CN110930838A - Virtual simulation experiment method for transistor unit circuit fault diagnosis - Google Patents
Virtual simulation experiment method for transistor unit circuit fault diagnosis Download PDFInfo
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Abstract
The invention discloses a virtual simulation experiment method for diagnosing the circuit fault of a transistor unit, wherein a related virtual simulation experiment platform is a man-machine interaction experiment platform which is formed by a virtual component, a virtual instrument and a bipolar transistor amplifier unit circuit fault sample library and flexibly accessed by a mobile end and a PC end according to the actual circuit fault diagnosis process of an electronic enterprise by relying on virtual reality, three-dimensional simulation, multimedia man-machine interaction, a database and internet technologies on the basis of an entity transistor single-tube amplifier and a combinational logic circuit experiment; the experimental procedure was: firstly, training basic experimental skills, then, autonomously selecting an experimental circuit, carrying out theoretical analysis and obtaining circuit theoretical data, and meanwhile, obtaining data of a fault circuit by utilizing a virtual test according to a circuit fault sample; and then, analyzing and judging the range of the circuit fault by adopting a parameter identification method in combination with a circuit theory, and finally positioning and eliminating the fault.
Description
Technical Field
The invention relates to a circuit fault diagnosis teaching method, in particular to a virtual simulation experiment method for circuit fault diagnosis of a transistor unit.
Background
The purpose of circuit fault diagnosis is to find and effectively process faults in time, prevent the diffusion and deterioration of the faults and ensure the safe and reliable operation of equipment. With the continuous improvement of functions and the continuous increase of integration of electronic systems, especially System on Chip (SoC), circuit fault diagnosis is becoming more and more important. The formed typical complex engineering problem is highly valued by the scientific and engineering industries. The traditional method for improving the circuit fault diagnosis capability of technicians depends on the accumulation of practical experience. Because the actual circuit fault forms are different and various, the training mode has long period and occupies more resources. The common experimental teaching environment can only provide limited class time, and the training mode is difficult to support. Therefore, the cultivation of the capability of solving the problems of the complex engineering is a short board for experimental teaching for a long time.
The transistor unit circuit is a basic circuit module forming an electronic system and a system on chip, the fault of the transistor unit circuit is a specific reflection of the fault of the electronic system and the system on chip, and the fault diagnosis technology is the basis of the fault diagnosis of the electronic system and the system on chip, and therefore new technologies such as intelligent circuit fault diagnosis, intelligent circuit optimization design, testability design, optimized yield analysis and the like are developed. For a long time, the traditional transistor unit circuit entity experiment mostly completes circuit building and electrical parameter measurement on a bread board according to a given circuit diagram. And then, carrying out experimental links such as data processing, result analysis and the like. The solidification experimental process is obviously different from the actual engineering situation, only the operation of building and debugging a unit circuit is needed, research-type test contents such as circuit fault diagnosis and the like are lacked, the space created by deep study and innovation is not provided, and the requirement for cultivating and solving the complex engineering problem can not be met.
Disclosure of Invention
In order to solve the problems of more components, less research and analysis contents and low efficiency of physical experiments in the conventional circuit fault diagnosis, the invention takes the problems as guidance, firstly builds a transistor unit circuit fault diagnosis virtual simulation experiment, randomly and quickly provides a plurality of circuit fault samples simulating engineering practice, overcomes the defects that the existing transistor unit circuit fault diagnosis is in verification and few contact examples, researches the provided transistor unit circuit fault diagnosis virtual simulation experiment platform and explores a new experiment teaching mode. By utilizing the powerful virtual simulation, human-computer interaction capacity and database technology of the virtual simulation experiment platform, an operator can complete basic skill training of circuit fault diagnosis of the transistor unit, accumulate the experience of circuit fault diagnosis, stimulate the initiative and the learning desire of learning, cultivate the capacity of independent analysis and problem solution, cultivate the capacity of solving complex engineering problems, and achieve the goal of collaborative cultivation of knowledge teaching, capability cultivation and quality improvement in experiment teaching.
