JP6323094B2 - Anti-glare inspection apparatus, method, and program - Google Patents

Description

  The present invention relates to an anti-glare inspection apparatus, method, and program for inspecting anti-glare properties.

  An antireflection film is attached to the outermost surface of a display such as a liquid crystal television, a smartphone, or a tablet in order to improve visibility.

  Examples of the antireflection film include AG (Anti Glare) having antiglare properties by scattering incident light, and LR (Low-Reflection) in which reflected light is reduced by interference of reflected light.

  The optical characteristics of anti-reflection film AG products include “haze”, “transmittance”, “glossiness”, “image clarity”, etc., which are produced by setting certain standard values as quality control items for anti-glare properties. Has been.

  However, even if it is an equivalent product that has produced AG products based on these standard values, the appearance of the film (how the lighting is reflected on the film) can be visually checked if the production lot is different. When confirmed, a phenomenon such as a difference in appearance occurs.

  Therefore, as an index other than the above-mentioned optical characteristics for evaluating the antiglare property, there is a sensory evaluation by visual observation of the film appearance (how the illumination is reflected in the film).

  This visual sensory evaluation consists of [1] the size of the reflected illumination spread (light spread from the illumination contour), and [2] the clarity of the reflected illumination contour (the sharpness of the illumination contour). [3] The anti-glare level is evaluated in increments of one by combining any one of the methods of black visual perception (the gray degree of the portion where there is no reflected illumination) or a plurality of methods.

  If the lower limit value of the standard is set to, for example, -2, the upper limit value of the standard is set to, for example, +2, and the antiglare level is equal to or higher than the lower limit value of the standard and lower than the upper limit value of the standard, the standard is OK. If it is smaller than the lower limit value or larger than the upper limit value, it is determined as NG outside the standard.

  However, since any of the above methods [1], [2], and [3] is emphasized and which method is used for evaluation differs depending on each manufacturer, evaluation is possible even if the same sample is evaluated. Results may vary from manufacturer to manufacturer.

  In addition, even if it is determined which of the above methods [1], [2], and [3] is important and which method is used for evaluation, since it is a visual sensory evaluation, Variations may occur.

By the way, in Patent Document 1, for the purpose of quantifying the effect of antiglare property and achieving consistency with a visual sensitivity test, the normal of the film surface subjected to antiglare treatment to be evaluated, etc. A diffusive light source whose size is controlled by a mask and a CCD camera are arranged at an angular position, and the light from the light source is reflected on an anti-glare film surface through a window of the mask. The CCD camera captures and captures a specular reflection image from the antiglare-treated film through an aperture that is adjusted so that the peak luminance value of the reflected image is constant for the same sample. The luminance distribution curve of the image data is smoothed by a ninth-order polynomial to obtain a regression curve, and an inflection point is obtained from the second derivative of the regression curve, and the first derivative of the obtained inflection point. Determine the maximum angle of inclination of the regression curve from a method of evaluating the anti-glare properties are described by the value of said maximum inclination angle.

  However, the method for evaluating anti-glare properties in Patent Document 1 makes the angle between the camera and the illumination variable, and because processing is performed with a complicated algorithm, the processing engine becomes high-spec due to the processing speed and becomes expensive. Has the disadvantages.

Japanese Patent No. 4297457

  The present invention has been made in consideration of such circumstances, and the same evaluation can be obtained regardless of who evaluates the antiglare level, and it can be easily performed that is consistent with visual sensory evaluation. Let it be an issue.

In order to solve the above-described problems in the present invention, first, the invention of claim 1 includes an illumination device that illuminates a workpiece, a camera that photographs the workpiece, and a data processing device, and the data processing device is illuminated from the camera. Means for capturing an image of the reflected work, means for binarizing the image of the work with illumination, and means for evaluating the antiglare level based on the number of white binarized pixels in the binarized image An anti-glare inspection device having two threshold values for binarizing an image of a work in which illumination is reflected, and binarizing a binary image based on evaluating the anti-glare level number of pixels, the feature that it is an binary number of pixels of white binarized image of the difference obtained by subtracting the binary image obtained by binarizing a high threshold from the binary image binarized by low threshold This is an anti-glare inspection device.

