JP3099979B2 - Method and apparatus for measuring additional phase noise - Google Patents

Method and apparatus for measuring additional phase noise

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Publication number
JP3099979B2
JP3099979B2 JP03151190A JP15119091A JP3099979B2 JP 3099979 B2 JP3099979 B2 JP 3099979B2 JP 03151190 A JP03151190 A JP 03151190A JP 15119091 A JP15119091 A JP 15119091A JP 3099979 B2 JP3099979 B2 JP 3099979B2
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JP
Japan
Prior art keywords
signal
circuit
under test
phase
phase noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP03151190A
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Japanese (ja)
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JPH04350576A (en
Inventor
匡夫 中川
孝 大平
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Nippon Telegraph and Telephone Corp
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Nippon Telegraph and Telephone Corp
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Priority to JP03151190A priority Critical patent/JP3099979B2/en
Publication of JPH04350576A publication Critical patent/JPH04350576A/en
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は2ポートデバイスの試験
に利用する。特に、入力と出力とで周波数が異なる回路
の付加位相雑音の測定に関する。
The present invention is used for testing two-port devices. In particular, the present invention relates to measurement of additional phase noise of a circuit having different frequencies between an input and an output.

【0002】本明細書において「2ポートデバイス」と
は、増幅器、分周器、ミキサ、逓倍器、位相同期ループ
発振器など、一つの入力に対して一つの出力が得られる
電気回路または電子回路をいう。
[0002] In this specification, the term "two-port device" refers to an electric circuit or an electronic circuit such as an amplifier, a frequency divider, a mixer, a multiplier, a phase-locked loop oscillator, etc., which can obtain one output with respect to one input. Say.

【0003】[0003]

【従来の技術】図4および図5は従来の付加位相雑音測
定方法を示す図であり、図4は入力と出力との周波数が
同じ場合、図5は双方の周波数が異なる場合を示す。
2. Description of the Related Art FIGS. 4 and 5 show a conventional method for measuring the additional phase noise. FIG. 4 shows a case where the input and output frequencies are the same, and FIG. 5 shows a case where both frequencies are different.

【0004】増幅器などの入力と出力とで周波数が同じ
回路について測定する場合には、信号源1の出力信号を
パワースプリッタ2で分岐し、その一方を被測定回路1
00に入力し、他方を90°移相器3に入力する。さら
に、被測定回路100の出力と90°移相器3の出力と
を位相検波器4に入力し、その出力を低域通過フィルタ
5に通してスペクトラムアナライザ6によりパワースペ
クトラムを観測する。
When measuring a circuit having the same frequency between the input and the output of an amplifier or the like, an output signal of a signal source 1 is split by a power splitter 2 and one of the output signals is split into a circuit under test 1
00 and the other is input to the 90 ° phase shifter 3. Further, the output of the circuit under test 100 and the output of the 90 ° phase shifter 3 are input to a phase detector 4, the output of which is passed through a low-pass filter 5, and a power spectrum is observed by a spectrum analyzer 6.

【0005】分周器、ミキサ、逓倍器、位相同期ループ
発振器など、入力と出力とで周波数が異なる回路の場合
には、90°移相器3の前段にも同等の回路を挿入す
る。すなわち、パワースプリッタ2で分岐された信号の
一方を被測定回路100−1に入力し、他方をこの被測
定回路100−1と同等の被測定回路100−2を介し
て90°移相器3に入力する。被測定回路100−1の
出力と90°移相器3の出力とは、位相検波器4に入力
され、低域通過フィルタ5を介してスペクトラムアナラ
イザ6に供給される。
In the case of a circuit having a different frequency between the input and the output, such as a frequency divider, a mixer, a multiplier, and a phase-locked loop oscillator, an equivalent circuit is inserted in the stage preceding the 90 ° phase shifter 3. That is, one of the signals split by the power splitter 2 is input to the circuit under test 100-1, and the other is passed through the circuit under test 100-2 equivalent to the circuit under test 100-1, and the 90 ° phase shifter 3 is turned on. To enter. The output of the circuit under test 100-1 and the output of the 90 ° phase shifter 3 are input to the phase detector 4 and supplied to the spectrum analyzer 6 via the low-pass filter 5.

