TWI582415B - Image processing apparatus, image acquiring apparatus, image processing method, and image acquiring method - Google Patents

Image processing apparatus, image acquiring apparatus, image processing method, and image acquiring method Download PDF

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TWI582415B
TWI582415B TW104116214A TW104116214A TWI582415B TW I582415 B TWI582415 B TW I582415B TW 104116214 A TW104116214 A TW 104116214A TW 104116214 A TW104116214 A TW 104116214A TW I582415 B TWI582415 B TW I582415B
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value
image
luminance
target pixel
target
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TW201612505A (en
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安田拓矢
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斯克林集團公司
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影像處理裝置,影像取得裝置,影像處理方法及影像取得方法 Image processing device, image acquisition device, image processing method and image acquisition method

本發明係關於處理影像之技術及取得影像之技術。 The present invention relates to techniques for processing images and techniques for acquiring images.

近年來,於各種之電子機器中設置有FPD(Flat Panel Display)。當於此種顯示裝置之製造中對形成於透明基材上之透明電極膜等之透明圖案的外觀進行檢查時,例如對基材照射光,且藉由接收反射光而取得圖案之影像。於日本專利特開2013-68460號公報(文獻1)中揭示有一種裝置,其一面將自光照射部至基材上之攝影區域之光軸與基材之法線所夾之照射角、及自攝影區域至線感測器之光軸與該法線所夾之檢測角維持為相等角度,一面取得影像。於該裝置中,係利用影像之對比變高之照射角及檢測角之設定角度。 In recent years, FPD (Flat Panel Display) has been installed in various electronic devices. When the appearance of the transparent pattern of the transparent electrode film or the like formed on the transparent substrate is inspected in the manufacture of such a display device, for example, the substrate is irradiated with light, and the image of the pattern is obtained by receiving the reflected light. Japanese Laid-Open Patent Publication No. 2013-68460 (Document 1) discloses a device in which an irradiation angle between an optical axis of a photographing region on a substrate and a normal line of a substrate from a light-irradiating portion to a substrate, and The image is taken while the optical axis from the photographing area to the line sensor is maintained at an equal angle to the detection angle of the normal line. In this device, the angle of illumination and the angle of detection of the detection angle are increased by contrast of the image.

再者,於日本專利特開2008-205737號公報(文獻2)中,揭示有一種獲取保存了邊界(edge)之平滑化模型之方法。於該方法中,計算目標區域中之目標像素(target pixel)與周邊像素之像素值乖離率及位置乖離率,使用像素值乖離率及位置乖離率求取相關指標值。然後自該相關指標值求取周邊像素之過濾係數,自像素值乖離率求取目標像素之過濾係數,且使用該過濾係數進行過濾演算。此外,作為可一面保存邊界一面除去雜訊之平滑處理方法,還 知有邊向過濾器(bilateral filter)、及ε過濾器。 Further, in Japanese Laid-Open Patent Publication No. 2008-205737 (Document 2), there is disclosed a method of acquiring a smoothing model in which an edge is stored. In the method, the pixel value deviation rate and the position deviation rate of the target pixel and the surrounding pixels in the target area are calculated, and the correlation index value is obtained by using the pixel value deviation rate and the position deviation rate. Then, the filter coefficient of the peripheral pixel is obtained from the correlation index value, and the filter coefficient of the target pixel is obtained from the pixel value deviation rate, and the filter coefficient is used to perform the filter calculation. In addition, as a smoothing method for removing noise while saving the boundary, Known as a lateral filter, and an ε filter.

然而,於透明之基材含有微小顆粒狀物質(所謂填料)之情況、或基材之表面存在有微小凹凸之情況等,於攝影之影像上存在有多數之顆粒狀要素,而無法精度良好地進行圖案之檢查。也可考慮藉由一面保存邊界一面除去雜訊之上述影像處理而將顆粒狀要素除去,但於顆粒狀要素之對比較圖案區域之邊界的對比更高之情況下,顆粒狀要素也會與圖案區域之邊界一併被保存。 However, in the case where the transparent substrate contains fine particulate matter (so-called filler) or the surface of the substrate has minute irregularities, there are many particulate elements in the image to be photographed, and the precision cannot be accurately performed. Perform a pattern check. It is also conceivable to remove the particulate elements by the above-described image processing for removing noise while preserving the boundary, but in the case where the contrast of the boundary of the comparative pattern regions of the particulate elements is higher, the granular elements are also associated with the pattern. The boundaries of the area are saved together.

本發明係適用於影像處理裝置,其目的在於,於含有較圖案區域之邊界的對比更高之顆粒狀要素之影像中,可一面保存圖案區域之邊界一面除去對比高之顆粒狀要素。 The present invention is applied to an image processing apparatus, and an object thereof is to remove a relatively high granular element while maintaining a boundary of a pattern region in a relatively high contrast image of a granular element having a boundary of a pattern region.

本發明之影像處理裝置,其包含:代表值取得部,其於顯示圖案區域並含有較上述圖案區域之邊界的對比更高之顆粒狀要素之影像中,將各像素作為目標像素,取得以上述目標像素為中心之規定尺寸之區域內包含之複數個對象像素的亮度值之代表值;基準值設定部,其於上述目標像素之亮度值在以上述代表值為中心而設定之亮度值範圍內之情況下,將上述目標像素之亮度值作為基準值進行設定,而於上述目標像素之亮度值在上述亮度值範圍外之情況下,將上述代表值作為基準值進行設定,或者,與上述目標像素之亮度值無關地,將上述代表值作為基準值進行設定;及過濾處理部,其使用上述複數個對象像素之亮度值,並藉由進行各對象像素之亮度值與上述基準值之差越小則對上述各對象像素之亮度值之加權越大之過濾處理,求取上述目標像素之新的亮度值。 An image processing device according to the present invention includes: a representative value acquisition unit that acquires each of the pixels as a target pixel in a display image region and includes a higher contrast image of the granular element than a boundary of the pattern region a representative value of a luminance value of a plurality of target pixels included in a region of a predetermined size centered on the target pixel; and a reference value setting portion in which the luminance value of the target pixel is within a luminance value set with the representative value as a center In the case where the luminance value of the target pixel is set as a reference value, and when the luminance value of the target pixel is out of the luminance value range, the representative value is set as a reference value, or the target is Regardless of the luminance value of the pixel, the representative value is set as a reference value, and the filtering processing unit uses the luminance values of the plurality of target pixels, and the difference between the luminance value of each target pixel and the reference value is In the case of filtering, the weighting of the luminance values of the above-mentioned respective object pixels is larger, and the new target pixel is obtained. Luminance value.

根據本發明,於顯示圖案區域並含有較圖案區域之邊界的對比高之顆粒狀要素之影像中,可一面保存圖案區域之邊界一面除去對比高之顆粒狀要素。 According to the present invention, in the image of the comparatively high granular element which displays the pattern area and contains the boundary of the pattern area, the grain element of the contrast can be removed while the boundary of the pattern area is preserved.

本發明之一較佳形態中,上述代表值取得部係求取顯示上述複數個對象像素中之亮度值之不均之值,上述基準值設定部係基於顯示上述不均之值而決定上述亮度值範圍之寬度,且使用上述亮度值範圍來設定上述基準值。 In a preferred aspect of the present invention, the representative value obtaining unit obtains a value indicating unevenness of luminance values in the plurality of target pixels, and the reference value setting unit determines the brightness based on a value indicating the unevenness. The width of the value range, and the above reference value is set using the above-described range of luminance values.

本發明之另一較佳形態中,上述過濾處理部係於上述過濾處理中,將上述複數個對象像素中的亮度值落在以上述代表值為中心而設定之亮度值範圍外之對象像素之上述亮度值排除。 According to still another preferred aspect of the present invention, the filtering processing unit is configured to reduce a luminance value of the plurality of target pixels to a target pixel outside a luminance value range set by the representative value. The above brightness values are excluded.

本發明之另一較佳形態中,於上述過濾處理中,上述各對象像素與上述目標像素之距離越小,則對上述各對象像素之亮度值之加權越大。 According to still another preferred mode of the present invention, in the filtering process, the smaller the distance between each of the target pixels and the target pixel, the greater the weighting of the luminance values of the target pixels.

本發明之一局面中,上述影像係顯示形成於透明基材上之透明電極膜之影像。 In one aspect of the invention, the image is an image of a transparent electrode film formed on a transparent substrate.

本發明還適用於取得形成在基材上之薄膜圖案之影像之影像取得裝置。本發明之影像取得裝置包含:攝影單元,其藉由對上述基材進行拍攝而取得攝影影像;及上述影像處理裝置,其對上述攝影影像進行處理。 The present invention is also applicable to an image acquisition device that obtains an image of a thin film pattern formed on a substrate. The image acquisition device of the present invention includes: a photographing unit that acquires a photographed image by photographing the substrate; and the image processing device that processes the photographed image.

