TW201249643A - Laminate, manufacturing method of the same, display panel with supporting plate, display panel, and display device - Google Patents

Laminate, manufacturing method of the same, display panel with supporting plate, display panel, and display device Download PDF

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Publication number
TW201249643A
TW201249643A TW101114289A TW101114289A TW201249643A TW 201249643 A TW201249643 A TW 201249643A TW 101114289 A TW101114289 A TW 101114289A TW 101114289 A TW101114289 A TW 101114289A TW 201249643 A TW201249643 A TW 201249643A
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Taiwan
Prior art keywords
insulating film
inorganic insulating
glass substrate
resin layer
layer
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TW101114289A
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Chinese (zh)
Inventor
Kenichi Ebata
Yoshitaka Matsuyama
Daisuke Uchida
Kengo Kawahara
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Asahi Glass Co Ltd
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Publication of TW201249643A publication Critical patent/TW201249643A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/06Interconnection of layers permitting easy separation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B9/00Layered products comprising a layer of a particular substance not covered by groups B32B11/00 - B32B29/00
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2383/00Polysiloxanes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Laminated Bodies (AREA)
  • Liquid Crystal (AREA)
  • Electroluminescent Light Sources (AREA)
  • Joining Of Glass To Other Materials (AREA)
  • Photovoltaic Devices (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

The present invention provides a laminate and the manufacturing method of the same. Even being treated with the thermal processing at high temperature, the resin of the resin layer is inhibited from adhering onto the peeling surface on the glass substrate side (I.e. the surface of inorganic insulation film) when the resin layer is peeled off from the glass substrate. By applying a cleaning treatment, the peeling surface on the glass substrate side after separation is kept clean, and the chemical endurance and the generation of cracks of the peeling surface on the glass substrate side are further enhanced.

