JP2001298235A - Electronic component mounting apparatus - Google Patents

Electronic component mounting apparatus

Info

Publication number
JP2001298235A
JP2001298235A JP2000080720A JP2000080720A JP2001298235A JP 2001298235 A JP2001298235 A JP 2001298235A JP 2000080720 A JP2000080720 A JP 2000080720A JP 2000080720 A JP2000080720 A JP 2000080720A JP 2001298235 A JP2001298235 A JP 2001298235A
Authority
JP
Japan
Prior art keywords
component
mounting
substrate
height
inclination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000080720A
Other languages
Japanese (ja)
Inventor
Takashi Yoshimura
隆 吉村
Koji Kawakatsu
浩司 川勝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2000080720A priority Critical patent/JP2001298235A/en
Publication of JP2001298235A publication Critical patent/JP2001298235A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To solve the problem of the conventional mounting means by chick components are mounted on the solder on a substrate before melting, hence the mounting height of the mounted components adhered to the substrate is not fixed because of the thickness variation of the adhering solder, the mounted components are tilted, the mounting height variation of the components or tilt between the mounted components exceeded an allowable range of the optical axis adjustment, and the light receiving surface height of the mounted components and the optical path are not aligned to result in the growth of an optical loss. SOLUTION: The surface of a mounted component 13 is aligned with an extension plane of the surface of a reference component 3 at a high accuracy. Thus, the mounting positional relation between the components can be accurately held to enable the high accuracy mounting for mounting optical modules, etc., irrespective of the thickness variation of solder 14, the mounting position failure of the reference component 3 and the distortion of the substrate 2.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電子部品、特に、
光モジュールを構成する複数の電子部品を一つの基板上
に搭載する搭載装置に関し、光学的損失を極小化できる
搭載装置に関するものである。
TECHNICAL FIELD The present invention relates to an electronic component, in particular,
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mounting device for mounting a plurality of electronic components constituting an optical module on one substrate, and to a mounting device capable of minimizing optical loss.

【0002】[0002]

【従来の技術】光モジュールを構成する複数の電子部品
を一つの基板上に搭載する、従来の搭載装置の構成を図
10、11を用いて説明する。
2. Description of the Related Art A configuration of a conventional mounting apparatus for mounting a plurality of electronic components constituting an optical module on one substrate will be described with reference to FIGS.

【0003】従来の搭載装置により得られる光モジュー
ルは、図11(a)の如く、基板102と、搭載を行う
搭載部品113と、基板102上に予め接合材料104
により搭載されている搭載済み部品103と、搭載部品
113と基板102を接合する為に必要な接合用半田1
14とから構成される。
As shown in FIG. 11A, an optical module obtained by a conventional mounting apparatus includes a substrate 102, a mounting component 113 for mounting, and a bonding material 104 on the substrate 102 in advance.
Mounted component 103 mounted by the above, and solder 1 necessary for bonding mounted component 113 to substrate 102
14.

【0004】一方、上記光モジュールを得るための従来
の搭載装置は、図10の如く、テープ状で供給される接
合用半田114を必要な長さに切り出す半田切り出し部
121と、切り出された半田を搭載基板上に供給する半
田供給部120と、部品を吸着するための機構を保持
し、搭載動作を行う搭載ヘッド130と、搭載動作時に
部品113と基板102の接触を感知する接触センサ1
31と、搭載ヘッド130をXYZ方向に動作させる搭
載ヘッド可動機構部132と、基板102を設置し、接
合用半田114を加熱する為のヒータを保持する搭載ス
テージ140から構成される。
On the other hand, as shown in FIG. 10, a conventional mounting device for obtaining the optical module includes a solder cutout portion 121 for cutting a joining solder 114 supplied in a tape shape to a required length, and a cutout solder 121. And a mounting head 130 that holds a mechanism for adsorbing components and performs a mounting operation, and a contact sensor 1 that detects contact between the components 113 and the substrate 102 during the mounting operation.
31, a mounting head moving mechanism 132 for operating the mounting head 130 in the XYZ directions, and a mounting stage 140 on which the substrate 102 is installed and which holds a heater for heating the bonding solder 114.

【0005】次に、搭載ヘッドの構造について図12を
用いて説明する。
Next, the structure of the mounting head will be described with reference to FIG.

【0006】搭載ヘッド部は部品を吸着する為の機構を
備えた搭載ヘッド130と、搭載ヘッド130を支える
アーム401から構成される。アーム部は接触センサ1
31を保持している。
The mounting head section includes a mounting head 130 having a mechanism for sucking components, and an arm 401 for supporting the mounting head 130. The arm is a contact sensor 1
31 is held.

【0007】通常、搭載ヘッド130と接触センサ13
1の間は、図12(a)の如く、隙間が無い状態である
が、搭載動作中は、図12(b)の如く、搭載ヘッド1
30が搭載部品113を基板102上の接合用半田11
4に押し付けることによって搭載ヘッド130が持ち上
げられ、接触センサ131との間に隙間が生じる。接触
センサ131はこの隙間を感知し、搭載部品113が接
合用半田114に接触したことを検出する。
Usually, the mounting head 130 and the contact sensor 13
1A, there is no gap as shown in FIG. 12A, but during the mounting operation, as shown in FIG.
Reference numeral 30 denotes a bonding solder 11 on the substrate 102 for mounting the component 113.
4, the mounting head 130 is lifted, and a gap is generated between the mounting head 130 and the contact sensor 131. The contact sensor 131 senses this gap and detects that the mounted component 113 has contacted the bonding solder 114.

【0008】以後、搭載ヘッド130と接触センサ13
1との間に隙間が生じ、搭載ヘッド130が物体に接触
を感知した状態をON状態と呼ぶ。また、搭載ヘッド1
30が下がり、接触センサ131との間に隙間がない状
態をOFF状態と呼ぶ。
Thereafter, the mounting head 130 and the contact sensor 13
A state in which a gap is generated between the mounting head 130 and the mounting head 130 sensing contact with an object is referred to as an ON state. The mounting head 1
A state in which 30 is lowered and there is no gap with the contact sensor 131 is called an OFF state.

【0009】次に、部品搭載動作について、同じく図1
3、14を用いて説明する。
Next, the component mounting operation will be described with reference to FIG.
This will be described with reference to FIGS.

【0010】まず、図13に示すように、予め接合用材
料104により接着された基準搭載部品103を搭載し
た基板102は、搭載動作開始時、搭載ステージ(図示
省略)上へ移載され、搭載部品113は搭載ヘッド13
0に吸着され保持される。
First, as shown in FIG. 13, a substrate 102 on which a reference mounting component 103 previously bonded by a bonding material 104 is mounted is transferred onto a mounting stage (not shown) at the start of the mounting operation, and is mounted. The component 113 is the mounting head 13
It is absorbed and held at 0.

【0011】ここで、図13の搭載動作説明の途中で、
搭載部品113と基板102を接合する為の接合用半田
114の供給動作を、図14に基づき説明しておく。
Here, during the description of the mounting operation in FIG.
The supply operation of the bonding solder 114 for bonding the mounting component 113 and the substrate 102 will be described with reference to FIG.

【0012】まず、テープ状で供給される接合用半田1
14を、半田切出し部121により必要な長さの分だけ
切り出し、半田供給部120により吸着し(図14
(a))、接合用半田114を吸着した半田供給部12
0が、基板102上の部品搭載位置へ接合用半田114
を供給する(図14(b))。
First, the bonding solder 1 supplied in a tape form
14 is cut out by a necessary length by the solder cut-out section 121 and is adsorbed by the solder supply section 120 (FIG. 14).
(A)), the solder supply unit 12 that has absorbed the bonding solder 114
0 is the bonding solder 114 to the component mounting position on the substrate 102
Is supplied (FIG. 14B).

【0013】次に、図13の搭載動作説明に戻って、搭
載部品113を吸着した搭載ヘッド130は接合用半田
114が位置する搭載位置上方へ移動し、搭載動作を開
始する。
Next, returning to the description of the mounting operation in FIG. 13, the mounting head 130 having sucked the mounting component 113 moves above the mounting position where the bonding solder 114 is located, and starts the mounting operation.

【0014】搭載位置上方から搭載ヘッド130を徐々
に下降し、接触センサ131が接触を感知し、ON状態
となる位置で下降を停止する。
The mounting head 130 is gradually lowered from above the mounting position, and the contact sensor 131 senses contact, and stops lowering at a position where it is turned ON.

【0015】次に、搭載ステージ(図示省略)が保持す
るヒータにより接合用半田114が融解するまで加熱す
る。接合用半田114が融解すると、搭載部品113を
吸着している搭載ヘッド130は自重により下がり、接
触センサ131はON状態からOFF状態となる。融解
確認後、ヒータによる加熱を停止し、接合用半田114
の硬化待ちを行う。
Next, heating is performed by a heater held by a mounting stage (not shown) until the bonding solder 114 is melted. When the bonding solder 114 is melted, the mounting head 130 that is holding the mounted component 113 is lowered by its own weight, and the contact sensor 131 is changed from the ON state to the OFF state. After the melting is confirmed, the heating by the heater is stopped, and the solder 114 for bonding is used.
Wait for curing.