本發明還適用於影像處理方法及取得形成於基材上之薄膜圖案之影像之影像取得方法。 The present invention is also applicable to an image processing method and an image acquisition method for obtaining an image of a thin film pattern formed on a substrate.

上述之目的及其他之目的、特徵、態樣以及長處,藉由參照所附圖式及以下進行之本發明之詳細說明,而可明確瞭解。 The above and other objects, features, aspects and advantages of the present invention will become apparent from

1‧‧‧影像取得裝置 1‧‧‧Image acquisition device

3‧‧‧電腦 3‧‧‧ computer

8‧‧‧攝影影像 8‧‧‧Photographic images

8a‧‧‧處理完畢影像 8a‧‧‧Processed image

9‧‧‧基材 9‧‧‧Substrate

11‧‧‧移動機構 11‧‧‧Mobile agencies

13‧‧‧攝影單元 13‧‧‧Photographic unit

21‧‧‧工作台 21‧‧‧Workbench

22‧‧‧X方向移動部 22‧‧‧X direction moving department

23‧‧‧Y方向移動部 23‧‧‧Y direction moving department

30‧‧‧記錄媒體 30‧‧‧Recording media

31‧‧‧CPU 31‧‧‧CPU

32‧‧‧ROM 32‧‧‧ROM

33‧‧‧RAM 33‧‧‧RAM

34‧‧‧固定碟 34‧‧‧Fixed disc

35‧‧‧顯示器 35‧‧‧ display

36a‧‧‧鍵盤 36a‧‧‧ keyboard

36b‧‧‧滑鼠 36b‧‧‧mouse

37‧‧‧讀取裝置 37‧‧‧Reading device

38‧‧‧通信部 38‧‧‧Communication Department

41‧‧‧影像處理部 41‧‧‧Image Processing Department

42‧‧‧檢查部 42‧‧‧Inspection Department

49‧‧‧記憶部 49‧‧‧Memory Department

71、72‧‧‧目標像素 71, 72‧‧‧ target pixel

81‧‧‧圖案區域 81‧‧‧pattern area

82‧‧‧背景區域 82‧‧‧Background area

90‧‧‧攝影區域 90‧‧‧Photography area

91‧‧‧圖案 91‧‧‧ pattern

92‧‧‧顆粒狀物質 92‧‧‧Particulate matter

99‧‧‧處理完畢影像 99‧‧‧Processed image

131‧‧‧光照射部 131‧‧‧Lighting Department

132‧‧‧線感測器 132‧‧‧ line sensor

133‧‧‧角度變更機構 133‧‧‧ Angle Change Agency

134‧‧‧基台壁 134‧‧‧Abutment wall

135‧‧‧馬達 135‧‧ ‧motor

136‧‧‧馬達 136‧‧ ‧ motor

201‧‧‧第1開口 201‧‧‧ first opening

202‧‧‧第2開口 202‧‧‧2nd opening

300‧‧‧程式 300‧‧‧ program

411‧‧‧代表值取得部 411‧‧‧ Representative Value Acquisition Department

412‧‧‧基準值設定部 412‧‧‧ benchmark setting unit

413‧‧‧過濾處理部 413‧‧‧Filter Processing Department

491‧‧‧攝影影像資料 491‧‧‧Photographic data

492‧‧‧處理完畢影像資料 492‧‧‧Processed image data

711、721‧‧‧對象區域 711, 721‧‧‧ object area

811‧‧‧邊界 811‧‧‧ border

831~833‧‧‧顆粒狀要素 831~833‧‧‧Grain elements

d‧‧‧顯示亮度值之不均之值 d‧‧‧Displays the value of the unevenness of the brightness value

J1、J2‧‧‧光軸 J1, J2‧‧‧ optical axis

k、l‧‧‧對象像素 k, l‧‧‧ object pixels

m‧‧‧亮度值之代表值 M‧‧‧ representative value of brightness value

N‧‧‧法線 N‧‧‧ normal

P1、P2‧‧‧(目標像素之)亮度值 P1, P2‧‧‧ (target pixel) brightness value

PA‧‧‧代表值 PA‧‧‧ representative value

R1、R2‧‧‧基準值判斷範圍 R1, R2‧‧‧ reference value judgment range

S11~S18‧‧‧步驟 S11~S18‧‧‧Steps

S、σd、σv‧‧‧係數 S, σ d , σ v ‧ ‧ coefficient

θ1、θ2‧‧‧角度 Θ1, θ2‧‧‧ angle

圖1為顯示影像取得裝置之構成之圖。 Fig. 1 is a view showing the configuration of an image acquisition device.

圖2為顯示電腦之構成之圖。 Figure 2 is a diagram showing the composition of a computer.

圖3為顯示由電腦實現之功能構成之方塊圖。 Figure 3 is a block diagram showing the functional configuration of a computer.

圖4為顯示對基材上之圖案進行檢查之處理流程之圖。 Fig. 4 is a view showing a processing flow for inspecting a pattern on a substrate.

圖5為顯示基材之剖視圖。 Figure 5 is a cross-sectional view showing the substrate.

圖6為顯示攝影影像之圖。 Fig. 6 is a view showing a photographic image.

圖7為顯示對象區域之亮度值分布之圖。 Fig. 7 is a view showing a distribution of luminance values of an object area.

圖8為顯示對象區域之亮度值分布之圖。 Fig. 8 is a view showing a distribution of luminance values of an object area.

圖9為顯示處理完畢影像之圖。 Figure 9 is a diagram showing the processed image.

圖10為顯示藉由比較例之處理之處理完畢影像之圖。 Fig. 10 is a view showing a processed image by the processing of the comparative example.

圖1為顯示本發明之一實施形態之影像取得裝置1之構成之圖。影像取得裝置1係取得形成於基材9上之薄膜圖案之影像,並基於該影像進行薄膜圖案之外觀檢查。亦即,影像取得裝置1包含作為圖案檢查裝置之功能。本實施形態中,基材9係玻璃基板或透明薄膜。薄膜圖案例如為透明電極膜。也可於基材9上設置抗反射膜等其他之膜。以下之說明中,將薄膜圖案簡稱為「圖案」。基材9例如用於靜電電容型之觸控面板之製造。 Fig. 1 is a view showing the configuration of an image acquisition device 1 according to an embodiment of the present invention. The image capturing device 1 acquires an image of a film pattern formed on the substrate 9, and performs an appearance inspection of the film pattern based on the image. That is, the image acquisition device 1 includes a function as a pattern inspection device. In the present embodiment, the substrate 9 is a glass substrate or a transparent film. The thin film pattern is, for example, a transparent electrode film. Other films such as an antireflection film may be provided on the substrate 9. In the following description, the thin film pattern is simply referred to as "pattern". The substrate 9 is used, for example, for the manufacture of a capacitive touch panel.

影像取得裝置1具備:移動基材9之移動機構11;攝影單元13;及電腦3。移動機構11具備:工作台21,其將基材9保持於工作台21上面;X方向移動部22,其使工作台21朝與基材9之主表面平行之圖1中的X方向移動;及Y方向移動部23,其使X方向移動部22朝平行於基材9之主表面且垂直於X方向之 Y方向移動。移動機構11係使基材9相對於後述之攝影區域90相對地移動之機構。再者,也可於移動機構11追加使工作台21朝垂直於X方向及Y方向之圖1中的Z方向移動之機構、或者使工作台21以平行於Z方向之軸為中心進行轉動之機構。於影像取得裝置1中,電腦3係發揮作為擔當影像取得裝置1之整體控制之整體控制部之作用。 The image acquisition device 1 includes a moving mechanism 11 that moves the substrate 9, a photographing unit 13, and a computer 3. The moving mechanism 11 includes a table 21 that holds the substrate 9 on the upper surface of the table 21, and an X-direction moving portion 22 that moves the table 21 in the X direction in FIG. 1 parallel to the main surface of the substrate 9; And the Y-direction moving portion 23 that makes the X-direction moving portion 22 parallel to the main surface of the substrate 9 and perpendicular to the X direction Move in the Y direction. The moving mechanism 11 is a mechanism that relatively moves the substrate 9 relative to the imaging region 90 to be described later. Further, the moving mechanism 11 may be configured to move the table 21 in the Z direction perpendicular to the X direction and the Y direction in the Z direction, or to rotate the table 21 around the axis parallel to the Z direction. mechanism. In the image acquisition device 1, the computer 3 functions as an overall control unit that controls the overall control of the image acquisition device 1.

