JPH09113932A - Wiring board and its production - Google Patents

Wiring board and its production

Info

Publication number
JPH09113932A
JPH09113932A JP27133095A JP27133095A JPH09113932A JP H09113932 A JPH09113932 A JP H09113932A JP 27133095 A JP27133095 A JP 27133095A JP 27133095 A JP27133095 A JP 27133095A JP H09113932 A JPH09113932 A JP H09113932A
Authority
JP
Japan
Prior art keywords
wiring
wirings
insulating layer
lead
exposure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP27133095A
Other languages
Japanese (ja)
Inventor
Tetsuya Fujikawa
徹也 藤川
Atsushi Inoue
淳 井上
Shiro Hirota
四郎 廣田
Mitsuaki Sugine
光晃 杉根
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP27133095A priority Critical patent/JPH09113932A/en
Publication of JPH09113932A publication Critical patent/JPH09113932A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)

Abstract

PROBLEM TO BE SOLVED: To improve the productivity of a wiring board laminated and formed with wirings via insulating layers by lithography method by divided exposure. SOLUTION: This board is formed with plural pieces of the wirings 4, the first insulating layer covering the wirings 4, terminals 7 connected to the wirings 4, the plural wirings 5 on the first insulating layer, the second insulating layer covering the wirings 5 and terminals 8 connected to the wirings 5 respectively by at least the lithography method of the divided exposure. In such a case, the terminals 7 and 8 are formed of the same conductive films. The wirings 4 and the terminals 7 are connected via the contact holes formed in the first insulating layer. The wirings 5 and the terminals 8 are connected via the contact holes formed in the second insulating layer. The terminals 7 and 8 and pixel electrodes 6 of the TFT substrate for a liquid crystal display panel are formed of the same conductive films.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、複数本の第1の配
線と、該第1の配線を覆う第1の絶縁層と、該第1の配
線に接続する第1の引き出し端子と、該第1の絶縁層の
上の複数本の第2の配線と、該第1の配線を覆う第2の
絶縁層と、該第2の配線に接続する第2の引き出し端子
のそれぞれが、分割露光のリソグラフィ法によって少な
くとも形成された配線基板とその製造方法、特に、液晶
表示パネルに用いられるTFT基板とその製造方法に関
する。
The present invention relates to a plurality of first wirings, a first insulating layer that covers the first wirings, a first lead terminal connected to the first wirings, and Each of the plurality of second wirings on the first insulating layer, the second insulating layer covering the first wirings, and the second lead terminal connected to the second wirings is divided and exposed. The present invention relates to a wiring substrate formed at least by the above-mentioned lithographic method and a manufacturing method thereof, and particularly to a TFT substrate used for a liquid crystal display panel and a manufacturing method thereof.

【0002】[0002]

【従来の技術】図4は従来の液晶表示パネル用TFT基
板の概略構成の説明図、図5は従来の液晶表示パネル用
TFT基板の主要構成の説明図、図6は図5のA−A断
面とB−B断面の説明図である。
2. Description of the Related Art FIG. 4 is an explanatory view of a schematic structure of a conventional TFT substrate for a liquid crystal display panel, FIG. 5 is an explanatory view of a main structure of a conventional TFT substrate for a liquid crystal display panel, and FIG. 6 is an AA line of FIG. It is explanatory drawing of a cross section and a BB cross section.

【0003】図4において、多数のTFTとその配線お
よび画素電極とがマトリックスに形成されたTFT基板
1は、図中の2点鎖線2で囲まれた表示領域とその周囲
の端子形成領域に区分される。
In FIG. 4, a TFT substrate 1 in which a large number of TFTs, wirings thereof, and pixel electrodes are formed in a matrix is divided into a display area surrounded by a two-dot chain line 2 in the drawing and a terminal forming area around the display area. To be done.

【0004】前記表示領域は、例えば図中の破線で分け
て示すように、6露光領域2a,2b,2c,2d,2e,2f に
区分し、前記端子形成領域は、図中の破線で分けて示す
ように、表示領域の上方の3領域3a,3b,3c と、表示
領域の下方の3領域3d,3e,3f と、表示領域の右方の
2領域3g,3h と、表示領域の左方の2領域3i,3jに
区分する。
The display area is divided into six exposure areas 2a, 2b, 2c, 2d, 2e and 2f, for example, as shown by the broken lines in the figure, and the terminal formation area is divided by the broken lines in the figure. As shown in Figure 3, the three areas 3a, 3b, 3c above the display area, the three areas 3d, 3e, 3f below the display area, the two areas 3g and 3h on the right side of the display area, and the left side of the display area. The two areas 3i and 3j are divided.

【0005】層間絶縁膜等を省略した図5において、2
点鎖線2の内側の表示領域には、TFTのゲート電極4
aが連通する多数のゲート配線(第1の配線)4と、T
FTのソース電極5aが連通する多数のソース・ドレイ
ン配線(第2の配線)5と、画素電極6等が形成され、
表示領域の外側には、ゲート配線4の引き出し端子7と
ソース・ドレイン配線5の引き出し端子8が形成されて
いる。
In FIG. 5, in which the interlayer insulating film and the like are omitted, 2
In the display area inside the dotted line 2, the gate electrode 4 of the TFT
a, a large number of gate wirings (first wirings) 4 communicating with each other, and T
A large number of source / drain wirings (second wirings) 5 communicating with the source electrode 5a of the FT, a pixel electrode 6 and the like are formed,
Outside the display region, a lead terminal 7 for the gate wiring 4 and a lead terminal 8 for the source / drain wiring 5 are formed.

