TWI324890B - Micro electro-mechanical system device and manufacturing method thereof - Google Patents

Micro electro-mechanical system device and manufacturing method thereof Download PDF

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TWI324890B
TWI324890B TW95147525A TW95147525A TWI324890B TW I324890 B TWI324890 B TW I324890B TW 95147525 A TW95147525 A TW 95147525A TW 95147525 A TW95147525 A TW 95147525A TW I324890 B TWI324890 B TW I324890B
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mems
wafer
substrate
cover
manufacturing
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TW95147525A
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TW200829047A (en
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Meng Jen Wang
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Advanced Semiconductor Eng
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13248901324890

三達編號:TW3334PA 九、發明說明: 【發明所屬之技術領域】 本發明係有關於一種微機電系統裝置及其製造方 法’且特別疋有關於—種作為微機電式麥克風之微機電系 統裝置及其製造方法。 【先前技術】 為因應現今市場對於電子產品小型化及功能複雜化 等&求應' 用微機電系統(Micro Electro-Mechanical Syste= ’ MEMS)之技術來進行系統之整合及微小化,係 為目月)業界所致力研究與發展之方向…般而言,微機電 系統係將感測器(sensc)r)、傳動器(a_t〇r)、電路等元 件藉由微積化技術製作於#晶圓基板上,其可廣泛地應用 於無線通汛、光通訊、醫療、生物晶片以及半導體等範疇。 常見之商品化的微機電系統例如數位式微鏡片元件、噴墨 頭、加速感測器、壓力感測器、血球數量測感測器、靜電 三軸加速感測器及微機電式麥克風等等。 由於微機電系統整體之結構相當微小且精密,使得其 中各樣元件容易受到外界電磁輻射,甚至是光線的干擾, 或是谷易叉到物理性的破壞。如此一來,係降低了微機電 系統作動之穩定性。例如應用於微機電式麥克風之微機電 系統封裝件中,一般而言係將微麥克風晶片及其他被動元 件設置於一基板上後,再增加設置金屬蓋或金屬板於基板 上’並使金屬蓋或金屬板遮蓋基板上之多個元件,用以屏 1324890达达编号号: TW3334PA IX. Description of the Invention: [Technical Field] The present invention relates to a MEMS device and a method of fabricating the same, and particularly to a MEMS device as a microelectromechanical microphone and Its manufacturing method. [Prior Art] In order to cope with the miniaturization and functional complication of electronic products in today's market, the integration and miniaturization of systems using Micro Electro-Mechanical Syste= 'MEMS' technology is目目) The direction of research and development in the industry. In general, MEMS systems use sensors such as sensors (sensc) r), actuators (a_t〇r), and circuits to be fabricated by micro-integration technology. On the wafer substrate, it can be widely used in wireless communication, optical communication, medical, bio-wafer and semiconductor. Common commercial MEMS systems such as digital microlens elements, inkjet heads, acceleration sensors, pressure sensors, hemocytometry sensors, electrostatic triaxial accelerometers, and microelectromechanical microphones, and the like. Since the overall structure of the MEMS is quite small and precise, various components are susceptible to external electromagnetic radiation, even light interference, or the damage of the grain to the physical. As a result, the stability of the MEMS operation is reduced. For example, in a MEMS package for a microelectromechanical microphone, generally, a micro mic chip and other passive components are disposed on a substrate, and then a metal cover or a metal plate is added on the substrate. Or a metal plate covering a plurality of components on the substrate for the screen 1324890

