CN106442556A - Device and method for detecting surface defects of perforated plate workpiece - Google Patents

Device and method for detecting surface defects of perforated plate workpiece Download PDF

Info

Publication number
CN106442556A
CN106442556A CN201611007125.2A CN201611007125A CN106442556A CN 106442556 A CN106442556 A CN 106442556A CN 201611007125 A CN201611007125 A CN 201611007125A CN 106442556 A CN106442556 A CN 106442556A
Authority
CN
China
Prior art keywords
image
value
pixel
threshold value
special
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201611007125.2A
Other languages
Chinese (zh)
Inventor
范剑英
赵首博
赵羽晴
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin University of Science and Technology
Original Assignee
Harbin University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin University of Science and Technology filed Critical Harbin University of Science and Technology
Priority to CN201611007125.2A priority Critical patent/CN106442556A/en
Publication of CN106442556A publication Critical patent/CN106442556A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The invention discloses a device and method for detecting surface defects of a perforated plate workpiece. The system comprises a transfer system, a special-shaped illuminating light source, an industrial charge coupled device (CCD) image sensor, an image acquisition card and a processor. A to-be-detected perforated plate workpiece is horizontally arranged in the transfer system; the special-shaped illuminating light source adopts a shed-shaped structure light source of which the top is arc-shaped and the horizontal section is rectangular, and is arranged at the periphery of a lens of the industrial CCD image sensor; the industrial CCD image sensor comprises a camera main body, a lens and an interface C; the camera main body adopts an industrial CCD camera and is connected with the lens through the interface C; the lens is arranged on the inner side of the special-shaped illuminating light source and is perpendicular to the to-be-detected perforated plate workpiece; the image acquisition card serves as the connector of an image acquisition part and an image processing part; the processor is used for realizing the operation of corresponding codes in a programming environment, calculating and marking the defect positions and intuitively displaying the defect positions. According to the detection device disclosed by the invention, the surface defect positions can be accurately displayed, and the workpiece defect information is acquired instead of human eyes, therefore, the detection accuracy is high.

