JP6044396B2 - Foreign object detection device and parts feeder - Google Patents

Description

  The present invention relates to a foreign matter detection device that detects the presence of foreign matter that may be mixed on a transport path capable of transporting a workpiece that is a transport target, and a parts feeder that includes the foreign matter detection device.

  2. Description of the Related Art Conventionally, there is known a parts feeder that conveys a workpiece that is a conveyance object such as an electronic component to a predetermined conveyance destination along a conveyance path by vibration. This type of parts feeder conveys the workpiece from the upstream end to the downstream end of the conveyance path by applying vibration to the entire conveyance body having a conveyance path (for example, a bowl feeder or a linear feeder) by an excitation source. The workpiece can be continuously supplied to a predetermined conveyance destination.

  In such a parts feeder, foreign matter other than the workpiece may be mixed with the workpiece and conveyed along with the workpiece, and a situation where the foreign material is conveyed with the workpiece to a predetermined conveyance destination (supply destination) must be avoided. .

  Therefore, for example, a foreign substance removal window is formed on the side wall (conveyance side surface) of the conveyance path so that only the workpiece can be conveyed (supplied) to the supply destination (for example, Patent Document 1), or extended in the conveyance direction on the conveyance floor surface. It is configured to cope with a situation in which foreign matter such as that described above is conveyed to the supply destination by forming foreign grooves such as rust preventive oil and iron scrap in this groove (for example, Patent Document 2). Is known.

JP-A-8-002653 JP 2010-089958 A

  By the way, for example, when a workpiece is electroplated, a spherical foreign substance called a medium or a media ball used as a medium for energizing electricity or a media ball may be mixed in the conveyance path. A method of removing such spherical foreign substances from the conveyance surface by the above-described windows and grooves formed on the conveyance surface is also conceivable.

  However, in a configuration in which foreign matter is removed from the transport path through a window or groove formed at a predetermined position on the transport surface, a foreign matter that satisfies this precondition (assuming that the foreign matter always reaches (passes) the window or groove) ( That is, foreign matter that has reached the window or groove can be removed from the conveyance path, while foreign matter that has not reached the window or groove cannot be removed.

  Such defects are due to the technical idea of mechanically removing only the foreign matter that has reached the window or groove without detecting the presence of the foreign matter on the transport path during the foreign matter removal process. it is conceivable that.

  In other words, until now, the technical idea of positively detecting foreign matter mixed in a workpiece on the conveyance path has not been conceived, and an apparatus embodying such a technical idea has never been implemented in an actual machine. .

  The inventor of the present application pays attention to such points, and invents a foreign matter detection device that positively detects the presence of foreign matter on the transport path that has not been conceived so far, and a parts feeder including the foreign matter detection device. It came to.

  In other words, the foreign object detection device according to the present invention provides a conveyance surface when conveying a workpiece, which is a conveyance object along the extending direction of a conveyance path having a conveyance surface, and whose surface is mainly a flat surface to a predetermined conveyance destination. A first light source that irradiates a predetermined area on the transport surface and an incident angle at which the predetermined area on the transport surface is larger than that of the first light source is to detect a foreign object whose surface that can be mixed with the workpiece is mainly a curved surface. And a second light source that irradiates with a light beam having a wavelength different from that of the first light source, an imaging unit that records an image at the time of simultaneous irradiation of the first light source and the second light source, and an image recorded by the imaging unit And an image processing unit that performs predetermined processing. In particular, the foreign object detection device according to the present invention includes, as an image processing unit, an image capturing unit that captures an image recorded by an imaging unit, and a first image and a second image based on a first light source from the image captured by the image capturing unit. Extracting means for respectively extracting second images based on the light source; and work image specifying means for specifying an image having a predetermined geometric feature amount as a work image that is an image of the work among the first images extracted by the extracting means; A workpiece image removing unit for removing a region corresponding to the workpiece image identified by the workpiece image identifying unit from the second image extracted by the extracting unit; and a second image obtained by removing the workpiece image by the workpiece image removing unit. A feature of the present invention is that it is provided with a foreign object image specifying means for specifying an image larger than the area as a foreign object image which is a foreign object image.

  Here, the shape of the “conveyance path” in the present invention is not particularly limited, such as a linear shape or a spiral shape. Examples of the work include minute parts such as electronic parts, but may be works other than electronic parts. The foreign object to be detected by the foreign object detection device of the present invention includes a spherical surface (including an elliptical sphere) whose entire surface is a curved surface, and a foreign material whose surface is a curved surface.

  The foreign object detection device according to the present invention utilizes the fact that the curved surface and the flat smooth surface are reflected differently, and is transported by the first light source having a relatively small incident angle and the second light source having a relatively large incident angle. The predetermined area of the surface is irradiated, and the imaging unit obtains a captured image (for example, a color image if the two light sources are visible light beams of different colors) based on the reflected light from the workpiece and the reflected light from the foreign object. A first image and a second image are extracted from the captured image by an extraction unit. Then, an image of reflected light derived from the wavelength of the first light source appears in the first image, and an image of reflected light derived from the wavelength of the second light source appears in the second image.

  Here, in the first image based on the first light source having a relatively small incident angle, only the top portion of the curved surface that is closest to the imaging unit in the optical axis direction of the imaging unit is captured or the foreign material is extremely small. If it is a thing, since the area of a top part is very small, it will hardly be reflected in a 1st image. On the other hand, an image corresponding to the planar shape of the workpiece (the shape of the workpiece viewed from the location where the imaging unit is installed) is clearly displayed in the first image. Therefore, this first image can be used as a work specifying image.

  Further, the second image based on the second light source having a relatively large incident angle includes, among foreign matters, a point closest to the image pickup unit in the optical axis direction of the image pickup unit and its peripheral portion (if the foreign object is spherical, the time of image pickup. The top part of) is hardly visible, but the other parts are clearly visible. Therefore, this second image can be used as a foreign matter specifying image.

  Then, the foreign object detection apparatus according to the present invention specifies an image having a predetermined geometric feature amount as an image of a work image among the images shown in the first image by the work image specifying means of the image processing unit, and from the second image The area corresponding to the work image specified by the work image specifying means is removed by the work image removing means. At this time, the area corresponding to the work image is removed from the second image, and the image of a predetermined area or more of the images appearing in the second image is specified as the foreign object image by the foreign object specifying means. be able to. Here, the “geometric feature value” is a value obtained by digitizing a geometric feature, and the workpiece image specifying means in the present invention is, for example, a workpiece image among the images reflected in the first image. An image having a geometric feature value to be satisfied is specified as a “work image”. Examples of the “image geometric feature” include “image area”, “maximum image ferret diameter”, “image minimum feret diameter”, and the like. In the work specifying means, the type (number) of geometric feature values of the image serving as a reference when specifying the work image may be one type (for example, only “image area”), or a plurality of types. It may be of a type (eg, “image area”, “maximum image ferret diameter”, and “image minimum feret diameter”).

  As described above, the foreign object detection apparatus according to the present invention records an image obtained by irradiating a predetermined area on the conveyance path with light sources having different wavelengths (first light source, second light source) with a single imaging unit. Thus, the position of the work shown in the first image and the position of the work shown in the second image can be made to correspond to each other without any contradiction, and the first image is specified in the second image by the work image removing means. When the area corresponding to the work area is removed, the area corresponding to the work image in the second image can be removed from the second image, and based on the second image after the work image equivalent area removal processing. Thus, foreign objects can be detected accurately.