【0006】ここで、入力と出力との周波数が同じ場合
について説明する。信号源1の出力信号A(t) を A(t) =Asin(ωt+φREF,n(t)) ……(1) とする。Aとωは振幅と角周波数であり、φREF,n(t)は
信号の位相雑音、すなわちジッタである。被測定回路1
00は入力と出力とで周波数が同じであるから、その出
力信号は、 B(t) =Bsin(ωt+φREF,n(t)+φDUT,n(t)) ……(2) となる。Bは振幅、φDUT,n(t)は被測定回路100で付
加される位相雑音である。90°位相器3の出力信号
は、そこで付加される位相雑音を無視すると、 C(t) =Csin(ωt+φREF,n(t)+90°) =Ccos(ωt+φREF,n(t)) ……(3) となる。位相検波器4は乗算器であり、その出力は、 D(t) =Bsin(ωt+φREF,n(t)+φDUT,n(t)) ×Ccos(ωt+φREF,n(t)) =(BC/2)sin(2ωt+2φREF,n(t)+φDUT,n(t)) +(BC/2)sin(φDUT,n(t)) ……(4) となる。この式の第1項は高周波成分であり、低域通過
フィルタ5により除去される。また、φDUT,n(t)は微小
であることから、 D(t) ≒(BC/2)φDUT,n(t) ……(5) となる。この電圧をスペクトラムアナライザ6に入力す
ることによって、 Sφ(fm)=〔ΦDUT,n(fm)〕2 ……(6) なるパワースペクトラムが得られる。ただし、Φ
DUT,n(fm)はφDUT,n(t)のフーリエ展開である。すなわ
ち、信号源1の位相雑音は相殺され、被測定回路100
の位相雑音だけを測定できる。
Here, a case where the input and output frequencies are the same will be described. The output signal A (t) of the signal source 1 is expressed as A (t) = A sin (ωt + φ REF, n (t)) (1) A and ω are the amplitude and angular frequency, and φ REF, n (t) is the phase noise of the signal, that is, the jitter. Circuit under test 1
Since 00 has the same frequency for the input and the output, the output signal is as follows: B (t) = Bsin (ωt + φREF , n (t) + φDUT , n (t)) (2) B is the amplitude, and φ DUT, n (t) is the phase noise added in the circuit under test 100. As for the output signal of the 90 ° phase shifter 3, ignoring the phase noise added there, C (t) = C sin (ωt + φREF , n (t) + 90 °) = Ccos (ωt + φREF , n (t)) (3) The phase detector 4 is a multiplier whose output is: D (t) = B sin (ωt + φREF , n (t) + φDUT , n (t)) × Ccos (ωt + φREF , n (t)) = (BC / 2) sin (2ωt + 2φREF , n (t) + φDUT, n (t)) + (BC / 2) sin ( φDUT, n (t)) (4) The first term of this equation is the high frequency component, which is removed by the low pass filter 5. Further, since φ DUT, n (t) is minute, D (t) ≒ (BC / 2) φ DUT, n (t) (5) By inputting this voltage to the spectrum analyzer 6, a power spectrum of Sφ (f m ) = [φ DUT, n (f m )] 2 (6) is obtained. Where Φ
DUT, n (f m ) is a Fourier expansion of φ DUT, n (t). That is, the phase noise of the signal source 1 is canceled and the circuit under test 100
Can measure only the phase noise.