Description

201249643 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種積層體、積層體之製造方法、附有支 持板之顯示裝置用面板、顯示裝置用面板、及顯示裝置。 【先前技術】 近年來’太陽電池(PV,Photovoltaic)、液晶面板 (LCD ’ Liquid Crystal Display)、有機 EL 面板(0LED, Organic Light Emitting Display)等裝置(電子機器)已推行 薄型化、輕量化,該等裝置中所使用之基板正推行薄板 化。若薄板化導致基板之強度不足,則於裝置之製造步驟 中,基板之操作性下降。 因此,自先前以來廣泛採用於厚於最終厚度之基板上形 成裝置用構件(例如薄膜電晶體)後,藉由對基板進行化學 蝕刻處理而進行薄板化的方法。然而,於該方法中,例如 於使1片基板之厚度自0.7 mm薄板化成〇 2 mm4〇」之 情形時’係以姓刻液剝落原先基板之材料之一大半,因此 就生產性或原材料之使用效率之觀點而言欠佳。 又’於上述利用化㈣刻之基板之薄板化方法中,於基 板表面上存在微細之傷之情形時,存在藉由㈣處理而以 傷為起點形成微細之凹處(腐钱坑)從而形成光學缺陷的情 最近’為應對上述課題而提出右+ i %叩扠itJ有如下方法丨準備 薄板玻璃基板與加強板之積層體, 層體於積層體之薄板玻璃基 板上形成裝置用構件後,自镇 * 自4板破璃基板分離加強板(例 163953.doc 201249643 如參照專利文獻1) ^加強板具有支持板、與固定於該支持 板上之樹脂層,樹脂層與薄板玻璃基板可剝離地密接。積 層體之樹脂層與薄板玻璃基板之界面發生剝離,自薄板破 璃基板分離之加強板可與新薄板玻璃基板積層而作為積層 體而再利用》 先前技術文獻 專利文獻 專利文獻1 :國際公開第2007/018028號手冊 【發明内容】 發明所欲解決之問題 然而,於上述先前之構成之積層體中,於將加強板自薄 板玻璃基板分離時,有時樹脂層之一部分附著於製品側即 薄板玻璃基板之㈣面上。《其是於高溫條對積層體 進行加熱處理後,會頻繁地發生樹脂層之一部分附著於製 品側即薄板玻璃基板之剝離面上的情況,結果有招致良率 下降之憂。 理之情形,期望表面潔淨 然而,於上述先前之構成之積層體中,經分離之薄板 之剝離面上附著有-部分樹脂層之成分,儘管欲 由利用使用溶劑等之清洗耸 物,作f用!· I $ 土 潔淨化處理而去除該附 仁實用上無法去除至期望之級別。 基先前之構成之積層體中,於經分離之薄板玻 基板之剝離面上,於制離時或此後之處理時,有時玻璃 163953.doc 201249643 生破裂(龜裂)等,並有時招致良率下降。 本發明係鑒於上述課題而成者,其目的在於提供一種積 層體及積層體之製造方法,該積層體即便於經實施高溫加 熱處理後,亦可於將樹脂層與玻璃基板剝離時抑制樹脂層 附著於玻璃基板之剝離面上,同時可藉由實施潔淨化處理 而保持經分離之玻璃基板之剝離面的潔淨性,進而可抑制 玻璃基板之剝離面上產生龜裂。 進而,本發明之目的在於提供一種包含該積層體之附有 支持板之顯示裝置用面板、使用附有支持板之顯示装置用 面板所形成之顯示裝置用面板、及顯示裝置。 解決問題之技術手段 本發明者為解決上述課題反覆進行銳意研究,完成本發 明。 即,為達成上述目的’本發明之第1態樣係一種積層 體,其依序具備支持板之層、樹脂層、附有無機絕緣膜之 玻璃基板之層,且該附有無機絕緣膜之玻璃基板之無機絕 緣膜與該樹脂層相接;該附有無機絕緣膜之玻璃基板中, 於玻璃基板之單面上具有含有包含選自由矽及鋁所組成之 群中之至少一種之氧化物、氮化物或氮氧化物的無機絕緣 膜’該無機絕緣膜之與上述樹脂層相接之面中鹼金屬及鹼 土金屬之原子之合計含量為〇 5 at。/。以下,該支持板之層與 該樹脂層之界面的剝離強度高於該樹脂層與該無機絕緣膜 之界面的剝離強度。 於第1態樣中’較佳為該無機絕緣膜為包含氧化矽、氮 163953.doc 201249643 化石夕、氮氧化妙或氧化紹之膜。 於第1態樣中,較佳為該無機絕緣膜之與該樹脂層相接 之面的表面粗經度(Ra)未達30 nm。 於第1態樣中,較佳為該無機絕緣膜之厚度為5〜5〇〇〇 nm ° 於第1態樣中,較佳為該玻璃基板之厚度為〇〇3〜〇8 mm 〇 於第1態樣中,較佳為該樹脂層之樹脂為聚矽氧樹脂。 於第1態樣中,較佳為該聚矽氧樹脂為有機烯基聚矽氧 院與有機氫聚矽氧烷之反應硬化物。 於第1態樣中,較佳為該樹脂層之厚度為1〜1〇〇μηΐβ 於第1態樣中,較佳為該支持板為玻璃板。 本發明之第2態樣係一種積層體之製造方法其係製造 依序具備支持板之層、樹脂層、及附有無機絕緣膜之玻璃 基板之層之積層體的方法,該方法包含:準備如下之附有 無機絕緣膜之玻璃基板:於玻璃基板之單面上具有含有包 含選自由矽及鋁所組成之群中之至少一種之氧化物、氮化 物或氮氧化物之無機絕緣膜,該無機絕緣膜之與該樹脂層 相接之面中鹼金屬及鹼土金屬之原子之合計含量為〇 5 _ 以下;並準備如下之附有樹脂層之支持考反··具有固定於該 支持板之單面上之該樹脂層,且該樹脂層之露出之表面具 有非附著性,·以該附有無機絕緣膜之玻璃基板之無機絕緣 膜的面、與該附有樹脂層之支持板之樹脂層纟面作為積層 面,而使該附有無機絕緣膜之玻璃基板與該附有樹脂層之 I63953.doc 201249643 支持板積層。 於第2態樣中,較佳為,該附有樹脂層之支持板為具有 使有機烯基聚矽氧烷與有機氫聚矽氧烷於該支持板上^應 硬化所獲得之聚矽氧樹脂之層的支持板。 本發明之第3態樣係一種附有支持板之顯示裝置用面 . 板,其具有本發明之第1態樣之積層體、與設置於該積層 體之玻璃基板表面上之顯示裝置用構件β 本發明之第4態樣係一種顯示裝置用面板,其係以該無 機絕緣膜與該樹脂層之界面作為剝離面而自本發明之第3 態樣之附有支持板之顯示裝置用面板剝離去除附有樹脂層 之支持板而形成。 本發明之第5態樣係一種顯示裝置,其具有本發明之第4 態樣之顯示裝置用面板。 發明之效果 根據本發明,可提供一種積層體及積層體之製造方法, 該積層體即便於經實施高溫加熱處理後,亦可於將樹脂層 與玻璃基板剝離時抑制樹脂層之樹脂附著於玻璃基板之剝 離面(即無機絕緣膜之表面)上,可藉由實施潔淨化處理而 保持經分離之玻璃基板之剝離面的潔淨性,進而可提高玻 璃基板側之剝離面之耐化學品性且抑制龜裂之產生。 進而,根據本發明,可提供一種包含該積層體之附有支 持板之顯示裝置用面板、使用附有支持板之顯示裝置用面 板所形成之顯示裝置用面板、及顯示裝置。 【實施方式】 163953.doc 201249643 下針對用以實施本發明之形態參照圖式加以說明, 本發月並不限制於以下實施形態,可不脫離本發明之範 圍而對以下實施形態添加各種變形及置換。 再者於本發明中,支持板之層與樹脂層之界面_離 強度高於樹脂層與無機絕緣膜之界面的剝離強纟,以下係 指樹脂層與無機絕緣膜可剝離地密接,支持板與樹脂層經 固定。 於本發明中,所謂at%係指各原子相對於全部原子數之 比例。 圖1係本發明之積層體之一例的模式剖面圖。 如圖1所示,積層體10係於附有無機絕緣膜之玻璃基板 24之層與支持板31之層之間存在樹脂層32·的積層體。 附有無機絕緣膜之玻璃基板24具備玻璃基板20'與設置 於其表面上之無機絕緣膜22。附有無機絕緣膜之玻璃基板 24之層係以該無機絕緣膜22與樹脂層32相接之方式而配置 於樹脂層32上,該無機絕緣膜22與樹脂層32之界面可剝離 地密接。再者,將成為無機絕緣膜22與樹脂層32之界面之 無機絕緣膜表面設為表面221,將樹脂層表面設為表面 321。 又,關於樹脂層32,其一面固定於支持板31之層上,同 時另一面(表面321)與附有無機絕緣膜之玻璃基板24之無機 絕緣膜22相接,樹脂層32與無機絕緣膜22之界面可剝離地 密接。包含支持板3 1之層及樹脂層32之2層部分係於製造 液晶面板等裝置(電子機器)之步驟中加強附有無機絕緣膜 163953.doc 201249643 之玻璃基板24。再者’將積層體ι〇之包含支持板31之層及 樹脂層32之2層部分自積層體丨〇獨立出者稱作附有樹脂層 之支持板(以下亦稱作加強板),積層體10中之該2層部分稱 作加強板30之層。於加強板3〇中樹脂層32固定於支持板3 1 上。 該積層體10係使用至裝置之製造步驟之中途為止。即, 該積層體10係使用至於其玻璃基板表面(即,附有無機絕 緣膜之玻璃基板24之不存在無機絕緣膜22之第2主面202) 上形成薄膜電晶體等裝置用構件為止。此後,加強板3〇之 層按與附有無機絕緣膜之玻璃基板24之層之界面剝離,積 層體10之加強板30之層不形成構成裝置之部分。自附有無 機絕緣膜之玻璃基板24上分離之加強板30,即附有樹脂層 之支持板,可與新附有無機絕緣膜之玻璃基板24積層而作 為積層體10而再利用。 於本發明中,發現藉由為無機絕緣膜22與樹脂層32相接 之構成之積層體10,可獲得所期望之效果。 以下’詳細說明各構成(附有無機絕緣膜之玻璃基板、 樹脂層、支持板)。 <附有無機絕緣膜之玻璃基板> 首先’說明附有無機絕緣膜之玻璃基板24。 附有無機絕緣膜之玻璃基板24具備玻璃基板20、與設置 於其表面上之無機絕緣膜22。無機絕緣膜22係以與後述樹 脂層32可剝離地密接之方式而配置於附有無機絕緣膜之玻 璃基板24中之最表面上。 163953.doc 201249643 以下,詳細描述玻璃基板20、無機絕緣膜22、及無機絕 緣膜22之製造方法。 (玻璃基板) 玻璃基板20於樹脂層32側之第1主面2〇1上具備無機絕緣 膜22 ’並於與樹脂層32侧相反側之第2主面2〇2上形成裝置 用構件而構成裝置。此處,所謂裝置用構件,係如後述顯 示裝置用面板之構成構件般構成裝置之至少一部分的構 件。作為具體例,可列舉:薄膜電晶體(TFT,Thin film transistor)、彩色濾光片(CF,c〇1〇r Fiher)。作為裝置可 例示:太陽電池(PV)、液晶面板(LCD)、有機EL面板 (0LED)等。 玻璃基板20之種類可為通常者,例如可列舉lcd、 0LED等顯示裝置用之玻璃基板等。玻璃基板2〇之耐化學 品性、耐透濕性優異,且熱收縮率較低。作為熱收縮率之 才曰標,使用JIS R 3 102(1995年修正)中規定之線膨脹係 數。 若玻璃基板20之線膨脹係數較大,則裝置之製造步驟多 伴有加熱處理,因此易於產生各種問題。例如,於在玻璃 基板20上形成TFT之情形時,若使於加熱下形成有TFT之 玻璃基板20冷卻,則有由於玻璃基板2〇之熱收縮而TFT之 位置偏離變得過大之虞。 玻璃基板20係使玻璃原料熔融並使熔融玻璃成形為板狀 而獲得。此種成形方法可為通常者,例如使用浮式法、熔 融法、流孔下引法、富可法、魯伯法等…尤其是厚度 163953.doc -10· 201249643 較薄之玻璃基板2〇,係利用將靳吐,a 暫夺成形為板狀之玻璃加埶 至可成形之溫度並以延伸等年於.k ' 于·^又進仃拉伸而使其變薄之方 法(再髮引法)成形而獲得。 玻璃基板20之玻璃並無特別限定,較佳為無驗爛石夕玻 • ㈣玻璃、㈣玻璃、高頻璃、其他以氧化石夕為主 . I成分之氧化物系、玻璃。作為氧化物系玻璃,較佳為以氧 化物換算之氧化矽之含量為40〜9〇質量%的玻璃。 作為玻璃基板20之玻璃,採用適於裝置之種類或其製造 步驟之玻璃。例如,液晶面板用之玻璃基板中,由於驗金 屬成分之溶出易於對液晶造成影響,故而包含實質上不含 鹼金屬成分之玻璃(無鹼玻璃)(其中通常包含鹼土金屬成 分)。如此,玻璃基板之玻璃係基於所應用之裝置之種類 及其製造步驟而適當選擇。 玻璃基板20之厚度並無特別限定,就玻璃基板2〇之薄型 化及/或輕量化之觀點而言,通常為〇8 mm以下,較佳為 0.3 mm以下,更佳為〇」5 mm以下。於超過〇 8 mm之情形 時,不滿足玻璃基板20之薄型化及/或輕量化之要求。於 〇·3 mm以下之情形時,可對玻璃基板2〇賦予良好之可撓 性。於0.1 5 mm以下之情形時,可將玻璃基板2〇捲成輥 • 狀。又’出於玻璃基板20之製造較為容易、玻璃基板20之 處理較為容易等理由,玻璃基板2〇之厚度較佳為〇.03 mm 以上。 再者’玻璃基板20亦可包含2層以上,於該情形時,.形 成各層之材料可為同種材料,亦可為不同種材料。又,於 -Π · 163953.doc 201249643 該清形時,「玻璃基板2G之厚度」意指所有層之合計厚 度。 (無機絕緣膜) .、’、機、、邑緣膜22含有包含選自切及朗組成 氧化物、氮化物或氮氧化物,亦可包含該等化合 β物。較佳為無機絕緣膜22包含矽或鋁之氧化物、 氮化物或氮氧化物,亦可包含該等化合物之混合物。無機 ^緣助較佳為包切或紹之氧化物、氮化物或氮氧化物 之任者。根據情況,無機絕緣膜22亦可包含降故肩+ 與㈣'子以外之金屬原子作為金屬原子。例如亦;= :: 原?鈕原子、鉬原子等。然而,較佳為如後所 述般實質上不包含鹼金屬原子及鹼土金屬原子。 _具體而t ’可列舉:二氧切(Si〇2)、氧仙(Al2〇3)、 f 化石夕(Si_3N4)、氮仙(Α1Ν)、氮氧切(SiOxN2_x,χ為(Μ )氣氧化紹(Al2〇yN3.y,y為(U〜2 9)、氮氧化石夕鋁 (Al2.xSixOzN4.x ’ 乂為〇9 ’鸲〇」〜3料。又亦可 為該等之混合物。 其中,由於耐熱性優異、耐龜裂性良好,可較佳地列 舉:二氧切(Si〇2)、氮切(Si3N4)、⑽况4表示且χ 處於〇.6〜K4之範圍内之氮氧化石夕、氧化銘㈧赴尤佳 為結晶性之二氧化石夕。 無機絕緣膜22較佳為包含上述氧化物 '氮化物或氣氧化 物作為主成分’具體而言,上述氧化物、氮化物及氮氧化 物之含量相對於無機絕緣膜總量,較佳為98質量%以上, 163953.doc -12· 201249643 更佳為99質量%以上,尤佳為99.999質量%以上。 無機絕緣膜2 2顯示優異之耐熱性。因此,即便將積層體 1 〇暴露於高溫條件下’膜本身亦不易發生化學變化,於與 樹脂層32之間亦不易發生化學結合,不易發生由重剝離化 引起之樹脂層32之樹脂附著於附有無機絕緣膜之玻璃基板 24上。又’無機絕緣膜22本身具有優異之機械強度,可對 玻璃基板20表面賦予耐龜裂性。 上述重剝離化係指:無機絕緣膜22與樹脂層32之界面之 剥離強度變得大於支持板3 1與樹脂層32之界面之剝離強 度、及樹脂層32之材料本身之強度(塊體強度)的任一者。 若於無機絕緣膜22與樹脂層32之界面上發生重剝離化,則 樹脂層32之表面321之樹脂容易附著於露出之無機絕緣膜 表面221上,其表面之潔淨化容易變得困難。樹脂附著於 無機絕緣膜表面221上意指:樹脂層32整體附著於無機絕 緣膜表面221上,及樹脂層32之表面321損傷而樹脂層32之 表面321之樹脂的一部分附著於無機絕緣膜表面22丨上。 無機絕緣膜22之厚度並無特別限制,就進一步抑制由重 剝離化引起之樹脂層32附著於附有無機絕緣膜之玻璃基板 24上,且維持耐擦傷性方面而言,較佳為5〜5〇〇〇 nm,更 佳為10〜500 nm。 若考慮將附有無機絕緣膜之玻璃基板24用於襞置用途方 面’則較佳為無機絕緣膜22透明。具體而言,波長38〇〜 780 nm時之透過率,即附有無機絕緣膜之玻璃基板24之可 見光透過率較佳為70%以上,更佳為8〇%以上。 I63953.doc 201249643 無機絕緣膜22於圖1中記作單層,但亦可為2層以上之積 層。例如’於無機絕緣膜22為2層之情形時,設置與玻璃 基板20相接之第i無機絕緣膜、與設置於第1無機絕緣膜之 上之第2無機絕緣膜。於無機絕緣膜22為2層之情形時,第 1無機絕緣膜與第2無機絕緣膜之成分可不同。進而,亦可 於第1無機絕緣膜與第2無機絕緣膜之間或玻璃基板2〇與第 1無機絕緣膜之間設置無機導電膜。 又’例如,於無機絕緣膜22之與樹脂層32相接之面的表 面粗糙度(Ra)未達30 nm之範圍内,無機導電膜可設置成 島狀或條紋狀。 又’亦可於玻璃基板20與無機絕緣膜22之間設置例如: 防止鹼性離子自玻璃基板20向無機絕緣膜22擴散之阻驗 層’使無機絕緣膜22之表面平坦化之平坦化層。 無機絕緣膜22可於無損本發明之效果之範圍内而設置於 玻璃基板20表面上之一部分上。例如,無機絕緣膜22可於 玻璃基板20表面上設置成島狀或條紋狀。 更具體而言’就進一步抑制由重剝離化引起之樹脂層32 附著於附有無機絕緣膜之玻璃基板24上之方面而言,無機 絕緣膜22於玻璃基板20表面上之被覆率較佳為50〜 100%,更佳為75〜100%。 於積層體10中,無機絕緣膜22之與樹脂層32相接之面 (即無機絕緣膜表面221)中鹼金屬及鹼土金屬之原子之合計 含量為0.5 at%以下,更佳為〇. 1 at%以下》於積層前之附 有無機絕緣膜之玻璃基板24中,或自積層體1〇分離後之附 I63953.doc 14 201249643 有無機絕緣膜之玻璃基板24中,無機絕緣膜22之與存在破 璃基板2〇之側相反側之表面中鹼金屬及鹼土金屬之原子之 合計含量亦相同’為0.5 at%以下,更佳為〇.1 at%以下。 藉由設為上述範圍而不易發生重剝離化等,可進一步抑制 咼溫處理後之樹脂層3 2之樹脂之附著,且可製成於所附著 之樹脂之去除性方面亦更為優異之表面。以下,只要並未 特別1^及積層體10中之無機絕緣膜表面221、及附有無機 絕緣膜之玻璃基板24本身之無機絕緣膜表面,則均稱作無 機絕緣膜表面221。 於本發明中’鹼金屬及鹼土金屬之原子之合計含量意指 利用 XPS(X-ray Photoelectron Spectroscopy,X射線光電子 分光法)測定無機絕緣膜表面而獲得之表面之鹼金屬原子 及鹼土金屬原子的含量。又,於XPS測定中,可使用公知 之XPS測定裝置。再者,以下亦將鹼金屬及鹼土金屬之原 子之合計含量為0.5 at%以下之情況稱作實質上不包含鹼金 屬原子及驗土金屬原子。 進而’較佳為於積層體1 0中無機絕緣膜22之與樹脂層32 相接之面(即無機絕緣膜表面221)之表面粗糙度(Ra)未達30 nm。同樣地’較佳為於附有無機絕緣膜之玻璃基板24中, 無機絕緣膜表面之表面粗糙度(Ra)亦未達30 nm。藉由設 為上述範圍而不易發生重剝離化等,可進一步抑制高溫處 理後之樹脂層32之樹脂之附著,且可製成於所附著之樹脂 之去除性方面亦更為優異之表面。其中,就本發明之效果 更優異方面而言,表面粗链度(Ra)較佳為10 nm以下,更 163953.doc -15- 201249643 佳為1 nm以了。再者’ 了限並無特別限制,較佳為〇nm。[Technical Field] The present invention relates to a laminated body, a method of manufacturing a laminated body, a panel for a display device with a supporting plate, a panel for a display device, and a display device. [Prior Art] In recent years, devices such as solar cells (PV, Photovoltaic), liquid crystal panels (LCD liquid crystal displays), and organic EL panels (0LEDs) have been thinned and lightened. The substrates used in these devices are being thinned. If the strength of the substrate is insufficient due to the thinning, the handleability of the substrate is lowered in the manufacturing process of the device. Therefore, a method of forming a device member (e.g., a thin film transistor) on a substrate thicker than the final thickness has been widely used, and then the substrate is subjected to a chemical etching treatment to form a thin plate. However, in this method, for example, when the thickness of one substrate is reduced from 0.7 mm to 〇 2 mm 4 〇", most of the materials of the original substrate are peeled off by the surname, so that the productivity or the raw material is The use efficiency is not good. Further, in the thinning method of the substrate using the above-described (four) engraving, when there is a fine flaw on the surface of the substrate, there is a process in which (4) processing is performed to form a fine recess (corrosive pit) from the wound as a starting point. Recently, in order to cope with the above-mentioned problems, the right + i % it it J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J 右 右From the town*, the reinforcing plate is separated from the four-plate glass substrate (Example 163953.doc 201249643, see Patent Document 1) ^The reinforcing plate has a support plate and a resin layer fixed to the support plate, and the resin layer and the thin glass substrate are peelable. Closely connected. The interface between the resin layer of the laminate and the thin glass substrate is peeled off, and the reinforcing plate separated from the thin glass substrate can be reused as a laminate with the new thin glass substrate. [Prior Art Document Patent Document 1: International Publication No. SUMMARY OF THE INVENTION PROBLEMS TO BE SOLVED BY THE INVENTION However, in the laminated body of the above-described prior art, when the reinforcing plate is separated from the thin glass substrate, a part of the resin layer may adhere to the product side, that is, the thin plate. (4) on the glass substrate. In the case where the laminate is heat-treated by the high-temperature strip, a part of the resin layer frequently adheres to the peeling surface of the thin-plate glass substrate on the side of the product, and as a result, there is a concern that the yield is lowered. In the case of the above-mentioned prior art, in the laminated body of the above-mentioned prior art, the component of the resin layer is adhered to the peeling surface of the separated thin plate, although it is intended to be cleaned by using a solvent or the like. use! · I $ Soil Cleansing and removal of the appendage is practically impossible to remove to the desired level. In the laminate of the previous composition, on the peeling surface of the separated thin-plate glass substrate, sometimes rupture (cracking) may occur in the glass 163953.doc 201249643 at the time of the separation or the subsequent treatment, and sometimes it may cause The yield is reduced. The present invention has been made in view of the above problems, and an object of the invention is to provide a method for producing a laminated body and a laminated body which can suppress a resin layer when the resin layer and the glass substrate are peeled off even after high-temperature heat treatment. By adhering to the peeling surface of the glass substrate, it is possible to maintain the cleansing property of the peeled surface of the separated glass substrate by performing the cleaning treatment, and it is possible to suppress the occurrence of cracks on the peeled surface of the glass substrate. Further, an object of the present invention is to provide a panel for a display device including a support board including the laminate, a panel for a display device formed using a panel for a display device with a support panel, and a display device. Means for Solving the Problems The inventors of the present invention have made intensive studies to solve the above problems and have completed the present invention. That is, in order to achieve the above object, the first aspect of the present invention is a laminate comprising a layer of a support plate, a resin layer, and a layer of a glass substrate with an inorganic insulating film, and the inorganic insulating film is attached thereto. An inorganic insulating film of the glass substrate is in contact with the resin layer; and the glass substrate with the inorganic insulating film has an oxide containing at least one selected from the group consisting of ruthenium and aluminum on one surface of the glass substrate Inorganic insulating film of nitride or oxynitride The total content of atoms of alkali metal and alkaline earth metal in the surface of the inorganic insulating film which is in contact with the above resin layer is 〇5 at. /. Hereinafter, the peel strength of the interface between the layer of the support sheet and the resin layer is higher than the peel strength of the interface between the resin layer and the inorganic insulating film. In the first aspect, it is preferable that the inorganic insulating film is a film containing cerium oxide, nitrogen 163953.doc 201249643 fossil, nitrous oxide or oxidized. In the first aspect, it is preferable that a surface roughness (Ra) of the surface of the inorganic insulating film that is in contact with the resin layer is less than 30 nm. In the first aspect, the thickness of the inorganic insulating film is preferably 5 to 5 nm. In the first aspect, the thickness of the glass substrate is preferably 〇〇3 to 〇8 mm. In the first aspect, it is preferred that the resin of the resin layer is a polyoxymethylene resin. In the first aspect, it is preferred that the polyfluorene oxide resin is a reaction hardened product of an organic alkenyl polyfluorene oxide and an organic hydrogen polyoxyalkylene oxide. In the first aspect, it is preferable that the thickness of the resin layer is 1 to 1 〇〇μηΐβ in the first aspect, and preferably the support plate is a glass plate. A second aspect of the present invention provides a method for producing a laminate, which comprises a method of sequentially providing a laminate of a support layer, a resin layer, and a layer of a glass substrate with an inorganic insulating film, the method comprising: preparing a glass substrate with an inorganic insulating film having an inorganic insulating film containing an oxide, a nitride or an oxynitride containing at least one selected from the group consisting of ruthenium and aluminum on one surface of the glass substrate, The total content of the atoms of the alkali metal and the alkaline earth metal in the surface of the inorganic insulating film that is in contact with the resin layer is 〇5 _ or less; and the support layer with the resin layer as follows is prepared and fixed to the support plate. The resin layer on one side, and the exposed surface of the resin layer has non-adhesiveness, the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film, and the resin of the support plate with the resin layer attached thereto The layered surface is used as a buildup layer, and the glass substrate with the inorganic insulating film is laminated with the I63953.doc 201249643 support plate with the resin layer. In the second aspect, preferably, the support layer with the resin layer is a polysiloxane obtained by hardening the organic alkenyl polyoxyalkylene and the organic hydrogen polyoxyalkylene on the support plate. Support plate for the layer of resin. A third aspect of the present invention is a surface plate for a display device with a support plate, which has a laminated body according to a first aspect of the present invention and a member for a display device provided on a surface of a glass substrate provided on the laminated body. The fourth aspect of the present invention is a panel for a display device, wherein the interface between the inorganic insulating film and the resin layer is used as a peeling surface, and a panel for a display device with a support plate attached to the third aspect of the present invention is used. It is formed by peeling off a support board with a resin layer. According to a fifth aspect of the invention, there is provided a display device comprising the panel for a display device according to the fourth aspect of the invention. Advantageous Effects of Invention According to the present invention, it is possible to provide a laminated body and a method for producing a laminated body, which can prevent the resin of the resin layer from adhering to the glass when the resin layer and the glass substrate are peeled off even after the high-temperature heat treatment is performed. On the peeling surface of the substrate (that is, the surface of the inorganic insulating film), the cleaning property of the separated glass substrate can be maintained by the cleaning treatment, and the chemical resistance of the peeling surface on the glass substrate side can be improved. Inhibit the occurrence of cracks. Further, according to the present invention, it is possible to provide a panel for a display device including a support plate, a panel for a display device formed using a panel for a display device with a support plate, and a display device. [Embodiment] 163953.doc 201249643 The present invention is described with reference to the drawings, and the present invention is not limited to the following embodiments, and various modifications and substitutions may be added to the following embodiments without departing from the scope of the invention. . Furthermore, in the present invention, the interface between the layer of the support plate and the resin layer is stronger than the peeling of the interface between the resin layer and the inorganic insulating film, and the following means that the resin layer and the inorganic insulating film are peelably adhered to each other, and the support plate The resin layer is fixed. In the present invention, the term "at%" means the ratio of each atom to the total number of atoms. Fig. 1 is a schematic cross-sectional view showing an example of a laminate of the present invention. As shown in Fig. 1, the laminated body 10 is a laminated body in which a resin layer 32· is present between a layer of a glass substrate 24 having an inorganic insulating film and a layer of the support plate 31. The glass substrate 24 with an inorganic insulating film is provided with a glass substrate 20' and an inorganic insulating film 22 provided on the surface thereof. The layer of the glass substrate 24 with the inorganic insulating film is disposed on the resin layer 32 such that the inorganic insulating film 22 is in contact with the resin layer 32, and the interface between the inorganic insulating film 22 and the resin layer 32 is peelably adhered. Further, the surface of the inorganic insulating film which is the interface between the inorganic insulating film 22 and the resin layer 32 is the surface 221, and the surface of the resin layer is the surface 321 . Further, the resin layer 32 is fixed to the layer of the support plate 31 on one side while the other surface (surface 321) is in contact with the inorganic insulating film 22 of the glass substrate 24 to which the inorganic insulating film is attached, the resin layer 32 and the inorganic insulating film. The interface of 22 is peelably adhered. The two-layer portion including the layer of the support plate 31 and the resin layer 32 is reinforced with the glass substrate 24 to which the inorganic insulating film 163953.doc 201249643 is attached in the step of manufacturing a liquid crystal panel or the like (electronic device). In addition, the layer of the support layer 31 and the two layers of the resin layer 32 are separately referred to as a support layer (hereinafter also referred to as a reinforcing plate) with a resin layer. The two-layer portion of the body 10 is referred to as a layer of the reinforcing plate 30. The resin layer 32 is fixed to the support plate 3 1 in the reinforcing plate 3 . This laminated body 10 is used until the middle of the manufacturing process of the apparatus. In other words, the laminated body 10 is formed by forming a member for a device such as a thin film transistor on the surface of the glass substrate (that is, the second main surface 202 on which the inorganic insulating film 22 is not present on the glass substrate 24 to which the inorganic insulating film is attached). Thereafter, the layer of the reinforcing plate 3 is peeled off at the interface with the layer of the glass substrate 24 to which the inorganic insulating film is attached, and the layer of the reinforcing plate 30 of the laminated body 10 does not form a part constituting the device. The reinforcing plate 30 separated from the glass substrate 24 to which the inorganic insulating film is attached, that is, the supporting plate with the resin layer attached thereto, can be reused as a laminated body 10 by laminating the glass substrate 24 to which the inorganic insulating film is newly attached. In the present invention, it has been found that a desired effect can be obtained by the laminated body 10 having the inorganic insulating film 22 and the resin layer 32 in contact with each other. Hereinafter, each configuration (a glass substrate, a resin layer, and a support plate with an inorganic insulating film) will be described in detail. <Glass substrate with inorganic insulating film> First, the glass substrate 24 to which the inorganic insulating film is attached will be described. The glass substrate 24 with an inorganic insulating film is provided with a glass substrate 20 and an inorganic insulating film 22 provided on the surface thereof. The inorganic insulating film 22 is disposed on the outermost surface of the glass substrate 24 with the inorganic insulating film attached so as to be in close contact with the resin layer 32 to be described later. 163953.doc 201249643 Hereinafter, a method of manufacturing the glass substrate 20, the inorganic insulating film 22, and the inorganic insulating film 22 will be described in detail. (Glass substrate) The glass substrate 20 is provided with the inorganic insulating film 22' on the first main surface 2'1 on the resin layer 32 side, and the device member is formed on the second main surface 2'2 on the side opposite to the resin layer 32 side. Form the device. Here, the member for the device is a member constituting at least a part of the device as a constituent member of the panel for a display device to be described later. Specific examples include a thin film transistor (TFT) and a color filter (CF, c〇1〇r Fiher). As the device, a solar cell (PV), a liquid crystal panel (LCD), an organic EL panel (0 LED), or the like can be exemplified. The type of the glass substrate 20 can be a normal one, and examples thereof include a glass substrate for a display device such as lcd or OLED. The glass substrate 2 is excellent in chemical resistance and moisture permeability, and has a low heat shrinkage rate. As a measure of the heat shrinkage rate, the linear expansion coefficient specified in JIS R 3 102 (1995 Revision) is used. If the linear expansion coefficient of the glass substrate 20 is large, the manufacturing steps of the apparatus are often accompanied by heat treatment, so that various problems are apt to occur. For example, when a TFT is formed on the glass substrate 20, if the glass substrate 20 on which the TFT is formed under heating is cooled, the positional deviation of the TFT becomes excessive due to thermal contraction of the glass substrate 2. The glass substrate 20 is obtained by melting a glass raw material and molding the molten glass into a plate shape. Such a forming method may be a normal one, for example, a floating method, a melting method, a flow hole down method, a rich method, a Luber method, etc., in particular, a thickness of 163953.doc -10·201249643 thin glass substrate 2〇 A method in which a glass which is formed into a plate shape is twisted to a moldable temperature and is stretched to a thickness of .k '. The method is obtained by forming. The glass of the glass substrate 20 is not particularly limited, and is preferably a non-destructive stone slab; (iv) glass, (four) glass, high-frequency glass, and other oxide-based ceremonies. The oxide-based glass is preferably a glass having a content of cerium oxide in an amount of 40 to 9 % by mass in terms of oxide. As the glass of the glass substrate 20, a glass suitable for the type of the device or a manufacturing step thereof is used. For example, in the glass substrate for a liquid crystal panel, since the elution of the metal component is likely to affect the liquid crystal, a glass (alkali-free glass) containing substantially no alkali metal component (which usually contains an alkaline earth metal component) is contained. Thus, the glass of the glass substrate is appropriately selected depending on the type of the apparatus to be applied and the manufacturing steps thereof. The thickness of the glass substrate 20 is not particularly limited, and is usually 〇8 mm or less, preferably 0.3 mm or less, and more preferably 〇5 mm or less from the viewpoint of thinning and/or weight reduction of the glass substrate 2〇. . When it exceeds 〇 8 mm, the requirements for thinning and/or weight reduction of the glass substrate 20 are not satisfied. When the thickness is 3 mm or less, the glass substrate 2 can be imparted with good flexibility. When the thickness is 0.1 5 mm or less, the glass substrate 2 can be wound into a roll shape. Further, the thickness of the glass substrate 2 is preferably 〇.03 mm or more because the glass substrate 20 is easily manufactured and the glass substrate 20 is easily handled. Further, the glass substrate 20 may have two or more layers. In this case, the materials forming the layers may be the same material or different materials. Further, in - Π 163953.doc 201249643 In the case of the clearing, "the thickness of the glass substrate 2G" means the total thickness of all the layers. (Inorganic Insulating Film) The optical film 22 contains an oxide, a nitride or an oxynitride selected from the group consisting of a cut and a lanthanum, and may also contain the compound β. It is preferable that the inorganic insulating film 22 contains an oxide, a nitride or an oxynitride of lanthanum or aluminum, and may also contain a mixture of the compounds. Inorganic support is preferably any of oxides, nitrides or oxynitrides. Depending on the case, the inorganic insulating film 22 may also contain a metal atom other than the shoulder + and (4) ' as a metal atom. For example, also; = :: original? Button atom, molybdenum atom, etc. However, it is preferred that substantially no alkali metal atoms and alkaline earth metal atoms are contained as described later. _ specific and t ' can be enumerated: dioxane (Si〇2), oxygen fairy (Al2〇3), f fossil (Si_3N4), nitrogen fairy (Α1Ν), oxynitride (SiOxN2_x, χ is (Μ) gas Oxidation (Al2〇yN3.y, y is (U~2 9), yttrium aluminum oxide (Al2.xSixOzN4.x '乂 is 〇9 '鸲〇"~3 material. It may also be a mixture of such Among them, since the heat resistance is excellent and the crack resistance is good, it is preferably exemplified by dioxane (Si〇2), nitrogen cut (Si3N4), (10), and 4, and χ is in the range of 〇.6 to K4. The nitrogen oxynitride eve, the oxidized dynasty (eight) goes to the crystallized sulphur dioxide. The inorganic insulating film 22 preferably contains the above oxide 'nitride or gas oxide as a main component', specifically, the above oxide The content of the nitride and the oxynitride is preferably 98% by mass or more based on the total amount of the inorganic insulating film, more preferably 163953.doc -12· 201249643 or more preferably 99% by mass or more, and particularly preferably 99.999% by mass or more. Film 2 2 exhibits excellent heat resistance. Therefore, even if the laminate 1 is exposed to high temperature conditions, the film itself is not susceptible to chemical changes. Chemical bonding between the resin layers 32 is also less likely to occur, and the resin of the resin layer 32 caused by heavy peeling is less likely to adhere to the glass substrate 24 with the inorganic insulating film attached thereto. Further, the inorganic insulating film 22 itself has excellent mechanical strength. The surface of the glass substrate 20 can be provided with crack resistance. The above-mentioned heavy peeling means that the peeling strength of the interface between the inorganic insulating film 22 and the resin layer 32 becomes larger than the peeling strength of the interface between the support sheet 31 and the resin layer 32, and Any one of the strength (block strength) of the material itself of the resin layer 32. If heavy peeling occurs at the interface between the inorganic insulating film 22 and the resin layer 32, the resin of the surface 321 of the resin layer 32 tends to adhere to the exposed On the surface 221 of the inorganic insulating film, the surface thereof is easily cleaned. The adhesion of the resin to the surface 221 of the inorganic insulating film means that the resin layer 32 is entirely attached to the surface 221 of the inorganic insulating film, and the surface 321 of the resin layer 32 is damaged. A part of the resin of the surface 321 of the resin layer 32 is adhered to the surface 22 of the inorganic insulating film. The thickness of the inorganic insulating film 22 is not particularly limited, and the peeling by the heavy peeling is further suppressed. The resin layer 32 is attached to the glass substrate 24 to which the inorganic insulating film is attached, and is preferably 5 to 5 nm, more preferably 10 to 500 nm in terms of maintaining scratch resistance. The glass substrate 24 having an inorganic insulating film is preferably used for the purpose of mounting. The transparent insulating film 22 is preferably transparent. Specifically, the transmittance at a wavelength of 38 Å to 780 nm, that is, the glass substrate 24 with an inorganic insulating film. The visible light transmittance is preferably 70% or more, more preferably 8% or more. I63953.doc 201249643 The inorganic insulating film 22 is referred to as a single layer in Fig. 1, but may be a laminate of two or more layers. For example, when the inorganic insulating film 22 is two layers, the i-th inorganic insulating film that is in contact with the glass substrate 20 and the second inorganic insulating film that is provided on the first inorganic insulating film are provided. When the inorganic insulating film 22 is two layers, the components of the first inorganic insulating film and the second inorganic insulating film may be different. Further, an inorganic conductive film may be provided between the first inorganic insulating film and the second inorganic insulating film or between the glass substrate 2A and the first inorganic insulating film. Further, for example, in the range where the surface roughness (Ra) of the surface of the inorganic insulating film 22 that is in contact with the resin layer 32 is less than 30 nm, the inorganic conductive film may be provided in an island shape or a stripe shape. Further, a flattening layer that planarizes the surface of the inorganic insulating film 22 may be provided between the glass substrate 20 and the inorganic insulating film 22, for example, a resist layer that prevents diffusion of alkaline ions from the glass substrate 20 to the inorganic insulating film 22. . The inorganic insulating film 22 can be provided on one portion of the surface of the glass substrate 20 within the range in which the effects of the present invention are not impaired. For example, the inorganic insulating film 22 may be provided in an island shape or a stripe shape on the surface of the glass substrate 20. More specifically, the coverage of the inorganic insulating film 22 on the surface of the glass substrate 20 is preferably such that the resin layer 32 is adhered to the glass substrate 24 with the inorganic insulating film by the heavy peeling. 50 to 100%, more preferably 75 to 100%. In the laminated body 10, the total content of the atoms of the alkali metal and the alkaline earth metal in the surface of the inorganic insulating film 22 which is in contact with the resin layer 32 (that is, the surface 221 of the inorganic insulating film) is 0.5 at% or less, more preferably 〇. At or below, in the glass substrate 24 with the inorganic insulating film before the lamination, or after the separation from the laminated body, I63953.doc 14 201249643 In the glass substrate 24 having the inorganic insulating film, the inorganic insulating film 22 is The total content of the atoms of the alkali metal and the alkaline earth metal in the surface on the side opposite to the side on the side of the glass substrate 2 is also the same as '0.5 at% or less, more preferably 〇.1 at% or less. By setting it as the said range, it is not easy to re-peeling, etc., and the adhesion of the resin of the resin layer 32 after the temperature-temperature process can be further suppressed, and the surface of the resin which adhered is also more excellent. . In the following, the surface of the inorganic insulating film 221 in the laminated body 10 and the surface of the inorganic insulating film of the glass substrate 24 with the inorganic insulating film itself are not particularly referred to as the inorganic insulating film surface 221. In the present invention, the total content of the atoms of the alkali metal and the alkaline earth metal means the alkali metal atom and the alkaline earth metal atom of the surface obtained by measuring the surface of the inorganic insulating film by XPS (X-ray photoelectron spectroscopy). content. Further, in the XPS measurement, a known XPS measuring device can be used. In addition, the case where the total content of the alkali metal and the alkaline earth metal atom is 0.5 at% or less is referred to as substantially no alkali metal atom and soil test metal atom. Further, it is preferable that the surface roughness (Ra) of the surface of the inorganic insulating film 22 in contact with the resin layer 32 (i.e., the inorganic insulating film surface 221) in the laminated body 10 is less than 30 nm. Similarly, it is preferable that the surface roughness (Ra) of the surface of the inorganic insulating film is less than 30 nm in the glass substrate 24 with the inorganic insulating film. By setting it to the above range, it is less likely to cause heavy peeling or the like, and the adhesion of the resin of the resin layer 32 after the high-temperature treatment can be further suppressed, and the surface which is more excellent in the removability of the adhered resin can be obtained. Among them, in terms of the effect of the present invention, the surface roughness (Ra) is preferably 10 nm or less, and more preferably 163953.doc -15 to 201249643 is 1 nm. Further, the limit is not particularly limited, and is preferably 〇nm.

