JP2001034735A - Information processor - Google Patents

Abstract

PROBLEM TO BE SOLVED: To realize a DA converter which is highly integrated and highly accurate. SOLUTION: This information processing includes a plurality of DA converters DAA1 which convert a plural-bit digital signal into an analog signal and output the analog signal, the magnitude of an analog output of a plurality of DA converters DAA1 is controlled by a single control circuit, the control circuit includes a current source to be a reference, and the converters DAA1 are controlled by the control circuit so that the magnitude of the output of the DA converters DAA1 can be decided according to the current value of the current source. Thus, highly accurate voltage/current conversion can be realized, and the DA converters can be formed with high integration.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an information processing apparatus in which a memory and an arithmetic circuit are integrated on a single semiconductor chip, and provides a method for transmitting and receiving a large amount of signals between the memory and the arithmetic circuit at a high speed. is there.

[0002]

2. Description of the Related Art In recent years, fine processing technology has advanced with the development of semiconductor technology, and a semiconductor memory in which 64-Mbit memory cells are integrated on one chip has been presented at academic conferences. On the other hand, high integration of semiconductors equipped with arithmetic circuits is also rapidly progressing. Furthermore, recently, a large number of information processing devices in which a memory and an arithmetic circuit are integrated on a single semiconductor chip have been put into practical use, and it is expected that a revolution will occur in information processing devices such as portable video cameras, computers, and telephones. I have.

[0003] Examples of this type of device include an image processing device and a neural network operation device. FIG. 22 shows the IEICE Technical Report Vol. 89, No. 312 (ICD89-144-1
51, integrated circuit, November 21, 1989) page 43, the neural network operation device described in FIG. In this conventional example, a neuron output value and a connection weight value are read out from memories written as an input RAM and a coefficient RAM, respectively, and stored in registers. Is calculated. The feature of this conventional example is that neural network information processing is performed at high speed by performing a multiply-accumulate operation by a plurality of arithmetic circuits in parallel.

[0004]

In the conventional example shown in FIG. 22, the following problem occurs when a large-scale neural network having a large number of neurons n is to be constructed.

In the conventional example shown in FIG. 22, one unit arithmetic circuit comprising a register, a multiplier, an adder and an accumulator (ACC) is provided for each coefficient memory (RAM) having an 8-bit output. The coefficient memory and the arithmetic circuit are connected by a bus. Although the pitch of the sense amplifier (data line) of the coefficient memory is not described,
In a recent highly integrated MOS memory, it is as small as about 1 to 2 μm. On the other hand, the pitch of the arithmetic circuit is determined by a multiplier, an adder, and the like. However, it is very difficult to lay out an 8-bit multiplier or a 16-bit adder with a width eight times the data line pitch. Therefore, for example, if one unit operation circuit is arranged below the leftmost coefficient memory in FIG. 22, the distance between the coefficient memory and the unit operation circuit to be connected by the bus increases toward the right. Therefore, the bus becomes longer, which increases the signal delay and the occupied area due to the wiring resistance. Further, since the length of the bus varies depending on the unit arithmetic circuit, the signal delay becomes uneven, and the data transfer speed from the memory cell array differs for each circuit, and it becomes difficult to synchronize each unit arithmetic circuit. Problems also arise. Conversely, if the coefficient memories are arranged in accordance with the pitch of the unit operation circuit, the bus becomes shorter, but an extra space is required between the coefficient memories, and the degree of integration is reduced.

In an information processing apparatus in which a memory and an arithmetic circuit are integrated on a single semiconductor chip, the present invention is not limited to the above-mentioned conventional example. It is expected that similar problems will arise in the future.

According to the present invention, in an information processing apparatus in which a memory and an arithmetic circuit are integrated on one semiconductor chip, an occupied area of a bus between the memory and the arithmetic circuit, a wiring length, and a non-uniform signal delay between the buses. Is to be reduced.

[0008]

According to the present invention, in order to solve the above-mentioned problems, a memory cell array (A) and an arithmetic circuit (P
E), a data line selector (ST) is provided to limit the number of data lines simultaneously connected to the arithmetic circuit, and the pitch between the input lines and the pitch between the output lines of the data line selector are respectively set to the memory cell array. The pitch between the data lines and the pitch between the input lines of the arithmetic circuit can be adjusted.

Since the data line selector having the same pitch is used as described above, even when the pitch between the data lines of the memory cell array and the pitch between the input lines of the arithmetic circuit are different, the memory cell array is adjacent to the data line selector. Arithmetic circuits can be arranged. For example, a memory cell array such as a DRAM having a very small data line pitch of several μm and a digital arithmetic circuit having a relatively large input line pitch of several tens μm are arranged via a data line selector without using a long bus. It is also possible.

As a result, signals can be directly transmitted and received between the memory cell array and the arithmetic circuit through the data line selector. Therefore, the occupied area increases due to the increase in the number of buses and the wiring resistance is reduced. The signal delay due to the increase is resolved. Further, since it is not necessary to use a bus having an extremely irregular length, unevenness in signal delay due to a difference in wiring length is also solved.

[0011]

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 1 shows an embodiment in which an information processing apparatus including a memory cell array and an arithmetic circuit on a semiconductor chip is constructed using the present invention. In FIG. 1, reference numeral A denotes a memory cell array, which includes a plurality of data lines, a plurality of word lines intersecting the data lines, and memory cells formed at desired intersections thereof. ST is a data line selector which selects a part of the information read from the memory cell array A through the data line and transmits it to the arithmetic circuit PE through the bus 1. The arithmetic circuit PE performs desired information processing using the information transmitted from the data line selector ST. IO is an input / output circuit for reading information from the memory cell array A to the outside of the chip via the bus 4 and IO.
To write information from outside the chip through the bus 5,
Alternatively, information output from the arithmetic circuit PE via the bus 2 is written to the memory cell array A or read out of the chip, information of the memory cell array A is written to the arithmetic circuit PE via the bus 3, or the arithmetic circuit PE is written from outside the chip. This is a circuit for inputting information through the bus 3. CTL is a control circuit for controlling the operations of the memory cell array A, the data line selector ST, the arithmetic circuit PE, and the input / output circuit IO by using signals such as control signals and addresses externally provided. .
In FIG. 1, the bus is composed of a plurality of arbitrary wires, but here, some buses are indicated by arrows for simplicity.

In this embodiment, the pitch of the input lines of the data line selector ST is the same as the pitch of the data lines, and the pitch of the output lines of the data line selector ST is adjacent to the memory cell array A in accordance with the pitch of the input lines of the arithmetic circuit. Then, the data line selector ST and the arithmetic circuit PE are arranged. As a result, a word line of the memory cell array A is selected, and a large number of information simultaneously read out from a plurality of memory cells on the word line to the data line are directly operated through the data line selector ST without using a long bus. It can be input to the circuit PE. Therefore, it is possible to eliminate an increase in wiring delay and a variation in wiring delay due to a long bus, and it is possible to realize a high-speed transfer of information between the memory cell array and the arithmetic circuit. Also, there is no increase in the occupied area due to the long bus.

As described above, according to the present embodiment, the pitch between the two can be matched by the data line selector SA. For example, the DR between the data lines is very small.
A digital arithmetic circuit having a relatively large pitch between a memory cell array such as an AM and input lines can be implemented without using a long bus.
It can be arranged on one semiconductor chip.

FIG. 2 shows a configuration example of the data line selector and the arithmetic circuit in the embodiment of FIG. In FIG. 2, ST1, ST2,. . , STk are data line selector unit circuits constituting the data line selector ST.
1, PE2,. . , PEk are operation unit circuits constituting the operation circuit PE. In this embodiment, the data line selector unit circuits ST1, ST2,. . , STk are a '
1, a'2,. . , A'k bits are received from the data line A of the memory cell array. . , Ak b
It selects the information of the operation unit circuit PE1, PE
2,. . , PEk. Operation unit circuits PE1, P
E2,. . , PEk can be operated in parallel, so that high-speed information processing is possible. Further, the data line selector ST and the arithmetic circuit PE are divided into unit circuits, and a signal is input from one data line selector unit circuit to only the nearest arithmetic unit circuit. The characteristic is that the signal transmission path can be made short and uniform. In this embodiment, to realize a highly integrated layout, the data line selector may be designed in accordance with the ratio of the pitch between the data lines of the memory cell array and the pitch between the input lines of the arithmetic circuit.

