CN108663194A - A kind of high-precision optical vector network analysis device and method - Google Patents

A kind of high-precision optical vector network analysis device and method Download PDF

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CN108663194A
CN108663194A CN201810584161.8A CN201810584161A CN108663194A CN 108663194 A CN108663194 A CN 108663194A CN 201810584161 A CN201810584161 A CN 201810584161A CN 108663194 A CN108663194 A CN 108663194A
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frequency
response
phase
amplitude
output
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张旨遥
高�豪
杨帆
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CHENGDU YITAI TECHNOLOGY Co.,Ltd.
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Chengdu Zhuoli Zhiyuan Technology Co Ltd
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    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

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Abstract

The invention belongs to field of photoelectric technology, are related to a kind of device and method for carrying out high-acruracy survey to optical device amplitude-frequency response and phase-frequency response.The present invention is based on shift frequency single sideband modulation technologies, and the high-acruracy survey of optical device is realized using narrowband photodetector and width phase detecting circuit, have many advantages, such as that measurement range is wide, frequency scanning precision is high, amplitude and phase measurement are accurate.Compared to existing optics vector network analysis technology, the present invention is based on the optics vector analysis device and methods of shift frequency single sideband modulation to improve measurement accuracy, and has saved system hardware cost.

Description

A kind of high-precision optical vector network analysis device and method
Technical field
The present invention relates to field of photoelectric technology, and in particular to one kind for optical device amplitude-frequency response and phase-frequency response into The device and method of row high-acruracy survey.
Background technology
With the high speed development of the high-capacity optical fiber communication technology, need by accurately distributing spectral channel come more effectively Using limited optical spectrum resource, therefore, a large amount of narrowband optical device has been emerged in recent years, such as:Optics micro-loop is humorous Shake device, whispering gallery modes resonator, super narrow band fiber bragg grating, Fabry-Perot fiber optic filter etc..It is narrow to accurately measure these The design of amplitude-frequency with optical device and phase versus frequency response charac t, development and optical system for optical device has to pass weight The effect wanted.The method that amplitude-frequency and phase-frequency response to optical device measure is known as optics vector network analysis.City at present Commercial optics vector network analyzer device comes from LUNA companies of the U.S., but the frequency of its last word OVA5000 point on face Resolution is only 200MHz (1.6pm@1550nm), can not to bandwidth GHz magnitudes be even less than the optical devices of GHz magnitudes into Row is accurate to be measured, such as:The three dB bandwidth of the Fabry-Perot fiber optic filter FFP-I of MOI companies of the U.S. from kHz magnitudes to GHz magnitudes, the three dB bandwidth of silicon-based micro ring resonator can down to 1GHz or so (W. Bogaerts, P.D.Heyn, T.V.Vaerenbergh et al.Silicon microring resonators.Laser Photonics Rev.,2011, 6(1):47-73), the three dB bandwidth of phase shift optical fiber Bragg grating reflection stopband only tens MHz (W.Z.Li, M.Li, J.P.Yao.A narrow-passband and frequency-tunable microwave photonic filter based on phase-modulation to intensity-modulation conversion using a phase- shifted fiber Bragg grating.IEEE Transactions on Microwave Theory and Techniques,2012,60(5):1287-1296), three dB bandwidth of the ultra-narrow with fiber bragg grating reflectance spectrum down to 9MHz(Y.Painchaud,M.Aubé,G.Brochu et al. Ultra-narrowband notch filter with highly resonant fiber Bragg gratings.Bragg Gratings,Photosensitivity,and Poling in Glass Waveguides, Karlsruhe, Germany, 21-24June 2010, Paper BTuC3), it is beautiful The whispering gallery modes resonator three dB bandwidth of OEwaves companies of state is less than 1.9MHz etc..