Ra係依據JIS B 0601(2001年修正)而測定。 又,更佳為關於附有無機絕緣膜之玻璃基板24之無機絕 緣膜側表面的上述2個表面特性均得以滿足。即,附有無 機絕緣膜之玻璃基板2 4之無機絕緣膜側表面更佳為於實質 上不包含鹼金屬原子及鹼土金屬原子,且其表面粗糙度 (Ra)未達 30 nm。 於通常之玻璃基板中,由於包含特定量之鹼金屬或鹼土 金屬成分,而於其表面存在驗金屬原子或驗土金屬原子。 例如,於包含無鹼硼矽玻璃之玻璃基板中實質上不含鹼金 屬成分’由於包含特定量之鹼土金屬成分,而於其表面存 在驗土金屬原子。又,包含鈉妈玻璃之玻璃基板中由於含 有特定量之鹼金屬成分與鹼土金屬成分,而於其表面存在 驗金屬原子與驗土金屬原子。因此,於使玻璃基板與樹脂 層直接接觸並暴露於高溫條件下之情形時,鹼金屬原子或 驗土金屬原子脫離而與樹脂層之成分發生化學反應,其結 果使玻璃基板表面與和其表面相接之樹脂層間之結合力增 大°因此’容易變得難以使玻璃基板2〇與樹脂層32分離, 又’亦易於發生重剝離化。再者,所謂鹼金屬係指鋰、鈉 及狎’所謂鹼土金屬係指鎂、鈣、鋇及锶。 可認為’於附有無機絕緣膜之玻璃基板24中,玻璃基板 2〇中之鹼金屬原子或鹼土金屬原子經無機絕緣膜22阻擋, 並且進而亦將無機絕緣膜表面221設為實質上不包含鹼金 屬原子或鹼土金屬原子者,藉此於積層體1〇中’不會發生 163953.doc • 16 - 201249643 由驗金屬原子或鹼土金屬原子自無機絕緣膜表面221向樹 脂層3 2側脫離而引起之化學反應,且不易發生重剝離化 等。藉此’於積層體1 〇經高溫處理後之剝離中,可抑制樹 脂附著於無機絕緣膜表面221上,且可製成於所附著之樹 脂之去除性方面亦更為優異之表面。無機絕緣膜表面221 中藉由XPS測定之鹼金屬或鹼土金屬之原子之合計含量為 0.5 at%以下,較佳為(M at%以下。 實質上不包含鹼金屬原子或鹼土金屬原子之表面係藉由 使用.貫質上不包含鹼金屬原子或鹼土金屬原子之材料作為 用以形成無機絕緣膜22之材料而獲得。例如,於利用減鑛 法形成無機絕緣膜22之情形時,使用鹼金屬原子或驗土金 屬原子較少之材料作為濺鍍靶等之無機絕緣膜材料或濺鍍 環境氣體等之材料,藉此可形成具有實質上不包含鹼金屬 原子或鹼土金屬原子之表面之無機絕緣膜22。通常,只要 不有意地於用以形成無機絕緣膜22之如上所述之材料中添 加鹼金屬原子或鹼土金屬原子,則作為雜質而包含於該材 料中之鹼金屬原子或鹼土金屬原子較少。因此,使用通常 使用之材料所獲得之無機絕緣膜22成為實質上不包含驗金 屬原子或鹼土金屬原子之無機絕緣膜。 又’只要不是厚度㈣薄之無機絕緣膜22,則玻璃基板 20之驗金屬原子或驗土金屬原子不會滲透無機絕緣膜”而 到達不與玻璃基板相接之表面。如上所述,只要無機絕緣 膜22之厚度為5⑽左右以上,則可充分阻擋玻璃基板2〇之 驗金屬原子或驗土金屬原子。 163953.doc -17- 201249643 通常使用之玻璃基板20之表面平滑,形成於其上之無機 絕緣膜22之表面亦變得平滑。即’通常使用之玻,璃基板2〇 之表面粗縫度(Ra)未達30 nm’形成於其上之無機絕緣膜 22之不與玻璃基板20相接之表面(無機絕緣膜表面221)的表 面粗糙度變得未達3 0 nm。然而’根據情況,有時藉由姓 刻等而使玻璃基板20表面粗面化。例如,根據無機絕緣膜 22之種類不同’而有為了提高與玻璃基板2〇表面之結合強 度而使玻璃基板20表面粗面化之情況。又,亦有時作為用 以使來自玻璃基板20表面之反射光擴散而降低由反射光引 起之眩光的處理(防眩化處理)’而使玻璃基板2〇表面粗面 化。於使玻璃基板20表面粗面化之情形時,有如下之虞: 若經粗面化之表面之表面粗糙度(Ra)成為3〇 nm以上,則 形成於其上之無機絕緣膜22之不與玻璃基板2〇相接之表面 (無機絕緣膜表面221)的表面粗糙度亦成為3〇 nm以上。再 者,藉由無機絕緣膜22之形成,而玻璃基板2〇表面之表面 粗糙度未必直接成為無機絕緣膜表面221之表面粗輪度, 亦有時無機絕緣膜22之表面粗糙度經緩和,因此無機絕緣 膜表面221之表面粗糙度並不僅由玻璃基板2〇表面之表面 粗糙度規定》 (無機絕緣膜之製造方法) 無機絕緣膜22之製造方法並無特別限制,可採用公知之 法例如可列舉藉由蒸鍍法或滅鍍法於玻璃基板2〇上設 置特定之氧化物、氮化物、氮氧化物的方法。例如,可利 用電漿氮化法等方法對藉由CVD(Chemical 163953.doc 201249643Ra is measured in accordance with JIS B 0601 (2001 revision). Further, it is more preferable that the above two surface characteristics of the inorganic insulating film side surface of the glass substrate 24 with the inorganic insulating film are satisfied. That is, the side surface of the inorganic insulating film of the glass substrate 24 with the inorganic insulating film is more preferably substantially free of alkali metal atoms and alkaline earth metal atoms, and its surface roughness (Ra) is less than 30 nm. In a typical glass substrate, a metal atom or a test metal atom exists on the surface thereof because it contains a specific amount of an alkali metal or an alkaline earth metal component. For example, in a glass substrate comprising an alkali-free borosilicate glass, substantially no alkali metal component is contained, and since a specific amount of an alkaline earth metal component is contained, a soil-measuring metal atom exists on the surface thereof. Further, since the glass substrate containing sodium mother glass contains a specific amount of an alkali metal component and an alkaline earth metal component, a metal atom and a soil test metal atom are present on the surface thereof. Therefore, when the glass substrate is brought into direct contact with the resin layer and exposed to high temperature conditions, the alkali metal atom or the soil metal atom is detached and chemically reacts with the components of the resin layer, and as a result, the surface of the glass substrate and the surface thereof The bonding force between the adjacent resin layers is increased. Therefore, it is easy to make it difficult to separate the glass substrate 2 from the resin layer 32, and it is also prone to heavy peeling. Further, the term "alkali metal" means lithium, sodium and lanthanum. The so-called alkaline earth metal means magnesium, calcium, barium and strontium. It is considered that in the glass substrate 24 with the inorganic insulating film, the alkali metal atom or the alkaline earth metal atom in the glass substrate 2 is blocked by the inorganic insulating film 22, and the inorganic insulating film surface 221 is also substantially not included. An alkali metal atom or an alkaline earth metal atom, by which it does not occur in the laminate 1 163 153953.doc • 16 - 201249643 The metal atom or alkaline earth metal atom is detached from the inorganic insulating film surface 221 toward the resin layer 3 2 side. The chemical reaction is caused, and heavy peeling or the like is less likely to occur. By this, in the peeling of the laminated body 1 after the high temperature treatment, the adhesion of the resin to the surface 221 of the inorganic insulating film can be suppressed, and the surface of the adhered resin can be made more excellent. The total content of the atoms of the alkali metal or alkaline earth metal measured by XPS in the surface 221 of the inorganic insulating film is 0.5 at% or less, preferably (M at % or less). The surface system substantially does not contain an alkali metal atom or an alkaline earth metal atom. A material which does not contain an alkali metal atom or an alkaline earth metal atom is used as a material for forming the inorganic insulating film 22. For example, in the case where the inorganic insulating film 22 is formed by a reduced ore method, an alkali metal is used. A material having a small atomic or soil-measured metal atom is used as a material of an inorganic insulating film material such as a sputtering target or a sputtering atmosphere, thereby forming an inorganic insulating layer having a surface substantially containing no alkali metal atom or alkaline earth metal atom. Membrane 22. Generally, if an alkali metal atom or an alkaline earth metal atom is not intentionally added to the material for forming the inorganic insulating film 22 as described above, the alkali metal atom or the alkaline earth metal atom contained in the material as an impurity Therefore, the inorganic insulating film 22 obtained by using a commonly used material becomes substantially free of a metal atom or an alkaline earth metal atom. Further, as long as the inorganic insulating film 22 is not thick (four) thin, the metal atom or the test metal atom of the glass substrate 20 does not penetrate the inorganic insulating film and reaches the surface which is not in contact with the glass substrate. As described above, as long as the thickness of the inorganic insulating film 22 is about 5 (10) or more, the metal atom or the test metal atom of the glass substrate 2 can be sufficiently blocked. 163953.doc -17- 201249643 The surface of the glass substrate 20 generally used is smooth, The surface of the inorganic insulating film 22 formed thereon is also smoothed. That is, the glass of the glass substrate 2 has a rough surface roughness (Ra) of less than 30 nm, and the inorganic insulating film 22 is formed thereon. The surface roughness of the surface (inorganic insulating film surface 221) which is not in contact with the glass substrate 20 becomes less than 30 nm. However, depending on the case, the surface of the glass substrate 20 may be roughened by a surname or the like. For example, depending on the type of the inorganic insulating film 22, the surface of the glass substrate 20 may be roughened in order to increase the bonding strength with the surface of the glass substrate 2. Further, it may be used as a glass base. When the reflected light on the surface of the plate 20 is diffused to reduce the glare caused by the reflected light (anti-glare treatment), the surface of the glass substrate 2 is roughened. When the surface of the glass substrate 20 is roughened, the following are as follows: After the surface roughness (Ra) of the roughened surface is 3 〇 nm or more, the surface of the inorganic insulating film 22 formed thereon that does not contact the glass substrate 2 ( (the inorganic insulating film surface 221) The surface roughness of the surface of the inorganic insulating film 22 is not necessarily the direct surface roughness of the surface 221 of the inorganic insulating film, and the surface roughness of the surface of the glass substrate 2 is not necessarily directly formed by the inorganic insulating film 22. When the surface roughness of the inorganic insulating film 22 is moderated, the surface roughness of the inorganic insulating film surface 221 is not limited to the surface roughness of the surface of the glass substrate 2 (manufacturing method of the inorganic insulating film). The method is not particularly limited, and a known method can be employed, for example, a method in which a specific oxide, a nitride, or an oxynitride is provided on a glass substrate 2 by a vapor deposition method or a non-plating method. For example, plasma nitridation or the like can be used by CVD (Chemical 163953.doc 201249643

