CN114325198B - Testing device and testing system - Google Patents
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- CN114325198B CN114325198B CN202111682301.3A CN202111682301A CN114325198B CN 114325198 B CN114325198 B CN 114325198B CN 202111682301 A CN202111682301 A CN 202111682301A CN 114325198 B CN114325198 B CN 114325198B
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Abstract
The application provides a testing device and a testing system. The device comprises: the system comprises a circuit attribute output module, an instruction detection module, a signal detection module and a controller, wherein the controller is used for controlling the circuit attribute output module to output a preset value to satellite integrated electronic equipment so as to enable the satellite integrated electronic equipment to feed back a comparison value; the instruction detection module is used for detecting first pulse signal data corresponding to the satellite comprehensive electronic equipment when the satellite comprehensive electronic equipment sends an instruction to external equipment, and sending the first pulse signal data to the controller; the signal detection module is used for detecting second pulse signal data corresponding to the satellite integrated electronic equipment when sending out signals and sending the second pulse signal data to the controller; and the controller is also used for generating fault information if the satellite integrated electronic equipment is determined to have faults according to the comparison value or the first pulse signal data or the second pulse signal data. The device can carry out comprehensive test on satellite comprehensive electrons, does not need to manually analyze test data, and can effectively improve the test efficiency.
Description
Technical Field
The application relates to the technical field of testing, in particular to a testing device and a testing system.
Background
The satellite comprehensive electronic system is an important component of a satellite platform, and is used as a satellite information data processing core to manage satellite flight, manage satellite comprehensive data, control satellite attitude, orbit control, GPS signal processing, satellite remote control and telemetry, satellite load management and other tasks. Whether the satellite can work normally or not, the satellite comprehensive electrons play a vital role, so that the satellite comprehensive electrons are particularly important to test in the satellite development stage.
The current satellite comprehensive electronic test is to test satellite comprehensive electrons by a plurality of scattered test devices, and evaluate the satellite comprehensive electrons according to the test results of the test devices.
The existing satellite comprehensive electronic test environment is complex to build, the test procedure is complex, and the test data needs to be manually recorded and manually judged, so that the test efficiency is low.
Disclosure of Invention
The application provides a testing device and a testing system for solving the problems that the existing satellite comprehensive electronic test needs to be tested on a plurality of testing devices and the test result needs to be judged manually, so that the testing efficiency is low.
In a first aspect, the present application provides a test device comprising: the device comprises a circuit attribute output module, an instruction detection module, a signal detection module and a controller, wherein the controller is respectively connected with the circuit attribute output module, the instruction detection module and the signal detection module, and the device is connected with satellite comprehensive electronic equipment;
the controller is used for controlling the circuit attribute output module to output a preset value to the satellite comprehensive electronic equipment so as to enable the satellite comprehensive electronic equipment to feed back a corresponding comparison value;
the instruction detection module is used for detecting first pulse signal data corresponding to the satellite comprehensive electronic equipment when the satellite comprehensive electronic equipment sends an instruction to external equipment, and sending the first pulse signal data to the controller;
the signal detection module is used for detecting second pulse signal data corresponding to the satellite integrated electronic equipment when sending out signals and sending the second pulse signal data to the controller;
the controller is further configured to generate corresponding fault information if it is determined that the satellite integrated electronic device has a corresponding fault according to the comparison value or the first pulse signal data or the second pulse signal data.
In a second aspect, the present application provides a test system comprising: the test device of the first aspect and a satellite integrated electronic device connected to the test device;
and the testing device is used for generating corresponding fault information when determining that the satellite integrated electronic equipment has faults.
