JP2003207535A - Printed circuit board inspection method and printed circuit board inspection device - Google Patents

Printed circuit board inspection method and printed circuit board inspection device

Info

Publication number
JP2003207535A
JP2003207535A JP2002008114A JP2002008114A JP2003207535A JP 2003207535 A JP2003207535 A JP 2003207535A JP 2002008114 A JP2002008114 A JP 2002008114A JP 2002008114 A JP2002008114 A JP 2002008114A JP 2003207535 A JP2003207535 A JP 2003207535A
Authority
JP
Japan
Prior art keywords
wiring
circuit board
printed circuit
terminal
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002008114A
Other languages
Japanese (ja)
Other versions
JP3603850B2 (en
Inventor
Yoshiyuki Fukami
美行 深見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2002008114A priority Critical patent/JP3603850B2/en
Publication of JP2003207535A publication Critical patent/JP2003207535A/en
Application granted granted Critical
Publication of JP3603850B2 publication Critical patent/JP3603850B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a printed circuit board inspection method capable of preventing wrong determination. <P>SOLUTION: When a disconnection on wiring 7 is produced near a back terminal 4 of the wiring 7 for connecting electrically the front and the back of the printed circuit board 5, the disconnection can not be detected hitherto, because a measuring needle 15 can not be brought into contact with the back terminal 4. On this account, a metal stage 19 is connected to the back terminal 4. When inspecting the wiring 7, the measuring needle 15 is brought into contact with a surface terminal 3 of the wiring 7. When the disconnection on the wiring 7 is generated near the back terminal 4, the electric capacity to be measured is approximately equal to a combined electric capacity of an electric capacity C3 and an electric capacity C4, but is smaller than an expected value as much as an electric capacity C5 between the stage 19 and a counter electrode 11, and hereby generation of the disconnection can be detected. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明はプリント基板検査方
法及びプリント基板検査装置に関し、特にプリント基板
に設けられた配線の良否を判定するプリント基板検査方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a printed circuit board inspection method and a printed circuit board inspection apparatus, and more particularly to a printed circuit board inspection method for determining the quality of wiring provided on a printed circuit board.

【0002】[0002]

【従来の技術】プリント配線基板を検査する方法とし
て、被検査配線とそれに対向する電極間に発生する電気
容量の大小を利用し、被検査配線の良否判定をする電気
容量測定方法がある。
2. Description of the Related Art As a method of inspecting a printed wiring board, there is an electric capacity measuring method which judges the quality of the wiring to be inspected by utilizing the magnitude of the electric capacitance generated between the wiring to be inspected and an electrode facing it.

【0003】この電気容量測定方法を用いた従来のプリ
ント基板検査方法について図面を用いて説明する。図2
は従来のプリント基板検査装置の構成を示す図である。
図2において、従来のプリント基板検査方法により被検
査配線の良否判定を行うプリント基板検査装置は、電気
容量計10と、対向電極11と、良否判定部12と、良
否判定条件格納部13と、良否表示部14と、測定針1
5と、測定アーム16とを有している。
A conventional printed circuit board inspection method using this capacitance measuring method will be described with reference to the drawings. Figure 2
FIG. 6 is a diagram showing a configuration of a conventional printed circuit board inspection device.
In FIG. 2, a printed circuit board inspecting apparatus for determining acceptability of a wiring to be inspected by a conventional printed circuit board inspecting method includes a capacitance meter 10, a counter electrode 11, a acceptability determining unit 12, a acceptability determining condition storage unit 13, Good / bad display 14 and measuring needle 1
5 and a measuring arm 16.

【0004】対向電極11は、プリント基板5に対向し
て設置され、プリント基板5を十分に覆うことができる
大きさの金属板からなる。測定針15は測定アーム16
を介して電気容量計10に接続されており、対向電極1
1も電気容量計10に電気的に接続されている。
The counter electrode 11 is installed facing the printed circuit board 5 and is made of a metal plate having a size sufficient to cover the printed circuit board 5. Measuring needle 15 is measuring arm 16
Is connected to the capacitance meter 10 via the counter electrode 1
1 is also electrically connected to the capacitance meter 10.

【0005】被検査対象であるプリント基板5には、下
層配線20及び上層配線21から構成される電気配線6
と、下層配線22及び上層配線23から構成されプリン
ト基板5の表裏を電気的に繋ぐ電気配線7とが設けられ
ている。
On the printed circuit board 5 to be inspected, an electric wiring 6 composed of a lower layer wiring 20 and an upper layer wiring 21 is provided.
And an electric wiring 7 which is composed of a lower layer wiring 22 and an upper layer wiring 23 and electrically connects the front and back of the printed circuit board 5.

【0006】ここで、プリント基板5に設けられた電気
配線6の良否判定を行う場合、測定アーム16に取付け
られた測定針15をプリント基板5表面に位置する電気
配線6上の端子1または端子2に接触させる。そして、
電気配線6と対向して配置された対向電極11と電気配
線6間の電気容量を電気容量計10により測定する。
Here, when the quality of the electric wiring 6 provided on the printed circuit board 5 is determined, the measuring needle 15 attached to the measuring arm 16 is placed on the surface of the printed circuit board 5 as the terminal 1 or the terminal on the electric wiring 6. Contact 2. And
An electric capacitance between the counter electrode 11 arranged to face the electric wiring 6 and the electric wiring 6 is measured by the electric capacitance meter 10.

【0007】その後、良否判定部12が、電気容量計1
0により測定された電気容量値と、良否判定条件格納部
13に格納されている電気配線6と対向電極11間の理
論的な電気容量値(期待値)とを比較して、電気配線6
の良否を判定する。良否判定部12は、期待値より測定
値が小である場合に断線不良と判定して、この判定結果
を良否表示部14に表示させる。
After that, the pass / fail judgment unit 12 causes the capacitance meter 1 to
The electrical capacitance value measured by 0 is compared with the theoretical electrical capacitance value (expected value) between the electrical wiring 6 and the counter electrode 11 stored in the quality determination condition storage unit 13, and the electrical wiring 6 is compared.
The quality of is judged. When the measured value is smaller than the expected value, the quality determination unit 12 determines that the disconnection is defective, and displays the determination result on the quality display unit 14.

