MX2008000182A - Binary code symbol and method and apparatus for analyzing and measuring same - Google Patents

Abstract

A binary code symbol for non-linear strain measurement designed specifically for perimeter-based deformation and strain analysis. The symbol is rectangular with a continuous outer perimeter, two data regions along adjacent sides of the rectangle and a utility region adjacent each side opposite the data regions. Each data region is made up of a number of data cells, and each utility region is made up of utility cells with alternating appearance. The inner half of the utility regions can be used to store auxiliary information and/or codes. There are two distinct finder cells on opposite corners of the rectangle, which can be used to orient the symbol. A non-linear strain gage for measuring the strain on an object under load in accordance includes a target, a sensor, and a computer, wherein the target is a binary code symbol.

Description

SYMBOL OF BINARY CODE AND METHOD AND APPARATUS TO ANALYZE AND MEASURE THE SAME Field of the Invention The present invention relates to a binary code symbol for measuring nonlinear voltage. More specifically, the invention relates to a binary code symbol for the I measure the nonlinear voltage, which can encode a range of data values using an error-correction code (ECC) technique, and a voltage measurement and analysis method that uses the binary code symbol. BACKGROUND OF THE INVENTION Currently, there are numerous one-dimensional (ID) and two-dimensional (2D) symbols in use, and many use a majority of the surface area of the symbol to store the encoded information. These symbols are generally comprised of blocks, dots, or large, distinguishable bars, called "cells" that allow data encoding. The spacing, relative size, state (ie black or white), or some combination of cell attributes is exploited to encode and decrypt data. These types of symbols are designed 1 for low-resolution, low-cost reading devices (or sensors); therefore the dimensions of the cell can be relatively large with respect to the total size of the symbol. While many applications require that the encoded information of a symbol "be read," there are additional applications that guarantee a detailed count of the spatial characteristics of the symbol. Metrology is such an application, which involves making exact geometrical measurements of the characteristics of the symbol. The symbols optimized for "reading" purposes are not necessarily, nor are they normally, optimized for the purposes of "metrology". Examples of common symbols (a UPC symbol, an i Data Matrix symbol, and a MaxiCode symbol) are provided in FIGURES 1A-1C. As shown in FIGURES 1A-1C, typical 1D and 2D symbols use cell arrays that result in a perimeter of the broken (or noncontinuous) symbol. In addition, each one has cells that are distributed somewhat uniformly across the entire area of the symbol. These characteristics are an efficient use of the surface area of the symbol such as data encoder / decoder, but can cause a reduction in the accuracy for certain types of deformation analysis, for example the measurement of tension. The resolution of the sensor for metrology allowed on the machine is generally higher than the resolution of the sensor required to simply code and decrypt the symbol information. Therefore with the high resolution sensors, it is possible to relax some of the requirements of the "reader" positions in the Existing symbol design, and produce symbols specifically for strain / strain measurement.