三達編號:TW3334PA 蔽及保護此些元件。然此種設置金屬蓋或金屬板之方式, 需分別於各個封裝件上進行設置,如此一來係增加了整體 製程之步驟,並且增加了之製程所需之時間及成本。 【發明内容】 本發明係有關於一種微機電系統裝置及其製造方 法,其中係將一晶圓級之蓋體結構,於製程中直接設置於 一微機電晶片上,使得依照本發明之微機電系統裝置及其 • 製造方法,係具有可縮短製程時間、簡化製程步驟以及節 省成本等優點。 根據本發明之一方面,提出一種微機電系統裝置,包 括一基板、一微機電晶片、一蓋體結構及一封膠。微機電 晶片設置於基板上。蓋體結構設置於微機電晶片上,且僅 部分地遮蓋此微機電晶片。封膠設置於基板上,且覆蓋基 板、微機電晶片及至少部分之蓋體結構。 根據本發明之另一方面,提出一種微機電系統裝置之 • 製造方法。此製造方法包括以下步驟。首先,提供一蓋體 晶圓及一微機電系統晶圓。然後,接合蓋體晶圓及微機電 系統晶圓。接著,設置微機電晶片於一膠帶上。其次,切 割接合之蓋體晶圓及微機電系統晶圓,以形成多個微機電 系統結構。而後,連接此些微機電系統結構至一基板上。 再來,利用一封膠封裝基板及此些微機電系統結構,此封 膠覆蓋基板及至少部分之每一微機電系統結構之頂面。最 後,切單此些微機電系統結構及基板。 1324890Sanda number: TW3334PA covers and protects these components. However, the manner of providing the metal cover or the metal plate needs to be separately set on each package, which increases the overall process steps and increases the time and cost required for the process. SUMMARY OF THE INVENTION The present invention relates to a microelectromechanical system device and a method of fabricating the same, in which a wafer level cover structure is directly disposed on a microelectromechanical wafer in a process, so that the microelectromechanical device according to the present invention System devices and their manufacturing methods have the advantages of shorter process times, simplified process steps, and cost savings. According to one aspect of the invention, a MEMS device is provided, comprising a substrate, a MEMS wafer, a cover structure, and a glue. The MEMS wafer is disposed on the substrate. The cover structure is disposed on the MEMS wafer and only partially covers the MEMS wafer. The encapsulant is disposed on the substrate and covers the substrate, the microelectromechanical wafer, and at least a portion of the cover structure. According to another aspect of the present invention, a method of manufacturing a MEMS device is proposed. This manufacturing method includes the following steps. First, a cover wafer and a MEMS wafer are provided. The lid wafer and MEMS wafer are then bonded. Next, the MEMS wafer is placed on a tape. Second, the bonded cover wafer and MEMS wafer are cut to form a plurality of MEMS structures. Then, the MEMS structures are connected to a substrate. Further, the substrate is encapsulated by a glue and the MEMS structure, the seal covering the substrate and at least a portion of the top surface of each of the MEMS structures. Finally, the MEMS structure and substrate are cut. 1324890

三達編號:TW3334PA 為讓本發明之上述内容能更明顯易懂,下文特舉較佳 之實施例,並配合所附圖式,作詳細說明如下: 【實施方式】 以下係提出兩實施例作為本發明之詳細說明。然而, 本發明並不限制於此,且此些實施例並不會限縮本發明欲 保護之範圍。再者,實施例中之圖示亦省略不必要之元 件,以清楚顯示本發明之技術特點。 第一實施例 請同時參照第1及第2A〜2H圖,第1圖繪示依照本 發明第一實施例之微機電系統裝置之製造方法的流程 圖;第2A〜2H圖分別繪示第1圖中步驟101〜步驟108 之示意圖。本實施例之製造方法首先,如步驟101及第2A 圖所示,提供一蓋體晶圓(cap wafer ) 11及一微機電系統 晶圓13,並且將蓋體晶圓11接合於微機電系統晶圓13 上。於本實施例中,此蓋體晶圓11係具有多個通孔11c, 此些通孔11c係貫通蓋體晶圓11之一上表面11a及一下表 面 1 lb。 接著,進行步驟102,黏著一薄膜於蓋體晶圓11上。 如第2B圖所示,薄膜15係遮蓋此些通孔11c,如此可確 保在製造過程中,其他異物或化學物質不會進入此些通孔 11c,進而避免微機電系統晶片13受到污染。此薄膜15 較佳地係為透明材質。 1324890。