CN113075268B - Insulation sleeve X-wax defect detection method and system based on FDS - Google Patents

Insulation sleeve X-wax defect detection method and system based on FDS Download PDF

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CN113075268B
CN113075268B CN202110342661.2A CN202110342661A CN113075268B CN 113075268 B CN113075268 B CN 113075268B CN 202110342661 A CN202110342661 A CN 202110342661A CN 113075268 B CN113075268 B CN 113075268B
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loss tangent
frequency domain
straight line
frequency
wax
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CN113075268A (en
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黄之明
卓然
张玉波
余长厅
傅明利
罗颜
赵坚
颜海俊
成传晖
喻越
张磊
焦健
熊佳明
王邸博
詹红生
杨涛
毛佳
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CSG Electric Power Research Institute
Electric Power Research Institute of Guangxi Power Grid Co Ltd
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CSG Electric Power Research Institute
Electric Power Research Institute of Guangxi Power Grid Co Ltd
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    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/221Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance by investigating the dielectric properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/228Circuits therefor

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Abstract

The application discloses an insulation sleeve X wax defect detection method and system based on FDS, after a frequency domain dielectric spectrum is obtained based on FDS, whether a to-be-detected sleeve has defects is judged according to a dielectric loss tangent value of a frequency band from 0.01Hz to 1Hz, when the defects are judged, linear fitting is respectively carried out on the dielectric loss tangent values of the frequency band from 0.001Hz to 0.1Hz and the frequency band from 0.1Hz to 10Hz based on a least square method, and whether the X wax in the to-be-detected sleeve has defects is judged according to a slope obtained by a fitting structure. The defect detection method has the advantages that the defect detection steps are simple and convenient, and the fitting result of the dielectric loss tangent values corresponding to two continuous frequency bands is used as a judgment basis, so that the detection accuracy is improved.

Description

Insulation sleeve X-wax defect detection method and system based on FDS
Technical Field
The application relates to the technical field of casing X wax detection, in particular to an insulation casing X wax defect detection method and system based on FDS.
Background
The oiled paper insulating sleeve is used as a key channel for outgoing lines of a transformer and a reactor, has the characteristics of large lead current, high voltage and the like, and is important to the stability of a power grid system in safe operation. Meanwhile, the oil paper insulating sleeve is one of components with the defects or the highest faults of the transformer, and researches show that the unplanned outage of the 220kV and 500kV transformers accounts for about 25% of the total unplanned outage due to the faults of the oil paper insulating sleeve; the unscheduled outage time accounts for 56.5% of the total unscheduled outage time.
The capacitor core is an important part of the high-voltage bushing, has the functions of voltage sharing, insulation and the like, has high requirements on the manufacturing process and raw materials, and the insulation performance of the capacitor core directly influences the service life of the bushing. When the capacitor is used, the capacitor core is immersed in insulating oil to form oil paper insulation.
The main defect types of the capacitor core comprise moisture and X wax defects, and the moisture and X wax can cause the capacitance value and dielectric loss of the inner layer of the capacitor core to be increased, so that the insulating property of the sleeve is reduced. At present, more researches are carried out on the moisture defects of the capacitor core, and achievements with engineering guidance significance are obtained, but the method for detecting the X wax defects is complex in steps, and the detection accuracy is required to be improved.
Disclosure of Invention
The application provides an insulation bushing X wax defect detection method and system based on FDS, and aims to solve the technical problems of complex steps and poor detection accuracy of the existing X wax defect detection method.
In view of the above, the first aspect of the present application provides an FDS-based insulation bushing X wax defect detection method, including the following steps:
obtaining dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing to be tested in a frequency range of 0.001Hz to 1000Hz, which are obtained in advance;
judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2 percent, and executing the next step when the judgment is yes;
respectively performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz based on a least square method, thereby obtaining a first linear equation and a second linear equation which respectively correspond to the frequency bands from 0.001Hz to 0.1Hz and from 0.1 to 10 Hz;
determining a corresponding first straight line slope and a second straight line slope according to the first straight line equation and the second straight line equation;
and judging whether the X wax in the casing pipe to be detected has defects or not according to the first straight line slope and the second straight line slope.
