JP7219504B2 - Inspection equipment whose operation is confirmed using pseudo-defective products - Google Patents

Description

The present invention relates to an inspection apparatus whose operation is confirmed using pseudo-defective products.

A product manufacturing facility may include inspection equipment that determines whether the product is good or bad. An example of an inspection device is an X-ray inspection device. An X-ray inspection apparatus has, for example, an X-ray irradiator that irradiates a product with X-rays and an imaging device that acquires an image of the product. Determination of good or bad products is often performed automatically. The determination procedure includes, for example, a process of comparing the index extracted from the image with a predetermined threshold.

When using the inspection device, it is necessary to periodically check the operation in order to confirm whether or not the automatic determination of whether the product is good or bad is being performed normally. Pseudo-defective products are used in the operation check of the inspection device disclosed in Patent Document 1 (Japanese Patent No. 4724462). A pseudo-defective product is an object configured to be determined as a defective product by an inspection device, such as a product to which a foreign substance is intentionally added. Pseudo-defective products are artificially mixed on the conveying path of the products successively supplied to the inspection device during the operation check. Product inspections are also carried out during such operation checks. A product that is determined to be non-defective by the inspection device during the operation check is passed to the subsequent process and shipped, so the operation check does not have a large adverse effect on manufacturing efficiency.

However, it is generally difficult to determine whether an inspection target determined to be defective is a defective product among the original products or a pseudo-defective product. It is difficult to check the operation of the inspection device at the same time. In a configuration in which the inspection device itself automatically determines whether or not an object to be inspected is a pseudo-defective product, the credibility of the operation confirmation of the inspection device itself is questionable.

SUMMARY OF THE INVENTION An object of the present invention is to facilitate checking of operations performed while manufacturing a product in an inspection apparatus.

An inspection apparatus according to a first aspect of the present invention inspects articles. The inspection apparatus includes an inspection mechanism, a transport mechanism, a storage section, an inspection result output section, an input section, and a mode setting section. The inspection mechanism performs an inspection to determine whether an article is a non-defective article or a defective article by detecting foreign matter attached to the article. A transport mechanism receives an item, passes it through an inspection mechanism, and ejects it. The storage unit stores the number of non-defective items, which is the number of non-defective items, and the number of defective items, which is the number of defective items determined in the inspection. The inspection result output unit outputs the number of non-defective products and the number of defective products. The input unit receives input from the user. The mode setting unit sets one of the normal mode for inspecting the article only and the test mode for checking the operation of the inspection mechanism together with the inspection of the article. When the mode setting section sets the test mode and the inspection mechanism determines that the article is non-defective, the storage section adds the article to the number of non-defective items. The test mode is set by the mode setting unit, and the inspection mechanism is configured to be determined as the defective product by the inspection mechanism that operates normally. If it is determined that there is, the storage unit does not count the pseudo-defective items in the number of defective items.

According to this configuration, pseudo-defective products are not included in the number of defective products in the test mode. The number of defective products described in the inspection report is the number of defective products generated in the product manufacturing process. Therefore, even during the operation check of the inspection device, the user can know the accurate defective product rate from the inspection report.

An inspection apparatus according to a second aspect of the present invention is the inspection apparatus according to the first aspect, wherein when the mode setting unit sets the test mode, the storage unit determines that the product is defective by the inspection mechanism. The number of pseudo-defective products, which is the number of pseudo-defective products detected, is further stored.

According to this configuration, in the test mode, pseudo-defective products are included in the number of pseudo-defective products. Therefore, the user can confirm the operation of the inspection apparatus by confirming whether the number of pseudo-defective products described in the inspection report matches the number of times pseudo-defective products were actually introduced during execution of the test mode. can be done.

An inspection apparatus according to a third aspect of the present invention is the inspection apparatus according to the second aspect, further comprising a display section for providing information to the user. When the mode setting unit has set the test mode and the defective product has been determined, the display unit displays an object to be inspected. In the same case, the input unit accepts from the user a designation as to whether the display is about the article or about the pseudo-defective product. In the same case, the storage unit counts the determination of defective items in the number of defective items when the designation is articles, and counts the determination of defective items in the number of pseudo defective items when the designation is pseudo-defective items. do.

According to this configuration, in the test mode, by viewing the display of the object to be inspected, the user can confirm whether the defective product determination is caused by a manufacturing defect of the product or by a pseudo-defective product. . Thereby, the operation of the inspection device 10 can be confirmed.