Description

A kind of tabular workpiece with hole surface defect detection apparatus and method
Technical field
The present invention relates to a kind of tabular workpiece with hole surface defect detection apparatus and method, belong to field of visual inspection.
Background technology
Tabular workpiece with hole, is widely used in machine tool processing, medical apparatus and instruments manufacture, vehicle fitting side in recent years Face.Most of manufacturers still adopt manual type to find tabular workpiece with hole surface defect at present, not only big to human eye injury, And efficiency is low, high cost is it is impossible to accurately find the particular location of Surface Flaw, and easily make one to produce vision by mistake Difference, leads to workpiece quality to decline, missing inspection, flase drop, greatly reduce product price and the market competitiveness.
Zeng You manufacturer passes through technological improvement, using laser scanning inspection, irradiates workpiece with the point source of multiple spot arrangement Surface, the integrated degree of surface of the work is judged by the default degree observing the point source reaching receiver board.This detection side Not only action is complicated for method, needs to arrange the luminous point position of laser generator in advance, and the cost of laser generator and later stage Maintenance cost is also higher, increased the cost of carrying out flaw detection.
Content of the invention
For above-mentioned prior art, the invention provides a kind of tabular workpiece with hole surface defect detection apparatus and method, In order to solve the technical problem existing for above-mentioned tabular workpiece with hole surface defects detection.
The technical scheme that a kind of present invention tabular workpiece with hole surface defect detection apparatus are achieved is:This device includes Transmission system, special-shaped lighting source, industrial CCD imageing sensor, image pick-up card and processor;Described transmission system is used for Horizontal transmission tabular to be detected workpiece with hole, and transmitted with uniform rectilinear's form;Described special-shaped lighting source is used for carrying For Uniform Illumination light source, and special-shaped lighting source can cover entirely tabular workpiece with hole region to be detected;Described Industrial CCD imageing sensor is used for converting optical signals into the signal of telecommunication, completes the collecting part of image;Described image acquisition Block for receiving the signal of telecommunication from photographic head collection, and the analogue signal collected is changed through A/D, image information is carried out Storage and process, and by data information transfer to processor;Described processor is to realize respective code in programmed environment Run, calculate, mark defective locations and intuitively show;
Described tabular workpiece with hole to be detected is horizontally placed in described transmission system;Described special-shaped lighting source is top The canopy shape structure light sources that arc, horizontal section are rectangle, and special-shaped lighting source can cover entirely described to be detected Tabular workpiece with hole region;Described special-shaped lighting source is arranged on the camera lens four of described industrial CCD imageing sensor Week, and be connected with described industrial CCD imageing sensor;The mathematical expression of the described geometric model of special-shaped lighting source Formula is:
(1)
Wherein,For unknown parameter coefficient,For boundary value;Described industrial CCD imageing sensor includes:Shooting owner Body, camera lens and C interface;Described camera body adopts industrial CCD video camera;Described camera body passes through C with camera lens Interface connects;Described camera lens is arranged on inside described special-shaped lighting source, and with holes perpendicular to described tabular to be detected Workpiece;Described image pick-up card is the interface of image acquisition part and image processing section.
A kind of tabular workpiece with hole detection method of surface flaw proposed by the present invention, is using a kind of above-mentioned tabular work with holes Part surface defect detection apparatus, and according to following steps:
Described tabular workpiece with hole to be detected is horizontally placed in described transmission system, and evenly from mirror in the form of straight line Move past below head, the complete image information of camera lens Real-time Collection;Described industrial CCD imageing sensor converts optical signals into The signal of telecommunication, then the signal of telecommunication collecting from photographic head through described image pick-up card reception, and by the analogue signal collecting Through A/D conversion, image information is stored and is processed, and given described process by image pick-up card by data information transfer Device;Within a processor, first pass through programming software and pretreatment is carried out to image, improve visual effect and the definition of image, bag Containing histogram equalization processing, normalized, medium filtering, further according to characteristics of image, binary conversion treatment is carried out to image;Connect And use edge detecting technology, sketch out the profile of each object while noise suppression with marginal point, some needs of analysis of the image The target of identification;Then pass through image Segmentation Technology, in contrast images, the out-of-the way position of saliency value carries out zone marker, finally carries Take characteristics of image, and intuitively find defect position.