The invention of claim 2, a method of data processing apparatus constituting the antiglare inspection device with a camera for photographing the illumination device and the work for illuminating the work to be executed, at least, of the workpiece fancy-through illumination from camera antiglare comprising the steps of capturing an image, and a step of binarizing an image of illumination fancy-through work, and a step of evaluating the anti-glare level based on the number of binary pixels in white binarized image There are two threshold values for binarizing the image of the work in which the illumination is reflected, and the number of white binarized pixels of the binarized image based on evaluating the antiglare level is Anti-glare property, which is the number of white binarized pixels in a binarized image obtained by subtracting a binarized image binarized with a high threshold from a binarized image binarized with a low threshold This is an inspection method.

According to a third aspect of the present invention, there is provided a step of taking an image of a workpiece in which illumination is reflected from a camera into a data processing device constituting an anti-glare inspection device together with an illumination device that illuminates the workpiece and a camera that photographs the workpiece, An anti-glare inspection program for executing a step of binarizing an image of a workpiece in which an image is reflected and a step of evaluating an anti-glare level based on the number of white binarized pixels of the binarized image. , There are two threshold values for binarizing the image of the work in which the illumination is reflected, and the binarized pixel number of the binary image based on evaluating the anti-glare level is binarized with a low threshold value. An anti-glare inspection program characterized by the number of white binarized pixels in a binarized image obtained by subtracting a binarized image binarized with a high threshold from the binarized image .

  The present invention has an effect that the same evaluation can be obtained regardless of who evaluates the antiglare level, and that it can be easily matched with visual sensory evaluation.

The front view when the door of the anti-glare test | inspection apparatus of one Embodiment of this invention is opened. The figure which shows the hardware constitutions of a data processor. It is explanatory drawing of a structure of a stage, Comprising: (a) is a top view of a workpiece pressing upper plate, (b) is a plan view of a workpiece, (c) is a plan view of a workpiece pressing lower plate, (d) is a workpiece that is a workpiece. The front view of a stage when it pinches | interposes between a presser upper plate and a workpiece presser lower plate and is fixed with a resin knurled screw. The figure which shows the installation positional relationship of a camera and an illuminating device. The figure which shows an inspection area in the image of the workpiece | work in which illumination was reflected. The figure which shows the image in the test | inspection area of the workpiece | work in which illumination was reflected. Samples with an anti-glare level lower than the standard limit and samples with an anti-glare level upper limit of the standard show the illumination obtained by shooting at a slower shutter speed so that the brightness of the reflected illumination is saturated. The figure which shows the image in the inspected area. The graph which shows the luminance distribution on the vertical line parallel to the arbitrary Y-axis of FIG. 7 about the image of the sample whose anti-glare level shown in FIG. The figure which shows the binarized image which binarized the image of the sample of the anti-glare level shown in FIG. The table | surface which shows the white binarized pixel number of each reference | standard sample. The graph which shows the white binarized pixel number of each reference | standard sample. An image in the inspection area where the illumination is reflected and a binarized image are shown for an anti-glare level of ± 3 and a non-standard (NG) sample, and an anti-glare level of 0 and a non-standard (OK) sample. Figure. Samples with an anti-glare level lower than the standard limit and samples with an anti-glare level upper limit of the standard show the illumination obtained by shooting at a higher shutter speed so that the brightness of the reflected illumination is not saturated. The figure which shows the image in the inspected area. The graph which shows the luminance distribution on the vertical line parallel to the arbitrary Y-axis of FIG. 13 about the image of the sample whose anti-glare level shown in FIG. For the sample images with anti-glare levels shown in FIG. 13 whose standard lower limit and upper limit are the threshold (1), the threshold (1) is a binarized image binarized with a high threshold (1), and the threshold (2) is a low threshold (2). ) Is a binarized image binarized, and (2)-(1) is a binarized image binarized with a high threshold (1) from a binarized image binarized with a low threshold (2). The figure which shows the binarized image of the pulled difference. For each sample, the anti-glare level visually evaluated by sensory evaluation (visual evaluation anti-glare Lv.), Pass / fail of whether it is within or outside the standard, a binary image binarized with a high threshold (1), a low threshold (2 ), A binarized image obtained by subtracting a binarized image binarized with a high threshold (1) from a binarized image binarized with a low threshold (2), The table | surface which shows the white binarized pixel number about each. The graph which shows the binarized pixel number of the white of the binarized image binarized by the anti-glare level (visual evaluation anti-glare Lv.) Visually evaluated about each sample, and the low threshold value (2). For each sample, the anti-glare level visually evaluated by sensory evaluation (visual evaluation anti-glare Lv.), The binary image binarized by the high threshold value (1) from the binarized image binarized by the low threshold value (2) The graph which shows the white binarized pixel number of the binarized image of the difference which pulled the binarized image. The flowchart which shows the example of the flow of an anti-glare level evaluation process.