攝影單元13具備:光照射部131,其朝基材9上之攝影區域90射出光;線感測器132,其接收來自攝影區域90之反射光;及角度變更機構133,其對光照射部131之光的照射角及線感測器132之檢測角進行變更。其中,照射角係自光照射部131至攝影區域90之光軸J1與基材9之法線N所夾之角度θ1。檢測角係自攝影區域90至線感測器132之光軸J2與法線N所夾之角度θ2。 The photographing unit 13 includes a light irradiation unit 131 that emits light toward the imaging region 90 on the substrate 9, a line sensor 132 that receives reflected light from the imaging region 90, and an angle changing mechanism 133 that is opposite to the light irradiation portion. The illumination angle of the light of 131 and the detection angle of the line sensor 132 are changed. The irradiation angle is an angle θ1 between the optical axis J1 of the light-irradiating portion 131 and the imaging region 90 and the normal line N of the substrate 9. The angle of the detection angle θ2 from the photographing area 90 to the optical axis J2 of the line sensor 132 and the normal line N is detected.

光照射部131係射出對圖案具有穿透性之波長之光。光至少照射於線狀之攝影區域90。光照射部131具備排列於X方向之複數個LED、及將來自LED之光均勻化後朝延伸於X方向之攝影區域90導引之光學系統。線感測器132具備一維之攝影元件、及使攝影區域90與攝影元件之受光面成為光學地共軛之光學系統。再者,也可於攝影單元13設置使光照射部131、線感測器132及角度變更機構133一體朝基材9之法線N的方向移動之自動對焦機構。 The light irradiation unit 131 emits light of a wavelength that is transparent to the pattern. Light is incident on at least the linear photographic area 90. The light irradiation unit 131 includes a plurality of LEDs arranged in the X direction, and an optical system that guides the light from the LEDs and guides them toward the imaging region 90 extending in the X direction. The line sensor 132 includes a one-dimensional imaging element and an optical system that optically conjugates the imaging region 90 and the light receiving surface of the imaging element. Further, the photographing unit 13 may be provided with an autofocus mechanism that integrally moves the light irradiation unit 131, the line sensor 132, and the angle changing mechanism 133 in the direction of the normal line N of the substrate 9.

於後述之攝影影像之取得時,基材9藉由移動機構11朝與攝影區域90交叉之方向移動。亦即,移動機構11係使基材9相對於攝影區域90相對地移動之機構。與基材9之移動同步,藉由線感測器132高速且重複地取得線狀之攝影區域90之線影像, 以取得二維之攝影影像。本實施形態中,基材9係朝相對於攝影區域90垂直之Y方向移動,但攝影區域90也可相對於移動方向呈傾斜。也可使拍攝基材9之攝影單元13內包含有移動機構11之一部分。 At the time of acquisition of the photographic image described later, the substrate 9 is moved in the direction intersecting the imaging region 90 by the moving mechanism 11. That is, the moving mechanism 11 is a mechanism that relatively moves the substrate 9 relative to the imaging region 90. In synchronization with the movement of the substrate 9, the line sensor 132 obtains a line image of the linear photographic area 90 at high speed and repeatedly. To obtain a two-dimensional photographic image. In the present embodiment, the substrate 9 is moved in the Y direction perpendicular to the imaging region 90, but the imaging region 90 may be inclined with respect to the moving direction. It is also possible to include a portion of the moving mechanism 11 in the photographing unit 13 of the photographing substrate 9.

角度變更機構133係一面將照射角θ1與檢測角θ2維持為相等一面對照射角θ1與檢測角θ2進行變更。因此,以下說明中之檢測角之大小也是照射角之大小,照射角之大小也是檢測角之大小。光照射部131及線感測器132經由角度變更機構133被支撐於基台壁134。基台壁134係平行於Y方向及Z方向之板構件。 The angle changing mechanism 133 changes the irradiation angle θ1 and the detection angle θ2 while maintaining the irradiation angle θ1 and the detection angle θ2 equal. Therefore, the magnitude of the detection angle in the following description is also the magnitude of the illumination angle, and the magnitude of the illumination angle is also the magnitude of the detection angle. The light irradiation unit 131 and the line sensor 132 are supported by the base wall 134 via the angle changing mechanism 133. The abutment wall 134 is a plate member parallel to the Y direction and the Z direction.

於基台壁134設置有以攝影區域90為中心之圓弧狀之第1開口201及第2開口202。角度變更機構133具有用以使光照射部131沿第1開口201移動之馬達135、暨導引部、齒條及小齒輪(省略圖示),並具有用以使線感測器132沿第2開口202移動之馬達136、暨導引部、齒條及小齒輪(省略圖示)。 The base wall 134 is provided with a first opening 201 and a second opening 202 which are arc-shaped around the imaging region 90. The angle changing mechanism 133 includes a motor 135, a nip guide, a rack and a pinion (not shown) for moving the light irradiation unit 131 along the first opening 201, and has a line sensor 132 along the line 2 Motor 136 in which opening 202 moves, cum guide, rack and pinion (not shown).

圖2為顯示電腦3之構成之圖。電腦3為普通之電腦系統之構成,其包括進行各種演算處理之CPU31、記憶基本程式之ROM32、及記憶各種資訊之RAM33。電腦3還包括:進行資訊記憶之固定碟34;進行影像等之各種資訊之顯示之顯示器35;受理來自操作者之輸入之鍵盤36a及滑鼠36b;自光碟、磁碟、光磁碟等之電腦可讀取之記錄媒體30進行資訊之讀取之讀取裝置37;及在與影像取得裝置1之其他構成之間傳送/接收信號之通信部38。 FIG. 2 is a view showing the configuration of the computer 3. The computer 3 is a general computer system, and includes a CPU 31 that performs various arithmetic processing, a ROM 32 that stores a basic program, and a RAM 33 that stores various kinds of information. The computer 3 further includes: a fixed disc 34 for performing information storage; a display 35 for displaying various information such as images; a keyboard 36a and a mouse 36b for accepting input from an operator; and a disc, a magnetic disc, a magneto-optical disc, etc. The computer-readable recording medium 30 reads the information from the recording device 37; and the communication unit 38 that transmits/receives signals between the other components of the image acquisition device 1.

於電腦3中,事先經由讀取裝置37自記錄媒體30讀取程式300且記憶於固定碟34。CPU31藉由程式300一面利用RAM33、固定碟34一面執行演算處理,實現後述之功能。 In the computer 3, the program 300 is read from the recording medium 30 via the reading device 37 in advance and stored in the fixed disk 34. The CPU 31 executes the arithmetic processing by using the RAM 33 and the fixed disk 34 by the program 300, thereby realizing the functions described later.

圖3為顯示由電腦3實現之功能構成之方塊圖,顯示藉由電腦3之CPU31、ROM32、RAM33、固定碟34等實現之功能構成。電腦3具有影像處理部41、檢查部42及記憶部49。影像處理部41具有代表值取得部411、基準值設定部412及過濾處理部413,對藉由攝影單元13取得之攝影影像進行後述之影像處理。記憶部49係記憶攝影影像資料491。對實現該等構成之功能之詳細內容,有待後述。再者,該等功能既可藉由專用之電路進行構建,也可局部利用專用之電路。 3 is a block diagram showing the functional configuration realized by the computer 3, showing the functional configuration realized by the CPU 31, the ROM 32, the RAM 33, the fixed disc 34, and the like of the computer 3. The computer 3 includes an image processing unit 41, an inspection unit 42, and a storage unit 49. The image processing unit 41 includes a representative value acquisition unit 411, a reference value setting unit 412, and a filtering processing unit 413, and performs image processing to be described later on the captured image obtained by the imaging unit 13. The memory unit 49 is a memory photographic image 491. The details of the functions for realizing such a configuration are to be described later. Furthermore, these functions can be constructed either by dedicated circuitry or by using dedicated circuitry locally.

圖4為顯示對基材9上之圖案進行檢查之處理流程之圖。於圖案檢查中,首先,準備形成有檢查對象之圖案之基材9,且將其載置於工作台21上(步驟S11)。圖5為顯示基材9之剖視圖。如已述,於基材9之主面上形成有透明電極膜之圖案91。此外,於基材9之內部含有微小之顆粒狀物質92(所謂填料)。顆粒狀物質92係分散於基材9之整體。 4 is a view showing a processing flow for inspecting a pattern on a substrate 9. In the pattern inspection, first, the substrate 9 on which the pattern to be inspected is formed is prepared and placed on the table 21 (step S11). FIG. 5 is a cross-sectional view showing the substrate 9. As described above, a pattern 91 of a transparent electrode film is formed on the main surface of the substrate 9. Further, a fine particulate matter 92 (so-called filler) is contained inside the substrate 9. The particulate material 92 is dispersed throughout the substrate 9.

