JPH01293738A - Demodulating circuit - Google Patents

Demodulating circuit

Info

Publication number
JPH01293738A
JPH01293738A JP12515588A JP12515588A JPH01293738A JP H01293738 A JPH01293738 A JP H01293738A JP 12515588 A JP12515588 A JP 12515588A JP 12515588 A JP12515588 A JP 12515588A JP H01293738 A JPH01293738 A JP H01293738A
Authority
JP
Japan
Prior art keywords
circuit
deterioration
signal
data changing
changing points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12515588A
Other languages
Japanese (ja)
Inventor
Takashi Kashiwagi
孝 柏木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12515588A priority Critical patent/JPH01293738A/en
Publication of JPH01293738A publication Critical patent/JPH01293738A/en
Pending legal-status Critical Current

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  • Dc Digital Transmission (AREA)

Abstract

PURPOSE:To compensate for respective defects in one-bit integration and two-bit integration and to correctly reproduce a code according to the compensation by selectively switching the integrating time of an integrating circuit with the deterioration degree of a detecting signal as information. CONSTITUTION:Data changing points when a deterioration in a detecting signal 1 is small concentrate near the rising edge of a reproduced clock 8b. However, the data changing points becomes ambiguous, and many parts to be apparent data changing points appear not only near the rising edge but also in other parts in the clock 8b when the deterioration in the signal 1 becomes larger. Consequently, a prescribed gate signal is generated at a shift register 6g, and only the apparent data changing points, which are made into pulses at a comparator 6b and a monostable multivibrator 6c, are passed through a gate 6d and counted at a counter 6e. It is decided that the deterioration of the signal 1 is large when the number of the apparent data changing points counted by a timer 6h for fixed time is larger than a value set in a plexer 6f, it is decided that the deterioration of the signal 1 is small when the above- mentioned number of the apparent data changing points is smaller than the above- mentioned set value, and the decided result is outputted to a switching circuit to select the integrating time.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明はディジタル通信装置の復調回路に係り特に検
波信号の劣化度に応じて、積分器の積分時間を制御する
復調回路に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a demodulation circuit for a digital communication device, and more particularly to a demodulation circuit that controls the integration time of an integrator according to the degree of deterioration of a detected signal.

〔従来の技術〕[Conventional technology]

第5図は###t       臣無念妻貴従来のディ
ジタル通信装置の復調回路を示すブロック図であり、図
において、1は周波数検波信号(以下、検波信号という
)、2は検波信号1から再生クロックを得るクロック再
生回路、3はリセットパルス発生回路、4はリセットパ
ルスを積分する積分回路、5は復調データを出力する符
号再生回路、8aは復調クロック、9は上記の復調デー
タである。
Figure 5 is a block diagram showing the demodulation circuit of a conventional digital communication device. 3 is a reset pulse generating circuit; 4 is an integrating circuit that integrates the reset pulse; 5 is a code reproducing circuit that outputs demodulated data; 8a is a demodulated clock; and 9 is the demodulated data.

次に動作について説明する。検波信号1は、クロック再
生回路2と積分回路4に入力される。積分回路4の積分
時間はリセットパルス発生回路3により規定される。−
例として、第6図(a)にGMSK変調された信号の検
波信号波形、第6図(b)に再生クロック、第6図(c
)に1ビット積分波形、第6図(d)に2ビット積分波
形をそれぞれ示す、ここでは再生クロックの立上りエツ
ジは検波信号のデータ変化点に同期している。また、リ
セットパルス発生回路3のリセットパルスは再生クロッ
クの立上りエツジに同期している。
Next, the operation will be explained. The detected signal 1 is input to a clock recovery circuit 2 and an integration circuit 4. The integration time of the integration circuit 4 is defined by the reset pulse generation circuit 3. −
As an example, Fig. 6(a) shows the detected signal waveform of the GMSK modulated signal, Fig. 6(b) shows the recovered clock, and Fig. 6(c) shows the detected signal waveform of the GMSK modulated signal.
) shows a 1-bit integrated waveform, and FIG. 6(d) shows a 2-bit integrated waveform, in which the rising edge of the recovered clock is synchronized with the data change point of the detected signal. Further, the reset pulse of the reset pulse generating circuit 3 is synchronized with the rising edge of the reproduced clock.