【0007】入力と出力とで周波数が異なる場合、被測
定回路100−1の出力信号は、 E(t) =Esin(ω′t+φ′REF,n(t)+φDUT1,n(t)) ……(7) となる。ただし、信号源1の出力信号が(1)式で表さ
れるとした。(7)式において、Eは振幅、ω′は被測
定回路100−1の出力角周波数、φ′REF,n(t)は被測
定回路100−1を介して出力される信号源1の位相雑
音、φDUT1,n(t)は被測定回路100−1で付加される
位相雑音である。また、90°移相器3で付加される移
相雑音を無視すると、被測定回路100−2と90°移
相器3とを経由した信号は、 F(t) =Fsin(ω′t+φ′REF,n(t)+φDUT2,n(t)+90°) =Fcos(ω′t+φ′REF,n(t)+φDUT2,n(t)) ……(8) となる。ただし、Fは振幅、φDUT2,n(t) は被測定回路
100−2で付加される移相雑音である。したがって、
位相検波器4と低域通過フィルタ5とを経由した信号
は、 G(t) =(EF/2)〔φDUT1,n(t)−φDUT2,n(t)〕 ……(9) となる。被測定回路100−1、100−2で発生する
雑音は互いに相関がないため(9)式のパワースペクト
ラムは個々の和として観測され、 Sφ(fm)=〔ΦDUT1,n(fm)〕2 +〔ΦDUT2,n(fm)〕2 ……(10) となる。ΦDUT1,n(fm) 、ΦDUT2,n(fm) はそれぞれφ
DUT1,n(t) 、φDUT2,n(t)のフーリエ展開である。
If the input and output have different frequencies, the output signal of the circuit under test 100-1 is: E (t) = Esin (ω't + φ'REF , n (t) + φDUT1 , n (t)) ... (7) However, it is assumed that the output signal of the signal source 1 is represented by the expression (1). In the equation (7), E is amplitude, ω 'is the output angular frequency of the circuit under test 100-1, and φ' REF, n (t) is the phase of the signal source 1 output via the circuit under test 100-1. The noise φ DUT1, n (t) is the phase noise added in the circuit under test 100-1. Also, ignoring the phase shift noise added by the 90 ° phase shifter 3, the signal passing through the circuit under test 100-2 and the 90 ° phase shifter 3 is given by F (t) = Fsin (ω′t + φ ′) REF, n (t) + φDUT2 , n (t) + 90 °) = Fcos (ω′t + φ′REF , n (t) + φDUT2 , n (t)) (8) Here, F is the amplitude, and φ DUT2, n (t) is the phase shift noise added by the circuit under measurement 100-2. Therefore,
The signal that has passed through the phase detector 4 and the low-pass filter 5 is as follows: G (t) = (EF / 2) [φ DUT1, n (t) −φ DUT2, n (t)] (9) Become. Since the noises generated in the circuits under test 100-1 and 100-2 have no correlation with each other, the power spectrum of the expression (9) is observed as a sum of the individual components, and Sφ (f m ) = [Φ DUT1, n (f m ) 2 + [Φ DUT2, n (f m )] 2 (10) Φ DUT1, n (f m ) and Φ DUT2, n (f m ) are φ
This is a Fourier expansion of DUT1, n (t) and φDUT2, n (t).

【0008】すなわち、信号源1の位相雑音は相殺され
て被測定回路100−1、100−2の雑音だけを測定
できるが、この二つの回路は独立に雑音を発生するた
め、雑音測定結果を1/2倍した値、すなわちdB表示
で3dB差し引いた値が被測定回路1個あたりの雑音と
なる。
That is, the phase noise of the signal source 1 is canceled and only the noise of the circuits under test 100-1 and 100-2 can be measured. However, since these two circuits generate noise independently, the noise measurement results The value obtained by multiplying by す な わ ち, that is, the value obtained by subtracting 3 dB in dB display, is the noise per circuit to be measured.

【0009】[0009]

【発明が解決しようとする課題】しかし、90°移相器
で付加される移相雑音φ90,n(t) がある場合には、観測
されるパワースペクトラムが、 Sφ(fm)=〔ΦDUT1,n(fm)〕2 +〔ΦDUT2,n(fm)〕2 +〔Φ90,n(fm)〕 ……(11) となってしまう。Φ90,n(fm)はφ90,n(t) のフーリエ展
開である。
However, if there is a phase shift noise φ 90, n (t) added by the 90 ° phase shifter, the observed power spectrum is Sφ (f m ) = [ Φ DUT1, n (f m )] 2 + [φ DUT2, n (f m )] 2 + [φ 90, n (f m )] (11) Φ 90, n (f m ) is a Fourier expansion of φ 90, n (t).

【0010】すなわち、従来の付加位相雑音測定方法で
は、測定系の発生する雑音を十分に切り分けることがで
きなかった。
That is, in the conventional method of measuring the additional phase noise, the noise generated by the measuring system cannot be sufficiently separated.

【0011】本発明は、このような課題を解決し、測定
系の発生する雑音を十分に切り分けることのできる付加
位相雑音測定方法およびそのための装置を提供すること
を目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to solve such a problem and to provide an additional phase noise measuring method and an apparatus therefor capable of sufficiently separating noise generated by a measuring system.

【0012】[0012]

【課題を解決するための手段】本発明の付加位相雑音測
定方法は、測定のための信号を被測定回路に通過させ、
その通過した信号を二つに分岐し、その一方の信号を9
0°移相器に通過させた後に他方の信号に乗算し、この
乗算結果により測定系の位相雑音を求め、この測定系の
位相雑音を従来の方法により測定された値から差し引く
ことを特徴とする。
According to the additional phase noise measuring method of the present invention, a signal for measurement is passed through a circuit to be measured.
The passed signal is branched into two, and one of the signals is divided into 9
After passing through a 0 ° phase shifter, the other signal is multiplied, the phase noise of the measurement system is obtained from the multiplication result, and the phase noise of the measurement system is subtracted from the value measured by the conventional method. I do.