本實施形態中,按照基材9上之各膜構造(膜之種類與厚度之組合),預先求取能提高在攝影影像上顯示圖案之區域(以下稱為「圖案區域」)之邊界的對比之照射角及檢測角之角度。圖案區域之邊界的對比,係攝影影像上之圖案區域的邊界附近之圖案區域與背景區域之間的亮度差(之絕對值)。於電腦3中,按照工作台21上之基材9之膜構造,確定照射角及檢測角之應設角度(以下稱為「設定角度」),藉由控制角度變更機構133,使照射角及檢測角成為該設定角度(步驟S12)。 In the present embodiment, in accordance with each film structure (combination of the type and thickness of the film) on the substrate 9, a comparison of the boundary between the region (hereinafter referred to as "pattern region") for displaying a pattern on the captured image is obtained in advance. The angle of illumination and the angle of the detection angle. The contrast of the boundary of the pattern area is the luminance difference (absolute value) between the pattern area and the background area near the boundary of the pattern area on the photographic image. In the computer 3, the angle of the irradiation angle and the detection angle (hereinafter referred to as "set angle") is determined according to the film structure of the substrate 9 on the table 21, and the angle of illumination is controlled by the angle changing mechanism 133. The detection angle becomes the set angle (step S12).

接著,開始自光照射部131射出光,且藉由移動機構11使基材9連續地朝Y方向移動,以使基材9上之應檢查位置通 過攝影區域90。然後與基材9之移動同步,於線感測器132中高速且重複地取得線狀之攝影區域90之線影像。藉此,取得顯示圖案之二維之攝影影像,且作為攝影影像資料491記憶於記憶部49(步驟S13)。 Next, light is emitted from the light irradiation unit 131, and the substrate 9 is continuously moved in the Y direction by the moving mechanism 11 so that the inspection position on the substrate 9 is passed. Passing through the shooting area 90. Then, in synchronization with the movement of the substrate 9, a line image of the linear photographic area 90 is taken in the line sensor 132 at high speed and repeatedly. Thereby, a two-dimensional photographic image of the display pattern is obtained, and the photographic image data 491 is stored in the storage unit 49 (step S13).

圖6為顯示攝影影像之一部分之圖。圖6中顯示添加於各區域之平行斜線之寬度越窄,則該區域之亮度(亮度值之平均值)越低。攝影影像8包括圖案區域81及背景區域82。背景區域82係非圖案區域。此外,攝影影像8中包含多數之微小顆粒狀要素831、832、833。其中,顆粒狀要素831~833係因存在於基材9之內部之已述之顆粒狀物質92及基材9之主表面上之微小凹凸或雜訊等引起。顆粒狀要素831~833中,於圖6中標示符號831之複數個顆粒狀要素的亮度最低,標示符號832之顆粒狀要素的亮度最高。此外,將各顆粒狀要素831~833與該顆粒狀要素831~833周圍之間的亮度差作為該顆粒狀要素831~833之對比,顆粒狀要素831之對比係較圖案區域81之邊界811之對比高。顆粒狀要素832、833之對比係較圖案區域81之邊界811之對比低。 Figure 6 is a diagram showing a portion of a photographic image. In Fig. 6, the narrower the width of the parallel oblique lines added to the respective regions, the lower the luminance (the average value of the luminance values) of the region. The photographic image 8 includes a pattern area 81 and a background area 82. The background area 82 is a non-pattern area. Further, the photographic image 8 includes a plurality of minute particulate elements 831, 832, and 833. Among them, the particulate elements 831 to 833 are caused by minute irregularities or noises on the main surfaces of the particulate matter 92 and the substrate 9 which are present inside the substrate 9. Among the granular elements 831 to 833, the plurality of granular elements denoted by reference numeral 831 in Fig. 6 have the lowest brightness, and the granular elements of the reference symbol 832 have the highest brightness. Further, the difference in luminance between each of the granular elements 831 to 833 and the periphery of the granular elements 831 to 833 is taken as a comparison of the granular elements 831 to 833, and the contrast of the granular elements 831 is compared with the boundary 811 of the patterned area 81. High contrast. The contrast of the particulate elements 832, 833 is lower than the contrast of the boundary 811 of the pattern area 81.

於代表值取得部411中,於攝影影像8中將各像素作為目標像素,設定以該目標像素為中心之規定尺寸之對象區域,以確定對象區域內包含之複數個像素(以下,稱為「對象像素」)。例如,於圖6中標示符號71之像素為目標像素之情況下,標示符號711之對象區域(以虛線之矩形顯示)內包含之所有像素為對象像素。於圖6中標示符號72之像素為目標像素之情況下,標示符號721之對象區域(以虛線之矩形顯示)內包含之所有像素為對象像素。且較佳為,對象區域遠大於顆粒狀要素。於以下之處理中,目 標像素71、72也作為對象像素之一個像素使用。再者,各目標像素之對象區域係相當於對該目標像素進行之後述之過濾處理中之過濾範圍。 In the representative image acquisition unit 411, each pixel is used as a target pixel in the captured image 8, and a target region having a predetermined size centering on the target pixel is set to determine a plurality of pixels included in the target region (hereinafter referred to as " Object pixel"). For example, in the case where the pixel of the symbol 71 is the target pixel in FIG. 6, all the pixels included in the object area (shown by the dotted rectangle) of the symbol 711 are the target pixels. In the case where the pixel of the symbol 72 is the target pixel in FIG. 6, all the pixels included in the object area (shown by the dotted rectangle) of the symbol 721 are the target pixels. And preferably, the object area is much larger than the granular element. In the following processing, The pixels 71 and 72 are also used as one pixel of the target pixel. Furthermore, the target area of each target pixel corresponds to a filtering range in the filtering process described later for the target pixel.

圖7及圖8為顯示對象區域之亮度值分布之圖。圖7中顯示於圖6中之對象區域711中以目標像素71為中心橫向排列之對象像素之亮度值,圖8中顯示於圖6中之對象區域721中以目標像素72為中心橫向排列之對象像素之亮度值。此外,圖7及圖8中,於目標像素之位置標示符號71、72,且以標示相同符號之箭頭顯示圖案區域81、背景區域82及顆粒狀要素831、832之範圍。如圖8所示,背景區域82中未包含於顆粒狀要素831內之非顆粒狀區域與顆粒狀要素831之亮度差,係較背景區域82之非顆粒狀區域與圖案區域81之亮度差大。 7 and 8 are diagrams showing the distribution of luminance values of the target region. The luminance values of the target pixels horizontally arranged around the target pixel 71 in the object area 711 in FIG. 6 are shown in FIG. 7, and are horizontally arranged around the target pixel 72 in the object area 721 shown in FIG. The brightness value of the object pixel. In addition, in FIGS. 7 and 8, the symbols 71 and 72 are indicated at the positions of the target pixels, and the areas of the pattern area 81, the background area 82, and the granular elements 831 and 832 are displayed by arrows indicating the same symbols. As shown in FIG. 8, the difference in luminance between the non-particulate regions not included in the particulate elements 831 in the background region 82 and the particulate elements 831 is greater than the difference in luminance between the non-particulate regions of the background regions 82 and the pattern regions 81. .

若確定了相對於目標像素之複數個對象像素,則取得該複數個對象像素中之亮度值之代表值、及顯示亮度值之不均之值(步驟S14)。亮度值之代表值例如為平均值,顯示亮度值之不均之值例如為標準偏差。實際上,將攝影影像8之一個像素作為目標像素,依序進行步驟S14之處理、及後述之步驟S15~S17之處理,該等一連串之處理係一面將目標像素變更為其他像素一面重複地進行。圖4中省略了顯示處理之重複過程之方塊之圖示。以下之記載中,為了將像素71為目標像素之情況、及像素72為目標像素之情況進行比對,因此同時對分別將複數之像素設為目標像素時之處理進行說明。 When a plurality of target pixels with respect to the target pixel are determined, a representative value of the luminance value in the plurality of target pixels and a value of the unevenness of the display luminance value are obtained (step S14). The representative value of the luminance value is, for example, an average value, and the value of the unevenness of the display luminance value is, for example, a standard deviation. Actually, one pixel of the photographic image 8 is used as the target pixel, and the processing of step S14 and the processing of steps S15 to S17 described later are sequentially performed, and the series of processing is repeated while changing the target pixel to another pixel. . An illustration of the blocks of the iterative process of display processing is omitted in FIG. In the following description, in order to compare the case where the pixel 71 is the target pixel and the case where the pixel 72 is the target pixel, the processing when the plurality of pixels are the target pixels will be described.