Preferably, the step of obtaining the dielectric loss tangent values corresponding to different frequencies according to the frequency domain dielectric spectrum data and the frequency domain dielectric spectrum curve of the pre-obtained casing to be tested within the frequency band of 0.001Hz to 1000Hz includes:
and acquiring frequency domain dielectric spectrum data and a frequency domain dielectric spectrum curve of the casing pipe to be tested in the frequency band of 0.001Hz to 1000Hz by using a frequency domain dielectric spectrum tester.
Preferably, the determining whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2%, and if yes, the next step is executed, further comprising:
and when the dielectric loss tangent value of the frequency range of 0.01Hz to 1Hz is judged not to exceed 2%, judging that the casing to be detected has no defects, and returning to the previous step.
Preferably, the step of performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz respectively based on the least square method specifically includes:
and respectively carrying out linear fitting on dielectric loss tangent values of the frequency bands of 0.001Hz to 0.1Hz and 0.1Hz to 10Hz under a logarithmic coordinate based on a least square method.
Preferably, the step of judging whether the X wax in the casing to be tested has a defect according to the first straight line slope and the second straight line slope specifically includes:
and when the slope of the first straight line is judged to be greater than zero and the slope of the second straight line is judged to be less than zero, judging that the X wax in the sleeve to be detected has defects.
In another aspect, the present invention provides an FDS-based insulation bushing X-wax defect detection system, including: the device comprises an acquisition module, and a first judgment module, a fitting module, a determination module and a second judgment module which are sequentially connected with the acquisition module;
the acquisition module is used for acquiring dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing to be detected within a frequency range of 0.001Hz to 1000Hz, which are acquired in advance;
the first judging module is used for judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2% or not, and is also used for sending a fitting signal to the fitting module when the judgment is yes;
the fitting module is used for performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz respectively based on a least square method after receiving the fitting signal sent by the first judging module, so as to obtain a first linear equation and a second linear equation which respectively correspond to the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10 Hz;
the determining module is used for determining corresponding first straight line slope and second straight line slope according to the first straight line equation and the second straight line equation;
and the second judging module is used for judging whether the X wax in the sleeve to be detected has defects or not according to the first straight line slope and the second straight line slope.
Preferably, the system further comprises a frequency domain dielectric spectrum tester for acquiring frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing to be tested in a frequency band of 0.001Hz to 1000 Hz.
Preferably, the first determining module is further configured to send an acquisition signal to the acquiring module when it is determined that the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz does not exceed 2%.
Preferably, the second determining module is further configured to determine that the X wax in the casing to be tested has a defect when the slope of the first straight line is greater than zero and the slope of the second straight line is less than zero.
Preferably, the bushing to be tested specifically adopts an oiled paper capacitive bushing with a voltage range of 72.5kV to 500 kV.
According to the technical scheme, the invention has the following advantages:
the invention provides an insulation sleeve X wax defect detection method based on FDS, which comprises the steps of obtaining a frequency domain dielectric spectrum based on FDS, judging whether a to-be-detected sleeve has defects according to a dielectric loss tangent value of a frequency band from 0.01Hz to 1Hz, respectively carrying out linear fitting on the dielectric loss tangent values of the frequency band from 0.001Hz to 0.1Hz and the frequency band from 0.1Hz to 10Hz based on a least square method after judging that the to-be-detected sleeve has the defects, and judging whether the X wax in the to-be-detected sleeve has the defects according to a slope obtained by a fitting structure. The defect detection method has the advantages that the defect detection steps are simple and convenient, and the fitting result of the dielectric loss tangent values corresponding to two continuous frequency bands is used as a judgment basis, so that the detection accuracy is improved. The invention also provides a method for detecting the X wax defect of the insulation sleeve based on the FDS, which has the beneficial effects consistent with the detection method and is not repeated herein.
Drawings
Fig. 1 is a flowchart of an FDS-based insulation bushing X wax defect detection method according to an embodiment of the present application;
fig. 2 is a flowchart of an FDS-based insulation bushing X-wax defect detection method according to another embodiment of the present application;
FIG. 3 is a diagram of a frequency domain dielectric spectrum tester provided in an embodiment of the present application;
FIG. 4 is a frequency domain dielectric spectrum plot of the oiled paper insulation bushing provided in the embodiment of the present application;
fig. 5 is a schematic structural diagram of an FDS-based insulation bushing X wax defect detection system according to an embodiment of the present application.
