MXPA06012622A

MXPA06012622A - Electronic thermometer with flex circuit location.

Info

Publication number: MXPA06012622A
Application number: MXPA06012622A
Authority: MX
Inventors: Joseph T Gierer; Mark Davis; Ricky A Sisk
Original assignee: Tyco Healthcare
Priority date: 2005-11-03
Filing date: 2006-10-31
Publication date: 2007-05-02
Also published as: US7494274B2; CN101081163A; US20070098040A1; US7988355B2; KR20080110711A; JP2007127638A; KR100955362B1; US7316507B2; BRPI0604523A; IL178902A0; US20110265320A1; IL178902A; CN101081163B; CA2565472C; JP4291845B2; KR20070048122A; US20080112462A1; US8342748B2; CA2565472A1; US20090135884A1

Abstract

An electronic thermometer is configured for ease and accuracy in construction. A probe of the thermometer includes a flex circuit containing electronic components used to measure temperature and transmit signals to a calculating unit of the thermometer. A locating member supported by the probe can function to pre-position the flex circuit prior to final fixation so that the electronic components are reliably positioned in manufacture.

Description

ELECTRONIC THERMOMETER WITH LOCATION OF FLEXIBLE CIRCUIT FIELD OF THE INVENTION The invention pertains to the field of electronic thermometers and more particularly to the field of fast response electronic thermometers employing a sensor probe.

BACKGROUND OF THE INVENTION Electronic thermometers are widely used in the field of health care to measure a patient's body temperature. Typical electronic thermometers are in the form of a probe with an elongated shaft. Electronic temperature sensors such as thermistors or other temperature sensitive elements are contained within the shaft portion. In one version, the probe includes a cup-shaped aluminum tip at its free end. A thermistor is placed in thermal contact with the aluminum tip inside the probe. When a free end portion is placed, for example, in a patient's mouth, the tip is heated by the patient's body and the thermistor measures the temperature of the tip. Additional electronics connected to the electronic sensor components may be contained within a base unit connected by wire to the shaft portion or may be contained in Ref. 177104 within a handle of the shaft portion, for example. The electronic components receive input from the sensor components to compute the patient's temperature. The temperature is then typically displayed in a visual output device such as a seven-segment numeric display device. Additional features of known electronic thermometers include an audible temperature level notification such as a tone or beep alert signal. A disposable cover or liner typically fits over the shaft portion and discarded after each use of the thermometer for sanitary reasons. Electronic thermometers have many advantages over conventional thermometers and have essentially replaced the use of conventional glass thermometers in the field of health care. An advantage of electronic thermometers over their conventional glass counterparts is the speed at which a temperature reading can be taken. Various methods are used to promote rapid measurement of the subject's temperature. One technique used is to use predictive algorithms as part of the logic of the thermometer to extrapolate temperature measurements of the thermistor in contact with the tip to reach a temperature reading before the tip reaches equilibrium with body temperature.

Another technique that can be used simultaneously with a predictive algorithm is to heat the probe to near body temperature so that part of the probe away from the tip does not act as a heat reduction, allowing the tip to reach a temperature close to the temperature body more quickly. The heating can be carried out by a resistor placed in contact with the probe. Another thermistor can be placed in contact with the probe to measure the amount at which the resistor is heating the probe, which is used to control the heating. It is also known to use an insulator to reduce heat loss from the tip to other parts of the probe. U.S. Patent No. 6,839,651 describes the use of such an insulator and is incorporated herein by reference. To assemble the probe, the circuitry (eg, thermistors and resistors) is mounted on a flexible substrate that supports and provides electrical connection for the components. The combination of the components and the flexible substrate is commonly called a "flexible circuit". The substrate can initially be flat to facilitate easy assembly of the components, but can be folded into position in the assembly on the probe. More specifically, the flexible substrate is bent to place a thermistor in position to make contact with the probe tip, and place the resistor and another thermistor in contact with a separator adjacent to the probe tip. These components can be glued in place with a thermally conductive adhesive in the final assembly. However, before the adhesive comes into contact with the components and / or before the adhesive is fixed, the components can move undesirably. The result of the movement may be insufficient contact of the components with the tip and / or separator to heat or detect the temperature in the final assembly. Preferably, such assembly faults should be minimized or avoided, and a highly repeatable assembly process is achieved.