【0013】この方法を実施するための装置は、信号源
と、この信号源の出力を二つの信号路に分配するパワー
スプリッタと、この二つの信号路の一方の出力に配置さ
れた90°移相器と、この二つの信号路を経由した二つ
の信号を乗算する位相検波器と、この位相検波器の出力
スペクトラムを観測する観測手段と、二つの信号路にそ
れぞれ被測定回路を接続する接続手段とを備え、さら
に、接続手段を短絡して二つの信号路からそれぞれ被測
定回路を切り離すとともにその被測定回路の一方を信号
源とパワースプリッタとの間に接続する接続切替手段を
備えたことを特徴とする。
An apparatus for carrying out the method comprises a signal source, a power splitter for splitting the output of the signal source into two signal paths, and a 90 ° shifter disposed at one output of the two signal paths. A phase detector, a phase detector for multiplying the two signals passing through the two signal paths, an observation means for observing an output spectrum of the phase detector, and a connection for connecting a circuit under test to each of the two signal paths. And a connection switching means for short-circuiting the connection means to disconnect the circuit to be measured from the two signal paths and connecting one of the circuits to be measured between the signal source and the power splitter. It is characterized by.

【0014】[0014]

【作用】被測定回路を接続しない状態でその測定系の雑
音を測定しておけば、それを被測定回路による雑音と区
別できる。しかし、被測定回路の入力と出力とで周波数
が異なる場合には、被測定回路を接続したときと接続し
ないときとでその後段の周波数が異なり、測定系を正し
く測定することはできない。そこで、信号源とパワース
プリッタとの間に被測定回路を挿入し、信号源と被測定
回路との付加雑音を共に相殺して測定系の発生する雑音
を測定する。この雑音を従来の付加位相雑音測定方法で
得られた値から差し引く。これにより測定系の発生する
雑音を十分に切り分けることができ、正確な付加位相雑
音を測定できる。
If the noise of the measuring system is measured without connecting the circuit to be measured, it can be distinguished from the noise due to the circuit to be measured. However, when the frequency of the input and output of the circuit under test is different, the frequency at the subsequent stage differs between when the circuit under test is connected and when it is not connected, and the measurement system cannot be measured correctly. Therefore, a circuit to be measured is inserted between the signal source and the power splitter, and the noise generated by the measurement system is measured by canceling out the additional noise of the signal source and the circuit to be measured. This noise is subtracted from the value obtained by the conventional additional phase noise measurement method. As a result, noise generated by the measurement system can be sufficiently separated, and accurate additional phase noise can be measured.

【0015】[0015]

【実施例】図1は付加位相雑音測定方法の第一の実施例
を示すブロック構成図である。
FIG. 1 is a block diagram showing a first embodiment of an additional phase noise measuring method.

【0016】まず、図1(a)に示すように、信号源1
からの測定のための信号をパワースプリッタ2で二つに
分岐し、その一方の信号を第一の被測定回路100−1
に入力し、その他方の信号を被測定回路100−1と実
質的に同一の特性をもつ第二の被測定回路100−2に
入力し、この第二の被測定回路100−2を通過した信
号の位相を90°移相器3で90°偏移させ、この位相
が90°偏移した信号と第一の被測定回路100−1を
通過した信号とを位相検波器4により乗算し、この乗算
結果を低域通過フィルタ5を介してスペクトラムアナラ
イザ6に供給することにより、被測定回路100−1、
100−2によって生じる付加位相雑音を求める。この
時の測定結果を以下「測定結果A」という。測定結果A
は、上述した(11)式で表される。
First, as shown in FIG.
From the signal to be measured is split into two by the power splitter 2, and one of the signals is split into the first circuit under measurement 100-1.
, And the other signal is input to a second circuit under test 100-2 having substantially the same characteristics as the circuit under test 100-1 and passed through the second circuit under test 100-2. The phase of the signal is shifted by 90 ° by the 90 ° phase shifter 3, and the signal whose phase is shifted by 90 ° is multiplied by the signal passed through the first circuit under measurement 100-1 by the phase detector 4, By supplying the multiplication result to the spectrum analyzer 6 via the low-pass filter 5, the circuit under measurement 100-1,
Determine the additional phase noise caused by 100-2. The measurement result at this time is hereinafter referred to as “measurement result A”. Measurement result A
Is represented by the above equation (11).

