CN115856750A

CN115856750A - Device and method for quickly calibrating SOC (System on chip) test system

Info

Publication number: CN115856750A
Application number: CN202310152392.2A
Authority: CN
Inventors: 段俊浩; 李全任; 包智杰
Original assignee: Nanjing Hongtai Semiconductor Technology Co ltd
Current assignee: Nanjing Hongtai Semiconductor Technology Co ltd
Priority date: 2023-02-23
Filing date: 2023-02-23
Publication date: 2023-03-28
Anticipated expiration: 2043-02-23
Also published as: CN115856750B

Abstract

The invention discloses a quick calibration device and a quick calibration method for an SOC (system on chip) test system, which are used for calibrating the SOC test system and comprise an SOC test system calibration source board card and a universal meter, wherein the SOC test system is provided with more than two functional board cards, each functional board card is provided with a Load and Measure module and more than two PMU modules, and all the EXT _ F & EXT _ S output ports on each functional board card are connected to a common EXT _ F & EXT _ S bus; the SOC test system calibration source board card is respectively connected with a public EXT _ F & EXT _ S bus of each function board card, a Load & Measure module of each function board card and a universal meter. The invention can quickly improve the calibration time by calibrating all the functional board cards in parallel at a high speed.

Description

Device and method for quickly calibrating SOC (System on chip) test system

Technical Field

The invention relates to a quick calibration device and a quick calibration method for an SOC (system on chip) test system, and belongs to the field of automatic test equipment of integrated circuits.

Background

The calibration scheme of the conventional SOC test system is that an external high-precision multimeter is utilized to calibrate each channel in the system one by one, the number of the channels of the high-density integrated circuit test system is increased in geometric grade, different calibration items are arranged in each channel, each calibration item comprises different gears, so that the calibration time of the whole system is multiplied, the time spent in calibration is an important index for measuring the test system, the single-channel calibration time of the conventional calibration scheme is 30s, one 512-channel system and one board 64 channel need about 30min, and the time required by the whole calibration is about 4.25h.

In the first conventional solution, a calibration test program is optimized, and the test efficiency is improved, but the improvement efficiency of the method is limited, because the time for reading the result of the external multimeter is constant, and the test stability is higher.

In the second traditional solution, a calibration source is added to replace an external multimeter, so that the calibration time is improved, but the scheme also increases the number of channels of the test system to increase the test time, and only optimizes the test time of the multimeter.

The two solutions have problems, and in the first traditional test method, each channel needs to be calibrated through a universal meter, so that the test efficiency is low. In the second conventional test method, the improvement of the calibration efficiency by the calibration source is limited. In conclusion, each conventional test scheme cannot significantly reduce calibration time in a high-density test system, and the increase of calibration time is cost increase, and the current test systems are all pushed to low cost and high efficiency.

Disclosure of Invention

The purpose of the invention is as follows: in order to overcome the problem that the test time of a calibration system is not substantially improved by the conventional calibration scheme, the invention provides a device and a method for quickly calibrating an SOC test system.

The technical scheme is as follows: in order to realize the purpose, the invention adopts the technical scheme that:

a quick calibration device of an SOC test system is used for calibrating the SOC test system and comprises an SOC test system calibration source board card and a universal meter, wherein the SOC test system is provided with more than two functional board cards, each functional board card is provided with a Load & Measure module and more than two PMU modules, each PMU module is provided with a module EXT _ F & EXT _ S output port, and all the module EXT _ F & EXT _ S output ports on each functional board card are connected to a common EXT _ F & EXT _ S bus; the SOC test system calibration source board card is respectively connected with a public EXT _ F & EXT _ S bus of each function board card, a Load & Measure module of each function board card and a universal meter.

Preferably: all module EXT _ F & EXT _ S output ports on each functional board card are connected to a public EXT _ F & EXT _ S bus through relays.

Preferably: the SOC test system is provided with 8 function board cards, and each function board card is provided with 64 PMU modules.