In order to solve the technical problems, the invention provides a virtual simulation experiment method for diagnosing the circuit fault of a transistor unit, and a related virtual simulation experiment platform is a man-machine interaction experiment platform which is formed by a virtual component, a virtual instrument and a bipolar transistor amplifier unit circuit fault sample library and flexibly connected with a mobile terminal and a PC terminal according to the actual circuit fault diagnosis process of an electronic enterprise by relying on virtual reality, three-dimensional simulation, multimedia man-machine interaction, a database and internet technologies on the basis of an entity transistor single-tube amplifier and a combinational logic circuit experiment; the bipolar transistor amplifier unit circuit fault sample library comprises more than three unit circuit fault samples or multi-stage circuit fault samples, and each unit circuit or multi-stage circuit fault sample is divided into a direct current domain fault, an alternating current domain fault and a mixed domain fault; the data of all circuit fault samples are derived from data in the past circuit fault diagnosis practice and simulated fault parameter data obtained by Multisim circuit simulation software; dividing the circuit complexity into a basic experiment and an extended experiment according to the diagnosed circuit complexity, wherein the basic experiment is mainly used for diagnosing single-fault circuit faults, and the extended experiment comprises a multi-fault circuit fault diagnosis experiment, a multi-stage circuit fault diagnosis experiment, a combinational logic circuit fault diagnosis experiment, a function derating circuit fault diagnosis experiment and an intelligent circuit fault diagnosis experiment; the specific contents of the basic experiment and the extended experiment are stored in the detail of the unit circuit fault diagnosis experiment project of the virtual simulation experiment platform; the experimental procedure was: firstly, training basic experimental skills, then, autonomously selecting an experimental circuit, carrying out theoretical analysis and obtaining circuit theoretical data, and meanwhile, obtaining data of a fault circuit by utilizing a virtual test according to a circuit fault sample; and then, analyzing and judging the range of the circuit fault by adopting a parameter identification method in combination with a circuit theory, and finally positioning and eliminating the fault.
Further, the virtual simulation experiment method for the circuit fault diagnosis of the transistor unit, provided by the invention, specifically comprises the following steps:
the method comprises the following steps: entering a virtual simulation experiment platform, and selecting one fault diagnosis experiment in basic experiment items from the unit circuit fault diagnosis experiment items;
step two, entering an experiment preparation stage according to engineering site requirements;
step three: selecting a transistor unit circuit, and completing theoretical analysis of the selected circuit to obtain theoretical parameters;
step four: a virtual simulation experiment platform randomly pushes out a fault sample circuit, and an operator measures and obtains virtual measurement parameters of the transistor unit circuit;
step five: an operator visually inspects the transistor unit circuit to narrow the fault range;
step six: comparing the virtual measurement parameters obtained in the step four with the theoretical parameters obtained in the step two, and judging the reason of the circuit fault of the transistor unit;
step seven: searching a circuit fault point of a transistor unit through instrument testing, and inputting a virtual simulation experiment platform;
step eight: measuring the circuit parameters of the transistor unit again, judging whether the circuit parameters are normal according to the theoretical parameters obtained in the third step, if so, removing the circuit fault, and executing the ninth step, otherwise, repeatedly executing the fifth step to the seventh step;
step nine: repeating the step four to the step eight in a circulating manner, and executing the step ten when the circulating frequency is 3;
step ten: executing the step eleven, or selecting a circuit from the extended experiment items provided in the virtual simulation experiment platform, and repeatedly executing the steps three to nine to finish the fault elimination of the selected circuit;
step eleven: and filling in an experiment report, and quitting the virtual simulation experiment platform after submitting the report.
In the process of repeating the step four to the step eight in three times of circulation execution, the circuit fault samples have randomness and diversity, and the specific content of fault diagnosis is from shallow to deep along with the increase of the circulation times.
Compared with the prior art, the invention has the beneficial effects that:
the experimental steps of the experiment are consistent with the process of completing circuit fault diagnosis in engineering practice, the virtual simulation experiment platform is fully utilized to randomly and quickly provide the advantages of circuit fault samples, various fault samples are contacted in a short time, basic skill training of circuit fault diagnosis of a transistor unit is completed, the experience of circuit fault diagnosis is accumulated, and the problems that the verification components of an entity circuit experiment are too many, the research and analysis contents are too few, and the efficiency of the entity experiment is low, and the training of complex engineering problems such as circuit fault diagnosis cannot be supported are solved. Meanwhile, the experiment randomly selects a fault sample from the database, and different individualized experiment contents are set. Meanwhile, the initiative and the intention of learning are stimulated, the theory is connected with the reality, the fault is determined through independent thinking and judgment, the achievement sense of learning and the interestingness of an experiment are increased, the capability of independent analysis and problem solving is cultivated, an operator can know the latest technical dynamics in the industry, the capability of solving complex engineering problems is cultivated, and the goal of collaborative cultivation of knowledge teaching, capability cultivation and quality improvement is achieved.
Drawings
FIG. 1 is a schematic view of the operation flow of a virtual simulation experiment platform of the experimental method of the present invention;
fig. 2 is a schematic diagram of a virtual simulation experiment platform according to an embodiment of the present invention.
