TWI559137B - Solid storage device with mixed storage mode - Google Patents

Solid storage device with mixed storage mode Download PDF

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TWI559137B
TWI559137B TW103122240A TW103122240A TWI559137B TW I559137 B TWI559137 B TW I559137B TW 103122240 A TW103122240 A TW 103122240A TW 103122240 A TW103122240 A TW 103122240A TW I559137 B TWI559137 B TW I559137B
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storage
block address
data
potential
mode
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TW201600964A (en
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Hung Wen Pan
Yin Chuan Liao
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Apacer Technology Inc
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Description

具混合儲存模式的固態儲存裝置Solid state storage device with mixed storage mode

本發明有關一種固態儲存裝置,尤指一種以相同快閃記憶體實施兩種以上電位儲存模式的固態儲存裝置。The present invention relates to a solid state storage device, and more particularly to a solid state storage device that implements two or more potential storage modes in the same flash memory.

按,隨固態儲存裝置(Solid-State Drive,SSD)技術的成熟,以逐漸取代習用硬碟裝置(Hard Disk Drive,HDD),固態儲存裝置相較於習用硬碟裝置具有資料存取的反應速度快速、耗電量低、重量輕等優點。According to the maturity of Solid-State Drive (SSD) technology, it gradually replaces the Hard Disk Drive (HDD). The solid-state storage device has the data access speed compared with the conventional hard disk device. Fast, low power consumption, light weight and so on.

又,固態儲存裝置主要利用一快閃記憶體的浮置閘極電晶體來儲存資料位元數據,且根據每一該電晶體所能儲存的資料位元數量可區分成單級單元式(Single-Level Cell,SLC)與多級單元式(Multi-Level Cell,MLC)等兩種電位儲存模式。該單級單元式於實施時,僅會有兩種電壓的變化,也就是每一該電晶體僅會儲存有單一資料位元,而多級單元式於實施時,則可於每一該電晶體內儲存二至三個資料位元。因此,於當使用多級單元式實施時,每一該電晶體所能儲存資料位元的數量是以單級單元式實施的數倍,且以多級單元式實施的快閃記憶體其製造成本相對低廉,但此種實施方式於資料存取的反應速度相對較慢、壽命較低。然而,以單級單元式實施的快閃記憶體其雖然具有穩定性較高、資料存取的反應速度相對較快以及使用壽命較長的優點,但其所能儲存資料的容量密度較低,使其製造成本相對較高。Moreover, the solid state storage device mainly uses a floating gate transistor of a flash memory to store data bit data, and can be divided into single-level cells according to the number of data bits that can be stored in each transistor (Single) -Level Cell, SLC) and Multi-Level Cell (MLC) and other potential storage modes. When the single-stage unit is implemented, there are only two kinds of voltage changes, that is, each of the transistors only stores a single data bit, and when the multi-level unit is implemented, it can be used for each of the units. Two to three data bits are stored in the crystal. Therefore, when the multi-level cell implementation is used, the number of data bits that can be stored in each of the transistors is several times that of a single-stage cell, and the flash memory is implemented in a multi-level cell. The cost is relatively low, but this type of implementation has a relatively slow response rate and a low lifetime in data access. However, the flash memory implemented in a single-stage unit has the advantages of high stability, relatively fast response speed of data access, and long service life, but the capacity density of the data that can be stored is low. It makes its manufacturing cost relatively high.

據此,各家廠商紛紛提出包含有單級單元式電位儲存模式以及多級單元式電位儲存模式的混合式固態儲存裝置,就如中華民國發明第I385517號專利案,其公開一種儲存裝置,其是以一第一快閃記憶體以及一相異於該第一快閃記憶體的第二快閃記憶體產生混合式儲存的目的,但該專利案於使用上需要添購兩種不同種類的快閃記憶體,使得製造成本仍會受限於以單級單元式電位儲存模式實施的快閃記憶體的售價,無法有效的下降。Accordingly, various manufacturers have proposed a hybrid solid-state storage device including a single-stage unit type potential storage mode and a multi-stage unit type potential storage mode, as disclosed in the Patent No. I385517 of the Republic of China, which discloses a storage device. The purpose of generating a hybrid storage is to use a first flash memory and a second flash memory different from the first flash memory, but the patent requires two different kinds of purchases. The flash memory makes the manufacturing cost still limited by the price of the flash memory implemented in the single-stage cell potential storage mode, which cannot be effectively reduced.