【0016】半田が硬化したのを確認した後、搭載部品
113の吸着を解除し、搭載ヘッド130を上昇するこ
とで搭載動作を終了する。
After confirming that the solder has hardened, the mounting component 113 is released from suction and the mounting head 130 is lifted to complete the mounting operation.

【0017】また、別の例では、半田が融解することに
よりヘッドが自重で下がることを補正する為に、半田融
解後に搭載ヘッドを予め決定された高さだけ上昇させる
という動作を行い、位置決めを行っていた。
Further, in another example, in order to correct that the head is lowered by its own weight due to melting of the solder, an operation of raising the mounting head by a predetermined height after the melting of the solder is performed, and positioning is performed. I was going.

【0018】また、特開平7−22800号公報では、
基板面の傾きまたは凹凸の少なくとも一方をセンサ等で
検知する手段を有しており、搭載動作前に搭載を行う基
板面の傾きや凹凸の測定を行っている。この測定した結
果に基づき、搭載部品を実装する際の部品搭載高さを補
正し、搭載動作を行っている。
In Japanese Patent Application Laid-Open No. 7-22800,
The device has means for detecting at least one of the inclination and the unevenness of the substrate surface with a sensor or the like, and measures the inclination or the unevenness of the substrate surface to be mounted before the mounting operation. Based on the result of the measurement, the component mounting height when mounting the mounted component is corrected, and the mounting operation is performed.

【0019】[0019]

【発明が解決しようとする課題】しかし、図11に示す
通り、従来の搭載手段は搭載する部品を基板上に搭載す
る際に溶解前の半田上に搭載を行っている為、接合材料
104により基板102に接着された搭載済み部品10
3に対して、接合用半田114の厚さのバラツキにより
搭載部品113の搭載高さが一定とならず(図11
(a))、さらには、接合材料204により基板202
に接着された搭載済み部品203に対して、接合用半田
214により基板202に接着される搭載部品213が
傾いて搭載されることも発生しうる(図11(b))。
However, as shown in FIG. 11, the conventional mounting means mounts the component to be mounted on the solder before melting when mounting the component on the substrate. Mounted component 10 bonded to substrate 102
In contrast to FIG. 3, the mounting height of the mounting component 113 is not constant due to the variation in the thickness of the bonding solder 114 (FIG. 11).
(A)) Further, the substrate 202 is formed by the bonding material 204.
The mounted component 213 bonded to the substrate 202 by the bonding solder 214 may be mounted on the mounted component 203 bonded to the substrate 202 at an angle (FIG. 11B).

【0020】また、ティーチングされた搭載高さへ引き
上げる場合も、基板の厚さや反りのバラツキに影響さ
れ、搭載高さが一定にならないことが発生する。
Further, even when the mounting height is raised to the taught mounting height, the mounting height may not be constant due to variations in the thickness and warpage of the substrate.

【0021】このため、部品相互の位置関係を精度良く
保つ必要がある光モジュール部品等の搭載においては、
前記の様な搭載手段では搭載高さのバラツキや搭載部品
間の傾きが光軸調整の許容範囲を越えてしまい、搭載部
品の受光面高さと光路が一致しないことや、部品が傾い
て搭載されることによる光学的な損失が発生するという
問題があった。
For this reason, when mounting an optical module component or the like that needs to maintain the positional relationship between components with high accuracy,
In the mounting means as described above, the variation in mounting height and the inclination between the mounted components exceed the allowable range of the optical axis adjustment, the light receiving surface height of the mounted component does not match the optical path, or the component is mounted with a tilt. However, there is a problem that optical loss occurs due to this.

【0022】上記問題点を鑑み、本発明の目的は、光モ
ジュールを構成する複数の電子部品を一つの基板上に搭
載する電子部品の搭載装置において、一つの基板上の複
数の電子部品の位置関係を高精度に制御して、光学的損
失を極小化できる電子部品の搭載装置を提供することに
ある。
In view of the above problems, an object of the present invention is to provide an electronic component mounting apparatus for mounting a plurality of electronic components constituting an optical module on a single board, and to position the plurality of electronic components on a single board. It is an object of the present invention to provide an electronic component mounting apparatus capable of minimizing optical loss by controlling the relationship with high precision.

【0023】[0023]

【課題を解決するための手段】本発明の第1の電子部品
の搭載装置は、他の部品の基準となる基準部品が搭載さ
れた基板と、前記基板を搭載したステージと、前記基準
部品の表面の前記基板表面に対する傾斜を求める傾斜計
測機構と、前記傾斜を基に、前記他の部品を前記基板上
に載置して、前記基準部品の表面の延長面に前記他の部
品の表面を合わせる搭載ヘッド可動機構部とを備えるこ
とを特徴とし、前記基準部品及び前記他の部品は、光モ
ジュールを構成する部品であって、前記基準部品はその
内部に前記基板の表面に概略平行して貫通する互いに異
なる少なくとも2つの光軸を有しており、前記傾斜計測
機構は、前記基準部品と前記基板との接着面内にあっ
て、前記少なくとも2つの光軸を挟んで斜めに相対する
2点における前記基準部品の表面の前記基板表面からの
高さを求める第1の高さ測定手段及び第2の高さ測定手
段と、前記第1の高さ測定手段及び前記第2の高さ測定
手段を制御する搭載制御部とから構成され、前記搭載制
御部は、前記第1の高さ測定手段及び前記第2の高さ測
定手段により求めた前記基準部品表面の前記相対する2
点における前記基板表面からの高さを基に、前記基準部
品表面の前記基板表面に対する傾き及び前記他の部品表
面の前記基板表面からの搭載高さを算出し、前記搭載ヘ
ッド可動機構部を構成する搭載ヘッドは、前記他の部品
の前記基板における搭載予定位置の上方に移動した時点
以降に、より望ましくは、前記他の部品の前記基板にお
ける搭載予定位置に移動した後に、前記搭載制御部によ
り算出された前記基準部品表面の前記基板表面に対する
傾き及び前記他の部品表面の前記基板表面からの搭載高
さを基に、前記他の部品の表面を前記基準部品の表面の
延長面に位置させる、というものである。
According to the first aspect of the present invention, there is provided a first electronic component mounting apparatus, comprising: a substrate on which a reference component serving as a reference for other components is mounted; a stage on which the substrate is mounted; A tilt measuring mechanism for obtaining a tilt of the surface with respect to the substrate surface, and based on the tilt, the other component is placed on the substrate, and the surface of the other component is extended on an extended surface of the surface of the reference component. Characterized in that the reference component and the other component are components constituting an optical module, and the reference component is provided inside the component substantially parallel to the surface of the substrate. The tilt measuring mechanism has at least two different optical axes that penetrate each other, and the tilt measuring mechanism is located in an adhesive surface between the reference component and the substrate, and is obliquely opposed to each other across the at least two optical axes. The group at the point A first height measuring unit and a second height measuring unit for calculating a height of the surface of the component from the substrate surface; and controlling the first height measuring unit and the second height measuring unit. And a mounting control unit, wherein the mounting control unit is configured to control the position of the reference component surface determined by the first height measuring unit and the second height measuring unit.
Based on the height from the substrate surface at a point, the inclination of the reference component surface with respect to the substrate surface and the mounting height of the other component surface from the substrate surface are calculated to constitute the mounting head movable mechanism. The mounting head, after moving to a position where the other component is to be mounted on the substrate, more preferably, after moving to the mounting position of the other component on the substrate, the mounting control unit Based on the calculated inclination of the reference component surface with respect to the substrate surface and the mounting height of the other component surface from the substrate surface, position the surface of the other component on an extension of the surface of the reference component. That is.

【0024】また、前記他の部品の表面の高さは、前記
光軸に直交し、かつ、前記他の部品を概略2分する平面
内における前記基板表面からの搭載高さに設定され、前
記搭載ヘッドは、前記基板に直交し、かつ、互いに直交
する2つの平面の、それぞれの平面内において回転可能
な機構を有する、という構成を採る。
Further, the height of the surface of the other component is set to a mounting height from the substrate surface in a plane orthogonal to the optical axis and approximately bisecting the other component. The mounting head adopts a configuration having a mechanism rotatable in each of two planes orthogonal to the substrate and orthogonal to each other.