  Furthermore, with the foreign object detection device according to the present invention, the work image in the first image is specified, while the work image specifying process in the second image is not necessary. The processing procedure can be simplified as compared with a configuration that requires processing to be specified.

  In the foreign object detection device according to the present invention, a plurality of workpieces whose directions are not aligned (not aligned) have passed through the irradiation regions of the first light source and the second light source while being in contact with each other. However, if the workpieces are in contact with each other on the sides, corners, or sides rather than the upward surfaces facing the imaging unit, in the first image used as the workpiece specifying image, portions corresponding to the workpiece images are continuous with each other. Since the image is projected as a non-contact (not touching) image, the work image can be easily specified using the first image. As a result, it is possible to smoothly perform the process of removing the area corresponding to the area (work image specifying area) in which the work image in the first image is specified in the second image, and the area corresponding to the work image specifying area. By executing the foreign matter specifying process by the foreign matter specifying means based on the second image from which the foreign matter is removed, it is possible to efficiently and appropriately perform the processing until the foreign matter is detected.

  In particular, the workpiece image specifying means in the foreign object detection device of the present invention performs a contraction process for contracting the first image a predetermined number of times, and an image having a predetermined geometric feature amount among the contracted first images is used as the work image. If specified, the area corresponding to the top portion of the foreign matter in the first image after the shrinking process is further reduced, and the work image specifying process by the work image specifying unit is compared with the case where the shrinking process is not performed. Can be performed smoothly and easily. Further, even when a state in which a plurality of workpieces are in contact is recorded as a captured image, it is possible to obtain an image in which the workpieces are separated from each other by performing a process of contracting the first image a predetermined number of times. This also contributes to improving the efficiency of the work image specifying process by the work image specifying means.

  By the way, since the second image is an image based on the second light source having a relatively large incident angle, the second image includes not only the surface (opposite surface) facing the imaging unit of the workpiece but also the workpiece. There may be a side surface or a boundary portion between the side surface and the opposing surface (a chamfered portion in the case of a chamfered workpiece). Therefore, the area of the area corresponding to the work shown in the second image may be larger than the area of the area corresponding to the work shown in the first image. In this case, when the area corresponding to the work image specifying area in the second image is simply removed based on the first image specifying the work image, the first area is calculated based on the area of the area corresponding to the work shown in the second image. There may occur an event in which a surplus part of the area corresponding to the work shown in the image remains as a frame-like image in the second image. In the foreign object detection device according to the present invention, in order to avoid such an event, as the work image removal unit, an expansion process is performed to expand the first image in which the work image is specified by the work image specifying unit a predetermined number of times. What removes the area | region corresponding to the area | region specified as a work image in the 1st image which carried out the expansion process among images should just be applied.

  In this way, the work image removing means performs the expansion process for expanding the first image whose work image has been specified by the work image specifying means a predetermined number of times, so that the area of the work image projected on the first image after the expansion process can be reduced. It is possible to make the area larger than the area corresponding to the work image in the second image. As a result, in the second image, when the region corresponding to the work image specific region is removed from the dilated first image, the region corresponding to the work image in the second image can be completely removed, The image projected in the second image after the removal process only needs to be subjected to a process of specifying whether or not it is a foreign object, which helps to improve the efficiency of the foreign object detection process.

  In addition, the parts feeder according to the present invention can vibrate the conveyance path to convey a workpiece, which is a conveyance object, to a predetermined conveyance destination along the conveyance path, and includes the foreign substance detection device described above. It is characterized by.

  If it is such a parts feeder, it will become a parts feeder which exhibits the remarkable effect based on the foreign material detection apparatus mentioned above, and can perform an appropriate foreign material detection process.

  Japanese Patent Laid-Open No. 2007-294576 states that “the semiconductor device 2 is composed of a reference mark 13 formed on the substrate 11 and a conductive ball 12 placed on the substrate 11. The first and second illumination means 5 and 6 simultaneously irradiate light of blue and red colors, respectively, and the photographing means 4 takes an image of the semiconductor device 2 only once. The image processing means 7 separates the captured image into a blue image and a red image, and then the relative position of each conductive ball 12 with respect to the reference mark 13 and the excessive conductive ball 12. Although the technique of “inspecting for the presence or absence of the” is disclosed, the technique described in the publication is an inspection apparatus that inspects a semiconductor device to be inspected composed of a plurality of types of components by image processing, In particular, in “an inspection apparatus for inspecting a semiconductor device in which a conductive ball is placed on a substrate, for example”, “the image processing means 7 is based on the above-mentioned image (color image of the semiconductor device 2 taken by the photographing means 4). The relative position between the reference mark 13 and the conductive ball 12 is recognized by the above-described procedure, and the presence / absence, position, size, pitch, and presence / absence of excessive mounting of the conductive ball 12 are determined.

  The technical idea of detecting foreign matter mixed in a workpiece in the conveyance path and the processing content of the image processing unit provided in the foreign matter detection device of the present invention are neither disclosed nor suggested in the above publication. Accordingly, it should be noted that the above publication does not act as a prior art document that denies inventive step as well as novelty of the present invention.

  According to the present invention, a “foreign matter detection device that accurately detects the presence of foreign matter on a conveyance path and a parts feeder including such a foreign matter detection device” has not been realized in the technical field. Can be realized. That is, according to the present invention, the first light source and the second light source having different incident angles and wavelengths with respect to the conveyance floor surface, which is the irradiation surface, are simultaneously irradiated with the reflected light to the captured image recorded by the common imaging unit. Based on this, the image processing unit individually extracts the first image based on the irradiation light of the first light source and the second image based on the irradiation light of the second light source, and the first image at the same time at the same shooting point and By performing the above-described processing using the second image as the workpiece specifying image and the foreign object specifying image, the foreign object on the conveyance floor surface can be accurately detected and specified.

The principal part schematic diagram of the parts feeder provided with the foreign material detection apparatus which concerns on one Embodiment of this invention. The functional block diagram of the image processing part in the embodiment. The figure explaining the reflected light of the workpiece | work in the embodiment. The figure explaining the reflected light of the workpiece | work in the embodiment. The figure explaining the reflected light of the foreign material in the embodiment. The figure explaining the reflected light of the foreign material in the embodiment. The figure which shows an example of the workpiece | work and foreign material which convey on the conveyance surface in the same embodiment. The figure which shows an example of the captured image in the same embodiment. The figure which shows the 1st image extracted by the extraction means based on the captured image of FIG. The figure which shows the 2nd image extracted by the extraction means based on the captured image of FIG. The figure which performed the binarization process with respect to the 1st image of FIG. FIG. 12 is a diagram showing a contraction process performed on the first image in FIG. 11. The figure which performed the non-work image removal process with respect to the 1st image of FIG. The figure which expanded the 1st image of FIG. The figure which performed the binarization process with respect to the 2nd image of FIG. The figure which performed the work image removal process with respect to the 2nd image of FIG. 6 is a flowchart of an image processing unit in the embodiment. The figure which shows another example of the captured image in the embodiment. The figure which shows the 1st image extracted by the extraction means based on the captured image of FIG. The figure which shows the 2nd image extracted by the extraction means based on the captured image of FIG. The figure which performed the binarization process with respect to the 1st image of FIG. The figure which shrunk | reduced to the 1st image of FIG. The figure which shows typically the maximum Feret diameter and the minimum Feret diameter in the 1st image of FIG. The figure which performed the non-work image removal process with respect to the 1st image of FIG. The figure which expanded the 1st image of FIG. The figure which performed the binarization process with respect to the 2nd image of FIG. FIG. 27 is a diagram obtained by performing a workpiece image removal process on the second image in FIG. 26. The figure which shows another another example of the captured image in the same embodiment. The figure which shows the 1st image extracted by the extraction means based on the captured image of FIG. The figure which shows the 2nd image extracted by the extraction means based on the captured image of FIG.

  Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

  As shown in FIG. 1, the foreign object detection device X according to the present embodiment moves a workpiece W (see FIG. 7) such as an electronic component to a predetermined conveyance destination (supply destination) while moving the workpiece W (see FIG. 7) on the conveyance path Y <b> 1 by vibration. This is applied to the parts feeder Y to be conveyed. The parts feeder Y of the present embodiment is a linear feeder Y1 that transports a workpiece W placed in a predetermined area (for example, a storage unit (not shown)) along a linear transport path (hereinafter referred to as “linear transport path Y1”). And a vibration source (not shown) for generating vibrations in the linear feeder Y1. Then, by generating vibration to the linear feeder Y1 by the vibration source, the workpiece W on the linear transport path Y1 is transported to the end of the linear transport path Y1 and supplied to a predetermined transport destination.

  The linear conveyance path Y1 is mainly composed of a conveyance floor surface Y2 that is an upward surface over the entire area, and is provided on a side surface (side) (not shown) that is integrally or integrally provided on at least one side edge of the conveyance floor surface Y2. The wall W is configured so that the workpiece W being transferred does not fall or drop from the transfer floor Y2 to the side. Here, the conveyance floor surface Y2 in the present embodiment corresponds to the “conveyance surface” of the present invention. The conveyance floor surface Y2 is a flat flat surface without unevenness. The conveyance floor surface Y2 may be set to a surface having no gradient over the entire region, or may be set to a predetermined ascending gradient toward the downstream side in the conveyance direction. For example, the ascending gradient of the linear conveying path Y1, more specifically, the ascending gradient of the conveying floor surface Y2, can be appropriately set so that the workpiece W can always move on the conveying floor surface Y2 at a substantially constant speed.

  And the parts feeder Y of this embodiment is provided with the foreign material detection apparatus X which detects the foreign material F (refer FIG. 7) which can mix with the workpiece | work W on the linear conveyance path Y1. In the present embodiment, the work W is applied with a part or the whole of the surface formed into a smooth flat surface (for example, a substantially rectangular parallelepiped (polyhedron) shape). Further, examples of the foreign substance F to be detected by the foreign substance detection device X include a spherical medium called a medium or a media ball used as a medium for energizing electricity when performing electroplating, and a solder ball.

  As shown in FIG. 1, the foreign object detection apparatus X according to the present embodiment includes a first light source 1 and a second light source 2 that simultaneously irradiate a predetermined area on the transport floor surface Y <b> 2, and a first light source 1 and a second light source 2. An imaging unit 3 that records an image when irradiated simultaneously and an image processing unit 4 that performs predetermined processing based on the image recorded by the imaging unit 3 are provided.

  The 1st light source 1 arrange | positions several LED in an annular | circular shape, and carries out ring illumination of the predetermined area | region of the conveyance floor surface Y2. In the present embodiment, a first LED 1 in which red LEDs are arranged in an annular shape is applied.

  Compared with the first light source 1, the second light source 2 is common in that a plurality of LEDs are arranged in an annular shape and a predetermined area of the transport floor Y2 is ring-illuminated. 1 differs from a red LED in that a plurality of blue LEDs, which are LEDs having different hues and wavelengths, are arranged along a circle having a larger diameter than a circle in which red LEDs constituting 1 are arranged.

  In the foreign object detection device X of the present embodiment, the first light source 1 and the second light source 2 are in a concentric relationship, and the first light source 1 is arranged at a position higher than the second light source 2, thereby conveying the floor surface. The light projection angle of the first light source 1 with respect to Y2 can be narrowed more efficiently than the light projection angle of the second light source 2, and the first light source 1 and the second light source 2 irradiate a predetermined region of the transport floor surface Y2, An image formed by reflected light of each light source (first light source 1 and second light source 2) is configured to be recordable by a single imaging unit 3.

  The imaging unit 3 is configured by using, for example, a color camera having an optical axis that coincides with a common center of the first light source 1 and the second light source 2 that are concentrically arranged and is positioned higher than the first light source 1. It is. The imaging unit 3 can record an image when the first light source 1 and the second light source 2 are respectively irradiated as a color image.

  As shown in FIG. 2, the image processing unit 4 includes an image capturing unit 41, an extracting unit 42, a work image specifying unit 43, a work image removing unit 44, and a foreign object image specifying unit 45. The foreign matter F on the conveyance floor Y2 is detected and specified by causing the means to function in conjunction with each other.

  The image capturing means 41 captures a captured image P (see FIG. 8 described later as an example) that is an image recorded by the imaging unit 3. Here, the picked-up image P records the reflected light of the light irradiated to the predetermined area | region on the conveyance floor surface Y2 from each light source (the 1st light source 1 and the 2nd light source 2) as a color image. Therefore, the color image that is reflected by the irradiation light of the first light source 1 configured by the red LED and recorded in the imaging unit 3 becomes an image of the red component, and is reflected by the irradiation light of the second light source 2 configured by the blue LED. The color image recorded in the imaging unit 3 is a blue component image. And since the workpiece | work W in this embodiment is the polyhedron shape which formed the surface in the flat smooth surface, and the foreign material F which is the detection target of the foreign material detection apparatus X is the spherical shape which formed the surface in the curved surface, the workpiece | work W And the foreign object F are different in the way of reflection.

  That is, as shown in FIGS. 3 and 4, when a workpiece W whose surface W1 facing the imaging unit 3 is a smooth surface is irradiated, two different points (points A and B) are provided on the same smooth surface W1. Point), the slope of the tangent plane (the plane in contact with the irradiated light) is substantially constant, and the normal L1 of the tangent plane at point A (a straight line passing through point A perpendicular to the tangent plane) and the point B The normal L2 of the tangent plane is substantially parallel. For this reason, the light emitted from the light source having a narrow projection angle (the first light source 1 having a narrower projection angle than the second light source 2 in the present embodiment) at any of the points A and B (FIG. 3 and FIG. 4, the line with an arrow indicated by a relatively thin solid line) has a small incident angle (for example, the angle formed by the normal line L1 of the tangent plane at the point A and the direction of the incident light in the case of the point A). It becomes incident light and is reflected as reflected light having a small reflection angle (for example, the angle between the normal L1 of the tangent plane at point A and the direction of the reflected light if it is point A) and reaches the image pickup unit 3 Recorded as a clear color image.

  On the other hand, a light source having a wide projection angle at any of points A and B on the common smooth surface W1 (the second light source 2 having a wider projection angle than the first light source 1 in this embodiment). Irradiation light (a line with an arrow indicated by a relatively thick solid line in FIGS. 3 and 4) becomes incident light having a large incident angle, is reflected as reflected light having a large reflection angle, does not reach the imaging unit 3, and is clear. Is not recorded as a clear color image. The irradiation light of the second light source 2 having a wide projection angle is applied to a surface (side surface W2) substantially parallel to the optical axis of the imaging unit 3 on the surface of the workpiece W, or to a boundary portion between the side surface W2 and the upward surface W1. When reflected on the formed partial arc-shaped or inclined chamfered portion (not shown in FIGS. 3 and 4) and reaches the imaging unit 3, the irradiated portion is displayed on the captured image P as a color image.

