JP2005308509A5 - - Google Patents
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- JP2005308509A5 JP2005308509A5 JP2004124966A JP2004124966A JP2005308509A5 JP 2005308509 A5 JP2005308509 A5 JP 2005308509A5 JP 2004124966 A JP2004124966 A JP 2004124966A JP 2004124966 A JP2004124966 A JP 2004124966A JP 2005308509 A5 JP2005308509 A5 JP 2005308509A5
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Claims (11)
前記被測定信号から分配された第一の分配信号の位相を表す第一の位相信号を生成するステップと、
前記被測定信号から分配された第二の分配信号の位相を表す第二の位相信号を生成するステップと、
前記第一の位相信号と前記第二の位相信号とのクロススペクトラムを少なくとも所定回数求めるステップと、
前記所定数の前記クロススペクトラムのベクトル平均を求めるステップと、
を備えることを特徴とする位相雑音測定方法。 A method for measuring phase noise of a signal under measurement,
Generating a first phase signal representing the phase of the first distributed signal distributed from the signal to be measured,
And generating a second phase signal representing a phase of the second distributed signal distributed from the signal to be measured,
And determining at least a predetermined number of times the cross spectrum between the first phase signal and the second phase signal,
Determining a vector average of the cross spectrum of said predetermined number,
A phase noise measurement method comprising:
前記被測定信号から分配された第一の分配信号から、第一の信号処理手段により第一の中間信号を生成するステップと、
前記被測定信号から分配された第二の分配信号から、前記第一の信号処理手段とは別個の第二の信号処理手段により第二の中間信号を生成するステップと、
前記第一の中間信号の位相を表す第一の位相信号を生成するステップと、
前記第二の中間信号の位相を表す第二の位相信号を生成するステップと、
前記第一の位相信号と前記第二の位相信号とのクロススペクトラムを少なくとも所定回数求めるステップと、
前記所定数の前記クロススペクトラムのベクトル平均を求めるステップと、
を備えることを特徴とする位相雑音測定方法。 A method for measuring phase noise of a signal under measurement,
Wherein the first distributed signal distributed from the measured signal, and generating a first intermediate signal by the first signal processing means,
Generating a second intermediate signal by a separate second signal processing means from said second distributed signal distributed from the signal to be measured, and the first signal processing means,
Generating a first phase signal representative of the first intermediate signal phase,
And generating a second phase signal representative of the second intermediate signal phase,
And determining at least a predetermined number of times the cross spectrum between the first phase signal and the second phase signal,
Determining a vector average of the cross spectrum of said predetermined number,
A phase noise measurement method comprising:
互いに異なる周波数帯域を有する複数の周波数領域のそれぞれにおいて、前記第一の位相信号と前記第二の位相信号との前記クロススペクトラムを求めるステップと、
前記周波数領域のそれぞれにおける前記クロススペクトラムを組み合わせて1つのクロススペクトラムを得るステップと、
を含むことを特徴とする請求項1乃至請求項3のいずれかに記載の位相雑音測定方法。 Obtaining the cross spectrum ,
Obtaining the cross spectrum of the first phase signal and the second phase signal in each of a plurality of frequency regions having different frequency bands;
Obtaining a single cross spectrum by combining the cross spectrum in each of the frequency domain,
The phase noise measuring method according to claim 1, wherein the phase noise measuring method is included.
互いに異なる周波数帯域を有する複数の周波数領域のそれぞれにおいて、前記第一の位相信号と前記第二の位相信号との前記クロススペクトラムを、同一時間内で繰り返し求めるステップと、
前記周波数領域のそれぞれにおいて前記時間内に2以上の前記クロススペクトラムが求められた場合、前記周波数領域毎に、求められた2以上の前記クロススペクトラムに対して時間方向のベクトル平均を施すステップと、
を含むことを特徴とする請求項1乃至請求項3のいずれかに記載の位相雑音測定方法。 Obtaining the cross spectrum ,
Repetitively obtaining the cross spectrum of the first phase signal and the second phase signal in the same time in each of a plurality of frequency regions having different frequency bands;
If two or more of the cross spectra in the time in each of the frequency domain is determined, comprising the steps of subjecting for each of the frequency domain, the obtained 2 or more in the time direction vector average to the cross spectrum,
The phase noise measuring method according to claim 1, wherein the phase noise measuring method is included.