An inspection apparatus according to a fourth aspect of the present invention is the inspection apparatus according to the third aspect, wherein the inspection mechanism has an electromagnetic wave source that emits electromagnetic waves. The indication to be inspected relates to the article irradiated with electromagnetic waves.

According to this configuration, the inspection mechanism inspects using electromagnetic waves. Therefore, the article to be inspected is less likely to be destroyed.

An inspection apparatus according to a fifth aspect of the present invention is the inspection apparatus according to the fourth aspect, wherein the electromagnetic waves are X-rays. The representation of the inspected object is an image of the article exposed to X-rays.

According to this configuration, the inspection mechanism performs inspection using X-rays. Therefore, it is possible to easily detect the presence of foreign matter in the article.

An inspection apparatus according to a sixth aspect of the present invention is the inspection apparatus according to the fourth aspect, wherein the display is a quantity related to the magnetic field induced by the electromagnetic wave that has passed through the article.

According to this configuration, the inspection mechanism performs inspection using the induced magnetic field. Therefore, it is easy to detect contamination of articles with metal pieces.

An inspection apparatus according to a seventh aspect of the present invention is the inspection apparatus according to the third aspect, in which the inspection mechanism has a weight measuring section for measuring the weight of the article. Indications are quantities in relation to the weight of the article.

According to this configuration, the inspection mechanism performs inspection by weight. Therefore, the inspection device can be constructed at a relatively low cost.
An inspection device according to another aspect inspects an article. The inspection apparatus includes an inspection mechanism, a transport mechanism, a storage section, an input section, a mode setting section, and a control section. The inspection mechanism performs an inspection to determine whether an article is a non-defective article or a defective article by detecting foreign matter to be inspected. A transport mechanism receives an item, passes it through an inspection mechanism, and ejects it. The storage unit stores the results determined in the inspection. The input unit receives input from the user. The mode setting section sets either a normal mode for only inspecting the article or a test mode for checking the operation of the inspection mechanism along with the inspection of the article. When the mode setting unit sets the test mode and the inspection mechanism determines that the inspection object is a non-defective product, the control unit causes the storage unit to store the inspection object as a non-defective product. The control unit determines that the test mode is set by the mode setting unit, the inspection mechanism determines that the inspection target is defective, and the inspection mechanism determines that the inspection mechanism operates normally and determines that the product is defective. When the input part receives an input indicating that it is a pseudo-defective product, the storage part does not store the inspection object selected by the input indicating that it is a pseudo-defective product as a defective product.
An inspection method according to another aspect is used to inspect an article. In the inspection method, in the test mode for checking the operation of the inspection mechanism together with the inspection of the article, when the inspection object is determined to be a non-defective product, the inspection object is stored as a non-defective product. In the inspection method, in the test mode, the test object is determined to be defective, and the test object is determined to be a pseudo-defective product by an inspection mechanism that operates normally. When receiving an input to the effect that it is a pseudo-defective product from the user, the inspection target selected by the input indicating that it is a pseudo-defective product is not stored as a defective product.
An inspection system according to another aspect inspects an article. The inspection system comprises a storage unit and a control unit. In a test mode for inspecting the article and checking the operation of the inspection mechanism, the control unit stores the inspection target as a non-defective product in the storage unit when determining that the inspection target is a non-defective product. In the test mode, the control unit determines that the inspection object is defective, and the inspection object is a pseudo-disused article configured to be determined as a disused article by the inspection object operating normally. When receiving an input to the effect that it is a pseudo-defective product from the user, the inspection target selected by the input indicating that it is a pseudo-defective product is not stored in the storage unit as a defective product.

According to the inspection apparatus according to the present invention, it is easy to check the operation performed while manufacturing the product.

1 is an external view of an inspection device 10 according to one embodiment of the present invention; FIG. 1 is a schematic diagram of an inspection system 90 using inspection apparatus 10. FIG. 3 is a schematic diagram of an inspection mechanism 50 of the inspection apparatus 10; FIG. 3 is a block diagram of a control unit 60 of the inspection device 10; FIG. 4 is an external view of a pseudo-defective product Q; FIG. It is a figure which shows the defect determination screen Z. FIG.

Hereinafter, embodiments of the present invention will be described with reference to the drawings. The following embodiments are specific examples of the present invention and do not limit the technical scope of the present invention.