【0006】図5および図6において、5bはドレイン
電極、9はチャネル保護膜、10はガラス基板、11はSiN
にてなるゲート絶縁膜, 12はアモルファスシリコン層,
13はSiN にてなるカバー膜であり、ゲート配線4とソー
ス・ドレイン配線5とは、ゲート絶縁膜11を介して重な
り、ドレイン電極5bと画素電極6とは、カバー膜13に
設けたコンタクトホール14を介して接続されている。
In FIGS. 5 and 6, 5b is a drain electrode, 9 is a channel protective film, 10 is a glass substrate, and 11 is SiN.
Gate insulating film, 12 is an amorphous silicon layer,
Reference numeral 13 is a cover film made of SiN, the gate wiring 4 and the source / drain wiring 5 overlap with each other through the gate insulating film 11, and the drain electrode 5b and the pixel electrode 6 are contact holes provided in the cover film 13. Connected through 14.

【0007】表示領域2a 〜2f に形成されたゲート配
線4と領域3g〜3jに形成された引き出し端子7、表
示領域2a 〜2f に形成するソース・ドレイン配線5と
領域3a〜3fに形成された引き出し端子8は、それぞ
れが同一導電膜から形成されている。
The gate wiring 4 formed in the display areas 2a to 2f, the lead terminal 7 formed in the areas 3g to 3j, the source / drain wiring 5 formed in the display areas 2a to 2f, and the areas 3a to 3f. Each of the lead terminals 8 is formed of the same conductive film.

【0008】従って、フォトリソグラフイ技術を利用し
た分割露光による従来のTFT基板1の製造では、ゲー
ト配線4,ゲート電極4a,端子7の形成、ソース・ド
レイン配線5,ソース電極5a,ドレイン電極5b,端
子8の形成、チャネル保護膜9の形成、コンタクトホー
ル14の形成に、それぞれ5種類のマスクと16回の露光
工程、即ち領域2a 〜2f に対応する1枚のマスクと領
域3a 〜3cに対応する1枚のマスクと領域3d〜3f
に対応する1枚のマスクと領域3g,3hに対応する1
枚のマスクと領域3i,3jに対応する1枚のマスク合
計5種類のマスクと、領域2a 〜2f および3a 〜3j
に対応する合計16回の露光工程を必要とし、さらに画
素電極6の作成に1種類のマスクと6回の露光工程を必
要とするため、合計21種類のマスクと70回の露光工
程が必要であった。
Therefore, in the manufacture of the conventional TFT substrate 1 by the division exposure using the photolithography technique, the gate wiring 4, the gate electrode 4a, the terminal 7 are formed, the source / drain wiring 5, the source electrode 5a and the drain electrode 5b are formed. , The formation of the terminal 8, the formation of the channel protective film 9, and the formation of the contact hole 14, respectively, five kinds of masks and 16 exposure steps, that is, one mask corresponding to the areas 2a to 2f and the areas 3a to 3c. One corresponding mask and areas 3d to 3f
One mask corresponding to 1 and 1 corresponding to the regions 3g and 3h
A total of five types of masks and one mask corresponding to the regions 3i and 3j, and regions 2a to 2f and 3a to 3j.
Therefore, a total of 16 exposure steps are required, and since one type of mask and 6 exposure steps are required to form the pixel electrode 6, a total of 21 types of masks and 70 exposure steps are required. there were.

【0009】[0009]

【発明が解決しようとする課題】以上説明説明したよう
に従来のTFT基板1では、非常に多種類のマスクと多
数回の露光工程を必要としていたが、ワードプロセッサ
やパーソナルコンピュータ等のディスプレイに、液晶表
示パネルが多く用いられるようになり、TFT基板1の
生産性向上とコストダウンが強く要望されるようになっ
た。
As described above, the conventional TFT substrate 1 requires a great variety of masks and a large number of exposure steps. However, in a display of a word processor, a personal computer or the like, a liquid crystal is used. Display panels have been widely used, and there has been a strong demand for improvement in productivity and cost reduction of the TFT substrate 1.