本發明之主要目的,在於解決習用固態儲存裝置僅能以單一電位儲存模式實施所產生的資料穩定性以及資料儲存量的問題。The main object of the present invention is to solve the problem that the conventional solid-state storage device can only implement the data stability and the data storage amount generated by the single potential storage mode.

為達上述目的,本發明提供一種具混合儲存模式的固態儲存裝置,該固態儲存裝置包含有一快閃記憶體以及一資料處理模組。其中,該快閃記憶體包含有一以一第一電位儲存模式儲存資料的第一儲存磁區以及一以相異於該第一電位儲存模式的一第二電位儲存模式儲存資料的第二儲存磁區,該第一儲存磁區包含有M個資料區塊,該第二儲存磁區包含有N個資料區塊,每一該資料區塊分別對應一實體區塊位址以及一邏輯區塊位址,該第一儲存磁區的實體區塊位址為P0 至PM-1 ,而該邏輯區塊位址為L0 至LM-1 ,該第二儲存磁區的實體區塊位址為PM 至PM+N-1 ,而該邏輯區塊位址為LM 至LM+N-1 。該資料處理模組與該快閃記憶體資訊連接,具有一接受一指令並解讀該指令所包含的該邏輯區塊位址而於對應的該實體區塊位址執行指令動作的資料處理模式。To achieve the above object, the present invention provides a solid state storage device having a mixed storage mode, the solid state storage device comprising a flash memory and a data processing module. The flash memory includes a first storage magnetic area for storing data in a first potential storage mode and a second storage magnetic field for storing data in a second potential storage mode different from the first potential storage mode. The first storage magnetic area includes M data blocks, and the second storage magnetic area includes N data blocks, each of the data blocks corresponding to a physical block address and a logical block position. Address, the physical block address of the first storage magnetic zone is P 0 to P M-1 , and the logical block address is L 0 to L M-1 , and the physical block position of the second storage magnetic zone The address is P M to P M+N-1 , and the logical block address is L M to L M+N-1 . The data processing module is coupled to the flash memory information, and has a data processing mode that accepts an instruction and interprets the logical block address included in the instruction and performs an instruction action on the corresponding physical block address.

於一實施例中,該第一電位儲存模式為單級單元式,而該第二電位儲存模式為多級單元式。進一步地,該資料處理模組具有一判斷該指令所包含的該邏輯區塊位址為L0 至LM-1 時對該指令加入一電位調變指令改變該指令原有電位儲存方式的資料調變模式。In an embodiment, the first potential storage mode is a single-stage unit type, and the second potential storage mode is a multi-level unit type. Further, the data processing module has a data indicating that the logical block address included in the instruction is L 0 to L M-1 , and a potential modulation command is added to the instruction to change the original potential storage mode of the instruction. Modulation mode.

於一實施例中,該第一電位儲存模式為多級單元式,而該第二電位儲存模式為單級單元式。進一步地,該資料處理模組具有一判斷該指令所包含的該邏輯區塊位址為LM 至LM+N-1 時對該指令加入一電位調變指令改變該指令原有電位儲存方式的資料調變模式。In an embodiment, the first potential storage mode is a multi-level cell type, and the second potential storage mode is a single-stage cell type. Further, the data processing module has a function of determining that the logical block address included in the instruction is L M to L M+N-1 , adding a potential modulation command to the instruction, and changing the original potential storage mode of the instruction. Data modulation mode.

於一實施例中,該第一儲存磁區的資料儲存容量相異於該第二儲存磁區的資料儲存容量。In one embodiment, the data storage capacity of the first storage magnetic zone is different from the data storage capacity of the second storage magnetic domain.