  Hereinafter, an embodiment of the present invention will be described.

  As shown in FIG. 1, the anti-glare inspection device of this embodiment includes a box 9 and a data processing device 8.

  As shown in FIG. 1, the box 9 is provided with a stage 4 for fixing the work 5 on the bottom of the box 9, and an illumination device 7 for illuminating the work 5 on the ceiling and illumination from the illumination device 7. Is provided with a camera 6 that captures an image of the workpiece 5 in which the illumination from the illumination device 7 is captured and obtains an image of the workpiece 5 in which the illumination from the illumination device 7 is reflected.

  The box 9 is made of a black member in order to suppress light reflection.

  The data processing device 8 is a computer such as a personal computer. As shown in FIG. 2, the data processing device 8 includes a central processing unit, a main storage device, an auxiliary storage device, an input device such as a keyboard, a mouse, and a touch panel, and a display. An output device and connected to the camera 6.

  The data processing device 8 stores an anti-glare inspection program in the auxiliary storage device, loads the anti-glare inspection program into the main storage device, and executes it in the camera 6 by the central processing unit executing it. The work 5 in which the illumination from the illumination device 7 is reflected is photographed, and the image of the workpiece 5 in which the illumination from the illumination device 7 is reflected is taken in from the camera 6 to the main storage device. The anti-glare property of the work 5 is inspected by evaluating the property level.

  The work 5 is an antiglare test object, and examples thereof include an antireflection film used on the outermost surface of a display such as a liquid crystal television, a smartphone, and a tablet.

  As shown in FIGS. 1 and 3D, the stage 4 includes a resin knurled screw 1, a work pressing upper plate 2, and a work pressing lower plate 3.

  As shown in FIG. 3A, the work pressing upper plate 2 has a hollow 11 in the center, a hole A ', a hole B', and a hole C '.

  The work presser lower plate 3 has a hole A, a hole B, and a hole C as shown in FIG.

  The hole A of the work presser lower plate 3 has a thread that meshes with the resin knurled screw 1.

  While aligning the workpiece holding upper plate 2 and the workpiece holding lower plate 3 with the hole B ′ of the workpiece holding upper plate 2 and the hole B of the workpiece holding lower plate 3, FIG. 1 and FIG. As shown, the workpiece 5 is sandwiched between the workpiece holding upper plate 2 and the workpiece holding lower plate 3, and the resin knurled screw 1 is passed through the hole A ′ of the workpiece holding upper plate 2, and the hole A of the workpiece holding lower plate 3 is inserted. The workpiece 5 is fixed to the stage 4 by tightening the resin knurled screw 1.