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 Detailed description of the invention. However, the invention is not limited thereto, and such embodiments are not intended to limit the scope of the invention. Furthermore, the illustrations in the embodiments also omit unnecessary elements to clearly show the technical features of the present invention. In the first embodiment, please refer to FIGS. 1 and 2A to 2H, and FIG. 1 is a flow chart showing a method of manufacturing the MEMS device according to the first embodiment of the present invention; FIGS. 2A to 2H are respectively shown as the first A schematic diagram of steps 101 to 108 in the figure. First, as shown in steps 101 and 2A, a cap wafer 11 and a MEMS wafer 13 are provided, and the cover wafer 11 is bonded to the MEMS. On wafer 13. In the present embodiment, the cover wafer 11 has a plurality of through holes 11c extending through an upper surface 11a of the cover wafer 11 and a lower surface 11b. Next, in step 102, a film is adhered to the cover wafer 11. As shown in Fig. 2B, the film 15 covers the through holes 11c, which ensures that other foreign matter or chemicals do not enter the through holes 11c during the manufacturing process, thereby preventing the MEMS wafer 13 from being contaminated. The film 15 is preferably a transparent material. 1324890

三達編號:TW3334PA 其次,進行步驟103,設置微機電系統晶圓13於一膠 帶(tape)上。如第2C圖所示,將接合之蓋體晶圓11及 微機電系統晶圓13固定至膠帶16上。此膠帶16例如是 ' 一紫外線膠帶。 然後,進行步驟104,如第2D圖所示,切割接合之 蓋體晶圓11及微機電系統晶圓13,蓋體晶圓11係切割為 多個蓋體結構12,微機電系統晶圓13係切割為多個微機 電晶片14。每一蓋體結構12係具有一個通孔11c,而每 • 一微機電晶片14之一上表面14a係具有一打線接合區 (wire-bonding region) 141,且打線接合區141係暴露於 蓋體結構12外。此外,每一蓋體結構12及每一微機電晶 片14係構成一微機電系統結構17。 再來,如步驟105及第2E圖所示,藉膠帶16連接此 些微機電系統結構17至一基板18上,並且線接合每一微 機電晶片14之打線接合區141及基板18,以將每一微機 電晶片14電性連接於基板18。基板18上係包括一積體電 • 路晶片19。於本實施例中,每一微機電系統結構17係設 置至每一積體電路晶片19旁。然於本發明所屬技術領域 中具有通常知識者可瞭解本發明之技術不限於此,每一微 機電系統結構17亦可設置至積體電路晶片19上,也就是 說積體電路晶片19係位於每一微機電晶片14及基板18 之間,如此可節省基板18之空間。 而後,進行步驟106,利用一封膠封裝(encapsulating) 基板18及此些微機電系統結構17。如第2F圖所示,封膠 1324890Sanda number: TW3334PA Next, proceed to step 103 to set the MEMS wafer 13 on a tape. As shown in Fig. 2C, the bonded cover wafer 11 and the MEMS wafer 13 are fixed to the tape 16. This tape 16 is, for example, a 'UV tape. Then, in step 104, as shown in FIG. 2D, the bonded cover wafer 11 and the MEMS wafer 13 are cut, and the cover wafer 11 is cut into a plurality of cover structures 12, and the MEMS wafer 13 The system is cut into a plurality of microelectromechanical wafers 14. Each of the cover structures 12 has a through hole 11c, and each of the upper surface 14a of the microelectromechanical wafer 14 has a wire-bonding region 141, and the wire bonding region 141 is exposed to the cover. Structure 12 is outside. In addition, each of the cover structures 12 and each of the microelectromechanical wafers 14 form a MEMS structure 17. Then, as shown in steps 105 and 2E, the MEMS structure 17 is attached to the substrate 18 by the tape 16, and the wire bonding regions 141 and the substrate 18 of each MEMS wafer 14 are wire bonded to each. A microelectromechanical wafer 14 is electrically connected to the substrate 18. The substrate 18 includes an integrated circuit wafer 19. In