於一實施例中,該資料處理模組包含有一記錄該第一儲存磁區所對應的實體區塊位址為P0 至PM-1 以及邏輯區塊位址L0 至LM-1 的第一映對表,以及一記錄該第二儲存磁區所對應的實體區塊位址為PM 至PM+N-1 以及邏輯區塊位址LM 至LM+N-1 的第二映對表。In an embodiment, the data processing module includes a physical block address corresponding to the first storage magnetic zone as P 0 to P M-1 and logical block addresses L 0 to L M-1 . a first mapping table, and a physical block address corresponding to the second storage magnetic zone, P M to P M+N-1 and a logical block address L M to L M+N-1 The second pair is on the table.

於一實施例中,該快閃記憶體更包含有一以相異於該第一電位儲存模式及該第二電位儲存模式的第三電位儲存模式儲存資料的第三儲存磁區,該第三儲存磁區包含有R個資料區塊,該第三儲存磁區的實體區塊位址為PN 至PN+R-1 ,而該邏輯區塊位址為LN 至LN+R-1 。進一步地,該資料處理模組包含有一記錄該第一儲存磁區所對應的實體區塊位址為P0 至PM-1 以及邏輯區塊位址L0 至LM-1 的第一映對表,一記錄該第二儲存磁區所對應的實體區塊位址為PM 至PM+N-1 以及邏輯區塊位址LM 至LM+N-1 的第二映對表,以及一記錄該第三儲存磁區所對應的實體區塊位址為PN 至PN+R-1 以及邏輯區塊位址LN 至LN+R-1 的第三映對表。In one embodiment, the flash memory further includes a third storage magnetic region for storing data in a third potential storage mode different from the first potential storage mode and the second potential storage mode, the third storage area. The magnetic zone includes R data blocks, the physical block address of the third storage magnetic zone is P N to P N+R-1 , and the logical block address is L N to L N+R-1 . Further, the data processing module includes a first image recording a physical block address corresponding to the first storage magnetic zone as P 0 to P M-1 and a logical block address L 0 to L M-1 For the table, a second mapping table for recording the physical block address corresponding to the second storage magnetic zone to P M to P M+N-1 and the logical block address L M to L M+N-1 And a third mapping table recording the physical block addresses corresponding to the third storage magnetic zone as P N to P N+R-1 and the logical block addresses L N to L N+R-1 .

於一實施例中,該資料處理模組具有一於該指令為寫入資料動作時根據該第一儲存磁區及該第二儲存磁區的每一該資料區塊的消除次數找出一可記錄區塊進行平均寫入的平均寫入演算法。In one embodiment, the data processing module has a number of times of eliminating each of the data blocks of the first storage magnetic zone and the second storage magnetic area when the instruction is a data write operation. The average write algorithm for the average write of the recorded block.

透過本發明上述實施方式,相較於習用具有以下特點:本發明以同一電晶體種類的該快閃記憶體實施,且將該快閃記憶體區分為該第一儲存磁區以及該第二儲存磁區,令該第一儲存磁區與該第二儲存磁區所使用的電位儲存方式相異,據此以提供一種具高穩定性及高資料儲存容量的固態儲存裝置。Through the above embodiments of the present invention, the present invention has the following features: the present invention is implemented by the flash memory of the same transistor type, and the flash memory is divided into the first storage magnetic region and the second storage. The magnetic zone is such that the first storage magnetic zone is different from the potential storage mode used by the second storage magnetic zone, thereby providing a solid state storage device with high stability and high data storage capacity.