BRIEF DESCRIPTION OF THE INVENTION In one aspect of the present invention, an electronic thermometer generally comprises a probe tip adapted to be heated at a temperature by an object for use in measuring the temperature of the object. A deformable circuit element includes a deformable electrical conductor and at least one temperature sensor connected to the electrical conductor to detect the temperature of the probe tip. A probe shaft supports the probe tip and deformable circuit element and includes an end portion. A separator is supported by the probe axis. A location member supported by the probe axis is formed to locate the circuit element at least temporarily. In another aspect of the present invention, a probe is described which has substantially the same construction as the preceding paragraph. In still another aspect of the present invention, a method for making a probe for an electronic thermometer generally comprises positioning a deformable circuit element with a probe shaft and deforming the deformable circuit element. A location member is connected to the probe axis. The deformable circuit element and location member are interconnected for use at the location of the deformable circuit element. Other features of the present invention will be partly evident and partly pointed out later.

BRIEF DESCRIPTION OF THE FIGURES Figure 1 is a perspective of an electronic thermometer; Figure 2 is a perspective view of an electronic thermometer probe; Figure 3 is a fragmentary perspective of the probe with detached parts to show the internal construction; Figure 3A is an enlarged fragmentary section of the probe; Figure 4 is an exploded perspective of a flexible circuit, separator and insulator of the probe; Figure 5 is a perspective of the flexible circuit received in the separator during assembly; Figure 6 is a perspective view of the separator and flexible circuit deformed to receive the insulator; Figure 7 is a perspective of the assembled flexible circuit, separator and insulator with a tip of the probe being placed on the insulator; Figure 8 is an enlarged perspective of the insulator; Figure 9 is a top side perspective of another version of an isolator for a probe of a second embodiment; Figure 10 is a bottom side perspective - of the insulator of Figure 9; Figure 11 is an elevation of a flexible circuit of the probe of the second embodiment; Figure 12 is a fragmentary section of a free end of the probe of the second embodiment showing a flexible circuit inserted in a separator and probe axis; Figure 13 is a fragmentary section of a free end of the fully assembled probe of the second embodiment; Fig. 14 is a top side perspective of an insulator of a probe of a third embodiment; Fig. 15 is a bottom side perspective of the insulator of Fig. 14; and Figure 16 is a fragmentary section similar to Figure 13, but showing the probe of a third embodiment. Corresponding reference characters indicate corresponding parts in all the various views of the figures.