(1) Overall Configuration FIG. 1 shows an inspection apparatus 10 according to one embodiment of the present invention. The inspection apparatus 10 is installed, for example, in a transportation line for goods such as bagged food, and inspects whether foreign substances such as metal pieces are mixed in the goods. The inspection apparatus 10 has a shield box 20, a transport mechanism 30, a touch panel 40, an inspection result output section 45, an inspection mechanism 50, and a control section 60 (not shown). The inspection apparatus 10 is placed on a table S in order to match the height of the conveyors arranged in the front and rear stages thereof.

FIG. 2 shows an inspection system 90 utilizing inspection apparatus 10 . The inspection device 10 receives the article A conveyed in the conveying direction C from the preceding conveyor B1. The inspection device 10 performs an inspection to determine whether the article A is a non-defective article containing no foreign matter or a defective article containing foreign matter. The articles A ejected from the inspection device 10 are sent to the sorting device 80 . The sorting device 80 receives the determination result regarding the article A from the inspection device 10 . The sorting device 80 delivers non-defective products to the downstream conveyor B2 and discharges defective products in the discharge direction E1 or the discharge direction E2.

(2) Detailed Configuration Returning to FIG. 1, details of the inspection apparatus 10 will be described. The inspection device 10 inspects the article A using X-rays.

(2-1) Shield box 20
The shield box 20 is the casing of the inspection device 10 . The shield box 20 is made of a material that does not transmit X-rays. The shield box 20 is formed with an article receiving opening 21 for receiving the article A and an article discharge opening 22 for discharging the article A. As shown in FIG. A shielding curtain 23 is attached to both the article receiving port 21 and the article discharging port 22 . The shielding curtain 23 prevents X-rays from leaking out of the shield box 20 .

(2-2) Transport mechanism 30
The conveying mechanism 30 conveys the article A from the article receiving opening 21 to the article discharging opening 22 . As shown in FIG. 3, the conveying mechanism 30 has an endless belt 31, a driving roller 32, a driven roller 33, and a driving motor . The endless belt 31 is stretched from the driving roller 32 to the driven roller 33 . The endless belt 31 is made of a material that transmits X-rays. A drive motor 34 rotates the drive roller 32 . The upper surface 31 a of the endless belt 31 moves from the driven roller 33 toward the driving roller 32 in the conveying direction C together with the article A, thereby allowing the article A to pass through the inspection mechanism 50 . A lower surface 31 b of the endless belt 31 moves from the driving roller 32 toward the driven roller 33 .

(2-3) Touch panel 40
A touch panel 40 shown in FIG. 1 functions as a key for receiving input from a user and a display for providing information to the user.

(2-4) Inspection result output unit 45
The inspection result output unit 45 outputs an inspection report regarding inspection routines performed on a plurality of articles A. FIG. The inspection result output unit 45 is configured as a printer. Alternatively, the inspection result output unit 45 may be configured as a display or other output device.

(2-5) Inspection mechanism 50
The inspection mechanism 50 shown in FIG. 3 has an X-ray irradiator 51 and an X-ray line sensor 52 . The X-ray irradiator 51 irradiates the article A transported by the endless belt 31 of the transport mechanism 30 with X-rays 53 . The article A is, for example, a product G such as food packaged in a packaging material W that transmits X-rays 53 . The X-rays 53 pass through the article A and the upper surface 31 a of the endless belt 31 and reach the X-ray line sensor 52 installed between the upper surface 31 a and the lower surface 31 b of the endless belt 31 . The X-ray line sensor 52 has a plurality of X-ray detection elements 52a arranged in a row in a direction perpendicular to the transport direction C. As shown in FIG. The X-ray line sensor 52 outputs a signal according to the intensity of the X-rays 53 detected by each X-ray detection element 52a.

(2-6) Control unit 60
A control unit 60 shown in FIG. 4 controls each unit of the inspection apparatus 10 . The control unit 60 has a central processing unit 61 , a storage unit 62 and a mode setting unit 63 . The central processing unit 61 controls the overall operation of the inspection apparatus 10 . The storage unit 62 stores data, programs, variables, flags, images, and other information. The operation mode of the inspection apparatus 10 is set in the mode setting section 63 by the user's input via the input section 41 . The control unit 60 further has various interfaces described below. The key input interface 65 a processes input from the input section 41 configured as keys of the touch panel 40 . The display interface 65 b performs screen control of the display 42 of the touch panel 40 . The inspection result output unit interface 65 c controls the inspection result output unit 45 . The irradiator interface 65 d controls the X-ray irradiator 51 . The line sensor interface 65e amplifies and AD-converts the output signal of the X-ray line sensor 52. FIG. A motor interface 65 f controls the drive motor 34 . The sorting device interface 65g transmits to the sorting device 80 the result of the determination regarding the article A to be inspected.

