CN105022864B - A kind of system testing point choosing method that matrix is relied on based on extension - Google Patents
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Abstract
A kind of system testing point choosing method that matrix is relied on based on extension, the fault mode being able to detect that first according to test point, obtain extension and rely on matrix Dx；Then in order respectively obtain fuzz testing point to collecting, hide test point to collection and equivalent test point to collection, and obtain most simple test point set, finally according to Fault Isolation contribution rate, most simple test point set obtain the final test point set of highest detection rate, complete integration test point and recommend.The inventive method compared with prior art, overcomes the defects of prior art is to the processing of all test points non-bonus point class, unified poorly efficient processing, how guidance adds test point, while fault coverage is ensured, has simplified final test point set.
Description
Technical field
The present invention relates to system performance testing field, particularly a kind of system testing point that matrix is relied on based on extension is chosen
Method.
Background technology
Test point is laid out and so that meets certain fault detect rate, Percent Isolated requirement in traditional testability field
In order to fault detect be come out in certain verification and measurement ratio when breaking down, and enable to that failure can be will appear from
Reason positioning, it is isolated to some failure or certain several failure.In the Military Application such as Aeronautics and Astronautics field, test point conjunction is carried out
Removing the work office, it is to position failure, investigate the necessary means of reason.
Mainly there are two classes to the method for test point optimization at this stage：First kind patent is based on given test point layout calculation
Fault detect rate, Percent Isolated result, such as a kind of BJ University of Aeronautics ＆ Astronautics's CN201110217872.X patents " testability
Single order correlation collective model method for building up ", the CN201010545014.3 patents of 63908 Forces, PLA
" a kind of electronic product testability analysis and the implementation method of diagnosis decision system ", University of Electronic Science and Technology CN201410273011.7
A kind of number patent " board-level circuit testability index computational methods ", this kind of method has been added mainly for testability designer
Test point is analyzed, and provides fault detect rate, the result of calculation of Percent Isolated, it is difficult to from reasonable progress test point layout
Overall system design, which is set out, carries out the recommendation of test point, and positive, constructive suggestions can not be provided to the recommendation of test point, is tested
Personnel carry out the layout of test point simply with a kind of mode of poorly efficient trial and error.Second class patent is to be based on designed test point
Design carries out preferred for the test of fault diagnosis, is concentrated from the test point of user's addition and searches for optimal test point and with satisfaction
Rapidity, such as CN201310025908.3 patents " the avionics assembly function maintenance test point selection side of Civil Aviation University of China
Method ", the CN201210366367.6 patents of North China Electric Power University " a kind of complication system tests preferable implementation method ", it is this kind of
Method is also to be analyzed for the test point layout designed, if obtaining test point is used for fault diagnosis, how using most
Few test point location failure, what is obtained is the optimal sequence of test point, difference and first kind patent, the test of the second class patent
The test point set for being preferably based on added number of point, will not also improve the indexs such as coverage rate, isolation rate.
The content of the invention
Present invention solves the technical problem that it is：Overcome the deficiencies in the prior art, there is provided one kind is by according to each test
The fault mode that is able to detect that of point establishes extension and relies on matrix, so obtain respectively in order fuzz testing point to, hide and survey
Pilot pair and equivalent test point are to obtaining most simple test point set, in conjunction with Fault Isolation contribution rate evaluation test point in set
Priority, obtain final test point set based on extension rely on matrix performance test point choosing method.