DETAILED DESCRIPTION OF THE INVENTION With reference now to the figures and in particular to Figures 1 and 2, an electronic thermometer constructed in accordance with the principles of the present invention is generally indicated as 1. The electronic thermometer comprises a temperature calculating unit, indicated generally as 3, which is dimensioned and shaped to be held comfortably in the hand H. The calculating unit 3 (broadly, "a base unit") is connected by a helical bead 5 to a probe 7 (the reference numbers indicate its subjects generally). The probe 7 is constructed to make contact with the object (for example, a patient) and send the signals to the calculating unit 3 representative of the temperature. The calculator unit 3 receives the signals from the probe 7 and uses them to calculate the temperature. The circuitry suitable for performing these calculations is contained within a housing 9 of the calculating unit 3. The logic in the circuitry can include a predictive algorithm for quickly ascertaining the patient's final temperature. The circuitry causes the calculated temperature to appear in an LCD display 11 on the front of the housing 9. Other information may desirably appear in the display 11, as will be appreciated by those of ordinary skill in the art. A panel llA of buttons for operating the thermometer 1 is located almost above the display 11. The housing 9 includes a compartment (not shown) generally at the back of the housing that can receive a remote portion of the probe 7 in the housing for fastening probe and isolate the distant portion of the environment when it is not in use. Figure 1 illustrates the probe 7 being removed by the other hand Hl from the compartment in preparation for use. The housing 9 also has a receptacle 13 that receives a suitable container such as a box C of probe covers (not shown). In use, the upper part of the box C is removed, exposing the open ends of the probe covers. The distal portion of the probe 7 can be inserted into the open end of the box C and one of the probe covers can be captured (eg, placed rapidly in) an annular recess 14. The pushers 15 are located in the joint of a handle 17 of the probe 7 with a probe shaft 19. The probe shaft is protected from contamination by the cover when the distal portion of the probe shaft 19 is inserted, for example, into a patient's mouth. A button 21 in the probe handle 17 can be pressed to cause the pushers 15 to move to release the probe cover from the probe shaft 19. Subsequent to use, the probe cover can be discarded. Other ways of capturing and releasing the probe covers can be used without departing from the scope of the present invention. An aluminum tip 25 at the distal end of the probe shaft 19 is heated by the patient and the temperature of the tip is detected, as will be more fully described later. The probe cover is preferably made of highly thermally conductive material, at least in the portion covering the tip 25, so that the tip can be rapidly heated by the patient. Referring now to Figures 3 and 3A, the tip 25 and distal end of the probe shaft 19 are partially detached (or shown in section) to reveal the components used to measure the temperature of the tip. A generally tubular spacer, generally indicated 27, is mounted at the distal end of the probe shaft 19 and extends generally in the open bottom portion of the tip 25, but does not engage the tip. An insulator indicated generally as 29 is mounted on one end of the separator 27 and engages the tip 25 for use in mounting the tip on the probe shaft 19. The probe axis, tip 25, separator 27 and insulator 29 (broadly "a location member") can be connected together in a suitable way. A flexible circuit, generally indicated as 31, includes a deformable substrate 33 mounting a tip thermistor 35, a separator thermistor 37 and a heating resistor 39 (see, FIG. 4). The tip thermistor 35 is in thermal contact with the tip 25, and the separator thermistor 37 and heating resistor 39 are in thermal contact with the separator 27. It will be appreciated that other electrical components (not shown) and other arrangements and numbers of components can be used without departing from the scope of the present invention. The tip thermistor 35, separator thermistor 37 and resistor 39 are energized by batteries (not shown) located in the housing 9 of the thermometer 1. It will be understood that other suitable sources of power may be employed. The power source need not be located in the calculator unit housing 9 and it is contemplated that calculating unit 3 may be omitted within the scope of the present invention. The tip thermistor 35 generates a signal that is representative of the temperature of the tip 25. The signal is transmitted by one or more electrical conductors in the flexible circuit substrate 33 to the circuitry in the housing 9. The separator thermistor 37 generates a signal that is representative of the temperature of the separator 27. The resistor 39 is energized by the batteries and heats the separator 27 so that the aluminum tip 25 can reach the patient's temperature more rapidly. The monitoring of the temperature of the separator 27 with the separator transmitter 