CN115993101A - Instrument for online detection of surface roughness of laser cleaning material and use method thereof - Google Patents

Instrument for online detection of surface roughness of laser cleaning material and use method thereof Download PDF

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CN115993101A
CN115993101A CN202111222929.5A CN202111222929A CN115993101A CN 115993101 A CN115993101 A CN 115993101A CN 202111222929 A CN202111222929 A CN 202111222929A CN 115993101 A CN115993101 A CN 115993101A
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sample
laser
light
optical fiber
laser cleaning
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CN202111222929.5A
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韩克利
羊送球
刘建勇
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Dalian Institute of Chemical Physics of CAS
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Dalian Institute of Chemical Physics of CAS
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Abstract

The invention discloses an instrument for detecting the surface roughness of a laser cleaning material on line and a use method thereof, belonging to the technical field of laser cleaning surface quality assessment, spectrum analysis and detection; the light source and light path system comprises a light source and light path adjusting system, a light source coupling head and an optical fiber probe which are connected through optical fibers; the sample control system is used for clamping and moving a sample to be detected; the laser cleaning system comprises a laser, a laser cleaning head, a mechanical arm, a laser and a mechanical arm controller; the spectrum detection and analysis system comprises an optical fiber probe, an optical fiber probe fixing support, a light detector, a computer and a software system, wherein the scattering and reflection spectrums of the surface of a sample are detected and analyzed while the laser is cleaned by the instrument, so that the roughness of the surface is obtained, and the online detection of the roughness of the laser cleaning surface by a scattering spectrometry is realized for the first time.