S よって、第6図(a)に示す検波信号はそのデータ
変化点を始点として積分され、例えば第6図(c)また
は(d)のように積分時間が1ビツトまたは2ビツトの
いずれかに固定される。
Therefore, the detected signal shown in Fig. 6(a) is integrated starting from the data change point, and the integration time is set to either 1 bit or 2 bits as shown in Fig. 6(c) or (d), for example. Fixed.

積分回路4の出力は符号再生回路5へ入り、積分終了時
点の電圧が予めセットされた識別基準電圧と比較されて
、′1”または“0”の判定を受け、復調データ9とし
て出力される。
The output of the integrating circuit 4 enters the code reproducing circuit 5, where the voltage at the end of the integration is compared with a preset identification reference voltage, determined to be '1' or '0', and output as demodulated data 9. .

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の復調回路は以上のように構成されているので、積
分回路4の積分時間が1ビツトまたは2ビツトのどちら
か一方に固定されると、1ビット積分の場合では、検波
信号1の劣化が大きくなると、符号判定のための識別余
裕が元々少なかったのがさらに減少するため正しく符号
再生されなくなり、一方、2ビット積分の場合では、符
号判定するビットの前2ビットのデータの組合せを条件
として符号再生するので、検波信号1の劣化が小さくて
も、何らかの条件で1ビツト誤ると、これを条件として
判定された符号も引き続き誤り、エラーの拡大を招くな
どの問題点があった。
Since the conventional demodulation circuit is configured as described above, if the integration time of the integration circuit 4 is fixed to either 1 bit or 2 bits, the deterioration of the detected signal 1 will be reduced in the case of 1 bit integration. When it becomes large, the identification margin for sign judgment, which was originally small, further decreases, and the code cannot be reproduced correctly.On the other hand, in the case of 2-bit integration, if the combination of the data of the 2 bits before the bit to be judged is the condition, Since the code is regenerated, even if the deterioration of the detected signal 1 is small, if one bit is erroneous under some condition, the code determined under this condition will continue to be erroneous and the error will increase.

この発明は上記のような問題点を解消するためになされ
たもので、検波信号の劣化度を情帽として、積分回路の
積分時間を選択的に切替えることにより、1ビット積分
および2ビット積分それぞれの欠点を補い、これにより
正しい符号再生ができる復調回路を得ることを目的とす
る。
This invention was made to solve the above-mentioned problems, and by selectively switching the integration time of the integration circuit based on the degree of deterioration of the detected signal, it is possible to perform 1-bit integration and 2-bit integration respectively. The purpose of this invention is to provide a demodulation circuit that can compensate for the shortcomings of the above and thereby perform correct code reproduction.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係る復調回路は、検波信号の劣化度をこの検
波信号のデータ変化点のばらつきから検知回路によって
検知し、この検知結果に従って、積分回路の積分時間を
切替回路によって選択的に切替えるような構成としたも
のである。
The demodulation circuit according to the present invention detects the degree of deterioration of the detected signal by a detection circuit from the variation in data change points of the detected signal, and selectively switches the integration time of the integration circuit by a switching circuit according to the detection result. It is structured as follows.

〔作用〕[Effect]

この発明における復調回路は、検波信号の劣化度を検波
信号より得られるデータ変化点のばらつきから判定し、
検波信号がある設定値より劣化していれば積分回路の積
分時間を2ビツトにして識別余裕を大きくし、その逆で
あれば積分時間を1ビツトにしてエラーの拡大を抑える
ようにする。
The demodulation circuit in this invention determines the degree of deterioration of the detected signal from the variation in data change points obtained from the detected signal,
If the detected signal has deteriorated below a certain set value, the integration time of the integration circuit is set to 2 bits to increase the discrimination margin, and if vice versa, the integration time is set to 1 bit to suppress the expansion of errors.