37 allows the heating of the resistor 39 to be controlled for better effect. For example, the separator 27 can initially be easily heated, but then heated intermittently when the separator approaches or reaches a pre-selected temperature. The function and operation of these components are known to those of ordinary skill in the art. Referring now to Figure 4, flexible circuit 31 (broadly, "a deformable circuit element") and separator 27 and isolator 29 are illustrated schematically prior to assembly. The flexible circuit substrate 33 has a flat cruciform shape which, unless deformed, can not be placed in the separator 27. To assemble the flexible circuit 31 and separator 27, the arms 43 of the flexible circuit substrate 33 are flexed together ( in the directions indicated by the arrows in Figure 4) so that the flexible circuit substrate assumes a somewhat cylindrical configuration and the separator thermistor 37 and resistor 39 are located on the outside of the flexible circuit substrate. The flexible circuit 31 can be inserted through a large open end 45 of the separator 27 to a position in which the separator thermistor 37 and resistor 39 are located in a neck 47 of the separator, and a head 49 of the flexible circuit substrate 33 mounting the tip thermistor 35 projects out of a small open end (not shown) of the spacer (see FIG. 5). Preferably, the flexible substrate 33 is resilient so that the arms 43 tend to push externally against an inner wall 51 of the separator 27 to bring the external surface portions of the substrate opposite the separator thermistor 37 and resistor 39 in contact with the inner wall. A thermally conductive epoxy or other suitable adhesive (not shown) is preferably applied to the contact portions of the outer surface of the substrate 33 and / or to the interior of the neck 47 of the separator 27 prior to insertion of the flexible circuit substrate 33 so that when the substrate portions contact the inner wall 51 of the neck, they are held in place. With reference to Figure 6, the head 49 of the flexible circuit substrate 33 is bent into a generally inverted U configuration and the insulator 29 moves on the flexible circuit 31 with the bent head being received in a central opening 55 of the insulator. The insulator 29 has a protrusion 57 (broadly, "location structure") located on an internal diameter surface 59 of the insulator and projected internally into the central opening 55 (see also figure 8). Preferably, the insulator 29 is made of a material that is a poor thermal conductor to minimize thermal communication between the tip 25 and the separator 27. An opening 63 in the head 49 of the flexible circuit substrate 33 is aligned with the protrusion 57. When a force holding the head 49 of the substrate 33 in the folded inverted U position is released, the head attempts to move back to its non-bent configuration. The movement of the substrate 33 causes the opening 59 to move on the protrusion 57, capturing the free end of the head 40 and preventing it from moving further into its undeformed configuration. A diametrically opposite part of the head 49 engages one side of the inner diameter surface 59 of the insulator 29 generally opposite the protrusion 57. An adhesive can be applied to further assist in holding the head 49 on the protrusion 57. The insulator 29 is it can push (for example, press fit) on the separator 27. In this way, the insulator 29 can act to preliminarily locate the head 49 of the substrate 33 and the tip thermistor 35 prior to final assembly. This exact location of the flexible circuit 31 is highly repeatable for the manufacturing assembly of the probe 7. The tip 25 can be secured to the sub-assembly of the flexible circuit 31, separator 27 and isolator 29, as is illustrated in Figure 7. The resilience of the flexible circuit substrate 33 causes it to act as a spring in its deformed condition to deflect the flexible circuit head 49 and the tip thermistor 35 towards the tip 25 for good thermal contact of a portion of the head generally opposite the tip thermistor. An epoxy or other adhesive can be applied to the separator 27 at the base of the neck 47. An epoxy can also be applied to either or both of the portions of the outer surface of the head 49 that will contact the tip 25., and the inside of the tip. The tip '25 is pushed on the separator 27 so that the bent head 49 of the flexible circuit substrate 33, insulator 29 and the neck 47 of the separator are received at the tip 25. The tip thermistor 35 is positioned by the insulator 29 so that the portion of the outer surface of the head directly opposite the tip thermistor will contact the tip 25 substantially at its center. Preferably, the center of the tip 25 is substantially flat to further facilitate good contact for heat transfer from the tip, through the substrate 33 and the tip thermistor 35. The epoxy can be cured to finally secure the tip 25. and portion of the flexible circuit substrate head 49 carrying the tip thermistor 35, as well as securing the portions of the flexible circuit arms 43 carrying the separator thermistor 37 and resistor 39 to the separator 27. The lower portion of the substrate The flexible