For example, the data line pitch of the memory cell array is 1 μm, and the pitch between input lines of the operation unit circuit is 5 μm.
And a1, a2,. . , Ak are all 8 bits, the data line selector unit circuit uses a 5: 1 data line selector, and a'1, a'2,. . , A'k all 40
It may be a bit. In this way, one operation unit circuit and one data line selector circuit can be accommodated exactly within the width of the data line for 40 bits.
Such an arrangement can be realized with high integration. In addition, since circuit patterns are regularly repeated, layout design is easy.

As described above, according to the embodiment of FIG.
A large amount of information can be transferred from the memory cell array A to the arithmetic circuit PE at high speed. However, in the above example, the selection ratio of the data line selector circuit is as large as 5: 1, and 4/5 of the information read on the data line is discarded. Therefore, in order to continue using all the information read on the data line in one reading, the word line of the memory cell array A must be started up five times, and an increase in power consumption may be a problem. . In such a case, it is preferable to use a data line selector unit circuit having a latch function as shown in FIG.

FIG. 3 shows a data line selector unit circuit STi having a selection ratio of h: 1, in which a'i bit is input and ai b
It is configured to output it. LAT is a latch circuit and SW is a switch. One output line is connected to each of the h latch circuits and switches. The operation of this embodiment will be described below. Of the information read from the memory cell array A, the information of a'i bit input to the data line selector unit circuit STi is stored in the latch circuit LAT. Next, by turning on one of the h switches connected to each output line, the latch circuit LAT is turned on.
Is selected and output to the output line. According to the present embodiment, all the information read from the memory cell array A is stored in the latch circuit, so that all the information read from the memory cell array A is used only by performing the read operation of the memory cell array A once. be able to. Therefore, even when the selectivity of the data line selector circuit is high, there is no increase in power consumption due to the read operation of the memory cell array A as described above. In addition, reading of information from the latch circuit can be performed at a higher speed with a shorter signal transmission path than reading from the memory cell array A. Therefore, there is an advantage that information can be transferred at a higher speed each time as compared with the case of reading from a memory cell.

In the foregoing, a configuration in which a memory cell array and a data line selector circuit are combined one by one with respect to one arithmetic circuit has been described. However, in some cases,
Any number of memory cell arrays and data line selector circuits may be used for one arithmetic circuit, or a plurality of data line selector circuits and arithmetic circuits may be provided for one memory cell array. It is needless to say that the above configuration is possible.

For example, in the configuration shown in FIG. 2, when the number of word lines is increased in order to increase the storage capacity of memory cell array A, the length of the data line becomes longer and the capacity and resistance of the data line become larger. Therefore, depending on the memory cell, the S / N ratio of the signal may be deteriorated, and the writing and reading operations may be delayed. In such a case, the configuration of FIG. 4 is suitable.

In FIG. 4, a plurality of memory cell arrays are provided for one processing circuit PE in the data line direction, and the divided arrays A1, A2,. . , AJ, data line selector circuits ST1, ST2,. . , STJ are arranged. The data line selector circuit STi (i = 1, 2,.
J) is a data line selector unit circuit STi1, STi.
2,. . , STik, and the data line selector unit circuits STi1, STi2,. . , STik are connected to the main data line MDATA.
Therefore, J data line selector unit circuits are connected to each main data line. Any one of the data line selector unit circuits connected to each main data line
By operating each one, the operation unit circuits PE1, PE2,. . , PEk to a1, a2,. . , Ak bits can be input in parallel from the memory cell array.

According to this embodiment, since the memory cell array is divided, the length of the data line is short for each divided memory cell array. Therefore, the capacitance and resistance of the data line are not large, and the S / N ratio of the signal is not degraded, and the writing and reading operations are not delayed.

As described above, in the present invention, the information stored in the memory cells on one word line is read out in parallel, and a part thereof is selected by the selector and input to the arithmetic circuit PE. Therefore, it is necessary to write information in the memory cells on the word lines in an arrangement corresponding to the intended operation.

FIGS. 5 to 7 specifically show how to arrange a processor for multiplying a scalar and a vector by arranging information in a memory cell array. For simplicity, in FIGS. 5 to 7, the number of bits of each component of the scalar C and the six-dimensional vectors VA to VF stored in the memory cell array is 2 bits. Each component of the vector is represented by a subscript, such as a third component of the vector VA, such as VA3. Further, in order to distinguish the first bit and the second bit of each component, the first bit of the third component VA3 of the vector VA is represented as va31, and the second bit is represented as va32.

FIG. 5 shows a first embodiment of the configuration of the processor as described above. This embodiment is characterized in that the vectors VA, VB,. . , VF to the memory cells on different word lines. As shown in FIG. 5, the memory cell array A has six word lines W
A,. . , WF and twelve data lines D1,. . , D1
2, and 72 memory cells provided at their intersections. The selector ST includes latch circuits LAT1,. . , LAT1
2 and switches SW1,. . , SW12. The arithmetic circuit PE includes two multipliers MT1 and MT2, and the scalar C
And the output of the selector are input. As can be seen from the figure, the selection ratio of the selector ST is 3: 1. Word line WA
In the upper memory cell, as shown in FIG.
a11, va21, va31, va12, va22, v
a32,. . , Va62 in that order.
The word lines WB,. . , WF in the same order as the vectors VB,. . , VF are arranged.

The operation of this embodiment will be described below. First,
The word line WA is selected, and the data lines D1,. . , D12
, A vector VA consisting of 12 bits is read out, and latch circuits LAT1,. . , LAT12. Subsequently, the switches SW1, SW4, SW7, and SW10 are turned on. As a result, va11 and va12, which are the first components VA1 of the vector VA, are stored in the multiplier MT1 and va41, va4, which are the fourth components VA4 of the vector VA, are stored in the multiplier MT2.
2 is input and the first component CVA1 of the multiplication result of the vector VA and the scalar C is supplied from the multiplier MT1 to the fourth component CVA4.
Is output from the multiplier MT2. Then switch SW
1, SW4, SW7, SW10 are turned off and SW2, SW
5, by turning on SW8 and SW11, the second component CVA2 of the multiplication result of the vector VA and the scalar C is output from the multiplier MT1, and the fifth component CVA5 is output from the multiplier MT2. Finally, switches SW2, SW5, SW8,
By turning off S11 and turning on SW3, SW6, SW9, and SW12, the third component CVA3 of the multiplication result of the vector VA and the scalar C is output from the multiplier MT1, and the sixth component CVA6 is output from the multiplier MT2. Thus, the multiplication of the vector VA and the scalar C is completed. Similarly, the word line WB is selected, and the vector VB and the scalar C are selected.
And the word line WF is selected, and the vector V
The calculation is performed by sequentially selecting word lines until multiplication of F and scalar C is performed. Thus, the six vectors VF
And the scalar C are completed. In this embodiment, the vectors VA, VB,. . , VF are written in the memory cells on different word lines, respectively. Therefore, in order to rewrite the value of one vector, there is an advantage that one word line can be selected and written at a time.

In the above embodiment, 6 multipliers are used by using two multipliers.
The selector is operated three times to perform multiplication of the dimensional vector, and the operation of one vector is completed. Since reading from the memory cell array only needs to be performed once for one vector, the reading speed is high as it is. However, in some cases, a higher speed operation is required.

The embodiment shown in FIG.
The operation of one vector is completed by the operation of the selector twice. The feature of the embodiment shown in FIG. 6 is that the number of data lines of the memory array is increased to store three vectors equal to the selection ratio of the selector in one word line, and six words are calculated so that one vector can be operated in parallel. That is, a multiplier is arranged. Since one multiplier is provided for each of the six data lines, the pitch of the multiplier is the same as that of the embodiment of FIG.

As shown in FIG. 6, memory cell array A has two word lines W1 and W2 and 36 data lines D.
1,. . , D36, and 72 memory cells provided at the intersection thereof. Selector S
T is a latch circuit LAT provided for each data line.
1,. . , LAT36 and switches SW1,. . , S
W36. The arithmetic circuit PE includes six multipliers MT1,. . , MT6, and the scalar C and the output of the selector are input to the multiplier. The selection ratio of the selector ST is 3: 1. The vectors VA, VB, VC are stored in the memory cells on the word line W1 as shown in FIG.
2, vc12,. . , Vc62 in that order. The vector V is applied to the word line W2 in the same order.
D, VE, and VF are arranged.