【0010】[0010]

【課題を解決するための手段】必要とする露光マスクの
枚数と露光回数(ショット数)を低減し、積層構成の配
線基板の生産性向上とコストダウンを目的とした本発明
は、 複数本の第1の配線と、該第1の配線を覆う第1
の絶縁層と、該第1の配線に接続する第1の引き出し端
子と、該第1の絶縁層の上の複数本の第2の配線と、該
第2の配線を覆う第2の絶縁層と、該第2の配線に接続
する第2の引き出し端子のそれぞれが、分割露光のリソ
グラフィ法によって少なくとも形成された配線基板にお
いて、該第1の引き出し端子と該第2の引き出し端子と
が第3の導電膜より形成され、該第1の引き出し端子と
第1の導電膜から形成された該第1の配線とが、該第1
の絶縁層に設けたコンタクトホールを介して接続され、
該第2の引き出し端子と第2の導電膜から形成された該
第2の配線とが、該第2の絶縁層に設けたコンタクトホ
ールを介して接続された配線基板と、さらに、前記第1
の配線が薄膜トランジスタ(TFT)のソースドレイン
配線またはゲート配線の一方であり、前記第2の配線が
該ソースドレイン配線またはゲート配線の他方であり、
該TFTに接続される画素電極と前記第1,第2の引き
出し端子とが、透明導電材料にてなる前記第3の導電膜
から分割露光のリソグラフィ法によって形成された配線
基板と、基板の表面に被着させた第1の導電膜からネガ
型レジストを使用した分割露光のリソグラフィ法により
前記第1の配線を形成し、その上に被着させた第1の絶
縁膜からポジ型レジストを使用した分割露光のリソグラ
フィ法により該第1の配線の端部を露呈させる前記第1
の絶縁層を形成し、その上に被着させた第2の導電膜か
らネガ型レジストを使用した分割露光のリソグラフィ法
により前記第2の配線を形成し、その上に被着させた第
2の絶縁膜からポジ型レジストを使用した分割露光のリ
ソグラフィ法によって該第2の配線の端部と該第1の配
線の端部の露呈部を露呈させる前記第2の絶縁層を形成
し、次いで第3の導電膜からポジ型レジストを使用した
分割露光のリソグラフィ法により前記第1,第2の引き
出し端子を形成する配線基板の製造方法と、さらに、前
記第1の配線がTFTのソースドレイン配線またはゲー
ト配線の一方であり、前記第2の配線が該ソースドレイ
ン配線またはゲート配線の他方であり、該TFTに接続
される画素電極と前記第1,第2の引き出し端子とを、
透明導電材にてなる第3の導電膜から分割露光のリソグ
ラフィ法によって形成する配線基板の製造方法である。
SUMMARY OF THE INVENTION The present invention is intended to reduce the number of exposure masks and the number of exposures (the number of shots) required to improve the productivity and cost of a wiring board having a laminated structure. A first wiring and a first wiring covering the first wiring
Insulating layer, a first lead terminal connected to the first wiring, a plurality of second wirings on the first insulating layer, and a second insulating layer covering the second wiring. And the second lead-out terminal connected to the second wiring is formed at least by the lithography method of divided exposure, in the wiring board, the first lead-out terminal and the second lead-out terminal are the third. The first lead-out terminal and the first wiring formed from the first conductive film,
Connected through a contact hole provided in the insulating layer of
A wiring board in which the second lead terminal and the second wiring formed of the second conductive film are connected via a contact hole provided in the second insulating layer, and the first wiring
Wiring is one of a source drain wiring or a gate wiring of a thin film transistor (TFT), and the second wiring is the other of the source drain wiring or the gate wiring,
A wiring board in which a pixel electrode connected to the TFT and the first and second lead terminals are formed from the third conductive film made of a transparent conductive material by a lithography method of divided exposure, and a surface of the substrate The first wiring is formed from the first conductive film deposited on the substrate by a lithography method of divided exposure using a negative resist, and the positive resist is used from the first insulating film deposited on the first wiring. And exposing the end portion of the first wiring by the divided exposure lithography method.
Second insulating layer is formed, the second wiring is formed on the second conductive film deposited on the insulating layer by a lithography method of divided exposure using a negative resist, and the second wiring is deposited on the second wiring. The second insulating layer exposing the exposed portions of the end portions of the second wiring and the end portions of the first wiring is formed from the insulating film by a lithography method of divided exposure using a positive type resist, and A method for manufacturing a wiring board, in which the first and second lead terminals are formed from a third conductive film by a split exposure lithography method using a positive resist, and further, the first wiring is a source / drain wiring of a TFT. Alternatively, it is one of the gate wirings, the second wiring is the other of the source drain wirings or the gate wirings, and the pixel electrode connected to the TFT and the first and second lead terminals are
It is a method of manufacturing a wiring board, which is formed by a lithography method of divided exposure from a third conductive film made of a transparent conductive material.

【0011】このうよな構成の配線基板とその製造方法
において、第1の配線を第1の導電膜から形成し、第2
の配線を第1の導電膜から形成し、第1,第2の引き出
し端子を第3の導電膜から形成し、第1の配線と第1の
端子とは第1の絶縁膜に形成したコンタクトホールを介
して接続し、第2の配線と第2の端子とは第2の絶縁膜
に形成したコンタクトホールを介して接続する構成とす
る。
In the wiring board having such a structure and the manufacturing method thereof, the first wiring is formed from the first conductive film, and the second wiring is formed.
Contacts formed from a first conductive film, first and second lead terminals formed from a third conductive film, and the first wires and the first terminals are contacts formed in a first insulating film. The connection is made through a hole, and the second wiring and the second terminal are connected through a contact hole formed in the second insulating film.

