JPS6372038A - Cathode-ray tube - Google Patents

Cathode-ray tube

Info

Publication number
JPS6372038A
JPS6372038A JP21383686A JP21383686A JPS6372038A JP S6372038 A JPS6372038 A JP S6372038A JP 21383686 A JP21383686 A JP 21383686A JP 21383686 A JP21383686 A JP 21383686A JP S6372038 A JPS6372038 A JP S6372038A
Authority
JP
Japan
Prior art keywords
foreign matter
electron gun
grid
particles
ray tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21383686A
Other languages
Japanese (ja)
Inventor
Masayoshi Ezawa
江澤 正義
Akira Misumi
三角 明
Takao Kawamura
河村 孝男
Yoshifumi Tomita
富田 好文
Noboru Toyama
外山 登
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP21383686A priority Critical patent/JPS6372038A/en
Publication of JPS6372038A publication Critical patent/JPS6372038A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve withstand voltage characteristic and eliminate generation of sparks by specifying the amount of foreign matter on an electron gun to be sealed in an envelope. CONSTITUTION:Foreign matter attached on an electron gun to be sealed in an envelope 10 is controlled to be particles of 1-100mum in diameters and 100-9,000 in number. As a method to control the amount of the attached foreign matter, the third grid 3 through the sixth grid 6 are immersed in washing liquid after the electron gun is assembled to be washed while being subjected to ultrasonic irradiation. At this washing, the number and the particle diameters of the foreign matter particles be removed are measured, and they are washed so as to make the remaining foreign matter particles to be 1-100mum in diameters and 100-9,000 in number. After the washing, further electron guns by sampling are immersed in washing liquid to be subjected to ultrasonic washing to confirm that foreign matter particles removed are 100-9,000 in number and 1-100mum in diameters. By this method, withstand voltage characteristic can be improved and a CRT in which no spark is generated is obtained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は陰極線管Eこ関するものである。[Detailed description of the invention] [Industrial application field] The present invention relates to a cathode ray tube E.

〔従来の技術〕[Conventional technology]

陰極線管、例えばカラーTVIご用いられるカラー陰極
線管(以下カラー受像管という)では、陽極電圧として
は20数KV以上の高電圧が印加され、またフォーカス
電圧としては前記陽極電圧の数分の一程度の電圧が、さ
らには別の電fメfこは零ないし数百ボルト程度の電圧
がそれぞれ印加さfする。
In a cathode ray tube, for example, a color cathode ray tube (hereinafter referred to as a color picture tube) used in a color TV, a high voltage of 20-odd KV or more is applied as an anode voltage, and a focus voltage is about a fraction of the anode voltage. Further, a voltage of zero to several hundred volts is applied to each of the electric currents.

このようなカラー受像管にあっては、%lえば米国特許
第3556627号明細書jこ示すよう1こ、電子銃を
外囲器内Iこ封入する前に清浄化する手段が講じられて
いる。
For such color picture tubes, as shown in US Pat. No. 3,556,627, measures are taken to clean the electron gun before it is enclosed in the envelope. .

また他の手段として、電子銃を構成する各電極部品をプ
レス成形したのち洗浄し、これをり11−ノルーム内で
電子銃Iこ組立て、更1こその後この電子銃を洗浄剤に
浸漬した状態で超音波を照射して洗浄を行い電子銃を清
浄化する方法が提案されている。
As another method, each electrode part constituting the electron gun is press-molded and then cleaned, and then the electron gun is assembled in a 11-room, and after that, the electron gun is immersed in a cleaning agent. A method of cleaning the electron gun by irradiating it with ultrasonic waves and cleaning it has been proposed.

さらに外囲器内に電子銃を封入し真空気密1こ封止した
後、所定の電極Eこ高電圧を印加して封入されている異
物及び電極の微小凸起などを消滅させる方法(スポット
ノッキング)が提案されている。
Furthermore, after enclosing an electron gun in the envelope and sealing it vacuum-tight, a high voltage is applied to a predetermined electrode E to eliminate the enclosed foreign matter and minute protrusions on the electrode (spot knocking). ) has been proposed.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが前述のような従来の方法で電子銃を〃を浄化し
ても異物付着により動作中にスパークが発生し耐電圧特
性の点で問題があり、また逆に極端に清浄化が進み過ぎ
ると前述のスポットノッキングに支障を来たすという問
題があった。
However, even if an electron gun is cleaned using the conventional method described above, sparks are generated during operation due to foreign matter adhering to the gun, causing problems in terms of voltage resistance characteristics.On the other hand, if the cleaning progresses too much, There was a problem in that it interfered with spot knocking.

本発明の目的は、耐電圧特性を向上させスパークの発生
のない陰極線管を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a cathode ray tube that has improved voltage resistance characteristics and does not generate sparks.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、外囲器内fこ封入される電子銃の異物の量を
制御することにより上記目的を達成するものである。
The present invention achieves the above object by controlling the amount of foreign matter contained in the envelope of the electron gun.

