CN109387460A - A kind of observation of pollution particle and test device and analysis method - Google Patents

A kind of observation of pollution particle and test device and analysis method Download PDF

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Publication number
CN109387460A
CN109387460A CN201710692969.3A CN201710692969A CN109387460A CN 109387460 A CN109387460 A CN 109387460A CN 201710692969 A CN201710692969 A CN 201710692969A CN 109387460 A CN109387460 A CN 109387460A
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CN
China
Prior art keywords
polarization
particle
optical
observation
measured zone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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CN201710692969.3A
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Chinese (zh)
Inventor
马俊安
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Yuemei Measurement System China Co ltd
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Beauty Measurement System (shanghai) Co Ltd
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Publication date
Application filed by Beauty Measurement System (shanghai) Co Ltd filed Critical Beauty Measurement System (shanghai) Co Ltd
Priority to CN201710692969.3A priority Critical patent/CN109387460A/en
Publication of CN109387460A publication Critical patent/CN109387460A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0227Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging using imaging, e.g. a projected image of suspension; using holography
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/06Investigating concentration of particle suspensions
    • G01N15/075
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N2015/0092Monitoring flocculation or agglomeration

Abstract

The present invention relates to a kind of observation of pollution particle and test devices and analysis method, device includes: optical imaging apparatus, lighting apparatus, polarization device, positioning device, detection device, processing display equipment, fixed equipment, motive power outputting apparatus, and polarization device includes electronics adjustment equipment.Lighting apparatus illuminates at least part of particle accumulation object; form illumination measured zone; it illuminates and is equipped with filter in measured zone; polarization device includes optical polarization mating plate and optical analyzer; optical analyzer is located at the front end of the lens barrel of reflected light stereoscope; positioning device moves in the illumination measured zone of particle accumulation object according to grid.The present invention can reduce the secondary pollution probability of test process, and entire observation and test process are realized by automation, reduce the testing time, improve the reproducibility of measurement result and reduce artificial contamination's probability.