The operation of this embodiment will be described below. First,
When word line W1 is selected and data lines D1,. . , D36
Read the vectors VA, VB, VC into the latch circuit L
AT1,. . , LAT36. Subsequently, the switches SW1, SW4, SW7,. . , SW34 are turned on. As a result, the multipliers MT1 to MT6 each receive 2b
the first component VA1 (va
11, va12) to the sixth component VA6 (va61, va
62) is input and the first to sixth components CVA1 to CVA6 of the multiplication result of the vector VA and the scalar C are output. Next, the switches SW1, SW4, SW7,. . , S
W34 is turned off and SW2, SW5, SW8,. . , SW
35, the vector VB and the scalar C
And finally switches SW2, SW5, SW
8,. . , SW35 are turned off and SW3, SW6, SW
9,. . , SW36, the multiplication of the vector VC and the scalar C is performed. Thus, the multiplication of the scalar C by the three vectors VA, VB, VC is completed.
Similarly, the word line W2 is selected, and the scalar C is multiplied by the vectors VD, VE, and VF. In this embodiment, the same number of vectors are written in the memory cells on one word line as the selection ratio of the selector. Each time the selector is operated, the value of one vector is input to the arithmetic circuit at a time to perform the calculation. be able to. Therefore, the calculation can be performed at a very high speed.

FIG. 7 shows a parallel write circuit suitable for the embodiment shown in FIG. In the embodiment of FIG.
A plurality of vectors need to be mixedly written to a memory cell on one word line. Therefore, in order to rewrite the value of one vector, discrete memory cells on one word line must be selected, and address control is complicated in a method of rewriting one bit at a time as in a normal memory. It takes time. A feature of the embodiment of FIG. 7 is that a parallel write is selectively performed on a memory cell in which one vector is written by using a distributor in a write circuit. In FIG. 7, IN is an input line, DSB
1, DSB2 is a distributor and RGT is a register. To write the vector VA on the word line W1, the following may be performed. First, the switches SWR11, SW
R12,. . , SWR62 in order to make the input line IN
Va11, va12,. . ,
va62 is set to cells R11 and R1 of the register RGT.
2,. . , R62. Subsequently, the word line W1
And switch S of distributor DSB2
1, S4,. . , S34 are turned on, and va11, va12,. . , Va62. This means that the vector VA has been written to the same memory cell as shown in FIG. As can be easily understood, writing of other vectors can be similarly performed by selecting an appropriate word line and a switch of the distributor DSB2. For example, when writing the vector VF, vf11,. . , Vf62, and switches S3, S6,... Of word line W2 and distributor DSB2. . , S36 may be selected.

As described above, according to the present embodiment, writing can be performed in parallel from the memory cells arranged on one word line to the memory cells at a plurality of discrete positions.
Therefore, high-speed writing can be performed as compared with the case where writing is performed to each memory cell. For the same vector, distributor DSB2 at the time of writing
The selection of the switch may be the same as the selection of the switch in the selector at the time of calculation. Therefore, selector S
A circuit for controlling the selection of the switches of T and the distributor DSB2 can be easily configured.

The basic configuration of the present invention has been described with reference to FIGS. INDUSTRIAL APPLICABILITY The present invention is suitable for an information processing apparatus that performs a parallel operation using a large amount of data.
For example, parallel distributed information processing using a neural network called image processing or neural computing (hereinafter, neural network information processing)
It is suitable for an apparatus for performing the following. Hereinafter, an embodiment in which the present invention is applied to a semiconductor device that performs neural network information processing will be described.

Neural network information processing has attracted attention in fields such as pattern recognition or optimization problems such as voice processing or image processing. In neural network information processing, a large number of arithmetic elements called neurons connected in a network form exchange information through transmission lines called connections to perform advanced information processing. In each neuron, a simple operation such as a product or a sum is performed on information (a neuron output value) sent from another neuron. The operation in each neuron and also the operation of different neurons can be performed in parallel, so that it has a feature that information processing can be performed at high speed. Further, since an algorithm (learning) for setting a weight value of a connection connecting neurons in order to perform desired information processing has been proposed, various types of information processing according to purposes can be performed.

The principle of operation of the neural network will be described with respect to two typical types of networks, a hierarchical network and a Hopfield network. FIG. 8 shows the structure of a hierarchical network, and FIG. 9 shows the structure of a Hopfield network. Both of these are composed of connections that connect neurons to the same area. Here, the term neuron is used, but in some cases, it is also called a node or an operation element. The direction of the connection arrow indicates the direction in which the neuron output value is transmitted. In the hierarchical network, as shown in FIG. 8, neurons are arranged in a plurality of hierarchies, and the neuron output value is transmitted only in the direction from the input layer to the output layer. On the other hand, in a Hopfield network, as shown in FIG. 9, neuron output values are transmitted in two directions between any two neurons.

FIGS. 8 and 9 also show the principle of the operation performed in the neuron. Since the operation principle is the same for both networks, the hierarchical network will be described with reference to FIG. In the lower part of FIG. 8, j in the (S + 1) th layer is shown.
The third neuron is shown enlarged. In this neuron, the output values V (1, s),. . , V (i,
s),. . , V (n, s). Here, n indicates the number of neurons in the S-th layer. In the neuron, the input output value V (1,
s),. . , V (i, s),. . , V (n, s) and connection weight values T (j, 1, s),. . , T (j, i,
s),. . , T (j, n, s) V (1, s) T
(J, 1, s),. . , V (i, s) T (j, i,
s),. . , V (n, s) T (j, n, s) are the multipliers M
Calculated by T. Next, the product of these and -Θ (j,
s + 1) is calculated by the adder ADD. Here, Θ (j, s + 1) is an amount called an offset and may be omitted in some cases. Further, the result is input to the nonlinear function circuit D, and the output value V (j, s
+1). The nonlinear function circuit D outputs an output g (x) with respect to the input x. As the function g, a non-linear function that outputs a binary output depending on whether the input x exceeds a certain threshold value xth or a continuous increasing function called a sigmoid function is often used. The non-linear function circuit D may have other characteristics as needed.
In some cases, a linear characteristic may be provided.

The principle of the above operation is the same in a Hopfield type network as shown in FIG. However, in the Hopfield type network, the output values of all neurons except for itself are input to one neuron.

As can be seen from FIG. 8, in the hierarchical network, first, the output values of the neurons in the input layer are set, and the output values of the neurons in the hidden layer are sequentially updated based on the output values. The output values of the neurons in the layer are updated. On the other hand, in the Hopfield network as shown in FIG. 9, since there is no layer, each neuron can update the output value at an appropriate timing. In this Hopfield network, the initial values of all the neuron output values are appropriately given, and the updating of the neuron output values is continued until the neuron output values reach an equilibrium state. Until the output values of the neurons reach an equilibrium state, it is usually necessary to update the output values of all the neurons several times. A device that updates the output values of all neurons simultaneously is called a synchronous Hopfield network, and a device that updates the output values of each neuron at arbitrary timing is called an asynchronous Hopfield network.

Hereinafter, an embodiment of an information processing apparatus (hereinafter, a neuroprocessor) for performing the above-described neural network calculation will be described. In the following, each layer is n
An embodiment in which calculation of an L-layer hierarchical network composed of N neurons is performed using k (k <n) multipliers operating in parallel will be described.
Is larger than n, an information processing apparatus for calculating a neural network can be similarly configured using the present invention. The operation principle of the above-described Hopfield network and other neural networks is the same, so that it can be realized in the same manner as the following embodiment.

FIG. 10 shows a first embodiment of a neuroprocessor constructed according to the present invention.