Deposition,化學氣相沈積)法而成膜之二氧化矽膜進行氮 化處理而形成氮氧化矽膜’亦可利用電漿氧化法等方法對 藉由CVD法而成膜之氮化矽膜進行氧化處理而形成氮氧化 矽膜。 製造條件係根據所使用之金屬之氧化物、氮化物、氮氧 . 化物而適當選擇最適條件。 <支持板> 支持板3 1與樹脂層32協動,支持並加強附有無機絕緣膜 之玻璃基板24,於裝置之製造步驟中防止附有無機絕緣膜 之玻璃基板24之變形、受傷、破損等。又,使用支持板3 ^ 之目的之一亦在於:於使用與先前相比厚度較薄之附有無 機絕緣膜之玻璃基板24之情形時,製作與先前之玻璃基板 相同厚度之積層體10,藉此可於裝置之製造步驟中使用適 合先前之厚度之玻璃基板的製造技術或製造設備。 作為支持板31,例如使用玻璃板、樹脂板' sus板等金 屬板等i於裝置之製造步驟伴有熱處理之情形時,支持板 31較佳為以與玻璃基板2〇之線膨脹係數之差較小的材料形 成,更佳為以與玻璃基板20相同之材料形成,較佳為支持 — 板31為玻璃板。尤佳為支持板31為包含與玻璃基板2〇之玻 璃基板相同之玻璃材料的玻璃板。 支持板3丨之厚度可厚於玻璃基板2〇,亦可薄於 20。較佳為,根據附有無機絕緣膜之玻璃基板24之厚度、 樹脂層32之厚度、及積層體1〇之厚度而選擇支持板^厚 度例如’現行之裝置之製造步驟係以處理厚度〇5腿之 163953.doc • 19· 201249643 基板之方式而設計,於附有無機絕緣膜之玻璃基板24之厚 度與樹爿a層32之厚度的和為〇·ΐ mm之情形時,將支持板31 之厚度設為0.4 mm »支持板3 1之厚度於通常情況下較佳為 〇·2〜5.0 mm。 於支持板31為玻璃板之情形時,出於易於處理、不易破 裂等理由,玻璃板之厚度較佳為〇.08 mm以上。又,出於 在裝置用構件形成後進行剝離時期望不會破裂而適度彎曲 之剛性之理由,玻璃板之厚度較佳為i 〇 mm以下。 玻璃基板20與支持板31於25〜300 °C下之平均線膨脹係數 (以下簡稱作「平均線膨脹係數」)之差較佳為5〇〇χ1〇.7/β(:α 下’更佳為30〇χ1〇7/Χ:以下,進而較佳為2〇〇χΐ〇-7/。。以 下。若差過大,則存在於裝置之製造步驟中之加熱冷卻 時,積層體10嚴重翹曲,或附有無機絕緣膜之玻璃基板24 與加強板30發生剝離等之可能性。於玻璃基板2〇之材料與 支持板3 1之材料相同之情形時,可抑制此種問題之產生。 <樹脂層> Ο 樹脂層32固定於支持板31上,又,可剝離地密接於附有 無機絕緣膜之玻璃基板24上。樹脂層32防止附有無機絕緣 膜之玻璃基板24之位置偏離直至進行將附有無機絕緣膜之 玻璃基板24與支持板31進行分離之操作,且藉由分離操作 而容易地自附有無機絕緣膜之玻璃基板24剝離,並防止附 有無機絕緣膜之玻璃基板24等因分離操作而破損。又,樹 脂層32固定於支持板31上,於分離操作中並無使樹脂層32 與支持板3 1剝離之虞,藉由分離操作而獲得附有樹脂層之 J63953.doc -20» 201249643 支持板(加強板30)。再者,較佳為,於開始分離操作時於 樹脂層32與無機絕緣膜22之界面設置剝離起點進行剝離, 以使其界面易於藉由分離操作而剝離。 樹脂層32之與無機絕緣膜22相接之表面321可剝離地密 接於無機絕緣膜22之表面221。於本發明中,將該樹脂層 表面321之可容易地剝離之性質稱作剝離性。 於本發明中,上述固定及(可剝離之)密接於剝離強度(即 剝離所需之應力)上存在差異,固定意指相對於密接而剝 離強度較大。又,所謂可剝離之密接,意指可剝離,並且 亦可不使經固定之面發生剝離而剝離。具體而言,意指: 於本發明之積層體10中,於進行使附有無機絕緣膜之玻璃 基板24與支持板31分離之操作之情形時,於密接之面上剝 離,而於固定之面上不剝離。因此,若對積層體丨〇進行使 附有無機絕緣膜之玻璃基板24與支持板3丨分離之操作,則 積層體10分離成附有無機絕緣膜之玻璃基板24與附有樹脂 層之支持板(加強板3 0)兩部分。 樹脂層32較佳為利用接著力或黏著力等較強之結合力而 固定於支持板3 1表面上。例如,藉由使反應硬化性樹脂於 支持板3 1表面上反應硬化,而使硬化之樹脂接著於支持板 31表面上。又,可實施使支持板31表面與樹脂層32間產生 較強之結合力之處理(例如使用偶合劑之處理),而提高支 持板3 1表面與樹脂層32間之結合力。 另一方面’較佳為,樹脂層32以較弱之結合力結合於無 機絕緣膜表面221上,例如以固體分子間之凡得瓦力引起 163953.doc -21· 201249643 之結合力而結合。與無機絕緣膜22相接前之樹脂層表面 321較佳為非附著性之表面’可藉由使該非附著性之樹脂 層表面321與無機絕緣膜表面221接觸,而使兩表面以較弱 之結合力而結合。即,若樹脂層表面321為非附著性,則 與無機絕緣膜表面221之界面中之剝離性變得更佳。兩表 面無間隙地接觸,於本發明中將該狀態稱作密接。 再者’可藉由對通常意義上不為非附著性之樹脂層之表 面賦予非附著性的表面處理而使樹脂層表面成為非附著 性°又’即便為於通常意義上不為非附著性之樹脂層,但 只要為可利用相對於上述固定中之結合力充分較低之結合 力進行密接之樹脂(且只要不發生無機絕緣膜自玻璃基板 上之剝離、附有無機絕緣膜之玻璃基板或支持板之破損等 而可剝離),則可不實施表面處理而用作樹脂層之材料。 尤其疋’於與無機絕緣膜相接之樹脂層表面為非附著性 之情形時’剝離時因樹脂層表面之破損而其一部分殘留於 無機絕緣膜表面上之情況較少,又,因無機絕緣膜之破損 而導致其材料之一部分殘留於樹脂層表面之情況亦較少。 如上所述’樹脂層32對於支持板3 1之表面之結合力與樹 脂層32對於無機絕緣膜表面22丨之結合力相比相對較高。 因此,樹脂層32與支持板3 1之間之剝離強度高於樹脂層32 與附有無機絕緣膜之玻璃基板24之間之剝離強度。樹脂層 32與支持板3 1之間較佳為以黏著或接著而結合。但並不限 定於此’只要與樹脂層32對於附有無機絕緣膜之玻璃基板 24之結合力相比相對較高,則樹脂層32與支持板3丨之間亦 163953.doc -22- 201249643 可藉由其他結合力引起之力而結合。 樹脂層32之大小並無特別限定。樹脂層32之大小與玻璃 基板20或支持板31相比可較大,亦較小。 Μ月曰層32之厚度並無特別限定,較佳為i〜丨〇〇 μηι,更 佳為5〜30 μηι,進而較佳為7〜2〇 μηΐβ其原因在於:若樹 月曰層32之厚度為此種範圍,則樹脂層32與附有無機絕緣膜 之玻璃基板24之密接充分。又,其原因在於:即便氣泡或 異物介在於樹脂層32與附有無機絕緣膜之玻璃基板24之 間,亦可抑制附有無機絕緣膜之玻璃基板24產生變形缺 陷。又,若树脂層32之厚度過厚,則由於形成需要時間及 材料而不經濟。 再者,樹脂層32亦可包含2層以上。於該情形時,「樹脂 層32之厚度」意指所有層之合計厚度。 又,於樹脂層32包含2層以上之情形時,形成各層之樹 脂之種類可不同。 較佳為,樹脂層32包含玻璃轉移點低於室溫(25<t左 右)、或不具有玻璃轉移點之材料。其原因在於:可更容 易地與附有無機絕緣膜之玻璃基板24剝離,同時與附有無 機絕緣膜之玻璃基板24之密接亦變得充分。 又,關於樹脂層32,由於大多在裝置之製造步驟中進行 加熱處理,故而較佳為具有耐熱性。 又,若樹脂層32之彈性模數過高,則存在與附有無機絕 緣膜之玻璃基板24之密接性變低之傾向。另一方面,若樹 脂層3 2之彈性模數過低,則剝離性變低。 163953.doc •23- 201249643 形成樹脂層32之樹脂之種類並無特別限定。例如可列 舉:丙烯酸系樹脂、聚烯烴樹脂、聚胺基曱酸酯樹脂、或 聚矽氧樹脂。亦可將幾種樹脂混合而使用。其中較佳為聚 妙氧树知。其原因在於聚石夕氧樹脂之对熱性或剝離性優 異。又’其原因在於在支持板31為玻璃板之情形時,藉由 與玻璃板表面之矽烷醇基之縮合反應而容易固定於玻璃板 上。聚矽氧樹脂層於介裝於支持板31與附有無機絕緣膜之 玻璃基板24之間之狀態下,即便例如於大氣中於2〇〇c>c左 右下處理1小時左右,剝離性亦幾乎未劣化,就該方面而 言亦較佳》 較佳為,樹脂層32包含聚矽氧樹脂中用於剝離紙用之聚 矽氧樹脂(硬化物)。剝離紙之剝離層之聚矽氧樹脂係使塗 佈於剝離紙上之硬化性聚矽氧樹脂組合物之層硬化而形 成使用該硬化性聚石夕氧樹脂組合物,並包含使該硬化性 聚石夕氧樹脂組合物於支持板31之表面上硬化而形成之硬化 聚石夕氧樹脂的樹脂層接著於支持板31表面上且其自由表面 具有優異之非附著纟’因此較佳。又,由於柔軟性較高, 故而即便於樹脂層32與附有無機絕緣膜之玻璃基板24之間 混入氣泡或塵芥等異物,亦可抑制附有無機絕緣膜之玻璃 基板24產生變形缺陷。 關於為形成此種㈣紙等之_層而制之硬化性聚石夕 氧樹脂組合物,根據其硬化機制而分類為縮合反應型聚石夕 氧樹脂組合物、加成反應型⑭氧樹脂k合物、紫外線硬 化型聚石夕氧樹脂組合物及電子束硬化型聚石夕氧樹脂組合 163953.doc •24· 201249643 物,可使用任一者。該等之中較佳為加成反應型聚石夕氧樹 脂組合物。其原因在於:硬化反應之進行容易度、硬化後 之樹脂層表面321之非附著性之程度良好,耐熱性亦較 高。 加成反應型聚石夕氧樹脂組合物係包含主劑及交聯劑、並 於鉑系觸媒等觸媒之存在下進行硬化之硬化性的組合物。 加成反應型聚矽氧樹脂組合物之硬化藉由加熱處理而受到 促進加成反應型聚^夕氧樹脂組合物中之主劑較佳為具有 鍵、,’σ於矽原子上之烯基(乙烯基等)之有機聚矽氧烷(即有機 烯基聚矽氧烷。再者,較佳為直鏈狀),且烯基等為交聯 點加成反應型聚碎氧樹脂組合物中之交聯劑較佳為具有 鍵結於矽原子上之氫原子(氫矽烷基)之有機聚矽氧烷(即有 機氫聚石夕氧炫。再者,較佳為直鏈狀),且氫石夕烧基等為 交聯點。 加成反應型聚矽氧樹脂組合物藉由主劑與交聯劑之交聯 點進行加成反應而硬化。 又’為形成剝離紙等之剝離層而使用之硬化性聚石夕氧樹 脂組合物於形態上存在溶劑型、乳夥型及無溶劑型,可使 用任-型。該等之中較佳為無溶劑型。其原因在於生產 性、安全性、環境特性方面較為優異。又,其原因在於: 於形成樹脂層32時之硬化時,即,於加熱硬化、紫外線硬 化或電子束硬化時,不包含產生發泡之溶劑,因此樹脂層 3 2中不易殘留氣泡。 又’作為為形成剝離紙等之剝離層而使用之硬化性聚矽 163953.doc -25· 201249643 氧樹脂組合物,具體作為市售之商品名或型號,可列舉: KNS-;320A、KS-847(均為 Shin-Etsu Silicones公司製造)、 TPR6700(Momentive Performance Materials Japan有限公司 製造)、乙烯基聚矽氧「8500」(荒川化學工業公司製造)與 甲基氫聚石夕氧烧「1203丨」(荒川化學工業公司製造)之組 合、乙烯基聚矽氧「11364」(荒川化學工業公司製造)與甲 基氫聚石夕氧烷「12031」(荒川化學工業公司製造)之組合、 乙烯基聚矽氧「1 1365」(荒川化學工業公司製造)與甲基氫 聚石夕氧烧「12031」(荒川化學工業公司製造)之組合等。 再者,KNS-320A、KS-847及TPR6700係預先含有主劑 與交聯劑之硬化性聚矽氧樹脂組合物。 又,形成樹脂層32之聚矽氧樹脂(上述硬化性聚矽氧樹 脂組合物之硬化物)較佳為具有聚矽氧樹脂層中之低分子 罝之聚石夕氧專成分難以向附有無機絕緣膜之玻璃基板Μ轉 移之性質,即低聚矽氧轉移性。 (樹脂層之製造方法) 將樹脂層32固定於支持板3 1上之方法並無特別限定,例 如較佳為,於支持板31表面上形成作為樹脂層32之硬化性 樹脂組合物之層,繼而使該硬化性樹脂組合物硬化而形成 樹脂層32,以此方法形成固定於支持板31上之樹脂層32。 又,例如’亦可利用將膜狀之樹脂固定於支持板3丨之表 面上的方法形成樹脂層32。具體而言,可列舉如下方法. 為對支持板31之表面賦予對於膜之表面之較高固定力(高 剝離強度),而對支持板31之表面進行表面改質處理(引發 163953.doc •26· 201249643 處理)’使其固定於支持姑^ 1 p 又符板3 1上。例如可例示:矽烷偶合 劑之類之化學性地揾古田> a α v 干I也杈阿固定力的化學方法(底塗處理),火 焰處理之類之增加表面活性基之物理方法,喷砂處理之類 之藉由增大表面之粗键度而增大阻力之機械處理方法等。 於在支持板3 1表面上形成作為樹脂層32之硬化性樹脂組 合物之層’繼而使該硬化性樹脂組合物硬化而形成樹脂層 32之方法中’作為於支持板31表面上形成硬化性樹脂組合 物之層之方法,例如可列舉將硬化性樹脂組合物塗佈於支 持板31上之方法^作為塗佈之方法,可列舉:f塗法、模 塗法旋塗法、改塗法、輥塗法、棒塗法、網版印刷法、 凹版印刷塗佈法等。可根據樹脂組合物之種類而自此種方 法中適當選擇。 又,於作為樹脂層32之硬化性樹脂組合物塗佈於支持板 31上之情形時,其塗佈量較佳為1〜1〇〇 g/m2,更佳為5〜 20 g/m2。 例如,於由加成反應型聚矽氧樹脂組合物形成樹脂層32 之情形時,將包含有機烯基聚矽氧烷、有機氫聚矽氧烷及 觸媒之混合物之硬化性樹脂組合物藉由上述喷塗法等公知 之方法塗佈於支持板3 1上,此後使其加熱硬化。加熱硬化 條件根據觸媒之調配5而不同,例如,於相對於有機烤基 聚矽氧烷與有機氫聚矽氧烷之合計量1〇〇質量份而調配鉑 系觸媒2質量份之情形時,於大氣中於5〇。〇〜25〇〇c下、較 佳為於100 C〜200°C下使其發生反應。又,將該情形時之 反應時間設為5〜60分鐘,較佳為設為1〇〜3〇分鐘。 163953.doc -27- 201249643 藉由使硬化性樹脂組合物加熱硬化,而於硬化反應時聚 石夕氧樹脂與支持板3i化學性地結合,又,藉由定錨效應而 聚矽氧樹脂層與支持板3 1結合並接著。藉由該等作用,聚 石夕氧樹脂層牢固地固定於支持板31上。再者,即便於由硬 化性樹脂組合物形成包含除聚矽氧樹脂以外之樹脂的樹脂 層之情形時,亦可利用與上述相同之方法形成固定於支持 板31上之樹脂層32。 <積層體及積層體之製造方法> 本發明之積層體10如上所述,係於附有無機絕緣膜之玻 璃基板24與支持板31之間存在樹脂層32之積層體。 本發明之積層發5之製造方法並無特別限制,通常較佳為 如下方法:準備附有無機絕緣膜之玻璃基板24及藉由上述 方法所製作之附有樹脂層之支持板(加強板3〇),並以附有 無機絕緣膜之玻璃基板24之無機絕緣膜之面與上述附有樹 脂層之支持板(加強板3〇)之樹脂層表面作為積層面而使兩 者積層。於樹脂層32之積層面具有非附著性之情形時,可 藉由通常之重合與加壓,而容易地使兩者可剝離地密接。 具體而言’例如可列舉如下方法:於常壓環境下使附有 無機絕緣膜之玻璃基板24重疊於樹脂層3 2之非附著性表面 上後’使用輥或加壓機使樹脂層32與附有無機絕緣膜之玻 璃基板24壓著。藉由利用輥或加壓機進行壓著而使樹脂層 32與附有無機絕緣膜之玻璃基板24進一步密接,因此較 佳°又’藉由利用輥或加壓機之壓著,而相對易於去除混 入樹脂層32與附有無機絕緣膜之玻璃基板24之間之氣泡, 163953.doc •28· 201249643 因此較佳。 若藉由真空層壓法或真空擠壓法進行壓著,則較佳地抑 制氣泡之混入或確保良好之密接,因此更佳。藉由於真空 下進行壓著,亦存在如下優點:即便於殘存有微小之氣泡 之情形時,氣泡不會藉由加熱而成長,不易導致附有無機 絕緣膜之玻璃基板24之變形缺陷。 於使樹脂層32可剝離地密接於附有無機絕緣膜之玻璃基 板24上時,較佳為充分地清洗樹脂層32及附有無機絕緣膜 之玻璃基板24之相互接觸之側之面,於潔淨度較高之環境 下進行積層。即便於樹脂層32與附有無機絕緣膜之破璃基 板24之間混入異物,亦由於樹脂層32發生變形故而不會對 附有無機絕緣膜之玻璃基板2 4之表面之平坦性造成影響, 但潔淨度越高其平坦性越良好,因此較佳。 本發明之積層體1 〇可用於各種用途中,例如可列舉製造 後述顯示裝置用面板、PV、薄膜2次電池、表面形成有電 路之半導體晶圓等電子零件之用途等。再者,於該用途 中’積層體10暴露於高溫條件(例如32(TC以上)下(例如j小 時以上)之情形較多。 此處,所謂顯示裝置用面板,包括LCD、OLED、電子 紙、電漿顯示面板、場發射面板、量子點LED面板、 MEMS(MICR0 ELECTRO MECHANICAL SYSTEMS,微機 電系統)快門面板等。 <附有支持板之顯示裝置用面板及附有支持板之顯示裝置 用面板之製造方法> 163953.doc -29- 201249643 於本發明中 置用面板。 使用上述積層體製造附有支持板之顯示裝 圖2係本發明之附有支持板 模式剖面圖。 之顯示裝置用 面板之一例之 附有支持板之顯示裝詈用Deposition, chemical vapor deposition) The ruthenium dioxide film formed by nitridation is formed into a ruthenium oxynitride film. The ruthenium nitride film formed by CVD can also be formed by a plasma oxidation method. Oxidation treatment forms a ruthenium oxynitride film. The production conditions are appropriately selected depending on the oxide, nitride, and oxynitride of the metal to be used. <Support Plate> The support plate 31 and the resin layer 32 cooperate to support and reinforce the glass substrate 24 with the inorganic insulating film, and prevent deformation and injury of the glass substrate 24 with the inorganic insulating film in the manufacturing process of the device. , damage, etc. Further, one of the purposes of using the support plate 3^ is to produce a laminate 10 having the same thickness as the previous glass substrate when using a glass substrate 24 with an inorganic insulating film which is thinner than before. Thereby, manufacturing techniques or manufacturing equipment suitable for the glass substrate of the previous thickness can be used in the manufacturing steps of the device. As the support plate 31, for example, when a metal plate such as a glass plate or a resin plate is used, and the manufacturing process of the device is accompanied by heat treatment, the support plate 31 preferably has a difference in linear expansion coefficient from the glass substrate 2 The smaller material is formed, more preferably formed of the same material as the glass substrate 20, and preferably the support plate 31 is a glass plate. More preferably, the support plate 31 is a glass plate containing the same glass material as the glass substrate of the glass substrate. The thickness of the support plate 3 can be thicker than the glass substrate 2 〇, and can be thinner than 20. Preferably, the support plate thickness is selected according to the thickness of the glass substrate 24 with the inorganic insulating film, the thickness of the resin layer 32, and the thickness of the laminate body 1 such as the manufacturing process of the current device to process the thickness 〇5. 163953.doc • 19·201249643 The design of the substrate is such that when the sum of the thickness of the glass substrate 24 with the inorganic insulating film and the thickness of the tree layer a layer 32 is 〇·ΐ mm, the support plate 31 is used. The thickness is set to 0.4 mm. » The thickness of the support plate 3 1 is preferably 〇 2 to 5.0 mm in general. In the case where the support plate 31 is a glass plate, the thickness of the glass plate is preferably 〇.08 mm or more for reasons of easy handling, difficulty in cracking, and the like. Further, the thickness of the glass sheet is preferably i 〇 mm or less for the reason that it is desired to be rigidly bent without being broken when the device member is formed after peeling. The difference between the average linear expansion coefficient of the glass substrate 20 and the support plate 31 at 25 to 300 ° C (hereinafter referred to as "average linear expansion coefficient") is preferably 5 〇〇χ 1 〇.7 / β (: α下' Preferably, it is 30 〇χ 1 〇 7 / Χ: the following, and further preferably 2 〇〇χΐ〇 -7 /.. If the difference is too large, the laminate 10 is severely warped when heated and cooled in the manufacturing steps of the apparatus. The curvature of the glass substrate 24 with the inorganic insulating film and the reinforcing plate 30 may be peeled off, etc. When the material of the glass substrate 2 is the same as the material of the support plate 31, such a problem can be suppressed. <Resin Layer> The resin layer 32 is fixed to the support plate 31, and is detachably adhered to the glass substrate 24 to which the inorganic insulating film is attached. The resin layer 32 prevents the position of the glass substrate 24 to which the inorganic insulating film is attached. The operation of separating the glass substrate 24 with the inorganic insulating film from the support plate 31 is performed, and the glass substrate 24 to which the inorganic insulating film is attached is easily peeled off by the separating operation, and the inorganic insulating film is prevented from being attached. The glass substrate 24 or the like is broken by the separation operation. The resin layer 32 is fixed to the support plate 31, and in the separation operation, the resin layer 32 is not peeled off from the support plate 31, and a J63953.doc -20» 201249643 support plate with a resin layer is obtained by a separating operation ( Further, it is preferable that the peeling origin is provided at the interface between the resin layer 32 and the inorganic insulating film 22 at the time of starting the separation operation to be peeled off, so that the interface is easily peeled off by the separating operation. The surface 321 which is in contact with the inorganic insulating film 22 is peelably adhered to the surface 221 of the inorganic insulating film 22. In the present invention, the property of the surface of the resin layer 321 which can be easily peeled off is referred to as releasability. The above-mentioned fixing and (peelable) are intimately adhered to the peeling strength (that is, the stress required for peeling), and the fixing means that the peeling strength is large with respect to the close contact. Further, the peelable close contact means peelable. Further, it is also possible to peel off the surface to be fixed without peeling off. Specifically, it means that the operation of separating the glass substrate 24 with the inorganic insulating film from the support plate 31 is performed in the laminated body 10 of the present invention. In this case, the surface is peeled off on the surface to be adhered, and the surface is not peeled off on the surface to be fixed. Therefore, if the laminated body is subjected to an operation of separating the glass substrate 24 with the inorganic insulating film and the support plate 3, the laminate is laminated. The body 10 is separated into a glass substrate 24 with an inorganic insulating film and a support plate (reinforcing plate 30) with a resin layer. The resin layer 32 is preferably fixed by a strong bonding force such as an adhesive force or an adhesive force. On the surface of the support plate 31, for example, the reaction-hardening resin is hardened by reaction on the surface of the support plate 31, so that the hardened resin is adhered to the surface of the support plate 31. Further, the surface of the support plate 31 can be implemented. The treatment for generating a strong bonding force between the resin layers 32 (for example, treatment using a coupling agent) improves the bonding force between the surface of the support sheet 31 and the resin layer 32. On the other hand, it is preferable that the resin layer 32 is bonded to the surface of the inorganic insulating film 221 with a weak bonding force, for example, by the bonding force of 163953.doc -21·201249643 by the van der Waals force between the solid molecules. The surface 321 of the resin layer before the contact with the inorganic insulating film 22 is preferably a non-adhesive surface ′ by making the non-adhesive resin layer surface 321 contact the inorganic insulating film surface 221, so that the two surfaces are weaker. Combine with force. That is, when the surface 321 of the resin layer is non-adhesive, the peeling property at the interface with the surface 221 of the inorganic insulating film is further improved. The two surfaces are in contact without a gap, and this state is referred to as a close contact in the present invention. Furthermore, the surface of the resin layer can be made non-adhesive by surface treatment which imparts non-adhesiveness to the surface of the resin layer which is not normally non-adhesive, and it is not non-adhesive in the usual sense. The resin layer is a resin which can be adhered to with a bonding force which is sufficiently low with respect to the bonding strength in the above-described fixing (and as long as the inorganic insulating film is not peeled off from the glass substrate, the glass substrate with the inorganic insulating film is not formed) Further, if the support sheet is peeled off or the like, it can be peeled off, and the surface treatment can be used as the material of the resin layer. In particular, when the surface of the resin layer that is in contact with the inorganic insulating film is non-adhesive, it is less likely to remain on the surface of the inorganic insulating film due to the breakage of the surface of the resin layer during peeling, and also because of inorganic insulation. The damage of the film causes a part of the material to remain on the surface of the resin layer to be less. As described above, the bonding force of the resin layer 32 to the surface of the support sheet 31 is relatively higher than the bonding strength of the resin layer 32 to the inorganic insulating film surface 22. Therefore, the peeling strength between the resin layer 32 and the support sheet 31 is higher than the peel strength between the resin layer 32 and the glass substrate 24 to which the inorganic insulating film is attached. Preferably, the resin layer 32 and the support plate 31 are bonded or joined together. However, it is not limited to this as long as the bonding strength of the resin layer 32 to the glass substrate 24 with the inorganic insulating film is relatively high, and the resin layer 32 and the support plate 3丨 are also 163953.doc -22- 201249643 It can be combined by the force caused by other bonding forces. The size of the resin layer 32 is not particularly limited. The size of the resin layer 32 can be larger and smaller than that of the glass substrate 20 or the support plate 31. The thickness of the ruthenium layer 32 is not particularly limited, and is preferably i~丨〇〇μηι, more preferably 5 to 30 μηι, and further preferably 7 to 2 〇μηΐβ because the tree layer is 32 When the thickness is in this range, the resin layer 32 is sufficiently adhered to the glass substrate 24 with the inorganic insulating film. Further, the reason is that even if bubbles or foreign matter are interposed between the resin layer 32 and the glass substrate 24 with the inorganic insulating film, the glass substrate 24 with the inorganic insulating film can be prevented from being deformed by deformation. Further, if the thickness of the resin layer 32 is too thick, it is uneconomical to form a time and material. Further, the resin layer 32 may also contain two or more layers. In this case, "thickness of the resin layer 32" means the total thickness of all the layers. Further, when the resin layer 32 contains two or more layers, the types of the resins forming the respective layers may be different. Preferably, the resin layer 32 comprises a material having a glass transition point lower than room temperature (25 <t<t) or having no glass transition point. The reason for this is that the glass substrate 24 with the inorganic insulating film is more easily peeled off, and the adhesion to the glass substrate 24 with the inorganic insulating film is also sufficient. Further, since the resin layer 32 is often subjected to heat treatment in the manufacturing process of the apparatus, it is preferable to have heat resistance. Further, when the elastic modulus of the resin layer 32 is too high, the adhesion to the glass substrate 24 with the inorganic insulating film tends to be low. On the other hand, if the elastic modulus of the resin layer 32 is too low, the peeling property is lowered. 163953.doc •23- 201249643 The type of the resin forming the resin layer 32 is not particularly limited. For example, an acrylic resin, a polyolefin resin, a polyamino phthalate resin, or a polyoxyxylene resin can be listed. Several resins can also be used in combination. Among them, it is preferred to know the polyoxo tree. The reason for this is that the polysulfide resin is excellent in heat or peelability. Further, the reason is that when the support plate 31 is a glass plate, it is easily fixed to the glass plate by a condensation reaction with a stanol group on the surface of the glass plate. In a state in which the polyoxyxylene resin layer is interposed between the support sheet 31 and the glass substrate 24 with the inorganic insulating film, the peeling property is also treated for about 1 hour at about 2 ° C > c in the atmosphere, for example. It is preferable that it is hardly deteriorated in this respect. It is preferable that the resin layer 32 contains a polyoxyl resin (hardened material) for a release paper in a polyoxyxylene resin. The polyoxyxene resin of the release layer of the release paper is formed by curing the layer of the curable polyoxynoxy resin composition coated on the release paper to form the curable polyoxo resin composition, and comprising the curable poly The resin layer of the hardened polyoxo resin formed by hardening the surface of the support layer 31 on the surface of the support sheet 31 is then adhered to the surface of the support sheet 31 and its free surface has excellent non-adhering enthalpy, which is preferable. Further, since the flexibility is high, even if foreign matter such as bubbles or dust mustard is mixed between the resin layer 32 and the glass substrate 24 with the inorganic insulating film, the glass substrate 24 with the inorganic insulating film can be prevented from being deformed. The curable polyoxo resin composition prepared to form the layer of the (four) paper or the like is classified into a condensation reaction type polyoxo resin composition and an addition reaction type 14 oxygen resin k according to the hardening mechanism. Any of the compounds, the ultraviolet curable polycities, and the electron beam curable polyoxo resin 163953.doc • 24·201249643, any of them can be used. Among these, an addition reaction type polyoxo resin composition is preferred. The reason for this is that the ease of the curing reaction and the degree of non-adhesion of the surface 321 of the resin layer after curing are good, and the heat resistance is also high. The addition-reaction type polyoxo resin composition is a curable composition which is cured by the presence of a host agent and a crosslinking agent in the presence of a catalyst such as a platinum-based catalyst. The hardening of the addition reaction type polyoxyxene resin composition is subjected to heat treatment to promote the addition reaction type. The main component in the polyoxygen resin composition preferably has a bond, 'σ on the fluorene atom. (vinyl or the like) of an organic polyoxyalkylene (i.e., an organic alkenyl polyoxyalkylene. Further, preferably linear), and an alkenyl group or the like is a crosslinking point addition reaction type polyoxyethylene resin composition. The crosslinking agent is preferably an organic polyoxane having a hydrogen atom (hydroalkylene group) bonded to a halogen atom (ie, an organic hydrogen polyoxo. Further, preferably a linear chain). And the hydrogenstone base is a crosslinking point. The addition reaction type polyoxymethylene resin composition is hardened by an addition reaction of a crosslinking point of a main agent and a crosslinking agent. Further, the curable polyoxo resin composition used for forming the release layer such as release paper may be in the form of a solvent type, a nipple type, or a solventless type, and any type may be used. Among these, it is preferably a solventless type. The reason is that it is excellent in terms of productivity, safety, and environmental characteristics. Further, the reason for this is that, in the case of curing at the time of forming the resin layer 32, that is, in the case of heat curing, ultraviolet curing, or electron beam curing, the solvent which causes foaming is not contained, and therefore bubbles are less likely to remain in the resin layer 32. Further, 'the curable polycondensation 163953.doc -25·201249643 oxygen resin composition used for forming a release layer such as release paper, specifically, as a commercially available product name or model, KNS-; 320A, KS- 847 (both manufactured by Shin-Etsu Silicones Co., Ltd.), TPR6700 (manufactured by Momentive Performance Materials Japan Co., Ltd.), vinyl polyoxylium "8500" (manufactured by Arakawa Chemical Industries Co., Ltd.), and methyl hydrogen polychlorite "1203丨" Combination of vinyl polyoxynium "11364" (made by Arakawa Chemical Industries Co., Ltd.) and methyl hydrogen polyoxomethoxane "12031" (made by Arakawa Chemical Industries Co., Ltd.), vinyl A combination of polyoxylium "1 1365" (manufactured by Arakawa Chemical Industries Co., Ltd.) and methyl hydrogen polysulfide "12031" (manufactured by Arakawa Chemical Industries, Ltd.). Further, KNS-320A, KS-847 and TPR6700 are preliminarily containing a curable polyoxyxylene resin composition of a main component and a crosslinking agent. Further, the polyfluorene oxide resin (the cured product of the curable polyanthracene resin composition) forming the resin layer 32 is preferably a compound having a low molecular weight in the polyoxynoxy resin layer, which is difficult to be attached thereto. The property of the glass substrate Μ transfer of the inorganic insulating film, that is, oligomeric oxime transfer property. (Manufacturing Method of Resin Layer) The method of fixing the resin layer 32 to the support sheet 31 is not particularly limited. For example, it is preferable to form a layer of a curable resin composition as the resin layer 32 on the surface of the support sheet 31. Then, the curable resin composition is cured to form the resin layer 32, and the resin layer 32 fixed to the support sheet 31 is formed in this manner. Further, for example, the resin layer 32 may be formed by a method of fixing a film-like resin to the surface of the support sheet 3 . Specifically, the following method can be mentioned. In order to impart a high fixing force (high peel strength) to the surface of the support sheet 31 to the surface of the support sheet 31, the surface of the support sheet 31 is surface-modified (initiated 163953.doc • 26· 201249643 Processing) 'Make it fixed on the support board 1 1 p and on the board 3 1 . For example, a chemical method such as a decane coupling agent, a 揾古田> a α v a dry I chemical method (primer treatment), a physical method of increasing a surface active group such as a flame treatment, spray A mechanical treatment method or the like which increases the resistance by increasing the coarseness of the surface by sand treatment or the like. In the method of forming the layer of the curable resin composition as the resin layer 32 on the surface of the support sheet 31 and then curing the curable resin composition to form the resin layer 32, 'curing property is formed on the surface of the support sheet 31. The method of the layer of the resin composition is, for example, a method of applying the curable resin composition onto the support sheet 31. The method of coating is, for example, f coating method, die coating method, and coating method. , roll coating, bar coating, screen printing, gravure coating, etc. It can be appropriately selected from such a method depending on the kind of the resin composition. Further, when the curable resin composition as the resin layer 32 is applied onto the support sheet 31, the coating amount thereof is preferably from 1 to 1 g/m2, more preferably from 5 to 20 g/m2. For example, in the case where the resin layer 32 is formed from the addition reaction type polyoxyxylene resin composition, a curable resin composition containing a mixture of an organic alkenyl polysiloxane, an organic hydrogen polyoxyalkylene, and a catalyst is used. It is applied to the support sheet 31 by a known method such as the above-described spraying method, and thereafter heat-hardened. The heat-hardening condition differs depending on the preparation 5 of the catalyst. For example, when the platinum-based catalyst is blended in an amount of 1 part by mass based on the total amount of the organic baking polysiloxane and the organic hydrogen polyoxyalkylene oxide, 2 parts by mass of the platinum-based catalyst is blended. At 5 于 in the atmosphere. It is preferably 〇~25〇〇c, preferably reacted at 100 C to 200 °C. Further, the reaction time in this case is 5 to 60 minutes, preferably 1 to 3 minutes. 163953.doc -27- 201249643 By thermally hardening the curable resin composition, the polyoxin resin is chemically bonded to the support plate 3i during the hardening reaction, and further, the polyoxyl resin layer is formed by the anchoring effect. Combined with the support board 31 and then. By these actions, the polyoxo resin layer is firmly fixed to the support plate 31. Further, even in the case where a resin layer containing a resin other than the polyoxynoxy resin is formed from the hard resin composition, the resin layer 32 fixed to the support sheet 31 can be formed by the same method as described above. <Manufacturing Method of Laminated Body and Laminated Body> As described above, the laminated body 10 of the present invention is a laminated body in which the resin layer 32 is present between the glass substrate 24 with the inorganic insulating film and the support plate 31. The manufacturing method of the laminated hair 5 of the present invention is not particularly limited, and it is generally preferred to prepare a glass substrate 24 with an inorganic insulating film and a support plate with a resin layer produced by the above method (reinforcing plate 3) Further, the surface of the inorganic insulating film of the glass substrate 24 with the inorganic insulating film and the surface of the resin layer of the above-mentioned support layer (reinforcing plate 3) with the resin layer are laminated as a layer. In the case where the layer of the resin layer 32 has non-adhesion properties, it is possible to easily peelably adhere the two by conventional superposition and pressurization. Specifically, for example, a method in which the glass substrate 24 with the inorganic insulating film is superposed on the non-adhesive surface of the resin layer 32 in a normal pressure environment is used, and the resin layer 32 is formed by using a roll or a press machine. The glass substrate 24 with an inorganic insulating film is pressed. The resin layer 32 is further adhered to the glass substrate 24 with the inorganic insulating film by pressing with a roll or a press, so that it is relatively easy to use by pressing with a roller or a press machine. The bubble between the resin layer 32 and the glass substrate 24 with the inorganic insulating film is removed, and is preferably 163953.doc • 28· 201249643. If the pressing is carried out by a vacuum lamination method or a vacuum extrusion method, it is preferable to suppress the incorporation of bubbles or to ensure good adhesion. By pressing under vacuum, there is also an advantage that even in the case where minute bubbles remain, the bubbles do not grow by heating, and deformation defects of the glass substrate 24 with the inorganic insulating film are less likely to occur. When the resin layer 32 is detachably adhered to the glass substrate 24 with the inorganic insulating film, it is preferable to sufficiently clean the side of the resin layer 32 and the glass substrate 24 with the inorganic insulating film on the side in contact with each other. Lamination is carried out in a clean environment. That is, the foreign matter is mixed between the resin layer 32 and the glass substrate 24 with the inorganic insulating film, and the resin layer 32 is not deformed, so that the flatness of the surface of the glass substrate 24 with the inorganic insulating film is not affected. However, the higher the degree of cleanliness, the better the flatness, and therefore it is preferred. The laminated body 1 of the present invention can be used in various applications, and examples thereof include the use of an electronic component such as a panel for a display device to be described later, a PV, a secondary battery, and a semiconductor wafer having a circuit formed thereon. Further, in this application, the laminate 10 is exposed to high temperature conditions (for example, 32 (TC or more) (for example, j hours or more). Here, the panel for a display device includes an LCD, an OLED, and an electronic paper. , plasma display panel, field emission panel, quantum dot LED panel, MEMS (MICR0 ELECTRO MECHANICAL SYSTEMS, MEMS) shutter panel, etc. <Display panel for display device with support plate and display device with support plate [Manufacturing Method of Panel] 163953.doc -29- 201249643 A panel is used in the present invention. A display panel with a support plate is manufactured using the above laminated body. FIG. 2 is a cross-sectional view showing a support plate pattern of the present invention. A display panel with a support plate as an example of a panel