Description

Instrument for online detection of surface roughness of laser cleaning material and use method thereof
Technical Field
The invention belongs to the technical fields of laser cleaning surface quality evaluation, spectrum analysis and detection, and particularly relates to an instrument for online detection of surface roughness of a laser cleaning material and a use method thereof.
Background
At present, the surface roughness measurement of an object is a mature technology, a plurality of standard methods exist at home and abroad, and a plurality of new technologies are continuously generated. Such as measuring the surface roughness of crankshaft and camshaft journals and bearings, studying the propagation effects of surface roughness on the terahertz spectrum, optical element surface quality assessment, material surface roughness monitoring, and the like. The measurement of surface roughness generally obtains an Ra value, which can be measured using a contact or non-contact measuring instrument. Including ultrasonic testing, micrometer measurement, microscopic observation, scanning electron microscope analysis, cross-section loss method, weightlessness method, anodic current density method, image pixel acquisition analysis method, laser confocal microscope analysis, etc.
In laser cleaning operations, surface roughness is an important parameter that characterizes the degree of surface cleaning. At present, a quantitative standard for the surface cleaning degree is not established, and a visual assessment method for the surface cleaning degree recommended by the national standard GB/T8923.1-2011 is implemented, wherein the surface of a material after being subjected to spray treatment is classified into four grades of Sa1, sa2, sa21/2, sa3 and the like, and the larger the number is, the cleaner the cleaning is. However, this qualitative method has not met the current high precision measurement requirements for laser cleaning. It is important to develop a new instrument for detecting and characterizing the cleanliness of metal surfaces and to enable rapid on-line detection at the laser cleaning site.
In the aspect of monitoring the laser cleaning quality, some patents have been filed at present, wherein the technology for monitoring the laser cleaning quality by adopting a spectrum method comprises the following steps: the detection method of the laser cleaning detection equipment and the laser cleaning detection method disclosed by the Xiaohaijing [ application number: CN201910973735.5] utilizes a CCD detector to track and shoot the surface of a sample, and analyzes various images, so that the detection method is a relatively complex technology; wang Chunming and the like invent a cleaning quality monitoring device and method based on a laser cleaning device (application number: CN 201710546718.4), wherein the monitoring method is essentially to analyze RGB gray values of an image on the surface of a sample; song Feng, and the like, is to realize on-line monitoring by utilizing the change of the temperature stress by a light sensor (application number: CN 201810727906.1). The applicant has also previously filed a method for characterizing the cleanliness of a metal surface using reflectance and scattering spectra of the metal material (application number 202010498595.3). In general, there are a few technical methods for monitoring the quality of laser cleaning, but no related research for detecting the quality of the surface by tracking laser cleaning in real time has been reported.
Disclosure of Invention
In view of the above, the present invention aims to provide an apparatus for online detecting the surface roughness of a laser cleaning material and a method for using the same, which solve the technical problems of online monitoring the surface roughness of a metal in real time and judging the surface cleaning degree in the laser cleaning process.
In order to achieve the above purpose, the invention adopts the following technical scheme:
an instrument for detecting the surface roughness of a laser cleaning material on line comprises a light source and light path system, a sample and control system, a laser cleaning system and a spectrum detection and analysis system;
the light source and light path system comprises a light source and light path adjusting system (1), a light source coupling head (2) and an optical fiber probe (5) which are sequentially connected through optical fibers, wherein the light source and light path system is used for vertically irradiating auxiliary light with a wavelength corresponding to a sample to be detected to the surface of the sample to be detected through the optical fiber probe (5) to form a detection light spot (14); the sample control system (4) is used for clamping and moving a sample to be detected; the laser cleaning system comprises a laser (10), a laser cleaning head (7), a mechanical arm (8), a laser and mechanical arm controller (9); the laser and mechanical arm controller (9) controls the movement of the mechanical arm (8) and the laser (10) outputs a laser beam to the laser cleaning head (7); the spectrum detection and analysis system comprises an optical fiber probe (5), an optical fiber probe fixing bracket (6), a light detector (11) and a computer and software system (12), wherein the optical fiber probe (5) is connected with the light detector (11) through an optical fiber, the light detector (11) is electrically connected with the computer and the software system (12), and the spectrum detection and analysis system is used for collecting and analyzing reflected or scattered light of auxiliary light irradiated to a sample to be detected;