【0008】電気配線6に断線不良が発生していない場
合、端子1または端子2に測定針15を接触させると、
電気容量計10により測定される電気容量は、いずれ
も、電気配線6を構成する下層配線20と対向電極11
間の電気容量C1と、電気配線6を構成する上層配線2
1と対向電極11間の電気容量C2との合成電気容量と
なる。これは期待値と等しいので、良否判定部12は、
電気配線6を良品と判定する。
If the measuring wire 15 is brought into contact with the terminal 1 or the terminal 2 when the disconnection failure does not occur in the electric wiring 6,
Each of the electric capacities measured by the electric capacity meter 10 is the lower layer wiring 20 and the counter electrode 11 which constitute the electric wiring 6.
The electric capacity C1 between them and the upper layer wiring 2 which constitutes the electric wiring 6
1 and a capacitance C2 between the counter electrode 11 and a combined capacitance. Since this is equal to the expected value, the pass / fail judgment unit 12
The electric wiring 6 is determined to be non-defective.

【0009】一方、例えば下層配線20と上層配線21
間に断線不良があるときに、端子1に測定針15を接触
させた場合、下層配線20と対向電極11間の電気容量
C1のみが測定され、また、端子2に測定針15を接触
させた場合、上層配線21と対向電極11間の電気容量
C2のみが測定され、どちらの場合にも、期待値である
電気容量C1と電気容量C2との合成電気容量より小さ
くなるため、良否判定部12は、断線不良であることを
検出することができる。
On the other hand, for example, the lower layer wiring 20 and the upper layer wiring 21
When the measuring needle 15 is brought into contact with the terminal 1 when there is a disconnection defect, only the electric capacitance C1 between the lower layer wiring 20 and the counter electrode 11 is measured, and the measuring needle 15 is brought into contact with the terminal 2. In this case, only the electric capacitance C2 between the upper layer wiring 21 and the counter electrode 11 is measured, and in both cases, it is smaller than the combined electric capacitance of the electric capacitance C1 and the electric capacitance C2, which is the expected value, and therefore the pass / fail judgment unit 12 Can detect that the wire is defective.

【0010】また、プリント基板5に設けられた電気配
線7の良否判定を行う場合、測定アーム16に取付けら
れた測定針15をプリント基板5表面に位置する電気配
線7上の端子3に接触させる。そして、電気配線7と対
向して配置された対向電極11と電気配線7間の電気容
量を電気容量計10により測定する。
When the quality of the electric wiring 7 provided on the printed board 5 is determined, the measuring needle 15 attached to the measuring arm 16 is brought into contact with the terminal 3 on the electric wiring 7 located on the surface of the printed board 5. . Then, the electric capacitance between the counter electrode 11 arranged to face the electric wiring 7 and the electric wiring 7 is measured by the electric capacitance meter 10.

【0011】電気配線7に断線不良が発生していない場
合、端子3に測定針15を接触させると、電気容量計1
0により測定される電気容量は、電気配線7を構成する
下層配線22と対向電極11間の電気容量C3と、電気
配線7を構成する上層配線23と対向電極11間の電気
容量C4との合成電気容量となる。これは良否判定条件
格納部13に格納されている期待値(電気配線7と対向
電極11間の理論的な電気容量)と等しいので、良否判
定部12は、電気配線7を良品と判定する。
When the electric wire 7 has no disconnection defect, the measuring needle 15 is brought into contact with the terminal 3 and the electric capacitance meter 1
The electric capacitance measured by 0 is a combination of the electric capacitance C3 between the lower layer wiring 22 and the counter electrode 11 forming the electric wiring 7 and the electric capacitance C4 between the upper layer wiring 23 and the counter electrode 11 forming the electric wiring 7. It becomes electric capacity. Since this is equal to the expected value (theoretical electric capacity between the electrical wiring 7 and the counter electrode 11) stored in the quality determination condition storage unit 13, the quality determination unit 12 determines that the electrical wiring 7 is a good product.

【0012】一方、例えば下層配線22と上層配線23
間に断線不良があるときに、端子3に測定針15を接触
させた場合、上層配線23と対向電極11間の電気容量
C4のみが測定され、期待値である電気容量C3と電気
容量C4との合成電気容量より小さくなるため、良否判
定部12は、断線不良であることを検出することができ
る。
On the other hand, for example, the lower layer wiring 22 and the upper layer wiring 23
When the measuring needle 15 is brought into contact with the terminal 3 when there is a disconnection defect between them, only the electric capacitance C4 between the upper wiring 23 and the counter electrode 11 is measured, and the expected electric capacitances C3 and C4 are obtained. Since the combined capacitance is smaller than the combined capacitance of No. 3, the pass / fail judgment unit 12 can detect a disconnection defect.

【0013】[0013]

【発明が解決しようとする課題】このような従来のプリ
ント基板検査方法では、プリント基板5の表裏に渡る電
気配線7の良否判定をなす場合、上述したように、測定
針15をプリント基板5表面上の端子3に接触させて電
気容量を測定することはできる。しかし、図2には示さ
れていないが、通常、検査のためにプリント基板5を支
持するステージが設置されるので、プリント基板5裏面
に位置する電気配線7上の裏面コネクタピン4(端子)
に測定針15を接触させることができず、裏面コネクタ
ピン4からの電気容量の測定を行うことはできない。
In such a conventional printed circuit board inspection method, when the quality of the electric wiring 7 extending from the front to the back of the printed circuit board 5 is determined, the measuring needle 15 is placed on the surface of the printed circuit board 5 as described above. The capacitance can be measured by contacting the upper terminal 3. However, although not shown in FIG. 2, since a stage for supporting the printed circuit board 5 is usually installed for inspection, the rear surface connector pin 4 (terminal) on the electric wiring 7 located on the rear surface of the printed circuit board 5 is installed.
The measuring needle 15 cannot be brought into contact with, and the capacitance from the rear surface connector pin 4 cannot be measured.