The present invention technical solution be：A kind of system testing point choosing method that matrix is relied on based on extension, including
Following steps：
(1) all test points that can place test are obtained, test point is designated as Ti, and then obtain the set of test point
Tpsb, all fault modes are then obtained, fault mode is designated as Fj, and then the set F of fault mode is obtained, wherein, i=1,
2,3 ... N, j=1,2,3 ... M, N are the quantity of test point, and M is the quantity of fault mode；
(2) test point T is judgediFault mode F can be detectedjIf test point TiFault mode F can be detectedj, then expand
Exhibition relies on matrix DxIn the i-th row jth arrange amount be 1, if if test point TiFault mode F can not be detectedj, then extension according to
Rely matrix DxIn the i-th row jth arrange amount be 0, travel through all test points and fault mode, obtain M rows N row extension rely on square
Battle array Dx；
(3) matrix D is relied in extensionxIn, obtain and test point TiThe identical row of respective column, and then obtain complete phase
Test point [T corresponding to same rowk,…,Tm], fuzz testing point is obtained to [Ti,Tk,…,Tm], travel through all test points and obtain institute
Some fuzz testing points pair；
(4) in each fuzz testing point pair, take a test point to represent present Fuzzy test point pair respectively, obtain one
Point set is tested, test point in the test point set is traveled through and relies on matrix D in extensionxIn corresponding row, if test point TiPlace
Logic or test point T are distinguished in row step-by-stepkColumn ..., test point TmThe result of column is test point TiColumn, then obtain
Hide test point pair<Ti,[Tk,…,Tm]>, the test point set is traveled through, obtains all hiding test points pair；
(5) in hiding test point pair<Ti,[Tk,…,Tm]>In, if test point TiThe institute that can be tested is faulty
Point set [T can be testedk,…,Tm] in it is at least one test arrive, then obtain equivalent test point pair<Ti,[Tk,…,Tm]>, traversal institute
The hiding test point pair having, obtain all equivalent test points pair；
(6) all test points are traveled through, can not be any to, the fault mode that is able to detect that by all equivalent test points
Test point is hidden and does not also hide the test point for the fault mode that any test point is able to detect that, is not equivalent test point pair
Part hides test point to adding most simple test point set, obtains most simple test point set；
(7) for the equivalent test point pair in most simple test point set<Ti,[Tk,…,Tm]>, calculate test point Ti, test
Point set [Tk,…,Tm] isolation contribution rate, if test point TiIsolation contribution rate be more than test point set [Tk,…,Tm]
Isolate contribution rate, then by TiFinal test point set is added, otherwise will test point set [Tk,…,Tm] add final test point set
Close, then the fault mode being each able to detect that in most simple test point set can not be hidden by any test point and also do not had
Have the test point of hiding any test point, be not equivalent test point pair part hide test point to add final test point set
Close, travel through most simple test point set, form final test point set；Described isolation contribution rate is：If m test point is being surveyed
Some fault mode can be tested out during examination, and n other test point can not test out the failure in test, then m test
The Fault Isolation contribution rate of point is m/ (m+n), and the Fault Isolation contribution rate of n test point is n/ (m+n)；
(8) test point when test point in final test point set is tested as current system.
The present invention compared with prior art the advantages of be：
(1) the test point set added is directed to the present invention overcomes conventional method and carries out fault detect rate, failure
Isolation rate carries out calculating analysis, and can not instruct how to be added with and be beneficial to improve fault detect rate, the test point of Percent Isolated
The defects of, extension is established by the fault mode being able to detect that according to each test point and relies on matrix, and then is distinguished in order
Obtain fuzz testing point to, hide test point pair and equivalent test point to obtaining most simple test point set, in conjunction with Fault Isolation
Priority of the contribution rate evaluation test point in set, obtains final test point set；
(2) the inventive method, overcome prior art and the processing of all test points non-bonus point class, unified poorly efficient processing are lacked
Fall into, obtain respectively in order fuzz testing point to, hide test point pair and equivalent test point pair, by these redundancy testing points
To merging treatment obtain final test point set；
(3) the inventive method, overcome prior art and treat fault detect rate, Percent Isolated strict differences, do not have
Two attribute efficient associations are got up to design the defects of test point provides effective information, combination failure verification and measurement ratio contribution margin, event
Priority of the phragma from contribution rate evaluation test point in set, while fault coverage is ensured, final test is simplified
Point set.
Brief description of the drawings
Fig. 1 is that a kind of system testing point that matrix is relied on based on extension of the present invention chooses method schematic；
Fig. 2 is that the inventive method obtains fuzz testing point to collecting flow chart；
Fig. 3 is that the inventive method obtains hiding test point to collecting flow chart；
Fig. 4 is the inventive method final test point set generating principle flow chart.