有關本發明之詳細說明及技術內容,現就配合圖式說明如下:The detailed description and technical contents of the present invention will now be described as follows:

請參閱圖1以及圖2,本發明具混合儲存模式的固態儲存裝置100,其主要包含有一快閃記憶體1以及一與該快閃記憶體1資訊連接的資料處理模組2。進一步地,本發明該快閃記憶體1可以是由複數晶片組構而成,每一該晶片的電晶體種類為相同。換言之,本發明該快閃記憶體1於未實施前僅具有單一種電位儲存模式,如多級單元式(Multi-Level Cell,MLC)。又,該快閃記憶體1具有複數資料區塊11,每一該資料區塊11分別對應一實體區塊位址(Physical Block Address,PBA)以及一邏輯區塊位址(Logical Block Address,LBA),進一步地,本發明以該邏輯區塊位址將該快閃記憶體1區分為一第一儲存磁區12以及一第二儲存磁區13,其中,該第一儲存磁區12包含有M個資料區塊11,其所對應的該實體區塊位址為P0 至PM-1 ,該邏輯區塊位址為L0 至LM-1 ,該第二儲存磁區13則包含有N個資料區塊11,所對應的該實體區塊位址則為PM 至PM+N-1 ,該邏輯區塊位址為LM 至LM+N-1Referring to FIG. 1 and FIG. 2 , the solid state storage device 100 of the present invention has a flash memory 1 and a data processing module 2 connected to the flash memory 1 . Further, the flash memory 1 of the present invention may be composed of a plurality of wafers, each of which has the same type of transistor. In other words, the flash memory 1 of the present invention has only a single potential storage mode, such as a Multi-Level Cell (MLC), before it is implemented. Moreover, the flash memory 1 has a plurality of data blocks 11, each of which corresponds to a physical block address (PBA) and a logical block address (LBA). Further, the present invention divides the flash memory 1 into a first storage magnetic area 12 and a second storage magnetic area 13 by using the logical block address, wherein the first storage magnetic area 12 includes M data blocks 11, the corresponding physical block addresses are P 0 to P M-1 , the logical block addresses are L 0 to L M-1 , and the second storage magnetic region 13 includes There are N data blocks 11, and the corresponding physical block address is P M to P M+N-1 , and the logical block address is L M to L M+N-1 .

由上述可知本發明該快閃記憶體1於未實施時僅具有單一種電位儲存模式,但本發明於實施的過程中透過該資料處理模組2改變其中一儲存磁區的電位儲存模式以模擬另一電位儲存模式記錄資料,更具體說明,本發明該第一儲存磁區12是以一第一電位儲存模式儲存資料,而該第二儲存磁區13則以一相異於該第一電位儲存模式的第二電位儲存模式儲存資料,於一實施例中,該第一電位儲存模式為單級單元式(Single-Level Cell,SLC),該第二電位儲存模式則為多級單元式,但本發明並不以此為限,亦可為該第一電位儲存模式為多級單元式,該第二電位儲存模式為單級單元式。又,本發明該快閃記憶體1於區分該第一儲存磁區12及該第二儲存磁區13後,由於該第一儲存磁區12與該第二儲存磁區13的電位儲存模式不同,使本發明該第一儲存磁區12的資料儲存容量相異於該第二儲存磁區13的資料儲存容量。舉例說明,當該第一儲存磁區12的該第一電位儲存模式為單級單元式時,該第一儲存磁區12內的每一該資料區塊11內的每一該電晶體僅會記錄一個位元的資料,使該第一儲存磁區12的資料儲存容量會小於該第二儲存磁區13以多級單元式為第二電位儲存模式實施的資料儲存容量。It can be seen from the above that the flash memory 1 of the present invention has only a single potential storage mode when not implemented. However, in the implementation process, the present invention changes the potential storage mode of one of the storage magnetic regions through the data processing module 2 to simulate Another potential storage mode recording data, more specifically, the first storage magnetic region 12 of the present invention stores data in a first potential storage mode, and the second storage magnetic region 13 is different from the first potential. The second potential storage mode of the storage mode stores data. In an embodiment, the first potential storage mode is a single-level cell (SLC), and the second potential storage mode is a multi-level cell. However, the present invention is not limited thereto, and the first potential storage mode may be a multi-stage unit type, and the second potential storage mode is a single-stage unit type. Moreover, after the flash memory 1 of the present invention distinguishes the first storage magnetic region 12 and the second storage magnetic region 13, the potential storage mode of the first storage magnetic region 12 and the second storage magnetic region 13 are different. The data storage capacity of the first storage magnetic region 12 of the present invention is different from the data storage capacity of the second storage magnetic region 13. For example, when the first potential storage mode of the first storage magnetic region 12 is a single-stage unit type, each of the transistors in the data storage block 11 in the first storage magnetic region 12 will only The data of one bit is recorded such that the data storage capacity of the first storage magnetic zone 12 is smaller than the data storage capacity of the second storage magnetic zone 13 implemented by the multi-level cell type as the second potential storage mode.

