CN115225147B - High-resolution large-measurement-range optical delay measurement system and method - Google Patents
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/077—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using a supervisory or additional signal
- H04B10/0775—Performance monitoring and measurement of transmission parameters
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- G—PHYSICS
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/0121—Operation of devices; Circuit arrangements, not otherwise provided for in this subclass
- G02F1/0123—Circuits for the control or stabilisation of the bias voltage, e.g. automatic bias control [ABC] feedback loops
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- G—PHYSICS
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/21—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour by interference
- G02F1/212—Mach-Zehnder type
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- H—ELECTRICITY
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- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
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Abstract
The invention provides a high-resolution large-measurement-range optical delay measurement system and a high-resolution large-measurement-range optical delay measurement method, belongs to the fields of optical delay measurement and microwave photonics, and can realize large-range and high-resolution optical delay measurement. The specific technical scheme is that an optical carrier wave emitted by a laser source enters a double parallel Mach-Zehnder modulator, a linear sweep frequency source emits a linear sweep frequency signal, the signal enters a 90-degree bridge to obtain two paths of radio frequency signals with the same power and 90 degrees phase difference, the radio frequency signals are respectively input into an upper sub-modulator and a lower sub-modulator, bias voltage is adjusted through an IQ modulator controller, and a carrier suppression single-sideband signal is generated. The signal passes through the first 50: the 50 polarization maintaining coupler is divided into two paths of optical signals, the upper path directly enters the second 50:50 coupler, the lower path enters the second 50:50 coupler after passing through the device to be detected, the second 50:50 coupler is connected to the photoelectric detector for beat frequency, the photoelectric detector is connected to the frequency spectrograph, the frequency difference of the two paths of signals is detected and uploaded to the control and signal acquisition circuit, and the control and signal acquisition circuit calculates the optical delay of the optical device to be detected according to the detection result of the frequency spectrograph.
Description
Technical Field
The invention provides a high-resolution large-measurement-range optical delay measurement system and a high-resolution large-measurement-range optical delay measurement method, and belongs to the fields of optical delay measurement and microwave photonics.
Background
Optical fibers have become attractive transmission media for different fields of application, such as optical communications, optical fiber sensing, and many large scientific or engineering facilities. Delay measurement caused by fiber optic transmission is essential in these applications. Optoelectronic devices and systems such as optically controlled phased array antennas, distributed radar networks, high-speed optoelectronic chips, and the like require high-precision optical delay measurement, and for phased array antenna applications, fiber-to-the-air (FTD) measurement accuracy directly affects control accuracy, and thus affects beam forming results. For optical system design, accurate knowledge of the group delay and amplitude response of the various fiber elements is critical to optimizing the performance of these devices during the production phase and to design advanced optical networks.
Currently, optical delay measurement is mainly performed by the following methods: time domain measurement techniques, frequency domain measurement techniques, phase derived measurement techniques. The main method of the time domain measurement technology comprises the following steps: the optical time domain reflectometer is an optical test instrument for representing the physical characteristics of an optical fiber link, and is a precise photoelectric integrated instrument manufactured by utilizing Rayleigh scattering and back scattering generated by Fresnel reflection of laser during optical fiber transmission. The instrument is used primarily to test the attenuation of the entire fiber link and to provide attenuation details that are related to length. The principle of the optical delay measurement is that narrow pulse laser is emitted to the optical fiber, the pulse laser enters the optical time domain reflectometer after being reflected, and the optical delay of the optical fiber is obtained by detecting the time difference of the back and forth of the optical pulse. The disadvantage is that the power of the laser limits the measurement range of the optical delay, and dispersion in the fiber leads to pulse broadening that affects the measurement accuracy.
