JPH10228386A - Process event latency time measuring system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To make it possible to measure the event latency time of a process. SOLUTION: At the transition of a process 100 from an execution waiting state to an executable state or an execution holding state, a VEWA judging means 21 judges whether a VEWA stored in an even latency time measuring information storing area 11 in a PCB 10 corresponding to the process 100 concerned is valid or not. At the time of judging that the VEWA is valid, an ESMA judging means 22 judges whether the address of an event semaphore linked when the process 100 is in the execution stand by state coincides with the ESMA stored in the storing area 11 or not. When the means 22 judges that both the addresses coincide with each other, an EWA adding means 23 adds the execution stand by time of the process 100 to an EWA stored in the storing area 11.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION The present invention relates to an information processing system in which a process is in a waiting state (a state of being linked to a queue of an event semaphore to wait for a specific event). ) For measuring the process event waiting time.

[0002]

2. Description of the Related Art In an information processing system, process states include an execution state, an executable state, an execution standby state, and an execution pending state (see FIG. 5).

A process executed on the information processing system includes a process control block (PCB) for storing control information such as an instruction counter for specifying an address of an instruction to be executed, a general register value, and an execution time. (Pr
access ControlBlock)). When the process transits to the execution state, the process transmits the instruction counter, the value of the general-purpose register, and the like from the PCB to the CPU (Central Processing).
Unit) to execute the processing.

Conventionally, information relating to time in the information in the PCB includes a process execution time, a value of a time slice timer, and a current state entry time (real time when a process state transitions to a current state; CET ( Curr
ent state Entry Time)).

[0005]

In the prior art described above, the information on time in the information in the PCB includes the execution time of the process, the value of the time slice timer, and C
ET, etc., and there is no means for knowing the time during which the process is in the execution waiting state for waiting for a specific event, that is, the idle time of the process.
There is a problem in that it is not possible to know the performance degradation of the information processing system due to the busy rate bottleneck of the core process of the system.

In view of the above, an object of the present invention is to make it possible to measure the event waiting time of a process executed on an information processing system and calculate the busy ratio of a process to thereby calculate the busy ratio of a core process or the like of an OS. It is an object of the present invention to provide a process event waiting time measuring method which makes it possible to know the performance degradation due to a bottleneck.

[0007]

SUMMARY OF THE INVENTION A process event waiting time measuring method according to the present invention is a method for measuring ESMA,
An event waiting time measurement information storage area for storing WA and VEWA, and when a process transits from an execution standby state to any of an executable state and an execution pending state,
VEWA determining means for checking whether or not VEWA in the event waiting time measurement information storage area in the PCB corresponding to the process is valid, and the VEWA determining means determines that "VEWA is valid". In this case, it is determined whether or not the address of the event semaphore linked when the process is in the execution standby state matches the ESMA in the event waiting time measurement information storage area in the PCB corresponding to the process. ESMA to judge
When the determination unit and the ESMA determination unit determine that “they match”, the time during which the process is in the execution standby state is stored in the event waiting time measurement information storage area in the PCB corresponding to the process. EWA adding means for adding the EWA to the middle EWA.

Further, in addition to the above components, the process event waiting time measuring method according to the present invention further comprises, when the process transitions from the execution waiting state to the executable state, the event waiting time in the PCB corresponding to the process. It is also possible to provide an EVC adding means for adding 1 to the EVC in the measurement information storage area, and then add the EVC in the event waiting time measurement information storage area.

[0009]

Next, a process event waiting time measuring method according to the present invention will be described in detail with reference to the drawings.

FIG. 1 is a block diagram showing a first embodiment of a process event waiting time measuring method according to the present invention.

The process event waiting time measuring method includes a PCB 10 corresponding to each process 100, an event waiting time measuring means 20, a busy rate calculating means 30,
It is configured to include an average event time calculating unit 40 and a process 100 to be measured executed on the information processing system.

The PCB 10 stores control information of the corresponding process 100. In the PCB 10 according to the present invention, control information (CET) conventionally existing in the PCB is used.
), And an event semaphore address (ESMA (Event SeMap) of the event to be measured.
(hole address)), the total event wait time (EWA (Event semaphore)).
Waiting time Acccountin
g)), an event waiting time measurement control bit (VEWA)
(Valid bit of EWA)) and an event occurrence counter (EVC (Event Cou)).
nt)) are defined (the event waiting time measurement information storage area 11 in FIG. 1).