於基準值設定部412中,設亮度值之代表值為m,顯示亮度值之不均之值為d,且規定之係數為s,將以(m-s.d)為下限 值且以(m+s.d)為上限值之亮度值範圍決定為基準值判斷範圍。並且,如圖7之例子,於目標像素71之亮度值P1在基準值判斷範圍R1內(包含亮度值為上限值或下限值之情況)之情況下,將該目標像素71之亮度值P1設定為後述之過濾處理中利用之基準值。此外,如圖8之例子,於目標像素72之亮度值P2在基準值判斷範圍R2外之情況下,亮度值之代表值PA係作為基準值而被設定(步驟S15)。於圖6之對象區域721中,背景區域82之面積遠較圖案區域81之面積大,且該背景區域82中未包含於顆粒狀要素831內之非顆粒狀區域,遠較包含於顆粒狀要素831內之區域大。因此,圖8中之亮度值之代表值PA近似於背景區域82之非顆粒狀區域中之亮度值。再者,上述係數s係考慮了顆粒狀要素之尺寸及分布或顆粒狀要素之對比等而適宜決定(於對象區域之尺寸等中也同樣)。 In the reference value setting unit 412, the representative value of the luminance value is m, the value of the unevenness of the display luminance value is d, and the predetermined coefficient is s, and the (m-s.d) is the lower limit. The range of the luminance value whose value is (m + s.d) is the upper limit value is determined as the reference value judgment range. Further, as shown in FIG. 7, in the case where the luminance value P1 of the target pixel 71 is within the reference value determination range R1 (including the case where the luminance value is the upper limit value or the lower limit value), the luminance value of the target pixel 71 is used. P1 is set to a reference value used in the filtering process described later. Further, as shown in the example of FIG. 8, when the luminance value P2 of the target pixel 72 is outside the reference value determination range R2, the representative value PA of the luminance value is set as the reference value (step S15). In the object area 721 of FIG. 6, the area of the background area 82 is much larger than the area of the pattern area 81, and the non-granular area of the background area 82 which is not included in the granular element 831 is much larger than that of the granular element. The area within 831 is large. Therefore, the representative value PA of the luminance value in FIG. 8 approximates the luminance value in the non-granular region of the background region 82. Further, the coefficient s is appropriately determined in consideration of the size and distribution of the particulate elements or the comparison of the particulate elements (the same applies to the size of the target region, etc.).

於基準值設定部412中,還將相對於目標像素71、72之複數個對象像素中的亮度值落在該基準值判斷範圍R1、R2內之對象像素確定為擷取像素(步驟S16)。換言之,將複數個對象像素中之亮度值落在該基準值判斷範圍R1、R2外之對象像素排除,剩餘之對象像素成為擷取像素。圖7之例中,將背景區域82內包含之對象像素排除,圖8之例中,將顆粒狀要素831內包含之對象像素排除。 In the reference value setting unit 412, the target pixel whose luminance values in the plurality of target pixels of the target pixels 71 and 72 fall within the reference value determination ranges R1 and R2 is also determined as the captured pixel (step S16). In other words, the target pixel outside the reference value determination range R1, R2 is excluded from the plurality of target pixels, and the remaining target pixels become the captured pixels. In the example of Fig. 7, the target pixels included in the background area 82 are excluded, and in the example of Fig. 8, the target pixels included in the granular element 831 are excluded.

接著,於過濾處理部413中,對目標像素進行規定之過濾處理。於過濾處理中,進行對過濾範圍內之複數個像素之亮度值乘以係數(加權)而加入之演算。在此,對普通之過濾處理之一的雙邊過濾器進行說明。於雙邊過濾器中,於設過濾範圍之列方向之尺寸為(2fx+1),行方向之尺寸為(2fy+1),且將像素中之目標像素之 亮度值表示為i(x,y)之情況下,該目標像素之新的亮度值i0(x,y),係使用規定之係數σdv以式1求得。 Next, in the filtering processing unit 413, a predetermined filtering process is performed on the target pixel. In the filtering process, the calculation is performed by multiplying the luminance values of the plurality of pixels in the filtering range by a coefficient (weighting). Here, a bilateral filter which is one of the ordinary filtering processes will be described. In the bilateral filter, the dimension in the direction of the filter range is (2fx+1), the dimension in the row direction is (2fy+1), and the luminance value of the target pixel in the pixel is expressed as i(x, y). In the case of the new luminance value i0(x, y) of the target pixel, the predetermined coefficient σ d , σ v is obtained by Equation 1.

於雙邊過濾器中,由於(於亮度值相等之情況)過濾範圍內包含之各像素與目標像素之間的距離越小,則對該像素之亮度值之加權越大,因此包含有以離目標像素近之像素為中心之平滑處理之作用。式1中之係數σd,係調整藉由雙邊過濾處理對影像進行平滑處理之程度。此外,於雙邊過濾器中,(於與目標像素之距離相等之情況)過濾範圍內包含之各像素之亮度值與目標像素之亮度值之差越小,則對該像素之亮度值之加權越大。因此,於過濾範圍內存在有明暗(亮度)不同之2個區域之情況下,對與目標像素所處之區域不同之區域的新亮度值之影響降低。其結果,該2個區域間之邊界不易模糊,亦即,變得容易保存邊界。式1中之係數σv,係調整藉由雙邊過濾處理而保存有邊界之程度。 In the bilateral filter, since the distance between each pixel included in the filtering range and the target pixel is smaller (in the case where the luminance values are equal), the weighting of the luminance value of the pixel is larger, and thus the target is included. The pixel near pixel is the center of smooth processing. The coefficient σ d in Equation 1 adjusts the degree to which the image is smoothed by bilateral filtering. In addition, in the bilateral filter, the smaller the difference between the luminance value of each pixel included in the filtering range and the luminance value of the target pixel (when the distance from the target pixel is equal), the more the weighting of the luminance value of the pixel is Big. Therefore, when there are two regions having different brightness and darkness in the filtering range, the influence on the new luminance value of the region different from the region in which the target pixel is located is lowered. As a result, the boundary between the two regions is not easily blurred, that is, it becomes easy to preserve the boundary. The coefficient σ v in Equation 1 is adjusted to the extent that the boundary is preserved by the bilateral filtering process.

於影像取得裝置1之過濾處理部413中,進行將雙邊過濾器變形後之過濾處理。具體而言,對以式1中之「i(x+k,y+1)」所確定之對象像素不是擷取像素之k及l之組合,不進行計算(亦即,該k及l之組合之值為0)。此外,式1中之「i(x,y)」被基準值 置換。因此,於將亮度值之代表值PA作為基準值而設定之圖8之例中,於求取顆粒狀要素831內包含之目標像素72之新的亮度值時,各擷取像素之亮度值與基準值PA之差越小,對該擷取像素之亮度值之加權越大。其結果,目標像素72之新的亮度值成為較圖案區域81之亮度值及顆粒狀要素831之亮度值更近似於亮度值之代表值PA之值,而比較近似於背景區域82之非顆粒狀區域中之亮度值。 In the filter processing unit 413 of the image acquisition device 1, a filtering process in which the bilateral filter is deformed is performed. Specifically, the target pixel determined by "i(x+k, y+1)" in Equation 1 is not a combination of k and l of the captured pixel, and no calculation is performed (that is, the k and l are The combined value is 0). In addition, "i(x, y)" in Equation 1 is used as a reference value. Replacement. Therefore, in the example of FIG. 8 in which the representative value PA of the luminance value is set as the reference value, when the new luminance value of the target pixel 72 included in the granular element 831 is obtained, the luminance value of each captured pixel is The smaller the difference between the reference values PA, the greater the weighting of the luminance values of the captured pixels. As a result, the new luminance value of the target pixel 72 becomes a value which is closer to the representative value PA of the luminance value than the luminance value of the pattern region 81 and the luminance value of the granular element 831, and is relatively non-granular similar to the background region 82. The brightness value in the area.

另一方面,如圖7之例子,於將目標像素71之亮度值P1作為基準值進行設定之情況下,各擷取像素之亮度值與目標像素71之亮度值P1之差越小,則對該擷取像素之亮度值之加權越大。藉此,目標像素71之新的亮度值比較近似於目標像素71之原亮度值。如此,對目標像素進行使用複數個擷取像素之亮度值之過濾處理,求取該目標像素之新的亮度值(步驟S17)。 On the other hand, as shown in the example of FIG. 7, when the luminance value P1 of the target pixel 71 is set as the reference value, the smaller the difference between the luminance value of each captured pixel and the luminance value P1 of the target pixel 71, the smaller The weighting of the luminance values of the captured pixels is larger. Thereby, the new luminance value of the target pixel 71 is approximated to the original luminance value of the target pixel 71. In this manner, the target pixel is subjected to filtering processing using the luminance values of the plurality of captured pixels, and a new luminance value of the target pixel is obtained (step S17).