The test device and the test system provided by the application comprise a circuit attribute output module, an instruction detection module, a signal detection module and a controller, wherein the controller is respectively connected with the circuit attribute output module, the instruction detection module and the signal detection module, and the device is connected with satellite integrated electronic equipment; the controller is used for controlling the circuit attribute output module to output a preset value to the satellite comprehensive electronic equipment so as to enable the satellite comprehensive electronic equipment to feed back a corresponding comparison value; the instruction detection module is used for detecting first pulse signal data corresponding to the satellite comprehensive electronic equipment when the satellite comprehensive electronic equipment sends an instruction to external equipment, and sending the first pulse signal data to the controller; the signal detection module is used for detecting second pulse signal data corresponding to the satellite integrated electronic equipment when sending out signals and sending the second pulse signal data to the controller; the controller is further configured to generate corresponding fault information if it is determined that the satellite integrated electronic device has a corresponding fault according to the comparison value or the first pulse signal data or the second pulse signal data. The testing device not only can carry out a plurality of comprehensive tests on the satellite comprehensive electronic equipment, but also can determine the fault reason, does not need to use a plurality of testing equipment, does not need to manually analyze test data, and can effectively improve the testing efficiency.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application.
FIG. 1 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a testing device according to a second embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a test system according to a sixth embodiment of the present invention;
fig. 4 is a schematic structural diagram of a load device according to a seventh embodiment of the present invention.
Symbol description:
100-test device 101-circuit attribute output module 102-instruction detection module
103-signal detection module 104-controller 105-current output module
106-voltage output module 107-resistance output module 108-instruction output module
200-test System 201-satellite Integrated electronic device 202-load device
203-programmable power supply 204-protection circuit 205-resistance load device
206-heat sink 207-status indication device
Specific embodiments thereof have been shown by way of example in the drawings and will herein be described in more detail. These drawings and the written description are not intended to limit the scope of the inventive concepts in any way, but to illustrate the concepts of the present application to those skilled in the art by reference to specific embodiments.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples are not representative of all implementations consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present application as detailed in the accompanying claims.
For a clear understanding of the technical solutions of the present application, the prior art solutions will be described in detail first.
In the prior art, satellite comprehensive electrons are important components of a satellite platform, and serve as a satellite information data processing core to manage satellite flight, manage satellite comprehensive data, control satellite attitude, orbit control, GPS signal processing, satellite remote control telemetry, satellite load management and other tasks. Whether the satellite can work normally or not, the satellite comprehensive electrons play a vital role, so that the satellite comprehensive electrons are particularly important to test in the satellite development stage. The existing satellite comprehensive electronic test is to test satellite comprehensive electrons by a plurality of scattered test devices, and evaluate the satellite comprehensive electrons according to the test results of the test devices.
The existing mode that is tested satellite integrated electronics by a plurality of scattered test equipment, every test equipment all need professional operating personnel, and need artifical record test data, and the test process is intelligent inadequately, needs the test personnel to carry out analysis and judgment to data, and whole test process needs to consume a large amount of manpowers that is the time, leads to the test inefficiency.
Therefore, aiming at the problems that the test of the satellite comprehensive electronics in the prior art needs to be carried out on a plurality of test devices and the test results need to be judged manually, so that the test efficiency is low, the inventor finds out in the research that a circuit attribute output module, an instruction detection module, a signal detection module and a controller are arranged in a test device, the controller is respectively connected with the circuit attribute output module, the instruction detection module and the signal detection module, and the test device is connected with the satellite comprehensive electronics; the controller is used for controlling the circuit attribute output module to output a preset value to the satellite comprehensive electronic equipment so as to enable the satellite comprehensive electronic equipment to feed back a corresponding comparison value; the instruction detection module is used for detecting first pulse signal data corresponding to the satellite comprehensive electronic equipment when the satellite comprehensive electronic equipment sends an instruction to external equipment and sending the first pulse signal data to the controller; the signal detection module is used for detecting second pulse signal data corresponding to the satellite integrated electronic equipment when sending out signals and sending the second pulse signal data to the controller; and the controller is also used for generating corresponding fault information if the satellite integrated electronic equipment is determined to have corresponding faults according to the comparison value or the first pulse signal data or the second pulse signal data. The testing device not only can carry out a plurality of comprehensive tests on the satellite comprehensive electronic equipment, but also can determine the fault reason, does not need to use a plurality of testing equipment, does not need to manually analyze test data, and can effectively improve the testing efficiency.