The foregoing is the solution of these and other problems that the present invention is directed. Brief Description of the Invention It is therefore a primary object of the present invention to provide a binary code symbol for the measurement of non-linear tension having a unique geometry and attributes. It is another object of the present invention to provide a binary code symbol for the measurement of the non-linear tension having characteristics that improve strain and strain measurement. It is still another object of the present invention to provide a binary code symbol for nonlinear strain measurement that is designed specifically for the analysis of stress and strain based on the perimeter. ! It is still another object of the present invention to provide a method of analyzing the perimeter tension for use with a binary code symbol for the measurement of nonlinear voltage. 1 It is still another object of the present invention to provide a binary code symbol for non-linear voltage measurement with the approximate perimeter data coding. It is another object of the present invention to provide a; binary code symbol for nonlinear voltage measurement that can encode a range of data values using an error-correction code technique ("ECC"). These and other objects of the invention are achieved by the provision of a rectangular binary code symbol for nonlinear voltage measurement comprising a solid, continuous perimeter, first and second data regions along the adjacent sides of the perimeter, first and second regions for general application along the adjacent sides of the perimeter opposite the first and second data regions, first and second seeker cells at the opposite corners of the rectangle, and inner and outer reserved regions distinguishing the first and second data regions, the first and second regions for general application, and the first and second searching cells from their background. Each data region comprises a number of data cells, each data cell represents a single bit of binary data; and each region for general application comprises a number of cells for general application of alternating aspect. In an aspect of the invention, the first and second regions for general application of the binary code symbol each may have an internal storage half of at least one of information and auxiliary codes. In another aspect of the invention, the binary data represented by the data cells is encoded using a code error-correction algorithm, for example, a Hamming technique 7-4. A nonlinear voltage calibration according to the invention comprises a target associated with an object for which at least one of strain and fatigue damage must be measured, a sensor means for preprocessing the perceptible physical quantity emitted by the target and the output data representing the physical quantity, the sensor means is compatible with the detectable physical quantity, means for analyzing the data output by the sensor means to define the binary code symbol, and means for measuring the voltage on the object based directly in the preprocessed and analyzed data, wherein the objective comprises a rectangular binary code symbol according to the present invention. In another aspect of the invention, the nonlinear voltage calibration further comprises means for using the voltage measurement to provide the information in at least one of fatigue damage and voltage hysteresis for materials of known and unknown mechanical properties. In a method of measuring the voltage in an object directly, according to the present invention, the binary code symbol is associated with an object in such a way that the deformation of the binary code symbol and the deformation under load of the object carry a one-to-one relationship, where the binary code symbol emits a detectable physical quantity. The changes in the binary code symbol are identified as a function of time and change in the load applied to the object. The changes in the binary code symbol are then in a direct measure of the voltage. The binary code symbol according to the present invention is based on the monitoring of the deformation of the symbol geometry based on using the fundamental concepts of the nonlinear voltage analysis as revealed by V.V. Novozhilov, Foundations of the Nonlinear Theory of Elasticity, Graylock Press, Rochester NY 1953. Other objects, features, and advantages of the present invention will be apparent to those skilled in the art upon reading this specification including the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS The invention is better understood by reading the following detailed description of the preferred embodiments with reference to the figures of the accompanying drawings, in which like reference numbers refer to like elements throughout, and where: FIGURE 1A illustrates a conventional UPC symbol. FIGURE 1B illustrates a conventional Data symbol Matrix FIGURE 1C illustrates a conventional MaxiCode symbol. FIGURE 2 illustrates an exemplary scheme of a rectangular binary code symbol in accordance with the present invention.

FIGURE 3 illustrates an exemplary binary code symbol in accordance with the present invention with the coded number 27,097. FIGURE 4 illustrates the binary state of data cells in the first data region of the binary code symbol of the FIGURE 3. | FIGURE 6 shows the arrangement of FIGURES 6A and 6B. FIGURE 5 is a schematic view of a nonlinear voltage calibration according to the present invention. FIGURES 6A and 6B together are a high-level flow diagram illustrating the algorithm followed by the computer program in accordance with the present invention. Detailed Description of the Preferred Modes i In describing the preferred embodiments of the present invention illustrated in the drawings, the specific terminology is employed for reasons of clarity. However, the invention is not intended to be limited to the specific terminology thus selected, and it should be understood that each specific element includes all technical equivalents that operate in a similar manner to achieve a similar purpose. A binary code symbol for nonlinear voltage measurement according to the present invention is designed specifically for perimeter-based tension and strain analysis, while providing a self-revision / self-coding data coding. correction, robust.