一 V置用面板4〇包括上述積層體1〇、與 示裝置用面板之構成構件5〇。 (顯示裝置用面板之構成構件) 所明顯不裝置用面板之構成構件5〇,例如於使用玻璃基 板之LCD、〇LED等顯示裝置中,係指形成於玻璃基板上 之構件或其一部分。例如’於lcd、等顯示裝置 中,於基板之表面上形成TFT陣列(以下簡稱作「陣 列」)保-蒦層、每> 色據光片、液晶、包含ιτ〇(ΐη—Μ ThThe V-use panel 4A includes the above-described laminated body 1A and the constituent members 5 of the panel for a display device. (Constituent members of the panel for a display device) The constituent members of the panel for the display device are not particularly used. For example, in a display device such as an LCD using a glass substrate or a 〇LED, it means a member formed on a glass substrate or a part thereof. For example, in a display device such as lcd or the like, a TFT array (hereinafter simply referred to as "array") is formed on the surface of the substrate, and each of the light-emitting sheets, liquid crystals, and ιτ〇 (ΐη-Μ Th) are formed on the surface of the substrate.

Oxides’氧化銦錫)之透明電極等、各種電路圖案等構件, 或將該等組合而成者。上述陣列中所使用之半導體材料並 無特別限定,例如可列舉:非晶、微晶、多晶等石夕,A member such as a transparent electrode of Oxides' indium tin oxide or the like, or a combination of various circuit patterns, or the like. The semiconductor material used in the above array is not particularly limited, and examples thereof include amorphous, microcrystalline, and polycrystalline.