The event waiting time measuring means 20 measures the event waiting time of a certain process 100 by using the event waiting time measuring information storage area 11 in the PCB 10 corresponding to the process 100.
Is executed when the state transitions from the execution standby state to another state (executable state or execution pending state).

A state transition from the execution standby state to another state occurs in the following two cases.

When a waiting event occurs and the state shifts from the execution standby state to the executable state

When an instruction for suspending execution of a process causes a transition from an execution standby state to an execution pending state

In the above two cases, the event waiting time measuring means 20 measures the event waiting time using the event waiting time measuring information storage area 11 in the PCB 10 as described above.

The event waiting time measuring means 20 has a function of
It comprises A determining means 21, ESMA determining means 22, EWA adding means 23, and EVC adding means 24.

The busy rate calculating means 30 calculates the busy rate of the process 100 to be measured based on information in the PCB 10 including the event waiting time measurement information storage area 11 using a busy rate calculating formula described later. I do. The busy rate calculating means 30 does not need to be an essential component in the present invention. Event waiting time measuring means 2
"Calculation of busy rate" based on information measured by 0
Needless to say, this can be realized manually or by general calculation software.

The average event time calculating means 40 calculates the average time required by the process 100 to be measured for one event, based on the information in the PCB 10 including the event waiting time measurement information storage area 11. Note that the event average time calculation means 40 does not need to be an essential component in the present invention. It goes without saying that the “calculation of the average event time” based on the information measured by the event waiting time measuring means 20 can be realized manually or by general calculation software.

FIG. 2 is a flowchart showing the processing of the event waiting time measuring means 20. This processing includes a VEWA check step 201, a semaphore address extraction step 202, a semaphore address comparison step 203,
WA addition step 204 and state transition determination step 20
5 and an EVC adding step 206.

FIG. 3 is a diagram for explaining the first embodiment of the present invention, and shows an example of a state transition of a process.

Next, the operation of the process event waiting time measuring method of the present invention having such a configuration will be described.

In order to measure the event waiting time of each process 100 by the process event waiting time measuring method of the present invention, the process 100 to be measured must be measured in advance.
A predetermined value is set in the ESMA, EWA, VEWA, and EVC areas in the event waiting time measurement information storage area 11 in the PCB 10 corresponding to.

EWA and EVC Clearing to 0 Processing for Setting Event Semaphore Address of Event to be Measured in ESMA Setting Processing for VEWA = 1 (Information indicating that VEWA is valid)

On the premise that the above settings are made, the event waiting time measuring means 20 measures the event waiting time by the PC on which the above-mentioned settings are made.
The process is started for the process 100 corresponding to B10.

The "event waiting time" is defined as a time from a first time point (a time point when the process 100 to be measured is linked to the queue of the event semaphore of the event to be measured and is in an execution waiting state), and then the second time. (The time from the execution standby state to the executable state or the execution pending state due to the occurrence of an event or execution of the execution pending instruction of the process 100).

Therefore, each time a state transition occurs, the PCB 10
CET (expressed in real time) is used
Event waiting time is required. That is, when transitioning from the execution standby state to the executable state or the execution pending state, the real time (TO
D (Time Of Day)) is taken out, and the real time indicated by the CET is subtracted from this real time, thereby obtaining the event waiting time.

More specifically, the event waiting time measuring means 2
0 is a process to be added to a process conventionally performed in such a case (hereinafter, referred to as “conventional process”) when a certain process 100 transitions from the execution standby state to the executable state. The following processing is performed (see FIG. 2).

VEW in the event waiting time measuring means 20
A determining means 21 is a PC corresponding to the process 100
Check processing of VEWA in the event waiting time measurement information storage area 11 in B10 (“VEWA = 0 (VEWA
Is information indicating that is invalid) or “VEWA =
1 ") (step 201).

The VEWA determination means 21 determines in step 201
If it is determined that “VEWA = 0”, the control is returned to the conventional processing.