The specific geometrical characteristics of the symbol are optimized for the measurement based on the perimeter, of non-linear tension using methods of discrete or analogous deformation analysis. The binary code symbol for the non-linear voltage measurement according to the present invention is different, materially and theoretically different than the symbolic voltage rosette ("SSR") as defined in the US patent application number 10 / 223,680 , filed on August 20, 2002 and published as North American publication No. 2004-0036853, since the binary code symbol according to the present invention is not based on using a voltage rosette and can measure the non-linear voltage, that the SSR can not. The binary code symbol according to the present invention is in rectangular form; It has a solid, continuous external perimeter, and allows the coding of data near the perimeter of the symbol. This unique combination of attributes significantly increases the quantity and quality of the spaced-apart features of the symbol. These unique characteristics allow the analysis of highly accurate deformation using discrete or analogous techniques. The data is encoded in proportionally smaller regions of the symbol (compared to the current symbols) therefore a higher resolution sensor is required to read and analyze the symbol.

A typical scheme of a rectangular symbol is shown in FIGURE 2. In the embodiment of FIGURE 2, the rectangular symbol 10 is square-shaped, with the continuous, solid, characteristic external perimeter 20. In the example shown in FIGURE 2 , the symbol 10 also has a solid, continuous internal perimeter, although in general, a solid, continuous internal perimeter is not required. There are two data regions 30 along the adjacent sides of the rectangle. Each data region 30 is composed of a number of data cells 30a. The symbol 10 in FIGURE 2 has twenty eight data cells 30a per data region 30; however no particular limit is placed on the number of data cells 30a per data region 30. In the case of symbols that are symmetric on a diagonal of the rectangle, the data regions may be identical to each other for the redundancy of encoded data. Each region of data opposite along one side of the rectangle, is a region for general application 40. The regions of general application 40 are composed of cells for general application 40a and 40b with an alternating aspect (i.e., foreground, background, plane, etc.). The regions for general application 40 aid in locating, orienting, and analyzing the symbol. In addition, the internal middle part 40c of the regions for general application 40 can be used to store information and / or auxiliary codes (eg vendor ID, application ID, function ID, version information, date / time, materials ID / info, etc.). There are two different search engines 50a and 50b in opposite corners of the rectangle, which can be used to orient the symbol 10. The internal and external reserved regions 60a and 60b are pointed out so that the data regions 30 , regions for general application 40, and seeker cells 50a and 50b can be distinguished from their previous ones. It is noted that in FIGURE 2, the dotted lines are used to show the boundaries of the inner and outer reserved regions 60a and 60b, but in practice, the symbol 10 does not actually include these dotted lines. In a binary code symbol according to the present invention, the information is encoded via the data cells of the symbol. An individual data cell represents a single bit of information; that is, its state is "active" or "off" (ie "1" or "0"). The order and status of the individual bit values are combined to represent a value of coded data. The binary contribution of a single data cell is indicated by the state of the cell, which is determined by a sensor. Data cells that look like the background of the symbol (or reserved region) are considered "active" or the value of the "1." bit. Data cells that look the same as the foreground (or perimeter) are considered "off" or the value of the "0." bit. An example symbol is shown in FIGURE 3. This symbol has the data value 27,097 encoded in its data regions using a code error-correction (ECC) technique. The data value is redundantly encoded in the upper and left data regions 30 (ie, the two data regions are identical). In the example of FIGURE 3, the foreground is colored black, and the background is colored white. However, there are no restrictions placed on the appearance of the foreground and the bottom of the cell unless sufficient contrast is provided to allow a sensor to determine the state of the cell. Using the above foreground and background appearance rules, the binary state information in the data cells 30 of the binary code symbol of FIGURE 3 is illustrated in FIGURE 4. The binary state of each data cell 30a, read from left to right, that is: 0,0,1,1,0,0,1,0,1,1,0,0,1,1,0,0,1,1,0,0, 1,1,1,0,0,1,1,0. This string of zeros and ones can be converted to the decimal number 27,097 using a reverse application of the Hamming technique 7-4 (ie deciphering), as discussed in more detail below. It is desirable that the encoded data be partly "self-correcting" in the event that the symbol part is damaged, scratched, or otherwise degraded. Therefore, the binary data in each data region of the symbol is encoded using an error-correction code (ECC) algorithm. The ECC algorithm combines vector-space mathematics and determined theory to convert numeric quantities into encoded values that provide a self-checking and self-correcting capability during decryption. The use of ECC algorithms plus data redundancy provides robust coding and limited protection against data loss. Using redundancy and ECC methods, the symbol in FIGURE 3, with 28 data cells per data region, can encode any data value in the range of 0 to 65,535. If the redundancy were not used, the data capacity of the symbol in FIGURE 3 would increase to the possible data values over 4-billion. The ECC algorithm used is a Hamming technique 7-4. This coding method takes the original data value (uncoded) and spaces in 4-bit "words". Each word of 4-bits is encoded in a 7-bit word that contains the original value and the three "check bits." This method allows the original 4-bit word to be retrieved in case the sensor can not determine the state of one of the bits of the 7-bit word. Therefore, the original data value can be retrieved if up to one bit in each word is lost. The Hamming technique used has an "efficient" coding of 0.571. This is calculated as the ratio of the number of original bits (NT) to the number of coded bits (N2). For the example in FIGURE 3, Ni = 16 and / N2 = 28, giving: Thus the data capacity (or number of unique combinations of data values) for a single data region in a symbol that uses the ECC coding, expressed in terms of the number of data cells per region (N2), is approximately: C = 2Ni'E The symbol is designed specifically to allow the analysis of high accuracy deformation. The solid perimeter of the symbol and the perimeter coding technique are unique attributes that significantly increase the quantity and quality of the spaced-apart characteristics of the symbol.