Detailed Description
In order to make the technical solutions of the present application better understood, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
For convenience of understanding, referring to fig. 1, the present application provides a method for detecting an X-wax defect of an insulation sleeve based on FDS, which includes the following steps:
s101: obtaining dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing to be tested in a frequency range of 0.001Hz to 1000Hz, which are obtained in advance;
s102: judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2 percent, and executing the next step when the judgment is yes;
it should be noted that the threshold of 2% is a criterion value determined based on a large amount of measured data in the field.
S103: respectively performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz based on a least square method, thereby obtaining a first linear equation and a second linear equation which respectively correspond to the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10 Hz;
it should be noted that, because the dielectric loss of the frequency domain dielectric spectrum test in the low frequency band is sensitive to the defect state response of the device under test, two low frequency bands, i.e., the frequency band of 0.001Hz to 0.1Hz and the frequency band of 0.1 to 10Hz, are selected to diagnose and analyze the device state.
Based on the research on the sample casing, the frequency domain dielectric spectrum curves of the X-wax casing and the normal casing are found to have detailed differences in linear fitting of the two frequency bands of 0.001Hz to 0.1Hz and 0.1 to 10Hz, so that the two frequency bands are selected for fitting to judge the X-wax defect diagnosis criterion of the casing, and the judgment effect is improved.
S104: determining a corresponding first straight line slope and a second straight line slope according to the first straight line equation and the second straight line equation;
s105: and judging whether the X wax in the casing to be detected has defects or not according to the slope of the first straight line and the slope of the second straight line.
It can be understood that, in this embodiment, after the frequency domain dielectric spectrum is obtained based on the FDS, whether the casing to be tested has a defect is determined according to the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz, when it is determined that the defect exists, the casing to be tested is subjected to linear fitting on the dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1 to 10Hz respectively based on the least square method, and whether the X wax in the casing to be tested has a defect is determined according to the slope obtained by the fitting structure. The method has the advantages that the defect detection steps are simple and convenient, and the fitting result of the dielectric loss tangent values corresponding to the two continuous frequency bands is used as a judgment basis, so that the detection accuracy is improved.
The above is a detailed description of an embodiment of the method for detecting the X-wax defect of the FDS-based insulation sleeve provided by the present invention, and the following is a detailed description of another embodiment of the method for detecting the X-wax defect of the FDS-based insulation sleeve provided by the present invention.
For convenience of understanding, referring to fig. 2, the invention provides an FDS-based insulation bushing X-wax defect detection method, which includes the following steps:
s201: acquiring frequency domain dielectric spectrum data and a frequency domain dielectric spectrum curve of the casing to be tested in a frequency band of 0.001Hz to 1000Hz by using a frequency domain dielectric spectrum tester;
it should be noted that the test condition of the frequency domain dielectric spectrum tester is at room temperature, and as shown in fig. 3, a test chart of the frequency domain dielectric spectrum tester is shown, wherein, during the test, a voltage output end (high voltage end) of the frequency domain dielectric spectrum tester is connected to a guide rod of the casing pipe to be tested, a current measuring end is connected to a tail screen of the casing pipe to be tested, and the casing pipe to be tested can adopt an oiled paper capacitive casing pipe with voltage of 72.5 kV-500 kV.
S202: obtaining dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the pre-obtained casing to be detected within a frequency band of 0.001Hz to 1000 Hz;
s203: judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2%, if so, executing the next step, and if not, judging that the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz does not exceed 2%, judging that the X wax in the casing pipe to be detected has no defect, and returning to the previous step;
s204: respectively performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz under a logarithmic coordinate based on a least square method, thereby obtaining a first linear equation and a second linear equation which respectively correspond to the frequency bands from 0.001Hz to 0.1Hz and from 0.1 to 10 Hz;
in one embodiment, the goodness-of-fit is required to be no less than 0.9, and the first linear equation is expressed as:
log(tanδ 1 )=k 1 ·logf+a
tan delta in the formula 1 Dielectric loss tangent, k, of the frequency band from 0.001Hz to 0.1Hz 1 Is the first linear slope, f is the frequency, a is the first intercept;
the second equation of the line is expressed as:
log(tanδ 2 )=k 2 ·logf+b
tan delta in the formula 2 Dielectric loss tangent, k, in the frequency range of 0.1 to 10Hz 2 Is the slope of the second line, f is the frequency, and b is the second intercept.
S205: determining corresponding first straight-line slope and second straight-line slope according to the first straight-line equation and the second straight-line equation;
s206: and when the slope of the first straight line is judged to be greater than zero and the slope of the second straight line is judged to be less than zero, judging that the X wax in the casing pipe to be detected has defects.