On the other hand, if the VEWA determination means 21 determines that “VEWA = 1” in step 201,
The control is passed to the ESMA determining means 22. The ESMA determining unit 22 determines the semaphore address of the queue of the event semaphore linked when the process 100 is in the standby state and the event waiting time measurement information storage area 1.
The semaphore address and the ESMA are extracted (step 202), and the semaphore address and the ESMA are compared (step 203).

The ESMA determining means 22 determines in step 203
If it is determined that "the semaphore address linked does not match the ESMA", the control is returned to the conventional processing.

On the other hand, the ESMA determining means 22 determines in step 203 that “the semaphore address
When A is determined, the control is passed to the EWA adding means 23. The EWA adding means 23 calculates the PCB
The CET value in 10 (the actual time when the process 100 enters the execution standby state) is extracted, and the value (the actual time) is obtained.
Is subtracted from the current real time (the value of TOD managed by the hardware) to obtain “the time during which the device was in the event waiting state in the execution waiting state”, and this time is added to the EWA (step 204).

Next, the EVC adding means 24 determines that the current state transition is "state transition from the execution standby state to the executable state".
Or “state transition from execution standby state to execution pending state” is determined (step 205).

The EVC adding means 24 adds the EVC in the event waiting time measurement information storage area 11 only when it is determined at step 205 that “the state transition is from the execution standby state to the executable state”. 1 is added (step 206), and control returns to the conventional processing.

It should be noted that the EVC adding means 24 performs step 2
If it is determined in 05 that the state is “state transition from the execution standby state to the execution suspension state”, no event has occurred, and the “event occurrence count processing” in step 206 is not performed.

The busy rate calculating means 30 is stored in the event waiting time measurement information storage area 11 as described above, assuming that the processing of the event waiting time measuring means 20 is performed as described above. PCB10 containing information
The busy rate is calculated using the following equation (busy rate calculation equation) based on the information in the above.

Busy rate = (elapsed time−event wait time) / elapsed time

For example, for a process 100 that makes a state transition as shown in FIG. 3, the busy rate is calculated as follows.

FIG. 3 shows the time of the process 100 (process 100 to be measured) and the time of the event to be measured on the event semaphore in the event semaphore. Also, and indicates the time of the executable state, and indicates the time of the executable state.

Therefore, the busy rate of the process 100 is obtained by subtracting the event waiting time from the elapsed time, ie, the “time in the executable state or the execution state” (=
+++) to the elapsed time (= ++++++)
Divided by).

The event average time calculating means 40
PCB including event waiting time measurement information storage area 11
Based on the information in 10, the process 100 to be measured calculates an average time required for one event. That is, the average time is calculated by dividing the elapsed time by the EVC value.

The existence of EVC in the event waiting time measurement information storage area 11, step 205 in FIG.
It is possible to realize the process event waiting time measuring method of the present invention without the processing of steps 206 and 206 and the absence of the event average time calculating means 40.

Next, a second embodiment of the present invention will be described with reference to FIG.

Referring to FIG. 4, according to a second embodiment of the present invention, a predetermined program (event wait time measuring means 20 (VEWA determining means 2 in the first embodiment)
1, a program for realizing the event waiting time measuring means 20) including the ESMA judging means 22, the EWA adding means 23, and the EVC adding means 24, the busy rate calculating means 30, and the event average time calculating means 40). It includes a recording medium 50 and a data processing device 60. The recording medium 50 may be a magnetic disk, a semiconductor memory, or another recording medium.

The predetermined program is read from the recording medium 50 by the data processing device 60 and is read by the data processing device 6.
0 operation is controlled. Under the control of the predetermined program, the data processing device 60 controls the ESMA, EW, in addition to the control information (including the CET) existing in the PCB 10 corresponding to each process 100.
A P in which an event waiting time measurement information storage area 11 for storing A, VEWA, and EVC, respectively, is defined.
CB10), the processing described in the first embodiment (event waiting time measuring means 20, busy rate calculating means 3)
0, and the processing realized by the event average time calculation means 40).

Also in the second embodiment, the existence of the EVC in the event waiting time measurement information storage area 11, the processing of steps 205 and 206 in FIG. Is optional, as described in the first embodiment.

The processing realized by the busy rate calculating means 30 and the event average time calculating means 40 in the program recorded on the recording medium 50 can be deleted from the program. The “calculation of busy rate” and “calculation of average event time” based on the obtained information can be realized by manual work or general calculation software, as in the first embodiment.