(3) Operation Modes Operation modes include normal mode MN and test mode MT.

(3-1) Normal mode MN
Normal mode MN is a mode in which a normal inspection routine for article A is performed. When the inspection routine is started, a plurality of articles A are continuously transported by the transport mechanism 30 to the inspection mechanism 50 shown in FIG. The intensity of the X-rays 53 transmitted through the article A is detected by the X-ray line sensor 52 . In the control unit 60 of FIG. 4, the output signal of the X-ray line sensor 52 is acquired by the central processing unit 61 after being amplified and AD-converted by the line sensor interface 65e. The central processing unit 61 integrates the output signals of the X-ray line sensor 52 for a plurality of times into an image format and stores it in the storage unit 62 . The central processing unit 61 determines whether the article A is non-defective or defective according to a predetermined processing procedure. The predetermined processing procedure referred to here includes, for example, image processing of the image stored in the storage unit 62, extraction of a predetermined index from the image, comparison of the index with a predetermined threshold value, and the like. The determination result is sent to the sorting device 80 . The determination results may also be sequentially displayed on the display 42 of the touch panel 40 . The determination result is included in the data of the number of non-defective items NP and the number of defective items NF stored in the storage unit 62 .

When a termination condition such as the elapse of a predetermined time period or the termination of determination of a predetermined number of articles A is satisfied, the inspection apparatus 10 terminates the inspection routine. Finally, an inspection report summarizing the judgment results for a plurality of articles A is output from the inspection result output unit 45 . The inspection report includes the number of non-defective items NP and the number of defective items NF.

The sorting device 80 passes the article A determined as non-defective to the downstream conveyor B2, and discharges the article A determined as defective in the discharge direction E1 or the discharge direction E2.

(3-2) Test mode MT
The test mode MT is a mode for checking the operation of the inspection device 10 itself in order to confirm whether or not the inspection for determining whether the article A is good or bad has been performed normally. Furthermore, the inspection of the article A is also carried out during the execution of the test mode MT, and the non-defective article is transferred to the subsequent conveyor B2 as in the normal mode MN.

In the test mode MT, a user who attends the operation check mixes a pseudo-defective product Q among the plurality of products A conveyed by the preceding conveyor B1. For example, as shown in FIG. 5, the pseudo-defective product Q is obtained by attaching a plurality of metallic foreign substances F with an adhesive tape T to the packaging material W for packaging the product G. As shown in FIG. The plurality of foreign metal particles F have sizes that change regularly and are arranged at regular positions.

In test mode MT, when the inspection routine is started, inspection mechanism 50 inspects article A in the same manner as in normal mode MN. If the object to be inspected is determined to be a non-defective product, the object to be inspected is included in the number of non-defective products NP, and the product A determined to be a non-defective product is transferred to the subsequent conveyor B2. On the other hand, if the inspection target is determined to be defective, the touch panel 40 displays the defect determination screen Z shown in FIG. 6, and the inspection apparatus 10 waits for an input from the user.

The defect determination screen Z includes a defect display 42a indicating that the item has been determined to be defective, and an X-ray image 42b of the item A that has been determined to be defective. By looking at the X-ray image 42b, the user can determine whether the displayed inspection object is a defective product caused by a defect in the manufacturing of the product A or a pseudo-defective product Q that is artificially mixed. do. The defect determination screen Z further includes a defective item key 41a and a pseudo defective item key 41b for designating the user's determination. In FIG. 6, the X-ray image 42b shows regularly arranged metallic foreign matter F, and since there is a high possibility that the object to be inspected is the pseudo-defective product Q, the user touches the pseudo-defective product key 41b. become. If the defective product key 41a is touched, the inspection object is included in the defective product count NF. On the other hand, when the pseudo-defective product key 41b is touched, the inspection object is added to the pseudo-defective product number NQ. The inspection device 10 issues a discharge instruction to the sorting device 80 when either the defective product key 41a or the pseudo defective product key 41b is touched. In this case, for example, the defective product of the product A may be discharged in the discharging direction E1, and the pseudo-defective product Q may be discharged in the discharging direction E2.