the present embodiment, each MEMS structure 17 is disposed adjacent to each integrated circuit die 19. However, those skilled in the art can understand that the technology of the present invention is not limited thereto, and each MEMS structure 17 can also be disposed on the integrated circuit chip 19, that is, the integrated circuit chip 19 is located. Between each microelectromechanical wafer 14 and the substrate 18, the space of the substrate 18 can be saved. Then, in step 106, the substrate 18 and the MEMS structures 17 are encapsulated with a glue. As shown in Figure 2F, the sealant 1324890

_ 三達編號:TW3334PA 20設置於基板18上,並覆蓋積體電路晶片19以及每一微 機電系統結構17之部分表面。此外,上述之薄膜15不受 封膠20覆蓋而暴露於封膠20外。 接著,如步驟107及第2G圖所示,移除膠膜15。由 於封膠20係以不覆蓋膠膜15之方式配置,因此當膠膜15 移除後,此些通孔11c係暴露於封膠20外。如此使得一 信號S可穿過此些通孔11c傳輸至此些微機電晶片14。 此外,進行步驟108,切單(singulating)此些微機電 • 系統結構17及基板18。第2H圖所繪示,係為依照本發 明第一實施例之微機電系統裝置1〇〇。依照上述步驟1〇1 〜步驟108所製造之微機電系統裝置100係包括蓋體結構 12、微機電晶片14、基板18、積體電路晶片19及封膠20。 此微機電系統裝置1〇〇係例如是一微機電式麥克風,微機 電晶片14係用以接受例如是一聲音信號(acoustic signal ) 之信號S,並對應產生一電性訊號,而積體電路晶片19 係用以接收此電性訊號。 ® 上述依照本發明第一實施例之微機電系統裝置及其 製造方法,係利用提供蓋體晶圓之方式,使得製造微機電 系統裝置之同時,即將蓋體結構設置於微機電晶片上,使 得微機電系統裝置具有晶圓等級(wafer level)之蓋體結 構,係可簡化製程步驟並且降低成本。並且較佳地設置透 明薄膜於蓋體晶圓上,以確保微機電晶片於製程中不會受 到污染。 1324890_ Sanda number: TW3334PA 20 is disposed on the substrate 18 and covers the integrated circuit wafer 19 and a portion of the surface of each MEMS structure 17. Further, the film 15 described above is not covered by the sealant 20 and is exposed to the outside of the sealant 20. Next, as shown in steps 107 and 2G, the film 15 is removed. Since the sealant 20 is disposed so as not to cover the adhesive film 15, the through holes 11c are exposed to the outside of the sealant 20 after the adhesive film 15 is removed. Thus, a signal S can be transmitted to the microelectromechanical wafers 14 through the through holes 11c. In addition, step 108 is performed to singulating the micro-electromechanical system structure 17 and the substrate 18. 2H is a microelectromechanical system device 1 according to a first embodiment of the present invention. The MEMS device 100 manufactured in accordance with the above steps 1 〇 1 to 108 includes a cover structure 12, a microelectromechanical wafer 14, a substrate 18, an integrated circuit wafer 19, and a sealant 20. The MEMS device 1 is, for example, a microelectromechanical microphone, and the MEMS 14 is configured to receive a signal S, such as an acoustic signal, and correspondingly generate an electrical signal, and the integrated circuit The chip 19 is used to receive the electrical signal. The MEMS device according to the first embodiment of the present invention and the method of manufacturing the same according to the first embodiment of the present invention are provided by providing a cover wafer such that the cover structure is disposed on the MEMS wafer while the MEMS device is being fabricated. The MEMS device has a wafer level cover structure that simplifies the process steps and reduces costs. It is also preferred to provide a transparent film on the cover wafer to ensure that the MEMS wafer is not contaminated during the process. 1324890

