JPS63182959A - Photoelectric conversion device - Google Patents

Photoelectric conversion device

Info

Publication number
JPS63182959A
JPS63182959A JP62014502A JP1450287A JPS63182959A JP S63182959 A JPS63182959 A JP S63182959A JP 62014502 A JP62014502 A JP 62014502A JP 1450287 A JP1450287 A JP 1450287A JP S63182959 A JPS63182959 A JP S63182959A
Authority
JP
Japan
Prior art keywords
photoelectric conversion
conversion device
light
photoconductor film
cds
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62014502A
Other languages
Japanese (ja)
Inventor
Kosuke Ikeda
光佑 池田
Hiroko Wada
裕子 和田
Noboru Yoshigami
由上 登
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62014502A priority Critical patent/JPS63182959A/en
Publication of JPS63182959A publication Critical patent/JPS63182959A/en
Pending legal-status Critical Current

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  • Solid State Image Pick-Up Elements (AREA)
  • Facsimile Heads (AREA)

Abstract

PURPOSE:To improve reproducibility with halftone by means of a CdS system photoconductive device having a large photoelectric current and to realize fast reading, by using a photoconductive device which shows the characteristic of the rise time of the photoelectric current of two and half or more times the fall time. CONSTITUTION:The photoconductive device which shows the characteristic of the rise time of the photoelectric current of two and half or more times the fall time is used. And a device is formed so that, out of the beams of light of a light source, a stationary bias beam of light due to a minimum reflected light component from an original, an inductive light system, and a leakage component from the neighborhood of the system is projected on the photoconductive device, and the rise time of the photoelectric current goes under twice the fall time. As the photoconductor film, a material in which a II-IV compound semiconductor is used as an organism is used. For example, as the photoconductor film, the material in which a CdS, a CdSe, or a CdS-CdSe is used as the organism is used. And by using a sensor array having a device to satisfy a condition of Cu concentration=0.05-0.3mol%, and film thickness=3250-5000Angstrom and using a photoelectric conversion device in which a LED array and an optical focusing fiber array are combined, the reading speed more than 4ms/line assuming the illuminance of an original plane as 100lux, can be obtained. Also, superior reproducibility with halftone can be obtained.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はファクシミリ、インテリジェントコピアなど各
種0ム機器の画像入力用光電変換装置に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a photoelectric conversion device for inputting images of various kinds of digital devices such as facsimiles and intelligent copiers.

従来の技術 近年、ファクシミリを始めとする各種OA機器の画像入
力部の小型化や画像ひずみの改良全四指して、原稿幅と
同一寸法の光電変換装置いわゆる密着型ラインセンサの
開発・実用化が進んできた。
Background of the Invention In recent years, advances have been made in miniaturizing the image input units of various office automation equipment such as facsimiles and improving image distortion, and the development and practical use of photoelectric conversion devices, so-called contact-type line sensors, whose dimensions are the same as the width of the document. It has progressed.

この様なラインセンサの受光部として、大きな光電流が
得られる光導電型素子を用いることは周辺回路の構成が
簡単であるので大変有利である。光導電型素子のうち、
CdS −CtlSe  を用いたものは光電流が桁違
いに大きく最も実用化が進んでいる。
It is very advantageous to use a photoconductive element that can obtain a large photocurrent as the light receiving section of such a line sensor because the peripheral circuitry is simple. Among photoconductive elements,
The one using CdS-CtlSe has an order of magnitude larger photocurrent and has been put into practical use the most.

一方、情報伝達の質の向上、高速化の要望に伴い、この
光導電素子を流れる光電流の照度に対する比例性、光応
答速度の向上が強く望まれている。
On the other hand, with the demand for improved quality and faster information transmission, there is a strong desire to improve the proportionality of the photocurrent flowing through the photoconductive element to the illuminance and the optical response speed.

この両特性の向上により中間調の再現性が向上し、かつ
高速読取が可能となる。
The improvement in both characteristics improves the reproducibility of halftones and enables high-speed reading.