The remaining algorithm of step one, spectrum calculates:
First two dimensional discrete Fourier transform is carried out to the gray level image of input, image is proceeded to frequency domain from spatial domain:, wherein,For gray level image spatial domain coordinate,For gray level image frequency domain coordinate;
(2)
Wherein,For this Fourier spectrum value.Ask amplitude spectrum and phase spectrum again:
(3)
(4)
Amplitude spectrum is taken the logarithm, obtains the Log spectrum of its amplitude:
(5)
Then smothing filtering is carried out to Log spectrum, obtain the approximate shape of Log spectrum:
(6)
Wherein,It is oneSmoothing filter,Spatial domain bandwidth for smoothing filter.Ask for both differences, Obtain composing residual error:
(7)
To spectrum residual errorAnd phase spectrumCarry out two-dimentional inverse Fourier transform, obtain
(8)
Wherein,Represent the saliency value of every point coordinates in gray level image.
Step 2, the setting of threshold value:
The present invention adopts two methods to arrange threshold value, and respectively by threshold value and the saliency value pair with pixel each in piece image The pixel that saliency value is more than or equal to threshold value is labeled as " 1 " to ratio, is designated as target area;Saliency value is less than the pixel of threshold value It is labeled as " 0 ", be designated as background area.
Threshold value is solved according to adaptive thresholding algorithm.WillIt is set to the average saliency value of given image:
(9)
Wherein,The length of correspondence image and width.By the often place saliency value of the image obtaining and adaptive thresholdRelatively, will be big It is labeled as " 1 " in the pixel equal to threshold value, be labeled as " 0 " less than the pixel of threshold value, and all pictures in this width image Vegetarian refreshments collection shares and is formed by 0,1OKColumn matrixRepresent.
Threshold value is solved according to big law.This width image saliency value scope is designated as, (Notable for maximum Value).Pre-set a threshold valueAbove-mentioned image saliency value is divided into two classes:,, And willWithIt is designated as target and background respectively, both inter-class variances are:
(10)
(11)
(12)
Wherein,Represent that in image, saliency value is less thanNumber of pixels,Represent that in image, saliency value is optionally greater than's Number of pixels,Be less thanTotal pixel average saliency value,Be optionally greater thanTotal pixel average saliency value;
So thatValue maximumValue is exactly required threshold value, that is,.Again willCompare with the often place saliency value of image, will It is labeled as " 1 " more than or equal to the pixel of threshold value, be labeled as " 0 " less than the pixel of threshold value, and all in this width image Pixel point set is with being formed by 0,1OKColumn matrixRepresent.
Step 3, marking of defects
By matrixWith matrixCorresponding element is multiplied, and obtains new matrix.I.e.:.Can by matrix dot product formula Know, matrixIt is also to be made up of element 0,1, element 1 represents that this pixel saliency value is all higher than equal to two threshold values, i.e. target image Overlapping positions.Find three matrixes according still further to order from left to right, from top to bottom successivelyMiddle element is 1 company The connected region of each matrix is designated as by logical area respectively .Choose matrix, to matrixIn All elements are sued for peace, and remember and are;To matrixMiddle all elements summation, remembers and is.Introduce function, order(13)
IfThen it is assumed that for defective locations at r.If being less thanThen it is assumed that being error-detecting, workpiece is intact herein Fall into.
Compared with prior art, the invention has the beneficial effects as follows:
A kind of tabular workpiece with hole surface defect detection apparatus and method that the present invention provides, are replaced existing using special-shaped lighting source Some point sources, can uniform irradiation, there is not equation of light phenomenon, solve tabular workpiece with hole Surface testing to be detected and illuminated Degree impact leads to gather not fogging clear problem.The present invention for tabular workpiece with hole image to be detected acquisition mode not There is the synchronous time difference, tabular workpiece with hole surface defect positions to be detected can be shown in real time, software and hardware exchanges degree height it is adaptable to The visual imaging of dynamic object thing, and precision of images height, color rendition degree are high.
Brief description
A kind of tabular workpiece with hole surface defect detection apparatus structure chart that Fig. 1 provides for the present invention;
The special-shaped lighting light source structure schematic diagram that Fig. 2 provides for the present invention;
A kind of detecting system flow chart of tabular workpiece with hole surface defect detection apparatus that Fig. 3 provides for the present invention.
In figure:1- transmission system, 2- tabular to be detected workpiece with hole, 3- special-shaped lighting source, 4- industrial CCD image sensing Device, 5- image pick-up card, 6- processor.