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
Example 1
Fig. 1 is a schematic structural diagram of a testing device according to an embodiment of the invention.
The invention provides a testing device 100, which comprises a circuit attribute output module 101, an instruction detection module 102, a signal detection module 103 and a controller 104, wherein the controller 104 is respectively connected with the circuit attribute output module 101, the instruction detection module 102 and the signal detection module 103, and the device is connected with satellite integrated electronic equipment; the controller 104 is configured to control the circuit attribute output module 101 to output a preset value to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding comparison value; the instruction detection module 102 is configured to detect first pulse signal data corresponding to when the satellite integrated electronic device sends an instruction to an external device, and send the first pulse signal data to the controller 104; the signal detection module 103 is configured to detect second pulse signal data corresponding to when the satellite integrated electronic device sends out a signal, and send the second pulse signal data to the controller 104; and the controller 104 is configured to generate corresponding fault information if it is determined that the satellite integrated electronic device has a corresponding fault according to the comparison value or the first pulse signal data or the second pulse signal data.
Referring to fig. 1, the test apparatus 1 is provided with a circuit attribute output module 101, an instruction detection module 102, a signal detection module 103, and a controller 104, and the controller 104 is connected to the circuit attribute output module 101, the instruction detection module 102, and the signal detection module 103 via buses, respectively. The controller 104 may be a PXI controller, or a PXIe controller, where the pxil controller or the PXIe controller is connected to the circuit attribute output module 101, the instruction detection module 102, and the signal detection module 103 through a PXI bus, and the testing device 1 is further connected to a satellite integrated electronic device.
The circuit attribute output module 101 is configured to output a preset value, where the preset value includes a preset current value, a preset voltage value, and a preset resistance value, and the controller 104 controls the circuit attribute output module 101 to output the preset value to the satellite integrated electronic device, where the satellite integrated electronic device can read the value and feed back a corresponding comparison value to the testing device 1. The controller 104 receives the corresponding comparison value sent by the satellite integrated electronic device, the controller 104 determines whether the satellite integrated electronic device has a corresponding fault according to the corresponding comparison value, and if the controller 104 determines that the satellite integrated electronic device has the corresponding fault according to the corresponding comparison value, the controller generates corresponding fault information.
The instruction detection module 102 is configured to detect first pulse signal data corresponding to when the satellite integrated electronic device sends an instruction to an external device, where the instruction detection module 102 sends the first pulse signal data to the controller 104. The controller 104 determines whether the satellite integrated electronic device has a corresponding fault according to the first pulse signal data, and if the controller 104 determines that the satellite integrated electronic device has a corresponding fault according to the first pulse signal data, the controller generates corresponding fault information.
The signal detection module 103 may be a PPS detection module, that is, a second pulse signal detection module, where the signal detection module 103 is configured to detect second pulse signal data corresponding to when the satellite integrated electronic device sends a signal, and the signal detection module 103 sends the second pulse signal data to the controller 104. The controller 104 determines whether the satellite integrated electronic device has a corresponding fault according to the second pulse signal data, and if the controller 104 determines that the satellite integrated electronic device has a corresponding fault according to the second pulse signal data, the controller generates corresponding fault information. The testing device not only can carry out a plurality of comprehensive tests on the satellite comprehensive electronic equipment, but also can determine the fault reason, does not need to use a plurality of testing equipment, does not need to manually analyze test data, and can effectively improve the testing efficiency.
Example two
Fig. 2 is a schematic structural diagram of a testing device according to a second embodiment of the present invention.
In the test device 100 provided by the invention, the circuit attribute output module comprises a current output module 105, a voltage output module 106 and a resistance output module 107; the controller 104 is further configured to control the current output module 105 to output a preset current to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding first comparison value; the controller 104 is further configured to control the voltage output module 106 to output a preset voltage to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding second comparison value; the controller 104 is further configured to control the resistor output module 107 to output a preset resistor to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding third comparison value; the controller 104 is further configured to determine whether the satellite integrated electronic device has a corresponding fault according to the first comparison value, the second comparison value, and the third comparison value, respectively.