発明が解決しようとする問題点 さて、光導電素子を流れる光電流J、の照度りに対する
比例性は普通、J p oc L+γとして表わされる
。光電流の大きなCd5−CdSe  セ/す(例えば
組成比6:4)では、通常の原稿面照度5o〜100 
duxでこのγ値が0.6〜o、76と小さい。
Problems to be Solved by the Invention The proportionality of the photocurrent J flowing through a photoconductive element to the illuminance is usually expressed as J p oc L+γ. For Cd5-CdSe cells with large photocurrent (for example, composition ratio 6:4), the normal document surface illuminance is 5o~100
The γ value of dux is as small as 0.6 to 76.

読取画像の中間調を忠実に再現するにはγ値が1に近い
程良いが、少なくとも0.8以上であることが望ましい
In order to faithfully reproduce the halftones of a read image, the closer the γ value is to 1, the better, but it is desirable that the γ value is at least 0.8 or more.

まだ、光導電素子の光応答速度は、その光電流の立上り
時間τr(Jp が0から飽和値の50チに上がるまで
の時間)、立下り時間τ(1(Jpが飽和値からその6
0%に下がるまでの時間)で表わせる。Cd5−CdS
e センサ(組成比6:4)では、100 duxのパ
ルス光に対してτ1が3〜s ms。
However, the photoresponse speed of a photoconductive element is determined by the rise time τr (the time it takes for Jp to rise from 0 to the saturation value of 50 degrees) and the fall time τ (1 (the time it takes for Jp to rise from the saturation value to 60 degrees) of the photocurrent).
It can be expressed as the time it takes for the value to drop to 0%). Cd5-CdS
e sensor (composition ratio 6:4), τ1 is 3 to s ms for pulsed light of 100 dux.

τdが2.5〜3msと遅く、実際の読取速度を1゜〜
sms/dine  に制限している。
τd is slow at 2.5~3ms, and the actual reading speed is 1°~
Limited to SMS/dine.

本発明は以上の様な欠点を大幅に改善した光電変換装置
を提供せんとするものである。
The present invention aims to provide a photoelectric conversion device that has significantly improved the above-mentioned drawbacks.

問題点を解決するための手段 本発明は、絶縁性透明基板の上に、光導電体膜に対向電
極を設けた光導電素子を主走査方向に複数個並べて形成
し、光源からの照明光が原稿に当たり、その原稿からの
反射光が導光系例えば集束性光ファイバアレイなどを経
て光導電素子に当たる構成の光電変換装置において、光
電流の立上り時間が立下り時間の2.5倍以上の特性を
示す光導電素子を用い、前記光源の光のうち前記原稿か
らの最少反射光成分(黒地の場合でも必らず2〜3チの
反射光成分がある)および前記導光系およびその周辺か
らの洩れ成分による光がバイアス光(3〜6%以上にも
なる)として常時前記光導電素子に当たり、前記光電流
の立上り時間が立下り時間の2倍以下となったことを特
徴とする光電変換装置である。
Means for Solving the Problems The present invention forms a plurality of photoconductive elements arranged in the main scanning direction on an insulating transparent substrate, each of which has a photoconductor film provided with a counter electrode. In a photoelectric conversion device in which the light reflected from the original hits a photoconductive element through a light guide system, such as a focusing optical fiber array, the rise time of the photocurrent is 2.5 times or more the fall time. Using a photoconductive element that exhibits A photoelectric conversion characterized in that the light due to the leakage component always hits the photoconductive element as bias light (3 to 6% or more), and the rise time of the photocurrent is less than twice the fall time. It is a device.

作用 例えばCd5−CdSeセンサの場合、Ca量を多くす
るか膜厚を薄くすると光電流Jp  とその立下り時間
τdは小さくなり、一方立上り時間τ1とγ値は大きく
なる。τ、=τdX (2,5〜10 )に設計してお
くと数多の定常バイアス光照射でτr≦τd×2程度に
小さくなり大幅な高速化が可能である。CdSeの組成
比を大きくしてもτr=τd×5程度にできるがバイア
ス光効果はずっと小さい。
Effect: For example, in the case of a Cd5-CdSe sensor, increasing the amount of Ca or decreasing the film thickness decreases the photocurrent Jp and its fall time τd, while increasing the rise time τ1 and the γ value. By designing τ, = τdX (2,5 to 10), τr≦τd×2 can be achieved by irradiating a large number of steady bias lights, and a significant increase in speed is possible. Even if the composition ratio of CdSe is increased, τr=τd×5 can be achieved, but the bias light effect is much smaller.