【0017】続いて、図1(b)に示すように、信号源
1からの信号を第一の被測定回路か第二の被測定回路、
またこれらと実質的に同一の特性をもつ第三の被測定回
路(これを被測定回路100とする)に通過させ、その
通過した信号を二つに分岐し、その一方の信号を90°
移相器3に通過させた後に位相検波器4により他方の信
号に乗算し、この乗算結果により測定系の位相雑音を求
めて「測定結果B」とし、この測定結果Bを最初に求め
た測定結果Aから差し引く。
Subsequently, as shown in FIG. 1B, the signal from the signal source 1 is transmitted to the first circuit under test or the second circuit under test,
Further, the signal is passed through a third circuit to be measured (which is referred to as a circuit to be measured 100) having substantially the same characteristics as those described above, the passed signal is branched into two, and one of the signals is divided by 90 °.
After passing through the phase shifter 3, the other signal is multiplied by the phase detector 4, the phase noise of the measurement system is obtained based on the multiplication result, and the obtained result is referred to as “measurement result B”. Subtract from result A.

【0018】パワースプリッタ2の前段に被測定回路1
00を接続した場合には、被測定回路100の出力信号
が(7)式で表され、位相検波器4の出力は、振幅をH
として、 H(t) =Hsin(2ω′t+2φ′REF,n(t)+φDUT1,n(t)+φ90,n(t)) +Hsin(φ90,n(t)) ……(12) となる。これを低域通過フィルタ5を介してスペクトラ
ムアナライザ6に入力し、パワースペクトラムを観測す
る。このときの測定結果Bは、 Sφ(fm) =〔Φ90,n(fm) 〕2 ……(13) となる。したがって、被測定回路ひとつ当たりの正確な
雑音は、 〔測定結果A−測定結果B〕/2 として求めることができる。
A circuit under test 1 is provided before the power splitter 2.
00 is connected, the output signal of the circuit under test 100 is expressed by equation (7), and the output of the
As, H (t) = Hsin ( 2ω't + 2φ 'REF, n (t) + φ DUT1, n (t) + φ 90, n (t)) + Hsin (φ 90, n (t)) ...... (12) Become. This is input to the spectrum analyzer 6 via the low-pass filter 5, and the power spectrum is observed. The measurement result B at this time is as follows: Sφ (f m ) = [φ 90, n (f m )] 2 (13) Therefore, the exact noise per circuit to be measured can be obtained as [measurement result A−measurement result B] / 2.

【0019】図2は測定装置の実施例を示すブロック構
成図である。図1に示した測定は、回路の接続を手作業
で切り替えて行うこともできるが、図2に示した装置を
用いれば、作業が容易になる。
FIG. 2 is a block diagram showing an embodiment of the measuring apparatus. Although the measurement shown in FIG. 1 can be performed by manually switching the circuit connection, the use of the apparatus shown in FIG. 2 facilitates the operation.

【0020】この装置は、信号源1と、この信号源1の
出力を二つの信号路に分配するパワースプリッタ3と、
この二つの信号路の一方の出力に配置された90°移相
器3と、この二つの信号路を経由した二つの信号を乗算
する位相検波器4と、この位相検波器4の出力スペクト
ラムを観測する観測手段としての低域通過フィルタ5お
よびスペクトラムアナライザ6とを備える。
The apparatus comprises a signal source 1, a power splitter 3 for dividing the output of the signal source 1 into two signal paths,
A 90 ° phase shifter 3 disposed at one output of these two signal paths, a phase detector 4 for multiplying two signals passing through the two signal paths, and an output spectrum of the phase detector 4 It has a low-pass filter 5 and a spectrum analyzer 6 as observation means for observing.

【0021】また、二つの信号路にそれぞれ被測定回路
(ここでは被測定回路100−1、100−2として示
す)を接続する接続手段として、二つの信号路の一方に
は端子13、14が設けられ、他方には端子15、16
が設けられ、それぞれが、被測定回路を接続するための
接続端子13′、14′、15′、16′に接続され
る。すなわち、一方の信号路では、端子13、接続端子
13′、被測定回路100−1、接続端子14′、端子
14の順に信号が伝えられ、他方の信号路では、端子1
5、接続端子15′、被測定回路100−2、接続端子
16′、端子16の順に信号が伝えられる。
Terminals 13 and 14 are provided on one of the two signal paths as connecting means for connecting a circuit to be measured (here, shown as circuits to be measured 100-1 and 100-2) to the two signal paths. Terminals 15 and 16
Are connected to connection terminals 13 ', 14', 15 ', 16' for connecting a circuit under test. That is, in one signal path, a signal is transmitted in the order of the terminal 13, the connection terminal 13 ', the circuit under test 100-1, the connection terminal 14', and the terminal 14, and in the other signal path, the terminal 1
5, the connection terminal 15 ', the circuit under test 100-2, the connection terminal 16', and the terminal 16 are transmitted in this order.

