具有多個刻面,供該些雷射光束射入,其中該多稜鏡之每一刻面皆能使每一條入射的雷射光束產生偏折,並經該多稜鏡之折射後平行出光,並在轉動一角度後在該基板的感光層的一斜向掃描路徑上形成一條狀曝光光斑,且相鄰之兩雷射光束所形成之條狀曝光光斑在X方向上之投影存在部分重疊。A penetrating laser direct imaging system includes: a carrier for carrying a substrate, the substrate is coated with a photosensitive layer; a laser exposure device can be relatively displaced with the carrier in a Y direction, and During the displacement process, the position of the photosensitive layer of the substrate on the stage in the X direction can also be selectively exposed by the laser exposure device to form a latent image pattern. The laser exposure device has a first A laser module. The first laser module includes: a linear laser light source including a plurality of laser diodes spaced apart along its length direction to output a plurality of laser beams parallel to each other, wherein The length direction of the linear laser light source is inclined to the X direction; an optical component having a plurality of focusing lens units for respectively correspondingly focusing the laser beams to the substrate; and a penetrating scanner having a rotatable A plurality of beams, the rotation axis of the plurality of beams is parallel to the length direction of the linear laser light source, and has multiple facets for the laser beams to enter, wherein each facet of the plurality of beams can make Every incident The light beam is deflected, and the light is parallelly emitted after being refracted by the multiple beams. After being rotated an angle, a stripe of exposure light is formed on an oblique scanning path of the photosensitive layer of the substrate, and two adjacent lasers The projections of the stripe-shaped exposure spots formed by the light beams in the X direction partially overlap. 如申請專利範圍第1項所述之穿透式雷射直接成像系統,其中該雷射曝光裝置更包括一第二雷射模組,其結構相同於該第一雷射模組,其中該第一雷射模組之最後一道雷射光束所形成之條狀曝光光斑與該第二雷射模組之第一道雷射光束所形成之條狀曝光光斑在X方向上之投影存在部分重疊。According to the penetrating laser direct imaging system described in item 1 of the patent application scope, wherein the laser exposure device further includes a second laser module having the same structure as the first laser module, wherein the first The stripe exposure spot formed by the last laser beam of a laser module and the projection of the stripe exposure spot formed by the first laser beam of the second laser module in the X direction partially overlap. 如申請專利範圍第1項所述之穿透式雷射直接成像系統,其中該雷射曝光裝置的第一雷射模組更包括一水冷卻系統,用以對該第一雷射模組之線性雷射光源進行散熱。The penetrating laser direct imaging system according to item 1 of the patent application scope, wherein the first laser module of the laser exposure device further includes a water cooling system for the first laser module. The linear laser light source dissipates heat. 如申請專利範圍第1項所述之穿透式雷射直接成像系統,其中該雷射曝光裝置的第一雷射模組之每一聚焦透鏡單元包括一鏡筒及設於該鏡筒內的一聚焦透鏡,且該鏡筒恰軸向套設於對應之雷射二極體的一基座上。According to the penetrating laser direct imaging system described in item 1 of the patent application scope, wherein each focusing lens unit of the first laser module of the laser exposure device includes a lens barrel and a A focusing lens, and the lens barrel is sleeved axially on a base of the corresponding laser diode. 如申請專利範圍第1項所述之穿透式雷射直接成像系統,其中該多稜鏡係設於該光學組件之該些聚焦透鏡與該載台之間的光學路徑上。The penetrating laser direct imaging system according to item 1 of the scope of the patent application, wherein the plurality of beams are disposed on an optical path between the focusing lenses of the optical component and the stage.
TW105143997A 2016-12-29 2016-12-29 Transmissive laser direct imaging system TWI625604B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW105143997A TWI625604B (en) 2016-12-29 2016-12-29 Transmissive laser direct imaging system
CN201710057512.5A CN108255020A (en) 2016-12-29 2017-01-26 Penetration type laser direct imaging system
CN201711203316.0A CN108255021A (en) 2016-12-29 2017-11-27 Maskless laser direct writing exposure machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW105143997A TWI625604B (en) 2016-12-29 2016-12-29 Transmissive laser direct imaging system