互いに異なる周波数帯域を有する複数の周波数領域のそれぞれにおいて、前記第一の位相信号と前記第二の位相信号との前記クロススペクトラムを、同一時間内で繰り返し求めるステップと、 Repetitively obtaining the cross spectrum of the first phase signal and the second phase signal in the same time in each of a plurality of frequency regions having different frequency bands;
前記周波数領域のそれぞれにおいて前記時間内に2以上の前記クロススペクトラムが求められた場合、前記周波数領域毎に、求められた2以上の前記クロススペクトラムに対して時間方向のベクトル平均を施して、1つの前記クロススペクトラムを求めるステップと、 When two or more cross spectra are obtained within the time in each of the frequency domains, a vector average in the time direction is applied to the obtained two or more cross spectra for each frequency domain, and 1 Obtaining the two cross spectrums;
前記周波数領域のそれぞれにおける前記クロススペクトラムを組み合わせて1つのクロススペクトラムを得るステップと、 Combining the cross spectrums in each of the frequency domains to obtain one cross spectrum;
を含むことを特徴とする請求項1乃至請求項3のいずれかに記載の位相雑音測定方法。 The phase noise measuring method according to claim 1, wherein the phase noise measuring method is included.
前記被測定信号から分配された第一の分配信号から、第一の信号処理手段により第一の中間信号を生成するステップと、
前記被測定信号から分配された第二の分配信号から、前記第一の信号処理手段とは別個の第二の信号処理手段により第二の中間信号を生成するステップと、
前記第一の中間信号の位相を表す第一の位相信号を生成するステップと、
前記第二の中間信号の位相を表す第二の位相信号を生成するステップと、
前記第一の位相信号と前記第二の位相信号との相互相関を求めるステップと、
を備えることを特徴とする位相雑音測定方法。 A method for measuring phase noise of a signal under measurement,
Wherein the first distributed signal distributed from the measured signal, and generating a first intermediate signal by the first signal processing means,
Generating a second intermediate signal by a separate second signal processing means from said second distributed signal distributed from the signal to be measured, and the first signal processing means,
Generating a first phase signal representative of the first intermediate signal phase,
And generating a second phase signal representative of the second intermediate signal phase,
Determining a cross-correlation between the first phase signal and the second phase signal,
A phase noise measurement method comprising:
前記被測定信号から分配された第一の分配信号の位相を検出する第一の位相検出手段と、
前記被測定信号から分配された第二の分配信号の位相を検出する、第一の位相検出手段とは別個の第二の位相検出手段と、
担当する周波数帯域が異なる複数のクロススペクトラム生成手段と、
を備え、
前記クロススペクトラム生成手段のそれぞれが、個々に担当する周波数帯域における、前記第一の位相検出手段の出力信号と前記第二の位相検出手段の出力信号とのクロススペクトラムを求める、
ことを特徴とする位相雑音測定装置。 An apparatus for measuring phase noise of a signal under measurement,
A first phase detector for detecting a phase of the first distributed signal distributed from the signal to be measured,
A separate second phase detecting means and said detecting a second distribution signal of the phase which is distributed from the signal to be measured, the first phase detecting means,
A plurality of cross spectrum generating means having different frequency bands in charge;
With
Wherein each of the cross-spectrum generating means, in the frequency band in charge individually determine the cross spectrum of the output signal of said first output signal and said second phase detection means of the phase detecting means,
A phase noise measuring device.