FIG. 3 is a software architecture overview of an embodiment of the present invention;
FIG. 4 is a schematic interface diagram of an embodiment of the present invention.
Detailed Description
The invention will be further described with reference to the following figures and specific examples, which are not intended to limit the invention in any way.
In order to achieve the goal of co-culture of knowledge teaching, capability culture and quality improvement, the design of a virtual experiment simulation platform is of great importance. The virtual simulation experiment platform is established by virtual instruments and components according to the appearance of a real object. The developed circuit fault sample library mainly comprises unit circuit fault samples of the bipolar transistor amplifier, the unit circuit fault sample library of the bipolar transistor amplifier comprises more than three unit circuit fault samples or multi-stage circuit fault samples, and each unit circuit or multi-stage circuit fault sample is divided into a direct current domain fault, an alternating current domain fault and a mixed domain fault; the data of all circuit fault samples are derived from data in the past circuit fault diagnosis practice and simulated fault parameter data obtained by Multisim circuit simulation software. In order to meet the requirements of different levels, basic experiments and extended experiments are divided according to the complexity of the diagnosed circuit. The basic experiment mainly diagnoses the fault of the single-fault circuit. The extended experiment comprises the contents of multi-fault circuit fault diagnosis, multi-stage circuit fault diagnosis, combinational logic circuit fault diagnosis, function derating circuit fault diagnosis, intelligent circuit fault diagnosis technology and the like. The specific contents of the basic experiment and the extended experiment are stored in the detail of the unit circuit fault diagnosis experiment project of the virtual simulation experiment platform;
in order to efficiently utilize the virtual simulation platform and improve the comprehensive capability of an operator, the operator needs to firstly participate in cognitive and entity experiments, basically know the circuit structure and the characteristics of the transistor unit, and initially train the use of a general instrument. On the basis, the principle that when a circuit fails, the electric parameters of key nodes of the circuit are obviously different from theoretical analysis results is utilized. An operator compares circuit parameters obtained by theoretical analysis with fault circuit parameters of field test by using a parameter identification method, and finally determines and eliminates fault points by using methods such as direct observation, parameter test, component replacement and the like by combining circuit theory and actual experience analysis, exploration and judgment of possible fault ranges.
In the experimental process, the virtual simulation experimental platform is guided by diagnosing the fault problem of the circuit, and firstly, basic steps of experimental preparation, experimental circuit selection, theoretical analysis, theoretical parameter data acquisition and the like are completed step by step according to the actual operation rules of engineering. Thereafter, the virtual experiment platform randomly provides circuit fault samples according to the selected circuit. The parameter identification method is combined with the circuit theory, the comparison result of the fault circuit data and the theoretical data which are virtually collected (or provided by a platform) is utilized, the circuit theory is combined to analyze and judge the range of the circuit fault, and finally the fault cause is positioned and solved.
An operator conducts experimental processes of circuit theory analysis, parameter acquisition, research judgment, determination and fault elimination, understanding of basic circuit theory is deepened, capability of analyzing, solving circuit faults, circuit design and the like under theoretical guidance is improved, a large number of practical cases are contacted in a short time, capability of solving complex engineering problems is comprehensively trained, and the purpose of improving comprehensive quality and innovation and creation capability is finally achieved.
The developed transistor unit circuit fault diagnosis virtual simulation experiment platform is a man-machine interaction experiment platform which is formed by virtual components, virtual instruments and a bipolar transistor amplifier unit circuit fault sample library, wherein a mobile end and a PC end can be flexibly connected in, and is constructed according to the actual circuit fault diagnosis process of an electronic enterprise by relying on virtual reality, three-dimensional simulation, multimedia man-machine interaction, a database and the internet technology on the basis of experiments of an entity transistor single-tube amplifier, a combinational logic circuit and the like.
The invention guides an operator to actively learn, theoretically link with the reality and determine the fault location through independent thinking and judgment by teaching and researching a transistor unit circuit fault diagnosis virtual simulation experiment platform and taking the capability of an operator as a theme and selecting the transistor unit circuit fault diagnosis as a breakthrough.
The virtual simulation experiment platform requires an operator to complete 3 fault sample diagnosis tasks each time the operator operates the platform, 3 circuit fault samples have randomness and difference, the specific contents of fault diagnosis are from shallow to deep along with the increase of cycle times, and generally 3 circuits are respectively direct current domain fault diagnosis, alternating current domain fault diagnosis and mixed domain fault diagnosis of the circuit. The using method comprises the following steps: firstly, the training of basic experimental skills such as the use of a general instrument, the cognition of electronic components, the electrical parameter (index) test of key nodes of a circuit and the like is familiar; then, independently selecting an experimental circuit, carrying out theoretical analysis and obtaining circuit theoretical data; meanwhile, according to a fault circuit sample provided by the virtual simulation platform, fault circuit data are obtained by utilizing virtual testing; and then, researching, analyzing and judging the range of the circuit fault by adopting a parameter identification method and combining with a circuit theory, and finally positioning and eliminating the fault.