  Thus, by fixing the work 5 to the stage 4, it is possible to prevent the reflection of illumination from changing as the work 5 is flattened and the work 5 is bent.

  A pin (not shown) is erected at the installation position of the stage 4 at the bottom inside the box 9, and this pin is connected to the hole C of the work presser lower plate 3 and the hole C ′ of the work presser upper plate 2. The position and the direction of the workpiece 5 are kept constant by being fitted to each other.

  Thus, by keeping the direction of the workpiece 5 constant, it is possible to prevent the reflection of illumination from changing due to the change in the direction of the workpiece 5.

  An adhesive material on which the workpiece 5 can be repeatedly peeled off is provided on the surface of the workpiece pressing lower plate 3 on which the workpiece 5 is placed. Even if the workpiece 5 is curled (warped), the workpiece 5 can be removed. It can be affixed flat on the work presser lower plate 3. Examples of such an adhesive material include slightly-adhesive urethane gel and silicone rubber.

  When the workpiece 5 is transparent, the surface of the workpiece presser lower plate 3 on which the workpiece 5 is placed is black, so that the workpiece 5 is in close contact with this surface with an adhesive material provided on this surface. In combination with this, the reflection on the back surface of the workpiece 5 can be reduced.

  Note that the stage 4 is an example of a mechanism for flattening the workpiece 5, and other mechanisms may be used as long as the workpiece 5 can be flattened. Further, the pin provided at the stage 4 installation position on the bottom inside the box 9 and the stage 4 are an example of a mechanism for making the direction of the work 5 constant. If the direction of the work 5 can be made constant, it is another mechanism. It doesn't matter. Furthermore, if the workpiece 5 is flat, a mechanism for flattening the workpiece 5 is not necessary.

  As shown in FIG. 4, the camera 6 has an installation angle of 0 degree with respect to the work 5, that is, the direction of the work 5 and the direction of the camera 6 is 90 degrees, as shown in FIG. Installed.

  Although no particular angle is specified for the illumination device 7, when the installation angle is set to 0 degree with respect to the workpiece 5 as shown in FIG. 4, the camera 6 and the illumination axis are shifted in order to prevent interference.

  At this time, since the illumination is shifted from the center of the camera field of view by the amount of the camera case, it is preferable to select a lens of the camera 6 that has as little influence of lens distortion as possible.

  The inspection area is a portion where there is no image distortion caused by the lens. Or it is good to calibrate the image distortion by a lens by performing image processing with an anti-glare inspection program.

  Since the edge portion is generated by using uniform surface emission with a frame or a pattern for illumination, it is effective for evaluating the sharpness of the reflection.

  By the anti-glare inspection program, the data processing device 8 captures an image of the work 5 in which the illumination obtained by the camera 6 is captured, as shown in FIG. The image in the inspection area as shown in FIG. 6 is obtained by cutting, and the antiglare level is evaluated for the image in the inspection area.

To evaluate the antiglare level,
[1] Magnification of reflected illumination (spread of light from illumination contour)
[2] Sharpness of the outline of the reflected illumination (clearness of the illumination outline)
The data processing device 8 selects one of the evaluation methods and evaluates the antiglare level by the selected evaluation method by the antiglare test program.

  First, [1] A method for evaluating the antiglare level based on the size of the reflected illumination (the spread of light from the illumination contour) will be described.

  First, for the samples with the anti-glare level being the lower limit of the standard and the samples with the anti-glare level being the upper limit of the standard, the magnitude of the spread of the reflected illumination was evaluated. Here, the standard lower limit of the antiglare level is −2, the standard upper limit of the antiglare level is +2, and the antiglare level of each sample is visually evaluated.

  Figure 7 shows a sample with an antiglare level at the lower limit of the standard and a sample with an antiglare level at the upper limit of the standard, each shot with a slower shutter speed so that the brightness of the reflected illumination is saturated. The image in the examination area where the illumination is reflected is shown. Comparing the images of the samples with the lower limit of the standard and the upper limit of the standard, it can be seen that the upper limit of the standard has a larger spread of the illumination reflection than the lower limit of the standard.