[0050]

As described above, according to the present invention,
By providing an event waiting time measurement information storage area in the PCB corresponding to each process, etc., the event waiting time of a process can be easily measured. By using this, the busy rate can be easily obtained. Therefore, by calculating the busy rate of the core process or the like of the OS using the busy rate calculation formula, it is possible to identify the cause of the performance degradation of the information processing system and to improve the OS (improve the performance). This produces the effect.

By storing the EVC in the event waiting time measurement information storage area, it is possible to calculate the average time required by the process to be measured for one event, and to know the event processing performance of the information processing system. This makes it possible to bring about an advantage in improving the performance of the information processing system.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a first embodiment of a process event waiting time measuring method according to the present invention.

FIG. 2 is a flowchart showing a process of an event waiting time measuring means in FIG. 1;

FIG. 3 is a diagram for explaining a specific operation of a busy rate calculation unit in FIG. 1, and is a diagram illustrating an example of a state transition of a process;

FIG. 4 is a block diagram showing a second embodiment of the present invention.

FIG. 5 is a diagram showing types of process states and aspects of state transition.

[Explanation of symbols]

 Reference Signs List 10 PCB 11 Event waiting time measurement information storage area 20 Event waiting time measuring means 21 VEWA judging means 22 ESMA judging means 23 EWA adding means 24 EVC adding means 30 Busy rate calculating means 40 Event average time calculating means 50 Recording medium 60 Data processing Apparatus 100 process

Claims (4)

[Claims] 1. An event waiting time measurement information storage area for storing ESMA, EWA, and VEWA in a PCB, and when a process transits from an execution standby state to one of an executable state and an execution pending state, VE for checking whether or not VEWA in the event waiting time measurement information storage area in the PCB corresponding to the process is valid
When the WAWA determination means determines that “VEWA is valid”, the address of the event semaphore linked when the process is in the execution standby state and the address in the PCB corresponding to the process are determined. ESMA determining means for determining whether or not ESMA in the event waiting time measurement information storage area matches, and when the ESMA determining means determines that "they match", the process waits for execution. EW that adds the time in the state to the EWA in the event waiting time measurement information storage area in the PCB corresponding to the process.
A process event waiting time measuring method, comprising: A adding means. 2. An event waiting time measurement information storage area including an EVC, and the event waiting time measurement information storage area in a PCB corresponding to the process when the process transits from an execution standby state to an executable state. E that adds 1 to EVC inside
2. The process event waiting time measuring method according to claim 1, further comprising a VC adding means. 3. When a process transitions from an execution standby state to any of an executable state and an execution pending state, ESMA and EW are stored in a PCB corresponding to the process.
A, and processing of the VEWA determining means for checking whether or not the VEWA in the event waiting time measurement information storage area for storing the VEWA is valid; and the VEWA determining means determines that "VEWA is valid". In this case, it is determined whether or not the address of the event semaphore linked when the process is in the execution standby state matches the ESMA in the event waiting time measurement information storage area in the PCB corresponding to the process. The processing of the ESMA determining means for determining, and when the ESMA determining means determines that the two are the same, the time during which the process is in the execution waiting state is the event waiting time in the PCB corresponding to the process. EW to be added to EWA in the measurement information storage area
A recording medium on which a program for causing a computer to execute the processing of the A adding means is recorded. 4. When a process transits from an execution standby state to any of an executable state and an execution pending state, ESMA, EW and
The processing of the VEWA determining means for checking whether the VEWA in the event waiting time measurement information storage area for storing A, VEWA, and EVC is valid, and "VEWA is valid" by the VEWA determining means. When it is determined, whether the address of the event semaphore linked when the process is in the execution standby state matches the ESMA in the event waiting time measurement information storage area in the PCB corresponding to the process. The process of the ESMA judging means for judging whether the process is in the execution standby state when the ESMA judging device judges "they match" is the event in the PCB corresponding to the process. EW to be added to EWA in the waiting time measurement information storage area
A adding means for adding 1 to EVC in the event waiting time measurement information storage area in the PCB corresponding to the process when the process transits from the execution waiting state to the executable state.
A recording medium on which a program for causing a computer to execute the processing of the VC adding means is recorded.