如已述之,實際上,將攝影影像8之一個像素作為目標像素之步驟S14~S17之處理係一面將目標像素變更為其他像素一面重複地進行。並且,藉由對攝影影像8之全部像素求取新的亮度值,如圖9所示,生成對攝影影像8實施了上述過濾處理之影像8a(以下稱為「處理完畢影像8a」),且作為處理完畢影像資料492記憶於記憶部49中。 As described above, in practice, the processing of steps S14 to S17 in which one pixel of the photographic image 8 is used as the target pixel is repeatedly performed while changing the target pixel to another pixel. Further, by obtaining a new luminance value for all the pixels of the captured image 8, as shown in FIG. 9, an image 8a (hereinafter referred to as "processed image 8a") subjected to the filtering processing on the captured image 8 is generated, and The processed image data 492 is stored in the memory unit 49.

於圖6之攝影影像8中,於對對比高之顆粒狀要素831內包含之目標像素之過濾處理中,將亮度值之代表值作為基準值進行設定,因此,可取得較近似於顆粒狀要素831之周圍之亮度值之值作為新的亮度值。藉此,顆粒狀要素831於圖9所示之處理完畢影像8a中被大致除去。圖6之攝影影像8中對比低之微小顆 粒狀要素832、833,藉由通常之平滑處理成分,於圖9所示之處理完畢影像8a中被大致除去。處理完畢影像8a可根據需要顯示於顯示器35。 In the photographic image 8 of FIG. 6, in the filtering process of the target pixel included in the contrast-shaped granular element 831, the representative value of the luminance value is set as the reference value, so that the granular element can be obtained. The value of the brightness value around 831 is taken as the new brightness value. Thereby, the granular element 831 is substantially removed in the processed image 8a shown in FIG. The contrasting tiny particles in the photographic image 8 of Figure 6. The granular elements 832 and 833 are substantially removed from the processed image 8a shown in Fig. 9 by a normal smoothing component. The processed image 8a can be displayed on the display 35 as needed.

檢查部42中記憶有顯示未包含缺陷之圖案之參照影像(之資料),藉由對處理完畢影像與參照影像進行比較,判斷圖案中有無缺陷(步驟S18)。基於處理完畢影像之圖案之檢查,也可藉由與參照影像之比較以外之方法來進行。此外,也可進行圖案區域之邊界間之距離(圖案之寬度)等之測量,且根據測量結果判斷圖案是否良好。 The inspection unit 42 stores therein a reference image (data) showing a pattern not including a defect, and compares the processed image with the reference image to determine whether or not there is a defect in the pattern (step S18). The inspection based on the pattern of the processed image can also be performed by a method other than comparison with the reference image. Further, it is also possible to measure the distance between the boundaries of the pattern regions (the width of the pattern) and the like, and judge whether the pattern is good or not based on the measurement result.

在此,對使用普通之雙邊過濾器之比較例之處理進行說明。於比較例之處理中,使用式1進行過濾處理。如已述,於式1之過濾處理中,相對於各目標像素之對象區域內包含之各對象像素之亮度值與該目標像素之亮度值之差越小則對該對象像素之亮度值之加權越大。因此,如圖8之例子,相對於顆粒狀要素831內包含之目標像素72之新的亮度值,係近似於顆粒狀要素831中之亮度值,如圖10所示,於比較例之處理之處理完畢影像99中,殘留有攝影影像8中之顆粒狀要素831。 Here, the processing of the comparative example using the ordinary bilateral filter will be described. In the treatment of the comparative example, the filtration treatment was carried out using Formula 1. As described above, in the filtering process of Equation 1, the smaller the difference between the luminance value of each of the target pixels included in the target region of each target pixel and the luminance value of the target pixel, the weighting of the luminance value of the target pixel. The bigger. Therefore, as shown in the example of FIG. 8, the new luminance value of the target pixel 72 included in the granular element 831 is approximated to the luminance value in the granular element 831, as shown in FIG. In the processed image 99, the granular element 831 in the photographic image 8 remains.

相對於此,於影像取得裝置1中,取得以各目標像素為中心之對象區域中的亮度值之代表值,且於該目標像素之亮度值是在以該代表值為中心而設定之基準值判斷範圍內之情況下,將該目標像素之亮度值作為基準值進行設定,而於落在該基準值判斷範圍外之情況下,將該代表值作為基準值進行設定。並且,藉由進行對象區域內包含之各對象像素之亮度值與基準值之差越小則對該對象像素之亮度值之加權越大之過濾處理,求取目標像素之新的亮 度值。藉此,於顯示圖案區域並含有較圖案區域之邊界之對比高之顆粒狀要素之攝影影像中,可一面保存圖案區域之邊界一面除去對比高之顆粒狀要素。其結果,可高精度且穩定地進行圖案之檢查(包含缺陷之檢測或形狀之測量)。 On the other hand, the image acquisition device 1 acquires a representative value of the luminance value in the target region around the target pixel, and the luminance value of the target pixel is a reference value set with the representative value as the center. In the case of the determination range, the luminance value of the target pixel is set as the reference value, and when it falls outside the reference value determination range, the representative value is set as the reference value. Further, by performing a filtering process in which the difference between the luminance value of each of the target pixels included in the target region and the reference value is smaller, the weighting of the luminance value of the target pixel is larger, and the new brightness of the target pixel is obtained. Degree value. Thereby, in the photographic image in which the pattern region is displayed and the granular element having a relatively high contrast with the boundary of the pattern region is contained, the grain-like element having a high contrast can be removed while the boundary of the pattern region is preserved. As a result, the inspection of the pattern (including the detection of the defect or the measurement of the shape) can be performed with high precision and stability.

藉由基於顯示對象區域內之複數個對象像素之亮度值之不均之值來決定用於基準值之設定的基準值判斷範圍之寬度,可容易設定適宜之基準值判斷範圍。此外,藉由於過濾處理中將該複數個對象像素中的亮度值落在基準值判斷範圍外之對象像素之該亮度值排除,防止於過濾處理中使用到異常之亮度值,可適宜求得目標像素之新的亮度值。 By determining the width of the reference value determination range for setting the reference value based on the value of the unevenness of the luminance values of the plurality of target pixels in the display target region, it is possible to easily set an appropriate reference value determination range. In addition, since the luminance value of the target pixel outside the reference value determination range is excluded in the filtering process, the brightness value of the abnormality is prevented from being used in the filtering process, and the target can be appropriately obtained. The new brightness value of the pixel.

於上述影像取得裝置1中可進行各種之變形。 Various modifications can be made in the image acquisition device 1 described above.

以代表值取得部411取得之亮度值之代表值,只要是顯示對象區域內之複數個對象像素中之亮度值之分布之中央附近的值即可,也可為中央值等之其他統計量。此外,亮度值之代表值也可為基準值判斷範圍內包含有亮度值之對象像素(擷取像素)中之亮度值的平均值或中央值等。同樣地,顯示複數個對象像素中之亮度值之不均之值,除標準偏差外,也可為顯示統計上之不均之其他統計量。 The representative value of the luminance value obtained by the representative value acquisition unit 411 may be a value near the center of the distribution of the luminance values among the plurality of target pixels in the display target region, and may be other statistical values such as the central value. Further, the representative value of the luminance value may be an average value or a central value of the luminance values in the target pixel (captured pixel) including the luminance value within the reference value determination range. Similarly, the value of the unevenness of the luminance values in the plurality of target pixels is displayed, and in addition to the standard deviation, other statistics showing statistically unevenness may be used.

也可於相對於各目標像素之對象區域中,僅於顯示亮度值之不均之值為規定值以上之情況,進行將式1中之「i(x,y)」置換為基準值之上述過濾處理,而於顯示亮度值之不均之值未滿規定值之情況,進行普通之雙邊過濾處理(比較例之處理)。該情況下,可僅對攝影影像中的包含對比高之顆粒狀要素831之區域,進行利用基準值之上述過濾處理。換言之,對僅顯示此種區域之影像(攝 影影像之一部分)進行上述過濾處理。 In the target region with respect to each target pixel, the above-mentioned "i(x, y)" in the formula 1 may be replaced with the reference value only when the value of the unevenness of the display luminance value is equal to or greater than a predetermined value. The filtering process is performed, and in the case where the value of the unevenness of the display luminance value is less than the predetermined value, ordinary bilateral filtering processing (processing of the comparative example) is performed. In this case, it is possible to perform the above-described filtering processing using the reference value only for the region including the comparatively high granular element 831 in the captured image. In other words, for displaying only images of such areas (photograph One of the shadow images is subjected to the above filtering process.