These qualities improve the accuracy of deformation analysis using techniques allowed in the machine, discrete or analogous. The deformation analysis can provide a detailed count of the spatial characteristics of the symbol under various conditions. For example, deformation analysis can mathematically describe geometric changes from a certain reference state to a subsequent state (for example, a change in size, shape, symmetry, etc.). The measurement of tension is a useful product of deformation analysis. Tension is a non-unit mechanical property defined as a change in length per unit length.

Referring now to FIGURE 5, a nonlinear voltage calibration 100 is shown schematically to measure the voltage in an object under load in accordance with the present invention, comprising a target 110, a sensor 120, and a computer 130, wherein the target 110 is a binary code symbol according to the present invention, which has been manufactured or identified. The binary code symbol may be composed of a plurality of sub-images, each of which has a figure center, and may be monitored by the sensor 120 to correlate the movement of the associated sub-picture figure centers. with the rectangular elements formed in the data regions 30 of the binary code symbol. Target 110 can be associated with an object by any means that results in deformation of the binary code symbol with deformation under load. The deformation of the binary code symbol and the object must have a one-to-one relationship. Objective 110 can be associated with an object for which the tension must be measured by applying it directly or indirectly to the surface of the object, or by identifying it in a preexisting pattern that defines a binary code symbol. If applied or identified, objective 110 can be incorporated into the object for which the voltage must be measured. Examples of application of an objective 110 include, but are not limited to: (1) application to a medium such as a polyimide film that is bonded, for example with glue, to the surface of the object for which the stress is to be measured (indirect application); (2) chemical attack on a surface (direct application); (3) painting on the surface (direct application); and (4) printing on a surface (direct application). The lens applications are described in detail in NASA STD 6002 and Handbook 6003. Examples of identifying an objective 110 include, but are not limited to: (1) Identification by observing the natural surface characteristics of the object that define a symbol of (code) binary on a macroscopic or microscopic scale (including as an example, but not limited to, features on the surface of the earth). (2) Identification by observing the natural subsurface features of the object that define a binary code symbol on a macroscopic or microscopic scale (including as an example, but not limited to, a fossil buried in the ground). (3) Identification by observing the artificial surface characteristics of the object that define a binary code symbol on a macroscopic or microscopic scale (including as an example, but not limited to, the collection of components). (4) Identification by observing the artificial sub-surface characteristics of the object that define a binary code symbol on a macroscopic or microscopic scale (including as examples, but not limited to, structural elements of a spacecraft covered with a skin, structural elements of a bridge covered with a skin, or the structural elements of a building that has an opaque surface in the visible spectrum). Examples of incorporating a target 110 include, but are not limited to: (1) Incorporate into the object to be studied when the object is being formed; (2) Identification of fabricated or natural sub-surface features; (3) Cover with an overlay material, such as one or more layers of paint; and (4) Implanting on a human body, on a part of the body or implant. For example, if the target 110 is located in a critical area of a hip joint or a hip implant, or in an artificial heart valve, the objective 110 can be seen through the tissue surrounding the objective 110 by a sensor 120 x-ray, and the damage from stress and fatigue to the associated body part or implant can be determined over time.