三達編號:TW3334PA 第二實施例 本實施例之微機電系統裝置與上述第一實施例之微 機電系統裝置100 (如第2H圖所示),不同之處在於通孔 之位置,其餘相同之處係不再加以贅述。 請參照第3圖,其繪示依照本發明第二實施例之微機 電系統裝置之示意圖。微機電系統裝置200包括蓋體結構 22、微機電晶片14、基板28、積體電路晶片19及封膠30。 蓋體結構22及微機電晶片14係組成一微機電系統結構 27。基板28具有一通孔28c,此通孔28c係貫通基板28 之一上表面28a及一下表面28b。當藉由膠帶26連接微機 電系統結構27至基板28時,微機電系統結構27係對應 至通孔28c之位置。此外,膠帶26於對應通孔28c處,係 具有開口 26a,使得一信號S可穿過通孔28c及開口 26a 傳輸至微機電晶片14。 於本實施例中,積體電路晶片19係設置於微機電晶 片14旁,且封膠30係覆蓋積體電路晶片19及微機電系 統結構27。也就是說,基板28上之所有元件均包覆於封 膠30内,使得微機電系統裝置200具有良好之保護性。 上述依照本發明較佳實施例之微機電系統裝置及其 製造方·法,係利用接合蓋體晶圓及微機電系統晶圓5並使 其一同進行切割及封裝步驟之方式,使得微機電封裝系統 裝置具有晶圓等級之蓋體結構。其優點在於,利用同時切 割及封裝兩晶圓之方式,於製程中即形成蓋體結構於微機 1324890Sanda number: TW3334PA Second embodiment The MEMS device of the present embodiment is different from the MEMS device 100 of the first embodiment described above (shown in FIG. 2H) in the position of the through hole, and the rest are the same. The department will not repeat them. Referring to Figure 3, there is shown a schematic diagram of a microcomputer system apparatus in accordance with a second embodiment of the present invention. The MEMS device 200 includes a cover structure 22, a microelectromechanical wafer 14, a substrate 28, an integrated circuit wafer 19, and a sealant 30. The cover structure 22 and the microelectromechanical wafer 14 form a MEMS structure 27. The substrate 28 has a through hole 28c which penetrates through one of the upper surface 28a and the lower surface 28b of the substrate 28. When the microcomputer system structure 27 is connected to the substrate 28 by the tape 26, the MEMS structure 27 corresponds to the position of the through hole 28c. Further, the tape 26 has an opening 26a at the corresponding through hole 28c so that a signal S can be transmitted to the microelectromechanical wafer 14 through the through hole 28c and the opening 26a. In the present embodiment, the integrated circuit wafer 19 is disposed beside the microelectromechanical wafer 14, and the encapsulant 30 covers the integrated circuit wafer 19 and the microelectromechanical system structure 27. That is, all of the components on the substrate 28 are encapsulated within the encapsulant 30 such that the MEMS device 200 has good protection. The MEMS device and the method for manufacturing the same according to the preferred embodiment of the present invention utilize a method of bonding a cover wafer and a MEMS wafer 5 and performing the cutting and packaging steps together to make the MEMS package. The system device has a wafer level cover structure. The advantage is that, by simultaneously cutting and encapsulating two wafers, a cover structure is formed in the process in the computer 1324890