【0012】その結果、液晶表示パネル用TFT基板に
おいて、前述した如く21種類の露光マスクと70回の
露光ショットを必要としたものが、詳細に後述する如く
9種類の露光マスクと40回の露光ショットで製造可能
になる。
As a result, the liquid crystal display panel TFT substrate requires 21 kinds of exposure masks and 70 times of exposure shots as described above. However, as will be described later in detail, 9 kinds of exposure masks and 40 times of exposures are performed. Can be manufactured with a shot.

【0013】[0013]

【発明の実施の形態】図1は本発明の適用例であるTF
T基板の概略構成の説明図、図2は本発明の適用例であ
るTFT基板の主要構成の説明図、図3は図2における
C−C断面とD−D断面の説明図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an example of application of the present invention, TF.
FIG. 2 is an explanatory diagram of a schematic configuration of a T substrate, FIG. 2 is an explanatory diagram of a main configuration of a TFT substrate that is an application example of the present invention, and FIG. 3 is an explanatory diagram of a CC cross section and a DD cross section in FIG.

【0014】図1において、複数枚(図は2枚)のTF
T基板が切り出せるガラス基板21において、一点鎖線22
で囲った領域はTFT基板切り出し領域であり、その内
側の二点鎖線2で囲った領域はTFT基板の表示領域で
あり、多数のTFTとその配線および画素電極が形成さ
れる表示領域は、図中に破線で分けて示すように、6つ
の領域2a,2b,2c,2d,2e,2f に分けて形成し、表示
領域の外側、即ち一点鎖線22と二点鎖線2に挟まれた領
域に、表示領域内の画素電極形成用導電膜から形成した
引き出し端子を形成する。各領域2a,2b,2c,2d,2e,
2f 内には、例えば数百×数百個のTFTと画素電極が
形成されるようになる。
In FIG. 1, a plurality of (two in the figure) TFs
In the glass substrate 21 from which the T substrate can be cut out, the one-dot chain line 22
The area surrounded by is a TFT substrate cut-out area, the area surrounded by the chain double-dashed line 2 is the display area of the TFT substrate, and the display area where a large number of TFTs, their wirings and pixel electrodes are formed is As shown by the broken lines in the figure, it is divided into six areas 2a, 2b, 2c, 2d, 2e, 2f and formed outside the display area, that is, in the area sandwiched between the one-dot chain line 22 and the two-dot chain line 2. A lead terminal formed from the pixel electrode forming conductive film in the display region is formed. Each area 2a, 2b, 2c, 2d, 2e,
Within 2f, for example, several hundreds × several hundreds of TFTs and pixel electrodes are formed.

【0015】従来構成と同一部分に同一符号を使用した
図2および図3において、基板21における多数のTFT
は、従来のTFTと同じく、ゲート配線4に連通するゲ
ート電極4aと、ソース・ドレイン配線5に連通するソ
ース電極5aと、チャネル保護膜9と、ソース電極5a
と同一膜から形成したドレイン電極5bにて構成され、
ドレイン電極5bと画素電極6とは、カバー膜13(図6
(a)参照)に形成したコンタクトホール14(図6
(a)参照)を介して接続される。
In FIG. 2 and FIG. 3 where the same reference numerals are used for the same parts as in the conventional structure, a large number of TFTs on the substrate 21
Is a gate electrode 4a communicating with the gate wiring 4, a source electrode 5a communicating with the source / drain wiring 5, a channel protective film 9, and a source electrode 5a, as in the conventional TFT.
And a drain electrode 5b formed from the same film as
The drain electrode 5b and the pixel electrode 6 are covered by the cover film 13 (see FIG.
The contact hole 14 (see FIG. 6A) formed in FIG.
(See (a)).

【0016】多数のゲート配線引き出し端子7,端子7
と配線4とを接続する接続線7a,ソース・ドレイン配
線引き出し端子8,端子8と配線5とを接続する接続線
8aは、画素電極6と同一の透明導電膜(ITO膜)か
ら形成し、二点鎖線2で示す表示領域内においてゲート
配線4と接続線7a,ソース・ドレイン配線5と接続線
8aとが接続する。
Many gate wiring lead terminals 7, terminals 7
The connecting line 7a connecting the wiring 4 and the wiring 4, the source / drain wiring lead-out terminal 8, and the connecting line 8a connecting the terminal 8 and the wiring 5 are formed of the same transparent conductive film (ITO film) as the pixel electrode 6, In the display area indicated by the chain double-dashed line 2, the gate wiring 4 is connected to the connection line 7a, and the source / drain wiring 5 is connected to the connection line 8a.

【0017】ゲート配線4と接続線7aとの接続を示す
図3(a) において、ゲート絶縁膜11には配線4の端部を
露呈させるコンタクトホール23を設け、カバー膜13には
コンタクトホール23を露呈させるコンタクトホール25を
設け、コンタクトホール23および25内に露呈する配線4
の端部に接続線7aが接続する。
In FIG. 3A showing the connection between the gate wiring 4 and the connection line 7a, the gate insulating film 11 is provided with a contact hole 23 exposing the end of the wiring 4, and the cover film 13 is provided with a contact hole 23. Wiring 4 exposed in contact holes 23 and 25 by providing contact hole 25 for exposing
The connection line 7a is connected to the end of the.