上述實施形態中,用於基準值之設定之亮度值範圍(基準值判斷範圍)之寬度,係基於顯示複數個對象像素之亮度值之不均之值而決定,但也可根據基材9之種類等,預先確定用於基準值之設定之亮度值範圍之寬度。如此,用於基準值之設定之亮度值範圍,可以藉由演算而求得之可變寬度、或預先確定之一定寬度來設定。此外,使用於過濾處理中被排除之對象像素之選擇(擷取像素之確定)之亮度值範圍,只要是以代表值為中心進行設定,也可與基準值判斷範圍不同。 In the above embodiment, the width of the luminance value range (reference value determination range) for setting the reference value is determined based on the value of the unevenness of the luminance values of the plurality of target pixels, but may be based on the substrate 9 The type or the like determines the width of the luminance value range for setting the reference value in advance. In this way, the range of the luminance value used for setting the reference value can be set by the variable width obtained by the calculation or a predetermined constant width. Further, the range of the luminance value used for the selection of the target pixel to be excluded in the filtering process (determination of the captured pixel) may be different from the reference value determination range as long as it is set with the representative value as the center.

於基準值設定部412中,也可與目標像素之亮度值無關,將對象區域中之亮度值之代表值作為基準值進行設定。該情況也可藉由進行各對象像素之亮度值與基準值之差越小則對該對象像素之亮度值的加權越大之過濾處理,而於處理完畢影像中,一面保存圖案區域之邊界,一面除去對比高之顆粒狀要素。另一方面,為了抑制處理完畢影像中邊界變得模糊之情形,較佳為,於目標像素之亮度值在以該代表值為中心而設定之亮度值範圍內之情況下,將該目標像素之亮度值作為基準值進行設定,而在該亮度值範圍外之情況下,將該代表值作為基準值進行設定。 The reference value setting unit 412 may set the representative value of the luminance value in the target region as a reference value regardless of the luminance value of the target pixel. In this case, the smaller the difference between the luminance value of each target pixel and the reference value, the larger the weighting of the luminance value of the target pixel, and the boundary of the pattern region is preserved in the processed image. One side removes the contrasting high granular elements. On the other hand, in order to suppress the blurring of the boundary in the processed image, it is preferable that the target pixel is in the range of the luminance value set by the representative value. The luminance value is set as a reference value, and when the luminance value is out of the range, the representative value is set as a reference value.

上述實施形態中,進行將邊界保存型平滑化過濾器之一即雙邊過濾器變形後之處理,但於過濾處理部413中,也可進行各對象像素之亮度值與基準值之差越小則對該對象像素之亮度值的加權越大之其他過濾處理。作為此種過濾處理,可例示將ε過濾器中之目標像素之亮度值置換為基準值之處理、或者將日本專利特開2008-205737號公報(上述文獻2)記載之方法中的目標像素之亮 度值置換為基準值之處理。 In the above embodiment, the process of deforming the bilateral filter which is one of the boundary-preserving smoothing filters is performed. However, in the filtering processing unit 413, the difference between the luminance value of each target pixel and the reference value may be smaller. The other filtering process is performed by increasing the weight of the luminance value of the target pixel. The processing of the target pixel in the method described in Japanese Laid-Open Patent Publication No. 2008-205737 bright The degree value is replaced by the processing of the reference value.

也可根據處理完畢影像之用途等,省略自各目標像素之對象區域內包含之複數個對象像素來確定擷取像素之步驟S16之處理,於過濾處理部413之過濾處理中,使用包含於對象區域之全部對象像素之亮度值,求取目標像素之新的亮度值。 The processing of the step S16 of capturing the pixels may be omitted by omitting a plurality of target pixels included in the target area of each target pixel according to the use of the processed image, and the filtering processing by the filtering processing unit 413 may be included in the target area. The luminance values of all the target pixels are used to obtain a new luminance value of the target pixel.

如已述,因含於內部之填料或表面之微小凹凸等之影響,於拍攝透明基材之影像中,容易含有較圖案區域之邊界的對比高之顆粒狀要素。因此,可於影像中一面保存圖案區域之邊界一面除去對比高之顆粒狀要素之上述影像處理,可說是尤其適合作為對顯示形成於透明基材上之透明電極膜之影像進行之處理。當然,於對有色之基材或基材以外之對象物進行拍攝,取得包含較圖案區域之邊界的對比高之顆粒狀要素之影像之情況,也可進行上述影像處理。影像處理裝置即影像處理部41之處理,除基材9上之圖案之檢查以外,也可利用於各種用途。 As described above, the image of the transparent substrate is likely to contain a relatively high-grained particulate element at the boundary of the pattern region due to the influence of the fine inclusions or the surface of the filler or the surface. Therefore, it is possible to treat the image processing of the transparent electrode film formed on the transparent substrate by the image processing in which the boundary of the pattern region is preserved while the image is preserved. Of course, the above image processing can also be performed by photographing an object other than the colored substrate or the substrate and obtaining an image of the relatively high granular element including the boundary of the pattern region. The image processing unit 41, which is an image processing device, can be used for various purposes in addition to the inspection of the pattern on the substrate 9.

上述實施形態及各變形例中之構成,只要不相互矛盾,即可適宜地加以組合。 The configurations in the above-described embodiments and modifications may be combined as appropriate without being mutually contradictory.

雖對本發明進行了詳細說明,但已述之說明僅為例示而已,並非用於限制本發明。因此,只要未超出本發明之範圍,即可採用多種之變形或態樣。 The invention has been described in detail with reference to the preferred embodiments of the invention. Accordingly, various modifications or aspects may be employed without departing from the scope of the invention.

41‧‧‧影像處理部 41‧‧‧Image Processing Department

42‧‧‧檢查部 42‧‧‧Inspection Department

49‧‧‧記憶部 49‧‧‧Memory Department

411‧‧‧代表值取得部 411‧‧‧ Representative Value Acquisition Department

412‧‧‧基準值設定部 412‧‧‧ benchmark setting unit

413‧‧‧過濾處理部 413‧‧‧Filter Processing Department

491‧‧‧攝影影像資料 491‧‧‧Photographic data

492‧‧‧處理完畢影像資料 492‧‧‧Processed image data

Claims (12)