三達編號:TW3334PA 電晶片上,係可簡化製程步驟,並且同時完成多個微機電 系統裝置。如此一來係提高了生產效率、縮短了製程時間 並節省了製造成本。此外,在進行切割及封裝步驟時,微 機電晶片即受到蓋體結構之保護,且更藉由黏著薄膜以遮 蓋通孔之方式,防止微機電晶片受到污染。使得微機電晶 片於製程中,可更簡便地進行各項處理動作。 綜上所述,雖然本發明已以較佳之實施例揭露如上, • 然其並非用以限定本發明。本發明所屬技術領域中具有通 常知識者,在不脫離本發明之精神和範圍内,當可作各種 之更動與潤飾。因此,本發明之保護範圍當視後附之申請 專利範圍所界定者為準。The Sanda numbering: TW3334PA on the wafer allows for simplified process steps and simultaneous completion of multiple MEMS devices. This increases productivity, reduces process time and saves manufacturing costs. In addition, the microelectromechanical wafer is protected by the cover structure during the cutting and packaging steps, and the microelectromechanical wafer is prevented from being contaminated by the adhesive film covering the through holes. In the process of making the MEMS wafer, it is easier to carry out various processing actions. In view of the foregoing, the invention has been described above in terms of preferred embodiments, which are not intended to limit the invention. It will be apparent to those skilled in the art that various changes and modifications can be made without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

11 132489011 1324890

. 三薦號:TW3334PA 【圖式簡單說明】 第1圖繪示依照本發明第一實施例之微機電系統裝置 之製造方法的流程圖; 第2A圖繪示第1圖中步驟101之示意圖; 第2B圖繪示第1圖中步驟102之示意圖; 第2C圖繪示第1圖中步驟103之示意圖; 第2D圖繪示第1圖中步驟104之示意圖; 第2E圖繪示第1圖中步驟105之示意圖; • 第2F圖繪示第1圖中步驟1〇6之示意圖; 第2G圖繪示第1圖中步驟107之示意圖; 第2H圖繪示第1圖中步驟108之示意圖;以及 第3圖繪示依照本發明第二實施例之微機電系統裝置 之示意圖。3: TW3334PA [Simplified description of the drawings] Fig. 1 is a flow chart showing a method of manufacturing a MEMS device according to a first embodiment of the present invention; and Fig. 2A is a view showing a step 101 of Fig. 1; 2B is a schematic diagram of step 102 in FIG. 1; FIG. 2C is a schematic diagram of step 103 in FIG. 1; FIG. 2D is a schematic diagram of step 104 in FIG. 1; FIG. 2F is a schematic diagram of step 1〇6 in FIG. 1; FIG. 2G is a schematic diagram showing step 107 in FIG. 1; FIG. 2H is a schematic diagram showing step 108 in FIG. And FIG. 3 is a schematic diagram of a MEMS device in accordance with a second embodiment of the present invention.

1212

Claims (1)

1324890 ⑽年2月2,正替換i 十、申請專利範圍: 1. 一 種微機電系統(Micro Electro-Mechanical System,MEMS)裝置,包括: 一基板; 一微機電晶片,設置於該基板上; 一蓋體結構,設置於該微機電晶片上,其中該蓋體結 構之一側面與該微機電晶片之一側面相齊平,以形成一連 續平面,且該蓋體結構係部分地遮蓋該微機電晶片;以及 一封膠,設置於該基板上,該封膠係覆蓋該基板、該 微機電晶片及至少部分之該蓋體結構。 2. 如申請專利範圍第1項所述之微機電系統裝置,其 中該蓋體結構係具有一通孔,該通孔係貫通該蓋體結構之 上表面及下表面,該封膠係暴露該通孔,用以使一信號傳 輸至該微機電晶片。 3. 如申請專利範圍第2項所述之微機電系統裝置,其 中該微機電系統裝置係為一微機電式麥克風(MEMS Microphone ),該信號係為一聲音信號。 4. 如申請專利範圍第2項所述之微機電系統裝置,更 包括: 一積體電路晶片,設置於該基板上,且位於該微機電 晶片旁,該積體電路晶片係用以接收該微機電晶片傳送之 一電性訊號。 5. 如申請專利範圍第4項所述之微機電系統裝置,其 中該封膠更覆蓋該積體電路晶片。 1324890 * 「.·| I 一一 I .......... ' 99年2月22日修正刪 6. 如申請專利範圍第2項所述之微機電系統裝置,更 包括: 一積體電路晶片,設置於該微機電晶片及該基板間, 該積體電路晶片係用以接收該微機電晶片傳送之·一電性 訊號。 7. 如申請專利範圍第1項所述之微機電系統裝置,其 中該微機電晶片之一上表面係具有一打線接合區,該微機 電晶片係經由該打線接合區線接合(wire bonding )於該基 板,以將該微機電晶片電性連接於該基板。 8. 如申請專利範圍第7項所述之微機電系統裝置,其 中該蓋體結構係不遮蓋該打線接合區。 9. 如申請專利範圍第1項所述之微機電系統裝置,其 中該基板具有一通孔,該通孔係貫通該基板之上表面及下 表面,用以使一信號傳輸至該微機電晶片。 10. 如申請專利範圍第9項所述之微機電系統裝置, 其中該微機電系統裝置係為一微機電式麥克風,該信號係 為一聲音信號。 11. 如申請專利範圍第9項所述之微機電系統裝置, 其中該封膠係完全覆蓋該蓋體結構。 12. 如申請專利範圍第9項所述之微機電系統裝置, 更包括: 一積體電路晶片,設置於該基板上,且位於該微機電 晶片旁,該積體電路晶片係用以接收該微機電晶片傳送之 15 1324890 _ 年J «5 I修正替換頁i 99. 2. 22 _i 一電性訊號。 13. 如申請專利範圍第12項所述之微機電系統裝 置,其中該封膠更覆蓋該積體電路晶片。 14. 一種微機電系統裝置之製造方法,包括: 提供一蓋體晶圓(cap wafer )及一微機電系統晶圓; 接合該蓋體晶圓以及該微機電系統晶圓; 設置該微機電系統晶圓於一膠帶上; 切割(dicing)該接合之蓋體晶圓及該微機電系統晶 圓,以形成複數個微機電系統結構,且其中該蓋體晶圓之 一切面與該微機電系統晶圓之一切面相齊平,為一連續切 面; 連接該些微機電系統結構至一基板上; 利用一封膠封裝(encapsulating)該基板及該些微機 電系統結構,該封膠係覆蓋該基板及各該微機電系統結構 至少部分之表面;以及 切單(singulating )該些微機電系統結構及該基板。 