In FIG. 10, A and B are memory cell arrays, STA and STB are selector circuits, PE is an arithmetic circuit,
ACC is an accumulator, and D is a non-linear operation circuit.
Memory cell arrays A and B are neuron output values, respectively.
For storing the connection weight value, the neuron output value and the connection weight value are expressed and stored as a bit and b bit, respectively. The memory cell array A has L word lines, and the memory cells on each word line store neuron output values for one layer. Therefore,
By selecting one word line, one layer of neuron output values is read out to the data line group. The memory cell array B has n (L-1) word lines,
By selecting a book, n (n = kh) coupling weight values are read out to the data line group. Selector circuits STA, ST
B represents k selector unit circuits STA, respectively.
1,. . , STAk and STB1,. . , STBk, and the selector unit circuit latches the information read from the memory array and selects it at a ratio of h: 1, and transmits it to the arithmetic circuit PE. Arithmetic circuit PE
Are k digital multipliers MTD1,. . , MTDk and switches SW1,. . , SWk, and transmits the product of the neuron output value and the connection weight value calculated by the digital multiplier MTDi to the accumulator ACC by turning on the switch SWi (i = 1,..., K). In the accumulator ACC, the product of the neuron output value transmitted from the multiplier and the connection weight value is added, and
The signal is transmitted to the non-linear operation circuit D. In the nonlinear operation circuit D,
The nonlinear function g in FIG. 8 is calculated, and a neuron output value is output. The non-linear operation circuit D is configured by a logic circuit so as to realize the input / output relationship of the non-linear function g, or treats input data as an address and stores the output value of the non-linear function g in a memory cell corresponding to the address. A memory that has been used can also be used.

Hereinafter, the operation of this embodiment will be described in detail with reference to FIG. FIG. 11 illustrates a calculation algorithm in the configuration (1) of the neuroprocessor of FIG. As described above, here, an L-layer hierarchical network having n neurons in each layer is assumed. FIG. 11 shows only one part of the connection weights in order to show the algorithm for calculating the output value of the first neuron in the second layer. The output values of the neurons in the input layer are written in advance to the memory cells on one word line of the memory array A in FIG. Also, (L-
1) All the n ² connection weight values are converted to connection weight values T
(J, i, s) (j and s are constant, i = 1,..., N) are written so as to be stored in the memory cells on the same word line.

First, the word line of the memory array A into which the output value of the neuron of the input layer has been written, and the connection weight value T (1, i, 1) between the neuron of the input layer and the first neuron of the second layer ) (I = 1,..., N) is selected and the word line of the memory array B is selected. As a result, the selector unit circuits STA1,. . , STAk respectively correspond to the first layer groups # 1,. . , #K are connected to the selector unit circuit STB.
1,. . , STBk, respectively, have a first layer group #
1,. . , #K to the first neuron of the second layer are input and latched. Then,
The output value of the first neuron of the second layer is calculated for h times. First, in the first cycle, the selector unit circuit STA
1,. . , STAk from the first layer group #
1,. . , #K are output to the selector unit circuits STB1,. . , STBk respectively output the weights of the combinations indicated by solid lines in FIG. . , MTDk. The digital multipliers MTD1,. . , MTDk, the product of the neuron output value and the connection weight value is calculated in parallel. Subsequently, the switches SW1,. . , SWk are sequentially turned on to transmit the multiplication result to the accumulator ACC. Next, in the second cycle, the selector unit circuits STA1,. . , STAk from the first layer group # 1,. . , #K in #k
The output value of the neuron is stored in the selector unit circuit STB.
1,. . , STBk respectively output the weight of the combination indicated by the broken line in FIG.
1,. . , MTDk and transmits the multiplication result to the accumulator ACC. Similarly, when the calculation is performed up to the h-th cycle, the accumulator ACC obtains the product-sum result necessary for obtaining the output value of the first neuron in the second layer.
Here, the result of the product sum is input to the non-linear operation circuit D, and the output value of the first neuron in the second layer is obtained.
(The output value of the neuron of the first layer is written to a memory cell on a word line other than the word line having the memory cell in which the output value is written). Subsequently, a connection weight value T (2, i, between the neuron in the input layer and the second neuron in the second layer)
1) Select the word line of the memory array B in which (i = 1,..., N) has been written, and likewise select the second line of the second layer.
The output value of the neuron is calculated. When calculating the output values of the neurons in the same layer, the output values of the necessary neurons have already been latched by the selector, so there is no need to select the word line of the memory array A again.

By continuing the above operation, the output value of the neuron of the second layer is written into the memory cell on one word line. After the calculation of the second layer is completed, the output value of the neuron of the second layer is read from the memory cell array A to obtain the connection weight value T between the neuron of the second layer and the first neuron of the third layer.
(1, i, 2) (i = 1,..., N) is stored in memory array B
, The output value of the first neuron in the third layer is calculated, and the same calculation is continued until the output value of the n-th neuron in the final layer is obtained.

As described above, according to the present embodiment, neural network information processing can be performed at high speed because k multiplications are performed in parallel. Further, since the selector is used, even if the data line pitch of the memory cell array and the input line pitch of the digital multiplying circuit are different, they can be matched and arranged close to each other with the selector interposed therebetween. For this reason, a long bus is not required and signals can be transmitted and received at high speed.
Further, since the selector is provided with the latch function, the read operation of the memory cell array may be reduced to once for each layer in the memory cell array A and once for each neuron in the memory cell array B.
Therefore, there is an advantage that the power consumed by the memory cell array can be reduced. In addition, since the data is read from the latch circuit in the selector, high-speed operation is possible as compared with the data read from the memory cell array.

FIG. 12 shows an example (2) of the configuration of the neuroprocessor, which is realized by using an analog multiplier and having the same function as the embodiment of FIG. FIG.
2, DAA1,. . , DAAk and DAB
1,. . , DABk are DA converters and the selectors S
The digital values output from TA and SAB are converted into analog values, and the values of the multipliers MTA1,. . , MTAk.
The multipliers MTA1,. . , MTAk whose output is current is used. Therefore, the multiplication results can be added at one time. Therefore, there is a feature that the operation speed is higher than the case where a switch is provided in the arithmetic circuit PE and the multiplication result is sequentially transmitted to the accumulator as in the embodiment of FIG. Further, in this embodiment, since an analog multiplier is used, there is an advantage that the occupied area can be reduced. Since the operation and calculation algorithm of this embodiment are the same as those of the embodiment of FIG. 10, detailed description of the operation will be omitted. Incidentally, the multipliers MTA1,. . , MTAK are, for example, eye, e, e, e, journal, of, solid,
State, Circuit, S, Sea 17, Volume 6, 11
Pages 74 to 1178 (IEEE Journal of Soli
d-State Circuits, vol, SC-17, no.6, December, 198
2, p.1174-1178) or i, e, e, e, journal, ob, solid, state, circuit, s, c22, Vol. 3, pp. 357-365 (IEEE Journal of Solid-State Circuits, vol, SC-2
2, no. 3, June, 1987, p. 357-365) can be used. A preferred embodiment of the DA converter having the configuration shown in FIG. 12 will be described later.

FIG. 13 shows a configuration example (3) of a neuroprocessor using the present invention, which is configured by using a digital arithmetic unit as in the embodiment of FIG. In FIG.
Is a register for storing a neuron output value. The arithmetic circuit PE includes k digital multipliers MTD
1,. . , MTDk and accumulator ACC
1,. . , ACCk. In the selector circuit STC, the switches SW1,. . , SWk are conducted one by one to transmit the product-sum result to the non-linear operation circuit D. In this embodiment, the neuron output value is calculated by a calculation algorithm different from that in FIG. Hereinafter, the operation of this embodiment will be described in detail with reference to FIG.

FIG. 14 illustrates the calculation algorithm in the configuration (3) of the neuroprocessor of FIG. As before, an L-layer hierarchical network having n neurons in each layer is assumed here. FIG. 14 shows only one part of the connection weights in order to show an algorithm for calculating the output value of the k-th neuron from the first neuron of the second layer. The output value of the neuron in the input layer is written in the register RA in advance. Also in the memory array B is written to (L-1) n ² pieces of all connection weights. At this time, the s-th layer neuron h
The n connection weight values T (j, i, s) between the (n) and the (s + 1) th layer neurons are stored in the memory cells on the same word line. For example, in FIG. 14, h neurons in group # 1 of the input layer and the first neuron in the second layer
The connection weight value between the neuron and the k-th neuron is stored in a memory cell on the same word line.