  As described above, in the captured image P, a color image based on the reflected light of the first light source 1 (in the present embodiment, all or substantially the entire region corresponding to the smooth surface W1 facing the imaging unit 3 of the workpiece W). A chamfered portion formed at the boundary portion between the side surface W2 and the upward surface W1 of the workpiece W and a part or a part of the region corresponding to the side surface W2 of the workpiece W as reflected light of the second light source 2. It appears as a color image based on it (a blue image in this embodiment).

  In addition, when a spherical foreign object F whose surface facing the imaging unit 3 is a curved surface F1 is irradiated, as shown in FIGS. 5 and 6, even on the same surface F1, other than the point C and the vertex part At the point D, the inclination angle of the tangent plane is different, and the normal line L3 of the tangent plane at the point C and the normal line L4 of the tangent plane at the point D are not parallel to each other. In the foreign matter F, a narrow range of the apex portion where the normal of the tangent plane is substantially parallel or nearly parallel to the optical axis of the imaging unit 3 is a light source with a narrow projection angle (second in this embodiment). Irradiation light (a line with an arrow indicated by a relatively thin solid line in FIG. 5) of the first light source 1) whose projection angle is narrower than that of the light source 2 becomes incident light having a small incident angle, and is reflected light having a small reflection angle. The reflected light reaches the imaging unit 3 and is recorded as a clear color image.

  However, as shown in FIG. 5, at point C, which is the top portion of the foreign matter F, the light source having a wide projection angle (the second light source 2 having a wider projection angle than the first light source 1 in this embodiment). Irradiation light (a line with an arrow indicated by a relatively thick solid line in FIG. 5) becomes incident light having a large incident angle, is reflected as reflected light having a large reflection angle, does not reach the imaging unit 3, and is a clear color image. Not recorded.

  On the other hand, as shown in FIG. 6, a light source having a narrow projection angle at a point (point D) other than the top portion of the foreign substance F (the first light source 1 having a narrow projection angle than the second light source 2 in this embodiment). ), The irradiated light (a line with an arrow indicated by a relatively thin solid line in FIG. 6) becomes incident light with a small incident angle, is reflected as reflected light with a small reflection angle, and reaches the imaging unit 3. Therefore, it is not recorded as a clear color image.

  However, when a point (point D) other than the top portion of the foreign substance F is irradiated with the second light source 2 having a wider projection angle than the first light source 1, the irradiation becomes incident light having a large incident angle, and the reflection angle becomes larger. The light is reflected as large reflected light, reaches the imaging unit 3 and is recorded as a clear color image.

  As described above, in the captured image P, a color image based on the reflected light of the first light source 1 (in this embodiment, all or substantially all of the region corresponding to the top portion of the foreign substance F formed with a curved surface F1). (A red image), and all or a part of the region corresponding to the portion other than the top portion of the foreign substance F is captured as a color image based on the reflected light of the second light source 2 (a blue image in this embodiment). Note that since the area corresponding to the top portion of the foreign substance F is a very small area, the captured image P may or may not appear as a blurred dark image.

  As described above, among the captured images P recorded by the imaging unit 3 when the workpiece W and the foreign matter F having different reflection methods are simultaneously irradiated by the two light sources (first light source 1 and second light source 2) having different incident angles. In the image of the workpiece W, the reflected light of the first light source 1 (red LED) having a relatively narrow projection angle is a main component, and the image of the foreign matter F is the second light source having a relatively wide projection angle. The reflected light of 2 (blue LED) is the main component.

  Specifically, for example, as shown in FIG. 7 (in the respective drawings after FIG. 7, attention is paid to the shapes of the workpiece W and the foreign matter F, and the ratio of the sizes of both is expressed as an exaggerated equivalent) In the state where one workpiece W and one foreign substance F are transported in a state of being separated from each other in the irradiation region of the first light source 1 and the second light source 2 set in a predetermined region of the transport floor Y2. When the 1 light source 1 and the 2nd light source 2 are irradiated simultaneously, the image recorded on the imaging part 3 and the image captured by the image capture means 41 become an image shown in FIG. That is, the irradiation light from the first light source 1 that is relatively narrow at the incident angle is reflected by the upward surface (at least a horizontal part) of the workpiece W and the top part of the foreign substance F, and the reflected light reaches the imaging unit 3. The irradiation light from the second light source 2 is recorded as a color image (red image) and is relatively wide at the incident angle, and is reflected from the side surface of the workpiece W and the portion excluding the top portion of the foreign matter F, The reflected light reaches the imaging unit 3 and is recorded as a color image (blue image). 7 and 8, the portion recorded as a red color image and the portion recorded as a blue color image are shown with different patterns. Further, in the present embodiment, since the conveyance floor surface Y2 is set to a surface that does not reflect, the background of the workpiece W and the foreign matter F is recorded as a black image in the captured image P of FIG. In the actual image, even if the color image is the same, the workpiece W having a luminance value larger than that of the foreign substance F is an image brighter than the foreign substance F, and conversely, the foreign substance F is an image darker than the workpiece W. The image P captured by the image capturing unit 41 is a captured image P having such color characteristics.

  The extracting unit 42 extracts the first image P1 based on the first light source 1 and the second image P2 based on the second light source 2 from the image P captured by the image capturing unit 41. Specifically, the first image P1 and the second image P2 are obtained by dividing the image P captured by the image capturing means 41 into components of respective colors (red of the first light source 1 and blue of the second light source 2). Are extracted individually. FIGS. 9 and 10 show a first image P1 and a second image P2 extracted from the image P shown in FIG.

  The work image specifying means 43 specifies an image having a predetermined geometric feature amount from the first image P1 extracted by the extracting means 42 as a work image that is an image of the work. Here, the “geometric feature value” is a value obtained by digitizing a geometric feature, and the work image specifying unit 43 in the present embodiment is a work image among images captured in the first image P1. If there is, an image having a geometric feature value to be satisfied is specified as a “work image”. In the present embodiment, a binarization process for binarizing the first image P1 extracted by the extraction means 42 with a predetermined threshold value and a contraction process for contracting the binarized first image P1 a predetermined number of times are performed. It is set so that an image having a geometric feature value that should be included in the contracted first image P1 is specified as a work image. FIG. 11 shows a first image P1 (a) obtained by binarizing the first image P1 shown in FIG. 9 with a predetermined threshold. Further, in FIG. 12, as the contraction process for contracting the binarized first image P1 a predetermined number of times, a process of replacing the black with a black pixel if there is even one pixel in the periphery (Erosion) is performed the first time. An image P1 (b) is shown. The work image specifying means 43 calculates the geometric feature amount of the connected component (lumb) of the white area recorded in the contracted first image P1, and the geometric feature amount is stored in advance in a predetermined storage unit. When the condition (numerical value) set in the “work determination reference range data” stored in is satisfied, the block having the geometric feature value is determined to be “work image”, whereby the work image Is specified. The “work determination reference range data” stores an upper limit value and a lower limit value (reference range) of a geometric feature amount that satisfies a work image. Here, in this embodiment, as the types of geometric feature values, “area” corresponding to the number of white pixels in the chunk, and the Feret diameter that is the length of the projected image when the chunk is projected at a certain angle. The “maximum Feret diameter” that is the maximum diameter of the lens and the “minimum Feret diameter” that is the minimum diameter of the Feret diameter are used, and the “work determination reference range data” includes a workpiece image. The upper limit value and lower limit value (reference range) of “area”, “maximum Feret diameter”, and “minimum Feret diameter” to be satisfied are stored. Although it is difficult to determine that the “lumps” are rectangular with only “area”, “maximum Feret diameter”, and “minimum Feret diameter”, as a criterion for distinguishing between the workpiece W and the spherical foreign matter F, It is enough. In the work image specifying means 43 in this embodiment, the “maximum Feret diameter” is regarded as a long side of the rectangle, and the “minimum Feret diameter” is regarded as a rectangular short side. If an image (block) of a broken work is recorded in the first image, the work image is a work image if the work image is specified by the work image specifying means 43 in the present embodiment. If it is an image that does not have a geometric feature value to be satisfied, the image of the broken workpiece is not specified as a “work image”. That is, the broken workpiece can be recognized as a foreign object.