The defect judgment screen Z continues to be displayed while waiting for an input from the user. At this time, the transport mechanism 30 may stop operating. Alternatively, only when the article A that is subsequently conveyed to the inspection device 10 continues to be judged as non-defective, and there is time to spare until the inspection target that was previously judged to be defective reaches the sorting device 80. Transport mechanism 30 and inspection mechanism 50 may continue to operate. Alternatively, if the inspection system 90 is configured to discharge both defective products A and pseudo-defective products Q in the same discharging direction E1, the transport mechanism 30 does not have to stop its operation. In this case, the storage unit 62 stores images of all inspection objects determined to be defective. After the inspection routine is completed, the user then views the series of stored images and designates a decision for each image by means of the defective key 41a or the pseudo-defective key 41b.

When the test mode end key 41c is touched or a predetermined end condition is satisfied, the inspection apparatus 10 ends the inspection routine. Finally, an inspection report summarizing the judgment results for a plurality of articles A is output from the inspection result output unit 45 . The inspection report includes the number of non-defective items NP, the number of defective items NF, and the number of pseudo-defective items NQ.

The test mode MT is meaningful for the user, for example, in the following points.
- By viewing the X-ray image 42b, the user can confirm that the pseudo-defective product Q has been determined to be defective. Thereby, the operation of the inspection device 10 can be confirmed.
- The user can confirm whether or not the number of pseudo-defective products NQ described in the inspection report matches the number of times the pseudo-defective products Q are actually introduced during execution of the test mode MT. If the number NQ of pseudo-defective products and the number of inputs match, it can be confirmed that the inspection apparatus 10 is operating normally.
- If the number of pseudo-defective products NQ and the number of inputs are different, it is possible that the pseudo-defective product Q was determined to be a non-defective product, for example. In this case, the user may take measures to discard all of the articles A manufactured during the execution of the inspection routine in the test mode MT, thereby preventing the pseudo-defective product Q from being shipped as a non-defective product of the product A. can be prevented.
- From the inspection report, it is possible to know the number NP of non-defective products that can be shipped.
- From the inspection report, it is possible to know the defective product rate NF/NP.

(4) Features (4-1)
In the test mode MT, the pseudo-defective product Q is not included in the defective product count NF. The number of defective products NF described in the inspection report is the number of defective products generated in the manufacturing process of the article A. Therefore, even during the operation check of the inspection apparatus 10, the user can know the accurate defective product ratio NF/NP from the inspection report.

(4-2)
In the test mode MT, the pseudo-defective product Q is added to the number of pseudo-defective products NQ. Therefore, the user can confirm the operation of the inspection apparatus 10 by confirming whether the number of pseudo defective products NQ described in the inspection report matches the number of times the pseudo defective products Q are actually introduced during the execution of the test mode MT. can confirm.

(4-3)
By viewing the X-ray image 42b in the test mode MT, the user can confirm whether the defective product determination is caused by a manufacturing defect of the product A or by a pseudo-defective product Q. Thereby, the operation of the inspection device 10 can be confirmed.

(4-4)
The inspection mechanism 50 performs inspection using X-rays. Therefore, it is possible to easily detect the foreign metal F mixed into the article A.

(5) Modification (5-1) Modification A
In the inspection apparatus 10 according to the above-described embodiment, the number of pseudo defective products NQ is counted in the test mode MT. Alternatively, in the test mode MT, the specification may be such that the number of pseudo-defective products NQ is not counted.

In the test mode MT, when the inspection target is determined to be defective, the touch panel 40 displays the defect determination screen Z shown in FIG. 6, and the inspection apparatus 10 waits for an input from the user. If the defective product key 41a is touched, the inspection object is included in the defective product count NF. On the other hand, when the pseudo-defective product key 41b is touched, the inspection object is not included in any variable.

When the test mode end key 41c is touched or a predetermined end condition is satisfied, the inspection apparatus 10 ends the inspection routine. Finally, an inspection report summarizing the judgment results for a plurality of articles A is output from the inspection result output unit 45 . The inspection report includes, for example, the number of non-defective items NP, the number of defective items NF, and the result of the inspection routine. The inspection routine result includes a message to the effect that it is "good" when the number of defective items NF is zero, and to the effect that it is "defective" when the number of defective items NF is 1 or more.

According to this configuration, the inspection report does not include the determination of the defective product caused by the pseudo defective product Q. FIG. Therefore, the user can grasp the state of the manufacturing equipment for the article A in a concise manner.

(5-2) Modification B
The inspection apparatus 10 according to the above-described embodiment is equipped with an inspection mechanism 50 configured as an X-ray optical system. Alternatively, the inspection mechanism 50 may be configured by other optical systems or electromagnetic wave detection systems. In this case, instead of the X-ray irradiator 51, an electromagnetic wave source that emits electromagnetic waves such as ultraviolet rays, visible rays, infrared rays, and microwaves is used. Instead of the X-ray line sensor 52, an electromagnetic wave sensor for detecting those electromagnetic waves is used.