Target 110 can naturally emit a detectable physical quantity, create a detectable physical quantity, or reflect a detectable physical quantity. The detectable physical quantity may be a signal in any portion of the electromagnetic spectrum (including the audio frequency range), or it may be a field such as a magnetic field. The detectable physical quantity can be a signal that can be characterized as a grayscale image that can be converted into an image memory file. Sensors that will detect various detectable physical quantities, including all these signals and fields, are commercially available. Objective 110 is scalable, since it can be produced and detected on a scale ranging from microscopic to macroscopic. Thus, the nonlinear voltage calibration 100 according to the present invention is applicable in very large applications such as seeing a target 110 on the ground from space to determine the displacement / tension of the surface or sub-surface stresses of the earth . Everything is required to equal the sensor 120 to the scale or scope of the objective and the detectable physical quantity emitted by the objective 110. An advantage of the non-linear voltage calibration 100 is that the voltage is measured directly, as compared to the deduction of secondary measures using analogous techniques; thus making possible an explicit detectable "reading" of normal tension and shear force components. This in turn leads to greater accuracy and reduced system errors.

Another advantage of non-linear voltage calibration 100 is that the range of voltage measurements is easy from 0 to at least 50%, which allows for stress measurements in elastic materials such as rubber and plastic. The potential comes out to cover the measurements at the nanoscale level. A third, and important advantage of the nonlinear voltage calibration 100 is that the sub-surface voltages can be measured. Sub-surface measurements may have Special applications in artificial compounds. The nonlinear voltage calibration 100 can also be used in the assessment of fatigue damage (accumulation) in critical areas of structures or components of devices subject to cyclic or other loads. This is accomplished by observing the area of a component under study over a selected period of time during normal use of the area. The data can then be used to assist in the control of the life cycle of the component. The sensor 120 observes the deformation of a target 110 placed on a surface or incorporated in a material by capturing the total image of the target 110 and transmitting it to the computer 130. The sensor 120 is selected to be compatible with the detectable physical quantity emitted by the target. objective 110 and undertakes a certain previous process of the observed physical quantity to provide the data representing the! physical amount to the computer 130. In the case of a binary code symbol that can be optically monitored, the input signal to the sensor 120 may be a grayscale image that can be converted to a picture memory file, although other entries can be adjusted. Computer 130 conventionally comprises memory 130a for storing programs and data and a processor 130b to implement the programs and process the data, and j is associated with a screen 130c to display the data. While the object under study is subjected to load resulting in 1 voltage, computer 130 implements the programs that (1) identify the binary code symbol and the changes therein as a function of time and change in the load, (2) translate the changes in the binary code symbol into tension, and (3) display it in a convenient format. The data display 'can happen in real time. The technology is scalable with respect to the size of the object under study. The binary code symbol is monitored - by an optical sensor, magnetic, electromagnetic, acoustic, or other 120, as appropriate - in successive periods of time, in continuous time, random times triggered by an external event, or on a scheduled time basis. The sub-images of the binary code symbol are correlated over time to detect the movement of the figure centers of the sub-, images, and movements are quantized and used in analytical expressions to determine the stress in the directions of the used coordinate system corresponding to the plane of the surface under study. The movement of the figure centers is detected by a program implemented by the computer 130 according to the present invention, which identifies the binary code symbol and its sub-images, correlates the sub-images within a certain time the binary code symbol , determines the displacement of the figure centers of the sub-images of the binary code symbol, and uses the data obtained as