【0018】ソース・ドレイン配線5と接続線8aとの
接続を示す図3(b) において、ゲート絶縁膜11の上に形
成された配線5の端部は、カバー膜13に設けたコンタク
トホール24内に露呈し、その露呈部に接続線8aが接続
する。
In FIG. 3B showing the connection between the source / drain wiring 5 and the connection line 8a, the end of the wiring 5 formed on the gate insulating film 11 has a contact hole 24 formed in the cover film 13. It is exposed inside, and the connecting wire 8a is connected to the exposed portion.

【0019】フォトレジスト膜を露光・現像してレジス
トパターンを形成し、所要膜の不要部を選択的に除去す
るフォトリソグラフィック技術を利用し、前記構成のT
FT基板を製造するに際して、ゲート配線4,ゲート電
極4aの作成、ソース・ドレイン配線5,ソース電極5
a,ドレイン電極5bの作成、チャネル保護膜9の作
成、コンタクトホール14の作成に、それぞれ1種類のマ
スクと領域2a〜2fに対応する6回の露光工程を実施
し、画素電極6と端子7と8および接続線7aと8aの
作成には、画素電極6形成用として1種類のマスクと領
域3a〜3c,3d〜3f,3gと3h,3iと3jに
対応する4種類のマスク合計5種類のマスクと、画素電
極6形成用マスクを用いて6回の分割露光と端子等形成
の4種類のマスクを用いて各領域3a〜3jを露光させ
る10回の露光工程によって形成する。
The photoresist film is exposed and developed to form a resist pattern, and a photolithographic technique for selectively removing an unnecessary portion of a required film is used.
When manufacturing the FT substrate, the gate wiring 4, the gate electrode 4a, the source / drain wiring 5, and the source electrode 5 are formed.
a, the drain electrode 5b, the channel protective film 9, and the contact hole 14 are subjected to six exposure steps each corresponding to one type of mask and regions 2a to 2f, and the pixel electrode 6 and the terminal 7 are formed. And 8 and the connecting lines 7a and 8a, one kind of mask for forming the pixel electrode 6 and four kinds of masks corresponding to the areas 3a to 3c, 3d to 3f, 3g and 3h, 3i and 3j, totaling 5 kinds. And the mask for forming the pixel electrode 6 are used for six times of division exposure, and four types of masks for forming terminals and the like are used to form each of the regions 3a to 3j by exposing 10 times.