According to this configuration, the inspection mechanism 50 performs inspection using electromagnetic waves. Therefore, the article A to be inspected is less likely to be destroyed.

(5-3) Modification C
The inspection apparatus 10 according to the above-described embodiment is equipped with an inspection mechanism 50 that performs determination by detecting transmitted X-ray intensity. Alternatively, the inspection mechanism 50 may make the determination by detecting magnetic fields induced by electromagnetic waves transmitted through the article. The magnetic field sensor used in place of the X-ray line sensor 52 need not be a line sensor. The control unit 60 does not need to integrate the output signals of the magnetic field sensors as an image. In the defect determination screen Z, the magnitude of the detected induced magnetic field is displayed instead of the X-ray image 42b. As the pseudo-defective product Q, a product to which a large amount of metal foreign matter F is added so as to exceed the range of the amount of metal foreign matter F mixed in a normal manufacturing process is used. The user looks at the level of the induced magnetic field displayed on the defect judgment screen Z and judges whether the object to be inspected is a defective product A or a pseudo-defective product Q. FIG. After that, the user designates the judgment using the defective product key 41a or the pseudo defective product key 41b.

According to this configuration, the inspection mechanism 50 performs inspection using an induced magnetic field. Therefore, it is easy to detect contamination of articles with metal pieces.

(5-4) Modification D
The inspection apparatus 10 according to the above-described embodiment inspects the presence or absence of foreign metal F mixed into an article A. As shown in FIG. Alternatively, the inspection device 10 may inspect whether the weight of the article A is within a predetermined shipping allowable range. In this case, instead of the inspection mechanism 50 that makes a determination by detecting the transmitted X-ray intensity, an inspection mechanism 50 that makes a determination by detecting the weight of the article A is mounted. The weight measuring unit used in place of the X-ray line sensor 52 need not be a line sensor. The control section 60 does not need to integrate the output signals of the weight measuring section as an image. On the defect determination screen Z, the size of the detected weight is displayed instead of the X-ray image 42b. As the pseudo-defective product Q, one having a weight that is outside the weight range of the normal product A is used. The user looks at the weight level displayed on the defect judgment screen Z and judges whether the object to be inspected is a defective item A or a pseudo-defective item Q. FIG. After that, the user designates the judgment using the defective product key 41a or the pseudo defective product key 41b.

According to this configuration, the inspection mechanism 50 performs inspection by weight. Therefore, the inspection device 10 can be constructed at a relatively low cost.

REFERENCE SIGNS LIST 10 inspection device 20 shield box 30 transport mechanism 40 touch panel 50 inspection mechanism 51 X-ray irradiation device 52 X-ray line sensor 60 control unit
A article
F Metal foreign matter
Q Pseudo defective product
Z defect display screen

Japanese Patent No. 4724462

Claims (2)

An inspection system for inspecting an article,
an inspection mechanism that performs an inspection to determine whether the article to be inspected is a non-defective article or a defective article;
a transport mechanism for receiving the article, passing the article through the inspection mechanism, and ejecting it;
an input unit that receives input from a user;
a mode setting unit that sets either a normal mode in which only the inspection of the article is performed, or a test mode in which the inspection of the article is performed and the operation of the inspection mechanism is confirmed;
When the mode setting unit sets the test mode and the inspection mechanism determines that the inspection object is the non-defective product, controlling the inspection object to be treated as the non-defective product,
The mode setting unit sets the test mode, the inspection mechanism determines that the inspection object is the defective product, and the inspection object is determined to be the defective product by the normally operating inspection mechanism. When the input unit receives the input indicating that the product is a pseudo-defective product configured to determine that there is a pseudo-defective product, the inspection target selected by the input indicating that the product is a pseudo-defective product is a control unit that controls not to treat as non-defective;
An inspection system comprising: a control unit;
an input unit that receives input from a user;
An inspection method for inspecting an article by
In a test mode for inspecting the article and checking the operation of the inspection mechanism, when determining that the inspection target is a non-defective product, the control unit treats the inspection target as the non-defective product,
A pseudo-defective product configured such that, in the test mode, the inspection object is determined to be defective, and the inspection mechanism operating normally determines the inspection object to be the defective product. when the input unit receives an input from the user indicating that it is a pseudo-defective product, the control unit does not treat the inspection target selected by the input indicating that the product is a pseudo-defective product as the defective product;
Inspection method.

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