input for the voltage equations as described below and produces and displays the voltage in two dimensions. Referring now to FIGS. 6A and 6B together, a high-level flowchart illustrating the algorithm followed by the computer programs according to the present invention is shown. The algorithm comprises three basic stages, image taking, voltage analysis, and data recording; and uses two types of images, a reference image, acquired without the application of a load or with a reference load on the object for which the voltage is to be measured, and the subsequent images, acquired after the reference image in the presence of a load or change to the load on the object. The image taking step comprises the following steps: The sensor 120 acquires the reference image and generates the data representing the reference image to the computer 130. A program or programs implemented by the computer 130 then analyzes the image data of the computer. reference for defining a binary code symbol, and concurrently displaying the reference image, preferably in real time, on the monitor or other display device 130c. After the analysis step, the computer 130 stores the analyzed data of the reference image. Once the reference image has been acquired, analyzed, and stored, the sensor 120 acquires a subsequent image and generates the data representing that subsequent image (i.e., the current subsequent image) to the computer 130, The acquisition of images Subsequent events may occur continuously or at predetermined intervals, or may be triggered by an external event such as the application of a load. The number of subsequent images can thus go from one to thousands. Once the data representing a subsequent image is generated to computer 130, the program analyzes them to define a binary code symbol, and concurrently displays the corresponding subsequent image, preferably in real time, on a computer monitor or other device of screen (preferably on the same monitor or other display device 130c where the reference image is being displayed, to facilitate comparison). After the analysis step, the computer 130 stores the data of the subsequent image analyzed for the current subsequent image. The stress analysis stage occurs after the image acquisition step, and is performed each time a subsequent image is acquired. In the stress analysis stage, the computer 130 calculates the tension of the stored data of the reference image and of the subsequent image data stored for the current subsequent image, based on the changes in the binary code symbol in function of time and change in the load. Thus, a new voltage calculation is made for each subsequent image. The voltage calculation can then be used as a display, as well as the provision of information about fatigue damage or stress hysteresis for materials of known and unknown mechanical properties, and data that can be used to assist in the control of the cycle of component life. The data capture stage occurs following each iteration of the stress analysis stage. In the data capture stage, the program gets the current results and writes them to a log file. 1 As will be appreciated by those skilled in the art, the flow chart of FIGURES 6A and 6B is for the purposes of illustration, and some changes can be made to the algorithm without affecting the results. For example, the deployment of reference and subsequent images may occur sequentially with the analysis of those images, as well as substantially concurrently; the acquisition and deployment of the reference and / or subsequent images can be initiated by an external event; and images can be recorded during an event and stored for processing at a later time. To measure the voltage using the symbol, a sensor is used to collect a discrete or analogous representation of the geometry of the symbol. The sensor data is used to perform an analysis of the deformation in the symbol in two or more deformation states. This analysis describes mathematically the geometric deformation, and these results can be used to calculate the voltage. It is to be understood that the present invention is not limited to the illustrated user interfaces or the order of the user interfaces described herein. The various types and styles of the user interfaces may be used in accordance with the present invention without limitation. I, Modifications and variations of the embodiments described above of the present invention are possible, as appreciated by those skilled in the art in light of the above teachings. It should therefore be understood that, within the scope of the appended claims and their equivalents, the invention may be practiced otherwise as specifically described.