【0022】ここで本実施例の特徴とするところは、二
つの信号路からそれぞれ被測定回路を切り離してその部
分を短絡するともにその被測定回路の一方を信号源1と
パワースプリッタ2との間に接続する接続切替手段とし
て、端子13〜16と接続端子13′〜16′との間に
切替回路7を備え、信号源1とパワースプリッタ2との
間に切替回路7に接続される端子11、12を備えたこ
とにある。
The feature of this embodiment is that the circuit to be measured is separated from the two signal paths, the portions thereof are short-circuited, and one of the circuits to be measured is connected between the signal source 1 and the power splitter 2. A switching circuit 7 between the terminals 13 to 16 and the connection terminals 13 'to 16' as a connection switching means for connecting to the terminal 11 connected to the switching circuit 7 between the signal source 1 and the power splitter 2. , 12 are provided.

【0023】切替回路7は連動する複数のスイッチを備
え、第一の状態では、端子11と端子12、端子13と
接続端子13′、端子14と接続端子14′、端子15
と接続端子15′、端子16と接続端子16′を接続す
る。また、第二の状態では、端子11と接続端子1
3′、端子12と接続端子14′、端子13と端子1
4、端子15と端子16を接続する。
The switching circuit 7 includes a plurality of interlocking switches. In the first state, the terminals 11 and 12, the terminal 13 and the connection terminal 13 ', the terminal 14 and the connection terminal 14', and the terminal 15
And the connection terminal 15 ', and the terminal 16 and the connection terminal 16'. In the second state, the terminal 11 and the connection terminal 1
3 ', terminal 12 and connection terminal 14', terminal 13 and terminal 1
4. Connect the terminal 15 and the terminal 16.

【0024】図3は付加位相雑音測定方法の第二の実施
例を示すブロック構成図である。
FIG. 3 is a block diagram showing a second embodiment of the additional phase noise measuring method.

【0025】この実施例は、被測定回路100−1、1
00−2の出力周波数が高いためにそれぞれの出力にダ
ウンコンバータ8−1、8−2を用い、さらにその後段
に増幅器9−1、9−2を用いた場合の測定を示す。
In this embodiment, the circuits under test 100-1, 1
The measurement is shown in the case where the down-converters 8-1 and 8-2 are used for the respective outputs because the output frequency of 00-2 is high, and the amplifiers 9-1 and 9-2 are used in the subsequent stages.

【0026】この場合には、まず、図3(a)に示すよ
うに、パワースプリッタ2で分岐した一方の信号を被測
定回路100−1、ダウンコンバータ8−1、増幅器9
−1に通過させ、他方の信号を被測定回路100−2、
ダウンコンバータ8−2、増幅器9−2および90°移
相器3に通過させ、それぞれの信号を位相検波回路4に
入力する。この位相検波回路4の出力を低域通過フィル
タ5を介してスペクトラムアナライザ6により観測す
る。このときの測定結果をAとすると、測定結果Aは、
信号源1の雑音が相殺され、被測定回路100−1、1
00−2、ダウンコンバータ8−1、8−2、増幅器9
−1、9−2および90°移相器3により付加された雑
音の和となる。
In this case, first, as shown in FIG. 3A, one of the signals branched by the power splitter 2 is divided into a circuit under test 100-1, a down converter 8-1, and an amplifier 9.
-1 and the other signal to the circuit under measurement 100-2,
The signal passes through the down converter 8-2, the amplifier 9-2 and the 90 ° phase shifter 3, and the respective signals are input to the phase detection circuit 4. The output of the phase detection circuit 4 is observed by a spectrum analyzer 6 via a low-pass filter 5. Assuming that the measurement result at this time is A, the measurement result A is
The noise of the signal source 1 is canceled out, and the circuits under measurement 100-1, 1
00-2, down converters 8-1, 8-2, amplifier 9
-1, 9-2 and the sum of the noises added by the 90 ° phase shifter 3.