【0014】そのため、電気配線7に内在する断線箇所
が裏面コネクタピン4に非常に近い部位において発生し
ている場合、測定針15を端子3に接触させることによ
り測定される電気配線7と対向電極11間の電気容量
は、電気容量C3と電気容量C4との合成電気容量にほ
ぼ等しくなって期待値と殆ど差異がなくなり、期待値の
良品範囲内となってしまうため、良否判定部12は、断
線不良があるにも関わらず誤って電気配線7を良品と判
断してしまうという問題があった。
Therefore, when a disconnection portion existing in the electric wiring 7 occurs in a portion very close to the back surface connector pin 4, the electric wiring 7 and the counter electrode which are measured by bringing the measuring needle 15 into contact with the terminal 3 The capacitance between 11 is almost equal to the combined capacitance of the capacitance C3 and the capacitance C4, and there is almost no difference from the expected value, which is within the non-defective range of the expected value. There is a problem that the electric wiring 7 is mistakenly judged as a good product in spite of the disconnection defect.

【0015】また、電気配線6についても、一方の端子
に測定針15を接触させて測定を行うのみでは、端子1
または端子2に非常に近い部位において断線が発生して
いるにも関わらず、電気配線6を良品と判断してしまう
ことがあるので、他方の端子にも測定針15を接触させ
て測定を行わなければならない。すなわち、電気配線6
の両端各々から測定を行わなければ、良否判定を確実に
行うことができなかった。
As for the electrical wiring 6, the terminal 1 is only required to be measured by bringing the measuring needle 15 into contact with one terminal.
Alternatively, the electric wire 6 may be determined to be a good product even if a disconnection occurs in a portion very close to the terminal 2, and therefore the measurement needle 15 is also brought into contact with the other terminal to perform the measurement. There must be. That is, the electrical wiring 6
If the measurement was not performed from both ends of each of the above, it was not possible to reliably determine the quality.

【0016】本発明の第1の目的は、プリント基板に設
けられた配線上の両端子各々から測定を行うことなく良
否判定を確実に行うことができるプリント基板検査方法
及びプリント基板検査装置を提供することである。
A first object of the present invention is to provide a printed circuit board inspecting method and a printed circuit board inspecting apparatus capable of surely making a pass / fail judgment without performing measurement from both terminals on a wiring provided on the printed circuit board. It is to be.

【0017】本発明の第2の目的は、プリント基板の表
裏を電気的に繋ぐ配線の良否判定を行う際の誤判定を防
止することができるプリント基板検査方法及びプリント
基板検査装置を提供することである。
A second object of the present invention is to provide a printed circuit board inspection method and a printed circuit board inspection device capable of preventing an erroneous judgment at the time of judging the quality of the wiring electrically connecting the front and back of the printed circuit board. Is.

【0018】[0018]

【課題を解決するための手段】本発明による第1のプリ
ント基板検査方法は、プリント基板に設けられた配線の
良否判定をなすプリント基板検査方法であって、プリン
ト基板に対向して対向電極を配置すると共に前記配線上
の端子に導体を接続しておき、前記導体が接続された前
記配線と前記対向電極との間の電気容量を測定し、この
測定された電気容量を基に前記良否判定をなすようにし
たことを特徴とする。
A first printed circuit board inspecting method according to the present invention is a printed circuit board inspecting method for determining the quality of wiring provided on a printed circuit board. A conductor is connected to a terminal on the wiring while being arranged, the electric capacitance between the wiring to which the conductor is connected and the counter electrode is measured, and the pass / fail judgment is made based on the measured electric capacitance. It is characterized by doing so.

【0019】また、前記第1のプリント基板検査方法に
おいて、前記配線は前記プリント基板の表裏に渡る配線
であり、前記導体は前記プリント基板の裏面に位置する
前記配線上の端子に接続されることを特徴とする。
In the first printed circuit board inspection method, the wiring is a wiring extending over the front and back surfaces of the printed circuit board, and the conductor is connected to terminals on the wiring located on the back surface of the printed circuit board. Is characterized by.

【0020】本発明による第2のプリント基板検査方法
は、プリント基板に設けられた配線と電気的に接続する
ための測定針と、前記プリント基板に対向して配置され
る対向電極とを用いて前記配線の良否判定をなすプリン
ト基板検査方法であって、前記配線上の端子に導体を接
続しておき、前記測定針を前記配線に接触させ前記導体
が接続された前記配線と前記対向電極との間の電気容量
を測定し、この測定された電気容量を基に前記良否判定
をなすようにしたことを特徴とする。
A second printed circuit board inspection method according to the present invention uses a measuring needle for electrically connecting to a wiring provided on the printed circuit board and a counter electrode arranged to face the printed circuit board. A printed circuit board inspection method for determining the quality of the wiring, wherein a conductor is connected to a terminal on the wiring, the measuring needle is brought into contact with the wiring, and the wiring and the counter electrode to which the conductor is connected. It is characterized in that the electric capacity between the two is measured, and the quality judgment is performed based on the measured electric capacity.

【0021】また、前記第2のプリント基板検査方法に
おいて、前記導体は前記配線上の一方の端子に接続さ
れ、前記測定針は前記配線上の他方の端子に接触される
ことを特徴とする。
Further, in the second printed circuit board inspection method, the conductor is connected to one terminal on the wiring, and the measuring needle is in contact with the other terminal on the wiring.

【0022】また、前記第2のプリント基板検査方法に
おいて、前記配線は前記プリント基板の表裏に渡る配線
であり、前記配線上の一方の端子は前記プリント基板の
裏面に位置する端子であり、前記配線上の他方の端子は
前記プリント基板の表面に位置する端子であることを特
徴とする。
Further, in the second printed circuit board inspection method, the wiring is a wiring extending over the front and back of the printed circuit board, and one terminal on the wiring is a terminal located on the back surface of the printed circuit board. The other terminal on the wiring is a terminal located on the surface of the printed circuit board.