ZnO、IGZ0等金屬氧化物,噻吩衍生物、稠五笨衍生物等 有機物等。又,例如於包含OLED之顯示裝置中,可列舉 形成於基板上之透明電極、電洞注入層、電洞傳輸層、發 光層、電子傳輸層等- 上述附有支持板之顯示裝置用面板4〇之製造方法並無特 別限疋’根據顯示裝置用面板之構成構件之種類,利用先 前公知之方法,於積層體10之附有無機絕緣膜之玻璃基板 24表面上形成顯示裝置用面板之構成構件5〇。 例如,以製造OLED之情形為例’為於積層體1〇之附有 163953.doc •30· 201249643 無機絕緣膜之玻璃基板24之與樹脂層32側相反側之表面 (相當於玻璃基板20之第2主面202)上形成有機EL構造體, 而進行各種層形成或處理:形成透明電極,進而於形成有 透明電極之面上蒸鍍電洞注入層、電洞傳輸層、發光層、 電子傳輸層等’形成背面電極’使用密封板進行密封等。 作為該等層形成或處理,具體而言,例如可列舉:.成膜處 理、蒸鍍處理、密封板之接著處理等。該等構成構件之形 成亦可為顯示裝置用面板所必需之所有構成構件之形成中 之一部分。於該情形時,將該形成有一部分構成構件之附 有無機絕緣膜之玻璃基板24自加強板30上分離後,於附有 無機絕緣膜之玻璃基板24上形成剩餘之構成構件,而製造 顯示裝置用面板。 <顯示裝置用面板及顯示裝置用面板之製造方法> 本發明之顯示裝置用面板60如圖2所示,包括附有無機 絕緣膜之玻璃基板24與顯示裝置用面板之構成構件50。 關於顯示裝置用面板60,自附有支持板之顯示裝置用面 板40上使無機絕緣膜22與樹脂層32之界面發生剝離,使附 有無機絕緣臈之玻璃基板24與加強板30分離而獲得。 再者,於經分離之附有無機絕緣膜之玻璃基板24上之構 成構件為顯示裝置用面板所必需之所有構成構件之形成中 之一部分的情形時’此後於附有無機絕緣膜之玻璃基板24 上形成剩餘之構成構件’從而製造顯示裝置用面板6 〇。 使無機絕緣膜22與樹脂層32之剝離性表面剝離之方法並 無特別限定。但是’較佳為首先於無機絕緣膜22與樹脂層 163953.doc 31 201249643 32之界面上形成剝離起點而剝離。具體而言,例如較佳 為,於無機絕緣膜22與樹脂層32之界面中插入銳利之刀狀 者而造成剝離之開端,此後喷附水與壓縮空氣之混合流體 而使其剝離。 再者’於自附有支持板之顯示裝置用面板4〇上分離顯示 裝置用面板60後,亦可視需要而於顯示裝置用面板6〇中之 附有無機絕緣膜之玻璃基板24之無機絕緣膜22上另外設置 顯示裝置用面板之構成構件。 又,經分離之加強板30可與新附有無機絕緣膜之玻璃基 板積層’而製造本發明之積層體1〇。作為該新積層體1〇之 製造方法,較佳為上述本發明之製造方法。 <顯示裝置> 又’可由此種顯示裝置用面板6〇而獲得顯示裴置。作為 顯示裝置’可列舉:LCD、OLED。作為LCD,可列舉: TN(Twisted Nematic ’ 扭轉向列)型、sTN(Super TwistedMetal oxides such as ZnO and IGZ0, organic compounds such as thiophene derivatives and condensed penta derivatives. Further, for example, a display device including an OLED includes a transparent electrode, a hole injection layer, a hole transport layer, a light-emitting layer, an electron transport layer, and the like formed on a substrate - the above-described display device panel 4 with a support plate The manufacturing method of the enamel is not particularly limited to the formation of a panel for a display device on the surface of the glass substrate 24 with the inorganic insulating film on the laminated body 10 by a conventionally known method according to the type of the constituent members of the panel for a display device. Member 5〇. For example, in the case of manufacturing an OLED, the surface of the glass substrate 24 of the inorganic insulating film on the side opposite to the side of the resin layer 32 (corresponding to the glass substrate 20) is attached to the laminated body 1 163953.doc • 30·201249643 An organic EL structure is formed on the second main surface 202), and various layers are formed or processed: a transparent electrode is formed, and a hole injection layer, a hole transport layer, a light-emitting layer, and an electron are deposited on the surface on which the transparent electrode is formed. The transfer layer or the like 'forms the back electrode' is sealed using a sealing plate or the like. Specific examples of the formation or treatment of the layers include a film formation treatment, a vapor deposition treatment, and a subsequent treatment of a sealing plate. The formation of the constituent members may also be part of the formation of all of the constituent members necessary for the panel for a display device. In this case, the glass substrate 24 with the inorganic insulating film formed with a part of the constituent members is separated from the reinforcing plate 30, and the remaining constituent members are formed on the glass substrate 24 with the inorganic insulating film, and the display is manufactured. Panel for the device. <Manufacturing Method of Panel for Display Device and Panel for Display Device> As shown in Fig. 2, the panel 60 for a display device of the present invention includes a glass substrate 24 with an inorganic insulating film and a member 50 for a panel for a display device. In the panel 60 for a display device, the interface between the inorganic insulating film 22 and the resin layer 32 is peeled off from the panel 40 for a display device to which the support plate is attached, and the glass substrate 24 with the inorganic insulating tape is separated from the reinforcing plate 30 to obtain . In the case where the constituent member on the glass substrate 24 with the inorganic insulating film separated is a part of the formation of all the constituent members necessary for the panel for a display device, the glass substrate with the inorganic insulating film is attached thereafter. The remaining constituent members ' are formed on 24 to manufacture the panel 6 for display devices. The method of peeling off the peeling surface of the inorganic insulating film 22 from the resin layer 32 is not particularly limited. However, it is preferable to form a peeling starting point and peel off at the interface between the inorganic insulating film 22 and the resin layer 163953.doc 31 201249643 32. Specifically, for example, it is preferable to insert a sharp blade into the interface between the inorganic insulating film 22 and the resin layer 32 to cause the opening of the peeling, and thereafter, the mixed fluid of the water and the compressed air is sprayed and peeled off. In addition, after the panel 60 for the display device is separated from the panel 4 for the display device to which the support panel is attached, the inorganic insulating film-attached glass substrate 24 may be optionally used in the panel 6 of the display device. A constituent member of the panel for a display device is additionally provided on the film 22. Further, the separated reinforcing plate 30 can be laminated with a glass substrate having a new inorganic insulating film to fabricate the laminated body 1 of the present invention. As a method of producing the new layered product, the above-described production method of the present invention is preferred. <Display device> Further, the display device can be obtained by such a display device panel 6〇. Examples of the display device include an LCD and an OLED. As the LCD, TN (Twisted Nematic ' twisted nematic) type, sTN (Super Twisted)

Nematic,超扭轉向列)型、FE(Field Emission,場發射) 型 ' TFT(Thin Film Transistors,薄膜電晶體)型、 MIM(Metal Insulator Metal,金屬 _絕緣體 _金屬)型。 此處,獲得顯示裝置之操作並無特別限定,例如可利用 先前公知之方法製造顯示裝置。 實施例 以下’藉由實施例等具體地說明本發明,但本發明並不 限定於該等例。 於以下實施例1〜5、比較例丨、4中,作為玻璃基板,使 163953.doc •32· 201249643 用包含無驗硼矽玻璃之玻璃板(縱720 mm,橫600 mm,板 厚0.3 mm,線膨脹係數38x1(T7/°C,旭硝子公司製造,商 品名「AN100」)。又,作為支持板,同樣地使用含無鹼硼 石夕玻璃之玻璃板(縱720 mm,橫600 mm,板厚0.4 mm,線 膨脹係數38xl(T7/°C ,旭硝子公司製造,商品名 「AN100」)。 又,於實施例6及比較例2中,作為玻璃基板及支持板, 使用包含鈉鈣玻璃之玻璃板(線膨脹係數85><1〇-7/。(:,旭硝 子公司製造’商品名「AS」)。於實施例7及比較例3中, 將藉由將該包含鈉鈣玻璃之玻璃板於450°C之硝酸鉀之熔 融鹽中浸潰1小時而進行化學強化處理所獲得的強化玻璃 板用作玻璃基板及支持板。該等玻璃基板之大小與厚度與 實施例1〜5中所使用之玻璃基板相同,該等支持板之大小 與厚度亦與實施例1〜5中所使用之支持板相同。 再者,於後述實施例及比較例中,表面粗糙度(Ra)係使 用原子力顯微鏡(Seiko Instruments公司製造, SPA300/SPI3800)而測定。 (剝離性評價) 關於後述積層體於加熱後之附有無機絕緣膜之玻璃基板 之剝離性,於後述特定之條件下進行加熱處琿後,將附有 無機絕緣膜之玻璃基板與樹脂層剝離,並藉由目視觀察附 有無機絕緣膜之玻璃基板之與樹脂層相接之面,藉此進行 評價。無樹脂層之殘渣者為好評,有樹脂層之殘渣者為^ 評。 163953.doc •33- 201249643 (潔淨性評價) 於後述特定之條件下進行加熱處理後,將自積層體上剝 離之附有無機絕緣膜之玻璃基板於己烷中進行超音波處理 (5分鐘),此後,於與樹脂層接觸之面上(無機絕緣膜面上) 貼附透明膠帶(商品名Sellotape(註冊商標),Nichiban製 造),進行90。剝離’測定其剝離強度。剝離強度越小,意 味著樹脂層之殘渣越存在於無機絕緣膜面上,實用上剝離 強度較佳為0.5 N/25 mm以上。 <實施例1 > 首先’將板厚0.4 mm之支持板進行純水清洗後,進而進 行UV(ultraviolet ’紫外線)清洗而使其潔淨化。 繼而,於支持板之第1主面上,將無溶劑加成反應型剝 離紙用聚發氧(Shin-Etsu Silicones公司製造,KNS-3 20 A, 黏度:0.40 Pa. s’ 溶解度參數(SP(Solubility Parameter) 值):7.3)100質量份與鉑系觸媒(51^11_以3115山(:〇11以公司製 造,CAT-PL-56)2質量份之混合液利用網版印刷機以縱7〇5 mm、橫595 mm之大小塗佈成長方形(塗佈量3〇 g/m2)。 繼而’使其於180°C下於大氣中加熱硬化30分鐘,而於 支持板之第1主面上形成厚度20 μπι之聚矽氧樹脂層。 再者’上述無溶劑加成反應型剝離紙用聚矽氧包含具有 鍵結於矽原子上之乙烯基與曱基之直鏈狀有機烯基聚矽氧 院(主劑)、與具有鍵結於矽原子上之氫原子與甲基之直鏈 狀有機氫聚矽氧烷(交聯劑)。 繼而,將板厚0.3 mm之玻璃基板之與聚矽氧樹脂接觸之 163953.doc -34- 201249643 側之面(第1主面)進行純水清洗,此後進行UV清洗而使其 潔淨化。進而’於經潔淨化之面上藉由磁控濺鍍法(加熱 溫度300°C,成膜壓力4 mTorr,功率密度3 w/cm2)形成厚 度30 nm之Si〇2膜’而獲得附有無機絕緣膜之玻璃基板。 無機絕緣膜表面(無機絕緣膜之與玻璃基板側相反側之表 面《以下為相同意思)之表面粗糙度(Ra)g〇 8 nm。又,藉 由xps測定(使用ULVAC_PHI公司製造之Quantera SXM。以 下相同)所獲得之無機絕緣膜表面中之鹼金屬及鹼土金屬 之原子的合計含量為檢測極限以下(〇丨at。/。以下)。 此後,使玻璃基板之Si02成膜面與支持板之聚矽氧樹脂 層面於室溫下藉由真空加壓而貼合,獲得積層體A。 於所獲得之積層體八中,<持板及玻璃基板與聚石夕氧樹 脂層無氣泡產生地密接,亦無變形狀缺點,平滑性亦良 好。 (加熱後之剝離性評價) 對於積層體A ’於大氣氧為〇1%以下之氮氣環境中,於 35〇°C下實施加熱處理1小時。 繼而,進行剝離試驗。且舻而上 . a ^具體而έ,首先,將積層體A中 之玻璃基板之第2主面固定於固定a 〜、口心口上。另一方面,以吸 附塾吸附支持板之第2 t - 弟2主面。繼而,於積層體A所具有之斗 個角部中之1個角處,於m古& Μ μ μ 於附有無機絕緣膜之玻璃基板與樹 脂層之界面中插入厚唐〇4 mm# η u • mm之刀片’使無機絕緣膜與樹 脂層之界面稍剥離,而4忐备丨轴^ Ββ k成釗離之開端。繼而,使吸附墊 向離開固定台之方向多容裔p 使".、機絕緣膜與樹脂層之界面 163953.docNematic, super twisted nematic), FE (Field Emission) type TFT (Thin Film Transistors), MIM (Metal Insulator Metal). Here, the operation of obtaining the display device is not particularly limited, and for example, the display device can be manufactured by a conventionally known method. EXAMPLES Hereinafter, the present invention will be specifically described by way of Examples and the like, but the present invention is not limited to the examples. In the following Examples 1 to 5, Comparative Examples, and 4, as a glass substrate, 163953.doc •32·201249643 was used as a glass plate containing borosilicate-free glass (720 mm in length, 600 mm in width, and 0.3 mm in thickness). , linear expansion coefficient 38x1 (T7/°C, manufactured by Asahi Glass Co., Ltd., trade name "AN100"). Also, as a support plate, a glass plate containing an alkali-free borosilicate glass (720 mm in length and 600 mm in width) is used in the same manner. The plate thickness is 0.4 mm, and the coefficient of linear expansion is 38xl (T7/°C, manufactured by Asahi Glass Co., Ltd., trade name "AN100"). In Example 6 and Comparative Example 2, soda lime glass is used as the glass substrate and the support plate. The glass plate (linear expansion coefficient 85 <1〇-7/. (:, manufactured by Asahi Glass Co., Ltd. 'trade name "AS"). In Example 7 and Comparative Example 3, the soda-lime glass was included. The tempered glass plate obtained by chemically strengthening the glass plate in a molten salt of potassium nitrate at 450 ° C for 1 hour is used as a glass substrate and a support plate. The size and thickness of the glass substrates are the same as in Example 1 The glass substrates used in 5 are the same, and the size of the support plates is The thickness is also the same as that of the support sheets used in the first to fifth embodiments. Further, in the examples and comparative examples described later, the surface roughness (Ra) was measured using an atomic force microscope (Seiko Instruments, SPA300/SPI3800). (Evaluation of the peeling property) The peeling property of the glass substrate with the inorganic insulating film after heating of the laminated body mentioned later is performed, and the glass substrate with the inorganic insulating film and the resin layer are carried out after heating on the specific conditions mentioned later. The peeling was performed by visually observing the surface of the glass substrate with the inorganic insulating film that was in contact with the resin layer, and the residue of the resin-free layer was praised, and the residue of the resin layer was evaluated. 163953. Doc •33-201249643 (Evaluation of cleanliness) After heat treatment under the specific conditions described later, the glass substrate with the inorganic insulating film peeled off from the laminate was subjected to ultrasonic treatment (5 minutes) in hexane, and thereafter A scotch tape (trade name: Sellotape (registered trademark), manufactured by Nichiban) is attached to the surface (inorganic insulating film surface) which is in contact with the resin layer, and 90 is peeled off. The peel strength is determined. The smaller the peel strength, the more the residue of the resin layer exists on the surface of the inorganic insulating film, and the peel strength is preferably 0.5 N/25 mm or more. [Example 1 > The support plate having a thickness of 0.4 mm is cleaned with pure water, and then UV (ultraviolet) is cleaned and cleaned. Then, on the first main surface of the support plate, the solvent-free addition reaction type release paper is used for polymerization. Oxygenation (manufactured by Shin-Etsu Silicones, KNS-3 20 A, viscosity: 0.40 Pa. s' Solubility Parameter (SP): 7.3) 100 parts by mass with platinum-based catalyst (51^11_ 3115 mountain (: 〇11, manufactured by the company, CAT-PL-56) 2 parts by mass of the mixture is coated into a rectangular shape by a screen printing machine with a length of 7〇5 mm and a width of 595 mm (coating amount 3〇g) /m2). Then, it was heat-hardened in the atmosphere at 180 ° C for 30 minutes to form a polyoxyxylene resin layer having a thickness of 20 μm on the first main surface of the support sheet. Further, 'the above-mentioned solvent-free addition reaction type release paper polyfluorene oxide contains a linear organic alkenyl polysiloxane (main agent) having a vinyl group and a fluorenyl group bonded to a ruthenium atom, and has a bond A linear organohydrogenpolyoxyalkylene (crosslinking agent) of a hydrogen atom and a methyl group on a halogen atom. Then, the surface of the glass substrate having a thickness of 0.3 mm and the surface of the 163953.doc -34 - 201249643 (the first main surface) which were in contact with the polyoxyxylene resin were washed with pure water, and then cleaned by UV cleaning. Further, the surface of the cleaned surface was obtained by magnetron sputtering (heating temperature 300 ° C, film formation pressure 4 mTorr, power density 3 w/cm 2 ) to form a Si 2 film having a thickness of 30 nm. A glass substrate of an inorganic insulating film. The surface roughness (Ra) g 〇 8 nm of the surface of the inorganic insulating film (the surface of the inorganic insulating film on the side opposite to the glass substrate side, the same meaning is hereinafter). In addition, the total content of the alkali metal and the alkaline earth metal in the surface of the inorganic insulating film obtained by xps measurement (using Quantera SXM manufactured by ULVAC_PHI Co., Ltd., the same applies hereinafter) is below the detection limit (〇丨at. /. or less). . Thereafter, the SiO 2 film-forming surface of the glass substrate and the polyoxy-oxygen resin layer of the support plate were bonded together under vacuum at room temperature to obtain a layered product A. In the obtained laminated body 8, the holding plate and the glass substrate were in close contact with the polyoxo resin layer without bubbles, and the shape was not changed, and the smoothness was also good. (Evaluation of peelability after heating) The laminate A' was heat-treated at 35 ° C for 1 hour in a nitrogen atmosphere in which atmospheric oxygen was 〇 1% or less. Then, a peeling test was performed. Further, a. Specifically, first, the second main surface of the glass substrate in the laminated body A is fixed to the fixed a to the mouth opening. On the other hand, the second t-dipole 2 main surface of the support plate is adsorbed. Then, at one corner of the corner of the layer body A, insert the thick Tang 〇 4 mm in the interface between the glass substrate and the resin layer with the inorganic insulating film at m ancient & Μ μ μ The blade of η u • mm 'slightly peels off the interface between the inorganic insulating film and the resin layer, and the 忐β k becomes the beginning of the separation. Then, the adsorption pad is moved away from the fixed table to make the interface of the dielectric film and the resin layer 163953.doc

