CN109522200A - A kind of raising stores the test method of disk array stability, system and terminal more - Google Patents
A kind of raising stores the test method of disk array stability, system and terminal more Download PDFInfo
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
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Abstract
The present invention provides the test method that a kind of raising stores disk array stability more, system and terminal, is based on array information, at least two storage disk inspection markers of configuration；Inspection configuration preset condition；Verifying can be compared to the inspection marker in array information according to inspection preset condition, judge whether array is abnormal.By a variety of alignments to the inspection marker in array information, and promote based on the setting of inspection preset condition the Information Security of storage system and the safety and stability of data stability and RAID array information operating process.Improve polydisc RAID array stability approach, the stability of RAID array can effectively be improved, it avoids forcing to power off or hanging the exception of RAID array caused by abnormal conditions of waiting indefinitely, ensure that the hard disk of RAID card and carry under RAID card can operate normally the safety with data, solves potential problem and risk existing for RAID card.
Description
Technical field
The present invention relates to the test sides that technical field of data storage more particularly to a kind of raising store disk array stability more
Method, system and terminal.
Background technique
The array with redundant ability that storage disk array has independent disk to constitute.Disk array is stored as autonomous system,
It is connected with server or host by network.Storage disk array has multiple ports that can be connected by different server or host.
Certain server or a host can connect storage disk array by multiple ports and promote transmission speed.
In storage disk array, RAID card is the heart of storage subsystem, and RAID is that muti-piece is stored disk differently
A logic hard disk is combined to form, so that providing than single hard disk has higher performance and provide data redundancy function.
And the stability of RAID array is even more the key of the performance and data safety that influence a storage subsystem.General feelings
Under condition, RAID card can regularly update the relevant information of each storage disk in storage disk array, it is ensured that entirely RAID array is complete
Property and stability, and when RAID card update array in it is each storage disk information when, in case of suddenly power-off or information pass
Defeated interruption, extension wait indefinitely abnormal conditions when, will cause in array store disk information it is inconsistent, asked so as to cause RAID array
Topic, influences the Information Security and data stability of storage system.How the Information Security and number of storage system are promoted
It is current technical problem urgently to be resolved according to stability and the safety and stability of RAID array information operating process.
Summary of the invention
In order to overcome the deficiencies in the prior art described above, the present invention provides a kind of data that can be realized and promote storage system
The test method of the safety and stability of safety and data stability and RAID array information operating process is
System and terminal.
Wherein, the present invention provides a kind of terminal realized and improve the test method of more storage disk array stability, comprising:
Memory, for storing computer program and improving the test method of more storage disk array stability；
Processor is mentioned for executing the computer program and improving the test method of more storage disk array stability with realizing
The step of test method of high more storage disk array stability.
In this way, method may be implemented in terminal includes:
Based on array information, at least two storage disk inspection marker of configuration；
Preferably, configuration storage disk inspection marker editor's mechanism；
Storage disk inspection marker editing machine is set up to set, principle is written in covering.
Preferably, configuration storage disk inspection marker editor's mechanism；
Storage disk inspection marker editing machine is set up into the sequential arrangement principle set according to write-in.
Further, inspection configuration preset condition；
According to inspection preset condition, verifying is compared to the inspection marker in array information, judges whether array is abnormal.
Further, step inspection configuration preset condition further include:
Configuration test monitoring time point；
When reaching test monitoring time point, storage disk inspection marker write operation is opened；
Storage disk inspection marker is written every a default write-in duration, until reaching the pre- of storage disk inspection marker
If quantity is written.
Further, step inspection configuration preset condition further include:
Using at least two storage disk inspection marker information of same test monitoring time point write-in as array judging unit；
The whether identical conduct inspection of at least two storage disk inspection marker information for including inside array judging unit is preset
Condition；
Inspection marker information at least two array informations for including inside array judging unit mutually compare and is tested
Card；
When information is consistent, it is judged as that array is normal.