  Further, “the connected component of the white area recorded in the contracted first image P1” is generally called “particle” in the technical term of image processing, but the foreign object F to be detected is spherical ( In the present embodiment, which is granular, there is a risk of misunderstanding when the workpiece W is represented as a particle.

  The foreign object detection device X according to the present embodiment leaves only the mass determined to be the work image among the masses that appear in the first image P1 (b) that has undergone the contraction process by the work image identification unit 43 a predetermined number of times, A process (non-work image removal process) for removing other blocks (blocks that are not determined to be workpiece images) is performed, and a workpiece image specific image P1 (c) that is an image after such processing is performed as a workpiece. It is used by the image removing means 44. Here, FIG. 13 shows a work image specifying image P1 (c) subjected to the non-work image removal process based on the first image P1 subjected to the contraction process shown in FIG.

  The workpiece image removing unit 44 removes a region corresponding to the workpiece image specified by the workpiece image specifying unit 43 from the second image P2 extracted by the extracting unit 42. In the present embodiment, the first image P1 (specifically, the workpiece image specifying image P1 (c)) in which the workpiece image is specified by the workpiece image specifying means 43 is expanded a predetermined number of times and extracted by the extracting means 42. The binarized second image P2 is binarized with a predetermined threshold value, and the binarized second image P2 corresponds to the region specified as the work image in the dilated first image P1. It is set to remove the area. FIG. 14 shows a first image P1 (d) obtained by performing a process of dilating a white image if there is a white pixel in the periphery (Dilation) a predetermined number of times as an expansion process for expanding the workpiece image specific image P1 (c). . The number of expansions is required to be the same as the number of contractions or more than the number of contractions. FIG. 15 shows a second image P2 (e) obtained by binarizing the second image P2 shown in FIG. 10 with a predetermined threshold. In the second image P <b> 2 (e) that has been subjected to the binarization process, the image obtained by reaching the imaging unit 3 after being reflected by the workpiece W and the foreign matter F in the irradiation light of the second light source 2 is a white lump. It is projected as. The foreign object detection device X according to the present embodiment includes a white block specified as a work image in the first image P1 (d) subjected to the dilation processing among the second images P2 (e) binarized by the work image removing unit 44. The area corresponding to is processed black. FIG. 16 shows an image obtained by performing blackening on an area corresponding to a white block identified as a work image in the dilated first image P1 (d) in the binarized second image P2 (e). (Work image removed image P2 (f)) is shown.

  The foreign object image specifying unit 45 specifies an image having a predetermined area or more as a foreign object image as a foreign object image based on the second image P2 (f) from which the work image is removed by the work image removing unit 44. In this foreign matter F specifying means, the area of the lump recorded in the workpiece image removal image is calculated, and the area is set in “foreign matter judgment reference data” stored in a predetermined storage unit in advance ( When satisfying (numerical value), a foreign object image is specified by determining a block having the area as a “foreign object image”. Here, since the work image removal image P2 (f) does not include a lump corresponding to the work image, it is estimated that there is no large lump other than the lump corresponding to the foreign object image in this image P2 (f). be able to. Therefore, it is sufficient to set only the lower limit value of the area to be filled as the foreign object image in the foreign object determination reference data. Of course, the lower limit value and the upper limit value of the area to be satisfied as the foreign object image are set in the foreign object determination reference data, and a block having an area within the range between the lower limit value and the upper limit value is specified as the foreign object image. It doesn't matter.

  Next, in the parts feeder Y to which the foreign object detection device X according to the present embodiment is applied, the foreign object detection device X detects the foreign object F mixed in the workpiece W conveyed along the conveyance direction on the conveyance floor surface Y2. (Foreign matter detection processing procedure) will be described with reference to FIGS.

  First, in the parts feeder Y of the present embodiment, the workpiece W that has been directly fed into the linear conveyance path Y1 from a workpiece discharge unit such as a hopper, or the appropriate conveyance path disposed upstream of the linear conveyance path Y1 is passed. The workpiece | work W which reached | attained the linear conveyance path Y1 is conveyed toward a supply destination along the conveyance floor surface Y2 of the linear conveyance path Y1. And the parts feeder Y of this embodiment irradiates the predetermined area | region on the conveyance floor Y2 of the linear conveyance path Y1 simultaneously with the 1st light source 1 and the 2nd light source 2 of the foreign material detection apparatus X, and reaches the imaging part 3 among them. The reflected light is recorded as a color image (captured image P) by the imaging unit 3.

  The imaging process by the imaging unit 3 may be performed in a state where the vibration of the linear conveyance path Y1 is stopped, that is, in a state where the workpiece W is stationary. However, in this embodiment, linear conveyance is performed in order to improve conveyance efficiency. This is performed in a state where the vibration of the path Y1 is continued, that is, in a state where the workpiece W is transported in the transport direction.

  Then, the parts feeder Y according to the present embodiment is based on the captured image P of the imaging unit 3, and the media ball or solder conveyed by being mixed with the workpiece W on the conveyance floor Y 2 by the following processing in the image processing unit 4. The presence of spherical foreign matters F such as balls can be specified.

  Here, the parts feeder of the present embodiment can transport a plurality of workpieces W passing through the linear transport path Y1 while aligning them in a predetermined transport posture, but the first light source 1 and the second light source. In the irradiation area 2, the plurality of workpieces W are not arranged in an orderly manner. That is, the foreign object detection device X of the present embodiment sets an area relatively close to the upstream end in the linear conveyance path Y as an irradiation area of the first light source 1 and the second light source 2, and before the work W is aligned. The foreign object F mixed with the workpiece | work W on the conveyance floor Y2 at the time is detected.

  Hereinafter, a foreign object detection processing procedure in the case where a plurality of workpieces W are not arranged in an orderly manner in the irradiation areas of the first light source 1 and the second light source 2 and the foreign objects F are mixed and conveyed with the workpieces W will be described.

  In the foreign object detection device X according to the present embodiment, first, a captured image P obtained by simultaneously irradiating a common area in the linear transport path Y1 with the first light source 1 and the second light source 2 is used as an image of the image processing unit 4. The image is captured by the capturing means 41 (image capturing step S1, see FIG. 17). The workpiece W in the present embodiment is a polyhedron in which the entire surface or most of the surface is formed into a flat smooth surface, and the foreign object F to be detected by the foreign object detection device X has a curved surface. Therefore, the work W and the foreign matter F are reflected differently, and the color image reflected on the irradiation light of the first light source 1 configured by the red LED and recorded in the imaging unit 3 is an image of a red component, and is a blue LED. The color image reflected on the irradiation light of the configured second light source 2 and recorded in the imaging unit 3 is a blue component image. FIG. 18 shows an example of the captured image P captured in the image capturing step S1. The captured image P shown in the figure is a color image in a state where a total of three workpieces W are in contact with a common foreign substance F in the irradiation areas of the first light source 1 and the second light source 2. In the figure, a different pattern is attached to each color according to the luminance value.