circuit 33 can be slid on the probe shaft 19 and the electrical connections are made on the handle 17 of the probe 7 for connection to the cord 5 and therefore the circuitry in the housing 9. This assembly step can occur prior to the deformation steps of the flexible circuit substrate 33, and application of the separator 27, insulator 29 and tip 25 that are previously described herein. Referring now to Figures 9-12, a probe 107 of a second embodiment is shown. The parts of the probe of the second mode corresponding to those of the probe 7 of the first mode will be given with the same reference numbers, plus "100". An insulator 129 of the probe 107 is shown comprising a disc 108 having a slot 110, and an annular flange 112 which depends on the peripheral edge margin of the disc. A platform 114 formed with the disc 108 is located above the top of the disc. The platform 114 has a pair of protrusions 116 (broadly, "location structure") that extend up an upper surface 118 of the platform (Figure 9). A resilient locator indicated generally as 120 depends on disk 108 (FIG. 10). The resilient locator 120 has a generally tubular shape and defines a cavity 122 that extends through the resilient locator (Figure 13). The locator 120 is elastically deformable, when bent to a more flattened configuration, for use in the electrical components of the probe location. Preferably, the insulator 129 is made of a thermally insulating material that is also resilient for reasons explained more fully below. The probe 107 includes a flexible circuit 131 comprising a deformable substrate 133 that includes a pair of arms 143 and a head 149 (Figure 11). In their undeformed position, the arms 143 extend generally parallel to the head 149 along the opposite sides. The ends of the arms 143 are formed with elongated stop tabs 144. The tabs define projections 146 at their intersections with the thinner portions of the arms 143. A spacer thermistor 137 and a resistor 139 are mounted on one of the tabs of 144 respective arrest. The distal end of the head 149 is formed with notches 148 on opposite sides of the head. A tip thermistor 135 is attached to the flexible circuit substrate 133 between these notches 148. The flexible circuit 131 can be assembled with other components to form the probe 107. The assembly of the probe 107 of the second embodiment can be performed as follows. A tubular spacer 127 is attached to the distal end of a probe shaft 119 in a suitable manner such as applying epoxy 150 to the upper end of the shaft and / or lower inner diameter of the spacer. In the preparation for the subsequent joining steps, a thermally conductive epoxy can be applied to the tip thermistor 135, separator thermistor 137 and resistor 139. The epoxy can be applied to 152 to these electrical components. It will be noted that the tip thermistor 135, separator thermistor 137 and resistor 139 are located on the "outside" of flexible circuit substrate 133 in this mode so that they directly contact tip 135 and separator 137 (respectively). However, the tip thermistor 135, separator thermistor 137 and resistor 139 may be placed in a more conventional position within the flexible circuit substrate 133 (i.e., so that the substrate directly contacts the tip and separator). before the electrical components). The flexible circuit substrate 133 can then be pulled through the probe shaft 119 from its distal end until the projections 146 on the retaining tabs 144 of the arms 143 engage an annular distal end surface 154 of the shaft and further resist the movement of the flexible circuit in relation to the axis (figure 12). Instead of bending at guiding angles to its length similar to the cruciform flexible circuit substrate 33 of the first embodiment, the arms 143 of the flexible circuit substrate 133 are screwed almost parallel to its longitudinal extension so that they are oriented almost orthogonally to a plane including the head 149 when inserted into the probe shaft 119. The retaining tabs 144 are in generally opposite relationship and the separator thermistor 137 and resistor face (and preferably coupling) a generally cylindrical interior wall 151 of the separator 127 within a neck 147 of the separator. The insulator 129 is placed on the neck 147 of the spacer 127 with the upper portion of the neck received within the flange 112 of the insulator (Fig. 13). The head 149 of the flexible circuit substrate 133 is threaded through the slot 110 so that it can extend above the insulator 129. The resilient locator 120 of the insulator extends into the neck 147 of the spacer 127 and deforms internally by coupling with the arrest tabs 144 of the flexible circuit substrate 133. The resilient locator 120 pushes the stop tabs 144, and the separator thermistor 137 and resistor 139 mounted therein out against the internal wall of the separator. In this way the resilient locator 120 diverts the thermistor 137 and resistor 139 against the inner wall 151 of the separator 127 to achieve good contact with the separator before the epoxy 152 is fixed. The head 149 of the flexible circuit substrate 133 is bent in a direction transverse to the longitudinal axis of the probe shaft 119 