Frequency domain measurement technique: the optical frequency domain measuring technology mainly comprises the steps that an optical signal is output by a linear sweep-frequency light source and enters an optical beam splitter, one path of the optical signal enters a photoelectric detector after passing through a device to be measured, the other path of the optical signal directly enters the photoelectric detector, and two paths of light are subjected to beat frequency in the photoelectric detector to obtain an intermediate frequency signal, so that optical delay is calculated. Another method of optical delay is to insert the optical fiber to be measured into the optical fiber laser through the mode-locked optical fiber laser to make it become a part of the resonant cavity, and the optical fibers with different lengths make the resonant cavity different in length, so that the longitudinal mode interval of the output of the laser is changed, and the optical fiber delay is calculated by testing the longitudinal mode interval. In addition, a phase-locked loop is a novel measurement method, in which a phase change caused by a transmission delay is converted into a frequency change by phase locking, and an optical delay is calculated by measuring the change in frequency. The method has the advantages of large measurement range and high precision. The disadvantage is that coarse measurement is required before fine measurement is performed, resulting in a complicated structure and a long measurement time.
Optical phase measurement: the principle of the method is that a microwave signal is loaded on light through a modulator, the light signal passes through an optical fiber to be detected, the phase of the light signal is changed, the light signal enters a photoelectric detector to be converted into the microwave signal, and the phase difference is obtained by phase discrimination between the microwave signal and a reference signal, so that the light delay is calculated. The measurement range of this method depends on the minimum step of the microwave source and the resolution depends on the accuracy of the phase detector.
Disclosure of Invention
In order to realize the optical delay measurement with high resolution and large measurement range, the invention provides the optical delay measurement method with high resolution and large measurement range, and the method has the advantages of simple structure, good stability, high measurement precision and the like.
A high resolution large measurement range optical delay measurement system, characterized by: the device comprises a laser source, a linear sweep source, a 90-degree bridge, a double-parallel Mach-Zehnder modulator, a 1:99 polarization-maintaining coupler, a first 50:50 polarization-maintaining coupler, a second polarization-maintaining 50:50 coupler, a photoelectric detector, a frequency spectrograph, an IQ modulator controller and a control and signal acquisition circuit.
The light source, the double parallel Mach-Zehnder modulator, the 1:99 polarization-maintaining coupler, the first 50:50 polarization-maintaining coupler, the optical device to be tested, the second 50:50 polarization-maintaining coupler and the photoelectric detector are sequentially connected through optical fibers;
the linear sweep source, the 90-degree bridge and the double-parallel Mach-Zehnder modulator are sequentially connected through cables;
the photoelectric detector, the spectrometer and the control circuit are connected through cables in sequence;
the 1:99 polarization maintaining coupler is connected with the IQ modulator controller through an optical fiber to provide feedback information for the bias control circuit;
the IQ modulator controller is connected with the double parallel Mach-Zehnder modulators through cables;
the control and signal acquisition circuit is connected with the light source through a cable;
the control and signal acquisition circuit is connected with the sweep frequency signal source through a cable;
a high-resolution large-measurement-range optical delay measurement method comprises the following steps:
the laser source emits an optical carrier signal to enter a double parallel Mach-Zehnder modulator, a radio frequency signal emitted by the linear sweep source is input into a 90-degree bridge so as to obtain two paths of radio frequency signals with equal intensity and 90-degree phase difference, and the two paths of radio frequency signals are respectively input into an upper sub Mach-Zehnder modulator and a lower sub Mach-Zehnder modulator of the double parallel Mach-Zehnder modulator; the carrier suppression single sideband signal enters a 1:99 polarization maintaining coupler, 1% of optical signals of the carrier suppression single sideband signal enter an IQ modulator controller as feedback signals, the IQ modulator controller controls three bias voltages on a double parallel Mach-Zehnder modulator according to the intensity of the feedback optical signals, carrier suppression single sideband modulation of +1 order signals is achieved, and 99% of optical signals pass through a first 50: the 50 polarization maintaining coupler is divided into two paths of identical optical signals, the upper path directly enters the second 50:50 polarization maintaining coupler, the lower path enters the second 50:50 polarization maintaining coupler after passing through a device to be tested, and the two paths of optical signals enter the photoelectric detector after being combined; the two paths of optical signals are subjected to beat frequency in the photoelectric detector to obtain intermediate frequency signals, the intermediate frequency signals enter the frequency spectrograph for detection, the frequency spectrograph transmits detected signal frequency information to the control and signal acquisition circuit, and the control and signal acquisition circuit calculates the optical delay of the device to be detected according to the sweep slope of the linear sweep source; the control and signal acquisition circuit controls the sweep frequency source to pass through sweep frequency periods with different durations, so that the optical delay measurement with different ranges can be realized. And combining the sweep slope of the sweep source to realize high-resolution and large-measurement-range optical delay measurement.
