JP2005221288A - Measuring method of processed face property by projection method and its device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a means for detecting the surface state of a processed face during feed processing performed by a processing means of a processing machine, by a projection method wherein a measuring sensor is out of contact with the processed face. <P>SOLUTION: This measuring method of a processed face property by the projection method is characterized by providing a shielding body 3 for forming a processed surface 2 shadow based on light source 1 irradiation in order to detect the surface state of a processed measuring object, detecting by an imaging means 4 the projection state such as the length 9 and the height 10 of the shadow 8 formed by the shielding body 3, and operating the processed surface state of the measuring object surface 2 by an operation processing device 5. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

The present invention contrasts shadows on the surface of various materials such as wood, metal, and plastic to be measured, and measures the length, depth, height, width, etc. of the contrasted shadows by a projection method. The present invention relates to a technique for detecting a processed surface state of an object to be measured.

As the above technique, for example, as shown in Patent Document 1, a stylus that is a measurement sensor is brought into contact with a processing surface, and the vertical movement of an arm that supports the stylus is converted into an electric signal to process the surface of the object to be measured. The method of measuring the state was common. Further, as shown in Patent Document 2, a method has been proposed in which a laser beam, which is a measurement sensor, is irradiated onto a processing surface, and the state of the processing surface is measured in a non-contact manner from the irradiation state of the laser light.
Japanese Patent Laid-Open No. 06-258003 (Japanese Patent No. 2853794) Japanese Patent Laid-Open No. 08-320222

As shown in Patent Document 1, in the measurement method based on the above principle, not only the measurement range is restricted by the radius of curvature of the stylus, but also because the stylus contacts the processing surface, a soft material such as wood is used. In some cases, the processed surface may be damaged with a stylus. In addition, the stylus can only move at a low speed, and it may be practically difficult to measure during feed processing by the processing means of the processing machine.
The measurement with laser light as in Patent Document 2 is non-contact measurement, so the surface to be measured is not damaged, but for homogeneous materials such as metal and plastic, the laser light diffuses on the irradiation surface. However, for porous materials such as wood, the laser beam diffuses on the irradiated surface and the center of the measurement becomes unclear, which may reduce the measurement accuracy. It was.

In view of the above-described situation, the present invention intends to solve the problem that the surface state of the processed surface is not brought into contact with the processing surface while the processing means of the processing machine is not performing the feed processing but also during the feed processing. A means for detecting by the method is desired, and there is a problem to be solved here.

In order to solve the above-mentioned problem, the present invention firstly provides a contrast means for contrasting a shadow on a processed surface based on light source irradiation to detect the surface state of the processed object to be measured. A projection method, comprising: detecting a projection state such as a length, height, depth, etc. of a shadow formed by the step, and calculating a processed surface state of an object to be measured based on the detection result of the projection state Thus, the processed surface properties can be measured without bringing the sensor into contact with the processed surface.

Therefore, it is possible to accurately measure the machined surface state of various materials without damaging the machined surface properties of the various materials by the method for measuring the machined surface properties by the projection method described above.

Second, a shield is provided with a certain gap from the processed surface of the object to be measured, and a light source for contrasting the shadow of the shield is provided behind the object to image a desired shadow on the surface of the object to be measured. Can be measured.

Third, the projection state such as the length, height, and depth of the shadow formed by the contrast means is detected by the imaging means, and the processed surface state of the object to be measured is calculated based on the detection result of the imaging means. Thus, the surface state of the processed surface can be detected in a non-contact manner.

Fourth, by interposing a condenser lens between the object to be measured and the imaging means, the projection state such as the length, height, depth, etc. of the shadow formed by the contrast means can be enlarged. The processed surface state of the measurement object can be calculated more accurately and measured accurately.

Fifth, in the case where the object to be measured is fed by the processing means of the processing machine, the processing surface of the object to be measured is configured to be exposed on the lower process side of the processing means, and the exposed processing surface In order to detect continuously, a contrast means for contrasting the shadow on the processing surface based on light source irradiation is provided, and the projection state such as the length, height, and depth of the shadow formed by the contrast means is detected, An object to be processed one after another in a production factory or the like by installing a measuring device for measuring the surface of the object to be processed by the projection method, which calculates the processed surface state of the object to be measured based on the detection result of the projection state Can be measured efficiently in the production process without damaging the machined surface properties.

According to the invention of claim 1, the means for detecting the surface state of the processed object to be measured is a projection method. Therefore, unlike the case of using a stylus as shown in Patent Document 1, it is possible to perform measurement without bringing the sensor into contact with the processing surface as in the case of the laser light shown in Patent Document 2. However, unlike the case of laser light, the shadow lines generated on the object to be measured are inhomogeneous such as wood and are clear even for porous materials, so that precise measurement can be performed.

And since it is a non-contact measurement, the to-be-measured object surface is not damaged. Therefore, it is possible to measure without damaging the processed surface properties of materials such as wood and paper whose surfaces are soft and inhomogeneous.