Specific embodiment
With reference to specific embodiment, the present invention is described in further detail.
As shown in figure 1, a kind of present invention tabular workpiece with hole surface defect detection apparatus, shine including transmission system 1, special-shaped Mingguang City source 3, industrial CCD imageing sensor 4, image pick-up card 5 and processor 6.Described transmission system 1 is used for horizontal transmission institute The tabular workpiece with hole 2 to be detected stated, and transmitted with uniform rectilinear's form;Described special-shaped lighting source 3 is used for providing Uniform Illumination light source, and special-shaped lighting source 3 can cover entirely tabular workpiece with hole 2 region to be detected;Described Industrial CCD imageing sensor 4 is used for converting optical signals into the signal of telecommunication, completes the collecting part of image;Described image is adopted Truck 5 is used for receiving the signal of telecommunication from photographic head collection, and the analogue signal collected is changed through A/D, to image information Stored and processed, and data information transfer is given described processor 6;Described processor 6 is real in programmed environment The operation of existing respective code, calculates, marks defective locations and intuitively show.
Described tabular workpiece with hole 2 to be detected is horizontally placed in described transmission system 1;Described special-shaped lighting source 3 is the canopy shape structure light source that top is that arc, horizontal section are rectangle, and special-shaped lighting source 3 can cover entirely described Tabular workpiece with hole 2 region to be detected;Described special-shaped lighting source 3 is arranged on described industrial CCD image sensing The camera lens surrounding of device 4, and be connected with described industrial CCD imageing sensor 4;The geometry of described special-shaped lighting source 3 The mathematic(al) representation of model is:
(1)
Wherein,For unknown parameter coefficient,For boundary value;Described industrial CCD imageing sensor 4 includes imaging owner Body, camera lens and C interface;Described camera body adopts industrial CCD video camera;Logical between described camera body and camera lens Cross C interface to connect;Described camera lens is perpendicular to described tabular workpiece with hole 2 to be detected;Described image pick-up card 5 is image Collecting part and the interface of image processing section.
A kind of tabular workpiece with hole detection method of surface flaw proposed by the present invention, is using a kind of above-mentioned tabular work with holes Part surface defect detection apparatus, and according to following steps:
Described tabular workpiece with hole 2 to be detected is horizontally placed in described transmission system 1, and in the form of straight line evenly from Move past below camera lens, the complete image information of camera lens Real-time Collection;Optical signalling is turned by described industrial CCD imageing sensor 4 It is changed to the signal of telecommunication, then receives the signal of telecommunication from photographic head collection through described image pick-up card 5, and the simulation collecting is believed Number through A/D conversion, image information is stored and is processed, and by image pick-up card 5 by data information transfer give described Processor 6;In processor 6, first pass through programming software and pretreatment is carried out to image, improve the visual effect of image and clear Degree, comprises histogram equalization processing, normalized, medium filtering, further according to characteristics of image, image is carried out at binaryzation Reason;It is then used by edge detecting technology, sketches out the profile of each object while noise suppression with marginal point, analysis of the image is some Need the target of identification;Then pass through image Segmentation Technology, in contrast images, the out-of-the way position of saliency value carries out zone marker, Extract characteristics of image afterwards, and intuitively find defect position.
As shown in figure 3, a kind of testing process of tabular workpiece with hole surface defect detection apparatus is followed successively by light source and irradiating, scheming As collection transmission, Image semantic classification, Image Edge-Detection, image segmentation and image recognition, final marking of defects.
Light source irradiates using described special-shaped lighting source 3 to described tabular workpiece with hole 2 projection uniform light to be detected.
Image acquisition is transmitted as the complete view data of described camera lens Real-time Collection, by described industrial CCD image Sensor 4 converts optical signals into the signal of telecommunication, then receives, through described image pick-up card 5, the telecommunications collecting from photographic head Number, and the analogue signal collected is changed through A/D, image information is acquired store and transmits.
The processor 6 that Image semantic classification is described sets up grey level histogram to image first, pixel in discovery image directly perceived The distribution situation of brightness;Again rectangular histogram is carried out equalizing, normalized, so that the uniform gray level of image is distributed, increase contrast, Image detail becomes apparent from;Then carry out medium filtering, image is filtered with noise, the detailed information of protection signal, and protects figure As edge;Finally binary conversion treatment is carried out to image, the threshold value setting using the saliency value difference in image, contrast, by each Pixel is attributed to a region, is " 1 " target area marker, background area is labeled as " 0 ", thus a width gray level image is changed into Bianry image.