Referring to fig. 2, the circuit attribute output module (not shown in fig. 2) includes a current output module 105, the current output module 105 is configured to output a preset current value, and the controller 104 controls the current output module 105 to output the preset current value to the satellite integrated electronic device, and the satellite integrated electronic device reads the value and feeds back the first comparison value. The controller 104 determines whether the satellite integrated electronic device has a corresponding fault according to the first comparison value, and if the controller 104 determines that the satellite integrated electronic device has a corresponding fault according to the first comparison value, corresponding fault information is generated.
Referring to fig. 2, the circuit attribute output module further includes a voltage output module 106, where the voltage output module 106 is configured to output a preset voltage value, and the controller 104 controls the voltage output module 106 to output the preset voltage value to the satellite integrated electronic device, and the satellite integrated electronic device reads the value and feeds back the second comparison value. The controller 104 determines whether the satellite integrated electronic device has a corresponding fault according to the second comparison value, and if the controller 104 determines that the satellite integrated electronic device has a corresponding fault according to the second comparison value, corresponding fault information is generated.
Referring to fig. 2, the circuit attribute output module further includes a resistance output module 107, where the resistance output module 107 is configured to output a preset resistance value, and the controller 104 controls the resistance output module 107 to output the preset resistance value to the satellite integrated electronic device, and the satellite integrated electronic device reads the value and feeds back the third comparison value. The controller 104 determines whether the satellite integrated electronic device has a corresponding fault according to the third comparison value, and if the controller 104 determines that the satellite integrated electronic device has a corresponding fault according to the third comparison value, the controller generates corresponding fault information.
Optionally, the controller 104, when configured to determine whether the satellite integrated electronic device has a corresponding fault according to the first comparison value, specifically includes: determining whether the first comparison value is consistent with a preset first comparison value corresponding to the preset current; if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if not, determining that the satellite integrated electronic equipment has corresponding faults.
The controller 104 obtains a preset first comparison value corresponding to the preset current, and the controller 104 compares the first comparison value with the preset first comparison value corresponding to the preset current to determine whether the first comparison value is consistent with the preset first comparison value corresponding to the preset current; if the first comparison value is consistent with a preset first comparison value corresponding to the preset current, determining that the satellite integrated electronic equipment does not have corresponding faults; if the first comparison value is inconsistent with the preset first comparison value corresponding to the preset current, determining that the satellite integrated electronic equipment has corresponding faults, and further generating corresponding fault information.
Optionally, the controller 104, when configured to determine whether the satellite integrated electronic device has a corresponding fault according to the second comparison value, specifically includes: determining whether the second comparison value is consistent with a preset second comparison value corresponding to the preset voltage; if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if not, determining that the satellite integrated electronic equipment has corresponding faults.
The controller 104 obtains a preset second comparison value corresponding to the preset voltage, and the controller 104 compares the second comparison value with the preset second comparison value corresponding to the preset voltage to determine whether the second comparison value is consistent with the preset second comparison value corresponding to the preset voltage; if the second comparison value is consistent with a preset second comparison value corresponding to the preset voltage, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if the second comparison value is inconsistent with the preset second comparison value corresponding to the preset voltage, determining that the satellite integrated electronic equipment has corresponding faults, and further generating corresponding fault information.
Optionally, the controller 104, when configured to determine whether the satellite integrated electronic device has a corresponding fault according to the third comparison value, specifically includes: determining whether the third value is consistent with a preset third comparison value corresponding to the preset resistor; if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if not, determining that the satellite integrated electronic equipment has corresponding faults.