Claims (10)

1. A rectangular binary code symbol for nonlinear voltage measurement, comprising:, a continuous, solid perimeter; First and second data regions along the adjacent sides of the perimeter, each data region comprises a 1 number of data cells, each data cell represents a single bit of binary data; First and second regions for general application along the adjacent sides of the perimeter and on opposite sides of the perimeter of the first and second data regions, each region for general application comprises a number Of cells for general application of alternating aspect; first and second seeker cells in the opposite corners of the rectangle; and internal and external reserved regions distinctive of the first and second data regions, the first and second regions for general application, and the first and second seeker cells of their background. The binary code symbol of claim 1, wherein the first and second regions for general application each have an internal half for storing at least one of the auxiliary information and codes. > 3. The binary code symbol of claim 1, wherein the symbol is symmetric and the first and second data regions are identical to each other for redundancy of the encoded data. 4. The binary code symbol of claim 1, wherein the binary data represented by the data cells is encoded using an error-correction code algorithm. 5. The binary code symbol of claim 4, where the code error-correction algorithm combines vector-space mathematics and theory determined for ??? convert numerical quantities into encoded values that provide the ability for self-verification and limited self-correction during decryption. 6. The binary code symbol of claim 5, wherein the algorithm used is a Hamming technique 7-4. 15 7. The nonlinear voltage calibration, which comprises: an objective associated with an object for which at least one of the fatigue and voltage damage must be measured and emit a detectable physical quantity, the objective comprises a rectangular binary code symbol for nonlinear voltage measurement, the 20 'binary code symbol includes: a solid, continuous perimeter; first and second data regions along the adjacent sides of the perimeter, each data region comprises a number of data cells, each data cell represents a single bit of binary data; first and second regions for general application along the adjacent sides of the perimeter and on opposite sides of the perimeter of the first and second data regions, each region for general application comprises a number of cells for general application of alternating appearance; first and second seeker cells in the opposite corners of the rectangle; and internal and external reserved regions distinctive of the first and second data regions, the first and second regions for general application, and the first and second seeker cells of their background; the sensor means to pre-process the detectable physical quantity emitted by the target data and generate the data representing the physical quantity, the sensor means is compatible with the physical quantity detectable; means for analyzing the output of data by the sensor means to define the binary code symbol; and means for measuring the tension in the object based directly on the pre-processed and analyzed data. 8. The nonlinear voltage calibration of claim 7, further comprising other means for using the voltage measurement to provide the information of at least one of the fatigue and stress hysteresis damage for materials of known and unknown mechanical properties. . 9. The nonlinear voltage calibration of claim 7, further comprising other means for using the voltage measurement to assist in the control of the life cycle of the component. 10. The nonlinear voltage calibration of claim 7, further comprising other means for utilizing the voltage measurement based on the collected damage accumulation data. 11, The nonlinear voltage calibration of claim 7, wherein the binary code symbol is defined a priori by manufacture. 1

2. The nonlinear voltage calibration of the claim 7, where the target is identified in a pre-exig pattern that defines the binary code symbol. 1

3. A method of measuring the voltage in an object directly, comprising the steps of: associating a binary code symbol with an object in such a way that the deformation of the binary code symbol and the deformation under load of the object bear a relation one by one, where the binary code symbol emits a detectable physical quantity and includes: a solid, continuous perimeter; first and second data regions along the adjacent sides of the perimeter, each data region comprises a number of data cells, each data cell represents a single bit of binary data; first and second regions for general application along the adjacent sides of the perimeter and on opposite sides of the perimeter of the first and second data regions, each region for general application comprises a number of cells for general application of alternating aspect; first and second seeker cells in the opposite corners of the rectangle; and internal and external reserved regions that are diguished from The first and second data regions, the first and second regions for general application, and the first and second seeker cells of their background; identify the changes in the binary code symbol as a function of time and the change in the load applied to the object; and translate the changes in the binary code symbol to a direct measure of the voltage. The method of claim 13, wherein the binary code symbol is defined a priori by the manufacturing and the association step comprises applying the binary code symbol to the object. The method of claim 13, wherein the step of; Association involves identifying the a priori binary code symbol. 16. The method of claim 13, further comprising the step of using the voltage measurement to provide the information of at least one fatigue and voltage hysteresis damage for materials of known and unknown mechanical properties. 17. The method of claim 13, further comprising the step of using the voltage measurement to assist in the control of the life cycle of the component. 18. The method of claim 13, further comprising the step of using the voltage measurement based on the accumulated damage collection data.