15. 如申請專利範圍第14項所述之製造方法,其中於 該切割步驟中,該蓋體晶圓係切割為複數個蓋體結構,該 微機電系統晶圓係切割為複數個微機電晶片,該些微機電 系統結構係分別包括各該蓋體結構及各該微機電晶片。 16. 如申請專利範圍第15項所述之製造方法,其中該 蓋體晶圓係具有複數個通孔,該些通孔係貫通該蓋體晶圓 之上表面及下表面,於進行該切割步驟之後,該些通孔係 分別對應配置於各該蓋體結構。 1324890 _, • · 9煮2月22日修正替換頁 k w .......... 17. 如申請專利範圍第16項所述之製造方法,於該接 " 合步驟之後,更包括: -* 黏著一薄膜於該蓋體晶圓上,用以遮蓋該些通孔。 18. 如申請專利範圍第17項所述之製造方法,其中該 薄膜係為透明材質。 19. 如申請專利範圍第17項所述之製造方法,於該封 裝步驟之後,更包括: 移除該薄膜。 20. 如申請專利範圍第16項所述之製造方法,其中於 該封裝步驟中,該封膠係暴露該些通孔。 21. 如申請專利範圍第15項所述之製造方法,其中該 微機電晶片之一上表面係具有一打線接合區,該蓋體結構 係不遮蓋該打線接合區。 22. 如申請專利範圍第21項所述之製造方法,於該連 接步驟之後,更包括: 線接合(wire bonding)該打線接合區及該基板,用以 將該微機電晶片電性連接於該基板。 23. 如申請專利範圍第15項所述之製造方法,其中該 基板係具有複數個通孔,該些通孔係貫通該基板之上表面 及下表面。 24. 如申請專利範圍第23項所述之製造方法,其中於 該連接步驟中,各該微機電系統結構係連接至該基板上對 應各該通孔之位置。 171324890 (10) February 2, is replacing i. Patent application scope: 1. A Micro Electro-Mechanical System (MEMS) device, comprising: a substrate; a microelectromechanical chip disposed on the substrate; a cover structure disposed on the MEMS pad, wherein a side of the cover structure is flush with a side of the MEMS pad to form a continuous plane, and the cover structure partially covers the MEMS a wafer; and a glue disposed on the substrate, the seal covering the substrate, the MEMS wafer, and at least a portion of the cover structure. 2. The MEMS device of claim 1, wherein the cover structure has a through hole extending through the upper surface and the lower surface of the cover structure, the sealant exposing the pass a hole for transmitting a signal to the MEMS wafer. 3. The MEMS device of claim 2, wherein the MEMS device is a MEMS Microphone, the signal being an acoustic signal. 4. The MEMS device of claim 2, further comprising: an integrated circuit chip disposed on the substrate and located adjacent to the MEMS wafer, the integrated circuit chip for receiving the The MEMS chip transmits an electrical signal. 5. The MEMS device of claim 4, wherein the encapsulant further covers the integrated circuit chip. 1324890 * ".·| I II I .......... ' Amendment of February 22, 1999. 6. The MEMS device as described in claim 2, including: The integrated circuit chip is disposed between the MEMS chip and the substrate, and the integrated circuit chip is configured to receive an electrical signal transmitted by the MEMS. 7. The micro device according to claim 1 An electromechanical system device, wherein an upper surface of the MEMS wafer has a wire bonding region, and the MEMS wafer is wire bonded to the substrate via the wire bonding region to electrically connect the MEMS wafer to the MEMS device. 8. The MEMS device of claim 7, wherein the cover structure does not cover the wire bonding region. 9. The MEMS device according to claim 1, The substrate has a through hole extending through the upper surface and the lower surface of the substrate for transmitting a signal to the MEMS wafer. 