It should be noted that when the slope of the first straight line is not greater than zero and the slope of the second straight line is not less than zero, it is determined that the casing to be tested has a non-X wax defect.
Three 500kV sleeve pipe samples are selected for test analysis, and verification shows that the X wax defect diagnosis method for the oil paper insulation capacitance type sleeve pipe based on the frequency domain dielectric spectrum, which is provided by the scheme, wherein the sleeve pipe A is an insulation damp sleeve pipe, the sleeve pipe B is an internal outgoing line X wax defect sleeve pipe, and the sleeve pipe C is a well-insulated sleeve pipe.
And (3) carrying out frequency domain dielectric spectrum test on the three 500kV sleeve pipe samples to obtain dielectric loss tangent values of the three 500kV sleeve pipe samples in a frequency range of 0.001Hz to 1000Hz, as shown in figure 4.
Judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2% by three 500kV casing pipe samples, wherein the dielectric loss tangent value of the A, B casing pipe in the frequency band exceeds 2% and the C casing pipe does not exceed as can be seen from the graph 4;
respectively performing linear fitting on the dielectric loss tangent values of the A, B casing pipe in the frequency band of 0.001Hz to 0.1Hz and the frequency band of 0.1Hz to 10Hz, as shown in FIG. 4, wherein the goodness of fit is required to be more than 0.9, and obtaining a first linear equation and a second linear equation after linear fitting:
the first linear equation for casing a is: log (tan delta) 1 )=-0.767·logf+1.08;
The second linear equation for casing a is: log (tan delta) 2 )=-0.775·logf+1.17;
The first linear equation for the B casing is: log (tan delta) 1 )=0.16·logf+0.87;
The second linear equation of the B casing is: log (tan delta) 2 )=-0.39·logf+0.35;
The slope magnitudes of the two line equations for the A, B cannula were determined and are given in table 1.
TABLE 1
Test article k 1 k 2
A casing -0.767 -0.775
B casing pipe 0.16 -0.39
As can be seen from Table 1, the A casing does not satisfy k 1 Is greater than 0 and k 2 If the number of the defects is less than 0, judging that the A casing is a non-X wax defect and belongs to other types of defects; b casing satisfies k 1 > 0 and k 2 And if the condition is less than 0, judging that the sleeve B is the X wax defect.
The above is a detailed description of another embodiment of the method for detecting the wax defect of the FDS-based insulation sleeve X provided by the present invention, and the following is a detailed description of an embodiment of the system for detecting the wax defect of the FDS-based insulation sleeve X provided by the present invention.
For convenience of understanding, referring to fig. 5, the present invention provides an insulation bushing X wax defect detection system based on FDS, comprising: the device comprises an acquisition module 100, and a first judgment module 200, a fitting module 300, a determination module 400 and a second judgment module 500 which are sequentially connected with the acquisition module 100;
the obtaining module 100 is configured to obtain dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the pre-obtained casing to be tested within a frequency band from 0.001Hz to 1000 Hz;
the first judging module 200 is configured to judge whether a dielectric loss tangent value of a frequency band from 0.01Hz to 1Hz exceeds 2%, and if so, send a fitting signal to the fitting module 300;
the fitting module 300 is configured to perform linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz based on a least square method after receiving the fitting signal sent by the first determining module 200, so as to obtain a first linear equation and a second linear equation corresponding to the frequency bands from 0.001Hz to 0.1Hz and from 0.1 to 10Hz respectively;
a determining module 400, configured to determine a first linear slope and a second linear slope according to a first linear equation and a second linear equation;
the second determining module 500 determines whether the X wax in the casing to be tested has a defect according to the first and second slope of the straight line.
Furthermore, the system also comprises a frequency domain dielectric spectrum tester which is used for acquiring frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing pipe to be tested in the frequency band of 0.001Hz to 1000 Hz.
Further, the first determining module 200 is further configured to send the acquiring signal to the acquiring module 100 when it is determined that the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz does not exceed 2%.
It can be understood that, when the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz is judged not to exceed 2%, it indicates that the casing to be tested has no defect, an acquisition signal is sent to the acquisition module 100, and the acquisition module 100 is notified to perform acquisition again.