  FIG. 8 shows a luminance distribution on a vertical line parallel to an arbitrary Y axis in FIG. 7 for an image of a sample whose antiglare level shown in FIG. From the luminance distribution shown in FIG. 8, it can be seen that the image of the sample with the upper limit of the standard is broader than the image of the sample with the sample of the lower limit of the standard. Moreover, it turns out that the brightness | luminance of all the samples of a specification minimum and an upper limit is saturated at 250 vicinity.

  From such a tendency of the luminance distribution, the pixel is binarized to black and white with a certain luminance threshold, the number of white or black binarized pixels is calculated, and the number of white or black binarized pixels is compared to expand. It is possible to make a numerical evaluation of the size of. Here, in the binarization, a pixel having a luminance equal to or higher than the luminance threshold is set to white, a pixel having a luminance lower than the threshold is set to black, or a pixel having a luminance higher than the luminance threshold is set to white, and the pixel having a luminance equal to or lower than the threshold is set. A pixel having luminance is black.

  As an example, FIG. 9 shows a binarized image obtained by binarizing the sample image of the standard lower limit and the standard upper limit of FIG. FIG. 9 shows that the binarized image of the sample with the upper limit of the standard has a larger area of the binarized white pixels. Thus, at the standard lower limit and the standard upper limit, the antiglare level can be evaluated by numerical evaluation.

  Next, with respect to the reference sample, evaluation of the extent of the reflected illumination is performed, and the shutter speed is slowed down so that the brightness of the reflected illumination part is saturated, as with the lower and upper specification standards. And took a picture.

  Here, the reference sample is a sample visually set with an antiglare level from -4 to +4.

  FIG. 10 shows a table of the number of white binarized pixels of each reference sample, and FIG. 11 shows a graph of the number of white binarized pixels of each reference sample.

  Regarding the relationship between the antiglare level visually evaluated by sensory evaluation and the number of white binarized pixels, the number of white binarized pixels increases as the antiglare level increases.

  In addition, FIG. 12 shows an image in the inspection area in which the illumination is reflected and 2 for a sample with an anti-glare level of ± 3 and a non-standard (NG) sample, and a sample with an anti-glare level of 0 and within the standard (OK). Although a binarized image is shown, it can be seen that there is a difference in the number of white binarized pixels.

  As described above, when shooting with a slow shutter speed so that the brightness of the reflected illumination portion is saturated, the image in the inspection area in which the illumination of the work 5 is reflected is binarized and binary white. By comparing the white binarized pixel number with a table that correlates the white binarized pixel number of the binarized image binarized with the threshold and the anti-glare level, An antiglare level of 5 can be evaluated.

  In addition, when shooting at a slower shutter speed so that the brightness of the reflected illumination is saturated, the antiglare level is within the standard by determining the number of white binarized pixels at the upper and lower limits of the standard. It is possible to determine whether it is OK or non-standard and NG.

  Next, [2] a method for evaluating the antiglare level based on the sharpness of the contour of the reflected illumination (the sharpness of the illumination contour) will be described.

  First, the clarity of the contour of the reflected illumination was evaluated for samples with an antiglare level having a lower limit of the standard and samples with an antiglare level having an upper limit of the standard. Here, the standard lower limit of the antiglare level is −2, the standard upper limit of the antiglare level is +2, and the antiglare level of each sample is visually evaluated.

  First, in FIG. 13, the samples with the anti-glare level being the lower limit of the standard and the samples having the anti-glare level having the upper limit of the standard were shot at a higher shutter speed so as not to saturate the brightness of the reflected illumination part. The image in the examination area where the illumination obtained in this way is reflected. Comparing the images of the samples with the lower limit of the standard and the upper limit of the standard, it can be seen that the illumination contour of the lower limit of the standard is clearer than the upper limit of the standard.