Publications (2)

Publication Number Publication Date
TWI625604B true TWI625604B (en) 2018-06-01
TW201823871A TW201823871A (en) 2018-07-01

Family

ID=62721716

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105143997A TWI625604B (en) 2016-12-29 2016-12-29 Transmissive laser direct imaging system

Country Status (2)

Country Link
CN (1) CN108255020A (en)
TW (1) TWI625604B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11687065B2 (en) 2020-12-18 2023-06-27 Industrial Technology Research Institute Method and system for generating and updating position distribution graph

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109491212A (en) * 2018-11-02 2019-03-19 深圳市先地图像科技有限公司 A kind of device and its application method of laser linear multi mechanical scanning imaging

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW523968B (en) * 2000-10-10 2003-03-11 3M Innovative Properties Co Direct laser imaging system
US20030189746A1 (en) * 2000-06-08 2003-10-09 Marc Vernackt System, method and article of manufacture for improved laser direct imaging a printed circuit board utilizing a mode locked laser and scophony operation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4508743B2 (en) * 2004-03-31 2010-07-21 日立ビアメカニクス株式会社 Pattern exposure method and pattern exposure apparatus
US20090002669A1 (en) * 2007-06-29 2009-01-01 Optical Associates, Inc. Ultraviolet light-emitting diode exposure apparatus for microfabrication
CN106537224B (en) * 2014-04-15 2019-11-26 荷兰应用科学研究会(Tno) Photohead, exposure device and the method for operating photohead

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030189746A1 (en) * 2000-06-08 2003-10-09 Marc Vernackt System, method and article of manufacture for improved laser direct imaging a printed circuit board utilizing a mode locked laser and scophony operation
TW523968B (en) * 2000-10-10 2003-03-11 3M Innovative Properties Co Direct laser imaging system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11687065B2 (en) 2020-12-18 2023-06-27 Industrial Technology Research Institute Method and system for generating and updating position distribution graph

Also Published As

Publication number Publication date
TW201823871A (en) 2018-07-01
CN108255020A (en) 2018-07-06

Similar Documents

Publication Publication Date Title
EP2267534A1 (en) Illumination system
CN1677240A (en) Exposing device
JP2004012903A (en) Aligner
KR100844262B1 (en) Pattern writing apparatus and pattern writing method
JP2005003762A (en) Method for identifying pixel location, method for correcting image deviation, and image forming apparatus
TWI625604B (en) Transmissive laser direct imaging system
JP2006047958A (en) Exposure device and exposure method
TWI666526B (en) Maskless laser direct imaging system
JP2007304517A (en) Exposure method and device for direct drawing system
KR102439363B1 (en) Exposure head for exposure device and projection optical system for exposure device
JP4589788B2 (en) Laser irradiation method
CN108255021A (en) Maskless laser direct writing exposure machine
JP2009210726A (en) Maskless exposure apparatus
JP4979462B2 (en) Image exposure device
JP2006293197A (en) Exposure light source using semiconductor laser
TW202244629A (en) Exposure apparatus
JP2007293099A (en) Direct exposure device
JP2009244616A (en) Laser direct drawing method and laser direct drawing device
US8089614B2 (en) Device for changing pitch between light beam axes, and substrate exposure apparatus
TW202024796A (en) Exposure apparatus
CN216351771U (en) Optical system of direct-writing type photoetching machine
CN212647263U (en) Exposure equipment
CN112026174B (en) Device and method for improving 3D printing precision by using DMD dynamic exposure
JP7196271B2 (en) Direct imaging exposure apparatus and direct imaging exposure method
US20210063884A1 (en) Mask-less laser direct imaging system