The basic operation flow of the experimental platform is described by taking the example that an operator autonomously operates the virtual simulation experimental platform to carry out direct-current domain fault diagnosis of a bipolar transistor amplifier unit circuit (sequentially completes 3 fault sample diagnosis tasks):
the method comprises the following steps: logging in a simulation experiment teaching center, namely a virtual simulation experiment platform, and selecting a transistor unit circuit fault diagnosis experiment. Logging in a simulation experiment teaching center, and selecting a transistor unit circuit fault diagnosis experiment in the item of the unit circuit fault diagnosis experiment in the virtual experiment list;
step two: and completing experimental preparation according to the requirements of the engineering site. Entering an experiment preparation stage according to engineering site requirements, wherein the experiment preparation stage comprises wearing an anti-static bracelet, checking the integrity of instrument equipment one by one and checking component parameters one by one;
step three: and selecting a transistor unit circuit on the virtual platform, and finishing theoretical analysis of the selected circuit to obtain theoretical parameters. Selecting a transistor unit circuit according to requirements, completing theoretical analysis of the selected circuit, and inputting an analysis result into a virtual simulation experiment platform, wherein if the data is incorrect, the virtual simulation experiment platform gives a prompt to require reanalysis until correct data is obtained;
step four: the virtual simulation platform randomly pushes out a fault sample circuit, and an operator measures and obtains virtual measurement parameters of the transistor unit circuit. The virtual simulation platform automatically and randomly pushes out a fault circuit sample according to the transistor unit circuit selected in the step three, and an operator performs virtual test on the fault circuit sample provided by the virtual simulation experiment platform in a virtual environment to obtain parameters of the transistor unit circuit;
step five: the operator visually inspects the transistor unit circuit to narrow the failure range. Under a virtual environment, visually inspecting the circuit module and analyzing the reason of the circuit fault; firstly, visual inspection is carried out on a selected transistor unit circuit to find a obviously damaged component and a connection point with poor contact, and a visual inspection result is recorded into a virtual simulation experiment platform. And if the judgment is correct, performing the step six. If the judgment is incorrect, the virtual simulation experiment platform gives a prompt and requires to re-determine the fault location;
step six: and C, comparing the virtual measurement parameters obtained in the step four with the theoretical parameters obtained in the step two, and analyzing and judging the reason of the circuit fault of the transistor unit. And theoretically analyzing the node parameters of the transistor unit circuit, comparing the node parameters with the circuit parameters acquired on the virtual platform, analyzing to obtain a fault node, and inputting the name of the fault node into the virtual simulation experiment platform. And if the judgment is positive, performing the seventh step. If the judgment is incorrect, the virtual simulation experiment platform gives a prompt and requires to re-determine the fault location;
step seven: and searching a circuit fault point of the transistor unit through an instrument test. And (3) carrying out fault analysis (such as a multimeter) on the selected transistor unit circuit by using an online measuring instrument, and recording the determined fault into a virtual simulation experiment platform. And if the judgment is positive, performing the step eight. If the judgment is incorrect, the virtual simulation experiment platform gives a prompt and requires to re-determine the fault location;
step eight: and measuring whether the circuit parameters of the transistor unit are normal or not again. Testing the electrical parameters of the selected transistor unit circuit in a virtual environment, and executing a ninth step if the parameter of each node is found to be recovered to be normal according to the theoretical parameters obtained in the third step, namely the circuit fault is eliminated; otherwise, repeating the fifth step to the seventh step;
step nine: whether three fault diagnosis experiments have been completed. And judging whether the three fault diagnosis experiments are finished or not, if so, entering the step ten, otherwise, setting a new circuit fault point for the transistor unit circuit set up in the step three by using the virtual simulation experiment platform, and repeatedly and sequentially executing the steps four to eight to eliminate the new circuit fault. Until the third fault diagnosis experiment is completed;
step ten: and step eleven is executed, or other technologies for diagnosing the circuit faults of the transistor unit are deeply known. Selecting a circuit from extended experiments (such as a multi-fault circuit fault diagnosis experiment, a multi-stage circuit fault diagnosis experiment, a combined logic circuit fault diagnosis experiment, a function derating circuit fault diagnosis experiment and an intelligent circuit fault diagnosis experiment) provided in the virtual simulated true experiment platform to carry out fault analysis; repeatedly executing the third step to the seventh step, then measuring the circuit parameters of the transistor unit again, judging whether the circuit parameters are normal according to the theoretical parameters obtained in the third step, if so, eliminating the circuit fault, and executing the eleventh step;
step eleven: and filling in an experiment report, and quitting the virtual simulation experiment platform. And learning scientific and technological writing specifications on the virtual simulation experiment platform, filling in an experiment report, and quitting the virtual simulation experiment platform after the report is submitted.