【0020】従って、必要とするマスクの総合計は9種
類であり、そのマスクを用いた総露光工程(露光ショッ
ト回数)は40回になる。即ち、本発明によってTFT
基板の配線パターンを形成する工程の順序は次のように
なる。 (1) ゲート形成用導電膜(Al膜)の被着 (2) ネガ型の第1のフォトレジスト膜の積層被着 (3) 第1のフォトレジスト膜の露光(領域2a〜2fに
対応せしめ6回分割露光) (4) 第1のフォトレジスト膜の現像 (5) ゲート配線4,ゲート電極4aをパターン形成 (6) ゲート絶縁膜(SiN膜:第1の絶縁膜)の被着 (7) ポジ型の第2のフォトレジスト膜の積層被着 (8) 第2のフォトレジスト膜の露光 (ゲートマスクを領
域2a〜2fに対応せしめて移動し6回分割露光) (9) コンタクトホール23が開口するゲート絶縁膜11を形
成 (10)アモルファスシリコン膜の被着 (11)チャネル保護膜形成用の膜(SiN膜)の被着 (12)ポジ型の第3のフォトレジスト膜の積層被着 (13)第3のフォトレジスト膜の露光(ゲート配線4,ゲ
ート電極4aをマスクとして背面露光したのち、チャネ
ル保護膜マスクを領域2a〜2fに対応せしめて移動し
6回分割露光) (14)第3のフォトレジスト膜の現像 (15)チャネル保護膜9をパターン形成 (16)ソース・ドレイン形成用導電膜(Al膜)の被着 (17)ネガ型の第4のフォトレジスト膜の積層被着 (18)第4のフォトレジスト膜の露光(ソース・ドレイン
マスクを領域2a〜2fに対応せしめて移動し6回分割
露光) (19)第4のフォトレジスト膜の現像 (20)アモルファスシリコン層12とソース・ドレイン配線
5とソース電極5aとドレイン電極5bをパターン形成 (21)カバー膜(SiN膜:第2の絶縁膜)の被着 (22)ポジ型の第5のフォトレジスト膜の積層被着 (23)第5のフォトレジスト膜の露光(コンタクトホール
マスクを領域2a〜2fに対応せしめて移動し6回分割
露光) (24)第5のフォトレジスト膜の現像 (25)コンタクトホール25と25が開口するカバー膜13を形
成 (26)透明導電膜(ITO膜)の被着 (24)ネガ型の第6のフォトレジスト膜の積層被着 (25)第6のフォトレジスト膜の露光(5種類の端子マス
クを用いて19回露光) (26)第6のフォトレジスト膜の現像 (27)画素電極6と端子7と端子8と接続線7aと接続線
8aを形成 ただし、端子7,8形成用マスクは、一部が表示領域に
侵入し露光させるマスクであり、本発明による配線基板
において各表示領域2a〜2f内の絶縁膜11および13に
は、接続線7aまたは8aに接続されないコンタクトホ
ール23〜25、即ち領域2a〜2fが接する周辺部に形成
されたコンタクトホール23〜25には接続線7aまたは8
aが接続されないで残る。そして、図2の実施例におい
てガラス基板21の外周部には、多数の端子7および8に
連通する導体パターン26が形成されており、導体パター
ン26は端子7と8が同一電位になるようにし、静電気に
よる基板21の絶縁破壊を防止する。
Therefore, the total number of masks required is nine, and the total exposure process (the number of exposure shots) using the mask is 40 times. That is, according to the present invention, the TFT
The sequence of steps for forming the wiring pattern on the substrate is as follows. (1) Deposition of conductive film (Al film) for gate formation (2) Laminate deposition of negative type first photoresist film (3) Exposure of first photoresist film (corresponding to regions 2a to 2f) (6 division exposure) (4) Development of first photoresist film (5) Pattern formation of gate wiring 4 and gate electrode 4a (6) Adhesion of gate insulating film (SiN film: first insulating film) (7) ) Laminate deposition of positive type second photoresist film (8) Exposure of second photoresist film (6 times divided exposure by moving gate mask corresponding to regions 2a to 2f) (9) Contact hole 23 Form gate insulating film 11 with openings (10) Deposit amorphous silicon film (11) Deposit film (SiN film) for forming channel protective film (12) Deposit positive third photoresist film (13) Exposure of the third photoresist film (backside exposure using the gate wiring 4 and the gate electrode 4a as a mask) After the light exposure, the channel protective film mask is moved corresponding to the regions 2a to 2f and divided into six exposures. (14) Development of the third photoresist film (15) Pattern formation of the channel protective film 9 (16) Source / Drain forming conductive film (Al film) deposition (17) Negative-type fourth photoresist film stack deposition (18) Fourth photoresist film exposure (source / drain masks on regions 2a to 2f) (19) Developing the fourth photoresist film (20) Patterning the amorphous silicon layer 12, source / drain wiring 5, source electrode 5a and drain electrode 5b (21) Cover film (SiN film: second insulating film) deposition (22) Laminate deposition of positive type fifth photoresist film (23) Exposure of fifth photoresist film (contact hole masks in regions 2a to 2f) Move correspondingly and move 6 times separately) (24) Development of fifth photoresist film (25) Forming cover film 13 in which contact holes 25 and 25 are opened (26) Adhesion of transparent conductive film (ITO film) (24) Negative type sixth photoresist film Laminate deposition (25) Exposure of 6th photoresist film (19 times exposure using 5 kinds of terminal masks) (26) Development of 6th photoresist film (27) Pixel electrode 6, terminal 7 and terminal 8 And the connection line 7a and the connection line 8a are formed. However, the mask for forming the terminals 7 and 8 is a mask for partially penetrating into the display area and exposing the light. The contact holes 23 to 25 that are not connected to the connection lines 7a or 8a are formed in the films 11 and 13, that is, the connection holes 7 to 8 are formed in the contact holes 23 to 25 formed in the peripheral portions contacting the regions 2a to 2f.
a remains unconnected. In the embodiment of FIG. 2, a conductor pattern 26 communicating with a large number of terminals 7 and 8 is formed on the outer peripheral portion of the glass substrate 21, and the conductor pattern 26 is arranged so that the terminals 7 and 8 have the same potential. Prevents dielectric breakdown of the substrate 21 due to static electricity.

【0021】なお、前記実施例は、液晶表示パネルに使
用するためTFTがマトリックスに配設されたTFT基
板について説明した。しかし、本発明は前記TFT基板
に限定されることなく、それぞれ複数本の第1,第2の
配線が絶縁層を介して積層形成され、かつ、その第1,
第2の配線のそれぞれに接続する引き出し端子が形成さ
れた配線基板に適用し、前記TFT基板と同様に所要の
露光マスク数および工数が削減されることが、前記実施
例から明らかである。
In the above embodiment, the TFT substrate in which the TFTs are arranged in a matrix for use in the liquid crystal display panel has been described. However, the present invention is not limited to the above-mentioned TFT substrate, and a plurality of first and second wirings are laminated and formed via an insulating layer, and the first and second wirings are formed.
It is apparent from the above embodiment that the present invention is applied to a wiring board in which lead-out terminals connected to each of the second wirings are formed, and the required number of exposure masks and man-hours are reduced as in the TFT substrate.

【0022】[0022]

【発明の効果】以上説明したように、本発明を液晶表示
パネル用TFT基板に適用したとき、従来技術で21種
類の露光マスクと70回の露光ショットを必要としたも
のが、9種類の露光マスクと40回の露光ショットで製
造可能になる。即ち、必要な露光マスクの枚数は1/2
以下となり、露光ショットは4/7に低減し、生産性が
向上すると共に、露光処理に伴う不良率が減少するよう
になる。
As described above, when the present invention is applied to a TFT substrate for a liquid crystal display panel, in the prior art, 21 types of exposure masks and 70 exposure shots were required, but 9 types of exposure masks were used. It can be manufactured with a mask and 40 exposure shots. That is, the required number of exposure masks is 1/2
Below, the exposure shot is reduced to 4/7, the productivity is improved, and the defective rate accompanying the exposure process is reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の適用例であるTFT基板の概略構成
の説明図
FIG. 1 is an explanatory diagram of a schematic configuration of a TFT substrate which is an application example of the present invention.