First, the output value of the first neuron of the group # 1 of the input layer is read from the register RA, and the output values of the h neurons of the group # 1 of the input layer and the first to kth neurons of the second layer are read out. The word line of the memory array B to which the connection weight value has been written is selected. As a result, the selector unit circuits STB1,. . , STBk respectively have h connection weight values T (1, i, 1),. . , T
(K, i, 1) (where i = 1,..., H) is input and latched. Subsequently, h of the input layer group # 1
The product of the connection weights between the number of neurons and the first to k-th neurons in the second layer is divided into h cycles. First, in the first cycle, the output value of the first neuron of the first layer is read from the register RA, and the selector unit circuits STB1,. . , STBk, respectively, obtains the weight of the combination indicated by the solid line in FIG.
D1,. . , MTDk. Digital multiplier MT
D1,. . , MTDk, the product of the neuron output value and the connection weight value is calculated in parallel, and the multiplication results are stored in accumulators ACC1,. . , ACCk. Next, in the second cycle, the output value of the second neuron of the first layer is read from the register RA, and the selector unit circuits STB1,. . ,
From STBk, the weights of the combinations indicated by the broken lines in FIG. . , MTD
Input to k and accumulator ACC
1,. . , ACCk and add them. Similarly, the calculation is performed up to the h-th cycle.
The sum of product of the connection weights between the neurons and the first to kth neurons in the second layer is calculated.

Next, the output value of the first neuron of the group # 2 of the input layer is read from the register RA, and the output values of the h neurons of the group # 2 of the input layer and the first to kth neurons of the second layer are read out. Select the word line of the memory array B in which the connection weight value has been written. Then, similarly to the above, the product of the connection weights between the h neurons of the group # 2 in the input layer and the first to kth neurons in the second layer is divided into h cycles. Hereinafter, h neurons of the group #k of the input layer and the second
When the multiplication of the connection weight between the first neuron and the k-th neuron of the layer is performed, the accumulator ACC
1,. . , ACCk can obtain the product-sum result necessary for obtaining the output value of the k-th neuron from the first neuron of the second layer. Here, the sum of the products is referred to as a switch SW
1,. . , SWk are turned on in order, and the non-linear operation circuit D
And write the output to register RA. Less than,
The output values of the neurons of the second layer are obtained k by k.
After the calculation of the neuron output value of the layer is completed, the neuron output value of the third layer is obtained by using the neuron output value of the second layer, and the calculation is similarly performed up to the output layer.

As described above, in this embodiment, since the neural network information processing is performed by the digital operation, the operation can be performed with high accuracy as in the embodiment of FIG. Furthermore, k multipliers and k accumulators are provided for multiplication,
Since addition is performed in parallel, the operation is faster than the embodiment of FIG. Since a selector is used in this embodiment, even if the data line pitch of the memory cell array is different from the pitch of the input line of the digital multiplying circuit and accumulator, they can be matched and arranged close to each other with the selector interposed therebetween. .
For this reason, a long bus is not required and signals can be exchanged at a high speed. Further, since the selector is provided with the latch function, the read operation of the memory cell array B may be as small as every h cycle. Therefore, there is an advantage that the power consumed by the memory cell array can be reduced. Although one non-linear operation circuit D is used in the present embodiment, it may be provided for each accumulator. In that case, the non-linear operation can also be performed in parallel, so that further high-speed processing is possible. In that case, the input bus of the register RA is expanded to ak bits without using the selector STC, and writing to the register RA is performed in parallel, so that high-speed processing can be performed.

FIG. 15 shows a configuration example (4) of a neuroprocessor using the present invention. In FIG. 15, PEA,
PEB is an arithmetic circuit, and DSB is a distributor. As in the previous embodiment, the register RA and the memory cell array B store the neuron output value and the connection weight value, respectively. The neuron output value and the connection weight value are represented by a bit and b bit, respectively. It is memorized. The feature of this embodiment is that hk accumulators are provided. Hereinafter, the operation of this embodiment will be described in detail with reference to FIGS.

FIG. 16 shows a calculation algorithm in the configuration (4) of the neuroprocessor of FIG. The most significant difference between this embodiment and the embodiment shown in FIGS. 13 and 14 is that in this embodiment, n accumulators are provided and output values of n neurons for one layer are calculated in parallel. That is. The output value of the neuron in the input layer is written in the register RA in advance. Also in the memory array B is written to (L-1) n ² pieces of all connection weights. At this time, the connection weight value T (j, i, s) (j = j) between the i-th neuron in the s-th layer and the neuron in the (s + 1) -th layer is stored in the memory cells on the same word line.
1,. . . , N) are stored, and the order on the word line is selected by selecting the word line, so that the selector unit circuit STBx supplies the i-th neuron of the s-th layer and the (s + 1) -th neuron.
The first to h-th groups of layers (# in FIG. 16)
1,. . , #H) to the x-th neuron. For example, in FIG. 16, the connection weights between the first neuron of the input layer and the n neurons of the second layer are stored on the same word line, and the first neuron of the input layer and the first neuron of each group (shaded lines) Are added to the selector unit circuit STB1 when the word line is selected.

The calculation is performed as follows. First, the output value of the first neuron of the input layer is read from the register RA, and the word line of the memory array B to which the connection weight between the first neuron of the input layer and the neuron of the second layer is written is selected. As a result, the selector unit circuit STB
1,. . , STBk are input with h connection weights and latched. Subsequently, the product of the output value of the first neuron in the input layer and the connection weight value between the n neurons in the second layer is divided into h cycles. First,
In the first cycle, the selector unit circuits STB1,. . ,
From STBk, the weights of the combinations indicated by the solid lines in FIG. . , MTDk
To enter. The digital multipliers MTD1,. . , MTDk
In, the product of the neuron output value and the connection weight value is calculated in parallel, and the multiplication result is passed through the distributor to the accumulators ACC (1,1), ACC (1,2). . , AC
Stored in C (1, k). Next, in the second cycle,
The selector unit circuits STB1,. . , STBk, the digital multipliers MTD1,. . , MTDk and the multiplication results are stored in accumulators ACC (2,1), ACC (2,1).
2),. . , ACC (2, k). Similarly, the h-th cycle calculation is performed, and the product-sum calculation of the connection weight values between the first neuron of the input layer and the n neurons of the second layer is performed.

Next, the output value of the second neuron of the input layer is read from the register RA, and the memory array B in which the connection weight between the second neuron of the input layer and the n neurons of the second layer is written. Select the word line. And
Similarly to the above, the product of the connection weight values between the second neuron of the input layer and the neuron of the second layer is performed in h cycles. Hereinafter, the n-th neuron and the second
When the multiplication of the connection weights between the neurons in the layer is performed, the accumulator obtains the product-sum result necessary for obtaining the output value of the n-th neuron from the first neuron in the second layer. For example, ACC (2,3) can obtain a product-sum result necessary for obtaining the output value of the third neuron of the second group in the second layer. Here, the sum of the products is referred to as a switch SW
1,. . , SWk are turned on in order, and the non-linear operation circuit D
And write it to the register RA. Hereinafter, the neuron output value of the third layer is obtained, and after the calculation of the neuron output value of the third layer is completed, the neuron output value of the fourth layer is obtained.
The same calculation is performed up to the output layer.

As described above, according to the present embodiment, k multipliers and n accumulators can be provided to calculate the output values of n neurons in the same layer in parallel.

Therefore, the data transfer from the accumulator to the non-linear operation circuit and the register can be performed collectively, so that the neural network information processing can be performed at high speed. Since the selector is also used in the present embodiment, even if the data line pitch of the memory cell array and the input line pitch of the digital multiplying circuit are different, they can be matched and arranged close to each other with the selector interposed therebetween. For this reason, a long bus is not required and signals can be exchanged at a high speed. Further, since the selector is provided with the latch function, the read operation of the memory cell array B may be as small as every h cycle. Therefore, there is an advantage that the power consumption of the memory cell array is small and the operation speed is high as in the above-described embodiment. In this embodiment, as in the above-described embodiment, a plurality of non-linear operation circuits D are provided, the input bus of the register RA is expanded, and the non-linear operation and writing to the register RA are performed in parallel to further increase the speed. It is possible.

In the following, an embodiment of a circuit suitable for the embodiments described above will be described.

FIG. 17 shows a configuration example of a selector suitable for a DRAM memory cell array. In the present embodiment, FIGS.
3, the memory cell array A and the selector ST, and the memory cell arrays A1,. . , AJ and selectors ST1,. . ,
STJ, memory cell array A and selector S of FIGS.
T, the memory cell arrays A and B and the selectors STA and STB in FIGS. 10 and 12, and the memory cell array B and the selector STB in FIGS. The features of this embodiment are that the memory cell array section is highly integrated using DRAM memory cells, and that the latch function of the selector is realized by using the rewrite sense amplifier in the DRAM cell array. In FIG. 17, M denotes a memory cell array, ST1,. . , STk are selector unit circuits.