  FIG. 14 shows a luminance distribution on a vertical line parallel to an arbitrary Y axis in FIG. 13 for an image of a sample whose antiglare level shown in FIG.

  Comparing the luminance distribution at the upper limit of the standard with the luminance distribution at the lower limit of the standard, the luminance distribution at the lower limit of the standard has a high peak and a sharp base, and the luminance distribution at the upper limit of the standard has a low peak and a broad base. I know that there is.

  Furthermore, the luminance distribution has a point where the upper limit of the standard and the lower limit of the standard intersect.

  When two threshold values (threshold value (1) and threshold value (2) shown in FIG. 14) are provided across the intersection point and the pixel is binarized to black and white, as shown by threshold value (1) in FIG. When binarization is performed with a high threshold (1), the lower limit of the standard has a larger number of white binarized pixels than the upper limit of the standard, and as shown in the threshold (2) of FIG. When binarization is performed with a low threshold (2), the number of white binarized pixels is larger at the upper limit of the standard than at the lower limit of the standard.

As a result, as shown in (2)-(1) of FIG. 15, from the binarized image binarized with the threshold (2) whose luminance is lower than that of the intersection, the threshold (1) whose luminance is higher than that of the intersection. In the binarized image obtained by subtracting the binarized binarized image, the lower limit of the standard has a smaller number of white binarized pixels than the upper limit of the standard. As described above, the lower limit of the standard has a clearer illumination contour than the upper limit of the standard.

  Thus, the sharpness of the illumination contour is obtained by converting a binarized image binarized with a threshold (1) higher in luminance than the intersection from a binarized image binarized with the threshold (2) lower in luminance than the intersection. It can be evaluated by the binarized image of the subtracted difference. That is, if the number of white pixels in this difference binary image is small, the illumination contour is clear.

  Next, for the actual sample, the sharpness of the reflected light outline is evaluated, and the shutter speed is increased so that the brightness of the reflected light part is not saturated, as with the lower and upper specification standards. I took a picture and carried it out.

  In FIG. 16, for each sample, the anti-glare level visually evaluated by the sensory evaluation (visual evaluation anti-glare Lv.), Pass / fail of whether it is within or outside the standard, a binarized image binarized with a high threshold (1), A difference of 2 obtained by subtracting a binarized image binarized with a low threshold (2) and a binarized image binarized with a low threshold (2) from a binarized image binarized with a high threshold (1) The table which shows the binarized image and the white binarized pixel number for each is shown.

  FIG. 17 shows the white binarized pixels of the binarized image binarized with the antiglare level visually evaluated for each sample (visual evaluation antiglare Lv.) And the low threshold (2). The graph which shows a number is shown.

  Further, in FIG. 18, for each sample, the antiglare level visually evaluated by sensory evaluation (visual evaluation antiglare Lv.), From a binarized image binarized with a low threshold (2), with a high threshold (1). The graph which shows the white binarized pixel number of the binarized image of the difference which pulled the binarized binarized image is shown.

  As apparent from the table of FIG. 16, the anti-glare level visually evaluated for samples A to F is between 0 and +1, −2 of the lower limit of the standard, and +2 of the upper limit of the standard. Whether it is inside or outside is OK because it is within the standard. On the other hand, the anti-glare level visually evaluated for the sample G is +3, which exceeds the upper limit of +2 of the standard. Therefore, whether it is within or outside the standard is NG because it is out of the standard. Yes.

  The binarization of the image in the examination area where the illumination is reflected with a low threshold (2) and the anti-glare level is evaluated from the number of white binarized pixels, as described above, [1] 17 is an evaluation method based on the extent of illumination expansion (expansion of light from the illumination contour portion). However, in the case of shooting at a high shutter speed so as not to saturate the brightness of the reflected illumination portion, FIG. As is clear from the graph, the samples A to F with pass / fail OK and the sample G with pass / fail NG have almost the same number of white binarized pixels binarized with a low threshold (2) and are difficult to distinguish. It is.