S •35- 201249643 整體剝離,使附有無機絕緣膜之玻璃基板與附有樹脂層之 支持板分離》 於經分離之附有無機絕緣膜之玻璃基板之剝離面上(無 機絕緣膜上)無樹脂之殘渣。 又’對於經分離之附有無機絕緣膜之玻璃基板進行上述 潔淨性評價,結果可知,剝離強度為0.7 n/25 mm,具有 優異之面潔淨性。 此後’將經分離之附有無機絕緣膜之玻璃基板於稀釋成 20重量%之抗姓劑剝離液(parker Corporation公司製造,包 含氫氧化鉀20質量%作為主要成分)中於50。〇下浸潰1〇分 鐘,藉由水進行刷洗後,於濃度為〇· 1莫耳/升之鹽酸水溶 液中於90°C下浸潰20小時’進行水之刷洗及鼓風。利用光 學顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果 未見龜裂。 (實施例lb) 藉由熱CVD法(加熱溫度400°C,反應壓力1 Pa,反應氣 體為四乙氧基矽烷與臭氧/氧氣,載氣為氮氣:2000 seem ’臭氧/氧氣比:3%)代替磁控濺鍍法而形成厚度1〇〇 nm之Si〇2膜’除此以外依據與實施例1相同之程序獲得積 層體A· 〇再者,附有無機絕緣膜之玻璃基板之無機絕緣膜 表面之表面粗經度(Ra)為2 nm。又,藉由XPS測定所獲得 之無機絕緣膜表面中之鹼金屬及鹼土金屬之原子之合計含 量為 0.5 at%。 此後’對於積層體A,以與實施例1相同之方式進行剝離 163953.doc -36- 201249643 性評價。於經分離之附有無機絕緣膜之玻璃基板之剝離面 上無樹脂之殘渣。 又’對於經分離之附有無機絕緣膜之玻璃基板進行潔淨 性評價’結果可知,剝離強度為0.8 N/25 mm,具有優異 之面潔淨性。 此後’依據與實施例1相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行鹼洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 再者’一般認為,無機絕緣膜表面中之驗金屬及鹼土金 屬之原子係由四乙氧基矽烷中之雜質而引起。 &lt;實施例2 &gt; 藉由 ICP-CVD 法(Inductively Coupled Plasma-Chemical Vapor Deposition’電感耦合型電漿輔助化學氣相沈積加 熱溫度 400 C ’ 成膜壓力 1 Pa,RF(Radio Frequency,射.頻) 功率 400 W’ DC(direct-current,直流)功率 230 V/0.5 A/80 W,氣體流量(1 〇〇% SiH4 : 10 seem、N2 : 140 seem))形成 厚度100 nm之ShN4膜代替形成Si02膜,除此以外依據與實 施例1相同之程序獲得積層體B。再者,附有無機絕緣膜之 玻璃基板之無機絕緣膜表面之表面粗縫度(Ra)為2 nm。 又,藉由XPS測定所獲得之無機絕緣膜表面中之鹼金屬及 鹼土金屬之原子之合計含量為檢測極限以下(0.1 at%以 下)。 此後,對於積層體B以與實施例1相同之方式進行剝離性 163953.doc -37- 201249643 評價。於經分離之附有無機絕緣膜之玻璃基板之剝離面上 無樹脂之殘渣。 又’對於經分離之附有無機絕緣膜之玻璃基板進行潔淨 性4價’結果可知’剝離強度為〇. 6 n / 2 5 m m,具有優異 之面潔淨性。 此後,依據與實施例1相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行驗洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 &lt;實施例3 &gt; 藉由磁控濺鍍法(加熱溫度300。(:,成膜壓力4 mTorr,功 率密度3 W/cm2)形成厚度1〇〇 nm之Si〇2膜代替形成Si02 膜’此後進行電漿氮化處理(加熱溫度300°c,腔室内壓力 100 Pa ’ 氣體流量(N2 : 1〇〇 seem,Ar : 1000 seem,H2 : 10 seem)),形成厚度 loo nm 之 si〇aNb(a=l,b=l)膜,除此 以外依據與實施例1相同之程序獲得積層體C。再者,附有 無機絕緣膜之玻璃基板之無機絕緣膜表面之表面粗糙度 (Ra)為1 nm。又,藉由xpS測定所獲得之無機絕緣膜表面 中之鹼金屬及鹼土金屬之原子之合計含量為檢測極限以下 (0.1 at%以下)。 此後,對於積層體C以與實施例1相同之方式進行剝離性 評價。於經分離之附有無機絕緣膜之玻璃基板之剝離面上 無樹脂之殘潰β 又,對於經分離之附有無機絕緣膜之玻璃基板以與實施 163953.doc •38· 201249643 例1相同之方式進行潔淨性評價,結果可知,剝離強度為 〇.6 N/25 mm,具有優異之面潔淨性。 此後’依據與貫施例1相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行鹼洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 &lt;實施例4 &gt; 於實施例1中所使用之玻璃基板表面上喷灑緩衝氟酸(氟 酸6重量❶/〇 :氟化銨3 0重量% ’剩餘部分為水,以下相 同)(約20秒)而使其粗面化’於玻璃基板之經粗面化之表面 上,藉由實施例1中所實施之磁控濺鍍法於玻璃基板上製 作厚度30 nm之Si〇2膜,使用該附有無機絕緣膜之玻璃基 板代替實施例1中所使用之附有無機絕緣膜之玻璃基板, 並藉由與實施例1相同之程序,獲得積層體D。再者,附有 無機絕緣膜之玻璃基板之無機絕緣膜表面之表面粗糙度 (Ra)為25 nm。又,藉由XPS測定所獲得之無機絕緣膜表面 中之驗金屬及鹼土金屬之原子之合計含量為檢測極限以下 (0.1 at%以下)。 此後’對於積層體D以與實施例1相同之方式進行剝離性 評價。於經分離之附有無機絕緣膜之玻璃基板之剝離面上 無樹脂之殘渣。 又’對於經剝離之附有無機絕緣膜之玻璃基板進行潔淨 性評價’結果可知’剝離強度為〇 6 n/25 mm,具有優異 之面潔淨性。 163953.doc •39· 201249643 此後,依據與實施例丨相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行鹼洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 &lt;實施例5 &gt; 藉由反應性濺鍍法(鋁靶,無加熱,成膜壓力〇· ι ,氣 體流量(〇2 : 25 sccm,Ar : 25 sccm))形成厚度5〇⑽之S •35- 201249643 Whole peeling, separating the glass substrate with inorganic insulating film from the supporting plate with resin layer” on the peeling surface (inorganic insulating film) of the separated glass substrate with inorganic insulating film Residue of resin. Further, as a result of the above-described cleanliness evaluation of the separated glass substrate with the inorganic insulating film, it was found that the peel strength was 0.7 n/25 mm, and the surface cleansing property was excellent. Thereafter, the separated glass substrate with the inorganic insulating film was placed in 50 in an anti-surname stripping liquid (manufactured by Parker Corporation, containing 20% by mass of potassium hydroxide as a main component) diluted to 20% by weight. After immersing for 1 〇 minutes, the mixture was brushed with water, and then immersed in a hydrochloric acid aqueous solution having a concentration of 〇·1 mol/liter at 90 ° C for 20 hours to perform water washing and blasting. The peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope, and as a result, no crack was observed. (Example lb) By thermal CVD (heating temperature 400 ° C, reaction pressure 1 Pa, reaction gas is tetraethoxy decane and ozone / oxygen, carrier gas is nitrogen: 2000 seem 'ozone/oxygen ratio: 3% In addition to the magnetron sputtering method, a Si 〇 2 film having a thickness of 1 〇〇 nm was formed. Otherwise, a laminate A was obtained according to the same procedure as in Example 1, and the inorganic layer of the glass substrate with the inorganic insulating film was added. The surface roughness (Ra) of the surface of the insulating film was 2 nm. Further, the total content of the alkali metal and alkaline earth metal atoms in the surface of the inorganic insulating film obtained by XPS measurement was 0.5 at%. Thereafter, for the laminate A, the peeling was performed in the same manner as in Example 1 163953.doc -36 - 201249643. There is no resin residue on the peeled surface of the separated glass substrate with the inorganic insulating film. Further, as a result of the evaluation of the cleanliness of the separated glass substrate with the inorganic insulating film, the peel strength was 0.8 N/25 mm, and the surface cleanliness was excellent. Thereafter, the glass substrate with the inorganic insulating film separated thereon was subjected to alkali washing, pickling, and brushing according to the same procedure as in Example 1, and the peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope. No cracks were seen. Further, it is considered that the metal of the metal oxide and the alkaline earth metal in the surface of the inorganic insulating film is caused by impurities in tetraethoxysilane. &lt;Example 2 &gt; ICP-CVD method (Inductively Coupled Plasma-Chemical Vapor Deposition' Inductively coupled plasma-assisted chemical vapor deposition heating temperature 400 C 'film formation pressure 1 Pa, RF (Radio Frequency, shot. Frequency) Power 400 W' DC (direct-current) power 230 V / 0.5 A / 80 W, gas flow rate (1 〇〇 % SiH4 : 10 seem, N2 : 140 seem)) to form a ShN4 film with a thickness of 100 nm instead A layered body B was obtained in the same manner as in Example 1 except that the SiO 2 film was formed. Further, the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film had a surface roughness (Ra) of 2 nm. Further, the total content of the alkali metal and the alkaline earth metal atom in the surface of the inorganic insulating film obtained by XPS measurement is below the detection limit (0.1 at% or less). Thereafter, the laminate B was subjected to the evaluation of the peeling property 163953.doc -37 - 201249643 in the same manner as in the first embodiment. There is no resin residue on the peeled surface of the separated glass substrate with the inorganic insulating film. Further, it was found that the peeling strength was 〇. 6 n / 2 5 m m, and the surface cleanliness was excellent as a result of the cleanness of the glass substrate with the inorganic insulating film separated. Thereafter, according to the same procedure as in Example 1, the separated glass substrate with the inorganic insulating film was subjected to washing, pickling and brushing, and the peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope. No cracks were seen. &lt;Example 3&gt; A Si〇2 film having a thickness of 1 〇〇nm was formed by magnetron sputtering (heating temperature 300 (:, film formation pressure: 4 mTorr, power density: 3 W/cm 2 ) instead of forming a SiO 2 film 'The plasma nitriding treatment is then carried out (heating temperature 300 ° C, chamber pressure 100 Pa ' gas flow rate (N2 : 1 〇〇 seem, Ar : 1000 seem, H2 : 10 seem)), forming the thickness loo nm si〇 ANb (a = 1, b = 1) film, except that the laminate C was obtained according to the same procedure as in Example 1. Further, the surface roughness of the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film (Ra) In addition, the total content of the alkali metal and the alkaline earth metal atom in the surface of the inorganic insulating film obtained by the xpS measurement is below the detection limit (0.1 at% or less). Thereafter, for the laminated body C and In the same manner as in Example 1, the peeling property evaluation was carried out. On the peeled surface of the separated glass substrate with the inorganic insulating film, there was no resin residue β, and the separated glass substrate with the inorganic insulating film was attached and 163953 was carried out. .doc •38· 201249643 Example 1 for the cleanliness evaluation in the same way As a result, it was found that the peeling strength was 〇.6 N/25 mm, and the surface cleanliness was excellent. Thereafter, the separated glass substrate with the inorganic insulating film was subjected to alkaline washing according to the same procedure as in Example 1. After pickling and brushing, the peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope, and as a result, no crack was observed. <Example 4> Spray buffering on the surface of the glass substrate used in Example 1. Fluoric acid (6 parts by weight of fluoric acid / 〇: 30% by weight of ammonium fluoride 'the rest is water, the same below) (about 20 seconds) and roughened on the roughened surface of the glass substrate A Si 2 film having a thickness of 30 nm was formed on the glass substrate by the magnetron sputtering method carried out in Example 1, and the glass substrate with the inorganic insulating film was used instead of the inorganic material used in Example 1. The glass substrate of the insulating film was obtained by the same procedure as in Example 1. The surface roughness (Ra) of the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film was 25 nm. , inorganic insulating film obtained by XPS measurement The total content of the atoms of the metal and the alkaline earth metal in the surface is below the detection limit (0.1 at% or less). Thereafter, the peeling property was evaluated for the laminate D in the same manner as in Example 1. On the peeling surface of the glass substrate of the insulating film, there is no resin residue. The result of 'cleaning evaluation of the peeled glass substrate with an inorganic insulating film' shows that the peeling strength is 〇6 n/25 mm and has excellent surface. Cleanliness. 163953.doc •39· 201249643 Thereafter, the separated inorganic insulating film-attached glass substrate was subjected to alkaline washing, pickling and brushing according to the same procedure as in Example ,, and observed with an optical microscope. The peeling surface of the glass substrate of the insulating film showed no cracks. &lt;Example 5 &gt; A thickness of 5 〇 (10) was formed by a reactive sputtering method (aluminum target, no heating, film formation pressure 〇·ι, gas flow rate (〇2: 25 sccm, Ar: 25 sccm))