The controller 104 obtains a preset third comparison value corresponding to the preset resistor, and the controller 104 compares the second comparison value with the preset third comparison value corresponding to the preset resistor to determine whether the second comparison value is consistent with the preset third comparison value corresponding to the preset resistor; if the third comparison value is consistent with a preset third comparison value corresponding to the preset resistor, determining that the satellite integrated electronic equipment does not have corresponding faults; if the third comparison value is inconsistent with the preset third comparison value corresponding to the preset resistor, determining that the satellite integrated electronic equipment has corresponding faults, and further generating corresponding fault information. The voltage, the voltage and the resistance of the satellite integrated electronic equipment can be tested through the testing device, a plurality of testing devices are not needed, and the test data are not needed to be manually analyzed, so that the test efficiency can be effectively improved.
Example III
Optionally, the controller is configured, when determining that the satellite integrated electronic device has a corresponding fault according to the first pulse signal data, specifically to: determining whether the first pulse signal data is within a first preset pulse data range; if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if not, determining that the satellite integrated electronic equipment has corresponding faults.
The method comprises the steps that a controller obtains a first preset pulse data range, the controller determines whether first pulse signal data are in the first preset pulse data range, wherein the first pulse signal data can be pulse signal width, and if the first pulse signal data are in the first preset pulse data range, it is determined that corresponding faults do not exist in satellite comprehensive electronic equipment; if the first pulse signal data is not in the first preset pulse data range, determining that the satellite integrated electronic equipment has corresponding faults, and further generating corresponding fault information.
Example IV
Optionally, the controller is configured, when determining that the satellite integrated electronic device has a corresponding fault according to the second pulse signal data, specifically to: determining whether the second pulse signal data is within a second preset pulse data range; if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if not, determining that the satellite integrated electronic equipment has corresponding faults.
The controller acquires a second preset pulse data range, and the controller determines whether the second pulse signal data is within the second preset pulse data range, wherein the second pulse signal data can be pulse signal width, and the second preset pulse data range can be set to be 0.01 ms-10 ms. If the second pulse signal data is in a second preset pulse data range, determining that the satellite comprehensive electronic equipment does not have corresponding faults; if the second pulse signal data is not in the second preset pulse data range, determining that the satellite integrated electronic equipment has corresponding faults, and further generating corresponding fault information.
Optionally, the second pulse signal data may be a pulse signal type, and the second preset pulse data may also be a preset pulse signal type, where the controller is configured to, when determining that the satellite integrated electronic device has a corresponding fault according to the second pulse signal data, specifically: determining whether the second pulse signal data is second preset pulse data; if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault; if not, determining that the satellite integrated electronic equipment has corresponding faults.
The controller determines whether the pulse signal type is a preset pulse signal type, wherein the preset pulse signal type comprises positive pulses or negative pulses, and if the pulse signal type is the preset pulse signal type, the controller determines that the satellite integrated electronic equipment does not have corresponding faults; if the pulse signal type is not the preset pulse signal type, determining that the satellite integrated electronic equipment has corresponding faults, and further generating corresponding fault information.
Example five
Optionally, the test device 100 further includes an instruction output module 108, where the instruction output module 108 is connected to the controller; and the controller is used for controlling the instruction output module 108 to send corresponding instructions to the satellite comprehensive electronic equipment so as to enable the satellite comprehensive electronic equipment to execute corresponding operations.
Referring to fig. 2, the test apparatus 100 further includes an instruction output module 108, where the instruction output module 108 is connected to the controller 104 through a bus, the instruction output module 108 is configured to output a corresponding instruction to the satellite integrated electronic device, the controller 104 controls the instruction output module 108 to output the corresponding instruction to the satellite integrated electronic device, for example, the controller 104 controls the instruction output module 108 to output a power-on instruction to the satellite integrated electronic device, and the satellite integrated electronic device performs a power-on operation according to the power-on instruction. The controller 104 controls the command output module 108 to output a shutdown command to the satellite integrated electronic device, and the satellite integrated electronic device performs a shutdown operation according to the startup command.