In order to realize high-resolution optical delay measurement of an optical device, the method in the field of microwave photonics is selected, the double-parallel Mach-Zehnder electro-optical modulator and the linear sweep frequency signal source are introduced, and the specific measurement resolution is determined by the bandwidth of the sweep frequency source, so that the linear sweep frequency signal source with excellent performance is selected as much as possible during actual use. In order to improve the measuring range, the invention selects the sweep frequency source with adjustable sweep frequency period, and the measuring range is determined by the sweep frequency period. In order to make the system more stable, the invention uses the bias control circuit to make the double-levelThree DC bias voltages V for a Mach-Zehnder modulator DC1 、V DC2 、V DC3 And adjusting to enable the double parallel Mach-Zehnder modulator to output a carrier suppressed single sideband optical signal.
The invention has the beneficial effects that:
the tunable optical delay measuring range can be realized by adjusting the sweep frequency period of the linear sweep frequency source;
the scanning signal adopted by the invention is a carrier suppression single sideband signal, so that the influence of redundant sidebands on measurement stability can be effectively avoided;
the invention adopts a large bandwidth sweep frequency source, and can effectively improve the measurement resolution.
Drawings
Fig. 1 is a schematic diagram of a link structure of a high resolution large measurement range optical delay measurement system.
Detailed Description
The invention is further described with reference to the accompanying drawings and mathematical derivations:
the device comprises a laser source, a linear sweep source, a 90-degree bridge, a double-parallel Mach-Zehnder modulator, a 1:99 polarization-maintaining coupler, a first 50:50 polarization-maintaining coupler, a second polarization-maintaining 50:50 coupler, a photoelectric detector, a frequency spectrograph, an IQ modulator controller and a control and signal acquisition circuit.
The light source, the double parallel Mach-Zehnder modulator, the 1:99 polarization-maintaining coupler, the first 50:50 polarization-maintaining coupler, the optical device to be tested, the second 50:50 polarization-maintaining coupler and the photoelectric detector are sequentially connected through optical fibers;
the linear sweep source, the 90-degree bridge and the double-parallel Mach-Zehnder modulator are sequentially connected through cables;
the photoelectric detector, the spectrometer and the control and signal acquisition circuit are connected through cables in sequence;
the 1:99 polarization maintaining coupler is connected with the IQ modulator controller through an optical fiber to provide feedback information for the bias control circuit;
the IQ modulator controller is connected with the double parallel Mach-Zehnder modulators through cables;
the control and signal acquisition circuit is connected with the light source through a cable;
the control and signal acquisition circuit is connected with the sweep frequency signal source through a cable;
step one, controlling a light source to emit a light signal as a carrier wave, and setting the center frequency of the light carrier wave as omega 0 Amplitude of E 0 . The expression of the optical carrier is
After the optical signal enters the double parallel Mach-Zehnder modulators, power is equally divided into upper and lower sub Mach-Zehnder modulators.