承上,本發明該資料處理模組2與該快閃記憶體1資訊連接,並具有一接受一指令D1並解讀該指令所包含的該邏輯區塊位址而對應於該實體區塊位址執行指令動作的資料處理模式。更具體說明,本發明該固態儲存裝置100可與一計算機裝置(如電腦)連接,並令該計算機裝置3對其進行資料寫入或讀取的動作,而本發明所稱該指令D1即是由該計算機裝置3所發出,當該計算機裝置3向該固態儲存裝置100發出該指令D1,該資料處理模組2接受該指令D1後,即解讀該指令D1所包含要求執行動作所屬資料的該邏輯區塊位址,並根據該邏輯區塊位址讀取相對應的資料。進一步地,由上述可以知道,本發明該第一電位儲存模式可以為多級單元式實施,因此,該資料處理模組2更具有一判斷該指令D1所包含的該邏輯區塊位址為L0 至LM-1 時對該指令D1加入一電位調變指令改變該指令D1原有電位儲存方式的資料調變模式。此外,若本發明於一實施例中,該第二電位儲存模式是以多級單元式實施時,該資料處理模組2所具有的該資料調變模式則是針對該指令D1所包含的該邏輯區塊位址為LM 至LM+N-1 時實施。承上,本發明令該資料處理模組2具有該資料調變模式以將原先多級單元式的電位儲存模式模擬成單級單元式的電位儲存模式。又,該電位調變指令可以是一旗標指令又或者是一分頁指令。The data processing module 2 of the present invention is connected to the flash memory 1 and has an instruction D1 and interprets the logical block address included in the instruction to correspond to the physical block address. The data processing mode for executing the instruction action. More specifically, the solid state storage device 100 of the present invention can be connected to a computer device (such as a computer) and cause the computer device 3 to perform data writing or reading, and the instruction D1 is referred to in the present invention. When the computer device 3 issues the command D1 to the solid-state storage device 100, the data processing module 2 receives the command D1, and then interprets the data of the instruction D1 that is required to execute the action. The logical block address, and the corresponding data is read according to the logical block address. Further, it can be known from the foregoing that the first potential storage mode of the present invention can be implemented in a multi-level unit manner. Therefore, the data processing module 2 further has a judgment that the logical block address included in the instruction D1 is L. When 0 to L M-1 , a potential modulation command is added to the command D1 to change the data modulation mode of the original potential storage mode of the command D1. In addition, in the embodiment, when the second potential storage mode is implemented in a multi-level cell, the data modulation mode of the data processing module 2 is for the command D1. Implemented when the logical block address is L M to L M+N-1 . According to the invention, the data processing module 2 has the data modulation mode to simulate the potential storage mode of the original multi-level cell into a single-stage cell potential storage mode. Moreover, the potential modulation command can be a flag command or a page command.

再者,復請參閱圖2,本發明該資料處理模組2更包含有一記錄該第一儲存磁區12所對應的該實體區塊位址為P0 至PM-1 以及該邏輯區塊位址L0 至LM-1 的第一映對表T1,以及一記錄該第二儲存磁區13所對應的該實體區塊位址為PM 至PM+N-1 以及該邏輯區塊位址LM 至LM+N-1 的第二映對表T2。藉此,該資料處理模組2可以藉由該第一映對表T1及該第二映對表T2快速地將每一該邏輯區塊位址與每一該實體區塊位址完成對應。又,資料處理模組2更包含有一於該指令D1為寫入資料動作時根據該第一儲存磁區12及該第二儲存磁區13的每一該資料區塊11的消除次數找出一可記錄區塊進行平均寫入的平均寫入演算法。In addition, referring to FIG. 2, the data processing module 2 of the present invention further includes a record of the physical block address corresponding to the first storage magnetic area 12 as P 0 to P M-1 and the logical block. The first mapping table T1 of the addresses L 0 to L M-1 , and the physical block address corresponding to the recording of the second storage magnetic region 13 are P M to P M+N-1 and the logical region The second mapping table T2 of the block address L M to L M+N-1 . Thereby, the data processing module 2 can quickly associate each of the logical block addresses with each of the physical block addresses by the first mapping table T1 and the second mapping table T2. Moreover, the data processing module 2 further includes a number of times of erasing the data block 11 according to the first storage magnetic area 12 and the second storage magnetic area 13 when the instruction D1 is a write data operation. The average write algorithm for the average write of the recordable block.