実施例 上記発明は下記実施例、すなわち大きな光電流が得られ
る光導電体膜を用いた光導電素子では、光電流の立下り
時間を小さく設計すれば、γ値を大きくできるという事
実を利用することによって実現される。具体的には、例
えばCd5−1dseの光導電体膜を用いた場合、添加
するCu量を多めにすること、あるいはCd5−CdS
eの膜厚を薄くすることによって実現される。τrがτ
dの2.5〜10倍のとき、僅か3〜5%程度の定常バ
イアス光の付加で著しいτ1 の減少が見られ、τdの
2倍以下にすることができる。Cd5−CdSeの組成
比を変えてもτrをτdよシずっと大きくできるが、例
えばその組成比を2二8にすればτ1はτdの6倍程度
になるが、この場合は3〜5チ程度のバイアス光成分て
てrをτdの2倍程度にすることはできない。
Embodiment The above invention utilizes the following embodiment, that is, the fact that in a photoconductive element using a photoconductor film that can obtain a large photocurrent, if the fall time of the photocurrent is designed to be small, the γ value can be increased. This is achieved by Specifically, for example, when using a Cd5-1dse photoconductor film, it is necessary to add a large amount of Cu, or to add Cd5-CdS.
This is achieved by reducing the film thickness of e. τr is τ
When d is 2.5 to 10 times, a significant decrease in τ1 is observed by adding only about 3 to 5% of steady bias light, and it is possible to reduce τ1 to less than twice τd. Even if the composition ratio of Cd5-CdSe is changed, τr can be made much larger than τd. For example, if the composition ratio is set to 228, τ1 will be about 6 times τd, but in this case, it will be about 3 to 5 times. It is not possible to make r approximately twice as large as τd in terms of the bias light component.

光導電体膜としてはH−VI族化合物半導体、なかでも
cas、casθあるいはCd5−Cd5θを全体とし
て成るものが好ましく、特に少通のOuおよび/あるい
はC1を不純物として含むことは効果的である。Cuの
添加はγ値を大きくし、Cgの添加は光電流を大きくす
る。CdS、CdSeあるいはCd5−CdSeを全体
とする光導電体膜は470〜600’Cの高温で、Cr
1C12蒸気を含む雰囲気中で加熱すると特に大きな光
電流が得られ、安定性にも優れる。このCdS、CdS
eあるいはCd5−CdSeを用いたものでのCu量は
0.06モル係以上、0.3モルチ以下が好ましく、ま
たCdCd2 蒸気を含む雰囲気中で加熱されたもので
はその膜厚が3260Å以上、500oÅ以下が特に優
れた結果を生む。Cu量が0.05モルチ以下、膜厚が
6000Å以上ではγ値の改善が不充分であり、τdも
大きく、Cu量が0.3%以上、膜厚が325゜へ以下
ではJpが小さくなってしまう。
The photoconductor film is preferably composed entirely of H-VI group compound semiconductors, especially cas, casθ, or Cd5-Cd5θ, and it is particularly effective to include small amounts of O and/or C1 as impurities. Addition of Cu increases the γ value, and addition of Cg increases the photocurrent. A photoconductor film made entirely of CdS, CdSe or Cd5-CdSe is heated to a high temperature of 470 to 600'C.
When heated in an atmosphere containing 1C12 vapor, a particularly large photocurrent can be obtained and excellent stability can be obtained. This CdS, CdS
The amount of Cu in a film using e or Cd5-CdSe is preferably 0.06 molar or more and 0.3 molar or less, and in a film heated in an atmosphere containing CdCd2 vapor, the film thickness is 3260 Å or more and 500 Å or more. The following will give particularly good results. When the Cu amount is less than 0.05 molti and the film thickness is more than 6000 Å, the improvement of the γ value is insufficient and τd is also large, and when the Cu amount is more than 0.3% and the film thickness is less than 325°, Jp becomes small. It ends up.