Further, step inspection configuration preset condition further include:
Comparison presupposed information is configured in same test monitoring time point；
By it is same test monitoring time point write-in each storage disk inspection marker information respectively with comparison presupposed information
Be compared, judge whether it is identical, as inspection preset condition；
When same test monitoring time point comparison information is consistent, judge that the test monitoring time point is normal for array.
Further, step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration starting test monitoring time point and test inspection interval duration；
After reaching starting test monitoring time point, storage disk inspection marker first time write operation is opened；
And storage disk inspection marker is written every a default write-in duration, until reaching storage disk inspection marker
Default write-in quantity；
Inspection interval duration is tested every one, opens storage disk inspection marker write-once operation.
Terminal also configures and executes the test macro for improving more storage disk array stability, comprising: array information configures mould
Block, inspection presetting module and contrast judgement module；
Array information configuration module is used to be based on array information, at least two storage disk inspection marker of configuration；
Inspection presetting module is used for inspection configuration preset condition；
Contrast judgement module is used to that verifying to be compared to the inspection marker in array information, sentence according to inspection preset condition
Whether disconnected array is abnormal.
Preferably, inspection presetting module is also used to configure test monitoring time point；When reaching test monitoring time point, open
Open storage disk inspection marker write operation；Storage disk inspection marker is written every a default write-in duration, until
Reach the default write-in quantity of storage disk inspection marker；
It is also used to configure comparison presupposed information in same test monitoring time point；
By it is same test monitoring time point write-in each storage disk inspection marker information respectively with comparison presupposed information
Be compared, judge whether it is identical, as inspection preset condition；
When same test monitoring time point comparison information is consistent, judge that the test monitoring time point is normal for array.
As can be seen from the above technical solutions, the invention has the following advantages that
The present invention can be compared verifying to the inspection marker in array information, judge array according to inspection preset condition
It is whether abnormal.Pass through a variety of alignments to the inspection marker in array information, and setting based on inspection preset condition
Set promoted the safety of the Information Security of storage system and data stability and RAID array information operating process with
And stability.Polydisc RAID array stability approach is improved, the stability of RAID array can be effectively improved, avoids forcing disconnected
Electricity hangs the exception of RAID array caused by abnormal conditions of waiting indefinitely, it is ensured that the hard disk of RAID card and carry under RAID card can be just
The often safety of operation and data, solves potential problem and risk existing for RAID card.
The present invention also optimizes the information for updating each storage disk in array, and solving abnormal conditions leads to RAID array
The problem of failed, improves the stability of polydisc RAID array, avoids loss of data, falls the problems such as disk.
Detailed description of the invention
In order to illustrate more clearly of technical solution of the present invention, attached drawing needed in description will be made below simple
Ground introduction, it should be apparent that, drawings in the following description are only some embodiments of the invention, for ordinary skill
For personnel, without creative efforts, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is the test method flow chart for improving more storage disk array stability；
Fig. 2 is the test method embodiment flow chart for improving more storage disk array stability；
Fig. 3 is the test method embodiment flow chart for improving more storage disk array stability；
Fig. 4 is the test macro schematic diagram for improving more storage disk array stability.
Specific embodiment
The present invention provides the test method that a kind of raising stores disk array stability more, as shown in Figure 1, method includes:
S1 is based on array information, at least two storage disk inspection marker of configuration；
Array information is systemic presupposition, and system is the array with redundant ability constituted based on independent storage disk.The present invention
Middle storage disk can be computer-readable medium, may include computer storage medium, such as random access memory (RAM),
Read-only memory (ROM), nonvolatile RAM (NVRAM), Electrically Erasable Programmable Read-Only Memory (EEPROM),
Flash memory, magnetically or optically data storage medium and analog.In some embodiments, a kind of manufacture product may include one or more
A computer-readable storage medium.
Here the write sequence of each storage disk inspection marker can be preset, namely according to write sequence successively to storage
Disk inspection marker carries out information write-in.System is also configured with RAID card.The setting for storing disk inspection marker is to record
Information to be verified.Here it can be set multiple.