Optionally, the testing apparatus 100 further includes a power supply module (not shown in fig. 2), where the power supply module is respectively connected to the current output module, the voltage output module, the resistance output module, the instruction detection module, the signal detection module, and the controller, and the power supply module is configured to supply power to the current output module, the voltage output module, the resistance output module, the instruction detection module, the signal detection module, and the controller.
Optionally, the testing apparatus 100 further includes a communication module (not shown in fig. 2), which is connected to the controller, and the communication module is used for communication connection with the satellite integrated electronic device, and the communication module may be a CAN bus communication module. The testing device is connected with the terminal, the terminal can be the terminal corresponding to the testing user, the testing device is in communication connection with the terminal through the communication module, the testing device sends corresponding fault information to the terminal, and the testing user can learn the fault of the current satellite integrated electronic equipment according to the corresponding fault information so as to maintain the satellite integrated electronic equipment.
Example six
Fig. 3 is a schematic structural diagram of a test system according to a sixth embodiment of the present invention.
Optionally, the test system 200 includes the test device 100 and the satellite integrated electronic device 201 of any of the foregoing embodiments, where the satellite integrated electronic device 201 is connected to the test device 100, and the test device 100 is configured to generate corresponding fault information when it is determined that the satellite integrated electronic device 201 has a fault.
The testing device 100 comprises a current output module, a voltage output module and a resistance output module; the controller of the testing device 100 is further configured to control the current output module to output a preset current to the satellite integrated electronic device 201, so that the satellite integrated electronic device 201 feeds back a corresponding first comparison value; the controller of the testing device 100 is further configured to control the voltage output module to output a preset voltage to the satellite integrated electronic device 201, so that the satellite integrated electronic device 201 feeds back a corresponding second logarithmic value; the controller of the testing device 100 is further configured to control the resistance output module to output a preset resistance to the satellite integrated electronic device 201, so that the satellite integrated electronic device 201 feeds back a corresponding third logarithmic value; the controller of the testing apparatus 100 is further configured to determine whether the satellite integrated electronic device 201 has a corresponding fault according to the first comparison value, the second comparison value, and the third comparison value, respectively.
Optionally, the controller of the testing apparatus 100 is further configured to control the current output module to output a preset current to the satellite integrated electronic device 201, so that the satellite integrated electronic device 201 feeds back a corresponding first comparison value; the controller of the testing device 100 is further configured to control the voltage output module to output a preset voltage to the satellite integrated electronic device 201, so that the satellite integrated electronic device 201 feeds back a corresponding second logarithmic value; the controller of the testing device 100 is further configured to control the resistance output module to output a preset resistance to the satellite integrated electronic device 201, so that the satellite integrated electronic device 201 feeds back a corresponding third logarithmic value; the controller of the testing apparatus 100 is further configured to determine whether the satellite integrated electronic device 201 has a corresponding fault according to the first comparison value, the second comparison value, and the third comparison value, respectively.
Referring to fig. 3, the test system 200 includes a test device 100 and a satellite integrated electronic device 201, where the satellite integrated electronic device 201 is connected to the test device 100, and when the test device 100 determines that there is a fault in the satellite integrated electronic device 201, the test device 100 generates corresponding fault information, and further, the test device 100 sends the corresponding fault information to a terminal, and a test user can learn that a fault exists in the current satellite integrated electronic device 201 according to the corresponding fault information, so as to repair the satellite integrated electronic device 201. The test system not only can carry out a plurality of comprehensive tests on the satellite comprehensive electronic equipment, but also can determine the fault reason, does not need to use a plurality of test equipment, does not need to manually analyze test data, and can effectively improve the test efficiency.
Example seven
Fig. 4 is a schematic structural diagram of a load device according to a seventh embodiment of the present invention.
Optionally, the test system 200 further includes a load device 202 and a programmable power supply 203, where the load device 202 is connected to the test apparatus 100 and the satellite integrated electronic device 201, and the programmable power supply 203 is connected to the test apparatus 100 and the satellite integrated electronic device 201, respectively.