Image Edge-Detection is to sketch out the profile of each object with marginal point, analyzes the mesh needing to identify in image Mark, that is, project the edge of image to extract characteristics of image.
Image segmentation be to after mark rim detection in image the different point of brightness split, be divided into some not Overlapping region.
Image recognition is first using the remaining well-marked target detection method of spectrum, described tabular workpiece with hole to be detected 2 to be carried out Detection, reuses global alignment method and identifies tabular workpiece with hole 2 surface defect positions to be detected.
The remaining algorithm of step one, spectrum calculates:
First two dimensional discrete Fourier transform is carried out to the gray level image of input, image is proceeded to frequency domain from spatial domain:, Wherein,For gray level image spatial domain coordinate,For gray level image frequency domain coordinate;
(2)
Wherein,For this Fourier spectrum value.Ask amplitude spectrum and phase spectrum again:
(3)
(4)
Amplitude spectrum is taken the logarithm, obtains the Log spectrum of its amplitude:
(5)
Then smothing filtering is carried out to Log spectrum, obtain the approximate shape of Log spectrum:
(6)
Wherein,It is oneSmoothing filter,Spatial domain bandwidth for smoothing filter.Ask for both differences, Obtain composing residual error:
(7)
To spectrum residual errorAnd phase spectrumCarry out two-dimentional inverse Fourier transform, obtain
(8)
Wherein,Represent the saliency value of every point coordinates in gray level image.
Step 2, the setting of threshold value:
The present invention adopts two methods to arrange threshold value, and respectively by threshold value and the saliency value pair with pixel each in piece image The pixel that saliency value is more than or equal to threshold value is labeled as " 1 " to ratio, is designated as target area;Saliency value is less than the pixel of threshold value It is labeled as " 0 ", be designated as background area;
Solved according to adaptive thresholding algorithm.By threshold valueIt is set to the average saliency value of given image:
(9)
Wherein,The length of correspondence image and width.By the often place saliency value obtaining and adaptive thresholdRelatively, by contrast, Will be greater than being labeled as " 1 " equal to the pixel of threshold value, be labeled as " 0 " less than the pixel of threshold value, and the institute in this width image By pixel point set with being formed by 0,1OKColumn matrixRepresent.
Solved according to big law.Image saliency value scope is designated as,(For maximum saliency value).Set in advance Put a threshold valueAbove-mentioned image saliency value is divided into two classes:,, and willWith It is designated as target and background respectively, both inter-class variances are:
(10)
(11)
(12)
Wherein,Represent that in image, saliency value is less thanNumber of pixels,Represent that in image, saliency value is optionally greater than's Number of pixels,Be less thanTotal pixel average saliency value,Be optionally greater thanTotal pixel average saliency value;
So thatValue maximumValue is exactly required threshold value, that is,.Again T is compared with the often place saliency value of image, will It is labeled as " 1 " more than or equal to the pixel of threshold value, be labeled as " 0 " less than the pixel of threshold value, and all in this width image Pixel point set is with being formed by 0,1OKColumn matrixRepresent.
Step 3, marking of defects
By matrixWith matrixCorresponding element is multiplied, and obtains new matrix.I.e.:.Can by matrix dot product formula Know, matrixIt is also to be made up of element 0,1, element 1 represents that this pixel saliency value is all higher than equal to two threshold values, i.e. target image Overlapping positions.Find three matrixes according still further to order from left to right, from top to bottom successivelyMiddle element is 1 company The connected region of each matrix is designated as by logical area respectively .Choose matrix, to matrixIn All elements are sued for peace, and remember and are;To matrixMiddle all elements summation, remembers and is.Introduce function, Order(13)
IfThen it is assumed that for defective locations at r.If being less thanThen it is assumed that being error-detecting, workpiece is intact herein Fall into.
In the present invention, Image semantic classification, Image Edge-Detection, image Segmentation Technology belong to this area class common knowledge, this Skilled person can reproduce according to the specific requirement of measured object, will not be described here.
Although above in conjunction with figure, invention has been described, the invention is not limited in above-mentioned specific embodiment party Formula, above-mentioned specific embodiment is only schematically, rather than circumscribed, and those of ordinary skill in the art is at this Under bright enlightenment, without deviating from the spirit of the invention, many variations can also be made, these belong to the guarantor of the present invention Within shield.