S2, inspection configuration preset condition；
Before judging array information safety and stability, inspection condition is first set, is based on verification condition, is tested
Card.Certain inspection configuration preset condition, can be based on verifying personnel's self-setting, in systems configuration setting port, system
It is verified automatically based on preset condition.
S3 is compared verifying to the inspection marker in array information, whether judges array according to inspection preset condition
It is abnormal.
Verification result can be exported in a manner of log, can also be directly displayed on a display screen.
It in order to make the invention's purpose, features and advantages of the invention more obvious and easy to understand, below will be with specific
Examples and drawings, the technical solution protected to the present invention are clearly and completely described, it is clear that implementation disclosed below
Example is only a part of the embodiment of the present invention, and not all embodiment.Based on the embodiment in this patent, the common skill in this field
Art personnel all other embodiment obtained without making creative work belongs to the model of this patent protection
It encloses.
Embodiment one, as shown in Fig. 2,
S11 is based on array information, at least two storage disk inspection marker of configuration；
S12, configuration test monitoring time point；
It is to test the write operation entry condition that monitoring time point is storage disk inspection marker in this way.
S13 opens storage disk inspection marker write operation when reaching test monitoring time point；
Here time point can be by user's self-setting, can also be based on system in the process of running, when the certain conditions of triggering
Just monitoring time point is tested in starting afterwards.
S14 is written storage disk inspection marker every a default write-in duration, until reaching storage disk inspection mark
Know the default write-in quantity of position.
After opening storage disk inspection marker write operation, the data write-in to storage disk inspection marker is not primary
Property completion, but based on a default write-in duration, write-in one by one.Because being provided with multiple storage disk inspections to identify
Position can carry out corresponding write operation in storage disk inspection marker according to presently written quantity.Store disk inspection mark
The preset quantity of position can be more than the quantity for needing to be written data.
S15 is compared verifying to the inspection marker in array information, judges that array is according to inspection preset condition
No exception.
Certainly after the completion of write-in, so that it may carry out judging whether array is abnormal.
Technology as described herein may be implemented in hardware, software, firmware or any combination of them.The various spies
Sign is module, and unit or assembly may be implemented together in integration logic device or separately as discrete but interoperable logic
Device or other hardware devices.In some cases, the various features of electronic circuit may be implemented as one or more integrated
Circuit devcie, such as IC chip or chipset.
In the present embodiment, it should be further noted that as shown in figure 3, step inspection configuration preset condition further include: again
First the data for completing storage disk inspection marker are written.Specific deterministic process further include:
S151 judges single using at least two storage disk inspection marker information of same test monitoring time point write-in as array
Member；
Namely using at least two storage disk inspection marker information of same test monitoring time point write-in as an entirety.
S152, the whether identical conduct of at least two storage disk inspection marker information that will include inside array judging unit
Inspection preset condition；
Namely if in array judging unit, if storage disk inspection marker information is all the same, it can be determined that be battle array
Column are normal.
S153 carries out phase to the inspection marker information at least two array informations for including inside array judging unit
Mutual comparison；
S154 is judged as that array is normal when information is consistent.
If the inspection marker information in certain array information is not identical, it is judged as array exception, carries out alarm and mention
Show.
The present invention also provides one embodiment two, with above-described embodiment one the difference is that,
Step inspection configuration preset condition further include:
Comparison presupposed information is configured in same test monitoring time point；
By it is same test monitoring time point write-in each storage disk inspection marker information respectively with comparison presupposed information
Be compared, judge whether it is identical, as inspection preset condition；
When same test monitoring time point comparison information is consistent, judge that the test monitoring time point is normal for array.
Different from embodiment one namely when comparison condition is arranged, wherein comparison condition is that have user setting one
Different comparison presupposed informations, the default letter of comparison can be arranged in a comparison presupposed information in different time sections
Breath can also be arranged according to the different use condition of system, and specific set-up mode is without limitation.