the sample control system (4) is arranged below the laser cleaning system, and the laser beam of the laser cleaning head (7) is vertically irradiated to the surface part of the sample to be cleaned to form a guide light spot (13); the optical fiber probe (5) is fixed on the laser cleaning head (7) through the optical fiber probe fixing bracket (6).
Further, the light source is any available light source, including xenon lamp, tungsten lamp and deuterium lamp, and includes, but is not limited to, monochromatic light or polychromatic light, the wavelength of the light source is 380 nm-1600 nm, and the computer determines to take a proper wavelength region for calculating the surface roughness.
Further, the height and the horizontal position of the optical fiber probe fixing bracket (6) can be adjusted; the distance between the optical fiber probe and the surface of the sample to be detected is 1-5 mm.
Further, the laser cleaning head (7) may be, but is not limited to, a standard laser cleaning equipment head.
Further, the distance between the center of the detection light spot and the center of the guide light spot is between 10mm and 50mm, and the detection light spot is properly adjusted according to the requirement of on-line measurement.
Further, the light detector (11) includes, but is not limited to, fiber optic spectrometers, monochromators and photodiodes, monochromators and photomultiplier tubes, gratings and CCD detectors, gratings and CMOS detectors; the optical detector (11) is a detection device capable of rapidly collecting optical signals, and in order to track the laser cleaning process in real time, the collection speed of the optical detector is generally required to be higher than 1000 frames; the operation of the spectrometer and the photodetector are controlled by a computer and cooperate with a sample control system (4).
Further, the sample control system (4) may be, but is not limited to, a movable platform, and the material includes, but is not limited to, sheet metal.
Further, the fiber optic spectrometer may be, but is not limited to, a commercially available fiber optic spectrometer, and may be, but is not limited to, a photodetector capable of collecting a broad spectral band.
Further, the angle at which the fiber optic probe (5) collects reflected or scattered light remains unchanged during measurement, and the optical element through which the reflected or scattered light passes may be, but is not limited to, an optical fiber.
Further, the computer and software system (12) obtains the surface roughness value of the sample by a set calculation method according to the spectrum collected by the optical detector (11) from the optical fiber probe (5).
Further, the optical fiber probe (5) may be, but is not limited to, a Y-type optical fiber, two optical fibers, and the optical fiber may be, but is not limited to, a multi-core optical fiber or a single-core optical fiber.
The invention also provides a use method of the instrument for detecting the surface roughness of the laser cleaning material on line, which mainly comprises the following steps:
(1) Selecting the wavelength of auxiliary light projected to a sample to be detected according to the substrate of the sample to be detected, and generating the auxiliary light;
(2) The laser and mechanical arm controller (9) controls the laser (10) to output laser beams to the laser cleaning head (7) to irradiate the surface part of the sample to be cleaned so as to carry out laser cleaning;
(3) The auxiliary light generated in the step (1) is vertically irradiated on the surface part of the sample cleaned by the laser in the step (2) through the optical fiber probe (5), reflected light or scattered light generated on the surface of the sample is collected by the optical fiber probe (5), is guided into the optical detector (11) through the optical fiber, and related spectrum data are saved and processed by a computer to obtain the surface roughness of the cleaned sample.
Compared with the prior art, the invention has the following beneficial effects:
the instrument for online detection of the surface roughness of the laser cleaning material is simple in structure, convenient to operate, high in measuring speed and suitable for online use, and can be well combined with laser cleaning equipment.
Drawings
In order to more clearly illustrate the embodiments of the present invention, the drawings to which the embodiments relate will be briefly described.
Fig. 1 is a schematic structural diagram of an apparatus for online detecting surface roughness of a laser cleaning material according to the present invention, wherein 1: light source and light path adjustment system, 2: optical source coupling head of optical fiber, 3: y-type optical fiber, 4: sample control system, 5: fiber optic probe, 6: optical fiber probe fixed bolster, 7: laser cleaning head, 8: mechanical arm, 9: laser and mechanical arm controller, 10: laser, 11: photodetector, 12: computer and software system, 13: guiding the light spot, 14: and detecting the light spot.
FIG. 2 shows the practical application of the instrument of the invention in the laser cleaning of aluminum alloy plate to on-line detection of surface roughness
FIG. 3 shows the practical application of the apparatus of the present invention in on-line detection of surface roughness of titanium alloy sheet material by laser cleaning
Detailed Description