【0025】次に、本発明の第2の電子部品の搭載装置
は、他の部品の基準となる基準部品が搭載された基板
と、前記基板を搭載したステージと、前記基準部品の表
面の前記基板表面に対する傾斜を求める傾斜計測機構
と、前記傾斜を基に、前記他の部品を前記基板上に載置
して、前記基準部品の表面の延長線上に前記他の部品の
表面を合わせる搭載ヘッド可動機構部とを少なくとも備
えることを特徴とし、前記基準部品及び前記他の部品
は、光モジュールを構成する部品であって、前記傾斜計
測機構は、前記基準部品表面の光軸上の異なる2点の前
記基板表面からの高さを求める第1の高さ測定手段及び
第2の高さ測定手段と、前記第1の高さ測定手段及び前
記第2の高さ測定手段を制御する搭載制御部とから構成
され、前記搭載制御部は、前記第1の高さ測定手段及び
前記第2の高さ測定手段により求めた前記基準部品表面
の光軸上の異なる2点の前記基板表面からの高さを基
に、前記基準部品表面の前記基板表面に対する傾き及び
前記他の部品表面の前記基板表面からの搭載高さを算出
し、前記搭載ヘッド可動機構部を構成する搭載ヘッド
は、前記他の部品の前記基板における搭載予定位置の上
方に移動した時点以降に、より望ましくは、前記他の部
品の前記基板における搭載予定位置に移動した後に、前
記搭載制御部により算出された前記基準部品表面の前記
基板表面に対する傾き及び前記他の部品表面の前記基板
表面からの搭載高さを基に、前記他の部品の表面を前記
基準部品の表面の延長線に位置させる、というものであ
る。
Next, a second electronic component mounting apparatus according to the present invention includes a substrate on which a reference component serving as a reference for other components is mounted, a stage on which the substrate is mounted, and a surface on the reference component. A tilt measuring mechanism for determining a tilt with respect to the substrate surface, and a mounting head for placing the other component on the substrate based on the tilt and aligning the surface of the other component on an extension of the surface of the reference component Wherein the reference component and the other component are components constituting an optical module, and the inclination measuring mechanism is provided with two different points on the optical axis of the surface of the reference component. A first height measuring means and a second height measuring means for obtaining a height from the substrate surface, and a mounting control unit for controlling the first height measuring means and the second height measuring means And the mounting control unit is Based on the heights of two different points on the optical axis of the reference component surface from the substrate surface determined by the first height measurement means and the second height measurement means, Calculate the mounting height of the mounting head movable mechanism from the inclination of the substrate surface and the mounting height of the other component surface from the substrate surface, above the mounting position of the other component on the substrate. After the movement, more preferably, after moving to the mounting position of the other component on the board, the inclination of the reference component surface calculated by the mounting control unit with respect to the board surface and the other component surface The surface of the other component is positioned on an extension of the surface of the reference component based on the mounting height from the substrate surface.

【0026】上記本発明の第1、2の電子部品の搭載装
置において、前記搭載ヘッドは、前記他の部品を吸着し
た後、前記他の部品を前記基板における搭載予定位置に
載置する動作を有し、かつ、前記基板の表面を構成する
構成体への前記他の部品の接触状態を感知する接触セン
サを具備し、前記他の部品を吸着した前記搭載ヘッド
は、前記基板の前記他の部品搭載予定位置の上方に移動
して、そこから前記基板の表面に向かって下降し、前記
他の部品が前記構成体と接触していないときは、前記搭
載ヘッドと前記接触センサとは互いに接する接触状態で
あり、前記他の部品が前記構成体と接触したときに、前
記搭載ヘッドと前記接触センサとが離間する非接触状態
となり、前記搭載制御部が前記接触状態から前記非接触
状態に変化したときを感知して、前記搭載ヘッドの動き
を停止し、前記搭載ヘッドは、前記搭載ヘッドの動きを
停止した後、前記搭載制御部により算出された前記基準
部品表面の前記基板表面に対する傾き及び前記他の部品
表面の前記基板表面からの搭載高さを基に、前記基板上
の前記構成体が溶融している間に、前記他の部品の表面
を前記基準部品の表面の延長上に位置させ、前記溶融し
た構成体を固化させることにより前記他の部品を前記基
板上に固定する、というものである。また、前記構成体
は、高温で溶融する導電物である。
In the first and second electronic component mounting apparatuses of the present invention, the mounting head picks up the other component and then mounts the other component at a mounting position on the substrate. Having a contact sensor for sensing a contact state of the other component with a component constituting a surface of the substrate, wherein the mounting head that has absorbed the other component includes the other component of the substrate. The mounting head and the contact sensor come into contact with each other when the component moves above the component mounting position and descends toward the surface of the substrate from there, and the other component is not in contact with the component. In a contact state, when the other component comes into contact with the structure, the mounting head and the contact sensor are in a non-contact state in which they are separated from each other, and the mounting control unit changes from the contact state to the non-contact state. When Sensing, stopping the movement of the mounting head, and the mounting head, after stopping the movement of the mounting head, the inclination of the reference component surface calculated by the mounting control unit with respect to the substrate surface and the other Based on the mounting height of the component surface from the substrate surface, while the component on the substrate is being melted, position the surface of the other component on an extension of the surface of the reference component, The other component is fixed on the substrate by solidifying the melted structure. Further, the structure is a conductive material that melts at a high temperature.

【0027】最後に、上記本発明の第1、2の電子部品
の搭載装置において、前記搭載制御部は、前記基板の前
記ステージに対する平面位置及び前記基準部品、前記他
の部品の前記基板に対する平面位置を補正する平面位置
補正用機構を制御し、前記平面位置補正用機構は、平面
位置補正用画像処理装置及び前記平面位置補正用画像処
理装置により制御される平面位置補正用カメラからな
る、というものである。
Lastly, in the first and second electronic component mounting apparatuses of the present invention, the mounting control section includes a plane position of the substrate with respect to the stage, a reference component, and a plane of the other component with respect to the substrate. A planar position correcting mechanism for correcting a position is controlled, and the planar position correcting mechanism includes a planar position correcting image processing device and a planar position correcting camera controlled by the planar position correcting image processing device. Things.

【0028】[0028]

【発明の実施の形態】本発明の特徴は、搭載する部品と
既に搭載済みである部品との相互の位置関係を精度の高
いものとする為、既に搭載済みである部品上面の高さを
測定して搭載時の基準面とし、測定した基準面を基に搭
載する部品の表面を搭載済みである部品の表面の延長面
に位置するよう搭載動作を行う。搭載基準面が傾いてい
る場合には、その傾き角度を考慮し搭載部品を傾けて搭
載動作を行う。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The feature of the present invention is to measure the height of the upper surface of a component already mounted in order to make the positional relationship between the component to be mounted and the component already mounted highly accurate. Then, the mounting operation is performed such that the surface of the component to be mounted is positioned on an extension surface of the surface of the mounted component based on the measured reference surface. When the mounting reference plane is inclined, the mounting operation is performed by tilting the mounted component in consideration of the inclination angle.

【0029】この手段を使用することで、搭載部品と基
板を接合する為の半田厚による搭載高さのずれや搭載基
板の歪み、搭載部品の傾き等に関係無く部品の搭載動作
を行うことが可能となる。
By using this means, the component mounting operation can be performed irrespective of the displacement of the mounting height due to the solder thickness for joining the mounted component and the substrate, the distortion of the mounted substrate, the inclination of the mounted component, and the like. It becomes possible.

【0030】次に、本発明の実施形態について、図1、
図2を用いて説明する。図2の上部には、部品を搭載す
る基板を上から見た平面図を示し、下部には、その平面
図における光軸に沿って基板を切断したときの断面図を
示す。
Next, an embodiment of the present invention will be described with reference to FIG.
This will be described with reference to FIG. The upper part of FIG. 2 shows a plan view of the substrate on which the components are mounted, as viewed from above, and the lower part shows a cross-sectional view of the substrate taken along the optical axis in the plan view.

【0031】本実施形態は、図1に示すように、搭載を
行う部品を供給する部品供給部10と、部品の搬送・搭
載動作時に部品を吸着する機構を保持する搭載ヘッド3
0と、部品吸着動作時や搭載動作時に搭載ヘッド30と
部品の接触や部品と基板2との接触を感知する接触セン
サ31と、搭載動作の為に搭載ヘッド30をXYZ方向
及びXZ平面上における回転軸θ1、YZ平面上におけ
る回転軸θ2方向に動作させる為の搭載ヘッド可動機構
部32がある。
In the present embodiment, as shown in FIG. 1, a component supply unit 10 for supplying a component to be mounted and a mounting head 3 for holding a mechanism for sucking the component during a component transfer / mounting operation.
0, a contact sensor 31 for detecting contact between the mounting head 30 and the component or contact between the component and the board 2 during the component suction operation or the mounting operation, and the mounting head 30 in the XYZ direction and the XZ plane for the mounting operation. There is a mounting head movable mechanism 32 for operating in the direction of the rotation axis θ2 on the rotation axis θ1 and the YZ plane.

【0032】部品を搭載する基板2には、図2のよう
に、部品を搭載する際の基準として使用し、基板2にあ
らかじめ接合材料4により基板2に搭載されている基準
搭載部品3がある。
As shown in FIG. 2, the substrate 2 on which components are mounted has a reference mounting component 3 which is used as a reference when mounting components and is mounted on the substrate 2 in advance by the bonding material 4 on the substrate 2. .

【0033】また、図1に示すように、搭載する部品と
基板2を接合する為の接合用半田14の供給手段とし
て、搭載動作時に必要な長さに切り出す処理を行う半田
切出し部21と、切り出させた接合用半田14を基板2
に供給する半田供給部20があり、さらに、搭載動作を
行う際に基板2を設置する搭載ステージ40には、接合
用半田14を加熱する為の加熱ヒータが設けられてい
る。
As shown in FIG. 1, as means for supplying solder 14 for joining the components to be mounted and the board 2, a solder cutting section 21 for cutting a required length during the mounting operation is provided. The cut-out solder 14 is applied to the substrate 2
And a mounting stage 40 on which the substrate 2 is set when the mounting operation is performed, is provided with a heater for heating the bonding solder 14.