Step two: the linear sweep source is controlled to generate a linear sweep signal, which is analyzed here for ease of understanding, taking as an example a radio frequency signal having an angular velocity ω and a voltage amplitude V. The expression of the radio frequency signal is V (t) =V 0 The cos omega enters a 90-degree bridge to generate two paths of signals with equal intensity and 90-degree phase difference, and the signals are used as modulation signals to be respectively loaded to an upper arm and a lower arm of the double parallel Mach-Zehnder modulator. The expressions of the output light of the upper arm and the lower arm are respectively
The output optical signal expression of the double parallel Mach-Zehnder modulator is that
Wherein the method comprises the steps ofFor modulating the index, V π Is Mach-ZehnderThe half-wave voltage of the modulator. The double parallel Mach-Zehnder modulator comprises an upper path and a lower path, wherein the upper path and the lower path further comprise an upper arm and a lower arm, and the upper arm and the lower arm are respectively provided with a lower arm and a lower arm>Indicating the phase difference of the optical signals of the upper and lower arms in the upper way, ">Indicating the phase difference of the optical signals of the upper and lower arms in the lower way, ">Is the phase difference of the upper and lower paths of optical signals of the double parallel Mach-Zehnder modulator, V DC1 、V DC2 The amplitude values of the first externally-applied direct-current bias voltage and the second externally-applied direct-current bias voltage of the double-parallel Mach-Zehnder modulator are respectively. V (V) DC3 The amplitude value of the third externally-added DC bias voltage of the double-parallel Mach-Zehnder modulator; the expression of the output light field of the double parallel Mach-Zehnder modulator is that
J n (m) is a first class of Bessel functions, where the value of n represents the order of the sidebands, such as: j (J) 0 (m) represents a carrier wave, J 1 (m) represents a positive first-order sideband, J -1 (m) represents a negative first-order sideband. According to the small signal approximation, only the optical carrier wave and the + -1-order sidebands are reserved, and the output light field expression of the double-parallel Mach-Zehnder modulator is that
Setting the bandwidth of the emitted signal of the linear sweep sourceF, the sweep period is T, the sweep slope is k=f/T, and the time required for the optical signal to pass through the upper path is T 1 The time required for the down road is t 2
The optical signal expression of the upper path is
The optical signal expression of the device to be tested is that
Where H is the insertion loss of the device under test.
The two paths of optical signals enter a photoelectric detector to perform beat frequency, and the obtained photocurrent intensity is
i(t)＝R|E 1 (t)+E 2 (t)| 2 (10)
Wherein R is the loudness of the photoelectric detector, and the beat frequency aims to obtain an intermediate frequency signal, and the frequency of the intermediate frequency signal is the frequency difference of two paths of optical signals.
Step three: and detecting the intermediate frequency signal after the beat frequency of the photoelectric detector by using a frequency spectrograph. The frequency difference of the upper and lower paths is obtained,
f＝2π(kt 1 -kt 2 ) (12)
the optical delay is therefore τ=t 1 -t 2 =f/2pi.k. The maximum value of the optical delay tau is the sweep period T, so the larger the sweep period T is, the larger the range of the optical delay tau is.
In summary, we propose a high-resolution and large-measurement-range optical delay measurement system and method, which realize fast and stable optical delay measurement of an optical device.
Claims (2)
1. A high resolution large measurement range optical delay measurement system, characterized by: the device comprises a laser source, a linear sweep source, a 90-degree bridge, a double-parallel Mach-Zehnder modulator, a 1:99 polarization-maintaining coupler, a first 50:50 polarization-maintaining coupler, a second 50:50 polarization-maintaining coupler, a photoelectric detector, a frequency spectrograph, an IQ modulator controller and a control and signal acquisition circuit;
the laser source, the double parallel Mach-Zehnder modulator, the 1:99 polarization-maintaining coupler, the first 50:50 polarization-maintaining coupler, the optical device to be tested, the second 50:50 polarization-maintaining coupler and the photoelectric detector are sequentially connected through optical fibers;
the linear sweep source, the 90-degree bridge and the double-parallel Mach-Zehnder modulator are sequentially connected through cables;
the photoelectric detector, the spectrometer and the control and signal acquisition circuit are connected through cables in sequence;
the 1:99 polarization maintaining coupler is connected with the IQ modulator controller through an optical fiber to provide feedback information for the IQ modulator controller;
the IQ modulator controller is connected with the double parallel Mach-Zehnder modulators through cables;
the control and signal acquisition circuit is connected with the laser source through a cable;
the control and signal acquisition circuit is connected with the linear sweep frequency source through a cable;