【0023】また、前記第1及び第2のプリント基板検
査方法において、前記導体として前記プリント基板を支
持するステージを用いることを特徴とする。
Further, in the first and second printed circuit board inspection methods, a stage for supporting the printed circuit board is used as the conductor.

【0024】また、前記第1及び第2のプリント基板検
査方法において、前記測定された電気容量と、前記導体
が接続された前記配線と前記対向電極との間の理論的な
電気容量と、を比較して前記良否判定をなすことを特徴
とする。
In the first and second printed circuit board inspection methods, the measured electric capacity and the theoretical electric capacity between the wiring to which the conductor is connected and the counter electrode are set. It is characterized in that the quality judgment is made by comparison.

【0025】本発明によるプリント基板検査装置は、プ
リント基板に設けられた配線の良否判定をなすプリント
基板検査装置であって、前記配線上の端子には導体が接
続されており、前記プリント基板に対向して配置される
対向電極と、測定針と、この測定針が前記配線に接触さ
れることにより前記導体が接続された前記配線と前記対
向電極との間の電気容量を測定する電気容量測定手段
と、前記電気容量測定手段により測定された前記電気容
量を基に前記良否判定をなす良否判定手段とを含むこと
を特徴とする。
The printed circuit board inspection device according to the present invention is a printed circuit board inspection device for determining the quality of wiring provided on a printed circuit board, wherein a conductor is connected to a terminal on the wiring and the printed circuit board is connected to the printed circuit board. Capacitance measurement for measuring the capacitance between the counter electrode and the counter electrode, which are arranged to face each other, the measurement needle, and the measurement needle contacting the wiring to connect the conductor to the wiring and the counter electrode. Means and a quality determination means for performing the quality determination based on the electric capacity measured by the electric capacity measuring means.

【0026】また、前記プリント基板検査装置におい
て、前記導体は前記配線上の一方の端子に接続され、前
記測定針は前記配線上の他方の端子に接触されることを
特徴とする。
In the printed circuit board inspection apparatus, the conductor is connected to one terminal on the wiring, and the measuring needle is in contact with the other terminal on the wiring.

【0027】また、前記プリント基板検査装置におい
て、前記配線は前記プリント基板の表裏に渡る配線であ
り、前記配線上の一方の端子は前記プリント基板の裏面
に位置する端子であり、前記配線上の他方の端子は前記
プリント基板の表面に位置する端子であることを特徴と
する。
Further, in the printed circuit board inspection device, the wiring is a wiring extending over the front and back surfaces of the printed circuit board, and one terminal on the wiring is a terminal located on the back surface of the printed circuit board, and on the wiring. The other terminal is a terminal located on the surface of the printed circuit board.

【0028】また、前記プリント基板検査装置におい
て、前記プリント基板を支持するステージを含み、この
ステージが前記導体として用いられることを特徴とす
る。
Further, the printed circuit board inspection apparatus includes a stage for supporting the printed circuit board, and the stage is used as the conductor.

【0029】また、前記プリント基板検査装置におい
て、前記良否判定手段は、前記測定された電気容量と、
前記導体が接続された前記配線と前記対向電極との間の
理論的な電気容量と、を比較して前記良否判定をなすこ
とを特徴とする。
In the printed circuit board inspecting device, the quality determining means may include the measured capacitance and
It is characterized in that the quality judgment is performed by comparing the theoretical capacitance between the wiring to which the conductor is connected and the counter electrode.

【0030】本発明の作用は次の通りである。被検査対
象である配線上の端子に導体を接続しておくことによ
り、この導体が接続された配線と対向電極との間の電気
容量を測定するようにする。そして、この測定された電
気容量を基に被検査対象の配線の良否判定を行う。これ
により、従来では、被検査対象である配線上の両端子か
らそれぞれ測定を行わなければ良否判定を確実に行うこ
とができなかったが、本発明では、導体が接続された端
子からの測定を行うことなく良否判定を確実に行うこと
が可能となる。
The operation of the present invention is as follows. By connecting a conductor to the terminal on the wiring to be inspected, the electric capacitance between the wiring to which the conductor is connected and the counter electrode is measured. Then, the quality of the wiring to be inspected is determined based on the measured electric capacity. As a result, in the past, it was not possible to reliably perform the pass / fail judgment without performing measurement from both terminals on the wiring to be inspected, but in the present invention, the measurement from the terminal to which the conductor is connected can be performed. It becomes possible to reliably perform the pass / fail determination without performing the determination.

【0031】また、被検査対象の配線がプリント基板の
表裏に渡る配線である場合、被検査対象の配線上の端子
に接続される導体は、プリント基板の裏面に位置する端
子(裏面端子)に接続しておくことにより、裏面端子か
らの測定を行うことなく良否判定を確実に行うことがで
き、裏面端子からの測定を行うことができないことによ
る誤判定を防止することができる。
When the wiring to be inspected is a wiring extending to the front and back of the printed circuit board, the conductors connected to the terminals on the wiring to be inspected are terminals located on the back surface of the printed circuit board (back surface terminals). By connecting, it is possible to surely perform the pass / fail determination without performing the measurement from the back surface terminal, and it is possible to prevent the erroneous determination due to the inability to perform the measurement from the back surface terminal.

【0032】[0032]

【発明の実施の形態】以下に、本発明の実施例について
図面を用いて説明する。図1は本発明の実施例によるプ
リント基板検査装置の構成を示す図であり、図2と同等
部分は同一符号にて示している。図1において、本発明
の実施例によるプリント基板検査方法を用いて被検査配
線の良否判定を行うプリント基板検査装置は、電気容量
計10と、対向電極11と、良否判定部12と、良否判
定条件格納部13と、良否表示部14と、測定針15
と、測定アーム16とを有しており、さらに、金属製ス
テージ19を有している。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a configuration of a printed circuit board inspection apparatus according to an embodiment of the present invention, and the same portions as those in FIG. In FIG. 1, a printed circuit board inspecting apparatus for determining the quality of a wiring to be inspected by using a printed circuit board inspecting method according to an embodiment of the present invention includes an electric capacitance meter 10, a counter electrode 11, a quality determination unit 12, and a quality determination. The condition storage unit 13, the pass / fail display unit 14, and the measuring needle 15
And a measurement arm 16, and further has a metal stage 19.