and is placed on the platform 114. The head 149 is pushed towards the upper surface 118 so that the notches 148 receive the protrusions 116. The edges of the notches 148 frictionally engage the protrusions to grip and hold the head 149 in position. Accordingly, the tip tennistor 135 is located exactly, located substantially on the axis of the probe axis. The insulator 129 grasps the head 149 so that it is held in place prior to final assembly of the probe 107. An aluminum tip 125 is then attached to this sub-assembly. The epoxy 158 is preferably applied to the exterior of the spacer neck 147, and the tip 125 is pushed over the end of the spacer 127 over the isolator 129. The pre-applied epoxy 152 in the tip thermistor 135 couples an inner central portion of the tip 125. The complete assembled probe 107 can be placed in an oven to cure the epoxy and achieve the final fixation of the various components. Other suitable ways of securing the components together can be employed within the scope of the present invention. In a modified version of the probe of the second embodiment, the arms 143 'of the flexible circuit substrate 133 may be longer (see imaginary illustration in Figure 13) so that they extend through the insulator 129. The insulator could be formed with additional slots (not shown) to receive the arms 143 'through it. The separator thermistor 137 and resistor 139 could still be in the same location against the sides of the separator 127. In this modified version, the insulator could additionally assist in holding the arms in position after they are formed from their non-position. deformed (for example, as shown in Figure 11). It will be appreciated that other ways of locating the electrical components of the flexible circuit in place prior to final fixture can be used without departing from the scope of the present invention. A fragmentary portion of a probe 207 of a third embodiment is shown in FIG. 16. The portions of the probe 207 corresponding to the probe 7 of the first embodiment are designated by the same reference numbers, plus "200". The parts corresponding to those of the probe 107 of the second mode will be given with the same reference numbers, plus "100". A probe axis 219, tip 225 and spacer 227 can be substantially similar to the previous modalities. A flexible circuit 231 may have a deformable substrate 233 that is similar to the substrate 133 of the second embodiment shown in FIG. 11., a head 249 of the flexible circuit substrate 233 may not have the notches 148 because the head 249 is not held in place by an insulator 229 in the third embodiment. With reference to Figures 14 and 15, insulator 229 comprises a disc 208 and a flange 212 which depends on the peripheral edge margin of the disc. A slot 210 is formed in the disc 208 to receive the head 249 through the insulator 229. A resilient locator 220 extends below the disc 208. When the insulator 220 is attached to the probe 207 it flexes in the same way as the locator 120 of the second embodiment and performs the same location function of a separator thermistor 237 and resistor 239 (figure 16). A cavity 22 extended through the resilient locator 220 allows the locator to be deformed by applying a spring force to the thermistor 237 and resistor 239. The upper part of the insulating disk 208 is formed with a flat surface or bridge 262 and receives the 249 of the flexible circuit substrate 233 when flexed on the insulator 229. When the tip 225 is applied to the probe shaft 219, separator 227 and insulator 229, the tip engages a tip thermistor 235 and pushes the tip thermistor down. The bridge 262 (which acts as a reaction surface) pushes upwards to push the tip thermistor 235 towards the tip 225 and ensures good contact with the tip. The epoxy between the tip thermistor 235 and the tip 225 can be used as above to make the final fixation. As previously stated herein with respect to the second embodiment, the tip thermistor 235, separator thermistor 237 and resistor 239 could be located inside the flexible circuit substrate 233 so that the substrate (and not the tip thermistor) , separator thermistor or resistor) directly contacts the tip 225 and spacer 227 (respectively). When introducing elements of the present invention or preferred embodiments thereof, the articles "a", "an", "the" and "the" are proposed to mean that one or more of the elements exist. The terms "comprises", "includes", and "has" are proposed to be inclusive and means that there may be additional elements other than the elements listed. In addition, the use of "above", "below", "superior" and "inferior" and variations of these terms are made for convenience, but do not require any particular orientation of the components. As several changes may be made in the foregoing without departing from the scope of the invention, it is proposed that all matter contained in the above description and shown in the accompanying figures should be interpreted as illustrative and not in a limiting sense. It is noted that in relation to this date, the best method known to the applicant to carry out the aforementioned invention, is that which is clear from the present description of the invention.