  In the foreign object detection device X according to the present embodiment, following the image capturing step S1, the extraction unit 42 extracts the red component image as the first image P1 and the blue component image as the second image P2. (See the extraction step S2, FIG. 17). The first image P1 and the second image P2 that are individually extracted in the image capturing step S1 based on the captured image P are shown in FIGS. 19 and 20, respectively. As can be understood from FIG. 19, in the first image P1 extracted from the captured image P in a state where the total three workpieces W are in contact with the common foreign matter F, the three workpieces W and the foreign matter F are different images. Exists as. On the other hand, as can be understood from FIG. 20, the second work P2 extracted from the captured image P in a state where the total three works W are in contact with the common foreign matter F is continuously displayed. One image exists.

  In the foreign object detection device X according to the present embodiment, subsequent to the extraction step S2, the geometric feature amount that should be included in the first image P1 extracted by the extraction unit 42 by the workpiece image specifying unit 43 is a workpiece image. The image which has is specified as a work image (see Work image specifying step S3, FIG. 17). In this work image specifying step S3, the first image P1 extracted in the extraction step S2 is binarized with a predetermined threshold, the binarized first image P1 is contracted a predetermined number of times, and the contracted first image P1 is processed. Among them, an image having a geometric feature amount corresponding to a condition (numerical value) set in “work determination reference range data” stored in advance in a predetermined storage unit is specified as a work image. FIG. 21 shows a first image P1 (a) obtained by binarizing the first image P1 shown in FIG. 19 with a predetermined threshold value. FIG. 22 shows a first image P1 (b) obtained by performing the above-described erosion process a predetermined number of times as a contraction process for contracting the first image P1 (a) subjected to the binarization process a predetermined number of times.

  As can be understood from FIG. 22, in the first image P <b> 1 (b) after the shrinking process, the white area chunks that are not continuous with each other (hereinafter simply referred to as “lumps”) maintain the center positions of the respective chunks. As it is, the area of the first image P1 (a) before the contraction process shown in FIG. 21, that is, the area in the first image P1 (a) immediately after the binarization process is smaller, and the first image after the contraction process. The separation distance between the non-continuous chunks in P1 (b) is longer than the separation distance between the non-continuous chunks in the first image P1 (a) before the shrinking process shown in FIG.

  Then, the foreign object detection device X of the present embodiment calculates the geometric feature amount of the lump recorded in the contracted first image P1 (b) in the work image specifying step S3, and the geometric feature. When the amount satisfies the condition (numerical value) set in the “work determination reference range data”, the work image is identified by determining that the block having the geometric feature amount is “work image” To do. In this embodiment, the “area”, “maximum Feret diameter”, and “minimum Feret diameter” of the mass are used as geometric feature amounts, and “area” and “maximum Feret diameter” set in the “work determination reference range data”. In addition, a lump that satisfies the upper limit value and the lower limit value (reference range) of the “minimum Feret diameter” is specified as the workpiece W. In FIG. 23, two lines intersecting in a substantially rectangular block are attached. In the figure, the relatively long line in each lump is the maximum Feret diameter, and the relatively short line is the minimum Feret diameter.

  In the foreign object detection device X of the present embodiment, in the work image specifying step S3, among the four non-continuous blocks in the first image P1 (b) shown in FIGS. While determining and specifying that the image satisfies the reference range set in the determination reference range data, that is, the workpiece image, the substantially circular mass is determined not to satisfy the reference range, that is, the workpiece image. Not identified as a statue.

  Further, in this work image specifying step S3, only the mass determined to be the work image among the masses reflected in the first image P1 (b) subjected to the contraction process a predetermined number of times is left, and other masses (work image). (A non-work image removal process) is removed. Here, FIG. 24 shows a work image specifying image P1 (c) which is the first image when the non-work image removal process is completed based on the first image P1 (b) subjected to the contraction process shown in FIG.

  The foreign object detection device X according to the present embodiment corresponds to the workpiece image identified in the workpiece image identification step S3 from the second image P2 extracted in the extraction step S2 by the workpiece image removal unit 44 after the workpiece image identification step S3. The area to be removed is removed (see work image removal step S4, FIG. 17). In this work image removal step S4, the work image specifying image P1 (c), which is the first image P1 specifying the work image in the work image specifying step S3, is expanded a predetermined number of times, and the second image P2 extracted in the extraction step S2 is used. Is binarized with a predetermined threshold value, and from the binarized second image P2, an area corresponding to the area specified as the work image in the first image P1 subjected to the dilation process is removed.

  FIG. 25 shows a first image P1 (d) obtained by performing dilation processing (Dilation processing) a predetermined number of times on the work image specifying image P1 (c). FIG. 26 shows a second image P2 (e) obtained by binarizing the second image P2 shown in FIG. 20 with a predetermined threshold. In the second image P2 (e) that has been subjected to the binarization process, the portion of the second image P2 extracted in the extraction step S2 that is projected as a color image is copied as a white block.

  In the present embodiment, the number of expansions is set larger than the number of contractions. Therefore, the total area of the “lumps” shown in the first image P1 (d) after the expansion process is the total area of the “lumps” corresponding to the work shown in the first image P1 (a) immediately after the binarization process in the extraction step S2. It becomes larger than the total area. Further, in the present embodiment, the total area of “lumps” shown in the first image P1 (d) that has been subjected to the dilation processing (Dilation processing) a predetermined number of times is shown in the second image P2 (e) immediately after the binarization processing. It is set to be larger than the total area of “lumps” corresponding to the workpiece.

  And the foreign material detection apparatus X of this embodiment specified as a work image in the 1st image P1 (d) which carried out the expansion process among the 2nd images P2 (e) binarized in the work image removal step S4. Processing to make the area corresponding to the white block black. FIG. 27 illustrates an image obtained by performing blackening on an area corresponding to a white block identified as a work image in the dilated first image P1 (d) in the binarized second image P2 (e). A workpiece image removal image P2 (f) is shown. The workpiece removal process in the workpiece image removal step S4 is performed by superimposing the first image P1 (d) subjected to the expansion process and the second image P2 (e) subjected to the binarization process on the second image P2 subjected to the binarization process. Of these, it can also be regarded as a process of blackening an area overlapping a white block specified as a work image in the first image P1 (d) subjected to the expansion process.

  The foreign object detection device X according to the present embodiment uses the foreign object image specifying unit 45 to set an image having a predetermined area or more as a foreign object image based on the second image P2 (f) from which the work image has been removed in the work image removal step S4. Identify (see foreign object image identifying step S5, FIG. 17). In this foreign matter F specifying step S5, the area of the lump shown in the workpiece image removal image P2 (f) is calculated, and the area (the area of each lump if there are a plurality of lumps) is stored in advance in a predetermined storage unit. When the condition (numerical value) set in the “foreign matter determination reference data” is satisfied, the block having the area is determined as the “foreign matter image” to identify the foreign matter image.