  On the other hand, as is apparent from the graph of FIG. 18, the binarized image of the difference obtained by subtracting the binarized image binarized with the high threshold (1) from the binarized image binarized with the low threshold (2). In the case of white binarized pixels, there is a difference in the number of white binarized pixels between the samples A to F in which pass / fail is OK and the sample G in which pass / fail is NG, and the sharpness of the contour of the reflected illumination It is possible to distinguish samples that are NG in the evaluation.

  As described above, when shooting at a high shutter speed so as not to saturate the brightness of the reflected illumination portion, the image in the inspection area in which the illumination of the work 5 is reflected is expressed by two thresholds (1) and (1). 2) White binary of the difference binarized image obtained by subtracting the binarized image binarized and binarized with the high threshold (1) from the binarized image binarized with the low threshold (2) The difference between the binarized image obtained by binarizing the white binarized pixel number with the high threshold (1) from the binarized image binarized with the low threshold (2). It is possible to evaluate the antiglare level of the work 5 by comparing with the table that associates the number of white binarized pixels of the binarized image with the antiglare level.

  As is apparent from the above description of the two evaluation methods, the auxiliary storage device of the data processing device 8 has [1] an evaluation method for the size of the reflected illumination (the spread of light from the illumination contour). As a data necessary for performing the above, a table that associates a threshold, the number of white binarized pixels of the binarized image binarized with the threshold, and the anti-glare level (hereinafter also referred to as a first correspondence table). ) And are saved.

  In addition, the auxiliary storage device of the data processing device 8 has [2] a high threshold (1) as data necessary for performing the evaluation method of the sharpness of the reflected illumination outline (the clarity of the illumination outline). The difference between the binarized image obtained by subtracting the binarized image binarized with the high threshold (1) from the binarized image binarized with the low threshold (2) and the low threshold (2) A table that associates the number of binarized pixels with the antiglare level (hereinafter also referred to as a second correspondence table) is stored.

  The auxiliary storage device of the data processing device 8 stores -2 as the value of the anti-glare level at the lower limit of the specification and +2 as the value of the anti-glare level at the lower limit of the specification.

  Below, the example of the flow of the glare-proof level evaluation process which the data processing apparatus 8 performs with a glare-proof inspection program is demonstrated according to the flowchart of FIG.

S (STEP) 1;
[1] Evaluation by any of the evaluation methods of the size of the reflected illumination spread (the spread of light from the illumination contour) and [2] the sharpness of the reflected illumination contour (the sharpness of the illumination contour) Is selected and input by an input device.

S (STEP) 2;
The camera 6 captures an image of the workpiece 5 in which the illumination from the illumination device 7 is reflected, and the camera 6 captures an image of the workpiece 5 in which the illumination is reflected.

S (STEP) 3;
The inspection area is cut out from the image of the workpiece 5 in which the illumination is reflected, and an image in the inspection area of the workpiece 5 in which the illumination is reflected is obtained.

S (STEP) 4;
[1] Select the evaluation method for the size of the reflected illumination (the spread of light from the illumination contour) or [2] the sharpness of the reflected illumination (the sharpness of the illumination contour) To determine whether or not
[1] When the evaluation method of the size of the reflected illumination spread (the spread of light from the illumination contour portion) is selected, the process proceeds to STEP5.
On the other hand, if [2] the evaluation method of the sharpness of the reflected illumination outline (the clarity of the illumination outline) is selected, the process proceeds to STEP8.

S (STEP) 5;
A threshold value is read from the auxiliary storage device, and the image in the inspection area of the work 5 on which the illumination is reflected is binarized with this threshold value.

S (STEP) 6;
The number of white binarized pixels is obtained from the binarized image in the inspection area of the work 5 in which the illumination is reflected.

S (STEP) 7;
The first correspondence table is read from the auxiliary storage device, and the anti-glare level of the work 5 is evaluated by comparing the first correspondence table with the obtained white binarized pixel number. move on.