Embodiment
The problem of present invention not enough optimizes for selecting test point, there is provided a kind of positive, efficient mode is surveyed
A kind of feasible method that pilot is recommended automatically, the fault mode being able to detect that first according to test point, obtain extension and rely on square
Battle array Dx；Then obtain respectively in order fuzz testing point to collecting, hide test point to collection and equivalent test point to collection, and obtain most
Letter test point set；Finally according to Fault Isolation contribution rate, most it is simple test point set obtain the final test point of highest detection rate
Set, complete integration test point and recommend.Below in conjunction with the accompanying drawings and embodiment is described in detail.
As shown in figure 1, the inventive method is implemented as follows：
(1) establish extension and rely on matrix Dx
First, all test points that can place test are obtained from the external world, is designated as Ti, and then obtain the set of test point
Tpsb, all fault modes then are obtained from the external world, are designated as Fj, and then the set F of fault mode is obtained, wherein, i=1,2,3 ...
N, j=1,2,3 ... M, N are the quantity of test point, and M is the quantity of fault mode, finally by judging test point TiIt can detect
Fault mode FjThe extension for obtaining M rows N row relies on matrix DxIf test point TiFault mode F can be detectedj, then extension dependence
Matrix DxIn the i-th row jth arrange amount be 1, if if test point TiFault mode F can not be detectedj, then extend and rely on matrix
DxIn the i-th row jth arrange amount be 0, wherein, extension rely on matrix DxStore fault mode F and test TiDependence.
(2) redundancy testing point pair is obtained
Defining test point verification and measurement ratio contribution margin is：For at least two set of test spots into set, the set addition TiAfterwards
Verification and measurement ratio and the difference of the set contribution rate.According to the definition of verification and measurement ratio contribution margin, the inventive method defines redundancy testing point pair
It is defined as：
Test point TiWith test point TkTest point pair is formed, if test point set addition test point TiWith adding test point
TkTest point verification and measurement ratio contribution margin it is identical, then TiAnd TkFor redundancy testing point pair.Matrix D is relied on according to extensionxRow surveyed
Pilot Analysis, the manifestation mode of redundancy testing point pair include three kinds：Fuzz testing point to, hide test point pair and equivalent test point
It is right.
The embodiment for obtaining redundancy testing point pair is as follows：
(2.1) fuzz testing point pair is obtained
The failure that each test point of fuzz testing point centering can test is duplicate, i.e. fuzz testing point pair
Any of test point can represent whole fuzz testing point pair.
Because each T of fuzz testing point centeringiThe fault mode F that can be measuredjThe same, thus correspond to extension according to
Rely matrix DxIn, identical row form fuzz testing point pair, obtain extension and rely on matrix DxIn with test point TiThe complete phase of column
Same row, and then obtain test point [T corresponding to identical rowk,…,Tm], and then test point is obtained to [Ti,Tk,…,
Tm], all test points are traveled through, obtain all fuzz testing points pair, wherein, if relying on matrix D in extensionxIn, not with survey
Pilot TiThe identical row of column, then test point TiCorresponding fuzz testing point is to for [Ti].It is illustrated in figure 2 acquisition mould
Paste the flow chart of test point pair.
(2.2) obtain and hide test point pair
Hide test point pair<Ti,[Tk,…,Tm]>Represent test point TiTest point can be tested to [Tk,…,Tm] can
All fault modes tested, wherein, k ≠ m ≠ i, k=1,2,3 ... N, m=1,2,3 ... N, i=1,2,3 ... N.
Correspond to extension and rely on matrix DxIn, test point TiLogic or test point T are distinguished in column step-by-stepkColumn ...,
Test point TmThe result of column is test point TiColumn, obtain hide test point pair accordingly.Extension relies on matrix DxIn, such as
The jth row that fruit i-th arranges is 1, then it represents that test point TiFault mode F can be detectedj, matrix D is relied in extensionxIn, two tests
Point Ti、TjColumn carries out step-by-step logic or can obtain the fault mode that two test points can test.In each fuzzy survey
Pilot centering, take a test point to represent its corresponding fuzz testing point pair respectively, obtain testing point set, then travel through new obtain
To test point be integrated into extension rely on matrix DxIn corresponding row, if test point TiLogic or test are distinguished in column step-by-step
Point TkColumn ..., test point TmThe result of column is test point TiColumn, then obtain hiding test point pair<Ti,
[Tk,…,Tm]>, the test point set newly obtained is traveled through, obtains all hiding test points pair.Acquisition is illustrated in figure 3 to hide
The step of test point pair.