Commercial optical vector network analyzer uses the amplitude-frequency of optical frequency sweep technology and optical coherence method to optical device It is carried out at the same time measurement with phase versus frequency response charac t, main advantage is that measurement wavelength band is wide, however frequency resolution is not high, studies carefully Its basic reason is that the frequency sweep precision of Wavelength tunable light source is limited, such as Keysight companies of U.S. tunable wave length light The sweeping steps of source N7714A are only 0.8pm (corresponding to 100MHz in 1550nm wave bands), and wavelength stability is in ± 0.5pm or so (in 1550nm wave band correspondences ± 62.5MHz).In order to solve, commercial optical vector network analyzer frequency resolution is poor to ask Topic proposes realize high-precision optical frequency sweep based on Electro-optical Modulation in recent years, and combines the optical heterodyne between carrier and sideband Beat frequency realizes the optics vector network analysis technical solution that optical device amplitude-frequency and phase versus frequency response charac t measure simultaneously.2012, Z.Z. Tang et al. proposes the optics vector network analysis technical solution based on optics single sideband modulation, its working principle is that: Microwave signal is loaded on direct current light carrier based on Electro-optical Modulation technology and realizes optics single sideband modulation, between carrier and sideband Frequency interval be equal to microwave signal frequency;Allow single sideband modulation light by optical device under test, the frequency response of device changes light Learn the amplitude and phase of sideband;By photodetection so that optics carrier frequency and sideband heterodyne beat recover microwave signal, microwave The amplitude and phase of signal reflect the amplitude and phase response of optical device respectively;Microwave is obtained using width phase measuring circuit to believe Number amplitude and phase, this be single-frequency point measure;The frequency sweep of optics sideband is realized by the tunable microwave source of High-Accuracy Frequency, Above-mentioned measurement is carried out to each frequency point, and deducts amplitude-frequency and the phase-frequency response of measuring system by calibration process, finally obtains light Learn the amplitude-frequency and phase versus frequency response charac t (Z.Z.Tang, S.L.Pan, J.P.Yao.A high resolution optical of device vector network analyzer based on a wideband and wavelength-tunable optical single-sideband modulator.Optics Express,2012,20(6):6555-6560).Although utilizing the technology Scheme tests the frequency resolution for obtaining 78kHz, this index than commercial optical vector network analyzer improves 3 numbers Magnitude, but if when realizing amplitude-frequency and the phase-frequency response measurement within the scope of tens ghz bands, it is tens GHz to need bandwidth Photodetector and width phase detecting circuit, cost is higher, and width phase detecting circuit is in the phase measurement accuracy meeting of high band It greatly reduces.
Invention content
The present invention is in view of the above-mentioned problems, propose a kind of high-precision optical vector network analysis device and method.
A kind of high-precision optical vector network analysis device, including tunable laser, electro-optic frequency translation device, tunable microwave Source, optics single side-band modulator, microwave source, optical device under test, photodetector, width phase detection module, computer.
The output of the tunable laser enters electro-optic frequency translation device, and electro-optic frequency translation device is driven by tunable microwave source, And tunable microwave source is controlled by computer.
The output of the electro-optic frequency translation device enters optics single side-band modulator, and optics single side-band modulator is carried out by microwave source Driving, and the output of microwave source is sent into width phase detection module simultaneously.
The output of the optics single side-band modulator is by entering photodetector after optical device under test.
The output of the photodetector enters width phase detection module.
Computer is sent into the output of the width phase detection module.
Technical scheme of the present invention:A kind of high-precision optical vector network analysis method, includes the following steps:
A. tunable laser output frequency is fcDirect current light, into the electro-optic frequency translation device driven by tunable microwave In, the frequency of tunable microwave source output is fRFMicrowave signal make direct current light occur frequency displacement, electro-optic frequency translation device output frequency For fc- fRFDirect current light;
B. the direct current light of electro-optic frequency translation device output enters in optics single side-band modulator, and optics single side-band modulator is by microwave 5 drivings, the microwave signal that microwave source output frequency is Δ f realize that single sideband modulation, optics single side-band modulator are defeated to direct current light Go out modulation light, the frequency of carrier wave is fc- fRF, the frequency of sideband is fc- fRFΔ f;
C. the modulation light of optics single side-band modulator output passes through optical device under test, the amplitude and phase of carrier and sideband Position is loaded with the amplitude response and phase response feature of optical device under test respectively;
D. the modulation light of optical device under test output enters in photodetector, and frequency is generated by optical heterodyne beat effect Rate is the microwave signal of Δ f, which carries the amplitude response and phase response feature of optical device under test;
E. photodetector output frequency be Δ f microwave signal (carry optical device under test amplitude response and Phase response feature) with microwave source output frequency be Δ f microwave signal (do not carry optical device under test amplitude response and Phase response feature) it is sent into width phase detection module together, realize the measurement of amplitude response and phase response;
F. tunable microwave source is controlled by computer so that its output frequency fRFIt is scanned with step delta f, for every A frequency point, the amplitude response and phase response carried out in step e measure, measurement data by width phase detection module be sent into computer into Row storage, amplitude-frequency response to be corrected and phase-frequency response data are obtained after completing single pass;
G. optical device under test is removed, the modulation light of optics single side-band modulator output directly inputs photodetector In, step f is repeated, the amplitude-frequency response and phase-frequency response data of measuring system itself are obtained;
H. the measuring system sheet obtained in the amplitude-frequency response and phase-frequency response deduction step g to be corrected obtained in step f The amplitude-frequency response of body and phase-frequency response, the final amplitude-frequency response for obtaining optical device under test and phase-frequency response.