Claims (5)

1. a kind of tabular workpiece with hole surface defect detection apparatus are it is characterised in that include transmission system (1), special-shaped illumination light Source (3), industrial CCD imageing sensor (4), image pick-up card (5) and processor (6);Described transmission system (1) is used for level The described tabular workpiece with hole (2) to be detected of transmission, and transmitted with uniform rectilinear's form;Described special-shaped lighting source (3) it is used for providing Uniform Illumination light source, and special-shaped lighting source (3) can cover entirely tabular workpiece with hole (2) to be detected Region;Described industrial CCD imageing sensor (4) is used for converting optical signals into the signal of telecommunication, completes the collection of image Part;Described image pick-up card (5) is used for receiving the signal of telecommunication from photographic head collection, and the analogue signal collected is passed through A/D changes, and image information is stored and processes, and data information transfer is given described processor (6);Described process Device (6) is the operation realizing respective code in programmed environment, calculates, marks defective locations and intuitively show;
Described tabular workpiece with hole (2) to be detected is horizontally placed in described transmission system (1);Described special-shaped lighting source (3) it is the canopy shape structure light sources that arc, horizontal section are rectangle for top, and special-shaped lighting source (3) can cover entirely Described tabular workpiece with hole (2) region to be detected;Described special-shaped lighting source (3) is arranged on described industrial CCD The camera lens surrounding of imageing sensor (4), and be connected with described industrial CCD imageing sensor (4);Described special-shaped illumination The mathematic(al) representation of the geometric model of light source (3) is:(1)
Wherein,For unknown parameter coefficient,For boundary value;Described industrial CCD imageing sensor (4) includes shooting owner Body, camera lens and C interface;Described camera body adopts industrial CCD video camera;Logical between described camera body and camera lens Cross C interface to connect;Described camera lens is perpendicular to described tabular workpiece with hole (2) to be detected;Described image pick-up card (5) is Image acquisition part and the interface of image processing section.
2. a kind of tabular workpiece with hole surface defect detection apparatus according to claim 1 it is characterised in that:Described Special-shaped lighting source (3) is the canopy shape structure light source that top is that arc, horizontal section are rectangle, and special-shaped lighting source (3) Entirely described tabular workpiece with hole (2) region to be detected can be covered;Described special-shaped lighting source (3) is arranged on work The camera lens surrounding of industry ccd image sensor (4), and be connected with described industrial CCD imageing sensor (4);Described spy The mathematic(al) representation of the geometric model of shape lighting source (3) is:
(1)
Wherein,For unknown parameter coefficient,For boundary value.
3. a kind of tabular workpiece with hole detection method of surface flaw is it is characterised in that adopt a kind of plate as claimed in claim 1 Shape workpiece with hole surface defect detection apparatus measure, and comprise the following steps:
The remaining algorithm of step one, spectrum calculates:
First two dimensional discrete Fourier transform is carried out to the gray level image of input, image is proceeded to frequency domain from spatial domain:, wherein,For gray level image spatial domain coordinate,For gray level image frequency domain coordinate;
(2) wherein,For this Fourier spectrum value;
Ask amplitude spectrum and phase spectrum again:
(3)
(4)
Amplitude spectrum is taken the logarithm, obtains the Log spectrum of its amplitude:
(5)
Then smothing filtering is carried out to Log spectrum, obtain the approximate shape of Log spectrum:
(6)
Wherein,It is oneSmoothing filter,Spatial domain bandwidth for smoothing filter;
Ask for both differences, obtain composing residual error:
(7)
To spectrum residual errorAnd phase spectrumCarry out two-dimentional inverse Fourier transform, obtain
(8)
Wherein,Represent the saliency value of every point coordinates in gray level image.
4. the setting of step 2, threshold value:
The present invention adopts two methods to arrange threshold value, and respectively by threshold value and the saliency value pair with pixel each in piece image The pixel that saliency value is more than or equal to threshold value is labeled as " 1 " to ratio, is designated as target area;Saliency value is less than the pixel of threshold value It is labeled as " 0 ", be designated as background area;
Solved according to adaptive thresholding algorithm
By threshold valueIt is set to the average saliency value of given image:(9)
Wherein,The length of correspondence image and width;By the often place saliency value obtaining and adaptive thresholdRelatively, by contrast, will It is labeled as " 1 " more than or equal to the pixel of threshold value, be labeled as " 0 " less than the pixel of threshold value, and all in this width image Pixel point set is with being formed by 0,1OKColumn matrixRepresent;
Solved according to big law;Image saliency value scope is designated as,(For maximum saliency value);Pre-set one Threshold valueAbove-mentioned image saliency value is divided into two classes:,, and willWithRespectively It is designated as target and background, both inter-class variances are:
(10)
(11)
(12)
Wherein,Represent that in image, saliency value is less thanNumber of pixels,Represent that in image, saliency value is optionally greater than's Number of pixels,Be less thanTotal pixel average saliency value,Be optionally greater thanTotal pixel average saliency value;
So thatValue maximumValue is exactly required threshold value, that is,;Again T is compared with the often place saliency value of image, will It is labeled as " 1 " more than or equal to the pixel of threshold value, be labeled as " 0 " less than the pixel of threshold value, and all in this width image Pixel point set is with being formed by 0,1OKColumn matrixRepresent.
5. step 3, marking of defects
By matrixWith matrixCorresponding element is multiplied, and obtains new matrix;I.e.:;Can by matrix dot product formula Know, matrixIt is also to be made up of element 0,1, element 1 represents that this pixel saliency value is all higher than equal to two threshold values, i.e. target figure The overlapping positions of picture;Find three matrixes according still further to order from left to right, from top to bottom successivelyMiddle element is 1 Connected region, respectively the connected region of each matrix is designated as
Choose matrix, to matrixMiddle all elements summation, remembers and is;To matrixThe summation of middle all elements, note and For
Introduce function, order(13)
IfThen it is assumed that for defective locations at r;If being less thanThen it is assumed that being error-detecting, workpiece is intact herein Fall into.
CN201611007125.2A 2016-11-16 2016-11-16 Device and method for detecting surface defects of perforated plate workpiece Pending CN106442556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611007125.2A CN106442556A (en) 2016-11-16 2016-11-16 Device and method for detecting surface defects of perforated plate workpiece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611007125.2A CN106442556A (en) 2016-11-16 2016-11-16 Device and method for detecting surface defects of perforated plate workpiece

