JPS5223986A - Method of detecting surface flaws - Google Patents

Method of detecting surface flaws

Info

Publication number
JPS5223986A
JPS5223986A JP9982275A JP9982275A JPS5223986A JP S5223986 A JPS5223986 A JP S5223986A JP 9982275 A JP9982275 A JP 9982275A JP 9982275 A JP9982275 A JP 9982275A JP S5223986 A JPS5223986 A JP S5223986A
Authority
JP
Japan
Prior art keywords
detecting surface
surface flaws
inspected
detection
points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9982275A
Other languages
Japanese (ja)
Inventor
Takao Sugimoto
Isamu Ichijima
Kazuo Miyagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP9982275A priority Critical patent/JPS5223986A/en
Publication of JPS5223986A publication Critical patent/JPS5223986A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Abstract

PURPOSE:To make the points of detection in a material being inspected at least two or more mutually adjacent points, and receive the projection of each detection point with each separate photoelectric converting device thereby eliminating false detection owing to disturbance by the light reflected form the surface of of the material beibg inspected.
JP9982275A 1975-08-19 1975-08-19 Method of detecting surface flaws Pending JPS5223986A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9982275A JPS5223986A (en) 1975-08-19 1975-08-19 Method of detecting surface flaws

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9982275A JPS5223986A (en) 1975-08-19 1975-08-19 Method of detecting surface flaws

Publications (1)

Publication Number Publication Date
JPS5223986A true JPS5223986A (en) 1977-02-23

Family

ID=14257510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9982275A Pending JPS5223986A (en) 1975-08-19 1975-08-19 Method of detecting surface flaws

Country Status (1)

Country Link
JP (1) JPS5223986A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565545A (en) * 1978-11-13 1980-05-17 Nhk Spring Co Ltd Multilayer coating protective film board
JPS5637075A (en) * 1979-08-31 1981-04-10 Asahi Denka Kogyo Kk Manufacture of film of energy ray hardening resin composition
JPS5883078A (en) * 1981-11-13 1983-05-18 Mitsubishi Heavy Ind Ltd Bonding of copper or copper alloy
JPS5965207A (en) * 1982-10-05 1984-04-13 Matsushita Electric Ind Co Ltd Apparatus for detecting surface flaw of hot slab made by continuous casting
JPS62261046A (en) * 1986-05-06 1987-11-13 Hitachi Electronics Eng Co Ltd Surface inspecting device
JPS6365231A (en) * 1986-09-04 1988-03-23 Fujitsu General Ltd Device for detecting disconnection of air feed and waste gas vent tube
JPS63167169U (en) * 1987-12-10 1988-10-31
US7154121B2 (en) 2002-12-23 2006-12-26 Epistar Corporation Light emitting device with a micro-reflection structure carrier
US7172909B2 (en) 2003-07-04 2007-02-06 Epistar Corporation Light emitting diode having an adhesive layer and a reflective layer and manufacturing method thereof
US7928455B2 (en) 2002-07-15 2011-04-19 Epistar Corporation Semiconductor light-emitting device and method for forming the same
US8860065B2 (en) 2005-01-18 2014-10-14 Epistar Corporation Optoelectronic semiconductor device
US8999736B2 (en) 2003-07-04 2015-04-07 Epistar Corporation Optoelectronic system

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565545A (en) * 1978-11-13 1980-05-17 Nhk Spring Co Ltd Multilayer coating protective film board
JPS5637075A (en) * 1979-08-31 1981-04-10 Asahi Denka Kogyo Kk Manufacture of film of energy ray hardening resin composition
JPS5883078A (en) * 1981-11-13 1983-05-18 Mitsubishi Heavy Ind Ltd Bonding of copper or copper alloy
JPS5965207A (en) * 1982-10-05 1984-04-13 Matsushita Electric Ind Co Ltd Apparatus for detecting surface flaw of hot slab made by continuous casting
JPS62261046A (en) * 1986-05-06 1987-11-13 Hitachi Electronics Eng Co Ltd Surface inspecting device
JPS6365231A (en) * 1986-09-04 1988-03-23 Fujitsu General Ltd Device for detecting disconnection of air feed and waste gas vent tube
JPS63167169U (en) * 1987-12-10 1988-10-31
US7928455B2 (en) 2002-07-15 2011-04-19 Epistar Corporation Semiconductor light-emitting device and method for forming the same
US8853722B2 (en) 2002-07-15 2014-10-07 Epistar Corporation Semiconductor light-emitting device and method for forming the same
US7154121B2 (en) 2002-12-23 2006-12-26 Epistar Corporation Light emitting device with a micro-reflection structure carrier
US7172909B2 (en) 2003-07-04 2007-02-06 Epistar Corporation Light emitting diode having an adhesive layer and a reflective layer and manufacturing method thereof
US8999736B2 (en) 2003-07-04 2015-04-07 Epistar Corporation Optoelectronic system
US8860065B2 (en) 2005-01-18 2014-10-14 Epistar Corporation Optoelectronic semiconductor device

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