Beneficial effects of the present invention are:(1) frequency of photodetector output microwave signal is kept not in scanning process Become, is usually arranged as lower frequency so that system does not need the photodetector and width phase detecting circuit in broadband, improves phase Accuracy of detection has saved system hardware cost;(2) scanning process is completed by shift frequency single-side belt Electro-optical Modulation, due to tunable micro- Wave source has very high frequency sweep precision, therefore can realize that the very amplitude-frequency response of high frequency resolution and phase-frequency response measure;(3) lead to Cross change tunable laser output wavelength, it can be achieved that within the scope of broadband optical device amplitude-frequency response and phase-frequency response height Precision measure.
Description of the drawings
Fig. 1 is the device of the invention structure and principle schematic.
Fig. 2 is the Experimental equipment for measuring stimulated Brillouin scattering amplitude-frequency response and phase-frequency response.
Fig. 3 is the schematic diagram for measuring stimulated Brillouin scattering amplitude-frequency response and phase-frequency response.
Fig. 4 is the amplitude-frequency response measurement result and notional result of stimulated Brillouin scattering gain spectral.
Fig. 5 is the phase-frequency response measurement result and notional result of stimulated Brillouin scattering gain spectral.
Specific implementation mode
The present invention is described in detail with reference to the accompanying drawings and detailed description.
In a kind of high-precision optical vector network analysis device as shown in Figure 1,1 output frequency f of tunable laserc Direct current light (a points in such as Fig. 1), into the electro-optic frequency translation device 2 driven by tunable microwave source 3, tunable microwave source 3 The frequency f of outputRFMicrowave signal make direct current light occur frequency displacement, then 2 output frequency of electro-optic frequency translation device be fc- fRFDirect current Light (the b points in such as Fig. 1), is represented by frequency domain
E (f)=A δ (f-fc+fRF) (1)
Wherein, A is the amplitude of 2 output light of electro-optic frequency translation device, and δ (x) is unit impulse function, and f is frequency variable.Electric light moves The direct current light that frequency device 2 exports enters in the optics single side-band modulator 4 driven by microwave source 5, and 5 output frequency of microwave source is Δ f Microwave signal to direct current light realize single sideband modulation, optics single side-band modulator 4 export modulation light (the c points in such as Fig. 1), It is represented by frequency domain
Ein(f)=A0δ(f-fc+fRF)+A+1δ(f-fc+fRF+Δf) (2)
Wherein, A0And A+1Respectively optics single side-band modulator 4 exports the amplitude of the carrier and sideband of modulation light.Carrier wave and The frequency of sideband is respectively fc- fRFAnd fc- fRFΔ f.
In measurement process, optical device under test 6 is placed between optics single side-band modulator 4 and photodetector 7, The modulation light that optics single side-band modulator 4 exports passes through optical device under test 6, and the amplitude and phase of carrier and sideband add respectively The amplitude response and phase response feature for having carried optical device under test 6 enter back into photodetector 7 and realize optical heterodyne beat frequency, Recover the microwave signal for carrying that the frequency of 6 amplitude response of optical device under test and phase response is Δ f.Optical device under test 6 output lights are represented by frequency domain
Eout(f)=Ein(f) H (f)=A0H(fc-fRF)δ(f-fc+fRF) +A+1H(fc-fRF-Δf)δ(f-fc+fRF+Δf) (3)
Wherein, receptance function H (f)=HODUT(f)Hosys(f) the complex response H of optical device under test 6 is containedODUT(f) with And in system other optical devices complex response Hosys(f).The output telegram in reply stream of photodetector 7 (the d points in such as Fig. 1) is in frequency domain Inside it is represented by
Wherein, Hesys(Δ f) is response coefficient of the photodetector 7 in Frequency point Δ f, and subscript * expressions take complex conjugate. The microwave signal that the frequency that photodetector 7 exports is Δ f (is carried into the amplitude response and phase sound of optical device under test 6 Answer feature) with microwave source 5 export frequency be Δ f microwave signal (do not carry the amplitude response and phase of optical device under test 6 Response characteristic) it is sent into width phase detection module 8 together, realize the measurement of amplitude response and phase response, this was measured for single-frequency point Journey.Tunable microwave source 3 is controlled by computer 9 so that its output frequency fRFIt is scanned with step delta f, for each frequency It clicks through line amplitude response and phase response measures, measurement data is sent into computer 9 by width phase detection module 8 and is stored, and completes Amplitude-frequency response to be corrected and phase-frequency response data are obtained after single pass, simultaneous computer 9 is recorded adjustable in scanning process All frequencies that humorous microwave source 3 exports.