除此之外,並請參閱圖3,本發明於一實施例中,該快閃記憶體1除包含有該第一儲存磁區12以及該第二儲存磁區13之外,更包含有一以相異於該第一電位儲存模式及該第二電位儲存模式的第三電位儲存模式儲存資料的第三儲存磁區14,該第三儲存磁區14包含有R個資料區塊11,該第三儲存磁區14的實體區塊位址為PN 至PN+R-1 ,而該邏輯區塊位址為LN 至LN+R-1 。舉例說明,於本實施例中,該第一電位儲存模式為單級單元式,該第二電位儲存模式為多級單元式,而該第三電位儲存模式則可以為一三層式儲存(TLC)。再者,於此實施例中,該資料處理模組2除可包含該第一映對表T1及該第二映對表T2之外,更可以包含有一記錄該第三儲存磁區14所對應的該實體區塊位址為PN 至PN+R-1 以及該邏輯區塊位址LN 至LN+R-1 的第三映對表T3。In addition, referring to FIG. 3, in an embodiment of the present invention, the flash memory 1 includes, in addition to the first storage magnetic region 12 and the second storage magnetic region 13, a third storage magnetic region 14 storing data corresponding to the first potential storage mode and the third potential storage mode of the second potential storage mode, the third storage magnetic region 14 including R data blocks 11 The physical block address of the three storage magnetic area 14 is P N to P N+R-1 , and the logical block address is L N to L N+R-1 . For example, in the embodiment, the first potential storage mode is a single-stage unit type, the second potential storage mode is a multi-level unit type, and the third potential storage mode may be a three-layer storage (TLC). ). Furthermore, in this embodiment, the data processing module 2 may further include a record corresponding to the third storage magnetic area 14 in addition to the first mapping table T1 and the second mapping table T2. The physical block address is P N to P N+R-1 and the third mapping table T3 of the logical block address L N to L N+R-1 .

綜上所述,本發明該具混合儲存模式的固態儲存裝置,主要由一快閃記憶體以及一與該快閃記憶體資訊連接的資料處理模組。其中,該快閃記憶體包含有一以一第一電位儲存模式儲存資料的第一儲存磁區以及一以一第二電位儲存模式儲存資料的第二儲存磁區,該第一儲存磁區的實體區塊位址為P0 至PM-1 ,邏輯區塊位址為L0 至LM-1 ,而該第二儲存磁區的實體區塊位址為PM 至PM+N-1 ,該邏輯區塊位址為LM 至LM+N-1 。該資料處理模組具有一解讀一指令所包含的該邏輯區塊位址而於對應的該實體區塊位址執行指令動作的資料處理模式。據此,以提供一種具高穩定性及高資料儲存容量的固態儲存裝置。In summary, the solid state storage device with the mixed storage mode of the present invention mainly consists of a flash memory and a data processing module connected to the flash memory. The flash memory includes a first storage magnetic region for storing data in a first potential storage mode and a second storage magnetic region for storing data in a second potential storage mode, the entity of the first storage magnetic region The block address is P 0 to P M-1 , the logical block address is L 0 to L M-1 , and the physical block address of the second storage magnetic zone is P M to P M+N-1 The logical block address is L M to L M+N-1 . The data processing module has a data processing mode for interpreting the logical block address included in an instruction and performing an instruction action on the corresponding physical block address. Accordingly, a solid storage device having high stability and high data storage capacity is provided.