The following detailed description of the invention is provided in connection with examples, but the implementation of the invention is not limited thereto, and it is obvious that the examples described below are only some examples of the invention, and that it is within the scope of protection of the invention to those skilled in the art to obtain other similar examples without inventive faculty.
Example 1
An instrument for detecting the surface roughness of a laser cleaning material on line has a structure shown in figure 1, and comprises a light source and light path system, a sample and control system, a laser cleaning system and a spectrum detection and analysis system; the light source and light path system comprises a light source and light path adjusting system (1), a light source coupling head (2) and a fiber probe (5) which are connected with one end of the Y-shaped fiber, which is not branched, wherein the light source and light path system is used for vertically irradiating auxiliary light with the wavelength corresponding to a sample to be detected to the surface of the sample to be detected through the fiber probe (5) to form a detection light spot (14); the light source is a light source generated by a xenon lamp, the wavelength range of the light source is 380 nm-1600 nm, and a computer determines to take a proper wavelength region for calculating the surface roughness; the sample control system (4) is a movable metal platform and is used for clamping and moving a sample to be detected; the laser cleaning system comprises a laser (10), a laser cleaning head (7), a mechanical arm (8), a laser and mechanical arm controller (9); the laser and mechanical arm controller (9) controls the movement of the mechanical arm (8) and the laser (10) outputs a laser beam to the laser cleaning head (7); the spectrum detection and analysis system comprises an optical fiber probe (5), an optical fiber probe fixing bracket (6), a light detector (11) and a computer and software system (12), wherein the distance between the optical fiber probe and the surface of a sample to be detected is 1-5 mm, the height and the horizontal position of the optical fiber probe fixing bracket (6) are adjustable, the light detector (11) is an optical fiber spectrometer, the acquisition speed is higher than 1000 frames, the operation of the light detector (11) is controlled by the computer and is cooperated with the sample control system (4); the optical fiber probe (5) is connected with the optical detector (11) through the optical fiber at the other end of the Y-shaped optical fiber bifurcation, the optical detector (11) is electrically connected with the computer and software system (12), and the spectrum detection and analysis system is used for collecting and analyzing reflected or scattered light of auxiliary light irradiated to a sample to be detected; the sample control system (4) is arranged below the laser cleaning system, and the laser beam of the laser cleaning head (7) is vertically irradiated to the surface part of the sample to be cleaned to form a guide light spot (13); the optical fiber probe (5) is fixed on the laser cleaning head (7) through the optical fiber probe fixing bracket (6); the distance between the center of the detection light spot and the center of the guide light spot is between 10mm and 50 mm.
Example 2
The invention relates to a use method of an instrument for detecting the surface roughness of a laser cleaning material on line, which mainly comprises the following steps:
(1) Selecting the wavelength of auxiliary light projected to a sample to be detected according to the substrate of the sample to be detected, and generating the auxiliary light;
(2) The laser and mechanical arm controller (9) controls the laser (10) to output laser beams to the laser cleaning head (7) to irradiate the surface part of the sample to be cleaned so as to carry out laser cleaning;
(3) The auxiliary light generated in the step (1) is vertically irradiated on the surface part of the sample cleaned by the laser in the step (2) through the optical fiber probe (5), reflected light or scattered light generated on the surface of the sample is collected by the optical fiber probe (5), is guided into the optical detector (11) through the optical fiber, and related spectrum intensity data are stored and processed by a computer to obtain the surface roughness of the cleaned sample.
Example 3
By using the instrument for online detection of the surface roughness of the laser cleaning material, an aluminum alloy plate is selected as a sample (shown as a picture on the left side of fig. 2), and the surface roughness obtained by cleaning the surface of the aluminum alloy plate under different laser powers is measured online according to the red arrow line in fig. 2 while laser cleaning. The right side of fig. 2 shows the signal curves obtained, and the cleaning effect at different laser powers can be compared.
By using the instrument for online detection of the surface roughness of the laser cleaning material, a titanium alloy plate is selected as a sample (shown in a picture on the left side of fig. 3), and the surface roughness obtained by cleaning the surface of the titanium alloy plate under different laser powers is measured online according to the red arrow line in fig. 3 while laser cleaning. The right side of fig. 3 shows the signal curves obtained, and the cleaning effect at different laser powers can be compared.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention.