【0033】金属製ステージ19は、検査のためにプリ
ント基板5を支持するものであり、プリント基板5の裏
面コネクタピン4に接続される。また、良否判定条件格
納部13に格納されている期待値のうち、良否判定部1
2において電気配線7の検査により測定される電気容量
値と比較される期待値は、図2に示した従来例では電気
容量C3と電気容量C4との合成電気容量(電気配線7
と対向電極11間の理論的な電気容量)であったが、本
実施例では電気容量C3と電気容量C4と電気容量C5
(金属製ステージ19と対向電極11間の電気容量)と
の合成電気容量(金属製ステージ19が接続された電気
配線7と対向電極11間の理論的な電気容量)である。
The metal stage 19 supports the printed circuit board 5 for inspection, and is connected to the back surface connector pins 4 of the printed circuit board 5. Further, among the expected values stored in the quality determination condition storage unit 13, the quality determination unit 1
The expected value compared with the electric capacitance value measured by the inspection of the electric wiring 7 in 2 is the combined electric capacity of the electric capacity C3 and the electric capacity C4 in the conventional example shown in FIG.
The theoretical capacitance between the counter electrode 11 and the counter electrode 11), but in the present embodiment, the capacitance C3, the capacitance C4, and the capacitance C5.
(Electrical capacitance between metal stage 19 and counter electrode 11) and combined electrical capacitance (theoretical electrical capacitance between electrical wiring 7 to which metal stage 19 is connected and counter electrode 11).

【0034】このような構成の本発明の実施例によるプ
リント基板検査装置において、プリント基板5の表裏を
接続するような電気配線7の断線不良を検査する場合、
まず、測定アーム16に取り付けられた測定針15を電
気配線7に属する端子3に接触させ、金属製ステージ1
9が接続された電気配線7と対向電極11間の電気容量
を電気容量計10により測定する。
In the printed circuit board inspecting apparatus according to the embodiment of the present invention having such a configuration, when inspecting the electric wiring 7 for connecting the front and back of the printed circuit board 5 for disconnection defects,
First, the measuring needle 15 attached to the measuring arm 16 is brought into contact with the terminal 3 belonging to the electric wiring 7, and the metal stage 1
The electric capacitance between the electric wiring 7 to which 9 is connected and the counter electrode 11 is measured by the electric capacitance meter 10.

【0035】そして、この電気容量計10により測定さ
れた値と良否判定条件格納部13に格納されている期待
値(金属製ステージ19が接続された電気配線7と対向
電極11間の理論的な電気容量)とを良否判定部12に
て比較し、期待値より測定値の方が小さい場合を断線不
良として良否表示部14にて良否結果を表示する。
The value measured by the capacitance meter 10 and the expected value stored in the quality determination condition storage unit 13 (theoretical between the electric wiring 7 connected to the metal stage 19 and the counter electrode 11) (Electric capacity) is compared by the quality determination unit 12, and if the measured value is smaller than the expected value, it is regarded as a disconnection defect and the quality display unit 14 displays the quality result.

【0036】電気配線7の検査の際、電気配線7に属す
る裏面コネクタピン4は金属製ステージ19に接続され
ているので、端子3と裏面コネクタピン4間が正常に導
通し断線不良がない場合は、電気容量計10は、下層配
線22と対向電極11間の電気容量C3と、上層配線2
3と対向電極11間の電気容量C4と、金属製ステージ
19と対向電極11間の電気容量C5との合成電気容量
を測定することができる。これは期待値と等しいので、
良否判定部12は、電気配線7を良品と判定する。
When the electric wiring 7 is inspected, the rear surface connector pins 4 belonging to the electric wiring 7 are connected to the metal stage 19, so that the terminals 3 and the rear surface connector pins 4 are normally electrically connected and there is no disconnection defect. The electric capacitance meter 10 includes an electric capacitance C3 between the lower layer wiring 22 and the counter electrode 11 and an upper layer wiring 2
It is possible to measure a combined capacitance of the capacitance C4 between the electrode 3 and the counter electrode 11 and the capacitance C5 between the metal stage 19 and the counter electrode 11. This is equal to the expected value, so
The quality determination unit 12 determines that the electrical wiring 7 is a good product.

【0037】一方、電気配線7に内在する断線箇所が裏
面コネクタピン4に非常に近い部位において発生してい
る場合、電気配線7は金属製ステージ19と導通してい
ないので、電気容量計10は、下層配線22と対向電極
11間の電気容量C3と、上層配線23と対向電極11
間の電気容量C4との合成電気容量にほぼ等しい電気容
量値を測定する。
On the other hand, when a disconnection portion existing in the electric wiring 7 occurs at a portion very close to the back surface connector pin 4, the electric wiring 7 is not electrically connected to the metal stage 19, so that the electric capacitance meter 10 , The electric capacitance C3 between the lower layer wiring 22 and the counter electrode 11, and the upper layer wiring 23 and the counter electrode 11
A capacitance value that is approximately equal to the combined capacitance with the capacitance C4 between is measured.