Referring to fig. 3, the test system 200 further includes a load device 202, where the load device 202 is connected to the test apparatus 100 and the satellite integrated electronic device 201, and specifically, the load device 202 is connected to the test apparatus 100 through an ethernet interface, and the load device 202 is connected to the satellite integrated electronic device 201 through a load interface.
Referring to fig. 3 and 4, the load device 202 includes a protection circuit 204, a resistive load device 205, a heat sink device 206, and a status indication device 207. The resistive load devices 205 are connected to the heat sink 206 and the status indicator 207 of the protection circuit 204, respectively.
The protection circuit 204 is used for protecting the satellite integrated electronic device 201 from faults. The protection circuit 204 is constituted by a fuse, has an overcurrent protection function, and when a circuit of the satellite integrated electronic device 201 fails, the protection circuit 204 can cut off the failure circuit to protect the satellite integrated electronic device 201 from a failure.
The resistive load device 205 is used to determine whether the satellite integrated electronic device 201 is abnormal in power supply, the test device 100 controls the satellite integrated electronic device 201 to supply power to the resistive load device 205, the resistive load device 205 is used to simulate a satellite, the test device 100 uses the resistive load device 205 to determine whether the satellite integrated electronic device 201 is abnormal in power supply, if the satellite integrated electronic device 201 is determined to be abnormal in power supply, corresponding abnormal information is generated, the test device 100 sends the abnormal information to the terminal, and a test user can learn that the current satellite integrated electronic device is abnormal in power supply according to the fault information so as to repair the satellite integrated electronic device.
The heat dissipation device 206 is configured to dissipate heat of the resistive load device 205, where the heat dissipation device 206 includes an air duct, a motor, and a blade, and the heat dissipation device 206 is capable of reducing a temperature of the resistive load device 205 to ensure a normal operation of the resistive load device 205.
The state indicating device 207 is configured to display an operating state of the resistive load device 205, and the state indicating device 207 may be an indicator lamp or a display device having a display function, and may reflect the operating state of the resistive load device 205.
Optionally, the programmable power supply 203 is configured to supply power to the satellite integrated electronic device 201 according to the received power supply instruction sent by the testing apparatus 100.
The test system 200 further includes a programmable power supply 203, where the programmable power supply 203 is respectively connected with the satellite integrated electronic device 201 and the test apparatus 100, specifically, the programmable power supply 203 is connected with the test apparatus 100 through an RS232 interface, the programmable power supply 203 is connected with the satellite integrated electronic device 201 through a power supply interface, the programmable power supply 203 is used to supply power to the satellite integrated electronic device 201, and the test apparatus 100 controls the programmable power supply 203 to supply power to the satellite integrated electronic device 201 so as to ensure normal operation of the satellite integrated electronic device.
Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the application following, in general, the principles of the application and including such departures from the present disclosure as come within known or customary practice within the art to which the application pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the application being indicated by the following claims.
It is to be understood that the present application is not limited to the precise arrangements and instrumentalities shown in the drawings, which have been described above, and that various modifications and changes may be effected without departing from the scope thereof. The scope of the application is limited only by the appended claims.
Claims (10)
1. A test apparatus, the apparatus comprising: the device comprises a circuit attribute output module, an instruction detection module, a signal detection module and a controller, wherein the controller is respectively connected with the circuit attribute output module, the instruction detection module and the signal detection module, and the device is connected with satellite comprehensive electronic equipment;
the controller is used for controlling the circuit attribute output module to output a preset value to the satellite comprehensive electronic equipment so as to enable the satellite comprehensive electronic equipment to feed back a corresponding comparison value;
the instruction detection module is used for detecting first pulse signal data corresponding to the satellite comprehensive electronic equipment when the satellite comprehensive electronic equipment sends an instruction to external equipment, and sending the first pulse signal data to the controller;
the signal detection module is used for detecting second pulse signal data corresponding to the satellite integrated electronic equipment when sending out signals and sending the second pulse signal data to the controller;
the controller is further configured to generate corresponding fault information if it is determined that the satellite integrated electronic device has a corresponding fault according to the comparison value or the first pulse signal data or the second pulse signal data;
the testing device is connected with load equipment of the testing system; the load equipment comprises a protection circuit, a resistance load device, a heat dissipation device and a state indicating device, wherein the resistance load device is respectively connected with the protection circuit, the heat dissipation device and the state indicating device;
and the protection circuit is used for cutting off a fault loop when the circuit of the satellite integrated electronic equipment fails, and performing fault protection on the satellite integrated electronic equipment.