Claims (10)

1. An instrument for detecting the surface roughness of a laser cleaning material on line is characterized by comprising a light source and light path system, a sample and control system, a laser cleaning system and a spectrum detection and analysis system;
the light source and light path system comprises a light source and light path adjusting system (1), a light source coupling head (2) and an optical fiber probe (5) which are sequentially connected through an optical fiber, wherein the light source and light path system is used for vertically irradiating auxiliary light of a sample to be detected to the surface of the sample to be detected through the optical fiber probe (5) to form a detection light spot (14); the sample control system (4) is used for clamping and moving a sample to be detected; the laser cleaning system comprises a laser (10), a laser cleaning head (7), a mechanical arm (8), a laser and mechanical arm controller (9), wherein the laser and mechanical arm controller (9) controls the movement of the mechanical arm (8) and the laser (10) outputs a laser beam to the laser cleaning head (7); the spectrum detection and analysis system comprises an optical fiber probe (5), an optical fiber probe fixing bracket (6), a light detector (11) and a computer and software system (12), wherein the optical fiber probe (5) is connected with the light detector (11) through an optical fiber, the light detector (11) is electrically connected with the computer and the software system (12), and the spectrum detection and analysis system is used for collecting and analyzing reflected or scattered light of auxiliary light irradiated to a sample to be detected;
the sample control system (4) is arranged below the laser cleaning system, and a guiding laser beam of the laser cleaning head (7) is vertically irradiated to a surface part of the sample to be cleaned to form a guiding light spot (13); the optical fiber probe (5) is fixed on the laser cleaning head (7) through the optical fiber probe fixing bracket (6).
2. The apparatus of claim 1, wherein the light source comprises a light source generated by a xenon lamp, a tungsten lamp, or a deuterium lamp, including but not limited to monochromatic or polychromatic light, and having a wavelength of 380nm to 1600nm.
3. The apparatus according to claim 1, characterized in that the height and horizontal position of the fiber optic probe fixation support (6) are adjustable; the distance between the optical fiber probe (5) and the surface of the sample to be detected is 1-5 mm.
4. An instrument according to claim 1, characterized in that the distance of the centre (14) of the detection spot from the centre of the guide spot (13) is between 10mm and 50 mm.
5. The apparatus according to claim 1, characterized in that the light detector (11) comprises, but is not limited to, a fiber optic spectrometer, a monochromator and photodiode, a monochromator and photomultiplier, a grating and CCD detector, a grating and CMOS detector; the acquisition speed of the photodetector (11) is higher than 1000 frames.
6. The apparatus of claim 1 wherein the sample control system (4) comprises, but is not limited to, a mobile platform, and the material comprises, but is not limited to, sheet metal.
7. An instrument according to claim 1, characterized in that the angle at which the fiber optic probe (5) collects reflected or scattered light remains unchanged during the measurement.
8. An instrument according to claim 1, characterized in that the computer and software system (12) obtains the sample surface roughness value by a set calculation method from the spectrum collected by the photodetector (11) from the fiber optic probe (5).
9. The apparatus according to claim 1, wherein the fiber optic probe (5) comprises, but is not limited to, a Y-type fiber optic probe, two fiber optic probes, the optical fibers comprising, but not limited to, a multi-core fiber or a single-core fiber.
10. The method of using an instrument according to any one of claims 1 to 9, comprising the steps of:
(1) Selecting auxiliary light and a wavelength range projected to the surface of a sample to be detected according to a substrate of the sample to be detected;
(2) The laser and mechanical arm controller (9) controls the laser (10) to output laser beams to the laser cleaning head (7) to irradiate the surface part of the sample to be cleaned so as to carry out laser cleaning;
(3) The auxiliary light generated in the step (1) is vertically irradiated on the surface part of the sample cleaned by the laser in the step (2) through the optical fiber probe (5), reflected light or scattered light generated on the surface of the sample is collected by the optical fiber probe (5), is guided into the optical detector (11) through the optical fiber, and related spectrum data are saved and processed by a computer to obtain the roughness of the surface of the cleaned sample.
CN202111222929.5A 2021-10-20 2021-10-20 Instrument for online detection of surface roughness of laser cleaning material and use method thereof Pending CN115993101A (en)

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Application Number Priority Date Filing Date Title
CN202111222929.5A CN115993101A (en) 2021-10-20 2021-10-20 Instrument for online detection of surface roughness of laser cleaning material and use method thereof

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Application Number Priority Date Filing Date Title
CN202111222929.5A CN115993101A (en) 2021-10-20 2021-10-20 Instrument for online detection of surface roughness of laser cleaning material and use method thereof

Publications (1)

Publication Number Publication Date
CN115993101A true CN115993101A (en) 2023-04-21

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Country Status (1)

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