〔発明の実施例〕[Embodiments of the invention]

以下、この発明の一実施例を図について説明する。第1
図において、lは検波信号、2はクロック再生回路、3
aは1ビット積分用のリセットパルス発生回路、3bは
2ビット積分用のリセットパルス発生回路、4aは1ビ
ット積分回路、4bは2ビット積分回路、5aは1ビッ
ト積分用の符号再生回路、5bは2ビット積分用の符号
再生回路、6は検波信号の劣化度を検知する検知回路、
7は検知回路6の条件によって積分時間を選択する切替
回路、8bは再生クロック、9は復調データである。
An embodiment of the present invention will be described below with reference to the drawings. 1st
In the figure, l is a detection signal, 2 is a clock recovery circuit, and 3 is a detection signal.
a is a reset pulse generation circuit for 1-bit integration, 3b is a reset pulse generation circuit for 2-bit integration, 4a is a 1-bit integration circuit, 4b is a 2-bit integration circuit, 5a is a code regeneration circuit for 1-bit integration, 5b 6 is a code regeneration circuit for 2-bit integration, 6 is a detection circuit that detects the degree of deterioration of the detected signal,
7 is a switching circuit that selects the integration time according to the conditions of the detection circuit 6, 8b is a reproduced clock, and 9 is demodulated data.

第2図は第1図に示した検知回路6の具体的ブロック図
である0図において、6aは検波信号1のデータ変化点
の位置を明白にするために設けた増幅器、6bは増幅器
6aの出力をデータ変化点にて比較する比較器、6cは
比較@6bの立上りエツジでパルスを発生させる単安定
マルチバイブレータ、6dは単安定マルチバイブレータ
6cの出力のうち、カウンタ6eで計数する部分を制御
するゲート、6fはカウンタ6eの出力から検波信号1
の劣化度を判定するマルチプレクサ、6g1tゲート6
dを制御するタイミングを再生クロックより作るシフト
レジスタ、6hはカウンタ6eを動作させる時間を計数
するタイマである。
FIG. 2 is a concrete block diagram of the detection circuit 6 shown in FIG. 1. In FIG. A comparator that compares the output at data change points, 6c is a monostable multivibrator that generates a pulse at the rising edge of comparison @6b, and 6d controls the part of the output of monostable multivibrator 6c that is counted by counter 6e. The gate 6f receives the detection signal 1 from the output of the counter 6e.
Multiplexer that determines the degree of deterioration of 6g1t gate 6
A shift register 6h generates the timing for controlling d from a recovered clock, and a timer 6h counts the time for operating the counter 6e.

次に、上記実施例の動作を説明する。検波信号1はGM
SK変調された信号の周波数検波波形とする。この検波
信号1を第6図(、)に示す、この検波信号1はクロッ
ク再生回路2.積分回路4a、4b及び検知回路6に入
力される。クロック再生回路2では、立上りエツジが検
波信号1のデータ変化点に一致した第6図(b)に示す
ようなりロック8bを再生する。一方、この再生クロッ
ク8bの立上りエツジに同期した1ビツト毎のパルスが
リセットパルス発生回路3aで、また、2ビツト毎のパ
ルスがリセットパルス発生回路3bでそれぞれ作られる
。これらパルスで制御された積分回路出力がそれぞれ第
6図(c)の1ビット積分波形、第6図(d)の2ビッ
ト積分波形である。そしてそれぞれの積分波形出力は別
々の符号再生回路5a、5bに入って“1”、′0#の
判定を受け、復調データとして出力される。
Next, the operation of the above embodiment will be explained. Detection signal 1 is GM
Let it be the frequency detection waveform of the SK modulated signal. This detected signal 1 is shown in FIG. The signal is input to integration circuits 4a and 4b and a detection circuit 6. The clock regeneration circuit 2 regenerates the lock 8b such that the rising edge coincides with the data change point of the detected signal 1 as shown in FIG. 6(b). On the other hand, a pulse for every 1 bit synchronized with the rising edge of the recovered clock 8b is generated by the reset pulse generating circuit 3a, and a pulse for every 2 bits is generated by the reset pulse generating circuit 3b. The outputs of the integrating circuit controlled by these pulses are the 1-bit integrated waveform shown in FIG. 6(c) and the 2-bit integrated waveform shown in FIG. 6(d), respectively. Then, the respective integrated waveform outputs enter separate code reproducing circuits 5a and 5b, are judged as "1" or '0#, and are output as demodulated data.