【0034】搭載動作を行う際の認識装置としては、搭
載部品と基板2のXY方向位置補正を行う為のXY補正
用カメラ50、XY補正用画像処理装置51と、基板2
上に搭載されている基準搭載部品3の部品搭載位置側の
上面高さを測定する為の高さ測定手段60と、基準部品
3の部品搭載位置から遠ざかる位置での上面高さを測定
する為の高さ測定手段61があり、さらに搭載動作全体
の制御を行う搭載動作制御部70から構成される。
A recognition device for performing the mounting operation includes an XY correction camera 50 and an XY correction image processing device 51 for correcting the positions of the mounted components and the substrate 2 in the X and Y directions.
Height measuring means 60 for measuring the upper surface height of the reference mounting component 3 mounted on the component mounting position side, and measuring the upper surface height at a position away from the component mounting position of the reference component 3 And a mounting operation control unit 70 for controlling the entire mounting operation.

【0035】接合用半田14の供給についての動作は従
来例と同様である。
The operation for supplying the bonding solder 14 is the same as in the conventional example.

【0036】しかし、搭載ヘッドの構造に関しては、図
3に示すように、θ1及びθ2方向の傾き補正を行う
為、搭載ヘッドがそれぞれθ1、θ2方向に回転可動す
ることが可能とするための搭載ヘッド可動機構部θ1軸
321及び搭載ヘッド可動機構部θ2軸322が搭載ヘ
ッド可動機構部32に備えられている。
However, regarding the structure of the mounting head, as shown in FIG. 3, in order to correct the inclination in the θ1 and θ2 directions, the mounting head is required to be rotatable in the θ1 and θ2 directions. The mounting head movable mechanism 32 has a head movable mechanism θ1 axis 321 and a mounting head movable mechanism θ2 axis 322.

【0037】次に、本実施形態の動作について、図4、
5を参照して説明する。最初に、搭載に必要な部材の供
給動作手順について説明する。
Next, the operation of this embodiment will be described with reference to FIGS.
This will be described with reference to FIG. First, a description will be given of a supply operation procedure of members required for mounting.

【0038】まず、図4に示すように、搭載部品13を
部品供給部10へ供給し、又、基板2を搭載ステージ4
0上へ供給する。接合用半田14の供給動作は図11で
示すような従来例と同様であり、接合用半田14を半田
切出し部21により必要な長さだけ切り出し、接合用半
田14を半田供給部20により基板2上の搭載部品13
の搭載位置へ供給する。接合用半田14を供給する基板
2にはあらかじめ基準搭載部品3が搭載されている。
First, as shown in FIG. 4, the mounting component 13 is supplied to the component supply unit 10, and the substrate 2 is mounted on the mounting stage 4.
0. The supplying operation of the joining solder 14 is the same as that of the conventional example as shown in FIG. 11. The joining solder 14 is cut out by a necessary length by the solder cutting section 21, and the joining solder 14 is Top mounted components 13
To the mounting position. The reference mounting component 3 is mounted on the substrate 2 for supplying the bonding solder 14 in advance.

【0039】次に、搭載部品13の取出し動作手順につ
いて図1、4を参照して説明する。
Next, a procedure for taking out the mounted component 13 will be described with reference to FIGS.

【0040】まず、図1で示した搭載動作制御部70
は、搭載ヘッド可動機構部32を制御し、搭載ヘッド3
0を部品供給部10の上方へ移動して、搭載部品13を
搭載ヘッド30に吸着する動作を行う。
First, the mounting operation control unit 70 shown in FIG.
Controls the mounting head movable mechanism 32, and controls the mounting head 3
0 is moved above the component supply unit 10 to perform an operation of attracting the mounted component 13 to the mounting head 30.

【0041】即ち、搭載ヘッド30を下降させ、搭載ヘ
ッド30と搭載部品13が接触し、接触センサ31がO
N状態となる高さで停止させる。
That is, the mounting head 30 is lowered, the mounting head 30 comes into contact with the mounting component 13, and the contact sensor 31
It stops at the height which becomes N state.

【0042】停止後、搭載ヘッド30が保持する吸着ノ
ズルにより搭載部品13を吸着後、搭載ヘッド30を上
昇させる(図4(a))。
After the stop, the mounting component 13 is sucked by the suction nozzle held by the mounting head 30, and then the mounting head 30 is raised (FIG. 4A).

【0043】次に、基板と搭載部品13の搭載位置補正
動作手順について図2を参照して説明する。
Next, the procedure for correcting the mounting position of the board and the mounted component 13 will be described with reference to FIG.

【0044】図2で示すように、搭載ステージ40に供
給された基板2をXY位置補正用カメラ50で撮像し、
XY位置補正用画像処理装置51においてXY方向の補
正移動量を算出する。基板2にはあらかじめXY位置合
わせ用の位置合わせマークA及び位置合わせマークBが
記されており、この位置合わせマークによりXY方向の
位置補正を行う。なお、基板2上にあらかじめ搭載され
ている基準搭載部品3も搭載部品13と同様にXY方向
の位置補正を行い、目標とする位置に精度良く搭載され
ている。
As shown in FIG. 2, the substrate 2 supplied to the mounting stage 40 is imaged by the XY position correcting camera 50,
The XY position correction image processing device 51 calculates a correction movement amount in the XY directions. An alignment mark A and an alignment mark B for XY alignment are written on the substrate 2 in advance, and the XY directions are corrected by using the alignment marks. It should be noted that the reference mounting component 3 mounted in advance on the substrate 2 performs position correction in the X and Y directions similarly to the mounting component 13, and is mounted at a target position with high accuracy.

【0045】次に、基準部品3の高さ測定動作手順につ
いて図2、6を用いて説明する。
Next, the procedure for measuring the height of the reference component 3 will be described with reference to FIGS.

【0046】図2に示すように、基板2上にあらかじめ
搭載されている基準搭載部品3における2つの光軸1、
光軸2を基準搭載部品3と基板2との接触面内で斜交い
に挟む2点を選択し、それぞれの点における基準搭載部
品3の上面の基板2表面からの高さを高さ測定手段60
と高さ測定手段61とで測定する。高さ測定手段60に
より上面高さを測定する位置は、搭載位置に近い方から
高さ測定点1、高さ測定点2とし、それぞれにおける測
定高さをh1、h2とする。
As shown in FIG. 2, two optical axes 1 and 2 of a reference mounting component 3 mounted on a substrate 2 in advance.
Two points sandwiching the optical axis 2 obliquely in the contact surface between the reference mounting component 3 and the substrate 2 are selected, and the height of the upper surface of the reference mounting component 3 from the surface of the substrate 2 at each point is measured. Means 60
And the height measuring means 61. The positions at which the upper surface height is measured by the height measuring means 60 are height measurement point 1 and height measurement point 2 from the side closer to the mounting position, and the measurement heights at these positions are h1 and h2.

【0047】この実施形態では、基準搭載部品3を貫通
する光軸を2本として説明したが、3本以上の光軸が基
準搭載部品3を貫通する場合においても、本実施形態を
適用することは可能であり、その場合は、複数本の光軸
を基準搭載部品3と基板2との接触面内で斜交いに挟む
2点を選択すれば良いことになる。
In this embodiment, the description has been made on the assumption that the number of optical axes passing through the reference mounting component 3 is two. However, the present embodiment is applicable to a case where three or more optical axes pass through the reference mounting component 3. Is possible. In this case, it is only necessary to select two points that obliquely sandwich a plurality of optical axes in the contact surface between the reference mounting component 3 and the substrate 2.

【0048】高さ測定点1と高さ測定点2のX軸方向の
距離をL1とし、Y軸方向の距離をL2とし、高さ測定
点1から搭載部品13を搭載する搭載位置までのX軸方
向の距離をL3とすると、基準部品3の上面のXZ平面
上における傾きθ1およびYZ平面上における傾きθ2
と、搭載部品13の搭載すべき高さhは、次式より求め
られる。 θ1=ATAN((h1−h2)/L1) θ2=ATAN((h1−h2)/L2) h=h1+L3*TANθ1 として算出し、決定する。
The distance between the height measurement point 1 and the height measurement point 2 in the X-axis direction is L1, the distance in the Y-axis direction is L2, and the distance X from the height measurement point 1 to the mounting position on which the mounting component 13 is mounted. Assuming that the axial distance is L3, the inclination θ1 of the upper surface of the reference component 3 on the XZ plane and the inclination θ2 of the upper surface of the reference component 3 on the YZ plane
And the height h at which the mounting component 13 is to be mounted is determined by the following equation. θ1 = ATAN ((h1−h2) / L1) θ2 = ATAN ((h1−h2) / L2) h = h1 + L3 * TANθ1

【0049】次に、搭載部品13の搭載動作手順につい
て図4〜6を用いて説明する。
Next, a procedure for mounting the mounting component 13 will be described with reference to FIGS.