〔作用〕[Effect]

電子銃〔こ付着する異物の袋を特定することにより、異
物1こよって誘起されるスパークを防止すると共番こ微
小の異物よりスポットノツキング工程ヲ制御することが
できる。
By identifying the bag of foreign matter that adheres to the electron gun, it is possible to prevent sparks induced by the foreign matter 1, and to control the spot knocking process from the minute foreign matter.

〔実施例〕〔Example〕

以下、本発明を図面;こ示す実施例により説明する0 まず、第1図は本発明の陰極線管の一実施例を示す側面
図、@2図は第1図の要部拡大断面図で、図においてK
はカンード、1〜6は第1グ11ツド〜第6グリツド、
7はコンタクトスプリング、8は内側導電膜、9はネッ
ク管、10は外囲器、11は第6グリツド6とコンタク
トスプリング7間1こ配置されたシールドカップ、12
([光面、13はシャドウマスクで、前記第6グリツド
6には内側導電膜8及びコンタクトスプリング7を介シ
テ陽極電圧が印加され、才た第3グリツド3以下の各電
極にはステム側からそれぞれ所定の電圧が印加され、さ
らに第5グリツド5は第3グリツド3と、また第4グリ
ツド4は第6グリツド6とそれぞれ管内で接続されてい
る。さら(こ前記電子銃部分に付着する異物を1〜10
0μmの粒子径でその付着量を100〜9000個tこ
制御している。
Hereinafter, the present invention will be explained with reference to the drawings and examples shown. First, FIG. 1 is a side view showing an embodiment of the cathode ray tube of the present invention, and FIG. 2 is an enlarged sectional view of the main part of FIG. 1. In the figure, K
is Kando, 1 to 6 are 1st to 6th grid,
7 is a contact spring, 8 is an inner conductive film, 9 is a neck tube, 10 is an envelope, 11 is a shield cup placed between the sixth grid 6 and the contact spring 7, 12
(The light surface 13 is a shadow mask, an anode voltage is applied to the sixth grid 6 through the inner conductive film 8 and the contact spring 7, and each electrode of the third grid 3 and below is connected from the stem side.) A predetermined voltage is applied to each, and the fifth grid 5 is connected to the third grid 3, and the fourth grid 4 is connected to the sixth grid 6 within the tube. 1 to 10
The adhesion amount is controlled at 100 to 9,000 particles with a particle size of 0 μm.

この異物付着量の制御方法としては、電極自体で処理を
行うことは勿論であるが、電子銃組立後、第3グリツド
3〜第6グリツド6を洗浄液中Eこ浸漬し超音波照射し
ながら洗浄を行う。この洗浄の際除去される付着異物の
数と粒子径を計測し、残存する異物が粒子径1〜100
μm、数量が100〜9000個になるように洗浄する
。なお、洗沿液七しては純水有機溶媒等を含む組成のも
のを用い、洗浄時間は電子銃の構造1こより異なるが、
図示の如き構造であれば約10分間洗浄すればよい。
As a method of controlling the amount of foreign matter adhering, it is of course possible to treat the electrode itself, but after assembling the electron gun, the third grid 3 to the sixth grid 6 are immersed in a cleaning solution and cleaned while irradiating them with ultrasonic waves. I do. The number and particle size of the attached foreign matter removed during this cleaning is measured, and the remaining foreign matter is determined to have a particle size of 1 to 100.
Wash so that the number of particles is 100 to 9000 μm. Note that the cleaning liquid used is one with a composition containing pure water and an organic solvent, and the cleaning time differs depending on the structure of the electron gun.
If the structure is as shown in the figure, cleaning may be performed for about 10 minutes.

その洗浄後頁(こ抜取りにより電子銃を新しい洗浄液中
に浸が1して超音波洗浄を行い、除去される異物が粒子
径1〜100μ扉のものが100〜9000個であるこ
とを確認する。
After cleaning, remove the electron gun by immersing it in fresh cleaning solution and performing ultrasonic cleaning, and confirm that the number of foreign particles removed is 100 to 9,000 particles with a particle size of 1 to 100μ. .

この洗浄により除去される異物及び残存する付着異物の
物質は、無機物、金属系、有機物系の各異物で、前記洗
浄液に対しイオン性及び非イオン性を呈するものである
The foreign matter removed by this cleaning and the remaining attached foreign matter are inorganic, metallic, and organic foreign matter, and exhibit ionic and nonionic properties with respect to the cleaning solution.