【0038】このとき図2に示した従来例では電気配線
7を良品と誤判定してしまうが、本実施例では、上述し
たように、裏面コネクタピン4を介して電気配線7と金
属製ステージ19とを接続して、金属製ステージ19が
接続された電気配線7と対向電極11間の電気容量を測
定するようにすることにより、良否判定の基準である期
待値を金属製ステージ19が接続された電気配線7と対
向電極11間の理論的な電気容量とすることができるの
で、裏面コネクタピン4に非常に近い部位に断線箇所が
発生している場合の測定値は期待値より小さい値とな
る。
At this time, in the conventional example shown in FIG. 2, the electric wiring 7 is erroneously determined as a non-defective product, but in the present embodiment, as described above, the electric wiring 7 and the metal stage are connected via the back surface connector pin 4. 19 is connected to measure the electric capacitance between the electric wiring 7 to which the metal stage 19 is connected and the counter electrode 11, so that the metal stage 19 connects the expected value, which is the criterion for the quality judgment. Since the theoretical electric capacity between the electric wiring 7 and the counter electrode 11 can be set, the measured value when the disconnection point is generated at a position very close to the back surface connector pin 4 is smaller than the expected value. Becomes

【0039】よって、裏面コネクタピン4に測定針15
を接触させて測定を行うことなく、良否判定部12は、
裏面コネクタピン4に非常に近い部位に発生した断線不
良も検出することができる。
Therefore, the measuring needle 15 is attached to the backside connector pin 4.
The quality determination unit 12 makes contact with the
It is also possible to detect a disconnection defect that has occurred in a portion very close to the back surface connector pin 4.

【0040】なお、金属製ステージ19として面積が十
分に大きなものを用いれば、良否判定部12において電
気配線7の検査により測定される電気容量値と比較され
る期待値を大きくすることができるので、裏面コネクタ
ピン4に非常に近い部位に発生した断線不良の検出をよ
り確実に行うことができる。
If a metal stage 19 having a sufficiently large area is used, the expected value compared with the electric capacitance value measured by the inspection of the electric wiring 7 in the pass / fail judgment section 12 can be increased. Therefore, it is possible to more reliably detect a disconnection defect that has occurred in a portion very close to the back surface connector pin 4.

【0041】また、本実施例では、裏面コネクタピン4
に接続される導体として金属製ステージ19を使用して
いるが、これは、通常、検査のためにステージを使用す
ることを考慮して、この通常使用されるステージを金属
製として裏面コネクタピン4に接続するようにしたもの
である。したがって、裏面コネクタピン4に接続される
導体は、金属製ステージ19に限定されるものではな
く、ステージを用いてプリント基板5を支持する場合で
あっても、このステージとは別に導体を用意して、これ
を裏面コネクタピン4に接続するようにしてもよい。
Further, in this embodiment, the rear surface connector pin 4 is used.
A metal stage 19 is used as a conductor connected to the backside connector pin 4 which is usually made of metal in consideration of using the stage for inspection. It is intended to connect to. Therefore, the conductor connected to the back surface connector pin 4 is not limited to the metal stage 19, and even when the printed circuit board 5 is supported using the stage, a conductor is prepared separately from this stage. Then, this may be connected to the back surface connector pin 4.

【0042】また、本実施例では、裏面コネクタピン4
が1つである場合を示したが、複数である場合、すなわ
ち、プリント基板5の表裏を電気的に繋ぐ配線7が複数
である場合でも、上記の動作を各配線7に個別に行うこ
とにより、同様の効果を実現することができることは勿
論である。なお、この場合、全ての裏面コネクタピン4
が金属製ステージ19に接続される。また、上述したよ
うにステージとは別の導体を接続する場合、全ての裏面
コネクタピン4を一の導体に接続するようにしてもよい
し、各裏面コネクタピン4毎に別々の導体を接続するよ
うにしてもよい。
Further, in this embodiment, the back surface connector pin 4 is used.
However, even if there is a plurality of wirings 7, that is, even if there are a plurality of wirings 7 that electrically connect the front and back of the printed circuit board 5, by performing the above operation individually for each wiring 7. Of course, the same effect can be realized. In this case, all the backside connector pins 4
Is connected to the metal stage 19. Further, as described above, when connecting a conductor different from the stage, all the back surface connector pins 4 may be connected to one conductor, or a separate conductor may be connected to each back surface connector pin 4. You may do it.

【0043】また、本実施例では、プリント基板5の表
裏を電気的に繋ぐ配線7上の裏面コネクタピン4に導体
を接続する場合について説明したが、これ以外の配線
(配線6)に導体を接続してもよい。すなわち、配線6
上の端子1に導体を接続することにより、端子1の近傍
で断線不良が発生していても測定針15を端子2に接触
させて検査を行うのみで、この断線不良を検出すること
が可能になる。同様に、配線6上の端子2に導体を接続
することにより、端子2の近傍で断線不良が発生してい
ても測定針15を端子1に接触させて検査を行うのみ
で、この断線不良を検出することが可能になる。
In this embodiment, the case where the conductor is connected to the back surface connector pin 4 on the wiring 7 that electrically connects the front and back of the printed circuit board 5 has been described, but the conductor is connected to the other wiring (wiring 6). You may connect. That is, the wiring 6
By connecting a conductor to the upper terminal 1, even if a disconnection defect occurs near the terminal 1, it is possible to detect this disconnection defect only by bringing the measuring needle 15 into contact with the terminal 2 for inspection. become. Similarly, by connecting a conductor to the terminal 2 on the wiring 6, even if a disconnection defect occurs in the vicinity of the terminal 2, it is only necessary to bring the measuring needle 15 into contact with the terminal 1 and perform an inspection. It becomes possible to detect.

【0044】このように、プリント基板に設けられた配
線上の一方の端子に導体を接続することにより、この一
方の端子からの検査を行うことなく他方の端子からの検
査を行うのみで、断線不良を確実に検出することができ
る。
As described above, by connecting the conductor to one terminal on the wiring provided on the printed circuit board, it is possible to perform the inspection from the other terminal without performing the inspection from the one terminal and disconnect the wire. It is possible to reliably detect defects.