一方、検知回路6は、第6図(a)と同様の第3図(a
)に示す検波信号1を、増幅器6aによって、第3図(
b)のようにデータ変化点を強調した波形にする。検波
信号1の劣化が少ない場合、第3図(b)、(c)の関
係のように、データ変化点は再生クロック8の立上りエ
ツジ付近に集中している。ところが、検波信号1の劣化
が大きくなると、データ変化点があいまいになり1本来
データ変化点ではないが見かけ上データ変化点となる部
分が、再生クロック8bの立上のエツジ付近以外にも多
数現われる。よって、シフトレジスタ6gで第3図(d
)に示すゲート信号を作り、比較器6bおよび単安定マ
ルチバイブレータ6cでパルスにした見かけ上のデータ
変化点だけ、ゲート6aを通過させて、カウンタ6eで
計数させる。
On the other hand, the detection circuit 6 is shown in FIG. 3(a) similar to FIG. 6(a).
) is detected by the amplifier 6a as shown in FIG.
Create a waveform that emphasizes data change points as shown in b). When the deterioration of the detected signal 1 is small, data change points are concentrated near the rising edge of the recovered clock 8, as shown in the relationships shown in FIGS. 3(b) and 3(c). However, as the deterioration of the detected signal 1 increases, the data change point becomes ambiguous, and many portions that are not originally data change points but appear to be data change points appear other than near the rising edge of the recovered clock 8b. . Therefore, with shift register 6g,
) is generated, and only the apparent data change points made into pulses by the comparator 6b and the monostable multivibrator 6c are passed through the gate 6a and counted by the counter 6e.

このデータ変化点の計数により、タイマー6hによって
一定時間計数された見かけ上のデータ変化点の数が、マ
ルチプレクサ6fに予めセットされている値より大きけ
れば、検波信号の劣化大、−方、小さければ劣化小の判
定を行なう、そして、このようにして得られた検波信号
1の劣化度が大きければ、切替回路7は2ピット積分に
より得られた再生データを復調データとして出力し、劣
化度が小さければ1ビット積分により得られた再生デー
タを復調データとして出力する。
By counting the data change points, if the apparent number of data change points counted for a certain period of time by the timer 6h is larger than the value preset in the multiplexer 6f, the deterioration of the detected signal is large; If the degree of deterioration of the detected signal 1 obtained in this way is large, the switching circuit 7 outputs the reproduced data obtained by 2-pit integration as demodulated data, and if the degree of deterioration is small, For example, reproduced data obtained by 1-bit integration is output as demodulated data.

なお、上記実施例ではリセットパルス発生回路3a、3
b、積分回路4a、4b、符号再生回路5a、5bをそ
れぞれ1ビット積分用、2ビット積分用として別々に設
け、復調データを検知回路6の情報により切替回路7で
選択しているが、第4図に示すように、リセットパルス
発生回路3a。
Note that in the above embodiment, the reset pulse generation circuits 3a, 3
b. Integrating circuits 4a, 4b and code reproducing circuits 5a, 5b are provided separately for 1-bit integration and 2-bit integration, respectively, and demodulated data is selected by switching circuit 7 based on information from detection circuit 6. As shown in FIG. 4, a reset pulse generation circuit 3a.

3bの出力を検知回路6の出力にもとづいて切替回路7
aにより切替えて、1つの積分回路4に入力するように
すれば、積分回路を1ビット積分用。
3b to the switching circuit 7 based on the output of the detection circuit 6.
If the signal is switched by a and input to one integrating circuit 4, the integrating circuit can be used for 1-bit integration.

2ビット積分用と分けることなく、共用が可能になる。It can be shared without having to separate it from the one for 2-bit integration.

また、上記実施例ではGMSK変調された信号の復調回
路について説明したが、検波信号1を積分した後符号再
生を行なうという手段を用いた復調形式のものならば、
変調方式によらず、上記実施例と同様の効果を奏する。
Further, in the above embodiment, a demodulation circuit for a GMSK modulated signal was explained, but if it is a demodulation type that uses a means of integrating the detected signal 1 and then performing code regeneration,
Regardless of the modulation method, the same effects as in the above embodiment can be achieved.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によれば検波信号の劣化度に合
わせて、劣化の小さい時は1ビット積分。
As described above, according to the present invention, 1-bit integration is performed when the deterioration is small according to the degree of deterioration of the detected signal.

