JPS6488264A - In-circuit tester - Google Patents

In-circuit tester

Info

Publication number
JPS6488264A
JPS6488264A JP62246007A JP24600787A JPS6488264A JP S6488264 A JPS6488264 A JP S6488264A JP 62246007 A JP62246007 A JP 62246007A JP 24600787 A JP24600787 A JP 24600787A JP S6488264 A JPS6488264 A JP S6488264A
Authority
JP
Japan
Prior art keywords
integrated circuit
state
voltage
moa
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62246007A
Other languages
Japanese (ja)
Inventor
Katsumi Nagano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62246007A priority Critical patent/JPS6488264A/en
Publication of JPS6488264A publication Critical patent/JPS6488264A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To make it possible to measure the mounted state of an integrated circuit without fail, by connecting first and second contacting means to a first terminal to which a power line of the integrated circuit is connected, or to a second terminal to which the power line is not connected. CONSTITUTION:When relay switches RL1 and RL2 are put in the ON state by the control of a control element CT, a power VS is supplied to an integrated circuit IC through a bus line BS1, the switch RL1, a probe pin CP1, a test land TL1 and a lead pin LP1. Since the switch RL2 is in the ON state, an output voltage V0 of an operational amplifier MOA for measurement turns to be as expressed by an equation V0=-Rref.VS/R. Since a conversion resistance Rref and the voltage VS are already known, a resistance value between test lands TL1 and TL2 can be determined by measuring the voltage V0 of the amplifier MOA by the control element CT, and it can be discriminated therefrom whether the mounted state of the integrated circuit IC1 is normal or not.
JP62246007A 1987-09-30 1987-09-30 In-circuit tester Pending JPS6488264A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62246007A JPS6488264A (en) 1987-09-30 1987-09-30 In-circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62246007A JPS6488264A (en) 1987-09-30 1987-09-30 In-circuit tester

Publications (1)

Publication Number Publication Date
JPS6488264A true JPS6488264A (en) 1989-04-03

Family

ID=17142073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62246007A Pending JPS6488264A (en) 1987-09-30 1987-09-30 In-circuit tester

Country Status (1)

Country Link
JP (1) JPS6488264A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0689990A (en) * 1992-04-29 1994-03-29 Motorola Inc Gate array

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0689990A (en) * 1992-04-29 1994-03-29 Motorola Inc Gate array

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