the laser source emits an optical carrier signal to enter a double parallel Mach-Zehnder modulator, a radio frequency signal emitted by the linear sweep source is input into a 90-degree bridge so as to obtain two paths of radio frequency signals with equal intensity and 90-degree phase difference, and the two paths of radio frequency signals are respectively input into an upper sub Mach-Zehnder modulator and a lower sub Mach-Zehnder modulator of the double parallel Mach-Zehnder modulator; the double parallel Mach-Zehnder modulator outputs a carrier-suppressed single sideband signal, the carrier-suppressed single sideband signal enters a 1:99 polarization maintaining coupler, wherein 1% of optical signals enter an IQ modulator controller as feedback signals, the IQ modulator controller controls three bias voltages on the double parallel Mach-Zehnder modulator according to the intensity of the feedback optical signals, carrier-suppressed single sideband modulation of +1 order signals is achieved, and 99% of optical signals pass through a first 50: the 50 polarization maintaining coupler is divided into two paths of identical optical signals, the upper path is directly connected into a second 50:50 polarization maintaining coupler, the lower path enters the second 50:50 polarization maintaining coupler after passing through a device to be tested, and the two paths of optical signals enter the photoelectric detector after being combined; the two paths of optical signals are subjected to beat frequency in the photoelectric detector to obtain intermediate frequency signals, the intermediate frequency signals enter the frequency spectrograph for detection, the frequency spectrograph transmits detected signal frequency information to the control and signal acquisition circuit, and the control and signal acquisition circuit calculates the optical delay of the device to be detected according to the sweep slope of the linear sweep source; the control and signal acquisition circuit controls the sweep source, and realizes the optical delay measurement in different ranges through sweep periods with different durations, and finally completes the optical delay measurement in high resolution and large measurement range.
2. A measurement method based on the system of claim 1, characterized by comprising the following procedures:
the laser source emits an optical carrier signal to enter a double parallel Mach-Zehnder modulator, a radio frequency signal emitted by the linear sweep source is input into a 90-degree bridge so as to obtain two paths of radio frequency signals with equal intensity and 90-degree phase difference, and the two paths of radio frequency signals are respectively input into an upper sub Mach-Zehnder modulator and a lower sub Mach-Zehnder modulator of the double parallel Mach-Zehnder modulator; the double parallel Mach-Zehnder modulator outputs a carrier-suppressed single sideband signal, the carrier-suppressed single sideband signal enters a 1:99 polarization maintaining coupler, 1% of optical signals of the carrier-suppressed single sideband signal enter an IQ modulator controller as feedback signals, the IQ modulator controller controls three bias voltages on the double parallel Mach-Zehnder modulator according to the intensity of the feedback optical signals, carrier-suppressed single sideband modulation of +1 order signals is achieved, and 99% of optical signals pass through a first 50: the 50 polarization maintaining coupler is divided into two paths of identical optical signals, the upper path is directly connected into a second 50:50 polarization maintaining coupler, the lower path enters the second 50:50 polarization maintaining coupler after passing through a device to be tested, and the two paths of optical signals enter the photoelectric detector after being combined; the two paths of optical signals are subjected to beat frequency in the photoelectric detector to obtain intermediate frequency signals, the intermediate frequency signals enter the frequency spectrograph for detection, the frequency spectrograph transmits detected signal frequency information to the control and signal acquisition circuit, and the control and signal acquisition circuit calculates the optical delay of the device to be detected according to the sweep slope of the linear sweep source; the control and signal acquisition circuit controls the sweep source, and realizes the optical delay measurement in different ranges through sweep periods with different durations, and finally completes the optical delay measurement in high resolution and large measurement range.
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| EP2461498A1 (en) * | 2010-12-02 | 2012-06-06 | Fujitsu Limited | Optical transmitter and optical transmitter unit |
| CN110926511A (en) * | 2019-12-06 | 2020-03-27 | 北京工业大学 | Broadband high-resolution spectral response measurement system and method |
| CN111464241A (en) * | 2020-04-06 | 2020-07-28 | 陈浩 | Measurement system and measurement method for improving precision of arrival angle of microwave signal |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| EP2461498A1 (en) * | 2010-12-02 | 2012-06-06 | Fujitsu Limited | Optical transmitter and optical transmitter unit |
| CN110926511A (en) * | 2019-12-06 | 2020-03-27 | 北京工业大学 | Broadband high-resolution spectral response measurement system and method |
| CN111464241A (en) * | 2020-04-06 | 2020-07-28 | 陈浩 | Measurement system and measurement method for improving precision of arrival angle of microwave signal |
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