Each storage disk inspection marker information of same test monitoring time point write-in is preset with comparison respectively
Information is compared, and array is normal if all the same.If some is inconsistent, then output array is abnormal, illustrates that system occurs
Generation power-off or information Transmission suddenly are crossed, abnormal conditions of waiting indefinitely are hung.
The present invention also provides one embodiment three, with above-described embodiment one, two the difference is that,
Step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration starting test monitoring time point and test inspection interval duration；
After reaching starting test monitoring time point, storage disk inspection marker first time write operation is opened；
And storage disk inspection marker is written every a default write-in duration, until reaching storage disk inspection marker
Default write-in quantity；
Inspection interval duration is tested every one, opens storage disk inspection marker write-once operation.
Here with above-described embodiment one, two the difference is that the write-in opening ways of storage disk inspection marker.Here
Opening ways are based on starting test monitoring time point and test inspection interval duration, user setting starting test monitoring time
After point, system starts to be calculated, and by a test inspection interval duration, then opens storage disk inspection marker for the first time
Write operation.In cycles operate, until setting end mode.
Writing mode is identical as above-described embodiment one and two, that is, every a default write-in duration to storage disk inspection mark
Know position to be written, until reaching the default write-in quantity of storage disk inspection marker.
Based on above-mentioned writing mode, subsequent step, according to inspection preset condition, to the inspection marker in array information
Verifying is compared, judges whether array is abnormal.
It can be any to be verified based on the verification mode of embodiment one and two.
If realized within hardware, the present invention relates to a kind of devices, such as can be used as processor or integrated circuit dress
It sets, such as IC chip or chipset.Alternatively or additionally, if realized in software or firmware, the technology can
Realize at least partly by computer-readable data storage medium, including instruction, when implemented, make processor execute one or
More above methods.For example, computer-readable data storage medium can store the instruction such as executed by processor.
The present invention also provides one embodiment four, with above-described embodiment one, two and three the difference is that,
Step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration storage disk inspection marker editor's mechanism；
Storage disk inspection marker editing machine is set up to set, principle is written in covering.
It is understood that storage disk array information may include a variety of data informations based on more storage disk configurations, it is
Validation tests can be carried out to more storage disk array stability.The storage disk in order to realize validation test is configured in array information
Inspection marker, that is, realize that the test to more storage disk array stability is verified by storage disk inspection marker.
The data of usually more storage disks are that the system that is based on is changed in real time in use, are in order to track
System variation, storage disk inspection marker are also required to the variation with system data and change.Here it is configured with covering write-in principle,
It is to cover old information, more when namely carrying out write operation to the storage disk inspection marker in array information every time
It is new that information is written to be new.Storage disk inspection marker information is enabled to follow the variation of current system data.
For step inspection configuration preset condition and according to inspection preset condition, to the inspection marker in array information
Verifying judgement is compared, use can be combined according to above-described embodiment one to three is any.
The present invention also provides one embodiment five, with above-described embodiment one, two, three and four the difference is that,
Step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration storage disk inspection marker editor's mechanism；
Storage disk inspection marker editing machine is set up into the sequential arrangement principle set according to write-in.
It is understood that storage disk array information may include a variety of data informations based on more storage disk configurations, it is
Validation tests can be carried out to more storage disk array stability.The storage disk in order to realize validation test is configured in array information
Inspection marker, that is, realize that the test to more storage disk array stability is verified by storage disk inspection marker.
The data of usually more storage disks are that the system that is based on is changed in real time in use, are in order to track
System variation, storage disk inspection marker are also required to the variation with system data and change.Here it is configured with time according to write-in
Sequence arranges principle, that is, when carrying out write operation to the storage disk inspection marker in array information every time, being will new write-in
Information arrangement is after old information, carry out sequence arrangement, can guarantee that tester can store disk inspection with real-time tracking in this way
The writing process of marker can carry out historical query to writing process.Also it may be implemented steady to the contrast judgement of historical data
It is qualitative, to from now on to more storage disk array configuration offer reference frames.Storage disk inspection marker information is also enabled to follow
The variation of current system data.