【0027】次に、図3(b)に示すように、被測定回
路100−1または100−2を切り離し、その一方
(これを被測定回路100とする)を信号源1とパワー
スプリッタ2との間に接続して同様の測定を行う。この
ときの測定結果をBとすると、この測定結果Bは、信号
源1および被測定回路100の雑音が相殺され、ダウン
コンバータ8−1、8−2、増幅器9−1、9−2およ
び90°移相器3による雑音を示す。したがって被測定
回路ひとつあたりの正確な雑音は、 〔測定結果A−測定結果B〕/2 として求めることができる。
Next, as shown in FIG. 3B, the circuit under test 100-1 or 100-2 is disconnected, and one of them (hereinafter referred to as the circuit under test 100) is connected to the signal source 1 and the power splitter 2. And perform the same measurement. Assuming that the measurement result at this time is B, the measurement result B cancels the noises of the signal source 1 and the circuit under test 100, and downconverters 8-1, 8-2, amplifiers 9-1, 9-2, and 90 ° shows noise due to the phase shifter 3. Therefore, the accurate noise per circuit to be measured can be obtained as [measurement result A−measurement result B] / 2.

【0028】さらに、図3(c)に示すように、ダウン
コンバータ8−1または8−2を切り離し、その一方
(これをダウンコンバータ8とする)をパワースプリッ
タ2の前段に配置し、同様の測定を行う。このときの測
定結果をCとすると、この測定結果Cは、増幅器9−
1、9−2および90°移相器3による雑音を示す。し
たがってダウンコンバータひとつあたりの正確な雑音
は、 〔測定結果B−測定結果C〕/2 として求めることができる。
Further, as shown in FIG. 3 (c), the down converter 8-1 or 8-2 is cut off, and one of the down converters (hereinafter referred to as the down converter 8) is arranged in front of the power splitter 2, and Perform the measurement. Assuming that the measurement result at this time is C, this measurement result C is
1, 9-2 and the noise due to the 90 ° phase shifter 3 are shown. Therefore, the accurate noise per downconverter can be obtained as [measurement result B-measurement result C] / 2.

【0029】このように、パワースプリッタを設ける位
置を順次後段に設けることにより、測定系で発生する雑
音をさらに切り分けることができる。
As described above, by sequentially providing the position where the power splitter is provided at the subsequent stage, it is possible to further separate the noise generated in the measurement system.

【0030】[0030]

【発明の効果】以上説明したように、本発明の付加位相
雑音測定方法および装置は、付加位相雑音の測定におい
て、その測定系の発生する雑音を切り分けることがで
き、正確な測定が可能となる効果がある。
As described above, the method and apparatus for measuring the additional phase noise of the present invention can separate the noise generated by the measuring system in the measurement of the additional phase noise, thereby enabling accurate measurement. effective.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の付加位相雑音測定方法の第一の実施例
を示すブロック構成図。
FIG. 1 is a block diagram showing a first embodiment of an additional phase noise measuring method according to the present invention.

【図2】本発明の付加位相雑音測定装置の実施例を示す
ブロック構成図。
FIG. 2 is a block diagram showing an embodiment of an additional phase noise measuring apparatus according to the present invention.

【図3】本発明の付加位相雑音測定方法の第二の実施例
を示すブロック構成図。
FIG. 3 is a block diagram showing a second embodiment of the additional phase noise measuring method of the present invention.

【図4】従来例付加位相雑音測定方法を示すブロック構
成図。
FIG. 4 is a block diagram showing a conventional additional phase noise measuring method.

【図5】従来例付加位相雑音測定方法を示すブロック構
成図。
FIG. 5 is a block diagram showing a conventional additional phase noise measuring method.

【符号の説明】[Explanation of symbols]

1 信号源 2 パワースプリッタ 3 90°移相器 4 位相検波器 5 低域通過フィルタ 6 スペクトラムアナライザ 7 切替回路 8、8−1、8−2 ダウンコンバータ 9、9−1、9−2 増幅器 11〜16 端子 13′〜16′ 接続端子 100、100−1、100−2 被測定回路 DESCRIPTION OF SYMBOLS 1 Signal source 2 Power splitter 3 90 degree phase shifter 4 Phase detector 5 Low pass filter 6 Spectrum analyzer 7 Switching circuit 8, 8-1, 8-2 Down converter 9, 9-1, 9-2 Amplifier 11- 16 terminals 13 'to 16' Connection terminals 100, 100-1, 100-2 Circuit under test