Publications (1)

Publication Number Publication Date
CN106442556A true CN106442556A (en) 2017-02-22

Family

ID=58207868

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611007125.2A Pending CN106442556A (en) 2016-11-16 2016-11-16 Device and method for detecting surface defects of perforated plate workpiece

Country Status (1)

Country Link
CN (1) CN106442556A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107014819A (en) * 2017-06-09 2017-08-04 杭州电子科技大学 A kind of solar panel surface defects detection system and method
CN107680086A (en) * 2017-09-27 2018-02-09 电子科技大学 A kind of existing arc-shaped side has the material profile defect inspection method of straight line again
CN108732186A (en) * 2018-07-20 2018-11-02 梧州学院 Embedded Surface Flaw automatic checkout system and its control method
CN109447989A (en) * 2019-01-08 2019-03-08 哈尔滨理工大学 Defect detecting device and method based on motor copper bar burr growth district
CN109584239A (en) * 2018-12-13 2019-04-05 华南理工大学 A kind of bloom body surface defect detecting system and method based on reflected light
CN109709105A (en) * 2019-01-18 2019-05-03 安徽工程大学 A kind of hole missing detection device
CN110288561A (en) * 2018-03-14 2019-09-27 浙江大学山东工业技术研究院 Refractory brick surface scratch recognition methods based on frequency filtering enhancing
CN111272766A (en) * 2020-02-20 2020-06-12 上海普密德自动化科技有限公司 Surface defect detection system based on vision technology and detection method thereof
CN111487192A (en) * 2020-04-26 2020-08-04 天津海融科技有限公司 Machine vision surface defect detection device and method based on artificial intelligence
CN112859189A (en) * 2020-12-31 2021-05-28 广东美的白色家电技术创新中心有限公司 Workpiece detection device, detection method, and computer-readable storage medium
CN113538432A (en) * 2021-09-17 2021-10-22 南通蓝城机械科技有限公司 Part defect detection method and system based on image processing
CN113592787A (en) * 2021-07-13 2021-11-02 苏州汇川控制技术有限公司 Light emitting component detection method, light emitting component detection device, terminal equipment and storage medium
CN114663430A (en) * 2022-05-18 2022-06-24 爱科赛智能科技(浙江)有限公司 PCB surface defect detection method based on frequency domain information double confirmation

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005172559A (en) * 2003-12-10 2005-06-30 Seiko Epson Corp Method and device for detecting line defect on panel
CN102305793A (en) * 2011-05-11 2012-01-04 苏州天准精密技术有限公司 Method and equipment for detecting appearance quality of product
CN102495069A (en) * 2011-12-07 2012-06-13 广东辉丰科技股份有限公司 Method for detecting defects of chain belts of zipper on basis of digital image processing
CN102590330A (en) * 2011-12-29 2012-07-18 南京理工大学常熟研究院有限公司 Image processing-based magnetic particle inspection defect intelligent identification detection system
CN104360501A (en) * 2014-10-15 2015-02-18 西安交通大学 Visual detection method and device for defects of liquid crystal display screen
CN105181713A (en) * 2015-07-19 2015-12-23 中北大学 Detection device used for optical fiber image inverter surface defects
CN106053479A (en) * 2016-07-21 2016-10-26 湘潭大学 System for visually detecting workpiece appearance defects based on image processing
CN206223683U (en) * 2016-11-16 2017-06-06 哈尔滨理工大学 A kind of tabular workpiece with hole surface defect detection apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005172559A (en) * 2003-12-10 2005-06-30 Seiko Epson Corp Method and device for detecting line defect on panel
CN102305793A (en) * 2011-05-11 2012-01-04 苏州天准精密技术有限公司 Method and equipment for detecting appearance quality of product
CN102495069A (en) * 2011-12-07 2012-06-13 广东辉丰科技股份有限公司 Method for detecting defects of chain belts of zipper on basis of digital image processing
CN102590330A (en) * 2011-12-29 2012-07-18 南京理工大学常熟研究院有限公司 Image processing-based magnetic particle inspection defect intelligent identification detection system
CN104360501A (en) * 2014-10-15 2015-02-18 西安交通大学 Visual detection method and device for defects of liquid crystal display screen
CN105181713A (en) * 2015-07-19 2015-12-23 中北大学 Detection device used for optical fiber image inverter surface defects
CN106053479A (en) * 2016-07-21 2016-10-26 湘潭大学 System for visually detecting workpiece appearance defects based on image processing
CN206223683U (en) * 2016-11-16 2017-06-06 哈尔滨理工大学 A kind of tabular workpiece with hole surface defect detection apparatus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
陈向伟;张学军;关山;: "基于计算机视觉的微小轴承表面缺陷检测", 机床与液压 *