以上已將本發明做一詳細說明,惟以上所述者,僅爲本發明之一較佳實施例而已,當不能限定本發明實施之範圍。即凡依本發明申請範圍所作之均等變化與修飾等,皆應仍屬本發明之專利涵蓋範圍內。The present invention has been described in detail above, but the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the scope of the invention. That is, the equivalent changes and modifications made by the scope of the present application should remain within the scope of the patent of the present invention.

1‧‧‧快閃記憶體
11‧‧‧資料區塊
12‧‧‧第一儲存磁區
13‧‧‧第二儲存磁區
14‧‧‧第三儲存磁區
2‧‧‧資料處理模組
3‧‧‧計算機裝置
100‧‧‧固態儲存裝置
D1‧‧‧指令
T1‧‧‧第一映對表
T2‧‧‧第二映對表
T3‧‧‧第三映對表
1‧‧‧flash memory
11‧‧‧Information block
12‧‧‧First storage area
13‧‧‧Second storage area
14‧‧‧ Third storage area
2‧‧‧ Data Processing Module
3‧‧‧Computer equipment
100‧‧‧Solid storage device
D1‧‧ directive
T1‧‧‧ first pair table
T2‧‧‧ second pair table
T3‧‧‧3rd party table

圖1,本發明具混合儲存模式的固態儲存裝置一實施例的單元組成圖。 圖2,本發明具混合儲存模式的固態儲存裝置一實施例的快閃記憶體示意圖。 圖3,本發明具混合儲存模式的固態儲存裝置另一實施例的快閃記憶體示意圖。Figure 1 is a block diagram showing an embodiment of a solid state storage device having a mixed storage mode of the present invention. 2 is a schematic diagram of a flash memory of an embodiment of a solid state storage device with a mixed storage mode of the present invention. 3 is a schematic diagram of a flash memory of another embodiment of the solid state storage device with mixed storage mode of the present invention.

1‧‧‧快閃記憶體 1‧‧‧flash memory

2‧‧‧資料處理模組 2‧‧‧ Data Processing Module

3‧‧‧計算機裝置 3‧‧‧Computer equipment

100‧‧‧固態儲存裝置 100‧‧‧Solid storage device

D1‧‧‧指令 D1‧‧ directive

Claims (6)