【0045】[0045]

【発明の効果】本発明による第1の効果は、プリント基
板に設けられた配線上の両端子各々から測定を行うこと
なく良否判定を確実に行うことができることである。そ
の理由は、被検査対象である配線上の端子に導体を接続
しておくことにより、この導体が接続された配線と対向
電極との間の電気容量を測定し、この測定された電気容
量を基に被検査対象の配線の良否判定を行うようにして
いるためであり、これにより、従来では、被検査対象で
ある配線上の両端子からそれぞれ測定を行わなければ良
否判定を確実に行うことができなかったが、本発明で
は、導体が接続された端子からの測定を行うことなく良
否判定を確実に行うことが可能となる。
The first effect of the present invention is that the pass / fail judgment can be reliably performed without performing measurement from both terminals on the wiring provided on the printed circuit board. The reason is that by connecting a conductor to the terminal on the wiring to be inspected, the electric capacitance between the wiring to which this conductor is connected and the counter electrode is measured, and the measured electric capacitance is This is because the quality of the wiring to be inspected is determined on the basis of this, so that in the past, it is possible to reliably perform the quality determination unless measurement is performed from both terminals on the wiring to be inspected. However, in the present invention, it becomes possible to reliably perform the pass / fail judgment without performing the measurement from the terminal to which the conductor is connected.

【0046】本発明による第2の効果は、プリント基板
の表裏を電気的に繋ぐ配線の良否判定を行う際の誤判定
を防止することができることである。その理由は、被検
査対象の配線がプリント基板の表裏に渡る配線である場
合、被検査対象の配線上の端子に接続される導体は、プ
リント基板の裏面に位置する端子(裏面端子)に接続し
ておくためであり、これにより、裏面端子からの測定を
行うことなく良否判定を確実に行うことができ、裏面端
子からの測定を行うことができないことによる誤判定を
防止することができる。
The second effect of the present invention is that it is possible to prevent an erroneous determination when the quality of the wiring electrically connecting the front and back of the printed circuit board is determined. The reason is that if the wiring to be inspected is a wiring that goes to the front and back of the printed circuit board, the conductor connected to the terminal on the wiring to be inspected should be connected to the terminal (back side terminal) located on the back side of the printed circuit board. This is because it is possible to reliably perform the pass / fail determination without performing the measurement from the back surface terminal, and it is possible to prevent the erroneous determination due to the inability to perform the measurement from the back surface terminal.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例のプリント基板検査装置の構成
を示す図である。
FIG. 1 is a diagram showing a configuration of a printed circuit board inspection apparatus according to an embodiment of the present invention.

【図2】従来のプリント基板検査装置の構成を示す図で
ある。
FIG. 2 is a diagram showing a configuration of a conventional printed circuit board inspection device.

【符号の説明】[Explanation of symbols]

1,2,3 端子 4 裏面コネクタピン 5 プリント基板 6,7 配線 10 電気容量計 11 対向電極 12 良否判定部 13 良否判定条件格納部 14 良否表示部 15 測定針 16 測定アーム 19 金属製ステージ 20,22 下層配線 21,23 上層配線 1, 2, 3 terminals 4 Back side connector pin 5 printed circuit boards 6,7 wiring 10 capacitance meter 11 Counter electrode 12 Pass / fail judgment section 13 Pass / fail judgment condition storage section 14 Pass / fail display 15 Measuring needle 16 measuring arm 19 metal stage 20,22 Lower layer wiring 21,23 Upper layer wiring

Claims (12)