Description

A kind of observation of pollution particle and test device and analysis method
Technical field
The present invention relates to surface pollution degree the field of test technology in kind more particularly to a kind of observations of pollution particle and test Device and analysis method.
Background technique
In automobile manufacture, aviation, precision machinery, semiconductors manufacture, food processing, health care or medicine and other fields, For understanding demand day of the technical cleannes of the component of the susceptible dust in surface, device, product, workpiece or contact surface Benefit increases, such as in car steering field, more and more needs clearly to understand fuel injection system, brake system, liquid system Or the particle contamination degree of the individual components and the complex assemblies produced on this basis of micromation and performance reinforcement.Generally Since the surface of tested sample is too huge or since complex-shaped, surface is rugged and rough leads to not use direct method It observes and tests, the method that generallys use at this time is the dust for removing surface by adhesive membrane or cleaning solution, in cleaning solution Or filter residue or test analysis being carried out according to particle size, distribution and chemical attribute on adhesive membrane, the above method can reduce survey The secondary pollution probability of examination process.In order to reduce the testing time, improving the reproducibility of measurement result and reduce artificial contamination Probability, entire observation and test process are realized preferably by automation.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of observation of pollution particle and test devices and analysis method, with solution Deficiency certainly in the prior art.
In order to achieve the above object, the purpose of the present invention is be achieved through the following technical solutions:
On the one hand, a kind of observation of pollution particle and test device are provided, comprising:
The particle accumulation object being distributed in planar structure is imaged in optical imaging apparatus, including reflected light solid is aobvious Micro mirror and LED annular light source, the reflected light stereoscope are configured with digital CCD camera, the LED annular light source difference Positioned at the lens barrel two sides of the reflected light stereoscope;
Lighting apparatus illuminates at least part of the particle accumulation object, forms illumination measured zone, the photograph Filter is equipped in bright measured zone;
Polarization device, including optical polarization mating plate and optical analyzer, it is vertical that the optical analyzer is located at the reflected light The front end of the microscopical lens barrel of body;
Positioning device moves in the illumination measured zone of the particle accumulation object according to grid;
Detection device is received and is assessed by the imaging of the optical imaging apparatus in illumination measured zone described in each Data;
Processing display equipment, including PC machine and display, the PC machine are separately connected the digital CCD camera and described Positioning device;
Fixed equipment, including frame, the frame are the rectangle frame of a side opening, and the LED annular light source is located at described In rectangle frame, the illuminating bundle that the LED annular light source issues is projected from the opening of the rectangle frame;
Motive power outputting apparatus, including servo motor, the display, the PC machine, the servo motor and the frame It is sequentially connected;Wherein,
The polarization device includes electronics adjustment equipment, and the optical polarization mating plate and the optical analyzer pass through respectively Electronics adjustment equipment realizes that the relative position between one first polarization position and one second polarization position adjusts, the optics at As equipment generates the image of the particle accumulation object on the first polarization position and second polarization position respectively.
Above-mentioned pollution particle observation and test device, wherein the optical polarization mating plate is positioned at the LED annular light source Polarizing coating in the illuminating bundle of sending, the position of the polarizing coating is by electronics adjustment equipment adjustment.
Above-mentioned pollution particle observation and test device, wherein the positioning device is polyaxial controller.
Above-mentioned pollution particle observation and test device, wherein the lighting apparatus includes autofocus system.
Compared with the prior art, the beneficial effects of the present invention are:
The secondary pollution probability of test process can be reduced, entire observation and test process are realized by automation, are reduced and are surveyed The time is tried, the reproducibility of measurement result is improved and reduces artificial contamination's probability.
Detailed description of the invention
The attached drawing for constituting a part of the invention is used to provide further understanding of the present invention, schematic reality of the invention It applies example and its explanation is used to explain the present invention, do not constitute improper limitations of the present invention.In the accompanying drawings:
Fig. 1 shows the structural schematic diagram of present invention pollution particle observation and test device;
Fig. 2 shows the flow diagrams of pollution grading analysis method of the invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase Mutually combination.
Refering to what is shown in Fig. 1, the present invention pollute particle observation and test device include optical imaging apparatus, lighting apparatus, partially Shake equipment, positioning device, detection device, processing display equipment, fixed equipment and motive power outputting apparatus, wherein optical imaging apparatus The particle accumulation object being distributed in planar structure is imaged, including reflected light stereoscope 1 and LED annular light source 3, it is right The particle accumulation object being distributed in planar structure is imaged, including reflected light stereoscope and LED annular light source, reflected light Stereoscope 1 is configured with digital CCD camera 2, and LED annular light source 3 is located at the lens barrel two of reflected light stereoscope 1 Side.Lighting apparatus illuminates at least part of particle accumulation object, forms illumination measured zone 4, illuminates in measured zone 4 Equipped with filter 5.Polarization device includes optical polarization mating plate and optical analyzer 6, and it is aobvious that optical analyzer 6 is located at reflected light solid The front end of the lens barrel of micro mirror 1.Positioning device moves in the illumination measured zone of particle accumulation object according to grid.Detection device connects It receives and assesses by the imaging data of the optical imaging apparatus in each illumination measured zone 4.Processing display equipment includes PC machine 7 With display 8, PC machine 7 is separately connected digital CCD camera 2 and positioning device.Fixed equipment includes frame 9, and frame 9 is side The rectangle frame of opening, LED annular light source 3 are located in rectangle frame, and the illuminating bundle 10 that LED annular light source 3 issues is from rectangle frame Opening projects.Motive power outputting apparatus includes servo motor 11, and display 8, PC machine 7, servo motor 11 and frame 9 successively connect It connects.Polarization device includes electronics adjustment equipment, and optical polarization mating plate and optical analyzer adjust equipment by electronics respectively and realize Relative position between one first polarization position and one second polarization position adjusts, and optical imaging apparatus generates the first polarization position respectively With the image of the particle accumulation object on the second polarization position.In the technical program, optical polarization mating plate is positioned at LED annular light source 3 Polarizing coating 12 in the illuminating bundle of sending, by electronics adjustment equipment adjustment, positioning device is polyaxial for the position of polarizing coating 12 Controller 13, the arrow 14 in figure have marked the moving direction of polyaxial controller 13, and lighting apparatus includes automatic focuses System.With continued reference to diagram, filter 5 is placed on micro slide 15, and the field range of reflected light stereoscope 1 is in 1X1mm2 To 5X5mm2Between, filter 5 is that diameter is 26mm or the circle of 50mm.
Referring to shown in Fig. 2, the invention further relates to a kind of pollution grading analysis methods, based on such as the pollution of above-mentioned any one Grain observation and test device are realized, comprising:
At least part of particle accumulation object is illuminated in a planar substrate;
It is imaged according to be illuminated illumination measured zone of the grid for the particle accumulation object;
The imaging data got from measured zone is assessed based on particle characteristics, and metal is covered in each measured zone Imaging under the light irradiation of first polarization position of grain reflection forms First Series imaging data, without covering metallic particles reflection Second polarization position light irradiation under imaging form second series imaging data, First Series imaging data and second series Imaging data is compared to each other to detect metallic particles, and metallic particles is based on quantity and size is assessed, the first polarization position and the Two polarization positions are set by using electronics adjustment equipment adjustment polarization device.
From above-described embodiment as can be seen that present invention has an advantage that
The secondary pollution probability of test process can be reduced, entire observation and test process are realized by automation, are reduced and are surveyed The time is tried, the reproducibility of measurement result is improved and reduces artificial contamination's probability.
Specific embodiments of the present invention are described in detail above, but the present invention is not restricted to tool described above Body embodiment, it is merely an example.To those skilled in the art, any equivalent modifications and substitution are also all in the present invention Scope among.Therefore, made equal transformation and modification without departing from the spirit and scope of the invention, should all cover In the scope of the present invention.