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107014819A (en) * 2017-06-09 2017-08-04 杭州电子科技大学 A kind of solar panel surface defects detection system and method
CN107680086A (en) * 2017-09-27 2018-02-09 电子科技大学 A kind of existing arc-shaped side has the material profile defect inspection method of straight line again
CN107680086B (en) * 2017-09-27 2020-10-23 电子科技大学 Method for detecting material contour defects with arc-shaped edges and linear edges
CN110288561A (en) * 2018-03-14 2019-09-27 浙江大学山东工业技术研究院 Refractory brick surface scratch recognition methods based on frequency filtering enhancing
CN108732186A (en) * 2018-07-20 2018-11-02 梧州学院 Embedded Surface Flaw automatic checkout system and its control method
CN109584239A (en) * 2018-12-13 2019-04-05 华南理工大学 A kind of bloom body surface defect detecting system and method based on reflected light
CN109584239B (en) * 2018-12-13 2024-02-06 华南理工大学 High-light object surface defect detection system and method based on reflected light
CN109447989A (en) * 2019-01-08 2019-03-08 哈尔滨理工大学 Defect detecting device and method based on motor copper bar burr growth district
CN109709105B (en) * 2019-01-18 2021-07-27 安徽工程大学 Hole missing detection device
CN109709105A (en) * 2019-01-18 2019-05-03 安徽工程大学 A kind of hole missing detection device
CN111272766A (en) * 2020-02-20 2020-06-12 上海普密德自动化科技有限公司 Surface defect detection system based on vision technology and detection method thereof
CN111487192A (en) * 2020-04-26 2020-08-04 天津海融科技有限公司 Machine vision surface defect detection device and method based on artificial intelligence
CN112859189A (en) * 2020-12-31 2021-05-28 广东美的白色家电技术创新中心有限公司 Workpiece detection device, detection method, and computer-readable storage medium
CN113592787A (en) * 2021-07-13 2021-11-02 苏州汇川控制技术有限公司 Light emitting component detection method, light emitting component detection device, terminal equipment and storage medium
CN113538432A (en) * 2021-09-17 2021-10-22 南通蓝城机械科技有限公司 Part defect detection method and system based on image processing
CN113538432B (en) * 2021-09-17 2021-12-21 南通蓝城机械科技有限公司 Part defect detection method and system based on image processing
CN114663430A (en) * 2022-05-18 2022-06-24 爱科赛智能科技(浙江)有限公司 PCB surface defect detection method based on frequency domain information double confirmation

Similar Documents

Publication Publication Date Title
CN106442556A (en) Device and method for detecting surface defects of perforated plate workpiece
CN108445007B (en) Detection method and detection device based on image fusion
US11514270B2 (en) Speckle contrast analysis using machine learning for visualizing flow
CN110675346A (en) Image acquisition and depth map enhancement method and device suitable for Kinect
CN105718931B (en) System and method for determining clutter in acquired images
CN110189375A (en) A kind of images steganalysis method based on monocular vision measurement
CN111242888A (en) Image processing method and system based on machine vision
CN114280075A (en) Online visual inspection system and method for surface defects of pipe parts
CN114092682A (en) Small hardware fitting defect detection algorithm based on machine learning
CN110880171A (en) Detection method of display device and electronic equipment
CN109661683B (en) Structured light projection method, depth detection method and structured light projection device based on image content
CN107784645A (en) Measurement for Digital Image Definition and system, auto focusing method
JP2008070242A (en) Noise-removing method and apparatus, unevenness defect inspecting method and apparatus
CN115661110A (en) Method for identifying and positioning transparent workpiece
JP4115378B2 (en) Defect detection method
KR101796551B1 (en) Speedy calculation method and system of depth information strong against variable illumination
CN115343313A (en) Visual identification method based on artificial intelligence
CN113504250A (en) Peanut aflatoxin detection device and method based on prism type RGB color extraction
CN114023249A (en) LED display screen image light point extraction method and device and LED display screen correction method
CN110274911B (en) Image processing system, image processing apparatus, and storage medium
CN114219758A (en) Defect detection method, system, electronic device and computer readable storage medium
TWI510776B (en) Bubble inspection processing method for glass
CN110441315A (en) Electronic component test equipment and method
CN117593302B (en) Defective part tracing method and system
CN110660073B (en) Straight line edge recognition equipment

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20170222

WD01 Invention patent application deemed withdrawn after publication