【特許請求の範囲】[Claims] 【請求項1】 プリント基板に設けられた配線の良否判
定をなすプリント基板検査方法であって、 プリント基板に対向して対向電極を配置すると共に前記
配線上の端子に導体を接続しておき、前記導体が接続さ
れた前記配線と前記対向電極との間の電気容量を測定
し、この測定された電気容量を基に前記良否判定をなす
ようにしたことを特徴とするプリント基板検査方法。
1. A printed circuit board inspection method for determining the quality of a wiring provided on a printed circuit board, wherein a counter electrode is arranged facing the printed circuit board, and a conductor is connected to a terminal on the wiring. A method of inspecting a printed circuit board, wherein an electric capacitance between the wiring to which the conductor is connected and the counter electrode is measured, and the quality judgment is performed based on the measured electric capacitance.
【請求項2】 前記配線は前記プリント基板の表裏に渡
る配線であり、前記導体は前記プリント基板の裏面に位
置する前記配線上の端子に接続されることを特徴とする
請求項1記載のプリント基板検査方法。
2. The print according to claim 1, wherein the wiring is a wiring extending to the front and back of the printed circuit board, and the conductor is connected to a terminal on the wiring located on the back surface of the printed circuit board. Substrate inspection method.
【請求項3】 プリント基板に設けられた配線と電気的
に接続するための測定針と、前記プリント基板に対向し
て配置される対向電極とを用いて前記配線の良否判定を
なすプリント基板検査方法であって、 前記配線上の端子に導体を接続しておき、前記測定針を
前記配線に接触させ前記導体が接続された前記配線と前
記対向電極との間の電気容量を測定し、この測定された
電気容量を基に前記良否判定をなすようにしたことを特
徴とするプリント基板検査方法。
3. A printed circuit board inspection for determining the quality of the wiring by using a measuring needle for electrically connecting to the wiring provided on the printed circuit board and a counter electrode arranged so as to face the printed circuit board. A method, wherein a conductor is connected to a terminal on the wiring, and the measuring needle is brought into contact with the wiring to measure the electric capacity between the wiring and the counter electrode to which the conductor is connected, A method of inspecting a printed circuit board, wherein the quality judgment is performed based on the measured electric capacity.
【請求項4】 前記導体は前記配線上の一方の端子に接
続され、前記測定針は前記配線上の他方の端子に接触さ
れることを特徴とする請求項3記載のプリント基板検査
方法。
4. The printed circuit board inspection method according to claim 3, wherein the conductor is connected to one terminal on the wiring, and the measuring needle is in contact with the other terminal on the wiring.
【請求項5】 前記配線は前記プリント基板の表裏に渡
る配線であり、前記配線上の一方の端子は前記プリント
基板の裏面に位置する端子であり、前記配線上の他方の
端子は前記プリント基板の表面に位置する端子であるこ
とを特徴とする請求項4記載のプリント基板検査方法。
5. The wiring is a wiring extending to the front and back of the printed circuit board, one terminal on the wiring is a terminal located on the back surface of the printed circuit board, and the other terminal on the wiring is the printed circuit board. The printed circuit board inspection method according to claim 4, wherein the terminal is located on the surface of the.
【請求項6】 前記導体として前記プリント基板を支持
するステージを用いることを特徴とする請求項2又は5
記載のプリント基板検査方法。
6. The stage according to claim 2, wherein a stage for supporting the printed circuit board is used as the conductor.
The printed circuit board inspection method described.
【請求項7】 前記測定された電気容量と、前記導体が
接続された前記配線と前記対向電極との間の理論的な電
気容量と、を比較して前記良否判定をなすことを特徴と
する請求項1〜6いずれか記載のプリント基板検査方
法。
7. The quality judgment is made by comparing the measured electric capacity with a theoretical electric capacity between the wiring connected to the conductor and the counter electrode. The printed circuit board inspection method according to claim 1.
【請求項8】 プリント基板に設けられた配線の良否判
定をなすプリント基板検査装置であって、 前記配線上の端子には導体が接続されており、 前記プリント基板に対向して配置される対向電極と、測
定針と、この測定針が前記配線に接触されることにより
前記導体が接続された前記配線と前記対向電極との間の
電気容量を測定する電気容量測定手段と、前記電気容量
測定手段により測定された前記電気容量を基に前記良否
判定をなす良否判定手段とを含むことを特徴とするプリ
ント基板検査装置。
8. A printed circuit board inspection device for determining the quality of a wiring provided on a printed circuit board, wherein a conductor is connected to a terminal on the wiring, and the counter is arranged to face the printed circuit board. An electrode, a measuring needle, an electric capacity measuring means for measuring an electric capacity between the counter electrode and the wiring to which the conductor is connected by contacting the measuring needle with the wiring, and the electric capacity measurement A printed circuit board inspecting device, comprising: a pass / fail determination means for performing the pass / fail determination based on the electric capacity measured by the means.
【請求項9】 前記導体は前記配線上の一方の端子に接
続され、前記測定針は前記配線上の他方の端子に接触さ
れることを特徴とする請求項8記載のプリント基板検査
装置。
9. The printed circuit board inspection device according to claim 8, wherein the conductor is connected to one terminal on the wiring, and the measuring needle is in contact with the other terminal on the wiring.
【請求項10】 前記配線は前記プリント基板の表裏に
渡る配線であり、前記配線上の一方の端子は前記プリン
ト基板の裏面に位置する端子であり、前記配線上の他方
の端子は前記プリント基板の表面に位置する端子である
ことを特徴とする請求項9記載のプリント基板検査装
置。
10. The wiring is wiring extending to the front and back of the printed circuit board, one terminal on the wiring is a terminal located on the back surface of the printed circuit board, and the other terminal on the wiring is the printed circuit board. The printed circuit board inspection device according to claim 9, wherein the printed circuit board inspection device is a terminal located on the surface of the substrate.
【請求項11】 前記プリント基板を支持するステージ
を含み、このステージが前記導体として用いられること
を特徴とする請求項10記載のプリント基板検査装置。
11. The printed circuit board inspection apparatus according to claim 10, further comprising a stage for supporting the printed circuit board, wherein the stage is used as the conductor.
【請求項12】 前記良否判定手段は、前記測定された
電気容量と、前記導体が接続された前記配線と前記対向
電極との間の理論的な電気容量と、を比較して前記良否
判定をなすことを特徴とする請求項8〜11いずれか記
載のプリント基板検査装置。
12. The quality judgment means compares the measured electric capacity with a theoretical electric capacity between the wiring to which the conductor is connected and the counter electrode to judge the quality. The printed circuit board inspection device according to claim 8, wherein the printed circuit board inspection device is provided.
JP2002008114A 2002-01-17 2002-01-17 Printed circuit board inspection method and printed circuit board inspection apparatus Expired - Lifetime JP3603850B2 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014112081A (en) * 2012-10-29 2014-06-19 Hioki Ee Corp Substrate inspecting device, and substrate inspecting method
JP2015004621A (en) * 2013-06-21 2015-01-08 株式会社日本マイクロニクス Device and method for inspecting wiring board
KR101530190B1 (en) * 2009-03-09 2015-06-19 (주)멜파스 Appratus and method for testing touch sensing panel

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62250375A (en) * 1986-04-24 1987-10-31 Hitachi Seiko Ltd Method for investigating inter-connection relation of electric network
JPH09113567A (en) * 1995-10-19 1997-05-02 Hioki Ee Corp Pattern short/open inspecting device for printed board
JPH10142271A (en) * 1996-11-12 1998-05-29 Hioki Ee Corp Measuring method for pattern electrostatic capacity of circuit board
JP2000206168A (en) * 1999-01-19 2000-07-28 Nippon Densan Riido Kk Apparatus and method for testing continuity of substrate

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62250375A (en) * 1986-04-24 1987-10-31 Hitachi Seiko Ltd Method for investigating inter-connection relation of electric network
JPH09113567A (en) * 1995-10-19 1997-05-02 Hioki Ee Corp Pattern short/open inspecting device for printed board
JPH10142271A (en) * 1996-11-12 1998-05-29 Hioki Ee Corp Measuring method for pattern electrostatic capacity of circuit board
JP2000206168A (en) * 1999-01-19 2000-07-28 Nippon Densan Riido Kk Apparatus and method for testing continuity of substrate

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101530190B1 (en) * 2009-03-09 2015-06-19 (주)멜파스 Appratus and method for testing touch sensing panel
JP2014112081A (en) * 2012-10-29 2014-06-19 Hioki Ee Corp Substrate inspecting device, and substrate inspecting method
JP2015004621A (en) * 2013-06-21 2015-01-08 株式会社日本マイクロニクス Device and method for inspecting wiring board
US9476934B2 (en) 2013-06-21 2016-10-25 Kabushiki Kaisha Nihon Micronics Inspection apparatus and inspection method for inspecting a wiring board

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