Claims

CLAIMS Having described the invention as above, the contents of the following claims are claimed as property: 1. Electronic thermometer, characterized in that it comprises: a probe tip adapted to be heated at a temperature by an object for use in measuring the temperature of the object; a deformable circuit element including a deformable electrical conductor and at least one temperature sensor connected to the electrical conductor to detect the temperature of the probe tip; a probe shaft that supports the probe tip and deformable circuit element and includes an end portion; a location member supported by the probe shaft formed to locate the deformable circuit element at least temporarily. Electronic thermometer according to claim 1, characterized in that the location member has a location structure that couples the deformable circuit element to position the deformable circuit element. 3. Electronic thermometer according to claim 2, characterized in that the location structure of the location member comprises a protrusion projecting outwards from the location member and engaging the deformable circuit element. Electronic thermometer according to claim 3, characterized in that the deformable electrical conductor comprises a deformable substrate having an opening in it receiving the protrusion of the location member. Electronic thermometer according to claim 2, characterized in that the location structure comprises a platform formed with the location member, a portion of the deformable circuit element that is clamped on the platform. Electronic thermometer according to claim 5, characterized in that the platform is formed with at least one protrusion extended upwards from the platform, the protrusion captures a portion of the deformable electrical conductor of the deformable circuit element. Electronic thermometer according to claim 6, characterized in that the deformable electrical conduit comprises a deformable substrate including at least one notch, the protrusion is received in the notch to hold the deformable substrate in position in the locating member. Electronic thermometer according to claim 1, characterized in that the location member includes a bridge generally located at one end of the probe axis, the bridge engaging a portion of the deformable circuit element. Electronic thermometer according to claim 8, characterized in that the deformable circuit element additionally comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the location member deflects the other electrical device against an inner wall of the separator . Electronic thermometer according to claim 9, characterized in that the location member includes a resilient locator extended in the spacer, the locator deflects the other electrical device against the inner wall of the spacer. 11. Electronic thermometer according to claim 10, characterized in that the location member includes a cavity located to allow resilient deformation by the locator. 12. Electronic thermometer according to claim 1, characterized in that the deformable circuit element additionally comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the location member deflects the other electrical device against an inner wall of the separator. . 13. Electronic thermometer according to claim 1, characterized in that the location member comprises an insulator made of thermally insulating material. 14. Electronic thermometer according to claim 1, characterized in that it additionally comprises a base unit and a cord that connects the probe shaft to the base unit. 15. Probe for an electronic thermometer, characterized in that it comprises: a probe tip adapted to be heated to a temperature by an object for use in the measurement of the temperature of the object; a deformable circuit element including a deformable electrical conductor and at least one temperature sensor electrically connected to the electrical conductor to detect the temperature of the probe tip; a probe shaft that supports the probe tip and deformable circuit element and includes an end portion; a separator supported by the probe axis; a location member supported by the probe shaft formed to locate the deformable circuit element at least temporarily. 16. Probe according to claim 15, characterized in that the location member has a location structure that couples the deformable circuit element to position the deformable circuit element. 17. Probe according to claim 16, characterized in that the location structure of the location member comprises a protrusion projecting outward from the location member and engaging the deformable circuit element 18. Probe according to claim 17, characterized in that the deformable electrical conductor comprises a deformable substrate having an opening therein receiving the protrusion of the location member 19. Probe according to claim 16, characterized in that the location structure comprises a platform formed with the location member. a portion of the deformable circuit element is held on the platform 20. Probe according to claim 19, characterized in that the platform is formed with at least one extended protrusion of the platform, the protrusion captures a portion of the deformable electrical conductor of the platform. deformable circuit element 21. Thermometer Electronic device according to claim 19, characterized in that the deformable electrical conductor comprises a deformable substrate that includes at least one notch, the protrusion is received in the notch to hold the deformable substrate in position in the location member. 22. Probe according to claim 15, characterized in that the location member includes a bridge generally located at one end of the probe axis, the bridge engaging a portion of the deformable circuit element. 23. Probe according to claim 22, characterized in that the deformable circuit element further comprises at least one electrical device electrically connected to the deformable electrical conductor, and wherein the location element deflects the other electrical device against an inner wall of the separator. 24. Probe according to claim 23, characterized in that the location element includes a resilient locator that extends towards the separator, the locator deflects the other electric resistor against the inner wall of the separator. 25. Probe according to claim 24, characterized in that the location element includes a cavity located to allow resilient deformation by the locator. 26. Probe according to claim 15, characterized in that the deformable circuit element further comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the location element deflects another electrical device against an inner wall of the separator. 27. Method for producing a probe for an electronic thermometer characterized in that it comprises: placing a deformable circuit element together with a probe axis; deform the deformable circuit element; } connect a separator to the probe axis; connect a location element to the probe axis; interconnecting the deformable circuit element and the location element for use in locating the deformable circuit element. 28. Method according to claim 27, characterized in that the interconnection of the deformable circuit element and the location element comprises inserting an opening in the deformable circuit element into a protrusion associated with the location element. 29. Method according to claim 27, characterized in that the interconnection of the deformable circuit element and the location element comprises inserting a receiving portion of the location element into notches formed in the deformable circuit element. 30. Method according to claim 27, characterized in that it further comprises diverting from the location element a portion of the deformable circuit element against the separator.