【0050】搭載ヘッド30に搭載部品13を吸着した
後、搭載ヘッド30を基板2のXY方向搭載位置上方へ
移動させる(図4(b))。この搭載位置はXY補正用
画像処理装置51において算出された補正移動量を反映
した位置である。
After the mounting component 13 is attracted to the mounting head 30, the mounting head 30 is moved above the mounting position of the substrate 2 in the X and Y directions (FIG. 4B). This mounting position is a position reflecting the correction movement amount calculated by the XY correction image processing device 51.

【0051】次に、この位置において搭載ヘッド30を
徐々に下降させ、吸着した搭載部品13と基板2が接触
し、アーム301に固定された接触センサ31がON状
態となる高さで搭載ヘッド30の下降を停止する(図5
(a))。
Next, at this position, the mounting head 30 is gradually lowered, and the mounting component 13 sucked and the substrate 2 come into contact with each other, and the mounting head 30 is at a height at which the contact sensor 31 fixed to the arm 301 is turned on. Stop descending (Fig. 5
(A)).

【0052】次に、搭載ヘッド30の下降停止後、搭載
ステージ40が保持する加熱用ヒータにより接合用半田
14の加熱を開始する。加熱時間はあらかじめ半田の溶
ける時間を決定しておき、その時間を使用する。半田は
加熱されることにより融解する為、搭載部品13を吸着
している搭載ヘッド30の位置は自重により下がり、接
触センサ31は再度搭載ヘッド30と接触してOFF状
態となる。この状態から、まず、予め高さ測定手段6
0、61により測定した結果より求められた搭載傾きθ
1、θ2だけ搭載ヘッド可動機構部32により搭載ヘッ
ド30を傾ける。
Next, after the mounting head 30 stops descending, the heating of the bonding solder 14 is started by the heating heater held by the mounting stage 40. As the heating time, the time for melting the solder is determined in advance, and that time is used. Since the solder is melted by being heated, the position of the mounting head 30 holding the mounted component 13 is lowered by its own weight, and the contact sensor 31 comes into contact with the mounting head 30 again to be in the OFF state. From this state, first, the height measuring means 6
Mounting inclination θ obtained from the results measured by 0 and 61
The mounting head 30 is tilted by the mounting head moving mechanism 32 by 1, θ2.

【0053】この場合、搭載ヘッド30を基板2のXY
方向搭載位置上方へ移動させた(図4(b))直後に、
高さ測定手段60、61により測定した結果より求めら
れた搭載傾きθ1、θ2だけ搭載ヘッド可動機構部32
により搭載ヘッド30を傾ける、という動作も本発明の
実施形態の一適用例として可能であるが、搭載ヘッド3
0の下降動作以降の搭載ヘッド30の機械的なずれを考
慮すると、本実施形態のように、最終的な搭載位置に最
も近い位置での傾きの調整の方が搭載部品13のより高
精度な搭載を可能とする。
In this case, the mounting head 30 is mounted on the XY
Immediately after being moved upward in the direction mounting position (FIG. 4B),
The mounting head movable mechanism 32 by the mounting inclinations θ1 and θ2 obtained from the results measured by the height measuring means 60 and 61.
The operation of inclining the mounting head 30 by the mounting head 3 is also possible as an application example of the embodiment of the present invention.
In consideration of the mechanical displacement of the mounting head 30 after the lowering operation of 0, the adjustment of the inclination at the position closest to the final mounting position is more accurate than the mounting component 13 as in the present embodiment. Enable mounting.

【0054】さらに、搭載部品13の表面の基板2表面
からの高さが、予め高さ測定手段60、61により測定
した結果より求められた搭載高さhとなるように、搭載
ヘッド30を上昇、或いは、下降させる(図5
(c))。
Further, the mounting head 30 is raised so that the height of the surface of the mounting component 13 from the surface of the substrate 2 becomes the mounting height h obtained from the result measured by the height measuring means 60 and 61 in advance. Or lower it (Fig. 5
(C)).

【0055】加熱時間経過後、この接触センサがOFF
状態となっていることを確認し、搭載ヘッド30を基準
面測定により求められた基準高さhの位置まで移動させ
て、高さを決定する。
After the elapse of the heating time, the contact sensor is turned off.
After confirming the state, the mounting head 30 is moved to the position of the reference height h obtained by the reference plane measurement, and the height is determined.

【0056】この位置で搭載ステージ40の保持する加
熱用ヒータをOFFし、接合用半田の硬化待ちを行う。
硬化待ち時間はあらかじめ半田が硬化する時間を決定し
ておき、その時間を使用する(図5(c))。
At this position, the heating heater held by the mounting stage 40 is turned off, and the curing of the joining solder is waited.
As the hardening waiting time, a time for hardening the solder is determined in advance, and that time is used (FIG. 5C).

【0057】硬化時間経過後、搭載ヘッド30による搭
載部品13の吸着を解除し、搭載ヘッド30を上昇さ
せ、搭載動作を終了する。
After the curing time has elapsed, the suction of the mounting component 13 by the mounting head 30 is released, the mounting head 30 is raised, and the mounting operation is completed.

【0058】以上のように、搭載部品13の表面を基準
搭載部品3の表面の延長面に位置させることにより、図
6、7に示すような、搭載部品13及び基準搭載部品3
それぞれにおける光軸1及び光軸2の高精度な一致を実
現することが可能となる。
As described above, by positioning the surface of the mounted component 13 on an extension of the surface of the reference mounted component 3, the mounting component 13 and the reference mounted component 3 as shown in FIGS.
It is possible to realize highly accurate matching of the optical axis 1 and the optical axis 2 in each case.

【0059】上述の如く、本発明の第1の実施形態の電
子部品の搭載装置を用いれば、半田厚のバラツキ(図6
(a))や、基準搭載部品の搭載位置不良および搭載す
る基板の歪み(図6(b))による表面の傾斜に左右さ
れることなく、搭載部品相互の位置関係を高精度に保持
することが可能となる。これにより、光モジュール等の
搭載においては、部品相互の搭載位置関係を精度良く保
つことが出来、精度の高い搭載が可能となる。
As described above, if the electronic component mounting apparatus according to the first embodiment of the present invention is used, the variation in solder thickness (FIG. 6)
(A)) and maintaining the positional relationship between the mounted components with high accuracy without being affected by the inclination of the surface due to the defective mounting position of the reference mounted component and the distortion of the mounted substrate (FIG. 6B). Becomes possible. Thus, when mounting the optical module or the like, the mounting positional relationship between the components can be accurately maintained, and the mounting can be performed with high accuracy.

【0060】本発明の第1の実施形態においては、搭載
部品の表面を基準搭載部品の表面の延長面に位置させる
という、2次元の補正について述べたが、搭載部品の表
面を基準搭載部品の表面に1次元的に補正することも可
能である。
In the first embodiment of the present invention, the two-dimensional correction in which the surface of the mounted component is positioned on an extension of the surface of the reference mounted component has been described. It is also possible to perform one-dimensional correction on the surface.

【0061】この方法を本発明の第2の実施形態とし
て、図8〜10を参照して説明する。図8の上部には、
部品を搭載する基板を上から見た平面図を示し、下部に
は、その平面図における光軸に沿って基板を切断したと
きの断面図を示す。本実施形態においても搭載動作は、
搭載部品の搭載高さの算出が1次元的である以外は第1
の実施形態と全く同じであり、図1と同じ搭載機構に従
う。
This method will be described as a second embodiment of the present invention with reference to FIGS. At the top of FIG. 8,
A plan view of a board on which components are mounted is viewed from above, and a lower section is a cross-sectional view of the board taken along the optical axis in the plan view. Also in the present embodiment, the mounting operation is
The first except that the calculation of the mounting height of the mounted components is one-dimensional
The embodiment is completely the same as that of the first embodiment, and follows the same mounting mechanism as in FIG.

【0062】まず、部品を搭載する基板2には、図8の
ように、部品を搭載する際の基準として使用し、基板2
にあらかじめ接合材料4により基板2に搭載されている
基準搭載部品3がある。
First, as shown in FIG. 8, the board 2 on which the components are mounted is used as a reference for mounting the components.
There is a reference mounting component 3 previously mounted on the substrate 2 with the bonding material 4.

【0063】搭載ヘッドは、図9に示すように、θ1方
向のみの傾き補正を行う為、搭載ヘッドがθ1方向に回
転可動することを可能とするための搭載ヘッド可動機構
部θ軸421のみが搭載ヘッド可動機構部32に備えら
れており、θ1及びθ2方向の回転可動が可能な第1の
実施形態と異なるところである。
As shown in FIG. 9, since the mounting head performs tilt correction only in the θ1 direction, only the mounting head movable mechanism θ-axis 421 for enabling the mounting head to rotate in the θ1 direction. The third embodiment is different from the first embodiment in that the second embodiment is provided in the mounting head movable mechanism 32 and is rotatable in the θ1 and θ2 directions.

【0064】また、搭載部品13を搭載ヘッド30に吸
着してから搭載部品13を基板2の搭載位置上方にまで
移動し、そこから搭載ヘッド30を下降させて接合用半
田14に接触させ、接合用半田14を溶融して、搭載部
品13の表面を基準搭載部品3の表面の延長線上に位置
させる動作は、第1の実施形態と同じであるので詳細な
説明は省略する。
After the mounting component 13 is attracted to the mounting head 30, the mounting component 13 is moved to a position above the mounting position of the substrate 2, and the mounting head 30 is lowered from there to contact the solder 14 for bonding. The operation of melting the solder for use 14 and positioning the surface of the mounted component 13 on an extension of the surface of the reference mounted component 3 is the same as that of the first embodiment, and a detailed description thereof will be omitted.