一種影像處理裝置,其包含:代表值取得部,其於顯示圖案區域並含有較上述圖案區域之邊界的對比更高之顆粒狀要素之影像中,將各像素作為目標像素,取得以上述目標像素為中心之規定尺寸之區域內包含之複數個對象像素的亮度值之代表值;基準值設定部,其於上述目標像素之亮度值在以上述代表值為中心而設定之亮度值範圍內之情況下,將上述目標像素之亮度值作為基準值進行設定,而於上述目標像素之亮度值在上述亮度值範圍外之情況下,將上述代表值作為基準值進行設定,或者,與上述目標像素之亮度值無關地,將上述代表值作為基準值進行設定;及過濾處理部,其使用上述複數個對象像素之亮度值,並藉由進行各對象像素之亮度值與上述基準值之差越小則對上述各對象像素之亮度值之加權越大之過濾處理,求取上述目標像素之新的亮度值。 An image processing device includes: a representative value acquisition unit that acquires the target pixel by using each pixel as a target pixel in a display image region and including a higher contrast granular element image than a boundary of the pattern region a representative value of luminance values of a plurality of target pixels included in a region of a predetermined size; a reference value setting portion in which a luminance value of the target pixel is within a luminance value range set with the representative value as a center And setting a luminance value of the target pixel as a reference value, and setting the representative value as a reference value when the luminance value of the target pixel is out of the luminance value range, or Regardless of the luminance value, the representative value is set as a reference value, and the filtering processing unit uses the luminance values of the plurality of target pixels, and the smaller the difference between the luminance value of each target pixel and the reference value is, The filtering process for increasing the weight value of each of the target pixel pixels is performed, and the new brightness of the target pixel is obtained. Value. 如申請專利範圍第1項之影像處理裝置,其中,上述代表值取得部係求取顯示上述複數個對象像素中之亮度值之不均之值,上述基準值設定部係基於顯示上述不均之值而決定上述亮度值範圍之寬度,使用上述亮度值範圍來設定上述基準值。 The image processing device according to claim 1, wherein the representative value obtaining unit obtains a value indicating unevenness of luminance values in the plurality of target pixels, and the reference value setting unit is based on displaying the unevenness The width of the luminance value range is determined by the value, and the reference value is set using the luminance value range described above. 如申請專利範圍第1或2項之影像處理裝置,其中,上述過濾處理部係於上述過濾處理中,將上述複數個對象像素中,亮度值落在以上述代表值為中心而設定之亮度值範圍外的對象像素之上述亮度值排除。 The image processing device according to claim 1 or 2, wherein the filtering processing unit is configured to perform, in the filtering process, the brightness value of the plurality of target pixels is set to a brightness value set with the representative value as a center. The above luminance values of the object pixels outside the range are excluded. 如申請專利範圍第1或2項之影像處理裝置,其中,於上述過 濾處理中,上述各對象像素與上述目標像素之距離越小,則對上述各對象像素之亮度值之加權越大。 An image processing apparatus according to claim 1 or 2, wherein In the filtering process, the smaller the distance between each of the target pixels and the target pixel, the greater the weighting of the luminance values of the respective target pixels. 如申請專利範圍第1或2項之影像處理裝置,其中,上述影像係顯示形成於透明基材上之透明電極膜之影像。 The image processing device according to claim 1 or 2, wherein the image is an image of a transparent electrode film formed on a transparent substrate. 一種影像取得裝置,係取得形成在基材上之薄膜圖案之影像者;其包含:攝影單元,其藉由對上述基材進行拍攝而取得攝影影像;及申請專利範圍第1或2項之影像處理裝置,其對上述攝影影像進行處理。 An image acquisition device for obtaining an image of a thin film pattern formed on a substrate; comprising: a photographing unit that obtains a photographed image by photographing the substrate; and an image of claim 1 or 2 A processing device that processes the captured image. 一種影像處理方法,其包含以下之步驟:a)於顯示圖案區域並含有較上述圖案區域之邊界的對比更高之顆粒狀要素之影像中,將各像素作為目標像素,取得以上述目標像素為中心之規定尺寸之區域內包含之複數個對象像素的亮度值之代表值之步驟;b)於上述目標像素之亮度值在以上述代表值為中心而設定之亮度值範圍內之情況下,將上述目標像素之亮度值作為基準值進行設定,而於上述目標像素之亮度值在上述亮度值範圍外之情況下,將上述代表值作為基準值進行設定,或者,與上述目標像素之亮度值無關地,將上述代表值作為基準值進行設定之步驟;及c)使用上述複數個對象像素之亮度值,並藉由進行各對象像素之亮度值與上述基準值之差越小則對上述各對象像素之亮度值之加權越大之過濾處理,求取上述目標像素之新的亮度值之步驟。 An image processing method comprising the steps of: a) obtaining, in the image of the display pattern region and containing a higher contrasting granular element than the boundary of the pattern region, using each pixel as a target pixel to obtain the target pixel as the target pixel a step of representing a representative value of luminance values of a plurality of target pixels in a region of a predetermined size in the center; b) in a case where a luminance value of the target pixel is within a range of luminance values set with the representative value as a center The brightness value of the target pixel is set as a reference value, and when the brightness value of the target pixel is out of the brightness value range, the representative value is set as a reference value or is independent of the brightness value of the target pixel. And the step of setting the representative value as a reference value; and c) using the luminance values of the plurality of target pixels, and performing the difference between the luminance values of the target pixels and the reference value The step of filtering the processing of the pixel of the pixel to obtain a new luminance value of the target pixel. 如申請專利範圍第7項之影像處理方法,其中,於上述a)步驟中,求取顯示上述複數個對象像素中之亮度值之不均之值, 於上述b)步驟中,基於顯示上述不均之值而決定上述亮度值範圍之寬度,使用上述亮度值範圍來設定上述基準值。 The image processing method of claim 7, wherein in the step a), the value of the unevenness of the brightness values in the plurality of target pixels is obtained. In the step b), the width of the luminance value range is determined based on the value of the unevenness, and the reference value is set using the luminance value range. 如申請專利範圍第7或8項之影像處理方法,其中,於上述c)步驟中,於上述過濾處理中,將上述複數個對象像素中,亮度值落在以上述代表值為中心而設定之亮度值範圍外之對象像素之上述亮度值排除。 The image processing method according to claim 7 or 8, wherein in the filtering process, in the filtering process, the brightness value is set to be set at the center of the plurality of target pixels. The above luminance values of the target pixels outside the range of the luminance value are excluded. 如申請專利範圍第7或8項之影像處理方法,其中,於上述過濾處理中,上述各對象像素與上述目標像素之距離越小,則對上述各對象像素之亮度值之加權越大。 The image processing method according to claim 7 or 8, wherein in the filtering process, the smaller the distance between each of the target pixels and the target pixel, the greater the weighting of the luminance values of the target pixels. 如申請專利範圍第7或8項之影像處理方法,其中,上述影像係顯示形成於透明基材上之透明電極膜之影像。 The image processing method of claim 7 or 8, wherein the image is an image of a transparent electrode film formed on a transparent substrate. 一種影像取得方法,係取得形成於基材上之薄膜圖案之影像者;其包含:藉由拍攝上述基材而取得攝影影像之步驟;及申請專利範圍第7或8項之影像處理方法,其對上述攝影影像進行處理。 An image acquisition method for obtaining a film image formed on a substrate; comprising: a step of obtaining a photographic image by photographing the substrate; and an image processing method according to claim 7 or 8 The above photographic image is processed.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI758609B (en) * 2018-06-20 2022-03-21 日商日本麥克隆尼股份有限公司 Image generation device and image generation method

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106776877B (en) * 2016-11-28 2020-05-01 常州市星网计算机技术有限公司 Automatic identification method for motorcycle part models
JP2019036821A (en) * 2017-08-14 2019-03-07 キヤノン株式会社 Image processing system, image processing method, and program
CN110645909A (en) * 2019-08-16 2020-01-03 广州瑞松北斗汽车装备有限公司 Vehicle body appearance defect detection method and detection system
WO2022163859A1 (en) * 2021-02-01 2022-08-04 三菱重工業株式会社 Inspection device and inspection method
KR20230170294A (en) 2022-06-10 2023-12-19 마채준 Wheelchair-accessible Healing Agricultural Plant Box(Flowerbed)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1567371A (en) * 2003-06-13 2005-01-19 金宝电子工业股份有限公司 Method for reducing image video and reinforcing edge in digital camera
CN101051619A (en) * 2006-04-03 2007-10-10 三星电子株式会社 Substrate check device and substrate check method
CN101868966A (en) * 2007-11-21 2010-10-20 奥林巴斯株式会社 Image processing device and image processing method
CN102137760A (en) * 2008-08-28 2011-07-27 佳能株式会社 Image formation device
TW201421170A (en) * 2012-10-25 2014-06-01 Applied Materials Inc Diffractive optical elements and methods for patterning thin film electrochemical devices

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4635651B2 (en) * 2005-03-08 2011-02-23 パナソニック株式会社 Pattern recognition apparatus and pattern recognition method
JP2008205737A (en) * 2007-02-19 2008-09-04 Olympus Corp Imaging system, image processing program, and image processing method
JP2009182735A (en) * 2008-01-30 2009-08-13 Kyocera Corp Noise eliminating method, image processor, and information code reader
JP5416377B2 (en) * 2008-08-28 2014-02-12 アンリツ産機システム株式会社 Image processing apparatus, X-ray foreign object detection apparatus including the same, and image processing method
JP5315158B2 (en) * 2008-09-12 2013-10-16 キヤノン株式会社 Image processing apparatus and image processing method
KR101590868B1 (en) * 2009-07-17 2016-02-02 삼성전자주식회사 A image processing method an image processing apparatus a digital photographing apparatus and a computer-readable storage medium for correcting skin color
CN101782530A (en) * 2010-01-29 2010-07-21 天津大学 Optical detection method for microcosmic defect expansion of film surfaces and implementing device
KR101231212B1 (en) * 2011-03-11 2013-02-07 이화여자대학교 산학협력단 Method for removing noise in image
JPWO2012153568A1 (en) * 2011-05-10 2014-07-31 オリンパスメディカルシステムズ株式会社 Medical image processing device
JP5728348B2 (en) * 2011-09-21 2015-06-03 株式会社Screenホールディングス Pattern image display device and pattern image display method
KR101376450B1 (en) * 2011-06-01 2014-03-19 다이닛뽕스크린 세이조오 가부시키가이샤 Image Acquisition Apparatus, Pattern Inspection Apparatus, and Image Acquisition Method
JP5810778B2 (en) * 2011-09-15 2015-11-11 株式会社リコー Image processing apparatus and image processing method
KR20130031572A (en) * 2011-09-21 2013-03-29 삼성전자주식회사 Image processing method and image processing apparatus
JP2013235517A (en) * 2012-05-10 2013-11-21 Sharp Corp Image processing device, image display device, computer program and recording medium
WO2014049667A1 (en) * 2012-09-28 2014-04-03 株式会社島津製作所 Digital image processing method and imaging device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1567371A (en) * 2003-06-13 2005-01-19 金宝电子工业股份有限公司 Method for reducing image video and reinforcing edge in digital camera
CN101051619A (en) * 2006-04-03 2007-10-10 三星电子株式会社 Substrate check device and substrate check method
CN101868966A (en) * 2007-11-21 2010-10-20 奥林巴斯株式会社 Image processing device and image processing method
CN102137760A (en) * 2008-08-28 2011-07-27 佳能株式会社 Image formation device
TW201421170A (en) * 2012-10-25 2014-06-01 Applied Materials Inc Diffractive optical elements and methods for patterning thin film electrochemical devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI758609B (en) * 2018-06-20 2022-03-21 日商日本麥克隆尼股份有限公司 Image generation device and image generation method

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