Claims (5)

1. a kind of pollution particle observation and test device characterized by comprising
The particle accumulation object being distributed in planar structure is imaged in optical imaging apparatus, including reflected light stereoscope With LED annular light source, the reflected light stereoscope is configured with digital CCD camera, and the LED annular light source is located at The lens barrel two sides of the reflected light stereoscope;
Lighting apparatus illuminates at least part of the particle accumulation object, forms illumination measured zone, and the illumination is surveyed It measures and is equipped with filter in region;
Polarization device, including optical polarization mating plate and optical analyzer, it is aobvious that the optical analyzer is located at the reflected light solid The front end of the lens barrel of micro mirror;
Positioning device moves in the illumination measured zone of the particle accumulation object according to grid;
Detection device is received and is assessed by the imaging number of the optical imaging apparatus in illumination measured zone described in each According to;
Processing display equipment, including PC machine and display, the PC machine are separately connected the digital CCD camera and the positioning Equipment;
Fixed equipment, including frame, the frame are the rectangle frame of a side opening, and the LED annular light source is located at the rectangle In frame, the illuminating bundle that the LED annular light source issues is projected from the opening of the rectangle frame;
Motive power outputting apparatus, including servo motor, the display, the PC machine, the servo motor and the frame are successively Connection;Wherein,
The polarization device includes electronics adjustment equipment, and the optical polarization mating plate and the optical analyzer pass through described respectively Electronics adjusts equipment and realizes that the relative position between one first polarization position and one second polarization position adjusts, and the optical imagery is set Back-up does not generate the image of the first polarization position and the particle accumulation object on second polarization position.
2. the observation of pollution particle and test device according to claim 1, which is characterized in that the optical polarization mating plate is position The position of polarizing coating in the illuminating bundle that the LED annular light source issues, the polarizing coating adjusts equipment by the electronics Adjustment.
3. the observation of pollution particle and test device according to claim 2, which is characterized in that the positioning device is polyaxial Controller.
4. the observation of pollution particle and test device according to claim 1, which is characterized in that the lighting apparatus includes automatic Focusing system.
5. a kind of pollution grading analysis method, which is characterized in that based on the pollution as described in any one of Claims 1-4 Particle observation and test device are realized, comprising:
At least part of particle accumulation object is illuminated in a planar substrate;
It is imaged according to be illuminated illumination measured zone of the grid for the particle accumulation object;
The imaging data got from measured zone is assessed based on particle characteristics, and it is anti-that metallic particles is covered in each measured zone The imaging that the light irradiation for the first polarization position penetrated is lower forms First Series imaging data, without cover that metallic particles reflects the Imaging under the light irradiation of two polarization positions forms second series imaging data, and First Series imaging data and second series are imaged Data are compared to each other to detect metallic particles, and metallic particles is based on quantity and size is assessed, and the first polarization position and second is partially Vibration position is set by using electronics adjustment equipment adjustment polarization device.
CN201710692969.3A 2017-08-14 2017-08-14 A kind of observation of pollution particle and test device and analysis method Pending CN109387460A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110744213A (en) * 2019-10-30 2020-02-04 中国航空制造技术研究院 In-situ monitoring device and method for pollution of welding laser head protective lens
CN112578245A (en) * 2020-12-09 2021-03-30 广西电网有限责任公司电力科学研究院 GIS disconnecting link air chamber fault diagnosis method and device based on optical technology

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CN1282378A (en) * 1997-10-17 2001-01-31 金尼康科学有限公司 Analyte assay using particulate labels
DE202005020273U1 (en) * 2005-12-23 2006-03-02 JOMESA Meßsysteme GmbH Particulates analyzer e.g. for hygiene monitoring, provides morphological detail using a stereo microscope, polarized light and digital image recording
US20070146870A1 (en) * 2005-12-23 2007-06-28 Jomesa Messsysteme Gmbh Method for particle analysis and particle analysis system
CN101842751A (en) * 2007-10-30 2010-09-22 纽约大学 Tracking and characterizing particles with holographic video microscopy
CN101952709A (en) * 2007-11-15 2011-01-19 爱克斯崔里斯科技有限公司 Particle detection
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110744213A (en) * 2019-10-30 2020-02-04 中国航空制造技术研究院 In-situ monitoring device and method for pollution of welding laser head protective lens
CN112578245A (en) * 2020-12-09 2021-03-30 广西电网有限责任公司电力科学研究院 GIS disconnecting link air chamber fault diagnosis method and device based on optical technology

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Effective date of registration: 20221221

Address after: No. 9, Lianxin Road, Taicang City, Suzhou City, Jiangsu Province 215488

Applicant after: Yuemei Measurement System (China) Co.,Ltd.

Address before: 201807 Room 1011, 1013, 1015, Building A, No. 1355, Chengbei Road, Industrial Zone, Jiading District, Shanghai

Applicant before: JOMESA MEASUREMENT SYSTEM (SHANGHAI) CO.,LTD.