The laying mode of storage disk inspection marker is identified by same time point, or with the storage disk inspection of write-once
Position arranged in parallel configuration forms current storage disk inspection and identifies hyte；
Different time points, or the storage disk inspection mark hyte of homogeneous write-in is not ranked up according to certain sequence.
For step inspection configuration preset condition and according to inspection preset condition, to the inspection marker in array information
Verifying judgement is compared, use can be combined according to above-described embodiment one to three is any.
The present invention also provides the test macros that a kind of raising stores disk array stability more, as shown in Figure 4, comprising: array
Information collocation module 1, inspection presetting module 2 and contrast judgement module 3；
Array information configuration module 1 is used to be based on array information, at least two storage disk inspection marker of configuration；
Inspection presetting module 2 is used for inspection configuration preset condition；
Contrast judgement module 3 is used to that verifying to be compared to the inspection marker in array information, sentence according to inspection preset condition
Whether disconnected array is abnormal.
Explanation is needed further exist for, inspection presetting module is also used to configure test monitoring time point；It is patrolled when reaching test
When examining time point, storage disk inspection marker write operation is opened；Every a default write-in duration to storage disk inspection marker
It is written, until reaching the default write-in quantity of storage disk inspection marker；It is also used to match in same test monitoring time point
Set comparison presupposed information；By it is same test monitoring time point write-in each storage disk inspection marker information respectively with than
To verifying presupposed information be compared, judge whether it is identical, as inspection preset condition；When same test monitoring time point compares
When information is consistent, judge that the test monitoring time point is normal for array.
The system and method being related in order to further illustrate the present invention is illustrated below with a specific embodiment,
System RAID card can regularly update the age information of each member disk in array, these information storages are respectively stored in RAID card
The specific storage address of NVRAM and each hard disk update the information before all covering every time.These age information are for ensuring
The integrality of RAID array, and can be judged to fall disk according to these information.
Improve polydisc RAID array stability, it is necessary first to the mechanism that age information is write in RAID card is modified, from each covering
Prime information becomes that new information is written, and stores 3 age information, replaces oldest age information every time.Secondly, RAID card timing
Each hard disk in inspection array updates age information, when finding array member's variation, is updated once every second age information, even
It is 3 times continuous.Finally, RAID card just judges to be changed only when 3 age information is all inconsistent for RAID array member, disk is kicked
Then RAID array is caused to degrade.In this way, when RAID card is when updating age information, be abnormal situation as force power-off or
When hanging extremely, due to only having updated the age information an of member disk, the age information of member disk three times not will lead to all
Difference not will lead to array degradation or failed, improve polydisc RAID array so array member's variation will not be judged as
Stability.
The present invention also provides a kind of terminals of test methods for realizing the more storage disk array stability of raising, comprising:
Memory, for storing computer program and improving the test method of more storage disk array stability；
Processor is mentioned for executing the computer program and improving the test method of more storage disk array stability with realizing
The step of test method of high more storage disk array stability.
The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, of the invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (10)
1. the test method that a kind of raising stores disk array stability more, which is characterized in that method includes:
Based on array information, at least two storage disk inspection marker of configuration；
Inspection configuration preset condition；
According to inspection preset condition, verifying is compared to the inspection marker in array information, judges whether array is abnormal.
2. the test method that raising according to claim 1 stores disk array stability more, which is characterized in that
Step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration storage disk inspection marker editor's mechanism；
Storage disk inspection marker editing machine is set up to set, principle is written in covering.
3. the test method that raising according to claim 1 stores disk array stability more, which is characterized in that
Step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration storage disk inspection marker editor's mechanism；
Storage disk inspection marker editing machine is set up into the sequential arrangement principle set according to write-in.