【0065】ここでは、第2の実施形態における搭載部
品13の表面の高さhを算出する方法についてのみ述べ
る。
Here, only the method of calculating the height h of the surface of the mounted component 13 in the second embodiment will be described.

【0066】図8に示すように、基板2上にあらかじめ
搭載されている基準搭載部品3の光軸上の上面の高さを
高さ測定手段60と高さ測定手段61で測定する。高さ
測定手段60により上面高さを測定する位置は高さ測定
点1とし、基準搭載部品3の搭載部品13を搭載する位
置に近い側の上面高さを測定する。高さ測定手段61に
より上面高さを測定する位置は高さ測定点2とし、搭載
部品13を搭載する位置とは反対側の上面高さを測定す
る。
As shown in FIG. 8, the height of the upper surface on the optical axis of the reference mounting component 3 previously mounted on the substrate 2 is measured by the height measuring means 60 and the height measuring means 61. The position where the upper surface height is measured by the height measuring means 60 is the height measurement point 1, and the upper surface height on the side closer to the position where the mounting component 13 of the reference mounting component 3 is mounted is measured. The position where the upper surface height is measured by the height measuring means 61 is the height measurement point 2, and the upper surface height on the opposite side to the position where the mounting component 13 is mounted is measured.

【0067】図10に、基準搭載部品3の上面の傾きθ
1と搭載部品13の搭載高さhとを算出する手順を示
す。図10(a)は、基準搭載部品3の上面が基板2の
表面に対して概略平行な場合を示し、図10(b)は、
基準搭載部品3の上面が基板2の表面に対して傾いてい
る場合を示し、図10(c)は、基準搭載部品3の上面
が基板2の表面に対して傾いている場合において、基準
搭載部品3の上面の傾きθ1と搭載部品13の搭載高さ
hとを算出する方法を示すものである。
FIG. 10 shows the inclination θ of the upper surface of the reference mounting component 3.
1 shows a procedure for calculating the mounting height h of the mounting component 13. FIG. 10A shows a case where the upper surface of the reference mounting component 3 is substantially parallel to the surface of the substrate 2, and FIG.
FIG. 10C shows a case where the upper surface of the reference mounting component 3 is inclined with respect to the surface of the substrate 2, and FIG. This shows a method of calculating the inclination θ1 of the upper surface of the component 3 and the mounting height h of the mounted component 13.

【0068】図10(a)の場合には、搭載部品13の
表面が、基板表面に平行、かつ、基板表面からhの高さ
になるように搭載される。
In the case of FIG. 10A, the mounting component 13 is mounted so that the surface of the mounting component 13 is parallel to the substrate surface and at a height h from the substrate surface.

【0069】図10(b)の場合には、次のような方法
が採られる。即ち、図10(c)の如く、高さ測定点1
と高さ測定点2は、光軸に沿った上面位置の2点であ
り、高さ測定点1の位置で測定した高さをh1とし、高
さ測定点2の位置で測定した高さをh2とする。高さ測
定点1と高さ測定点2の距離をL1とし、高さ測定点1
から搭載部品13を搭載する搭載位置までの距離をL2
とする。
In the case of FIG. 10B, the following method is adopted. That is, as shown in FIG.
And height measurement point 2 are two points on the upper surface position along the optical axis. The height measured at the position of height measurement point 1 is h1, and the height measured at the position of height measurement point 2 is h1. h2. The distance between height measurement point 1 and height measurement point 2 is L1, and height measurement point 1
Is the distance from L2 to the mounting position where the mounting component 13 is mounted.
And

【0070】この測定した2点の高さh1、h2と測定
点間の距離L1と高さ測定点1と搭載位置までの距離L
2により、基準搭載部品3の上面の傾きθ1と搭載部品
13の搭載高さhは、 θ1=ATAN((h2−h1)/L1) h=h1−L2*TANθ1 として算出し、決定する。
The measured heights h1 and h2 of the two points, the distance L1 between the measurement points, and the distance L between the height measurement point 1 and the mounting position.
According to 2, the inclination θ1 of the upper surface of the reference mounting component 3 and the mounting height h of the mounting component 13 are calculated and determined as θ1 = ATAN ((h2−h1) / L1) h = h1−L2 * TANθ1.

【0071】上述の如く、第2の実施形態の電子部品の
搭載装置を用いれば、電子部品の特性が許容される範囲
において、第1の実施形態に比べて装置の簡略化、製造
プロセスの短縮、製造コストの低減等を図ることが可能
となる。
As described above, when the electronic component mounting apparatus of the second embodiment is used, the apparatus can be simplified and the manufacturing process can be shortened as compared with the first embodiment to the extent that the characteristics of the electronic component are permissible. In addition, it is possible to reduce the manufacturing cost.

【0072】[0072]

【発明の効果】以上のように、本発明の電子部品の搭載
装置を用いて、一つの基板上に複数の電子部品を搭載す
る場合、他の部品表面を基準部品表面の延長面に高精度
に位置させることにより、半田厚のバラツキや基準部品
の搭載位置不良および搭載する基板の歪みに左右される
ことなく、光モジュール等の搭載においては、部品相互
の搭載位置関係を精度良く保つことが出来、精度の高い
搭載が可能となる。
As described above, when a plurality of electronic components are mounted on one substrate by using the electronic component mounting apparatus of the present invention, the surface of the other component is highly precisely positioned on the extension surface of the reference component surface. In the mounting of optical modules, etc., the mounting position relationship between components can be accurately maintained without being affected by variations in solder thickness, defective mounting positions of the reference component, and distortion of the mounting substrate. It can be mounted with high accuracy.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施形態による電子部品の搭載
装置の構成を説明するブロック図である。
FIG. 1 is a block diagram illustrating a configuration of an electronic component mounting apparatus according to a first embodiment of the present invention.

【図2】本発明の第1の実施形態による電子部品の搭載
装置において、その動作の主要部分である電子部品表面
の基板からの高さを測定する方法を説明する図である。
FIG. 2 is a diagram illustrating a method of measuring a height of a surface of an electronic component from a substrate, which is a main part of the operation, in the electronic component mounting apparatus according to the first embodiment of the present invention.

【図3】本発明の第1の実施形態による電子部品の搭載
装置において、搭載ヘッド可動機構部θ1軸及び搭載ヘ
ッド可動機構部θ2軸を説明する図である。
FIG. 3 is a diagram illustrating a mounting head movable mechanism θ1 axis and a mounting head movable mechanism θ2 axis in the electronic component mounting apparatus according to the first embodiment of the present invention.

【図4】本発明の第1の実施形態による電子部品の搭載
装置において、電子部品を基板上に搭載する方法を、工
程順に示す図である。
FIG. 4 is a diagram illustrating a method of mounting an electronic component on a substrate in the electronic component mounting apparatus according to the first embodiment of the present invention in the order of steps.

【図5】図4に続く工程を示す図である。FIG. 5 is a view showing a step following the step shown in FIG. 4;

【図6】本発明の第1の実施形態による電子部品の搭載
装置により、搭載する電子部品の表面が基準搭載部品表
面の延長面に合致する様子を説明するための図である。
FIG. 6 is a view for explaining how the electronic component mounting apparatus according to the first embodiment of the present invention matches a surface of an electronic component to be mounted with an extension of a reference mounted component surface.

【図7】本発明の第1の実施形態による電子部品の搭載
装置により、搭載する電子部品の表面が基準搭載部品表
面の延長面に合致する様子を基準搭載部品表面の傾きに
注目して説明する図である。
FIG. 7 is a diagram illustrating a state in which the surface of an electronic component to be mounted coincides with an extension of the surface of the reference mounted component by the electronic component mounting apparatus according to the first embodiment of the present invention, focusing on the inclination of the surface of the reference mounted component; FIG.

【図8】本発明の第2の実施形態による電子部品の搭載
装置において、その動作の主要部分である電子部品表面
の基板からの高さを測定する方法を説明する図である。
FIG. 8 is a diagram illustrating a method of measuring a height of a surface of an electronic component from a substrate, which is a main part of the operation, in the electronic component mounting apparatus according to a second embodiment of the present invention.

【図9】本発明の第2の実施形態による電子部品の搭載
装置において、搭載ヘッド可動機構部θ1軸を説明する
図である。
FIG. 9 is a view for explaining a mounting head movable mechanism θ1 axis in the electronic component mounting apparatus according to the second embodiment of the present invention.

【図10】本発明の第2の実施形態による電子部品の搭
載装置において、搭載する電子部品の搭載高さ補正を説
明するための図である。
FIG. 10 is a diagram for explaining a mounting height correction of an electronic component to be mounted in an electronic component mounting apparatus according to a second embodiment of the present invention.

【図11】従来の電子部品の搭載装置の構成を説明する
ブロック図である。
FIG. 11 is a block diagram illustrating a configuration of a conventional electronic component mounting apparatus.