(2.3) equivalent test point pair is obtained
Equivalent test point pair<Ti,[Tk,…,Tm]>Represent test point TiTest point can be tested to [Tk,…,Tm] can
All fault modes tested, and test point TiEqually test less than test point to [Tk,…,Tm] the failure mould that does not detect
Formula, i.e. TiThe institute that can be tested is faulty, it is necessary to tested point set [Tk,…,Tm] in it is at least one measure,
Extension relies on matrix DxIn, i.e. test point Ti1 all neither ones can not be tested point set [T in columnk,…,Tm] institute
Override in row.In each hiding test point pair, take a test point to represent its corresponding fuzz testing point pair respectively, obtain
Test point set.
(3) test point Fault Isolation contribution rate is obtained
The present invention defines test point Fault Isolation contribution rate：If m test point in test can (or can not) test out
Some failure, and n other test point in test can not (or can) test out the failure, then the event of m test point
Phragma is m/ (m+n) from contribution rate, and the Fault Isolation contribution rate of n test point is n/ (m+n).
If for example, test point can (or can not) test out some failure, t test point can not (or can) survey in addition
Some failure is tried out, then the Fault Isolation contribution rate of this test point is 1/ (1+t), corresponds to extension and relies on matrix DxIn, if
Test point TiColumn is that 1, m is classified as 1, n and is classified as 0, then test point TiIsolation contribution rate be：(m+1)/(m+n+1), wherein,
T=1,2,3 ... N, n=1,2,3 ... N.
(4) integration test point set is completed to recommend
The inventive method can will meet that highest detection rate, isolation rate most simplify test in test point recommendation process
Point is recommended out, and specific test point recommends method as shown in figure 4, step is as follows：
(4.1) the most simple test point set that disclosure satisfy that maximum fault detect rate is chosen from test point set
According to the equivalent test point that step (2.3) acquires to, not by any equivalent test point to comprising test point
(including two parts：The fault mode being able to detect that can not be hidden by any test point, also not hide the survey of any test point
Pilot；Be not equivalent test point pair part hide test point to), obtain disclosure satisfy that the most simple test of maximum fault detect rate
Point set, plus the point of redundancy testing before acquisition strategy rule, the test point set that the set can ensure to obtain is most simple
Test point set, wherein, in most simple test point set comprising all equivalent test points to, the fault mode that is able to detect that not
Can be hidden by any test point and also do not hide any test point test point, be not equivalent test point pair part hide test
Point pair.
(4.2) in most simple test point set, for each equivalent test point pair, selection has maximum Fault Isolation tribute
The element of the test point pair of rate is offered, adds final test point set, travels through all equivalent test points pair；First according to step (3) more
The isolation contribution rate of new all test points, then for all equivalent test points pair, obtain has maximum isolation contribution rate respectively
Test point or test point set.Such as equivalent test point pair<Ti,[Tk,…,Tm]>If TiIsolation contribution rate it is big
In [Tk,…,Tm] isolation contribution rate, then take TiFinal test point set is added, otherwise takes [Tk,…,Tm] add final test
Point set.
(4.3) by most it is simple test point set in the fault mode being able to detect that can not be hidden by any test point and
Do not hide any test point test point, be not equivalent test point pair part hide test point to add final test point set
Close, the most simple test point set of traversal obtains final test point set, and the test point set is that can reach highest detection rate, coverage rate
Most simplified set.Final test point results set, it can as reach the most simplified test point set of highest detection rate, isolation rate
Close.
(5) test point when test point in final test point set is tested as current system.A kind of base of the present invention
The system testing point choosing method of matrix is relied in extension, it is real by the quantitative assessment to test point verification and measurement ratio, isolation contribution rate
The packet of existing redundancy testing point pair and the priority ordering of isolation test point pair, carry out quantitative analysis to test point, are systematic function
Test point in testing field recommends to provide a kind of reference method.