A quick calibration method of an SOC test system adopts a quick calibration device of the SOC test system, and comprises the following steps:

step 1, calibrating a calibration source: the method for calibrating the calibration source board card of the SOC test system comprises the following steps of calibrating the calibration source board card of the SOC test system through a multimeter: driving a calibration source PMU module of a calibration source board card of the SOC test system, measuring a parameter of the calibration source PMU module of the calibration source board card of the SOC test system by a calibration source measurement module of the calibration source board card of the SOC test system as a first parameter, measuring a parameter of the calibration source PMU module of the calibration source board card of the SOC test system by a multimeter as a second parameter, comparing the first parameter with the second parameter to obtain a calibration source calibration parameter, and obtaining a calibrated calibration source board card of the SOC test system according to the calibration source calibration parameter;

step 2, calibrating a load and Measure module: the method for calibrating the Load and Measure modules on each function board card by taking the calibrated SOC test system calibration source board card as a reference comprises the following steps: driving any PMU module on the ith functional board card, and measuring the PMU module driven on the ith functional board card by a Load and Measure module on the ith functional board card to obtain a first parameter; meanwhile, the calibrated SOC test system calibration source board card also measures a PMU module driven on the ith function board card to obtain a second parameter, the first parameter is compared with the second parameter to obtain a Load & Measure module calibration parameter of the ith function board card, and a calibrated Load & Measure module of the ith function board card is obtained according to the Load & Measure module calibration parameter of the ith function board card; sequentially calibrating Load and Measure modules on each functional board card;

step 3, calibrating PMU modules of all channels: sequentially calibrating each channel PMU module in each functional board by using the calibrated Load and Measure modules as a reference through a public EXT _ F & EXT _ S bus; and sequentially calibrating each channel PMU module in each functional board by using the calibrated Load and Measure module of each functional board as a reference through a public EXT _ F & EXT _ S bus: and recording the jth PMU module on the ith functional board card as an ijth PMU module, recording the Load and Measure module on the ith functional board card as the ith Load and Measure module, driving the ijth PMU module, measuring the driven ijth PMU module by the ith Load and Measure module through a public EXT _ F & EXT _ S bus to obtain the calibration parameter of the ijth PMU module, and completing the calibration of the ijth PMU module according to the calibration parameter of the ijth PMU module.

Preferably: and (4) calibrating different functional board cards in the step (3) at the same time.

Preferably, the following components: the calibration source calibration parameters in step 1 include load resistance, MI and MV.

Compared with the prior art, the invention has the following beneficial effects:

the invention makes full use of the calibration source and introduces load and measurement into each board card, so that the internal channel of each single board can be calibrated independently, the channels of different board cards can be calibrated in parallel, and the calibration time is quickly improved.

Drawings

FIG. 1 is a schematic diagram of an SOC test system.

Fig. 2 is a block diagram of the present invention.

Detailed Description

The present invention is further illustrated by the following description in conjunction with the accompanying drawings and the specific embodiments, it is to be understood that these examples are given solely for the purpose of illustration and are not intended as a definition of the limits of the invention, since various equivalent modifications will occur to those skilled in the art upon reading the present invention and fall within the limits of the appended claims.

A quick calibration device of an SOC test system is used for calibrating the SOC test system and comprises an SOC test system calibration source board card 7 and a high-precision multimeter 6, wherein the SOC test system calibration source board card 7 is mainly used for replacing an external high-precision multimeter to realize quick calibration of the SOC system, more than two functional board cards are installed on the SOC test system 1, each functional board card is provided with a Load & Measure module 5 and more than two PMU modules 2, each PMU module 2 is provided with a module EXT _ F & EXT _ S output port 4, and all the module EXT _ F & EXT _ S output ports 4 on each functional board card are connected to a common EXT _ F & EXT _ S bus 3 through relays. The SOC test system calibration source board card 7 is respectively connected with the public EXT _ F & EXT _ S bus 3 of each function board card, the Load & Measure module 5 of each function board card and the universal meter 6.