【図2】 本発明の適用例であるTFT基板の主要構成
の説明図
FIG. 2 is an explanatory diagram of a main configuration of a TFT substrate which is an application example of the present invention.

【図3】 図2におけるC−C断面とD−D断面の説明
FIG. 3 is an explanatory view of a CC cross section and a DD cross section in FIG. 2;

【図4】 従来の液晶表示パネル用TFT基板の概略構
成の説明図
FIG. 4 is an explanatory diagram of a schematic configuration of a conventional TFT substrate for a liquid crystal display panel.

【図5】 従来の液晶表示パネル用TFT基板の主要構
成の説明図
FIG. 5 is an explanatory diagram of a main configuration of a conventional TFT substrate for a liquid crystal display panel.

【図6】 図5のA−A断面およびB−B断面の説明図FIG. 6 is an explanatory diagram of an AA cross section and a BB cross section of FIG. 5;

【符号の説明】[Explanation of symbols]

4 ゲート配線(第1の配線) 4a ゲート電極 5 ソースドレイン配線(第2の配線) 5a ソース電極 5b ドレイン電極 6 画素電極 7,8 引き出し端子 9 チャネル保護膜 21 ガラス基板 23,24,25 コンタクトホール 4 gate wiring (first wiring) 4a gate electrode 5 source / drain wiring (second wiring) 5a source electrode 5b drain electrode 6 pixel electrode 7, 8 lead-out terminal 9 channel protective film 21 glass substrate 23, 24, 25 contact hole

フロントページの続き (72)発明者 廣田 四郎 神奈川県川崎市中原区上小田中1015番地 富士通株式会社内 (72)発明者 杉根 光晃 鳥取県米子市石州府字大塚ノ弐650番地 株式会社米子富士通内Front page continued (72) Inventor Shiro Hirota 1015 Kamiodanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture, Fujitsu Limited (72) Inventor, Mitsuaki Sugine, Yonago, Yonago City, Tottori Prefecture 650 Otsuka Noji, Yonago Fujitsu Limited

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 複数本の第1の配線と、該第1の配線を
覆う第1の絶縁層と、該第1の配線に接続する第1の引
き出し端子と、該第1の絶縁層の上の複数本の第2の配
線と、該第2の配線を覆う第2の絶縁層と、該第2の配
線に接続する第2の引き出し端子のそれぞれが、分割露
光のリソグラフィ法によって少なくとも形成された配線
基板において、 該第1の引き出し端子と該第2の引き出し端子とが第3
の導電膜より形成され、該第1の引き出し端子と第1の
導電膜から形成された該第1の配線とが、該第1の絶縁
層に設けたコンタクトホールを介して接続され、該第2
の引き出し端子と第2の導電膜から形成された該第2の
配線とが、該第2の絶縁層に設けたコンタクトホールを
介して接続されてなること、 を特徴とする配線基板。
1. A plurality of first wirings, a first insulating layer covering the first wirings, a first lead terminal connected to the first wirings, and a first insulating layer. At least each of the plurality of second wirings on the upper side, the second insulating layer covering the second wirings, and the second lead terminals connected to the second wirings are formed by a lithography method of divided exposure. In the printed wiring board, the first lead terminal and the second lead terminal are the third
The first lead terminal and the first wiring formed of the first conductive film are connected to each other through a contact hole provided in the first insulating layer. Two
And the second wiring formed of the second conductive film are connected to each other through a contact hole provided in the second insulating layer.
【請求項2】 前記第1の配線が薄膜トランジスタ(T
FT)のソースドレイン配線またはゲート配線の一方で
あり、前記第2の配線が該ソースドレイン配線またはゲ
ート配線の他方であり、該TFTに接続される液晶表示
パネル用画素電極と前記第1の引き出し端子と前記第2
の引き出し端子とが、透明導電材料にてなる前記第3の
導電膜から分割露光のリソグラフィ法によって形成され
てなること、 を特徴とする請求項1記載の配線基板。
2. The thin film transistor (T
FT) source / drain wiring or gate wiring, the second wiring is the other of the source / drain wiring or gate wiring, and the liquid crystal display panel pixel electrode connected to the TFT and the first lead wire. Terminal and the second
2. The wiring board according to claim 1, wherein the lead-out terminal is formed from the third conductive film made of a transparent conductive material by a divided exposure lithography method.
【請求項3】 基板の表面に被着させた第1の導電膜か
らネガ型レジストを使用した分割露光のリソグラフィ法
により前記第1の配線を形成し、その上に被着させた第
1の絶縁膜からポジ型レジストを使用した分割露光のリ
ソグラフィ法により該第1の配線の端部を露呈させる第
1のコンタクトホールを有する前記第1の絶縁層を形成
し、その上に被着させた第2の導電膜からネガ型レジス
トを使用した分割露光のリソグラフィ法により前記第2
の配線を形成し、その上に被着させた第2の絶縁膜から
ポジ型レジストを使用した分割露光のリソグラフィ法に
よって該第2の配線の端部を露呈させる第2のコンタク
トホールと該第1のコンタクトホールを露呈させる第3
のコンタクトホールを有する前記第2の絶縁層を形成
し、その上に被着させた第3の導電膜からポジ型レジス
トを使用した分割露光のリソグラフィ法により前記第1
の引き出し端子と前記第2の引き出し端子とを形成する
こと、 を特徴とする配線基板の製造方法。
3. The first wiring is formed from the first conductive film deposited on the surface of the substrate by the lithography method of divided exposure using a negative resist, and the first wiring is deposited thereon. The first insulating layer having a first contact hole exposing the end of the first wiring was formed from the insulating film by a lithography method of divided exposure using a positive resist, and was deposited on the first insulating layer. The second conductive film is formed on the second conductive film by a lithography method of divided exposure using a negative resist.
Wiring is formed, and the second contact hole and the second contact hole for exposing the end portion of the second wiring from the second insulating film deposited on the second wiring by a lithography method of divided exposure using a positive resist. Third to expose the first contact hole
Forming the second insulating layer having the contact holes of the above, and using the third conductive film deposited on the second insulating layer, the first insulating film is formed by the lithography method of divided exposure using a positive resist.
Forming the lead-out terminal and the second lead-out terminal.
【請求項4】 前記第1の配線がTFTのソースドレイ
ン配線またはゲート配線の一方であり、前記第2の配線
が該ソースドレイン配線またはゲート配線の他方であ
り、該TFTに接続される液晶表示パネル用画素電極と
前記第1の引き出し端子と前記第2の引き出し端子と
を、透明導電材にてなる前記第3の導電膜から分割露光
のリソグラフィ法によって形成すること、 を特徴とする配線基板の製造方法。
4. A liquid crystal display connected to the TFT, wherein the first wiring is one of a source drain wiring or a gate wiring of a TFT and the second wiring is the other of the source drain wiring or the gate wiring. A wiring board, characterized in that the panel pixel electrode, the first lead terminal, and the second lead terminal are formed from the third conductive film made of a transparent conductive material by a split exposure lithography method. Manufacturing method.
JP27133095A 1995-10-19 1995-10-19 Wiring board and its production Pending JPH09113932A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27133095A JPH09113932A (en) 1995-10-19 1995-10-19 Wiring board and its production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27133095A JPH09113932A (en) 1995-10-19 1995-10-19 Wiring board and its production