他の、より具体的実施例について述べる。すなわち、ガ
ラス基板(コー二/グ了069.230X25X1.2
7)上に、Cd5o6Sθ。、4:Cu薄膜を蒸着形成
し、フォトエツチング法により主走査方向に島状に8ビ
ツト/ffの割合で1728ビツト配置する。この島状
膜を550’Cでeach2 蒸気を含む雰囲気中で加
熱して光導電体膜とした後、島状膜の各々にNiCr/
ムUの対向電極すなわち共通側電極と個別側電極を形成
する。対向電極のギャップは60μmであり、島状膜の
幅は100μmである。なお光導電体膜中のCu量は母
体Ca5o、6Sso、41 モ/L=に対してo、0
1〜0.5 モル%であり、膜厚は3000〜55oO
人である。
Other, more specific examples will be described. In other words, the glass substrate (Koji/Gryo069.230
7) Above, Cd5o6Sθ. , 4: A Cu thin film is formed by vapor deposition, and 1728 bits are arranged in an island shape in the main scanning direction at a rate of 8 bits/ff by photoetching. After heating this island-like film at 550'C in an atmosphere containing each2 vapor to form a photoconductor film, each island-like film was coated with NiCr/
Form U's opposing electrodes, that is, a common side electrode and individual side electrodes. The gap between the opposing electrodes was 60 μm, and the width of the island-shaped film was 100 μm. Note that the amount of Cu in the photoconductor film is o, 0 with respect to the matrix Ca5o, 6Sso, 41 mo/L=
1 to 0.5 mol%, and the film thickness is 3000 to 55oO
It's a person.

この様にして作製した各光導電素子アレイのうち各々1
素子ずつを選びその特性を測定した。すなわち、DC1
0V印加下、1田で点滅(o、5secずつ)するLE
D光(s7o、w)を照射し、光導電素子面での照度を
100duxとして、その光電流、その立上り時間、立
下り時間およびγ値(50−100lux間)を求めた
。また同種のLEDで31ux定常バイアス光として照
射した場合の特性も併せて測定した。これのJp、γに
およぼす効果は小さいので無視する。
Of each photoconductive element array produced in this way, each
We selected each element and measured its characteristics. That is, DC1
LE flashes at 1 field (o, 5 seconds each) under 0V application
D light (s7o, w) was irradiated, and the photocurrent, its rise time, fall time, and γ value (between 50 and 100 lux) were determined with the illuminance on the photoconductive element surface set to 100 dux. In addition, the characteristics when irradiated with 31 ux steady bias light using the same type of LED were also measured. The effect of this on Jp and γ is small, so it is ignored.

これらの結果を第1表(a) 、 (b)にまとめる。These results are summarized in Table 1 (a) and (b).

(a)は膜厚を一定(4500人ンとしてCu濃度を変
えたものであり、(b)ばCu濃度を一定(0,1モル
%)にして膜厚を変えたものである。何れも上段はJ。
(a) is a film with a constant film thickness (4,500 people) and the Cu concentration is changed, and (b) is a film with a constant Cu concentration (0.1 mol%) and a change in film thickness. The top row is J.

(μム)〔τr(ms)−τd(ms))γであり、下
段はバイアス光3%付加時の〔τr(mS)−τd(m
s)〕である。
(μm) [τr (ms) - τd (ms)) γ, and the bottom row shows [τr (mS) - τd (m
s)].

(IL)  膜厚4SoO人 (b)  Cufi度0.1モル% この様にCu濃度を高めることと膜厚を薄くすることに
よって高いγ値と高速応答性が得られることが分ったo
 、rp、> 10μ人、τr、τd≦2.4mB(4
ms/1ineの読取速度に相当する)、γ〉o、s 
 1充たす条件は(a)でCu濃度=0.05〜0.3
モk % 、(b)で膜厚=3260〜500o入であ
る。
(IL) Film thickness: 4SoO (b) Cufi degree: 0.1 mol% It was found that a high γ value and high-speed response can be obtained by increasing the Cu concentration and decreasing the film thickness.
, rp, > 10μ, τr, τd≦2.4mB (4
corresponding to a reading speed of ms/1ine), γ〉o, s
The conditions to satisfy 1 are (a), Cu concentration = 0.05 to 0.3
Mok %, (b) film thickness = 3260-500o.

上記条件を充たす素子を有するセンサアレイを用い、L
EDアレイおよび光集束性7アイバアレイと組み合わせ
た光電変換装置を用い、原稿面照度を1001uxとし
た場合には4m515ins以上の読取速度が得られ、
しかも中間調の再現性が極めて優れたものとなる。
Using a sensor array having elements that satisfy the above conditions, L
Using a photoelectric conversion device combined with an ED array and a light-focusing 7-eyebar array, a reading speed of 4m515ins or more can be obtained when the illuminance of the document surface is 1001ux.
Moreover, the reproducibility of intermediate tones is extremely excellent.