  As described above, in the foreign object detection apparatus X according to the present embodiment, the first light source 1 and the second light source 2 having different incident angles and wavelengths with respect to the transport floor surface Y2 that is the irradiation surface are simultaneously irradiated, and the reflected light is irradiated. Based on the captured image P recorded by the common imaging unit 3, the image processing unit 4 uses the first image P 1 based on the irradiation light of the first light source 1 and the second image P 2 based on the irradiation light of the second light source 2. And detecting the foreign matter F on the transport floor Y2 by performing the above-described processing using the first image P1 and the second image P2 at the same time as the workpiece specifying image and the foreign matter specifying image, respectively. Can be specified.

  In particular, the foreign object detection device X according to the present embodiment requires two types of light sources (first light source 1 and second light source 2), but only one imaging unit 3 is required. Compared with a mode in which an imaging unit is individually provided for each of the first and second light sources 2), the configuration can be simplified and the cost can be reduced, and a single workpiece W moving on the transfer floor Y2 can be obtained. When the image pickup unit 3 is used, the position of the work W recorded in the first image P1 and the position of the work W recorded in the second image P2 can be made to correspond to each other without contradiction. When the area corresponding to the area of the workpiece W specified in the first image P1 is removed from the second image P2 by the workpiece image removing unit 44, the area corresponding to the workpiece image in the second image P2 is included in the second image P2. The second image P2 (which corresponds to the work image) Foreign matter F based on the second image P2) obtained by removing the region in which it is possible to appropriately detect.

  Furthermore, in the foreign object detection device X of the present embodiment, while the work image in the first image P1 is specified, the process of specifying the work image in the second image P2 is unnecessary, and thus the work image in the second image P2 is determined. The processing procedure can be simplified as compared with the required processing.

  Further, in the foreign object detection device X according to the present embodiment, a plurality of workpieces W whose directions are not aligned (not aligned) pass through the irradiation regions of the first light source 1 and the second light source 2 while being in contact with each other. Even in the case where the workpieces W are in contact with the side surfaces, corners, or sides instead of the upward surfaces facing the imaging unit 3, in the first image P1 used as the workpiece specifying image, for example, FIG. As shown in FIG. 21 and FIG. 21, portions corresponding to the workpiece image are projected as non-continuous (non-contacting) images. Therefore, the workpiece image can be easily specified using the first image P1. it can.

  In addition, since only the region corresponding to the top portion of the foreign matter F is projected on the first image P1, it corresponds to the top portion of the foreign matter F compared to the region corresponding to the work image in the first image P1. The area is extremely small, which also contributes to the easy detection and identification of the work image in the first image P1.

  In particular, in the foreign object detection device X according to the present embodiment, the work image specifying unit 43 performs a contraction process for contracting the first image P1 extracted by the extraction unit 42 a predetermined number of times, and the contracted first image P1 (b). Since an image having a predetermined geometric feature amount is specified as a work image, the area corresponding to the top portion of the foreign matter F in the first image P1 (b) after the shrinkage process is more Compared with a case where the shrinkage process is not performed, the work image specifying process by the work image specifying unit 43 can be performed smoothly and easily.

  In the foreign object detection device X according to the present embodiment, the work image removing unit 44 performs an expansion process for expanding the first image P1 (c), in which the work image is specified by the work image specifying unit 43, a predetermined number of times. Since the area corresponding to the area (work image specifying area) specified as the work image in the first image P1 (d) subjected to the expansion process is removed from the image P2, the first image after the expansion process is removed. The area of the work image projected on P1 (d) can be made larger than the area corresponding to the work image in the second image P2. By removing the area corresponding to the work image specific area in the first image P1 (d) after such expansion processing from the second image P2, the area corresponding to the work image in the second image P2 is completely completed. Therefore, after the removal process, a process for specifying whether or not the image is projected in the second image P2 is a foreign object F may be performed. Therefore, if the area corresponding to the work image in the second image P2 is removed based on the first image P1 that is not subjected to the expansion process, an event that a frame-like image remains in the second image P2, that is, A phenomenon in which a frame-like image remains in the second image P2 due to the fact that the area corresponding to the work image in the second image P2 is larger than the work image specific area in the first image P1 that has not been expanded. This is useful for improving the efficiency of foreign object detection processing.

  When foreign objects F are in contact with each other on the transport floor surface Y2, when such a foreign object F and a workpiece W are recorded by the imaging unit 3, the entire shape of the contacting foreign objects F in the captured image P May be similar to the image corresponding to the workpiece W. FIG. 28 shows a captured image P corresponding to the above case. In such a case, in the second image P2 shown in FIG. 30 extracted by the extracting means 42, the dumpling-like image corresponding to the foreign matter F in contact with the image and the image corresponding to the workpiece W are similar. It is difficult to detect and specify the foreign matter F only with the second image P2. However, in the first image P1 shown in FIG. 29 extracted by the extracting means 42, images corresponding to the top portions of the foreign substances F that are in contact with each other appear in a state where they are separated from each other, or the luminance value. In some cases, an image corresponding to the top portion is not captured, so that the workpiece image can be easily specified based on the first image P1.

  Further, in the foreign object detection device X according to the present embodiment, the foreign object image specifying unit 45 has an image remaining in the second image P2 (f) at that time (the second image P2 (f) after the binarization process). It is configured to determine (calculation processing) whether or not the image is larger than a predetermined area only for the white lump (remaining white lump). ing. Since the image corresponding to the work image is removed from the second image P2 (f) at the start of the foreign object image specifying process, for example, the image corresponds to the work image in the second image P2 at the start time of the foreign object image specifying process. Compared with a configuration in which an image is recorded and it is necessary to determine whether this image is an image having a predetermined area or more, the number of calculation processes required to specify a foreign object image can be reduced. In addition, the foreign object image specifying process can be executed without being influenced by the way the workpiece W is captured in the second image P2.

  Furthermore, in the foreign object detection device X according to the present embodiment, the image corresponding to the workpiece image is removed from the second image P2 at the start of the foreign object image identification process, and the image remaining in the second image P2 at that time point. Only (a white block remaining in the second image P2 after the black and white binarization process) is determined (calculation process) whether or not the image is a predetermined area or more, and the predetermined area or more Therefore, the image that is not identified as a foreign object image by the foreign object image identification process for the image remaining in the second image P2 at the start of the foreign object image identification process. Can be grasped as a background pattern (part feeder Y itself including the transport floor Y2), fine dust, or image noise. This merit is that, for example, when the threshold value of the brightness value of the foreign object F and the background is obtained, it can be calculated without depending on the brightness value of the workpiece W.

  Furthermore, the parts feeder Y according to the present embodiment can accurately detect the foreign matter F on the transport floor surface Y2 by enjoying the effect obtained by the foreign matter detection device X described above. And in the parts feeder Y which concerns on this embodiment, since the foreign material detection process by the foreign material detection apparatus X is implemented before the work W is aligned, it exists by the presence of the foreign material F after the time when the work W is aligned. It is possible to prevent or suppress the situation where the work W is aligned and transported and the transport efficiency is lowered.

  As described above, the foreign matter F mixed on the transport floor Y2 that has not been conceived in the past by the foreign matter detection device X according to the present embodiment and the parts feeder Y provided with the foreign matter detection device X. A technique of detecting and specifying can be realized.