【図12】従来の電子部品の搭載装置により基板に搭載
される電子部品の不具合を説明する図である。
FIG. 12 is a diagram illustrating a defect of an electronic component mounted on a substrate by a conventional electronic component mounting apparatus.

【図13】電子部品を基板上に搭載するときの搭載ヘッ
ドの動作を説明する図である。
FIG. 13 is a diagram illustrating an operation of a mounting head when mounting an electronic component on a substrate.

【図14】電子部品を予め基準搭載部品の搭載された基
板上に搭載するときの搭載ヘッドの搭載動作を説明する
図である。
FIG. 14 is a diagram illustrating a mounting operation of a mounting head when mounting an electronic component on a substrate on which a reference mounting component is mounted in advance.

【図15】半田供給機構の半田供給処理を説明する図で
ある。
FIG. 15 is a diagram illustrating a solder supply process of the solder supply mechanism.

【符号の説明】[Explanation of symbols]

2、102、202 基板 3 基準搭載部品 4、104、204 接合材料 10、110 部品供給部 13、113、213 搭載部品 14、114、214 接合用半田 20、120 半田供給部 21、121 半田切出し部 30、130 搭載ヘッド 31、131 接触センサ 32、132 搭載ヘッド可動機構部 40、140 搭載ステージ 50 XY位置補正用カメラ 51 XY補正用画像処理装置 60、61 高さ測定手段 70、170 搭載動作制御部 103、203 搭載済み部品 301、401 アーム 321、421 搭載ヘッド可動機構部θ1軸 322 搭載ヘッド可動機構部θ2軸 2, 102, 202 Substrate 3 Reference mounting component 4, 104, 204 Bonding material 10, 110 Component supply unit 13, 113, 213 Mounting component 14, 114, 214 Soldering solder 20, 120 Solder supply unit 21, 121 Solder cutting unit 30, 130 Mounting head 31, 131 Contact sensor 32, 132 Mounting head movable mechanism section 40, 140 Mounting stage 50 XY position correction camera 51 XY correction image processing device 60, 61 Height measuring means 70, 170 Mounting operation control section 103, 203 Mounted parts 301, 401 Arms 321, 421 Mounting head movable mechanism θ1 axis 322 Mounting head movable mechanism θ2 axis

Claims (18)

【特許請求の範囲】[Claims] 【請求項1】 他の部品の基準となる基準部品が搭載さ
れた基板と、前記基板を搭載したステージと、前記基準
部品の表面の前記基板表面に対する傾斜を求める傾斜計
測機構と、前記傾斜を基に、前記他の部品を前記基板上
に載置して、前記基準部品の表面の延長面に前記他の部
品の表面を合わせる搭載ヘッド可動機構部とを備えるこ
とを特徴とする電子部品の搭載装置。
1. A substrate on which a reference component serving as a reference for another component is mounted, a stage on which the substrate is mounted, an inclination measuring mechanism for determining an inclination of a surface of the reference component with respect to the substrate surface, and And a mounting head moving mechanism for mounting the other component on the substrate and aligning the surface of the other component with an extension of the surface of the reference component. Onboard equipment.
【請求項2】 前記基準部品及び前記他の部品は、光モ
ジュールを構成する部品であって、前記基準部品はその
内部に前記基板の表面に概略平行して貫通する互いに異
なる少なくとも2つの光軸を有しており、前記傾斜計測
機構は、前記基準部品と前記基板との接着面内にあっ
て、前記少なくとも2つの光軸を挟んで斜めに相対する
2点における前記基準部品表面の前記基板表面からの高
さを求める第1の高さ測定手段及び第2の高さ測定手段
と、前記第1の高さ測定手段及び前記第2の高さ測定手
段を制御する搭載制御部とから構成される請求項1記載
の電子部品の搭載装置。
2. The reference component and the other component are components constituting an optical module, wherein the reference component has at least two different optical axes penetrating therein substantially in parallel with a surface of the substrate. Wherein the tilt measuring mechanism is located on the bonding surface between the reference component and the substrate, and the substrate on the surface of the reference component at two points obliquely opposed to each other across the at least two optical axes. Consisting of a first height measuring means and a second height measuring means for obtaining a height from the surface, and a mounting control unit for controlling the first height measuring means and the second height measuring means. The electronic component mounting apparatus according to claim 1, wherein
【請求項3】 前記搭載制御部は、前記第1の高さ測定
手段及び前記第2の高さ測定手段により求めた前記基準
部品表面の前記相対する2点における前記基板表面から
の高さを基に、前記基準部品表面の前記基板表面に対す
る傾き及び前記他の部品表面の前記基板表面からの搭載
高さを算出する請求項2記載の電子部品の搭載装置。
3. The mounting control section calculates a height from the substrate surface at the two opposite points of the reference component surface obtained by the first height measuring means and the second height measuring means. 3. The electronic component mounting apparatus according to claim 2, wherein the inclination of the reference component surface with respect to the substrate surface and the mounting height of the other component surface from the substrate surface are calculated based on the reference component surface.
【請求項4】 前記搭載ヘッド可動機構部を構成する搭
載ヘッドは、前記他の部品の前記基板における搭載予定
位置の上方に移動した時点以降に、前記搭載制御部によ
り算出された前記基準部品表面の前記基板表面に対する
傾き及び前記基板表面からの搭載高さを基に、前記他の
部品の表面を前記基準部品の表面の延長面に位置させる
請求項3記載の電子部品の搭載装置。
4. The reference component surface calculated by the mounting controller after the mounting head constituting the mounting head moving mechanism moves above a mounting position of the other component on the substrate. 4. The electronic component mounting apparatus according to claim 3, wherein the surface of the other component is positioned on an extension of the surface of the reference component based on the inclination of the component relative to the substrate surface and the mounting height from the substrate surface.
【請求項5】 前記搭載ヘッドは、前記他の部品の前記
基板における搭載予定位置に移動した後に、前記搭載制
御部により算出された前記基準部品表面の前記基板表面
に対する傾き及び前記他の部品の前記基板表面からの搭
載高さを基に、前記他の部品の表面を前記基準部品の表
面の延長面上に位置させる請求項3又は4記載の電子部
品の搭載装置。
5. The mounting head, after moving to a position where the other component is to be mounted on the substrate, the inclination of the reference component surface calculated by the mounting control unit with respect to the substrate surface and the inclination of the other component. 5. The electronic component mounting apparatus according to claim 3, wherein the surface of the other component is positioned on an extension of the surface of the reference component based on the mounting height from the substrate surface.
【請求項6】 前記他の部品の表面の高さは、前記光軸
に直交し、かつ、前記他の部品を概略2分する平面内に
おける前記基板表面からの搭載高さに設定される請求項
4又は5記載の電子部品の搭載装置。
6. The height of the surface of the other component is set to a mounting height from the surface of the substrate in a plane orthogonal to the optical axis and approximately bisecting the other component. Item 5. The electronic component mounting device according to item 4 or 5.
【請求項7】 前記搭載ヘッドは、前記基板に直交し、
かつ、互いに直交する2つの平面の、それぞれの平面内
において回転可能な機構を有する請求項4、5又は6記
載の電子部品の搭載装置。
7. The mounting head is orthogonal to the substrate,
7. The electronic component mounting apparatus according to claim 4, further comprising a mechanism rotatable in each of two planes orthogonal to each other.
【請求項8】 他の部品の基準となる基準部品が搭載さ
れた基板と、前記基板を搭載したステージと、前記基準
部品の表面の前記基板表面に対する傾斜を求める傾斜計
測機構と、前記傾斜を基に、前記他の部品を前記基板上
に載置して、前記基準部品の表面の延長線上に前記他の
部品の表面を合わせる搭載ヘッド可動機構部とを少なく
とも備えることを特徴とする電子部品の搭載装置。
8. A substrate on which a reference component serving as a reference for another component is mounted, a stage on which the substrate is mounted, an inclination measuring mechanism for determining an inclination of a surface of the reference component with respect to the substrate surface, and An electronic component, comprising: a mounting head movable mechanism for mounting the other component on the substrate and aligning the surface of the other component on an extension of the surface of the reference component. Mounting equipment.
【請求項9】 前記基準部品及び前記他の部品は、光モ
ジュールを構成する部品であって、前記傾斜計測機構
は、前記基準部品表面の光軸上の異なる2点の前記基板
表面からの高さを求める第1の高さ測定手段及び第2の
高さ測定手段と、前記第1の高さ測定手段及び前記第2
の高さ測定手段を制御する搭載制御部とから構成される
請求項8記載の電子部品の搭載装置。
9. The reference component and the other component are components constituting an optical module, and the inclination measuring mechanism is configured to detect two different points on the optical axis of the reference component surface from the substrate surface. First height measuring means and second height measuring means for determining the height, and the first height measuring means and the second height measuring means
9. The electronic component mounting apparatus according to claim 8, further comprising a mounting control unit that controls a height measuring unit.
【請求項10】 前記搭載制御部は、前記第1の高さ測
定手段及び前記第2の高さ測定手段により求めた前記基
準部品表面の光軸上の異なる2点の前記基板表面からの
高さを基に、前記基準部品表面の前記基板表面に対する
傾き及び前記他の部品表面の前記基板表面からの搭載高
さを算出する請求項9記載の電子部品の搭載装置。
10. The mounting control section is configured to determine two different heights from the substrate surface on the optical axis of the reference component surface obtained by the first height measuring means and the second height measuring means. The electronic component mounting apparatus according to claim 9, wherein an inclination of the reference component surface with respect to the substrate surface and a mounting height of the other component surface from the substrate surface are calculated based on the height.
【請求項11】 前記搭載ヘッド可動機構部を構成する
搭載ヘッドは、前記他の部品の前記基板における搭載予
定位置の上方に移動した時点以降に、前記搭載制御部に
より算出された前記基準部品表面の前記基板表面に対す
る傾き及び前記他の部品表面の前記基板表面からの搭載
高さを基に、前記他の部品の表面を前記基準部品の表面
の延長線に位置させる請求項10記載の電子部品の搭載
装置。
11. The reference component surface calculated by the mounting control unit after the mounting head constituting the mounting head moving mechanism moves above a mounting position of the other component on the substrate. The electronic component according to claim 10, wherein the surface of the other component is positioned on an extension of the surface of the reference component based on the inclination of the component with respect to the substrate surface and the mounting height of the surface of the other component from the substrate surface. Mounting equipment.
【請求項12】 前記搭載ヘッドは、前記他の部品の前
記基板における搭載予定位置に移動した後に、前記搭載
制御部により算出された前記基準部品表面の前記基板表
面に対する傾き及び前記他の部品表面の前記基板表面か
らの搭載高さを基に、前記他の部品の表面を前記基準部
品の表面の延長線に位置させる請求項10又は11記載
の電子部品の搭載装置。
12. The mounting head, after moving to a position where the other component is to be mounted on the substrate, the inclination of the reference component surface with respect to the substrate surface calculated by the mounting control unit and the other component surface 12. The electronic component mounting apparatus according to claim 10, wherein the surface of the another component is positioned on an extension of the surface of the reference component based on the mounting height from the substrate surface.
【請求項13】 前記搭載ヘッドは、前記他の部品を吸
着した後、前記他の部品を前記基板の上に載置する動作
を有し、かつ、前記基板の表面を構成する構成体への前
記他の部品の接触状態を感知する接触センサを具備する
請求項4、5、6、7、11又は12記載の電子部品の
搭載装置。
13. The mounting head, after adsorbing the other component, has an operation of mounting the other component on the substrate, and the mounting head includes a component for forming a surface of the substrate. 13. The electronic component mounting apparatus according to claim 4, further comprising a contact sensor that detects a contact state of the other component.
【請求項14】 前記他の部品を吸着した前記搭載ヘッ
ドは、前記基板の前記他の部品搭載予定位置の上方に移
動して、そこから前記基板の表面に向かって下降し、前
記他の部品が前記構成体と接触していないときは、前記
搭載ヘッドと前記接触センサとは互いに接する接触状態
であり、前記他の部品が前記構成体と接触したときに、
前記搭載ヘッドと前記接触センサとが離間する非接触状
態となり、前記搭載制御部が前記接触状態から前記非接
触状態に変化したときを感知して、前記搭載ヘッドの動
きを停止する請求項13記載の電子部品の搭載装置。
14. The mounting head, having sucked the other component, moves above the other component mounting position of the substrate, descends from there toward the surface of the substrate, and moves the other component. Is not in contact with the structure, the mounting head and the contact sensor are in a contact state in contact with each other, and when the other component contacts the structure,
14. The non-contact state in which the mounting head and the contact sensor are separated from each other, and the mounting control unit detects a change from the contact state to the non-contact state, and stops the movement of the mounting head. Electronic component mounting equipment.
【請求項15】 前記搭載ヘッドは、前記搭載ヘッドの
動きを停止した後、前記搭載制御部により算出された前
記基準部品表面の前記基板表面に対する傾き及び前記他
の部品表面の前記基板表面からの搭載高さを基に、前記
基板上の前記構成体が溶融している間に、前記他の部品
の表面を前記基準部品の表面の延長上に位置させ、前記
溶融した構成体を固化させることにより前記他の部品を
前記基板上に固定する請求項14記載の電子部品の搭載
装置。
15. The mounting head, after stopping the movement of the mounting head, the inclination of the reference component surface with respect to the substrate surface calculated by the mounting control unit and the inclination of the other component surface from the substrate surface. Positioning the surface of the other component on an extension of the surface of the reference component while the component on the substrate is molten based on the mounting height, and solidifying the molten component. 15. The electronic component mounting apparatus according to claim 14, wherein the other component is fixed on the substrate by using.
【請求項16】 前記構成体が、高温で溶融する導電物
である請求項13、14又は15記載の電子部品の搭載
装置。
16. The electronic component mounting apparatus according to claim 13, wherein the component is a conductive material that melts at a high temperature.
【請求項17】 前記搭載制御部は、前記基板の前記ス
テージに対する平面位置及び前記基準部品、前記他の部
品の前記基板に対する平面位置を補正する平面位置補正
用機構を制御する請求項1、2、3、4、5、6、7、
8、9、10、11、12、13、14、15又は16
記載の電子部品の搭載装置。
17. A planar position correcting mechanism for correcting a planar position of the substrate with respect to the stage and a planar position of the reference component and the other component with respect to the substrate. 3, 4, 5, 6, 7,
8, 9, 10, 11, 12, 13, 14, 15, or 16
A mounting device for the electronic component described above.
【請求項18】 前記平面位置補正用機構は、平面位置
補正用画像処理装置及び前記平面位置補正用画像処理装
置により制御される平面位置補正用カメラからなる請求
項17記載の電子部品の搭載装置。
18. The electronic component mounting apparatus according to claim 17, wherein said plane position correcting mechanism comprises a plane position correcting image processing apparatus and a plane position correcting camera controlled by said plane position correcting image processing apparatus. .
JP2000080720A 2000-02-10 2000-03-22 Electronic component mounting apparatus Pending JP2001298235A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000080720A JP2001298235A (en) 2000-02-10 2000-03-22 Electronic component mounting apparatus