2. The apparatus of claim 1, wherein the circuit attribute output module comprises a current output module, a voltage output module, and a resistance output module;
the controller is further configured to control the current output module to output a preset current to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding first comparison value;
the controller is further configured to control the voltage output module to output a preset voltage to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding second comparison value;
the controller is further configured to control the resistance output module to output a preset resistance to the satellite integrated electronic device, so that the satellite integrated electronic device feeds back a corresponding third comparison value;
the controller is further configured to determine whether a corresponding fault exists in the satellite integrated electronic device according to the first comparison value, the second comparison value, and the third comparison value, respectively.
3. The apparatus of claim 2, wherein the controller, when configured to determine whether the satellite integrated electronic device has a corresponding fault according to the first comparison value, specifically comprises:
determining whether the first comparison value is consistent with a preset first comparison value corresponding to the preset current;
if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault;
if not, determining that the satellite comprehensive electronic equipment has corresponding faults.
4. The apparatus of claim 2, wherein the controller, when configured to determine whether the satellite integrated electronic device has a corresponding fault based on the second comparison value, specifically comprises:
determining whether the second comparison value is consistent with a preset second comparison value corresponding to the preset voltage;
if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault;
if not, determining that the satellite comprehensive electronic equipment has corresponding faults.
5. The apparatus of claim 2, wherein the controller, when configured to determine whether the satellite integrated electronic device has a corresponding fault according to the third comparison value, specifically comprises:
determining whether the third value is consistent with a preset third comparison value corresponding to the preset resistor;
if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault;
if not, determining that the satellite comprehensive electronic equipment has corresponding faults.
6. The apparatus of claim 1, wherein the controller, when configured to determine from the first pulse signal data that the satellite integrated electronic device has a corresponding fault, is specifically configured to:
determining whether the first pulse signal data is within a first preset pulse data range;
if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault;
if not, determining that the satellite comprehensive electronic equipment has corresponding faults.
7. The apparatus according to claim 1, wherein the controller, when configured to determine from the second pulse signal data that the satellite integrated electronic device has a corresponding fault, is specifically configured to:
determining whether the second pulse signal data is within a second preset pulse data range;
if yes, determining that the satellite comprehensive electronic equipment does not have a corresponding fault;
if not, determining that the satellite comprehensive electronic equipment has corresponding faults.
8. The apparatus of claim 1, wherein the test apparatus further comprises a command output module, the command output module being coupled to the controller;
the controller is further configured to control the instruction output module to send a corresponding instruction to the satellite integrated electronic device, so that the satellite integrated electronic device executes a corresponding operation.
9. A test system comprising the test apparatus of claim 1, satellite integrated electronics, and a load device, the satellite integrated electronics being coupled to the test apparatus;
the testing device is used for generating corresponding fault information when determining that the satellite integrated electronic equipment has faults;
the load equipment comprises a protection circuit, a resistance load device, a heat dissipation device and a state indicating device, wherein the resistance load device is respectively connected with the protection circuit, the heat dissipation device and the state indicating device;
and the protection circuit is used for cutting off a fault loop when the circuit of the satellite integrated electronic equipment fails, and performing fault protection on the satellite integrated electronic equipment.
10. The system of claim 9, further comprising a programmable power supply, wherein the load device is coupled to the test device and the satellite integrated electronic device, respectively, and wherein the programmable power supply is coupled to the test device and the satellite integrated electronic device, respectively.
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