For convenience of explanation, the memory cell array M is composed of the memory cell array unit circuits M1,. . , Ma,. . The selector unit circuit ST1 includes basic selectors ST11,. . , ST1
a. Memory cell array unit circuit M1
As shown in (1), the memory cell array is composed of a dynamic memory cell MC including one transistor and one capacitor. D1, D1B,. . . . D
h, DhB are data lines, W1, W2,. . , Wm are word lines. PR, SA, RSA, and WS are circuits for controlling reading and writing of information from and to the memory cell MC, and include a precharge circuit, a sense amplifier, a read amplifier,
Write circuit. As shown in the basic selector ST11, one basic selector has h data line pairs D1 and D1.
B,. . . . Dh and DhB are input, and a pair of selector output lines TD1 and TD1B are output.

The selector unit circuits are ST11 to ST1a.
Up to a basic circuits. Basic circuit S
As shown in T11, D1,. . , D
h are the switches MOS SM1,. . , SMh to D1B,. . , DhB are switch MOS SM1B,. . , SMhB to the common data line CD1B. Precharge pMOSs PM1 and PM1B are connected to the common data line pairs CD1 and CD1B, respectively, and a CMOS
The data is input to buffer circuits BF1 and BF1B using an inverter. Outputs of the buffer circuits BF1 and BF1B become output lines TD1 and TD1B. Here, since the CMOS inverter is used for the buffer circuit, the input and output potentials of the buffer circuit are inverted. However, it is of course possible to connect two stages of CMOS inverters as the buffer circuit so that the input and output potentials match. When the CMOS inverters are connected in multiple stages, the drive capability of the buffer circuit can be increased without increasing the capacity of the common data line pair by appropriately setting the transistor size ratio between the stages of the CMOS inverter. It is suitable for connecting a large arithmetic circuit to a selector.

The outline of the operation of reading information through the selector is as follows. First, one word line in the memory cell array M is selected as in a normal DRAM read operation, and the information stored in the memory cells on the word line becomes a small potential difference between each data line pair. Read out. The small potential difference is amplified by the sense amplifier SA provided for each data line pair, and rewritten to the memory cell. The selector is operated while the amplified potential difference is latched by the sense amplifier SA to select and output one pair of data per data line pair h. Therefore, FIG.
In the configuration shown in (1), by selecting one word line, ahk bit information is read out to the ah pair of data lines per selector unit circuit and the ahk pair of data lines as a whole. Bit data is selected and output in parallel.

Hereinafter, the operation of the selector of FIG. 17 will be described in detail with reference to FIG. Note that the read operation from the memory cell through the output lines O and OB and the write operation through the input lines I and IB are the same as those of the conventional DRAM, and the description is omitted. FIG. 18 shows an example of operation waveforms in the case where the information read out by selecting the word line W1 in FIG. First, at the beginning of the operation, the potentials of all the word lines are at the low potential Vss and the precharge signal φp is at the high potential Vcc, whereby the memory cells are in a non-selected state and all the data lines are at Vc.
It is precharged to a potential VH between c and Vss.
Next, after lowering the potential of the precharge signal φp to a low potential, the word line W1 is selected and the potential is set to Vcc + V.
t (where Vt is M of memory cell MC)
The threshold voltage of the OS transistor). Then, a small potential difference is generated in each data line pair according to the information stored in the memory cell MC connected to the data line. In FIG. 18, the data line D1 is set to a higher potential than D1B,
h shows a case where the potential becomes lower than DhB. Subsequently, the potentials of the sense amplifier SA activation signals PP and PN are changed from VH to a high potential and a low potential, respectively. Then, the minute potential difference between the data line pair is amplified, the data line on the high potential side is charged until the potential becomes Vcc, and the data line on the low potential side is discharged until the potential becomes Vss. Thus, the signals read and amplified in all of the ahk pairs of data lines are latched on the data line pairs by keeping the potentials of the sense amplifier SA activation signals PP and PN at the high potential Vcc and the low potential Vss, respectively. Subsequently, the selector performs the parallel reading continuously for h times ak bits at a time.
As shown in FIG. 18, at the beginning of the operation, the common data line precharge signal FP and the selection lines F1,. . , Fh are at Vss, and all common data lines are at Vcc.
Has been precharged. After the potential of the common data line precharge signal FP is raised to Vcc with the signal read on the data line pair latched as described above, the selection line F
The potential of 1 is raised to Vcc. Then, the switch MOS is turned on, and the potential of the common data line connected to the data line charged to Vcc remains at Vcc.
The potential of the common data line connected to the data line discharged to Vss decreases. For example, as shown in FIG. 18, since the data line D1 is charged to Vcc, the potential of the common data line CD1 connected thereto via the switch MOS SM1 remains at Vcc, but the data line D1B
Is discharged to Vss, the potential of the common data line CD1B decreases. Although the potential of the data line D1B temporarily rises due to the charge from the common data line CD1B, the data line D1B and the common data line C are turned on by the sense amplifier SA.
Both D1B are discharged to Vss. The signals read out to the common data line pair CD1 and CD1B in this manner are input to buffer circuits BF1 and BF1B using CMOS inverters, inverted in potential, and output from selector output lines TD1B and TD1. The selector output line has a pair of a in each selector unit circuit of FIG.
Are output in parallel. Next, as shown in FIG. 18, after the potential of the selection line F1 is lowered to Vss to turn off the switch MOS, the potential of the common data line precharge signal FP is lowered to Vss and all the common data lines are again set to Vcc. Precharge to. Thereafter, the potential of the common data line precharge signal FP is raised to Vcc in the same manner as described above, and then the potential of the selection line F2 is raised to Vcc.
S (not shown in the figure) through the switch MOS
Is read from the selector output line. Hereinafter, the same operation is performed, and the selection signal F
3,. . , Fh, the signals of all the data lines can be read from the selector output lines. Here, the case where the selection signals are selected in order is taken as an example, but it goes without saying that the selection signals may be selected at random as needed. When one word line is selected and one part of the read information is output, another word line may be selected. Alternatively, information read out by selecting one word line may be repeatedly selected at random. These selections can be freely set according to the requirements of the arithmetic circuit connected to the selector. In addition,
In the present embodiment, since the DRAM cell that stores the electric charge in the capacitance is used, the electric charge of the cell leaks as in the case of the ordinary DRAM. For this reason, it is necessary to perform the refresh operation while the electric charge of the cell is at the allowable value, and the time required for the specific word line not to be selected is long due to the request of the arithmetic circuit. The refresh operation may be performed by selecting the corresponding word line. Alternatively, it is also possible to provide a refresh period as in a normal DRAM and to select all the word lines in order during the refresh period to perform the intensive refresh operation. 17 and 18, the common data line is precharged. However, when the capacitance of the common data line is sufficiently smaller than the capacitance of the data line, when the switch MOS is turned on, residual charge of the common data line causes Since the potential of the data line pair is not inverted and the sense amplifier does not malfunction, the common data line precharge MOS can be omitted, and the selector circuit can be further highly integrated.

As described above, in this embodiment, the memory cell array is highly integrated using DRAM memory cells, and the latch function of the selector is realized by utilizing the rewrite sense amplifier in the DRAM cell array. For this reason, the information processing apparatus according to the present invention can be highly integrated. In addition,
The read circuit RSA and the write circuit WS shown in FIG. 17 are performed for each memory cell, but the output lines O, O
B, if a plurality of sets of input lines I and IB are provided and writing and reading are performed in parallel on a plurality of memory cells, high-speed writing and reading can be performed. Further, by providing a parallel writing circuit as shown in FIG. 7, parallel writing can be performed on discrete memory cells on the same word line.

