JPS57124264A - Burn-in testing equipment - Google Patents

Burn-in testing equipment

Info

Publication number
JPS57124264A
JPS57124264A JP56010022A JP1002281A JPS57124264A JP S57124264 A JPS57124264 A JP S57124264A JP 56010022 A JP56010022 A JP 56010022A JP 1002281 A JP1002281 A JP 1002281A JP S57124264 A JPS57124264 A JP S57124264A
Authority
JP
Japan
Prior art keywords
prescribed temperature
burn
temperature
minimized
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56010022A
Other languages
Japanese (ja)
Inventor
Hideyoshi Inauchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56010022A priority Critical patent/JPS57124264A/en
Publication of JPS57124264A publication Critical patent/JPS57124264A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To perform a test at low cost while minimizing the capacity of a power source part by setting the prescribed temperature of a burn-in so that current capacity that a body to be tested requires is minimized. CONSTITUTION:For a burn-in test, a body 2 to be testes is placed in a thermostatic chamber 1 held at prescribed temperature. Once a temperature detection part 6 detects the chamber being held at the prescribed temperature, its detection signal is outputted to a switch circuit 5 through a delay circuit 4. The delay circuit 4 uses a timer, etc., whose set time coincides with the time when the faying-part temperature of the body 2 to be tested reaches the prescribed temperature. Therefore, the prescribed temperature is so set that current capacity required by the body 2 is minimized, thereby constituting a power source part at low cost.
JP56010022A 1981-01-26 1981-01-26 Burn-in testing equipment Pending JPS57124264A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56010022A JPS57124264A (en) 1981-01-26 1981-01-26 Burn-in testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56010022A JPS57124264A (en) 1981-01-26 1981-01-26 Burn-in testing equipment

Publications (1)

Publication Number Publication Date
JPS57124264A true JPS57124264A (en) 1982-08-03

Family

ID=11738767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56010022A Pending JPS57124264A (en) 1981-01-26 1981-01-26 Burn-in testing equipment

Country Status (1)

Country Link
JP (1) JPS57124264A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923672U (en) * 1982-08-03 1984-02-14 日本電気株式会社 semiconductor test equipment
JPS61102880U (en) * 1984-12-10 1986-06-30
EP0333160A2 (en) * 1988-03-15 1989-09-20 Furukawa Denki Kogyo Kabushiki Kaisha Laminated board for testing electronic components

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923672U (en) * 1982-08-03 1984-02-14 日本電気株式会社 semiconductor test equipment
JPS61102880U (en) * 1984-12-10 1986-06-30
JPH0439584Y2 (en) * 1984-12-10 1992-09-16
EP0333160A2 (en) * 1988-03-15 1989-09-20 Furukawa Denki Kogyo Kabushiki Kaisha Laminated board for testing electronic components

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