S (STEP) 8;
The threshold value (1) is read from the auxiliary storage device, and the image in the inspection area of the work 5 on which the illumination is reflected is binarized with the threshold value (1).

S (STEP) 9;
The threshold value (2) is read from the auxiliary storage device, and the image in the inspection area of the work 5 on which the illumination is reflected is binarized with the threshold value (2).

S (STEP) 10;
A difference binarized image obtained by subtracting the binarized image binarized by the threshold (1) from the binarized image binarized by the threshold (2) is obtained.

S (STEP) 11;
The number of white binarized pixels is obtained from the binarized image of the obtained difference.

S (STEP) 12;
The anti-glare level of the work 5 is evaluated by reading the second correspondence table from the auxiliary storage device and comparing the second correspondence table with the obtained white binary pixel count.

S (STEP) 13;
The work 5 obtained by reading out the value of the anti-glare level at the lower limit of the standard and the value of the anti-glare level at the upper limit of the standard from the auxiliary storage device, and evaluating the value of the lower limit of the standard and the value of the upper limit of the standard, respectively. Compared with the anti-glare level, it is determined whether the workpiece 5 is OK within the standard or NG outside the standard.

S (STEP) 14;
The evaluation result of the antiglare level of the workpiece 5 and the determination result within and outside the standard are output by the output device and stored in the auxiliary storage device.

DESCRIPTION OF SYMBOLS 1 ... Resin knurled screw 2 ... Work holding | maintenance upper board 3 ... Work holding | maintenance lower board 4 ... Stage 5 ... Work 6 ... Camera 7 ... Illuminating device 8 ... Data processing device 9 ... Box 10 ... Door 11 ... Center part hollow A ... Hole A '... Hole B ... Hole B' ... Hole C ... Pin C '... Hole

Claims (3)

A lighting device that illuminates a workpiece, a camera that shoots the workpiece, and a data processing device are provided. The data processing device captures an image of the workpiece that is illuminated from the camera, and an image of the workpiece that is illuminated. An anti-glare inspection apparatus having means for binarizing and means for evaluating the anti-glare level based on the number of white binarized pixels of the binarized image ,
There are two threshold values for binarizing the image of the work in which the illumination is reflected, and the binary binarized pixel number of the binarized image based on evaluating the antiglare level is binarized with a low threshold value. antiglare inspection device, characterized in that it is a binary number of pixels of white binarized image of the difference obtained by subtracting the binary image obtained by binarizing the binary image with a high threshold. How to perform a data processing apparatus constituting the antiglare inspection device with a camera for photographing the illumination device and the work for illuminating the workpiece,
At least a step of capturing an image of a work in which illumination is reflected from a camera, a step of binarizing the image of a work in which illumination is reflected, and anti-glare based on the number of white binarized pixels in the binarized image An anti-glare test method comprising a step of evaluating a sex level ,
There are two threshold values for binarizing the image of the work in which the illumination is reflected, and the binary binarized pixel number of the binarized image based on evaluating the antiglare level is binarized with a low threshold value. An anti-glare inspection method characterized by the number of white binarized pixels of a binarized image obtained by subtracting a binarized image binarized with a high threshold from the binarized image . The process of capturing the image of the workpiece with the illumination reflected from the camera and the image of the workpiece with the illumination reflected in the data processing device constituting the anti-glare inspection device together with the illumination device for illuminating the workpiece and the camera for photographing the workpiece. An anti-glare test program that executes a binarization step and a step of evaluating an anti-glare level based on the number of white binarized pixels in a binarized image ,
There are two threshold values for binarizing the image of the work in which the illumination is reflected, and the binary binarized pixel number of the binarized image based on evaluating the antiglare level is binarized with a low threshold value. An anti-glare inspection program characterized by the number of white binarized pixels of a binarized image obtained by subtracting a binarized image binarized with a high threshold from the binarized image .