発明の効果 本発明により、光電流の大きいCdS系光導電素子を用
い、中間調の再現性に優れた、しかも高速読取が可能な
光電変換装置が得られ、その工業的意義は大きい。
Effects of the Invention According to the present invention, a photoelectric conversion device using a CdS-based photoconductive element with a large photocurrent, excellent in reproducibility of halftones, and capable of high-speed reading can be obtained, which has great industrial significance.

Claims (6)

【特許請求の範囲】[Claims] (1)絶縁性透明基板の上に、光導電体膜に対向電極を
設けた光導電素子を主走査方向に複数個並べて形成し、
光源からの照明光が原稿に当たり、その原稿からの反射
光が導光系を経て光導電素子に当たる構成の光電変換装
置において、光電流の立上り時間が立下り時間の2.5
倍以上の特性を示す光導電素子を用い、前記光源の光の
うち前記原稿からの最少反射光成分(黒地)および前記
導光系およびその周辺からの洩れ成分による定常バイア
ス光が前記光導電素子に当たり、前記光電流の立上り時
間が立下り時間の2倍以下となることを特徴とする光電
変換装置。
(1) On an insulating transparent substrate, a plurality of photoconductive elements each having a photoconductor film provided with a counter electrode are formed side by side in the main scanning direction,
In a photoelectric conversion device configured such that illumination light from a light source hits a document and reflected light from the document passes through a light guide system and hits a photoconductive element, the rise time of the photocurrent is 2.5 times longer than the fall time.
Using a photoconductive element that exhibits a characteristic more than double that of the light source, steady bias light from the minimum reflected light component (black background) from the document and leakage components from the light guide system and its surroundings is transmitted to the photoconductive element. A photoelectric conversion device characterized in that the rise time of the photocurrent is twice or less than the fall time.
(2)光導電体膜がII−VI族化合物半導体を生体として
成ることを特徴とする特許請求の範囲第1項記載の光電
変換装置。
(2) The photoelectric conversion device according to claim 1, wherein the photoconductor film is made of a II-VI group compound semiconductor as a living body.
(3)光導電体膜がCdS、CdSeあるいはCdS−
CdSeを生体として成ることを特徴とする特許請求の
範囲第2項記載の光電変換装置。
(3) The photoconductor film is CdS, CdSe or CdS-
The photoelectric conversion device according to claim 2, characterized in that it is made of CdSe as a living body.
(4)光導電体膜が少量のCuおよび/あるいはClを
不純物として含むことを特徴とする特許請求の範囲第3
項記載の光電変換装置。
(4) Claim 3, characterized in that the photoconductor film contains a small amount of Cu and/or Cl as an impurity.
The photoelectric conversion device described in .
(5)光導電体膜中のCu量が0.05モル%以上、0
.3モル%以下であることを特徴とする特許請求の範囲
第4項記載の光電変換装置。
(5) The amount of Cu in the photoconductor film is 0.05 mol% or more, 0
.. 5. The photoelectric conversion device according to claim 4, wherein the content is 3 mol% or less.
(6)光導電体膜の膜厚が3250Å以上、5000Å
以下であることを特徴とする特許請求の範囲第5項記載
の光電変換装置。
(6) The thickness of the photoconductor film is 3250 Å or more and 5000 Å
A photoelectric conversion device according to claim 5, characterized in that:
JP62014502A 1987-01-23 1987-01-23 Photoelectric conversion device Pending JPS63182959A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62014502A JPS63182959A (en) 1987-01-23 1987-01-23 Photoelectric conversion device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62014502A JPS63182959A (en) 1987-01-23 1987-01-23 Photoelectric conversion device

Publications (1)

Publication Number Publication Date
JPS63182959A true JPS63182959A (en) 1988-07-28

Family

ID=11862834

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62014502A Pending JPS63182959A (en) 1987-01-23 1987-01-23 Photoelectric conversion device

Country Status (1)

Country Link
JP (1) JPS63182959A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007153327A (en) * 2005-12-05 2007-06-21 Adm21 Co Ltd Wiper blade

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007153327A (en) * 2005-12-05 2007-06-21 Adm21 Co Ltd Wiper blade

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