While the present invention has been described with reference to the accompanying drawings, the present invention is not limited to the above-described embodiments, which are illustrative only and not restrictive, and many modifications may be made by those skilled in the art without departing from the spirit of the present invention, within the scope of the appended claims.
Claims (3)
1. A virtual simulation experiment method for circuit fault diagnosis of a transistor unit is characterized in that a virtual simulation experiment platform is established by relying on virtual reality, three-dimensional simulation, multimedia human-computer interaction, a database and internet technology and according to the actual circuit fault diagnosis process of an electronic enterprise on the basis of an entity transistor single-tube amplifier and a combinational logic circuit experiment, wherein the virtual simulation experiment platform is composed of a virtual component, a virtual instrument and a bipolar transistor amplifier unit circuit fault sample library, and is flexibly connected with a mobile terminal and a PC terminal;
the bipolar transistor amplifier unit circuit fault sample library comprises more than three unit circuit fault samples or multi-stage circuit fault samples, and each unit circuit or multi-stage circuit fault sample is divided into a direct current domain fault, an alternating current domain fault and a mixed domain fault; the data of all circuit fault samples are derived from data in the past circuit fault diagnosis practice and simulated fault parameter data obtained by Multisim circuit simulation software;
dividing the circuit complexity into basic experiments and extended experiments according to the diagnosed circuit complexity, wherein the basic experiments mainly diagnose the fault of a single fault circuit, and the extended experiments comprise multi-fault circuit fault diagnosis experiments, multi-stage circuit fault diagnosis experiments, combinational logic circuit fault diagnosis experiments, function derating circuit fault diagnosis experiments and intelligent circuit fault diagnosis experiments; the specific contents of the basic experiment and the extended experiment are stored in the detail of the unit circuit fault diagnosis experiment project of the virtual simulation experiment platform;
the experimental procedure was: firstly, training basic experimental skills, then, autonomously selecting an experimental circuit, carrying out theoretical analysis and obtaining circuit theoretical data, and meanwhile, obtaining data of a fault circuit by utilizing a virtual test according to a circuit fault sample; and then, analyzing and judging the range of the circuit fault by adopting a parameter identification method in combination with a circuit theory, and finally positioning and eliminating the fault.
2. The virtual simulation experiment method for the circuit fault diagnosis of the transistor unit according to claim 1, characterized by comprising the following steps:
the method comprises the following steps: entering a virtual simulation experiment platform, and selecting one fault diagnosis experiment in basic experiment items from the unit circuit fault diagnosis experiment items;
step two, entering an experiment preparation stage according to engineering site requirements;
step three: selecting a transistor unit circuit, and completing theoretical analysis of the selected circuit to obtain theoretical parameters;
step four: a virtual simulation experiment platform randomly pushes out a fault sample circuit, and an operator measures and obtains virtual measurement parameters of a transistor unit circuit;
step five: an operator visually inspects the transistor unit circuit to narrow the fault range;
step six: comparing the virtual measurement parameters obtained in the step four with the theoretical parameters obtained in the step two, and judging the cause of the circuit fault of the transistor unit;
step seven: searching a circuit fault point of a transistor unit through instrument testing, and inputting a virtual simulation experiment platform;
step eight: measuring the circuit parameters of the transistor unit again, judging whether the circuit parameters are normal according to the theoretical parameters obtained in the third step, if so, removing the circuit fault, and executing the ninth step, otherwise, repeatedly executing the fifth step to the seventh step;
step nine: repeating the step four to the step eight in a circulating manner, and executing the step ten when the circulating frequency is 3;
step ten: executing the step eleven, or selecting a circuit from the extended experiment items provided in the virtual simulation experiment platform, and repeatedly executing the steps three to nine to finish the fault elimination of the selected circuit;
step eleven: and filling in an experiment report, and quitting the virtual simulation experiment platform after submitting the report.
3. The virtual simulation experiment method for the circuit fault diagnosis of the transistor unit as claimed in claim 2, wherein in the process of repeating the step four to the step eight in three times of loop execution, the circuit fault samples have randomness and diversity, and the specific content of the fault diagnosis is from shallow to deep as the number of loop times increases.
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