FIG. 19 shows the digital multipliers MTD1, MTD in the embodiments of FIGS.
2,. . , MTDk is a unit circuit of a parallel digital multiplier. Nikkei Electronics May 29, 1978
As described on page 76 to page 90, the parallel digital multiplier is configured by combining unit circuits having an input / output logical relationship as shown on the right of FIG. 19 in an array. Various unit circuits of the parallel digital multiplier have been proposed, but when the multiplier is arranged immediately below the memory cell array as in the present invention, it is desirable that the unit be arranged within a layout pitch as narrow as possible. The embodiment of the unit circuit shown in FIG. 19 has 16 nMOSs and pMOs each.
The logic shown in the right side of FIG. 19 is realized by a so-called composite gate. This circuit has the advantage that the number of transistors is small, and the number of wirings between basic circuits is small when combined in an array because input / output signals are not pair signals. In addition, since it is a CMOS circuit, the power consumption is small, and it is suitable for a case where a large number of multipliers are implemented with high integration as in the present invention. Since it is easy to understand that the input / output logic of the circuit shown on the left side of FIG. 19 is as shown by the equation on the right side of FIG. 19, the description is omitted. As described in the Nikkei Electronics May 29, 1978, p. 80, a parallel multiplier that handles two's complement requires a unit circuit to be corrected by an inverter or an OR circuit. The correction by the inverter can be realized without providing a new inverter in the multiplier if the signal from the selector is a pair signal as in the embodiment of FIG. The correction by the OR circuit may be achieved by changing the AND term of X and Y to OR in the equation on the right side of FIG. For this purpose, in the circuit of FIG.
Since the MOS may be connected in series and the nMOS may be connected in parallel, the same size as the unit circuit of FIG. 19 can be realized.
Therefore, a parallel multiplier that handles two's complement can be realized with high integration.

FIG. 20 shows a configuration example of a DA converter suitable for the embodiment of FIG. In FIG. 20, CBIAS is a common bias circuit, DAA1,. . , DAAk are DA converters. The DA converters DAA1,. . , DAA
k converts an a-bit digital signal read from a memory cell array through a data line into a current having an analog value and outputs the converted signal to output lines O1,. . , Ok. Although not shown in FIG. 20, DAB1,. . , DABk can be similarly configured. DA converter DAA
1,. . , DAAk are biased by the common bias circuit CBIAS. . , BLa. In the common bias circuit CBIAS, pMO
S-transistor MP0 is a load of current source ISO, and pMO
S transistors MP1,. . , MPa are biased. The pMOS transistors MP1,. . , MP
a has the same gate width / gate length (hereinafter, referred to as size), and the nMOS transistors MN1,. . , MNa have a ratio of 1: 2 :,. . ,: (2 to the power of a-1). In these transistors, the same current based on the current of the current source ISO flows from the positive power supply Vcc. In the DA converter DAA1, the pMOS transistor MPD0 is a load of the output line O1,
1,. . , MNCa are switch MOSs. The switch MOS MNC1,. . , MNCa are read out from the memory cell array through the data lines since their gates are connected to the data lines of the memory cell array.
It turns on and off according to the digital signal of bit. MN
D1,. . , MNDa are nMOS transistors having the same size. As can be seen from FIG. 20, the nMOS transistors MNi and MNDi (i = 1, 2,..., A)
Is a current mirror connection, switch MOS
Is turned on, a current flows through MNDi. The current flowing at this time is determined by the current mirror ratio, that is, the size ratio between the nMOS transistors MNi and MNDi. Therefore, the switch MOS MNC1,. . , MNCa are turned on, the nMOS transistors MND1,. . , MN
The ratio of the current flowing through Da is 1: (1/2) :( 1 /
4):,. . , :( 1 / (2 a-1)), that is,
(2 to the power of a-1) :,. . , 4: 2: 1, and a current obtained by adding these currents flows to the output line O1. Therefore, an a-bit digital signal read from the memory cell array through the data line is converted into an analog current, and the output lines O1,. . , Ok.

The feature of this embodiment is that a DA converter DAA1,. . , DAA
k MOS transistors MND1,. . , MNDa are kept constant. This enables high integration D
Since the A-converter can be configured, it can be easily arranged directly below the array as in the embodiment of FIG. Further, since the current value is controlled based on the current source ISO in the common bias circuit CBIAS, high-accuracy conversion can be performed.

In the embodiment shown in FIG. 20, the signal on the data line input to the DA converter need not be differential. Therefore, when a memory cell array such as a DRAM or an SRAM array that outputs a differential signal to a data line is used, one of the data line pairs may be input. Note that only one of the data line pairs is connected to the nMOS transistor MND.
1,. . , MNDa, there is a case where the capacitance of the data line pair is unbalanced due to the gate capacitance, which may adversely affect the operation. In such a case, nM
The OS transistors MND1,. . , MNDa are also connected to data lines not connected to the gates of MND1,. . , MNDa, an nMOS transistor having the same gate width and gate length may be added to balance the capacitance of the data line pair.

So far, an embodiment for realizing a neural network information processing apparatus using the present invention has been described. The neural network is used for searching for an optimal solution or for pattern recognition. When applied to pattern recognition, a pattern discriminating circuit as described below can be used to perform recognition processing even on ambiguous results. In pattern recognition using a neural network, when an input pattern is clearly classified into a certain class, an expected value corresponding to the class can be obtained as an output. However, when the input pattern is classified into any one of a plurality of classes or is delicate, it may be an intermediate value between the expected values of the plurality of classes. For example, when the input speech in speech recognition is {K}, a neuron output value (expected value) of 1111 is obtained in the output layer with respect to the speech waveform encoded and supplied to the input layer. In the case of {C}, when the connection weight value is set so as to produce an output value (expected value) of 0000, the neuron output value of the output layer is given when an intermediate sound waveform of {K}, {C} is given. May give an intermediate value such as 0001 or 1110. In such a case, the distance between the neuron output value of the output layer and the expected value 1111 for {K} or the expected value 0000 for {C} is {K} or {
It can be interpreted as a measure giving the proximity to C ｀. Therefore, even if an ambiguous output is obtained by providing a pattern discriminating circuit for comparing the neuron output value of the output layer with the expected value of the class and obtaining the distance between the output result and the expected value, it is possible to perform recognition.

FIG. 21 shows an example of the configuration of the above-described pattern determination circuit. In FIG. 21, BNY is a bit
RGT is a register for storing the converted neuron output value for one layer, M-PATTERN.
Is a register that stores the expected value of the class, and CMP is a circuit that compares the contents of the register M-PATTERN and the contents of the register RGT in parallel and outputs the Hamming distance. COMP
OUT is a circuit that compares the output result of CMP with a reference value and outputs the result. The comparator CMP includes a comparator circuit CMPU and a load resistor R _CMP provided in parallel. The comparison result conversion circuit COMPOUT includes differential amplifiers AMP211 and AMP.
212,. . , AMP21Z. The comparator CMP has a data line pair (DTG1, DTGB),. . , (DTGr, DT
GrB) and the data line pair of the register RGT (DR
1, DR1B),. . , (DRr, DRrB) are input. The operation of this embodiment is as follows.

First, the neuron output values of the final layer obtained for a certain input pattern are sequentially input to the binarization circuit BNY, and compared with the threshold value TH, converted to 1 if larger than TH and converted to 0 if smaller than TH. And store it in the register RGT.
After all the neuron output values of the last layer are binarized, the clear signal Φ _C is then raised to turn on the MOS transistor Q216.
Is turned on, and the gate voltage of the MOS transistor Q215 falls. Next, the clear signal Φ _C falls, a signal is read out from the registers RGT and M-PATTERN to the data line, and the data line potential becomes Vcc or 0 V, and then the comparator CMP is activated by the comparator activation signal Φ _CMP . Then, the data line (DTG) input to the comparison circuit
1, DR1), (DTG2, DR2),. . , (DTG
r, DRr) is exclusive OR (EXCLU)
(SIVE-OR) logic. As a result, when the information on the data line on the array M-PATTERN side matches the information on the data line on the register RGT side, the gate of the MOS transistor Q215 remains at the low potential. Transition to a high potential. For this reason, in the comparator CMPU in which information does not match between the data line on the array M-PATTERN side and the data line on the register RGT side, M
The OS transistor Q215 turns on. As a result, the data lines (DTG1, DR1), (DTG2, DR
2),. . , (DTGr, DRr), the greater the number of mismatches, the more the power supply VCMP is shifted from the load resistance RCMP.
A current flows toward the ground electrode through the switch. Therefore, the potential of the comparison line CO decreases as the number of mismatches increases.
The comparison line CO is connected to the differential amplifiers AMP211, AMP212,. . ,
It is connected to AMP21Z. The reference voltages VRC1, VRC2,. . , VRCZ are set to appropriate values, and the comparison result output lines DCO1, DCO2,. . , DCOZ
Among them, the number of high potentials increases. That is, the comparison result conversion circuit COMPOUT operates as one type of AD converter. As described above, according to the present embodiment, the register M-PA
The magnitude of the hamming distance can be obtained by comparing information read to a plurality of data lines of TTERN with information read to a plurality of data lines of a register RGT. Therefore, each expected value is stored in the register M-PATTER.
By storing the values in the N memory cells, it is possible to know how close the neuron output value is to the expected value by comparing with the neuron output value stored in the register RGT. Therefore, even when the obtained neuron output value does not match the expected value corresponding to the class, the recognition processing can be performed at high speed.