In correction course, optical device under test 6 is removed from system, optics single side-band modulator 4 and photoelectricity are visited It surveys device 7 to be connected directly, then the output of photodetector 7 telegram in reply stream is represented by frequency domain
The microwave that the frequency that the microwave signal that the frequency that photodetector 7 exports is Δ f is exported with microwave source 5 is Δ f Signal is sent into width phase detection module 8 together, realizes the measurement of amplitude response and phase response.In strict accordance with the frequency in measurement process Rate point controls tunable microwave source 3, again so that its output frequency f by computer 9RFIt is scanned with step delta f, for Each frequency point carries out amplitude response and phase response measures, and measurement data is sent into computer 9 by width phase detection module 8 and is deposited The amplitude-frequency response and phase-frequency response data of acquisition measuring system itself after single pass are completed in storage.
By formula (4) divided by formula (5), obtained after arrangement
From formula (6), it can be seen that, optical device under test 6 is in Frequency point fc- fRFReceptance function H at Δ fODUT(fc fRFΔ f) is by 3 output frequency f of tunable microwave sourceRFWhen measurement obtained i (Δ f) and isys(Δ f) and Frequency point fc fRFThe receptance function H at placeODUT(fc- fRF) common determining.
Assuming that initial frequency of the tunable microwave source 3 in scanning process is fRF0, number of scan points N, then all scannings frequency Rate point F is
F=[fRF0,fRF0+Δf,…,fRF0+(N-2)Δf,fRF0+(N-1)Δf] (7)
Meanwhile the amplitude response M to be corrected obtained in measurement processuWith phase response PuData are expressed as
Mu=[Mu0,Mu1,…,Mu(N-2),Mu(N-1)] (8)
Pu=[Pu0,Pu1,…,Pu(N-2),Pu(N-1)] (9)
The amplitude response M of the measuring system obtained in correction course itselfcWith phase response PcData are expressed as
Mc=[Mc0,Mc1,…,Mc(N-2),Mc(N-1)] (10)
Pc=[Pc0,Pc1,…,Pc(N-2),Pc(N-1)] (11)
For scanning initial frequency point fRF0, H is setODUT(fc- fRF0)=1, then optical device under test 6 is in Frequency point fc- fRF0Receptance function H at Δ fODUT(fc- fRF0Δ f) can calculate as follows according to formula (6)
For scanning initial frequency point fRF0Frequency point in addition, optical device under test 6 is in Frequency point fc- fRF0- n Δs f The receptance function H at place's (n is integer, and 1≤n≤N-1)ODUT(fc- fRF0- n Δs f) can calculate as follows according to formula (6)
So far, 6 true amplitude-frequency response of optical device under test and phase-frequency response are obtained.
Embodiment
High-precision optical vector network analysis device and method shown in FIG. 1 is used below, is with stimulated Brillouin scattering Example further illustrates the present invention.
The experiment that the present embodiment measures stimulated Brillouin scattering amplitude-frequency response and phase-frequency response is set forth in Fig. 2 and Fig. 3 Device and schematic diagram.Stimulated Brillouin scattering is summarized as follows:When frequency is fcPump light when transmitting in a fiber, it will in Frequency of heart fc- fBGain spectral nearby is formed in certain band limits, and can be in centre frequency fc+fBNeighbouring certain band limits Interior formation loss spectra, as shown in figure 3, wherein fBFor Brillouin shift amount;For the light wave transmitted in opposite directions with pump light in optical fiber, It if its frequency is located in gain spectral, can be amplified, if its frequency is located in loss spectra, can be attenuated.