In the embodiment of the invention, the SOC test system 1 is provided with 8 functional boards, and each functional board is provided with 64 PMU modules 2.

step 1, calibrating a calibration source: calibrating the calibration source board card 7 of the SOC test system through the multimeter 6, and calibrating each parameter of the calibration source board card 7 of the SOC test system, if: the method for calibrating the calibration source board card 7 of the SOC test system comprises the following steps of loading resistors, MI, MV and the like, wherein the calibration source board card 7 of the SOC test system is provided with a calibration source PMU module and a calibration source measurement module: the calibration source PMU module of the SOC test system calibration source board card 7 is driven, the calibration source measurement module of the SOC test system calibration source board card 7 measures the parameter of the calibration source PMU module of the SOC test system calibration source board card 7 as a first parameter, meanwhile, the parameter of the calibration source PMU module of the SOC test system calibration source board card 7 is measured through the universal meter 6 as a second parameter, the first parameter is compared with the second parameter to obtain a calibration source calibration parameter, and the calibrated SOC test system calibration source board card 7 is obtained according to the calibration source calibration parameter.

Step 2, calibration of the load and Measure module 5: by taking the calibrated calibration source board card 7 of the SOC test system as a reference, the Load and Measure modules 5 on the function board cards are calibrated, and it should be noted that the function board cards in the chassis are calibrated here, so that preparation is made for the subsequent parallel calibration. The method for calibrating the Load and Measure module 5 on each functional board card comprises the following steps: and driving any PMU module 2 on the ith functional board card, and measuring the PMU module 2 driven on the ith functional board card by using a Load and Measure module 5 on the ith functional board card to obtain a first parameter. Meanwhile, the calibrated SOC test system calibration source board card 7 also measures the PMU module 2 driven on the ith function board card to obtain a second parameter, the first parameter is compared with the second parameter to obtain a calibration parameter of the Load & Measure module 5 of the ith function board card, and the calibrated Load & Measure module 5 of the ith function board card is obtained according to the calibration parameter of the Load & Measure module 5 of the ith function board card. And the Load and Measure modules 5 on the functional board cards are sequentially calibrated.

Step 3, calibrating the PMU modules 2 of each channel: and each functional board sequentially calibrates each channel PMU module 2 in the functional board through a public EXT _ F & EXT _ S bus 3 by taking the Load & MEASURE module 5 calibrated by each functional board as a reference. And each functional board sequentially calibrates each channel PMU module 2 in the functional board through a public EXT _ F & EXT _ S bus 3 by taking the calibrated Load & Measure module 5 as a reference: and recording the jth PMU module 2 on the ith functional board card as an ijth PMU module, recording the Load and Measure module 5 on the ith functional board card as the ith Load and Measure module, driving the ijth PMU module, measuring the driven ijth PMU module by the ith Load and Measure module through a public EXT _ F & EXT _ S bus 3 to obtain the calibration parameter of the ijth PMU module, and completing the calibration of the ijth PMU module according to the calibration parameter of the ijth PMU module. Different function integrated circuit boards can be calibrated simultaneously this moment.

According to the invention, through the use of the Load and Measure modules on the function board cards and the parallel calibration of a plurality of function board cards, the calibration efficiency of the whole machine is rapidly improved, and the calibration time is reduced, wherein the optimization time is very obvious. For example, a 512-channel tester and a single-function board 64 channel require 8 boards, and the existing solution requires 8 times of a single board, while the time required by the present invention is still the time required by a single board.

According to the invention, the calibration function is placed in the functional board card, so that the calibration board is separated, the types of hardware board cards are reduced, the cost of the calibration board is saved, and the competitiveness of the equipment cost is improved.

Through EXT _ F and EXT _ S bus output, the use of an output relay is reduced, the problem caused by abnormal relay is reduced, the equipment is convenient to maintain, and the stability of the performance of the equipment is improved.

The invention uses the external meter, the calibration source and the Load and Measure module of the function board card for hierarchical calibration. And the use of an output relay is reduced through EXT _ F & EXT _ S bus output. And calibrating the function board card through the Load and Measure module of the function board card. And a plurality of functional boards can be calibrated in parallel. The optimization of the calibration efficiency is very obvious, the whole system can be calibrated only by spending the time for calibrating one functional board card, just like the existing calibration scheme needs 30min for calibrating one board card, but the calibration scheme of the invention only needs 30min for calibrating the whole system, so that the calibration efficiency is greatly optimized, and the calibration time is saved.