10. The MEMS device according to claim 9 of the patent application, Where the MEMS is installed The MEMS device is a MEMS device. The MEMS device of claim 9 wherein the sealant completely covers the cover structure. The MEMS device of claim 9, further comprising: an integrated circuit chip disposed on the substrate and located adjacent to the MEMS chip, the integrated circuit chip is configured to receive the MEMS transmission 15 1324890 _ Y «5 I Amendment Replacement Page i 99. 2. 22 _i A galvanic signal. 13. The MEMS device of claim 12, wherein the sealant covers the integrated circuit more A method of manufacturing a MEMS device, comprising: providing a cap wafer and a MEMS wafer; bonding the lid wafer and the MEMS wafer; setting the micro The electromechanical system wafer is on a tape; dicing the bonded cover wafer and the MEMS wafer to form a plurality of MEMS structures, and wherein all sides of the cover wafer and the micro The entire surface of the electrical system wafer is flush and is a continuous cut surface; the MEMS structure is connected to a substrate; the substrate and the MEMS structure are encapsulated by an adhesive, the sealant covers the substrate And at least a portion of the surface of each of the MEMS structures; and singulating the MEMS structure and the substrate. 15. The method of manufacturing of claim 14, wherein in the cutting step, The cover wafer is cut into a plurality of cover structures, and the MEMS wafer is cut into a plurality of MEMS wafers, and the MEMS structures respectively include the cover structures and the MEMS wafers. 16. The manufacturing method of claim 15, wherein the cover wafer has a plurality of through holes extending through the upper surface and the lower surface of the cover wafer for performing the cutting. After the step, the through holes are respectively disposed corresponding to each of the cover structures. 1324890 _, • · 9 cooking February 22 revision replacement page kw .......... 17. As described in the scope of the patent application, in the method of the connection, after the step The method includes: -* adhering a film to the cover wafer to cover the through holes. 18. The method of manufacture of claim 17, wherein the film is a transparent material. 19. The method of manufacturing of claim 17, further comprising: removing the film after the step of packaging. 20. The method of manufacturing of claim 16, wherein in the encapsulating step, the encapsulant exposes the through holes. 21. The method of manufacturing of claim 15, wherein the upper surface of the MEMS wafer has a wire bonding region that does not cover the wire bonding region. 22. The manufacturing method of claim 21, after the connecting step, further comprising: wire bonding the wire bonding region and the substrate for electrically connecting the MEMS pad to the Substrate. The manufacturing method according to claim 15, wherein the substrate has a plurality of through holes penetrating through the upper surface and the lower surface of the substrate. 24. The method of manufacture of claim 23, wherein in the joining step, each of the MEMS structures is coupled to a location on the substrate corresponding to each of the vias. 17
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