一種具混合儲存模式的固態儲存裝置,包括有:一快閃記憶體,包含有一以一第一電位儲存模式儲存資料的第一儲存磁區以及一以相異於該第一電位儲存模式的一第二電位儲存模式儲存資料的第二儲存磁區,該第一儲存磁區包含有M個資料區塊,該第二儲存磁區包含有N個資料區塊,每一該資料區塊分別對應一實體區塊位址以及一邏輯區塊位址,該第一儲存磁區的實體區塊位址為P0至PM-1,而該邏輯區塊位址為L0至LM-1,該第二儲存磁區的實體區塊位址為PM至PM+N-1,而該邏輯區塊位址為LM至LM+N-1;以及一資料處理模組,與該快閃記憶體資訊連接,具有一接受一指令並解讀該指令所包含的該邏輯區塊位址而於對應的該實體區塊位址執行指令動作;其中,該第一電位儲存模式為單級單元式,而該第二電位儲存模式為多級單元式,且該資料處理模組具有一判斷該指令所包含的該邏輯區塊位址為L0至LM-1時對該指令加入一電位調變指令改變該指令原有電位儲存方式的資料調變模式。 A solid state storage device with a mixed storage mode includes: a flash memory including a first storage magnetic region for storing data in a first potential storage mode and a first one different from the first potential storage mode The second potential storage mode stores a second storage magnetic region of the data, the first storage magnetic region includes M data blocks, and the second storage magnetic region includes N data blocks, and each of the data blocks corresponds to a physical block address and a logical block address, the physical block address of the first storage magnetic zone is P 0 to P M-1 , and the logical block address is L 0 to L M-1 The physical block address of the second storage magnetic zone is P M to P M+N-1 , and the logical block address is L M to L M+N-1 ; and a data processing module, and The flash memory information connection has an instruction to receive an instruction and interpret the logical block address included in the instruction, and execute an instruction action on the corresponding physical block address; wherein the first potential storage mode is a single Level unit type, and the second potential storage mode is a multi-level unit type, and the data processing module has Analyzing the LBA included in the instruction data to change the mode of the instruction of the original modulation mode is stored potential L 0 to L M-1 added to this instruction a voltage modulation command. 如請求項1所述的具混合儲存模式的固態儲存裝置,其中,該第一儲存磁區的資料儲存容量相異於該第二儲存磁區的資料儲存容量。 The solid state storage device with a mixed storage mode according to claim 1, wherein the data storage capacity of the first storage magnetic zone is different from the data storage capacity of the second storage magnetic zone. 如請求項1或2所述的具混合儲存模式的固態儲存裝置,其中,該資料處理模組包含有一記錄該第一儲存磁區所對應的實體區塊位址 為P0至PM-1以及邏輯區塊位址L0至LM-1的第一映對表,以及一記錄該第二儲存磁區所對應的實體區塊位址為PM至PM+N-1以及邏輯區塊位址LM至LM+N-1的第二映對表。 The solid state storage device with a mixed storage mode according to claim 1 or 2, wherein the data processing module includes a physical block address corresponding to the first storage magnetic zone as P 0 to P M-1 And a first mapping table of the logical block addresses L 0 to L M-1 , and a physical block address corresponding to the second storage magnetic zone is P M to P M+N-1 and a logical area A second mapping table of block addresses L M to L M+N-1 . 如請求項1所述的具混合儲存模式的固態儲存裝置,其中,該快閃記憶體更包含有一以相異於該第一電位儲存模式及該第二電位儲存模式的第三電位儲存模式儲存資料的第三儲存磁區,該第三儲存磁區包含有R個資料區塊,該第三儲存磁區的實體區塊位址為PN至PN+R-1,而該邏輯區塊位址為LN至LN+R-1The solid state storage device with a mixed storage mode according to claim 1, wherein the flash memory further comprises a third potential storage mode stored in the first potential storage mode and the second potential storage mode. a third storage magnetic zone of the data, the third storage magnetic zone includes R data blocks, and the physical storage block address of the third storage magnetic zone is P N to P N+R-1 , and the logical block The address is L N to L N+R-1 . 如請求項4所述的具混合儲存模式的固態儲存裝置,其中,該資料處理模組包含有一記錄該第一儲存磁區所對應的實體區塊位址為P0至PM-1以及邏輯區塊位址L0至LM-1的第一映對表,一記錄該第二儲存磁區所對應的實體區塊位址為PM至PM+N-1以及邏輯區塊位址LM至LM+N-1的第二映對表,以及一記錄該第三儲存磁區所對應的實體區塊位址為PN至PN+R-1以及邏輯區塊位址LN至LN+R-1的第三映對表。 The solid state storage device with a mixed storage mode according to claim 4, wherein the data processing module includes a physical block address corresponding to the first storage magnetic zone as P 0 to P M-1 and logic The first mapping table of the block addresses L 0 to L M-1 , the physical block address corresponding to the second storage magnetic zone is recorded as P M to P M+N-1 and the logical block address a second mapping table of L M to L M+N-1 , and a physical block address corresponding to the recording of the third storage magnetic domain is P N to P N+R-1 and a logical block address L The third pair of tables from N to L N+R-1 . 如請求項1所述的具混合儲存模式的固態儲存裝置,其中,該資料處理模組具有一於該指令為寫入資料動作時根據該第一儲存磁區及該第二儲存磁區的每一該資料區塊的消除次數找出一可記錄區塊進行平均寫入的平均寫入演算法。 The solid state storage device with a mixed storage mode according to claim 1, wherein the data processing module has a data according to the first storage magnetic region and the second storage magnetic region when the instruction is a write data operation The number of erasures of the data block finds an average write algorithm for a recordable block for average write.
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