The invention also saves the hardware cost, particularly saves the calibration board of the prior proposal, and hundreds of relays on the calibration board, which are very high cost, and the invention can reduce the cost of the whole tester and improve the competitiveness of the equipment.

The above description is only of the preferred embodiments of the present invention, and it should be noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the invention and these are intended to be within the scope of the invention.

Claims

1. The utility model provides a quick calibrating device of SOC test system for the calibration of SOC test system which characterized in that: the system comprises an SOC test system calibration source board card (7) and a universal meter (6), wherein more than two functional board cards are installed on the SOC test system (1), each functional board card is provided with a Load & Measure module (5) and more than two PMU modules (2), each PMU module (2) is provided with a module EXT _ F & EXT _ S output port (4), and all the module EXT _ F & EXT _ S output ports (4) on each functional board card are connected to a common EXT _ F & EXT _ S bus (3); the SOC test system calibration source board card (7) is respectively connected with a public EXT _ F & EXT _ S bus (3) of each function board card, a Load & Measure module (5) of each function board card and a universal meter (6).

2. The apparatus for rapidly calibrating an SOC test system according to claim 1, wherein: all module EXT _ F & EXT _ S output ports (4) on each functional board card are connected to a common EXT _ F & EXT _ S bus (3) through relays.

3. The apparatus for rapidly calibrating an SOC test system according to claim 1, wherein: SOC test system (1) installs 8 function integrated circuit boards, is provided with 64 PMU modules (2) on every function integrated circuit board.

4. A quick calibration method of an SOC test system is characterized in that: the rapid calibration device for the SOC test system of claim 1, comprising the steps of:

step 1, calibrating a calibration source: the method for calibrating the SOC test system calibration source board card (7) through the universal meter (6) comprises the following steps: a calibration source PMU module of the SOC test system calibration source board card (7) is driven, a calibration source measurement module of the SOC test system calibration source board card (7) measures a parameter of the calibration source PMU module of the SOC test system calibration source board card (7) as a first parameter, a parameter of the calibration source PMU module of the SOC test system calibration source board card (7) is measured through a multimeter (6) as a second parameter, the first parameter is compared with the second parameter to obtain a calibration source calibration parameter, and the calibrated SOC test system calibration source board card (7) is obtained according to the calibration source calibration parameter;

step 2, calibrating a load and Measure module (5): the method for calibrating the Load & Measure modules (5) on each functional board card by taking the calibrated SOC test system calibration source board card (7) as a reference comprises the following steps: driving any one PMU module (2) on the ith functional board card, and measuring the PMU module (2) driven on the ith functional board card by a Load and Measure module (5) on the ith functional board card to obtain a first parameter; meanwhile, a calibrated SOC test system calibration source board card (7) also measures a PMU module (2) driven on the ith functional board card to obtain a second parameter, the first parameter is compared with the second parameter to obtain a calibration parameter of a Load & Measure module (5) of the ith functional board card, and the calibrated Load & Measure module (5) of the ith functional board card is obtained according to the calibration parameter of the Load & Measure module (5) of the ith functional board card; the Load and Measure modules (5) on each functional board card are sequentially calibrated;

step 3, calibrating each channel PMU module (2): each functional board sequentially calibrates each channel PMU module (2) in the functional board by using the Load and Measure module (5) calibrated by each functional board as a reference through a public EXT _ F & EXT _ S bus (3); and each functional board sequentially calibrates each channel PMU module (2) in the functional board by using the calibrated Load and Measure module (5) as a reference through a public EXT _ F & EXT _ S bus (3): and recording the jth PMU module (2) on the ith functional board card as an ijth PMU module, recording the Load and Measure module (5) on the ith functional board card as the ith Load and Measure module, driving the ijth PMU module, measuring the driven ijth PMU module by the ith Load and Measure module through a public EXT _ F & EXT _ S bus (3) to obtain the calibration parameter of the ijth PMU module, and completing the calibration of the ijth PMU module according to the calibration parameter of the ijth PMU module.

5. The method for fast calibration of an SOC test system according to claim 4, wherein: and (4) calibrating different functional board cards in the step (3) at the same time.

6. The method for fast calibration of an SOC test system according to claim 5, wherein: the calibration source calibration parameters in step 1 include load resistance, MI and MV.