According to the second aspect of the present invention, the shield is provided with a certain gap from the processed surface of the object to be measured, and the light source for contrasting the shadow of the shield is provided behind the desired object on the processed surface of the object to be measured. The shadow can be imaged. Further, when a light source for contrasting the shadow on the processing surface of the object to be measured is provided at a free angle with respect to the surface of the object to be measured, the convenience is further increased, and the object to be measured, the processing machine, etc. It is possible to respond to the situation, etc., and is less affected by the measurement environment.

According to the invention of claim 3, the projection state such as the length, height, and depth of the shadow formed by the contrast means is detected by the image pickup means, and the processed surface of the object to be measured based on the detection result of the image pickup means The state can be calculated. The imaging means can use means such as analog, digital format, black and white, and color depending on the nature of the light source. By the arithmetic processing, the machined surface properties can be displayed in three dimensions in the length and width directions of the object to be measured, which is advantageous in evaluating the machined surface properties.

According to the invention of claim 4, the projection state such as the length, height, depth, etc. of the shadow formed by the contrast means is enlarged by interposing a condenser lens between the processing surface and the imaging means. Therefore, the machining surface state of the object to be measured can be calculated more precisely, and measurement can be performed with high accuracy even for an elaborate machining surface state.

According to the invention of claim 5, the object to be measured is fed by the processing means of the processing machine, and the processing surface of the object to be measured is exposed on the lower side of the processing step of the processing means, In order to continuously detect the exposed processed surface, a contrast means for contrasting the shadow on the processed surface based on light source irradiation is provided, and projection of the length, height, depth, etc. of the shadow formed by the contrast means is provided. The machined surface property is measured by installing a measurement device for the machined surface property by the projection method, which detects the state and calculates the machined surface state of the object to be measured based on the detection result of the projection state. Can be measured in the length and width directions. Accordingly, it is possible to continuously detect and evaluate the processed surface properties without stopping the processing means at the production site, which is advantageous for improving the productivity.

DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
FIG. 1 shows an outline of a measuring device for processing surface properties by the projection method. This measuring device includes a contrast means (1) for contrasting a shadow (8) on a surface (2) to be measured, and a space between the contrast means (1) and the surface (2) to be measured with a certain gap from the processing surface. A shield (3) provided on the imaging device, an imaging means (4) for detecting a projection state on the surface of the object to be measured, and provided between the surface of the object to be measured (2) and the imaging means (4) depending on conditions. And a condensing lens (6) that can be processed, and a processing device (5) that performs arithmetic processing on the detection result of the imaging means (4).
The contrast means (1) includes various light sources such as a white light lamp, and the imaging means (4) includes a digital camera, a video, etc. The arithmetic processing unit (5) has various arithmetic processing software, Arithmetic processing is performed.

In order to irradiate the light beam (7) by the contrast means (1), the object to be measured is irradiated with an angle (α) between the irradiated light beam (7) and the surface of the object to be measured (2). The shadow (8) of the shield (3) provided between the contrast means (1) and the surface of the object to be measured (2) is projected on the surface of the object to be measured (2) with a certain gap from the surface (2). After the projection state such as the length (9) and height (10) of the shadow (8) formed on the object to be measured is detected by the imaging means (4), the length of the shadow is calculated by the arithmetic processing unit (5). Calculate height, depth, etc.
If the angle (α) formed by the parallel light beam (7) and the surface of the object to be measured (2) is large, the height range that can be measured increases. If the angle (α) is small, the height range that can be measured decreases. Since the processing accuracy is improved, the measurement accuracy is improved.

FIG. 2 shows a projection curve in a state in which the processed surface property formed on the processed surface (2) of a heterogeneous porous material such as wood is detected by the imaging means (4) by the imaging means of the present invention. FIG. 3 shows a processed surface property obtained by irradiating a processed surface (2) of a non-homogeneous porous material such as wood with a laser beam as shown in Patent Document 2, as described above. The detected curve is shown.
By comparing FIG. 2 and FIG. 3, the projection curve of FIG. 2 showing the processed surface properties formed on the surface of the object to be measured (2) by the contrast means (1) irradiates the surface of the object to be measured. It is clear that the processing surface properties obtained by doing so are more elaborate than the curve of FIG.
Therefore, the measurement method according to the present invention is more precise than the conventional measurement method using a laser beam, and can accurately measure the surface roughness (surface roughness) regardless of the material to be measured.

In FIG. 4, the projection state such as the length and height of the shadow formed on the surface of the object to be measured (2) is detected by the imaging means (4), and the shadow length is calculated by the processing software of the processing unit (5). The result of calculating the height and the like is shown. This curve is a two-dimensional result showing the processed surface properties of one section of the object to be measured with respect to the length (9) and the height (10).