4. the test method that raising according to claim 1 stores disk array stability more, which is characterized in that
Step inspection configuration preset condition further include:
Configuration test monitoring time point；
When reaching test monitoring time point, storage disk inspection marker write operation is opened；
Storage disk inspection marker is written every a default write-in duration, until reaching the pre- of storage disk inspection marker
If quantity is written.
5. the test method that raising according to claim 4 stores disk array stability more, which is characterized in that
Step inspection configuration preset condition further include:
Using at least two storage disk inspection marker information of same test monitoring time point write-in as array judging unit；
The whether identical conduct inspection of at least two storage disk inspection marker information for including inside array judging unit is preset
Condition；
Inspection marker information at least two array informations for including inside array judging unit mutually compare and is tested
Card；
When information is consistent, it is judged as that array is normal.
6. the test method that raising according to claim 1 stores disk array stability more, which is characterized in that
Step inspection configuration preset condition further include:
Comparison presupposed information is configured in same test monitoring time point；
By it is same test monitoring time point write-in each storage disk inspection marker information respectively with comparison presupposed information
Be compared, judge whether it is identical, as inspection preset condition；
When same test monitoring time point comparison information is consistent, judge that the test monitoring time point is normal for array.
7. the test method that raising according to claim 1 stores disk array stability more, which is characterized in that
Step is based on array information, at least two storage disk inspection marker of configuration further include:
Configuration starting test monitoring time point and test inspection interval duration；
After reaching starting test monitoring time point, storage disk inspection marker first time write operation is opened；
And storage disk inspection marker is written every a default write-in duration, until reaching storage disk inspection marker
Default write-in quantity；
Inspection interval duration is tested every one, opens storage disk inspection marker write-once operation.
8. the test macro that a kind of raising stores disk array stability more characterized by comprising array information configuration module,
Inspection presetting module and contrast judgement module；
Array information configuration module is used to be based on array information, at least two storage disk inspection marker of configuration；
Inspection presetting module is used for inspection configuration preset condition；
Contrast judgement module is used to that verifying to be compared to the inspection marker in array information, sentence according to inspection preset condition
Whether disconnected array is abnormal.
9. the test macro that raising according to claim 8 stores disk array stability more, which is characterized in that
Inspection presetting module is also used to configure test monitoring time point；When reaching test monitoring time point, opens storage disk and patrol
Examine marker write operation；Storage disk inspection marker is written every a default write-in duration, until reaching storage disk
The default write-in quantity of inspection marker；
It is also used to configure comparison presupposed information in same test monitoring time point；
By it is same test monitoring time point write-in each storage disk inspection marker information respectively with comparison presupposed information
Be compared, judge whether it is identical, as inspection preset condition；
When same test monitoring time point comparison information is consistent, judge that the test monitoring time point is normal for array.
10. a kind of realize the terminal for improving the test method of more storage disk array stability characterized by comprising
Memory, for storing computer program and improving the test method of more storage disk array stability；
Processor, for executing the computer program and improving the test method of more storage disk array stability, to realize such as
The step of test method of the more storage disk array stability of raising described in claim 1 to 7 any one.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112148221A (en) * | 2020-09-18 | 2020-12-29 | 北京浪潮数据技术有限公司 | Method, device, equipment and storage medium for routing inspection of redundant array of disks |
Citations (1)
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| CN106502843A (en) * | 2016-10-09 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of hard disk plug stability test method suitable for raid card |
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| CN106502843A (en) * | 2016-10-09 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of hard disk plug stability test method suitable for raid card |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112148221A (en) * | 2020-09-18 | 2020-12-29 | 北京浪潮数据技术有限公司 | Method, device, equipment and storage medium for routing inspection of redundant array of disks |
| CN112148221B (en) * | 2020-09-18 | 2024-02-13 | 北京浪潮数据技术有限公司 | Method, device, equipment and storage medium for inspecting redundant array of inexpensive disks |
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