前記被測定信号から分配された第一の分配信号から第一の中間信号を生成する第一の信号処理手段と、
前記被測定信号から分配された第二の分配信号から第二の中間信号を生成する、前記第一の信号処理手段とは別個の第二の信号処理手段と、
前記第一の中間信号の位相を検出する第一の位相検出手段と、
前記第二の中間信号の位相を検出する、前記第一の位相検出手段とは別個の第二の位相検出手段と、
担当する周波数帯域が異なる複数のクロススペクトラム生成手段と、
を備え、
前記クロススペクトラム生成手段のそれぞれが、個々に担当する周波数帯域における、第一の位相検出手段の出力信号と第二の位相検出手段の出力信号とのクロススペクトラムを求める、
ことを特徴とする位相雑音測定装置。 An apparatus for measuring phase noise of a signal under measurement,
A first signal processing means for generating a first intermediate signal from the first distributed signal distributed from the signal to be measured,
A separate second signal processing means and said generating a second intermediate signal from the second distributed signal distributed from the signal to be measured, said first signal processing means,
A first phase detector for detecting the first intermediate signal phase,
Detecting said second intermediate signal phase, and a separate second phase detecting means and said first phase detecting means,
A plurality of cross spectrum generating means having different frequency bands in charge;
With
Each of the cross spectrum generation means obtains a cross spectrum between the output signal of the first phase detection means and the output signal of the second phase detection means in the frequency band in charge of each .
A phase noise measuring device.
ことを特徴とする請求項9または10に記載の位相雑音測定装置。 Wherein each of the cross-spectrum generating unit determines repeatedly cross spectrum of the output signal of said first phase detecting means output signal and said second phase detection means in the same time, two or more of the in the time When a cross spectrum is obtained, a vector average in the time direction is applied to the obtained two or more cross spectra.
The phase noise measuring device according to claim 9 or 10.
Priority Applications (1)
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JP2004124966A JP4761724B2 (en) | 2004-04-21 | 2004-04-21 | Method for measuring phase noise and phase noise measuring apparatus |
Applications Claiming Priority (1)
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JP2004124966A JP4761724B2 (en) | 2004-04-21 | 2004-04-21 | Method for measuring phase noise and phase noise measuring apparatus |
Publications (3)
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JP2005308509A JP2005308509A (en) | 2005-11-04 |
JP2005308509A5 true JP2005308509A5 (en) | 2007-05-31 |
JP4761724B2 JP4761724B2 (en) | 2011-08-31 |
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JP2004124966A Expired - Lifetime JP4761724B2 (en) | 2004-04-21 | 2004-04-21 | Method for measuring phase noise and phase noise measuring apparatus |
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Families Citing this family (4)
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JP5619902B2 (en) * | 2009-09-23 | 2014-11-05 | オーイーウェイブス,インコーポレーテッド | Measurement of phase noise in radio frequency, microwave or millimeter wave signals based on optical delay |
US8711992B2 (en) * | 2012-05-31 | 2014-04-29 | Agilent Technologies, Inc. | Phase noise extraction apparatus and technique |
GB2529200B (en) * | 2014-08-13 | 2019-05-01 | Fen Ep Ltd | Improvement to Analysing Physiological Electrograms |
CN110716092B (en) * | 2019-10-22 | 2021-09-07 | 上海交通大学 | Phase noise measuring device and measuring method based on laser frequency discrimination and cross-correlation processing |
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JPS5956170A (en) * | 1982-09-24 | 1984-03-31 | Advantest Corp | Transfer function measuring instrument |
JP3099979B2 (en) * | 1991-05-27 | 2000-10-16 | 日本電信電話株式会社 | Method and apparatus for measuring additional phase noise |
US5412325A (en) * | 1993-12-23 | 1995-05-02 | Hughes Aircraft Company | Phase noise measurement system and method |
JP3381109B2 (en) * | 1994-12-28 | 2003-02-24 | ソニー株式会社 | Transfer function measurement device |
US5608331A (en) * | 1995-06-06 | 1997-03-04 | Hughes Electronics | Noise measurement test system |
JP3921035B2 (en) * | 2000-06-14 | 2007-05-30 | アンリツ株式会社 | Phase noise transfer characteristic analyzer |
JP2003232842A (en) * | 2002-02-12 | 2003-08-22 | Mitsubishi Electric Corp | Azimuth detection device |
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