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000-33035 2000-02-10
JP2000033035 2000-02-10
JP2000080720A JP2001298235A (en) 2000-02-10 2000-03-22 Electronic component mounting apparatus

Publications (1)

Publication Number Publication Date
JP2001298235A true JP2001298235A (en) 2001-10-26

Family

ID=26585167

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006267236A (en) * 2005-03-22 2006-10-05 Fuji Photo Film Co Ltd Laser device and its assembling method
KR101211128B1 (en) 2008-02-11 2012-12-11 삼성테크윈 주식회사 Method for teaching a position of part
WO2023017632A1 (en) * 2021-08-10 2023-02-16 ヌヴォトンテクノロジージャパン株式会社 Semiconductor laser device, soldered sub-mount, soldered sub-mount assembly, and testing method for semiconductor laser device

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Publication number Priority date Publication date Assignee Title
JPH05158528A (en) * 1991-12-02 1993-06-25 Hitachi Ltd Control system for robot
JPH0722800A (en) * 1993-06-30 1995-01-24 Matsushita Electric Ind Co Ltd Method of mounting electronic component and equipment for mounting electronic component
JPH0883955A (en) * 1994-09-12 1996-03-26 Hitachi Ltd Optical assembly
JPH09145965A (en) * 1995-11-22 1997-06-06 Hitachi Ltd Optical module and its manufacture
JPH1012971A (en) * 1996-06-21 1998-01-16 Hitachi Ltd Optical module and fabrication thereof
JPH11289131A (en) * 1997-09-02 1999-10-19 Matsushita Electric Ind Co Ltd Wavelength variable semiconductor laser and photointegrated device as well as manufacture thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05158528A (en) * 1991-12-02 1993-06-25 Hitachi Ltd Control system for robot
JPH0722800A (en) * 1993-06-30 1995-01-24 Matsushita Electric Ind Co Ltd Method of mounting electronic component and equipment for mounting electronic component
JPH0883955A (en) * 1994-09-12 1996-03-26 Hitachi Ltd Optical assembly
JPH09145965A (en) * 1995-11-22 1997-06-06 Hitachi Ltd Optical module and its manufacture
JPH1012971A (en) * 1996-06-21 1998-01-16 Hitachi Ltd Optical module and fabrication thereof
JPH11289131A (en) * 1997-09-02 1999-10-19 Matsushita Electric Ind Co Ltd Wavelength variable semiconductor laser and photointegrated device as well as manufacture thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006267236A (en) * 2005-03-22 2006-10-05 Fuji Photo Film Co Ltd Laser device and its assembling method
JP4515298B2 (en) * 2005-03-22 2010-07-28 富士フイルム株式会社 Laser device assembly method
KR101211128B1 (en) 2008-02-11 2012-12-11 삼성테크윈 주식회사 Method for teaching a position of part
WO2023017632A1 (en) * 2021-08-10 2023-02-16 ヌヴォトンテクノロジージャパン株式会社 Semiconductor laser device, soldered sub-mount, soldered sub-mount assembly, and testing method for semiconductor laser device

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