Further, the second determining module 500 is further configured to determine that the X wax in the casing to be tested has a defect when the first straight line slope is greater than zero and the second straight line slope is less than zero.
Further, the sleeve to be tested specifically adopts an oiled paper capacitive sleeve with a voltage range of 72.5 kV-500 kV.
In this embodiment, after a frequency domain dielectric spectrum is obtained based on FDS, whether a defect exists in the casing to be tested is judged according to the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz, when the defect exists, linear fitting is respectively performed on the dielectric loss tangent values of the frequency band from 0.001Hz to 0.1Hz and the frequency band from 0.1Hz to 10Hz based on a least square method, and whether a defect exists in the X wax in the casing to be tested is judged according to the slope obtained by the fitting structure. The defect detection method has the advantages that the defect detection steps are simple and convenient, and the fitting result of the dielectric loss tangent values corresponding to two continuous frequency bands is used as a judgment basis, so that the detection accuracy is improved.
The above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.

Claims (4)

1. An FDS-based insulation sleeve X wax defect detection method is characterized by comprising the following steps:
obtaining dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing to be tested in a frequency range of 0.001Hz to 1000Hz, which are obtained in advance;
judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2 percent, and executing the next step when the judgment is yes; when the dielectric loss tangent value of the frequency range of 0.01Hz to 1Hz is judged not to exceed 2 percent, judging that the casing to be detected has no defects, and returning to the previous step;
respectively performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz under a logarithmic coordinate based on a least square method, thereby obtaining a first linear equation and a second linear equation which respectively correspond to the frequency bands from 0.001Hz to 0.1Hz and from 0.1 to 10 Hz;
determining a corresponding first linear slope and a corresponding second linear slope according to the first linear equation and the second linear equation;
when the slope of the first straight line is judged to be greater than zero and the slope of the second straight line is judged to be less than zero, the X wax in the casing pipe to be tested is judged to have defects;
the to-be-tested sleeve specifically adopts an oiled paper capacitive sleeve with a voltage range of 72.5kV to 500kV.
2. The method as claimed in claim 1, wherein the step of obtaining dielectric loss tangent values corresponding to different frequencies according to the frequency domain dielectric spectrum data and the frequency domain dielectric spectrum curve of the pre-obtained casing to be tested within the frequency range of 0.001Hz to 1000Hz comprises:
and acquiring frequency domain dielectric spectrum data and a frequency domain dielectric spectrum curve of the sleeve to be tested in a frequency band of 0.001Hz to 1000Hz by a frequency domain dielectric spectrum tester.
3. An FDS-based insulation bushing X wax defect detection system, comprising:
the device comprises an acquisition module, and a first judgment module, a fitting module, a determination module and a second judgment module which are sequentially connected with the acquisition module;
the acquisition module is used for acquiring dielectric loss tangent values corresponding to different frequencies according to frequency domain dielectric spectrum data and frequency domain dielectric spectrum curves of the casing to be detected within a frequency range of 0.001Hz to 1000Hz, which are acquired in advance;
the first judging module is used for judging whether the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz exceeds 2% or not, and is also used for sending a fitting signal to the fitting module when the judgment is yes; when the dielectric loss tangent value of the frequency band from 0.01Hz to 1Hz is judged not to exceed 2%, sending an acquisition signal to the acquisition module;
the fitting module is used for performing linear fitting on dielectric loss tangent values of the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10Hz respectively under logarithmic coordinates based on a least square method after receiving the fitting signal sent by the first judging module, so as to obtain a first linear equation and a second linear equation which respectively correspond to the frequency bands from 0.001Hz to 0.1Hz and from 0.1Hz to 10 Hz;
the determining module is used for determining corresponding first straight line slope and second straight line slope according to the first straight line equation and the second straight line equation;
the second judging module is used for judging whether the X wax in the casing to be detected has defects or not according to the first straight line slope and the second straight line slope, and judging that the X wax in the casing to be detected has defects when the first straight line slope is larger than zero and the second straight line slope is smaller than zero;
the to-be-tested sleeve specifically adopts an oiled paper capacitive sleeve with a voltage range of 72.5kV to 500kV.
4. An FDS based insulating sleeve X-wax defect detection system as claimed in claim 3, further comprising a frequency domain dielectric spectroscopy tester for obtaining frequency domain dielectric spectroscopy data and frequency domain dielectric spectroscopy curves of the sleeve under test over a frequency band of 0.001Hz to 1000 Hz.
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