  Then, in the process after the presence of the foreign matter F is identified by such a foreign matter detection device X, the position of the identified foreign matter F is detected by an appropriate means, so that only the foreign matter F whose location has been identified is pinpointed. It is possible to remove from the transfer floor surface Y2 by an appropriate removal device (for example, a mechanical removal device using a robot hand or the like, a removal device using air injection, or the like).

  Such a configuration for removing the foreign matter F is a configuration that has been conventionally adopted, that is, the foreign matter F that reaches and passes through the window formed on the transport surface or reaches the groove formed on the transport surface. As compared with the configuration that has been removed from the transport surface, it is possible to obtain a remarkable effect that all the foreign matter F mixed on the transport floor surface Y2 can be removed from the transport floor surface Y2, a problem that occurs in the past, That is, even if the foreign matter F does not reach the window or the groove, it is possible to solve the problem that the foreign matter F is transported as it is toward the transport destination together with the workpiece W.

  In addition, this invention is not limited to embodiment mentioned above. For example, in the above-described embodiment, the mode in which the first image extracted from the image by the extraction unit of the processing unit and the second image are binarized with a predetermined threshold is exemplified. The subsequent processing may be performed without binarizing the one image and the second image.

  In addition, based on the first image itself extracted by the extraction means or an image obtained by binarizing the first image, the workpiece image specifying means includes a lump having a predetermined geometric feature amount among these images ( Image) may be specified as a work image. That is, according to the present invention, the work image specifying process can be performed based on an image that has not been subjected to the contraction process.

  In addition, for example, only “area” is adopted as the geometric feature amount of the workpiece that is a reference when the workpiece image specifying means specifies the workpiece image, or only “area” and “minimum Feret diameter” or “area” is adopted. ”And“ maximum Feret diameter ”, or elements, characteristics, and quantities other than“ area ”and Feret diameter may be employed.

  Furthermore, in the present invention, it is possible to use a workpiece image removing unit that does not perform the expansion process for expanding the first image in which the workpiece image is specified by the workpiece image specifying unit a predetermined number of times. In this case, the work image removing means may be any means that removes the area corresponding to the area specified as the work image in the first image specified by the work image specifying means from the second image. In the case where the expansion process is not performed, an image obtained by removing an area corresponding to an area (work image specifying area) specified as a work image in the first image in which the work image is specified by the work image specifying means is removed from the second image. In the image-removed image, a frame-like image may remain because the area corresponding to the work image in the second image is larger than the work image specifying area in the first image that has not been subjected to the expansion process. If this frame-like image is removed from the workpiece image removal image by, for example, a thinning process and further contracting, the foreign object image specifying process by the foreign object image specifying means can be performed smoothly and appropriately. it can.

  Moreover, the irradiation area | region of a 1st light source and a 2nd light source may be the conveyance surface of a spiral conveyance path (bowl conveyance path). That is, the parts feeder to which the foreign matter detection device of the present invention is applied includes a bowl feeder, and a predetermined area in the bowl conveyance path provided in the bowl feeder is set as an irradiation area of the first light source and the second light source. It can be configured such that the foreign matter mixed in the workpiece passing through the region is detected by the foreign matter detection device. The number and orientation (posture) of the workpieces that pass through the irradiation areas of the first light source and the second light source are not particularly limited, but the number and orientation of the workpieces should be positively limited in consideration of specifications and the like. May be.

  If the workpiece is conveyed while contacting or approaching the conveyance side surface of the conveyance path (linear conveyance path, bowl conveyance path), the conveyance side surface is the “conveyance surface” of the present invention, and a predetermined region on the conveyance side surface is the first area. It is also possible to set to irradiate with one light source and a second light source.

  Further, the conveyance path is not limited to the one set to the ascending gradient, and may be horizontal or one set to the descending gradient.

  The first light source and the second light source may have different wavelengths, and may be visible light of a color other than red or blue, or may employ a wavelength other than visible light such as infrared or ultraviolet. What is necessary is just to select the appropriate | suitable thing for an imaging part according to the kind of light beam of a 1st light source and a 2nd light source.

  In addition, the work that is the object to be transported may be formed by forming a part or all of the surface on a smooth surface, such as various LEDs such as LEDs, electronic components other than LEDs such as chip resistors and chip capacitors, or A thing other than electronic parts such as food may be used as a conveyance object.

  The foreign object to be detected by the foreign object detection device according to the present invention is not limited to a spherical object as long as all or part of the surface is a curved surface.

  Further, in the foreign object detection device according to the present embodiment, even when the foreign object to be detected is placed on the upward surface of the workpiece, the extraction is performed even when the irradiation area of the first light source and the second light source is passed. In the first image extracted by the means, in the image corresponding to the workpiece, the image corresponding to the top portion of the foreign substance and the image corresponding to the portion other than the top portion are different in color from the image corresponding to the workpiece or The work image specifying process can be performed based on the first image, and an area corresponding to the work image specifying area in the work image specifying image is extracted from the second image extracted by the extracting unit. By removing it, it is possible to appropriately perform subsequent foreign object detection processing.

  In addition, the specific configuration of each part is not limited to the above embodiment, and various modifications can be made without departing from the spirit of the present invention.

DESCRIPTION OF SYMBOLS 1 ... 1st light source 2 ... 2nd light source 3 ... Imaging part 4 ... Image processing part 41 ... Image capture means 42 ... Extraction means 43 ... Work image specification means 44 ... Work image removal means 45 ... Foreign object image specification means F ... Foreign substance P1 ... first image P2 ... second image W ... work X ... foreign matter detection device Y ... part feeder Y1 ... conveying path (linear conveying path)
Y2 ... Conveying surface (conveying floor surface)

Claims (4)

A surface that can be mixed with the work on the transport surface when transporting a work to be transported to a predetermined transport destination, which is an object to be transported along the extending direction of the transport path having the transport surface. Is a foreign object detection device for detecting foreign objects mainly composed of curved surfaces,
A first light source that irradiates a predetermined area on the transport surface;
A second light source that irradiates the predetermined area on the transport surface with a light beam having a larger incident angle than the first light source and a wavelength different from that of the first light source;
An imaging unit for recording an image at the time of simultaneous irradiation of the first light source and the second light source;
An image processing unit that performs predetermined processing based on the image recorded by the imaging unit,
The image processing unit
Image capturing means for capturing an image recorded by the imaging unit;
Extraction means for respectively extracting a first image based on the first light source and a second image based on the second light source from the image captured by the image capturing means;
A work image specifying means for specifying an image having a predetermined geometric feature amount among the first image extracted by the extracting means as a work image which is an image of the work;
A work image removing means for removing a region corresponding to the work image specified by the work image specifying means from the second image extracted by the extracting means;
Foreign object image specifying means for specifying an image having a predetermined area or more as a foreign object image as the foreign object image based on the second image from which the work image has been removed by the work image removing means. A foreign object detection device. The work image specifying means performs a contraction process for contracting the first image a predetermined number of times, and specifies an image having the predetermined geometric feature amount as a work image among the contracted first images. The foreign object detection device according to claim 1. The workpiece image removing unit performs an expansion process for expanding the first image whose workpiece image is specified by the workpiece image specifying unit a predetermined number of times, and the workpiece image is expanded in the first image of the second image that has been expanded. The foreign object detection device according to claim 2, wherein an area corresponding to the area specified as is removed. A parts feeder that vibrates a conveyance path and conveys a workpiece, which is a conveyance object, to a predetermined conveyance destination along the conveyance path,
A parts feeder comprising the foreign matter detection device according to claim 1.

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