このような構造からなる陰極線管1こついて第3flp
iこ示すような結線でリーク電流を測定した結果、第4
図iこ示すように従来構造の特性a1こ比べ本発明にお
いては、特性すに示すようにリーク電流がW以下fこ低
法しており、耐定圧が2〜8KV程度向上している。ま
た本発明より更(こ異物付着量を減らしたものではスポ
ットノッキング工程に問題があり、特性aとほぼ同様な
傾向であった。また第5図は、縦軸をこリーク電流と印
加電圧の二乗の比を、また横軸は印加電圧の逆数をとっ
たものであるが、この図からも明らかなように、本発明
になるものの特性Cは、従来構造の特fidに比べ格段
に特性向上がはかられている。
Cathode ray tube 1 consisting of such structure and 3rd flp
i As a result of measuring the leakage current with the wiring shown, the fourth
As shown in Figure I, compared to the characteristics a1 of the conventional structure, in the present invention, as shown in the characteristics, the leakage current is less than W or less, and the withstand voltage is improved by about 2 to 8 KV. In addition, in the case where the amount of foreign matter attached was further reduced than that of the present invention, there was a problem in the spot knocking process, and the tendency was almost the same as characteristic a. The square ratio is taken, and the horizontal axis is the reciprocal of the applied voltage.As is clear from this figure, the characteristic C of the present invention is significantly improved compared to the characteristic fid of the conventional structure. is being measured.

なお、上述の実施例では第1グリツド〜第6グリツドま
でのグリッド電極を有するもの1こついて説明したが、
本発明は他の電極構造のものにおいても同様に適用でき
ることは勿論である。
In addition, in the above-mentioned embodiment, one example having grid electrodes from the first grid to the sixth grid was explained.
Of course, the present invention can be similarly applied to other electrode structures.

〔発明の効果〕〔Effect of the invention〕

以上の如く、本発明によれば、リーク電流を従来構造f
こ比べ半減でき、スパークの発生がなく耐電圧特性の向
上を可能にしたものである。
As described above, according to the present invention, the leakage current can be reduced by the conventional structure f.
This can be reduced by half compared to the previous model, and there is no generation of sparks, making it possible to improve the withstand voltage characteristics.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の陰極線管の一実施例を示す側面図、第
2図は第1図の要部拡大断面図、第3図はリーク電流測
定回路図、第4図及び第5図は特性図である。 1〜6・・・第1〜第6グリツド、  8・・・内αI
!J導′に膜、9・・・ネック管、     10・・
・外囲器。 1\飄 代理人 弁理士 小 川 勝 男  ゛)4第1図 10:ダI[ffi忌9 12:壁尤面 13:シャF゛ウマスフ fa2図 1〜6 : 争ら 1〜$67−リ・7 ドア:コン′
77トスプリン7゛ 8:内イQ“j導電順 9: ;¥・ソ7)念1 10:  714弓 才4 11:ラールF′力・/7″ 第3図 1へ6: 猶1〜情6り゛す7V。 7: コンツクトス76す〉7゛ II : 云−Iレド゛〃・・ノブ0 第4図 陽崖り電瓜=Eb (にV)
FIG. 1 is a side view showing an embodiment of the cathode ray tube of the present invention, FIG. 2 is an enlarged sectional view of the main part of FIG. 1, FIG. 3 is a leakage current measurement circuit diagram, and FIGS. 4 and 5 are It is a characteristic diagram. 1 to 6...1st to 6th grid, 8...Inner αI
! Membrane in J conductor, 9... neck tube, 10...
・Envelope. 1 \ Agent Patent Attorney Katsuo Ogawa ゛) 4 Figure 1 10: Da I・7 Door: Con'
77 Tosprin 7゛8: Inner IQ "j conduction order 9: ; ¥・So 7) Nen 1 10: 714 Bow Sai 4 11: Ral F'force・/7" To Figure 3 1 6: Yu 1~Jō 6ris 7V. 7: Kontsuktosu 76su〉7゛II: 云-I red゛〃...knob 0 Figure 4 Sun cliff electric gourd = Eb (to V)

Claims (1)

【特許請求の範囲】 1、外囲器と、この外囲器内に封入された電子銃とを有
する陰極線管において、前記電子銃に付着する1〜10
0μmの粒子径の異物を100〜9000個としたこと
を特徴とする陰極線管。 2、前記異物が無機質異物、有機質異物及び金属系異物
からなり、かつ清浄剤に対しイオン性及び非イオン性を
呈することを特徴とする特許請求の範囲第1項記載の陰
極線管。
[Scope of Claims] 1. A cathode ray tube having an envelope and an electron gun enclosed in the envelope, in which 1 to 10 particles attached to the electron gun are provided.
A cathode ray tube comprising 100 to 9,000 foreign particles with a particle size of 0 μm. 2. The cathode ray tube according to claim 1, wherein the foreign matter is composed of an inorganic foreign matter, an organic foreign matter, and a metallic foreign matter, and exhibits ionic and nonionic properties with respect to a cleaning agent.
JP21383686A 1986-09-12 1986-09-12 Cathode-ray tube Pending JPS6372038A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21383686A JPS6372038A (en) 1986-09-12 1986-09-12 Cathode-ray tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21383686A JPS6372038A (en) 1986-09-12 1986-09-12 Cathode-ray tube

Publications (1)

Publication Number Publication Date
JPS6372038A true JPS6372038A (en) 1988-04-01

Family

ID=16645832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21383686A Pending JPS6372038A (en) 1986-09-12 1986-09-12 Cathode-ray tube

Country Status (1)

Country Link
JP (1) JPS6372038A (en)

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