In the present embodiment, it is f using the frequency that a photo-coupler exports tunable lasercLight be divided into two Beam, a branch of detection light as optics vector network analysis obtain institute of the present invention by electro-optic frequency translation and optics single sideband modulation (frequency of carrier and sideband is respectively f to the shift frequency single sideband modulation light statedc- fRFAnd fc- fRFΔ f), to being excited cloth In deep scattering gain spectrum amplitude-frequency response and phase-frequency response measure;Another Shu Zuowei pump lights, it is defeated by 1 mouthful of optical circulator Enter, the single-mode quartz optical fibers that length are 25 kms are sent into 2 mouthfuls of outputs, it is allowed opposite in a fiber with shift frequency single sideband modulation light to pass It is defeated.In the present embodiment, electro-optic frequency translation device is made of a double parallel MZ electrooptic modulator by 90 ° of bridge-drives, double flat The Dc bias of two sub- MZ electrooptic modulators is set as its respective half-wave voltage, main MZ structures inside row MZ electrooptic modulators Dc bias be set as the half of half-wave voltage;In addition, optics single side-band modulator is by a pair by 90 ° of bridge-drives Arm drives MZ electrooptic modulators to constitute, and the Dc bias of both arms driving MZ electrooptic modulators is set as the half of half-wave voltage.It surveys During amount, the shift frequency single sideband modulation luminous power that forward direction enters single-mode quartz optical fibers is -12dBm, is redirected back into single mode quartz The pumping light power of optical fiber is -0.5dBm, and the output frequency of microwave source is set as Δ f=100kHz, the frequency in tunable microwave source Rate scanning step is set as 100kHz, and scanning range is set as 10.4GHz-11.4GHz, and total number of scan points is 10001.Fig. 4 gives The amplitude-frequency response measurement result and notional result, Fig. 5 for having gone out stimulated Brillouin scattering gain spectral give stimulated Brillouin scattering The phase-frequency response measurement result and notional result of gain spectral.It can see from Fig. 4 and Fig. 5, measurement result is complete with notional result It coincide, the Brillouin shift amount of single-mode quartz optical fibers is fB=10.8695GHz, gain bandwidth 28MHz.
It, can be right by specific example it is found that the present invention proposes a kind of high-precision optical vector network analysis device and method The amplitude-frequency response of optical device and phase-frequency response carry out high-acruracy survey, it has, and frequency resolution is high, it is accurate to measure, without width It the advantages that band photodetector and width phase detecting circuit, has broad application prospects.
It is further to note that the present invention is not limited to the specific details in the above embodiment, in the original of the present invention A variety of simplification, modification within the scope of reason method belong to the protection content of the present invention.

Claims (2)

1. a kind of high-precision optical vector network analysis device, which is characterized in that including tunable laser, electro-optic frequency translation device, Tunable microwave source, optics single side-band modulator, microwave source, optical device under test, photodetector, width phase detection module, meter Calculation machine;
The output of the tunable laser enters electro-optic frequency translation device, and electro-optic frequency translation device is driven by tunable microwave source, and Tunable microwave source is controlled by computer;
The output of the electro-optic frequency translation device enters optics single side-band modulator, and optics single side-band modulator is driven by microwave source It is dynamic, and the output of microwave source is sent into width phase detection module simultaneously;
The output of the optics single side-band modulator is by entering photodetector after optical device under test;
The output of the photodetector enters width phase detection module;
Computer is sent into the output of the width phase detection module.
2. a kind of high-precision optical vector network analysis method, which is characterized in that include the following steps:
(1)Tunable laser output frequency bef c Direct current light pass through the electro-optic frequency translation device driven by tunable microwave source and generate Frequency isf c f RF Shift frequency direct current light;
(2)Shift frequency direct current light is passed through generates modulation light, wherein carrier and sideband by the optics single side-band modulator that microwave source drives Frequency is respectivelyf c f RF Withf c f RF Δf
(3)Modulation light loads optical device under test amplitude response and phase response after optical device under test;
(4)Optical device under test output light enters in photodetector, and it is Δ to restore frequency by optical heterodyne beat effectf's Microwave signal, the microwave signal carry the amplitude response and phase response feature of optical device under test;
(5)The frequency of photodetector output is ΔfThe frequency of microwave signal and microwave source output be ΔfMicrowave signal one With width phase detection module is sent into, the measurement of amplitude response and phase response is realized;
(6)Tunable microwave source is controlled by computer so that its output frequencyf RF With step deltafIt is scanned, for each Frequency point carries out step(5)In amplitude response and phase response measure, measurement data by width phase detection module be sent into computer into Row storage, amplitude-frequency response to be corrected and phase-frequency response data are obtained after completing single pass;
(7)Optical device under test is removed, the modulation light of optics single sideband modulation output directly inputs in photodetector, repeats Step(6), obtain the amplitude-frequency response and phase-frequency response data of measuring system itself;
(8)Step(6)The amplitude-frequency response and phase-frequency response deduction step to be corrected of middle acquisition(7)The measuring system sheet of middle acquisition The amplitude-frequency response of body and phase-frequency response, the final amplitude-frequency response for obtaining optical device under test and phase-frequency response.
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