Further, by providing a plurality of binarization circuits in the embodiment of FIG. 21 and performing the binarization calculations in parallel, the processing can be performed at a higher speed.

Although the details of the differential amplifier and the binarizing circuit are omitted in the embodiment of FIG. 21, the binarizing circuit as well as the differential amplifier is simply a comparison circuit, so that it can be easily realized using ordinary circuit technology. it can.

Although the embodiment using a so-called one-transistor, one-capacitor DRAM cell has been described, other memory cells, such as an SRAM cell and an EEP cell, may be used.
Non-volatile DRA using ROM cell or ferroelectric
Of course, M memory cells can be used in the present invention. Further, for example, a portion for storing a connection weight value does not need to be frequently rewritten during information processing, so that a nonvolatile memory cell is used. The cell type can be changed according to the contents.

When a memory circuit is highly integrated using a minute memory cell such as a one-transistor one-capacitor DRAM cell, a part of the memory cell sometimes does not operate because a minute wiring is used. The neural network has a feature that even if the connection weight value is slightly changed, the effect on the function is small. However, when the memory cell storing the neuron output value does not operate, the information processing may be hindered. In order to avoid such a problem, a redundant word line or a data line as used in an ordinary highly integrated semiconductor memory can be provided so that a defective cell is not used.

Although a circuit using a CMOS has been described so far, it can also be realized by using a bipolar transistor to further increase the speed. Furthermore, it goes without saying that the present invention may be realized by other devices without being limited to bipolar transistors and MOS transistors.

Although the description has been given mainly of the hierarchical network as an example, the present invention is not limited to these, and can be applied to a neural network information processing using a Hopfield network or various types of networks. . For example, a network such as a Boltzmann machine in which neuron output values are updated stochastically can be realized. As described on page 27 of neural network information processing (Sangyo Tosho, written by Hideki Aso), the Boltzmann machine has the same network shape as a Hopfield type network,
The neuron output value (0 or 1) is characterized by being determined stochastically, not uniquely determined by the product sum of the neuron output value input to the neuron and the connection weight value. The probability P that the neuron output value becomes 1 is expressed as P = 1 / (1 + exp (-I / T)). Here, I is the product sum of the neuron output value input to the neuron and the connection weight value, and T is a parameter called temperature. According to the present invention, the above Boltzmann machine can be easily realized. For example, FIGS.
The neuron output value can be determined stochastically by changing the output characteristics of the nonlinear circuit D shown in 3, 15 over time. By changing the changing speed, the same effect as changing the temperature T can be obtained.

In the above, the application to neural network information processing has been mainly described. However, the present invention is not limited to this. A device that performs information processing by providing a high integration degree can be realized. For example, a high-speed and compact image processing system can be constructed by providing an arithmetic circuit for performing image processing and a memory cell array for storing image information on the same chip.

[0079]

As described above, according to the present invention, a selector and an arithmetic circuit are arranged adjacent to a memory cell array.
The pitch of the input line and the output line of the selector were adjusted to the data line pitch of the memory cell and the pitch of the arithmetic circuit, respectively.

Therefore, even when the pitch of the data lines of the memory array and the pitch of the input lines of the arithmetic circuit are different, the memory cell array and the arithmetic circuit can be arranged adjacent to the selector. For example, a memory array such as a DRAM having a very small data line pitch and a digital arithmetic circuit having a relatively large input line pitch can be arranged via a selector without using a long bus.

Therefore, the conventional problems such as an increase in the occupied area due to an increase in the number of buses, an increase in wiring resistance, and a non-uniform signal delay due to a difference in bus length are solved.

[Brief description of the drawings]

FIG. 1 is a diagram showing one embodiment of a configuration of a semiconductor chip using the present invention.

FIG. 2 is a diagram illustrating an embodiment of a configuration of a selector and an arithmetic circuit.

FIG. 3 is a diagram showing one embodiment of a configuration of a selector unit circuit.

FIG. 4 is a diagram showing one embodiment of a configuration when a data line of a memory cell array is divided.

FIG. 5 is a diagram showing an embodiment of a configuration of a processor that performs multiplication of a vector and a scalar.

FIG. 6 is a diagram illustrating an embodiment of a configuration of a processor that performs multiplication of a vector and a scalar.

FIG. 7 is a diagram showing an embodiment of a configuration of a parallel writing circuit suitable for the processor of FIG. 5;

FIG. 8 is a diagram showing a configuration of a hierarchical neural network.

FIG. 9 is a diagram showing a configuration of a Hopfield type neural network.

FIG. 10 is a diagram showing one embodiment of a configuration of a neuroprocessor.

FIG. 11 is a diagram showing one embodiment of a calculation algorithm having the configuration of FIG. 10;

FIG. 12 is a diagram showing one embodiment of a configuration of a neuroprocessor.

FIG. 13 is a diagram showing an embodiment of a configuration of a neuroprocessor.

FIG. 14 is a diagram showing one embodiment of a calculation algorithm having the configuration of FIG. 13;

FIG. 15 is a diagram showing one embodiment of a configuration of a neuroprocessor.

FIG. 16 is a diagram showing one embodiment of a calculation algorithm having the configuration of FIG. 15;

FIG. 17 is a diagram showing one embodiment of a selector suitable for a DRAM memory cell array.

18 is a waveform chart showing an example of the operation waveform of FIG.

FIG. 19 is a circuit diagram showing an embodiment of a unit circuit of the digital multiplier.

FIG. 20 is a circuit diagram showing one embodiment of a DA converter.

FIG. 21 is a circuit diagram showing one embodiment of a configuration of a pattern determination circuit.

FIG. 22 shows a configuration of a conventional neuroprocessor.

[Explanation of symbols]

ST, STA, STB, STC ... selector, PE, PE
A, PEB: arithmetic circuit, A, A1, A2,. . , AJ,
B, M: memory cell array, CTL: control circuit, IO:
Input / output circuit, LAT ... Latch circuit, SW, SW1, SW
2,. . , SWk: switch, D: nonlinear operation circuit, A
CC: accumulator, AD: AD converter, RA,
RGT, M-PATTERN register, DSB distributor, PR precharge circuit, SA sense amplifier, RSA read amplifier, WS write circuit, CBIAS common bias circuit, DAA1,. . ,
DAAk: DA converter, BNY: Binarization circuit, CM
P: comparator, CMPOUT: comparison result conversion circuit.

 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Ken Sakata 1-280 Higashi Koikekubo, Kokubunji-shi, Tokyo Inside the Hitachi, Ltd. Central Research Laboratory (72) Inventor Masakazu Aoki 1-280 Higashi Koikekubo, Kokubunji-shi, Tokyo Hitachi, Ltd. Central Research Laboratory

Claims (5)

[Claims] An information processing apparatus wherein a plurality of DA converters are controlled by a single bias circuit. 2. An information processing apparatus comprising a plurality of D / A converters for converting a digital signal of a plurality of bits into an analog signal and outputting the analog signal. The control circuit includes a current source serving as a reference, and the DA converter is controlled by the control circuit such that the magnitude of its output is determined by the current value of the current source. An information processing apparatus characterized by the above-mentioned. 3. The information processing apparatus according to claim 2, wherein said control circuit and said DA converter are connected in a current mirror manner. 4. The digital-to-analog converter according to claim 2, wherein the digital-to-analog converter includes a plurality of first nodes to which the digital signal is input, and first and second nodes connected in series between the first and second nodes. A plurality of converters each having a second MOSFET, wherein a gate of the first MOSFET is connected to a corresponding one of the plurality of first nodes; a gate of the second MOSFET is connected to the control circuit; An information processing device, wherein one node is supplied with a first potential, and the second node is supplied with a second potential lower than the first potential. 5. The converter according to claim 4, wherein the plurality of converters are provided in common with a third MOSFET coupled between the first node and a first potential, and a gate of the third MOSFET is connected to the first node. An information processing apparatus characterized by being coupled to a computer.