For convenience of explanation, the above description has been made in a state in which the processed surface property of the surface to be measured (2) is partially measured. However, the processed surface property is measured and displayed on the entire surface of the surface to be measured (2). For this purpose, the measurement object or the projection measurement means such as the shield / imaging means is moved by a target distance in the width direction of the measurement object, and irradiation / projection / imaging / calculation processing is performed in the same manner as described above. . By performing this operation many times, the length (9), height (10), etc. of the shadow (8) are calculated for the entire surface of the object to be measured. FIG. 5 shows the result of illustrating the processing surface properties such as the depth length (9) and the height (10) measured by using the shadow after the above operation with respect to the entire processing surface. The property of the surface of the object to be measured is displayed three-dimensionally. The calculation processing software in this measurement is capable of calculating / notifying properties / shapes such as length and height for the entire surface of the object to be measured.

6, 7 and 8 show the measurement positions shown in the claims and the measurement results. FIG. 6 shows an example of claim 5, which is driven via a rotary encoder (14) disposed on the lower side of the processing step of a processing machine equipped with a processing tool (12) for cutting the surface of wood. Above the conveyor (13), the light source (1), the shield (3), and the imaging means (4) are positioned at their respective positions, and the imaging means (4) is connected to an arithmetic processing unit (5) (not shown). If necessary, the condenser lens (6) is positioned. With this configuration, the workpiece surface (2) whose surface has been machined with the machining tool (12) is transferred to the lower side of the machining process of the processing machine and conveyed to the conveyor (13), while the conveyor (13) and the shielding body. When reaching the passage space with (3), the shadow (8) is projected on the surface of the object to be measured (2) upon receiving the irradiation from the light source (1), and the shadow is detected by the imaging means (4) and calculated. By performing arithmetic processing with the processing device (5), the surface (2) of the object to be measured can be measured continuously and accurately without contact.
FIG. 7 shows a three-dimensional representation of the large undulations (10) generated on the wood processing surface. From this figure, it is possible to easily understand the processed surface properties formed on the surface of the object to be measured (2), and it becomes a judgment material for correcting processing conditions and selecting products. In FIG. 8, the cutting marks (11) and the texture roughness (12) on the wood processing surface are displayed, and the fine roughness can be measured by this measuring method.

Therefore, the measuring method described in the present invention can accurately display the surface state of various materials such as wood, metal and plastic in terms of the length, height, width and the like. Further, the measurement speed is affected by the processing speed of the arithmetic processing program and the arithmetic equipment, but the processing properties of the entire processing surface can be displayed by this measuring method during the feed processing by the processing means of the processing machine. The processing machine can be applied to a surface shaving machine, a cutting machine, a surface processing machine, a lathe, a polishing machine, etc., and has applicability within the scope of the technical idea described in the present invention.

1 is a schematic perspective view of a measurement apparatus that enables measurement by showing an embodiment of the present invention. It is a projection curve which shows the processing surface property formed in the processing surface by the imaging means. It is a curve which shows the processed surface property obtained by irradiating a processed surface with a laser beam. It is the processed surface curve obtained after calculating the projection curve which shows the processed surface property formed in the processed surface. It is a three-dimensional display of machined surface properties. It is an illustration of a measurement position and is a schematic side view of the apparatus. It is a three-dimensional display of large undulations generated on the wood processing surface. The texture of the wood processing surface and the cutting marks are displayed.

Explanation of symbols

(1) Light source (2) Surface of object to be measured (3) Shield (4) Imaging means (5) Arithmetic processing device (6) Condensing lens (7) Parallel rays (8) Shadow (9) Length (10) Height (11) Width (12) Wood surface cutting tool (13) Conveyor (14) Rotary encoder (15) Waviness (16) Texture roughness (17) Cutting trace

Claims (5)

In order to detect the surface state of the processed object to be measured, a contrast means for contrasting the shadow on the processed surface based on light source irradiation is provided, and the length, height, depth, etc. of the shadow formed by the contrast means A method of measuring a machined surface property by a projection method, wherein a projection state is detected, and a processed surface state of an object to be measured is calculated based on a detection result of the projection state.   2. The method of measuring a processed surface property by a projection method according to claim 1, wherein a shield is provided with a certain gap from the processing surface of the object to be measured, and a light source for contrasting the shadow of the shield is provided behind the shield. .   A projection state such as the length, height, and depth of a shadow formed by the contrast unit is detected by the imaging unit, and a processed surface state of the object to be measured is calculated based on a detection result of the imaging unit. A method for measuring a surface finish by the projection method according to claim 1.   4. A method for measuring a processed surface property by a projection method according to claim 3, wherein a condenser lens is interposed between the processed surface and the imaging means. In the case where the object to be measured is fed by the processing means of the processing machine, the processing surface of the object to be measured is configured to be exposed on the lower side of the processing step of the processing means, and the exposed processing surface is continuously For the detection, a contrast means for contrasting the shadow on the processing surface based on the light source irradiation is provided, and the projection state such as the length, height, and depth of the shadow formed by the contrast means is detected, and the projection state An apparatus for measuring a machined surface property by a projection method, wherein a machined surface state of an object to be measured is calculated based on a detection result.

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