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 測定のための信号を二つに分岐し、 その一方の信号を第一の被測定回路に入力し、 その他方の信号を第二の被測定回路に入力し、 この第二の被測定回路を通過した信号の位相を90°移
相器で90°偏移させ、 この位相が90°偏移した信号と前記第一の被測定回路
を通過した信号とを乗算し、 この乗算結果を用いて前記第一の被測定回路および前記
第二の被測定回路によって生じる付加位相雑音を求める
付加位相雑音測定方法において、 前記測定のための信号を第三の被測定回路に通過させ、 その通過した信号を二つに分岐し、 その一方の信号を前記90°移相器に通過させた後に他
方の信号に乗算し、 この乗算結果により測定系の位相雑音を求め、 この測定系の位相雑音を前記付加位相雑音から差し引く
ことを特徴とする付加位相雑音測定方法。
1. A signal for measurement is branched into two, one of the signals is input to a first circuit to be measured, and the other signal is input to a second circuit to be measured. The phase of the signal passing through the circuit under test is shifted by 90 ° by a 90 ° phase shifter, and the signal whose phase is shifted by 90 ° is multiplied by the signal passing through the first circuit under test. In an additional phase noise measuring method for obtaining additional phase noise generated by the first circuit under test and the second circuit under test using a result of the multiplication, the signal for the measurement is passed through a third circuit under test. The passed signal is branched into two, and one of the signals is passed through the 90 ° phase shifter and then multiplied by the other signal. The multiplication result is used to determine the phase noise of the measurement system. Phase noise is subtracted from the additional phase noise. Additional phase noise measurement method.
【請求項2】 信号源と、 この信号源の出力を二つの信号路に分配するパワースプ
リッタと、 この二つの信号路の一方の出力に配置された90°移相
器と、この90°移相器の出力信号と前記二つの信号路の他方
を経由した信号と を乗算する位相検波器と、 この位相検波器の出力スペクトラムを観測する観測手段
と、 前記二つの信号路にそれぞれ被測定回路を接続する接続
手段とを備えた付加位相雑音測定装置において、前記接続手段は、 前記二つの信号路からそれぞれ被測定
回路を切り離してその部分を短絡するともにその被測
定回路の一方を前記信号源と前記パワースプリッタとの
間に接続する接続切替手段を含むことを特徴とする付加
位相雑音測定装置。
2. A signal source, a power splitter for distributing the output of the signal source into two signal paths, and 90 ° phase shifter disposed on one of the outputs of the two signal paths, the 90 ° shift The output signal of the phaser and the other of the two signal paths
Additional phase noise measurement, comprising: a phase detector that multiplies a signal passing through the phase detector; an observation unit that observes an output spectrum of the phase detector; and a connection unit that connects a circuit to be measured to each of the two signal paths. in the device, the connecting means, the connection switching for connecting one of both the circuit under test by shorting the part disconnect the two respective circuit to be measured from the signal path between the signal source and the power splitter An additional phase noise measuring device, characterized by including means.
JP03151190A 1991-05-27 1991-05-27 Method and apparatus for measuring additional phase noise Expired - Lifetime JP3099979B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03151190A JP3099979B2 (en) 1991-05-27 1991-05-27 Method and apparatus for measuring additional phase noise

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03151190A JP3099979B2 (en) 1991-05-27 1991-05-27 Method and apparatus for measuring additional phase noise

Publications (2)

Publication Number Publication Date
JPH04350576A JPH04350576A (en) 1992-12-04
JP3099979B2 true JP3099979B2 (en) 2000-10-16

Family

ID=15513245

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3099979B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19901750B4 (en) * 1999-01-18 2006-04-13 Rohde & Schwarz Gmbh & Co. Kg Arrangement for measuring the phase noise of the output signal of a DUT
US6393372B1 (en) * 1999-05-17 2002-05-21 Eugene Rzyski Automated frequency stepping noise measurement system
JP2005308511A (en) * 2004-04-21 2005-11-04 Agilent Technol Inc Method and apparatus for measuring phase noise
JP2005308510A (en) * 2004-04-21 2005-11-04 Agilent Technol Inc Apparatus and system for measuring phase noise
JP4761724B2 (en) * 2004-04-21 2011-08-31 アジレント・テクノロジーズ・インク Method for measuring phase noise and phase noise measuring apparatus
WO2008114700A1 (en) * 2007-03-13 2008-09-25 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, electronic device and program
US8711992B2 (en) * 2012-05-31 2014-04-29 Agilent Technologies, Inc. Phase noise extraction apparatus and technique
JP6636508B2 (en) * 2014-09-25 2020-01-29 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. Digital receive coil with built-in receive phase noise indicator
DE102018108219B3 (en) * 2018-01-29 2019-06-19 Infineon Technologies Ag Spectral estimation of noise in radar devices
CN110187197B (en) * 2019-04-11 2021-07-27 东南大学 Automatic additional phase noise measuring device

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Publication number Publication date
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