大きい時は2ビット積分を行うように構成したので、双
方の欠点である識別余裕の問題や誤り拡大の問題が大い
に減少でき、安定な符号再生能力を有する復調回路が得
られる効果がある。
Since the structure is configured so that 2-bit integration is performed when the value is large, the problems of identification margin and error amplification, which are the drawbacks of both, can be greatly reduced, and a demodulation circuit with stable code reproduction ability can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例による復調回路を示すブロ
ック図、第2図は第1図に示した検知回路の具体的ブロ
ック図、第3図は第2図に示した検知回路の各部の信号
波形図、第4図はこの発明の他の実施例を示すブロック
図、第5図は従来の復調回路を示すブロック図、第6図
は検波信号と再生クロック、1ビツト及び2ビット積分
波形の位相関係を示す信号波形図である。 1は周波数検波信号(検波信号)、4,4a。 4bは積分回路、6は検知回路、7は切替回路、8bは
再生クロック。 なお、図中、同一符号は同一または相当部分を示す。 特許出願人  三菱電機株式会社 第2図 第3図 (e) 8oI今生70プフ 第6図 (0]1 手続補正書(自発)・
FIG. 1 is a block diagram showing a demodulation circuit according to an embodiment of the present invention, FIG. 2 is a specific block diagram of the detection circuit shown in FIG. 1, and FIG. 3 is a block diagram of each part of the detection circuit shown in FIG. 2. FIG. 4 is a block diagram showing another embodiment of the present invention, FIG. 5 is a block diagram showing a conventional demodulation circuit, and FIG. 6 shows the detected signal, recovered clock, 1-bit and 2-bit integration. FIG. 3 is a signal waveform diagram showing a phase relationship of waveforms. 1 is a frequency detection signal (detection signal), 4, 4a. 4b is an integrating circuit, 6 is a detection circuit, 7 is a switching circuit, and 8b is a regenerated clock. In addition, in the figures, the same reference numerals indicate the same or corresponding parts. Patent applicant Mitsubishi Electric Corporation Figure 2 Figure 3 (e) 8oI Imao 70 Puff Figure 6 (0] 1 Procedural amendment (voluntary)

Claims (1)

【特許請求の範囲】[Claims] 周波数検波信号を再生クロックに同期したタイミングで
、1ビット分及び2ビット分それぞれ積分する積分回路
と、上記周波数検波信号の劣化度を、この周波数検波信
号から得られるデータ変化点のばらつきに基づいて検知
する検知回路と、この検知回路の出力に基づいて上記積
分回路の出力を切替選択して出力する切替回路とを備え
た復調回路。
An integration circuit that integrates the frequency detection signal for 1 bit and 2 bits at a timing synchronized with the regenerated clock, and the degree of deterioration of the frequency detection signal is determined based on the variation in data change points obtained from the frequency detection signal. A demodulation circuit comprising: a detection circuit for detecting; and a switching circuit for selectively outputting the output of the integrating circuit based on the output of the detection circuit.
JP12515588A 1988-05-23 1988-05-23 Demodulating circuit Pending JPH01293738A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12515588A JPH01293738A (en) 1988-05-23 1988-05-23 Demodulating circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12515588A JPH01293738A (en) 1988-05-23 1988-05-23 Demodulating circuit

Publications (1)

Publication Number Publication Date
JPH01293738A true JPH01293738A (en) 1989-11-27

Family

ID=14903237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12515588A Pending JPH01293738A (en) 1988-05-23 1988-05-23 Demodulating circuit

Country Status (1)

Country Link
JP (1) JPH01293738A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006332878A (en) * 2005-05-24 2006-12-07 Japan Radio Co Ltd Threshold setting device of two-symbol zone integration output
JP2007129595A (en) * 2005-11-05 2007-05-24 New Japan Radio Co Ltd Fsk demodulation circuit
JP2008236206A (en) * 2007-03-19 2008-10-02 New Japan Radio Co Ltd Bit synchronization circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58206264A (en) * 1982-05-27 1983-12-01 Nippon Telegr & Teleph Corp <Ntt> Demodulating system of digital modulated signal

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58206264A (en) * 1982-05-27 1983-12-01 Nippon Telegr & Teleph Corp <Ntt> Demodulating system of digital modulated signal

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006332878A (en) * 2005-05-24 2006-12-07 Japan Radio Co Ltd Threshold setting device of two-symbol zone integration output
JP2007129595A (en) * 2005-11-05 2007-05-24 New Japan Radio Co Ltd Fsk demodulation circuit
JP4722673B2 (en) * 2005-11-05 2011-07-13 新日本無線株式会社 FSK demodulation circuit
JP2008236206A (en) * 2007-03-19 2008-10-02 New Japan Radio Co Ltd Bit synchronization circuit

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