The content not being described in detail in description of the invention belongs to the known technology of those skilled in the art.
Claims (1)
1. a kind of system testing point choosing method that matrix is relied on based on extension, it is characterised in that comprise the following steps：
(1) all test points that can place test are obtained, test point is designated as Ti, and then obtain the set T of test pointpsb, so
After obtain all fault modes, fault mode is designated as Fj, and then the set F of fault mode is obtained, wherein, i=1,2,3 ... N,
J=1,2,3 ... M, N are the quantity of test point, and M is the quantity of fault mode；
(2) test point T is judgediFault mode F can be detectedjIf test point TiFault mode F can be detectedj, then extension dependence
Matrix DxIn the i-th row jth arrange amount be 1, if test point TiFault mode F can not be detectedj, then extend and rely on matrix DxIn
The amount of i-th row jth row is 0, travels through all test points and fault mode, and the extension for obtaining M rows N row relies on matrix Dx；
(3) matrix D is relied in extensionxIn, obtain and test point TiThe identical row of respective column, and then obtain identical
Test point [T corresponding to rowk,…,Tm], fuzz testing point is obtained to [Ti,Tk,…,Tm], travel through all test points obtain it is all
Fuzz testing point pair；
(4) in each fuzz testing point pair, take a test point to represent present Fuzzy test point pair respectively, obtain a test
Point set, travel through test point in the test point set and rely on matrix D in extensionxIn corresponding row, if test point TiColumn is pressed
Position difference logic or test point TkColumn ..., test point TmThe result of column is test point TiColumn, then hidden
Test point pair<Ti,[Tk,…,Tm]>, the test point set is traveled through, obtains all hiding test points pair；
(5) in hiding test point pair<Ti,[Tk,…,Tm]>In, if test point TiThe institute that can be tested faulty can test
Point set [Tk,…,Tm] in it is at least one test arrive, then obtain equivalent test point pair<Ti,[Tk,…,Tm]>, travel through all hidden
Test point pair is hidden, obtains all equivalent test points pair；
(6) all test points are traveled through, by all equivalent test points to, not by any equivalent test point to comprising test point add
Enter most simple test point set, obtain most simple test point set；It is described not by any equivalent test point to comprising test point
Fault mode including being able to detect that can not be hidden by any test point and not hide the test point of any test point, and
It is not the hiding test point pair in part of equivalent test point pair；
(7) for the equivalent test point pair in most simple test point set<Ti,[Tk,…,Tm]>, calculate test point Ti, test point set
Close [Tk,…,Tm] isolation contribution rate, if test point TiIsolation contribution rate be more than test point set [Tk,…,Tm] isolation
Contribution rate, then by TiFinal test point set is added, otherwise will test point set [Tk,…,Tm] final test point set is added,
Then by most it is simple test point set in not by any equivalent test point to comprising test point add final test point set, time
Most simple test point set is gone through, forms final test point set；Described isolation contribution rate is：If m test point is in test
Some fault mode can be tested out, and n other test point can not test out the failure in test, then m test point
Fault Isolation contribution rate is m/ (m+n), and the Fault Isolation contribution rate of n test point is n/ (m+n)；It is described not by any equivalent
Test point to comprising test point include the fault mode that is able to detect that and can not be hidden and do not hide any by any test point
The test point of test point, and be not the hiding test point pair in part of equivalent test point pair；
(8) test point when test point in final test point set is tested as current system.
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| CN106980715A (en) * | 2017-03-13 | 2017-07-25 | 郑州云海信息技术有限公司 | A kind of method for not having to add ICT measuring point networks in quick inspection PCB |
| CN109901054A (en) * | 2019-03-25 | 2019-06-18 | 苏州中晟宏芯信息科技有限公司 | The function coverage model measurement point extracting method and system of fixed and floating conversion circuit |
| CN111162959B (en) * | 2019-11-28 | 2021-07-06 | 中国航空工业集团公司西安航空计算技术研究所 | Parameter-based avionics interface data communication protocol fuzzy test method |
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