Publications (1)

Publication Number Publication Date
JPH09113932A true JPH09113932A (en) 1997-05-02

Family

ID=17498556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27133095A Pending JPH09113932A (en) 1995-10-19 1995-10-19 Wiring board and its production

Country Status (1)

Country Link
JP (1) JPH09113932A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000014600A1 (en) * 1998-09-04 2000-03-16 Matsushita Electric Industrial Co., Ltd. Active matrix liquid crystal device and method for producing the same
KR100324457B1 (en) * 1998-06-01 2002-02-27 가네꼬 히사시 Active matrix liquid crystal display device
KR100339507B1 (en) * 1998-07-14 2002-05-31 다니구찌 이찌로오, 기타오카 다카시 Liquid crystal display apparatus and manufacturing method thereof
WO2004068445A1 (en) * 2003-01-30 2004-08-12 Toshiba Matsushita Display Technology Co., Ltd. Display, wiring board, and method for manufacturing same
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Publication number Priority date Publication date Assignee Title
KR100324457B1 (en) * 1998-06-01 2002-02-27 가네꼬 히사시 Active matrix liquid crystal display device
KR100339507B1 (en) * 1998-07-14 2002-05-31 다니구찌 이찌로오, 기타오카 다카시 Liquid crystal display apparatus and manufacturing method thereof
WO2000014600A1 (en) * 1998-09-04 2000-03-16 Matsushita Electric Industrial Co., Ltd. Active matrix liquid crystal device and method for producing the same
WO2004068445A1 (en) * 2003-01-30 2004-08-12 Toshiba Matsushita Display Technology Co., Ltd. Display, wiring board, and method for manufacturing same
KR100738309B1 (en) * 2003-01-30 2007-07-12 도시바 마쯔시따 디스플레이 테크놀로지 컴퍼니, 리미티드 Display, wiring board, and method for manufacturing same
US7324351B2 (en) 2003-01-30 2008-01-29 Toshiba Matsushita Display Technology Co., Ltd. Display, wiring board, and method of manufacturing the same
US8842230B2 (en) 2007-07-06 2014-09-23 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
JP2009038353A (en) * 2007-07-06 2009-02-19 Semiconductor Energy Lab Co Ltd Liquid crystal display device
US9188825B2 (en) 2007-07-06 2015-11-17 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US9766526B2 (en) 2007-07-06 2017-09-19 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US10338447B2 (en) 2007-07-06 2019-07-02 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US10678107B2 (en) 2007-07-06 2020-06-09 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US10712625B2 (en) 2007-07-06 2020-07-14 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US11194207B2 (en) 2007-07-06 2021-12-07 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US11726378B2 (en) 2007-07-06 2023-08-15 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
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