Ah〇3膜代替形成Si〇2膜,除此以外依據與實施例1相同之 程序獲得積層體E。再者,於本實施例中,附有無機絕緣 膜之玻璃基板之無機絕緣膜表面之表面粗糖度(Ra)為〇 8 nm。又,藉由XPS測定所獲得之無機絕緣膜表面中之鹼金 屬及驗土金屬之原子之合計含量為檢測極限以下(〇 i at% 以下)。 此後,對於積層體E以與實施例丨相同之方式進行剝離性 »平價於經为離之附有無機絕緣膜之玻璃基板之剝離面上 無樹脂之殘渣。 又對於經为離之附有無機絕緣膜之玻璃基板進行潔淨 性評價,結果可知,剝離強度為〇 6 N/25 mm,具有優異 之面潔淨性。 此後,依據與實施例丨相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行驗洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 &lt;實施例6 &gt; 163953.doc •40· 201249643 使用包含鈉鈣玻璃之玻璃板作為支持板及玻璃基板,除 此以外藉由與實施例1相同之方法獲得積層體F。再者,於 本實施例中,附有無機絕緣膜之玻璃基板之無機絕緣膜表 面之表面粗糙度(Ra)為0.8 nm。又,藉由XPS測定所獲得 之無機絕緣膜表面中之鹼金屬及鹼土金屬之原子之合計含 量為檢測極限以下(0.1 at%以下)。 此後,對於積層體F以與實施例1相同之方式進行剝離性 評價。於經分離之附有無機絕緣膜之玻璃基板之剝離面上 無樹脂之殘漬。 又,對於經分離之附有無機絕緣膜之玻璃基板進行潔淨 性評價’結果可知,剥離強度為〇.6 n/25 mm,具有優異 之面潔淨性。 此後,依據與實施例1相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行臉洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 &lt;實施例7 &gt; 使用經化學強化之玻璃板作為支持板及玻璃基板,除此 以外藉由與實施例2相同之方法獲得積層體G。再者,附有 無機絕緣膜之玻璃基板之無機絕緣膜表面之表面粗糙度 (Ra)為0.8 nm〇又,藉由XPS測定所獲得之無機絕緣膜表 面中之鹼金屬及鹼土金屬之原子之合計含量為檢測極限以 下(0.1 at%以下)。 此後,對於積層體G以與實施例1相同之方式進行剝離性 163953.doc 201249643 評價°於經剝離之附有無機絕緣膜之玻璃基板之剝離面上 無樹脂之殘渣。 又,對於經分離之附有無機絕緣膜之玻璃基板進行潔淨 性評價,結果可知,剝離強度為〇·6 N/25 mm,具有優異 之面潔淨性。 此後’依據與實施例1相同之程序,對經分離之附有無 機絕緣膜之玻璃基板進行鹼洗、酸洗及刷洗,並利用光學 顯微鏡觀察附有無機絕緣膜之玻璃基板之剝離面,結果未 見龜裂。 再者’關於上述實施例1〜7中所使用之積層體A〜G, 於上述剝離試驗中’係於聚矽氧樹脂層與無機絕緣膜之間 發生剝離,而並非於聚矽氧樹脂層與支持板之間。根據該 點確認,聚矽氧樹脂層與支持板之間之密接力大於聚石夕氧 樹脂層與無機絕緣膜之間之密接力,換言之,聚石夕氧樹脂 層與支持板之間之剝離強度高於聚矽氧樹脂層與無機絕緣 膜之間之剝離強度。 &lt;比較例1 &gt; 使用不附有無機絕緣膜之玻璃基板代替實施例1中所使 用之附有無機絕緣膜之玻璃基板,除此以外藉由與實施例 1相同之程序獲得積層體Η。於積層體Η中不含無機絕緣 膜。再者,將玻璃基板之與樹脂層表面接觸之側之面進行 純水清洗,此後進行UV清洗,使潔淨化。又,經潔淨化 之玻璃基板之表面粗糖度(Ra)為0.5 nm。又,藉由xps測 定所獲得之玻璃基板表面中之鹼金屬及鹼土金屬之原子之 163953.doc -42- 201249643 合計含量為1 .〇 at%。 繼而,依據與實施例1相同之程序,於進行加熱處理後 進行剝離性評價,使積層體H中之玻璃基板與具有樹脂層 之支持板分離。 於經分離之玻璃基板之與樹脂層接觸之面上附著有一 部分樹脂層之樹脂,於支持板上相當於樹脂層表面之部分 中確認有破損。 又’對於經分離之玻璃基板進行潔淨性評冑,結果,剝 離強度為0.1 N/25 mm’無法充分地去除附著於表面上之 樹脂。 利用刀去除樹脂後,禾J用光學顯微鏡觀察玻璃基板之剝 離面,結果於剝離面之一部分中確認到產生龜裂。 &lt;比較例2 &gt; 使用與實施例6相同之包含鈉鈣玻璃之玻璃板作為支持 板及玻璃基板,除此以外藉由與比較例丨相同之方法獲得 積層體J。於積層體j中不含無機絕緣膜。再者,經潔淨化 之玻璃基板之表面粗糙度(Ra)為〇 5 nm。又,藉由xps測 定所獲得之玻璃基板表面中之鹼金屬及鹼土金屬之原子之 合計含量為1.5 at%。 繼而’依據與實施例1相同之程序,於進行加熱處理後 進行剝離性評價,使積層體j中之玻璃基板與具有樹脂層 之支持板分離。 於經分離之玻璃基板之與樹脂層接觸之面上附著有一部 分樹脂層之樹脂’於支持板上相當於樹脂層表面之部分上 163953.doc •43- 201249643 確認有破損。 又對於經分離之玻璃基板進行潔淨性評價,結果,剝 離強度為0.1 N/25 mm’無法充分地去除附著於表面上之 樹脂。 &lt;比較例3 &gt; 使用與實施例7相同之經化學強化之玻璃板作為支持板 及玻璃基板,除此以外藉由與比較例丨相同之方法獲得積 層體K。於積層體κ中不含無機絕緣膜。再者,經潔淨化 之玻璃基板之表面粗链度(Ra)為〇. 5 nm。又,藉由χρ§測 定所獲得之玻璃基板表面中之鹼金屬及鹼土金屬之原子之 合計含量為1.5 at%。 繼而’依據與實施例1相同之程序,於進行加熱處理後 進行剝離性評價,使積層體K中之玻璃基板與具有樹脂層 之支持板分離。 於經分離之玻璃基板之與樹脂層接觸之面上附著有一部 分樹脂層之樹脂,於支持板上相當於樹脂層表面之部分上 確認有破損。 又’對於經分離之玻璃基板進行潔淨性評價,結果,剝 離強度為0.1 N/25 mm ’無法充分地去除附著於表面上之 樹脂。 &lt;比較例4 &gt; 於比較例1中所使用之玻璃基板表面上喷灑緩衝氟酸(約 60秒)而使其粗面化’使用該粗面化玻璃基板代替實施例i 中所使用之附有無機絕緣膜之玻璃基板,並藉由與實施例 163953.doc •44· 201249643 1相同之程序獲得積層體於積層體L中不含無機絕緣 膜。再者,對粗面化玻璃基板之與樹脂層接觸之側之面進 行純水清洗,此後進行UV清洗,使其潔淨化。 所獲得之粗面化玻璃基板之經潔淨化之表面(經粗面化 之面)之表面粗糙度(Ra)為100 nm。又,藉由xps測定所獲 得之粗面化玻璃基板之經潔淨化之表面中之鹼金屬及鹼土 金屬之原子之合計含量為1.1 at%。 繼而,依據與實施例丨相同之程序’於進行加熱處理後 進行剝離性評價,使積層體L中之玻璃基板與具有樹脂層 之支持板分離0 於經分離之玻璃基板之與樹脂層接觸之面上附著有一部 分樹脂層之樹脂,於支持板上相當於樹脂層表面之部分上 綠ό忍有破損。 &lt;實施例8 &gt; 於本例中,使用實施例3中所得之積層體C製造OLED。 、形成透明電極之步驟,形成辅助電極之步驟,蒸鍍電洞 :主,層、電洞傳輸層、發光層、電子傳輸層等之步驟,將The layered body E was obtained in the same manner as in Example 1 except that the Ah 〇 3 film was used instead of the Si 〇 2 film. Further, in the present embodiment, the surface roughness (Ra) of the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film was 〇 8 nm. Further, the total content of the alkali metal and the earth metal in the surface of the inorganic insulating film obtained by XPS measurement is below the detection limit (〇 i at% or less). Thereafter, the laminate E was subjected to releasability in the same manner as in Example ». Equivalent to the resin-free residue on the peeled surface of the glass substrate to which the inorganic insulating film was attached. Further, as a result of evaluation of the cleanliness of the glass substrate with the inorganic insulating film attached thereto, it was found that the peeling strength was 〇 6 N/25 mm, and the surface cleanliness was excellent. Thereafter, the separated inorganic insulating film-attached glass substrate was subjected to washing, pickling, and brushing according to the same procedure as in Example ,, and the peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope. No cracks were seen. &lt;Example 6&gt; 163953.doc • 40·201249643 A laminate F was obtained by the same method as in Example 1 except that a glass plate containing soda lime glass was used as the support plate and the glass substrate. Further, in the present embodiment, the surface roughness (Ra) of the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film was 0.8 nm. Further, the total content of the alkali metal and the alkaline earth metal atom in the surface of the inorganic insulating film obtained by XPS measurement is not more than the detection limit (0.1 at% or less). Thereafter, the laminate property F was evaluated for the peeling property in the same manner as in Example 1. There is no resin residue on the peeled surface of the separated glass substrate with the inorganic insulating film. Further, as a result of evaluation of the cleanliness of the separated glass substrate with the inorganic insulating film, the peel strength was 〇.6 n / 25 mm, and the surface cleanliness was excellent. Thereafter, according to the same procedure as in Example 1, the separated glass substrate with the inorganic insulating film was subjected to face washing, pickling and brushing, and the peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope. No cracks were seen. &lt;Example 7&gt; A layered body G was obtained by the same method as in Example 2 except that a chemically strengthened glass plate was used as the support plate and the glass substrate. Further, the surface roughness (Ra) of the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film is 0.8 nm, and the atom of the alkali metal and the alkaline earth metal in the surface of the inorganic insulating film obtained by XPS measurement The total content is below the detection limit (0.1 at% or less). Thereafter, the laminate G was subjected to peeling in the same manner as in Example 1 163953.doc 201249643 Evaluation No residue of the resin on the peeled surface of the peeled glass substrate with the inorganic insulating film. Further, as a result of evaluation of the cleanliness of the separated glass substrate with the inorganic insulating film, the peel strength was 〇·6 N/25 mm, and the surface cleanliness was excellent. Thereafter, the glass substrate with the inorganic insulating film separated thereon was subjected to alkali washing, pickling, and brushing according to the same procedure as in Example 1, and the peeling surface of the glass substrate with the inorganic insulating film was observed by an optical microscope. No cracks were seen. Further, in the above-mentioned peeling test, the laminates A to G used in the above Examples 1 to 7 were peeled off between the polyoxynitride resin layer and the inorganic insulating film, and were not in the polyoxyalkylene resin layer. Between the support board and the support board. According to this point, it is confirmed that the adhesion between the polyoxyxene resin layer and the support plate is greater than the adhesion between the poly-sulfur oxide layer and the inorganic insulating film, in other words, the peeling between the poly-stone resin layer and the support plate. The strength is higher than the peel strength between the polysiloxane resin layer and the inorganic insulating film. &lt;Comparative Example 1 &gt; A laminated substrate was obtained by the same procedure as in Example 1 except that the glass substrate not having the inorganic insulating film was used instead of the glass substrate with the inorganic insulating film used in Example 1. . The inorganic insulating film is not contained in the laminated body. Further, the surface of the glass substrate on the side in contact with the surface of the resin layer was washed with pure water, and then UV-cleaned to be cleaned. Further, the surface of the cleaned glass substrate had a roughness (Ra) of 0.5 nm. Further, the total content of 163953.doc -42 - 201249643 of the alkali metal and alkaline earth metal in the surface of the obtained glass substrate by xps was 1. 〇 at%. Then, according to the same procedure as in Example 1, the peeling property was evaluated after the heat treatment, and the glass substrate in the layered product H was separated from the support sheet having the resin layer. A resin having a part of the resin layer adhered to the surface of the separated glass substrate which is in contact with the resin layer is confirmed to be damaged in the portion of the support sheet corresponding to the surface of the resin layer. Further, the cleanness evaluation of the separated glass substrate revealed that the peeling strength was 0.1 N/25 mm', and the resin adhering to the surface could not be sufficiently removed. After the resin was removed by a knife, the peeling surface of the glass substrate was observed with an optical microscope, and as a result, cracking was confirmed in one of the peeling faces. &lt;Comparative Example 2&gt; A laminated body J was obtained by the same method as the comparative example except that a glass plate containing soda lime glass as in the sixth embodiment was used as the support plate and the glass substrate. The inorganic insulating film is not contained in the laminated body j. Further, the surface roughness (Ra) of the cleaned glass substrate was 〇 5 nm. Further, the total content of the alkali metal and alkaline earth metal atoms in the surface of the glass substrate obtained by xps measurement was 1.5 at%. Then, according to the same procedure as in Example 1, the peeling property was evaluated after the heat treatment, and the glass substrate in the layered body j was separated from the support sheet having the resin layer. A resin having a part of the resin layer adhered to the surface of the separated glass substrate which is in contact with the resin layer is attached to the surface of the support layer corresponding to the surface of the resin layer. 163953.doc • 43- 201249643 It is confirmed that there is damage. Further, the cleansing evaluation of the separated glass substrate revealed that the peeling strength was 0.1 N/25 mm', and the resin adhering to the surface could not be sufficiently removed. &lt;Comparative Example 3&gt; A laminated body K was obtained by the same method as the comparative example except that the chemically strengthened glass plate similar to that of Example 7 was used as the support plate and the glass substrate. The inorganic insulating film is not contained in the laminated body κ. Further, the surface roughness (Ra) of the cleaned glass substrate is 〇. 5 nm. Further, the total content of the alkali metal and alkaline earth metal atoms in the surface of the glass substrate obtained by χρ§ was 1.5 at%. Then, according to the same procedure as in Example 1, the peeling property was evaluated after the heat treatment, and the glass substrate in the layered product K was separated from the support sheet having the resin layer. A resin having a part of the resin layer adhered to the surface of the separated glass substrate in contact with the resin layer was confirmed to be damaged on the portion of the support plate corresponding to the surface of the resin layer. Further, the cleansing evaluation of the separated glass substrate revealed that the peeling strength was 0.1 N/25 mm', and the resin adhering to the surface could not be sufficiently removed. &lt;Comparative Example 4 &gt; The surface of the glass substrate used in Comparative Example 1 was sprayed with buffered hydrofluoric acid (about 60 seconds) to be roughened. The roughened glass substrate was used instead of the example i. A glass substrate to which an inorganic insulating film is attached is obtained, and a laminate is obtained in the laminate L without the inorganic insulating film by the same procedure as in Example 163953.doc • 44·201249643. Further, the surface of the roughened glass substrate on the side in contact with the resin layer was washed with pure water, and then UV-cleaned to be cleaned. The surface roughness (Ra) of the cleaned surface (roughened surface) of the obtained roughened glass substrate was 100 nm. Further, the total content of the alkali metal and alkaline earth metal atoms in the cleaned surface of the roughened glass substrate obtained by xps measurement was 1.1 at%. Then, according to the same procedure as in Example ', the peeling property evaluation was performed after the heat treatment, and the glass substrate in the layered product L was separated from the support sheet having the resin layer by 0. The resin layer was in contact with the separated glass substrate. The resin having a part of the resin layer adhered to the surface thereof is damaged on the support plate corresponding to the surface of the resin layer. &lt;Example 8&gt; In this example, an OLED was produced using the layered body C obtained in Example 3. a step of forming a transparent electrode, a step of forming an auxiliary electrode, and a step of depositing a hole: a main layer, a hole transport layer, a light emitting layer, an electron transport layer, etc.,

1、至密封步驟而於積層體〇之玻璃基板上形成有機EL ^ 於破璃基板上具有有機EL構造體之積層體c(以下 柄:面板C)為本發明之附有支持體之顯示裝置用面板。 严 使面板C之密封體側真空吸附於定盤上,此後於 面板C之角邮十+ + 玻璃基板與樹脂層之界面中插入厚度0.1 mm之不鏽鋼贺 ,於玻璃基板之無機絕緣層與樹脂層之 界面中造成制離 间*而。進而’利用24個真空吸附墊吸附 163953.doc •45- 201249643 面板c之支持板表面,此後自接近面板c之角部之吸附墊 開始依序使其上升。其結果為,於定盤上僅殘留有形成有 有機EL構造體之玻璃基板,可剝離附有樹脂層之支持板。 繼而,使用雷射裁刀或切割斷裂法切割經分離之玻璃基 板,切割成縱41 mmx橫30 mm之288個單元後,組裝形成 有有機EL構造體之玻璃基板與對向基板,實施模組形成步 驟而製作OLED。以此方式所獲得之〇led不會於特性上產 生問題。 已詳細地、且參照特定之實施態樣說明了本發明,但從 業者很明確,可不脫離本發明之範圍與精神而添加各種修 正或變更。 本申請案係基於2011年4月22曰提出申請之曰本專利申 請案2011-095632者,將其内容以參照之方式引入本文。 【圖式簡單說明】 圖1係本發明之積層體之一實施形態的模式剖面圖。 圖2係本發明之附有支持板之顯示裝置用面板之一實施 形態之模式剖面圖。 【主要元件符號說明】 10 積層體 20 玻璃基板 22 無機絕緣膜 24 附有無機絕緣膜之玻璃基板 30 加強板(附有樹脂層之支持板) 31 支持板 163953.doc • 46 · 201249643 32 樹脂層 40 附有支持板之顯示裝置用面板 50 顯示裝置用面板之構成構件 60 顯示裝置用面板 - 201 玻璃基板之第1主面 . 202 玻璃基板之第2主面 221 無機絕緣膜表面 321 樹脂層表面 163953.doc • 47-1. The organic EL is formed on the glass substrate of the laminated body to the sealing step. The laminated body c having the organic EL structure on the glass substrate (the lower handle: the panel C) is the display device with the support of the present invention. Use the panel. The vacuum side of the sealing body of the panel C is vacuum-adsorbed onto the fixing plate, and then a stainless steel thickness of 0.1 mm is inserted into the interface of the glass substrate and the resin layer at the corner of the panel C, and the inorganic insulating layer and the resin on the glass substrate are inserted. The interface between the layers causes the inter-division*. Further, the surface of the support plate of the panel 163953.doc •45-201249643 was adsorbed by 24 vacuum adsorption pads, and thereafter the adsorption pads from the corners of the panel c were sequentially raised. As a result, only the glass substrate on which the organic EL structure is formed remains on the plate, and the support plate with the resin layer can be peeled off. Then, the separated glass substrate is cut by a laser cutting or cutting fracture method, and cut into 288 cells of 41 mm in length and 30 mm in width, and then the glass substrate and the opposite substrate on which the organic EL structure is formed are assembled, and the module is implemented. The formation step produces an OLED. The 〇led obtained in this way does not cause problems in terms of characteristics. The present invention has been described in detail with reference to the preferred embodiments of the invention. This application is based on a patent application 2011-095632 filed on Apr. 22, 2011, the content of which is hereby incorporated by reference. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing an embodiment of a laminate of the present invention. Fig. 2 is a schematic cross-sectional view showing an embodiment of a panel for a display device with a support plate according to the present invention. [Main component symbol description] 10 Laminate 20 Glass substrate 22 Inorganic insulating film 24 Glass substrate 30 with inorganic insulating film Reinforced plate (support plate with resin layer) 31 Support plate 163953.doc • 46 · 201249643 32 Resin layer 40 Display panel for display panel 50 Component panel for display panel 60 Display panel panel - 201 First main surface of glass substrate. 202 Second main surface of glass substrate 221 Inorganic insulating film surface 321 Resin layer surface 163953.doc • 47-

Claims (1)

201249643 七、申請專利範圍: 1 · 一種積層體,其係依序具備支持板之層、樹脂層、及附 有無機絕緣膜之玻璃基板之層’且上述附有無機絕緣膜 之玻璃基板之無機絕緣膜與上述樹脂層相接者, 上述附有無機絕緣膜之玻璃基板係 於玻璃基板之單面上具有含有包含選自由矽及鋁所組 成之群中之至少一種之氧化物、氮化物或氮氧化物之無 機絕緣膜, 上述無機絕緣膜之與上述樹脂層相接之面中驗金屬及 驗土金屬之原子之合計含量為〇5 at°/。以下, 上述支持板之層與上述樹脂層之界面之剝離強度高於 上述樹脂層與上述無機絕緣膜之界面之剝離強度。 2.如凊求項1之積層體,其中上述無機絕緣膜為包含氧化 石夕、氮化&gt;5夕、氮氧化石夕或氧化銘之膜。 3·如明求項1或2之積層體,其中上述無機絕緣膜之與上述 樹脂層相接之面之表面粗糙度(Ra)未達3〇 nm。 4. 如凊求項1至3中任一項之積層體,其中上述無機絕緣膜 之厚度為5〜5000 nm。 5. T凊求項1至4中任-項之積層體,.其中上述玻璃基板之 尽度為〇.〇3〜0.8 mm。 6. 女:請求項⑴中任一項之積層體’其中上述樹脂層之樹 月曰為聚&gt;5夕氧樹脂。 ^求項6之積層體,其中上述聚矽氧樹脂為有機烯基 ♦石夕氧燒與有機氫聚矽氧烷之反應硬化物。 163953.doc 201249643 8. 如請求項1至7中任一項之積層體,其中上述樹脂層之厚 度為1〜1〇〇 。 9. 如請求項1至8中任一項之積層體,其中上述支持板為玻 璃板。 10. —種積層體之製造方法,其係製造依序具備支持板之 層、樹脂層、及附有無機絕緣膜之玻璃基板之層的積層 體之方法’且該方法包含 準備附有無機絕緣膜之玻璃基板’該附有無機絕緣膜 之玻璃基板係於玻璃基板之單面上具有含有包含選自由 石夕及銘所組成之群中之至少一種之氧化物、氮化物或氮 氧化物之無機絕緣膜,且上述無機絕緣膜之與上述樹脂 層相接之面中驗金屬及驗土金屬之原子之合計含量為〇 5 at%以下; 準備附有樹脂層之支持板,該附有樹脂層之支持板具 有固定於上述支持板之單面上之上述樹脂層,且該樹脂 層之露出表面具有非附著性; 以上述附有無機絕緣膜之玻璃基板之無機絕緣膜之 面、與上述附有樹脂層之支持板之樹脂層表面作為積層 面,使上述附有無機絕緣膜之玻璃基板與上述附有樹脂 層之支持板積層。 11. 如請求項10之積層體之製造方法’其中上述附有樹脂層 之支持板為具有使有機稀基聚$夕氧烧與有機氫聚碎氧炫&gt; 於該支持板上反應硬化所獲付之聚衫氧樹脂之層的支持 板。 163953.doc 201249643 12. 13. 14. 一種附有支持板之顯示裝置用面板,其具有如請求 至9中任一項之積層體,與設置於上述積層體之破螭義1 板表面上之顯示裝置用構件。 ^ 一種顯示裝置用面板,其係自如請求項12之附有支持板 之顯示裝置用面板上以上述無機絕緣膜與上述樹脂層之 界面作為剝離面而剝離去除附有樹脂層之支持板而形成 者。 一種顯示裝置’其具有如請求項 _ 之顯不裝置用面板。 163953.doc201249643 VII. Patent application scope: 1 . A laminated body which is provided with a layer of a support plate, a resin layer, and a layer of a glass substrate with an inorganic insulating film in sequence, and the inorganic layer of the glass substrate with the inorganic insulating film attached thereto The insulating film is in contact with the resin layer, and the glass substrate with the inorganic insulating film is provided on one surface of the glass substrate and has an oxide, a nitride or a film containing at least one selected from the group consisting of ruthenium and aluminum. The inorganic insulating film of oxynitride, wherein the total content of the atoms of the metal and the soil of the soil in which the inorganic insulating film is in contact with the resin layer is 〇5 at ° /. Hereinafter, the peel strength of the interface between the layer of the support sheet and the resin layer is higher than the peel strength of the interface between the resin layer and the inorganic insulating film. 2. The laminate according to claim 1, wherein the inorganic insulating film is a film comprising oxidized oxidized stone, nitrided, or oxidized by oxynitride or oxidized. 3. The laminate according to claim 1 or 2, wherein a surface roughness (Ra) of the surface of the inorganic insulating film which is in contact with the resin layer is less than 3 〇 nm. 4. The laminate according to any one of items 1 to 3, wherein the inorganic insulating film has a thickness of 5 to 5000 nm. 5. The laminated body of any one of items 1 to 4, wherein the glass substrate has a fullness of 〇.〇3 to 0.8 mm. 6. The laminated body of any one of the items (1), wherein the resin layer of the above resin layer is poly&gt; The layered body of claim 6, wherein the polyfluorene oxide resin is a reaction hardened product of an organic alkenyl group and an organic hydrogen polyoxyalkylene. The laminated body according to any one of claims 1 to 7, wherein the resin layer has a thickness of 1 to 1 Å. 9. The laminate according to any one of claims 1 to 8, wherein the support plate is a glass plate. 10. A method for producing a laminated body, which comprises a method of sequentially providing a laminate of a layer of a support sheet, a resin layer, and a layer of a glass substrate with an inorganic insulating film, and the method comprises preparing an inorganic insulating layer The glass substrate with a film of the inorganic insulating film has a glass substrate on one side of the glass substrate and has an oxide, a nitride or an oxynitride containing at least one selected from the group consisting of Shi Xi and Ming. An inorganic insulating film, wherein a total content of atoms of the metal and the soil of the soil in which the inorganic insulating film is in contact with the resin layer is 〇5 at% or less; and a support plate with a resin layer, which is provided with a resin The support plate of the layer has the resin layer fixed to one surface of the support plate, and the exposed surface of the resin layer has non-adhesiveness; the surface of the inorganic insulating film of the glass substrate with the inorganic insulating film described above, and the above The surface of the resin layer of the support plate with the resin layer is used as an accumulation layer, and the glass substrate with the inorganic insulating film is laminated with the support plate with the resin layer. 11. The method of manufacturing a laminate according to claim 10, wherein the support layer with the resin layer is provided to have an organic thin base and an organic hydrogen polycondensate&gt; A support plate for the layer of polysiloxane resin that has been paid. 163953.doc 201249643 12. 13. 14. A panel for a display device with a support plate, comprising the laminate according to any one of claims 9 to 9 and a surface of the breakage plate provided on the laminate. A member for a display device. A panel for a display device which is formed by peeling off a support plate with a resin layer by using an interface between the inorganic insulating film and the resin layer as a peeling surface on a panel for a display device with a support plate of claim 12 By. A display device 'having a panel for a display device as claimed. 163953.doc
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