CN104820135A - Reactor testing method and testing device - Google Patents
Reactor testing method and testing device Download PDFInfo
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- CN104820135A CN104820135A CN201410044606.5A CN201410044606A CN104820135A CN 104820135 A CN104820135 A CN 104820135A CN 201410044606 A CN201410044606 A CN 201410044606A CN 104820135 A CN104820135 A CN 104820135A
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Abstract
The invention discloses a method for testing a reactor. The method comprises a step S1 of data conversion, a step S2 of data display, a step S3 of data filtering, a step S4 of data calculation, a step S5 of data drawing, and a step S6 of inductance determination. By using the testing method of the invention, the inductance value of the reactor can be obtained accurately.
Description
Technical field
The present invention relates to a kind of method of testing, more specifically, the present invention relates to a kind of reactor method of testing.The invention still further relates to a kind of proving installation for performing said method.
Background technology
In the prior art, when carrying out performance authentication test to I/O reactor, needs are measured and are calculated inductance ratings value and the dynamic electric inductance value of its reality.As shown in prior art in Fig. 1, electric current when adopting oscillograph recording capacitance group to discharge, voltage and time, then calculate inductance ratings value and dynamic electric inductance value.Traditional computing method have two kinds: a kind of is computing function by oscillograph itself, one section in artificial selection discharge current curves, and calculates the inductance value of this section.The average electrical inductance value in an electric current section can only be obtained by this method.When inductance is tending towards state of saturation, discharge current and time are not linear relationship, and result of calculation can exist comparatively big error.And for dynamic electric inductance value corresponding to some current values, cannot accurate Calculation obtain by this method; Another kind of computing method are the scientific algorithm functions by Microsoft Office Excel, and calculate inductance value by the method for curve, but the fit approach that Excel provides is fairly simple, precision is lower, very accurately can not calculate inductance value.
Summary of the invention
The present invention proposes one and can realize more high-precision reactor method of testing.
Method of testing according to reactor of the present invention comprises the following steps:
Step S1: data conversion step, data conversion module converts the input voltage of input and the ratio of current sensor and voltage and current data to identifiable design data;
Step S2: data displaying, identifiable design Plotting data is become voltage-time curve and current versus time curve by data disaply moudle;
Step S3: data filtering step, data filtering module carries out filtering process according to the filtering time of input to identifiable design data;
Step S4: data calculation procedure, each current value time differential on differential module calculating current-time curve, and inductance computing module calculates actual inductance value corresponding to each current value of array form according to the differential value of Current versus time of input, filtered voltage data and sampling time data;
Step S5: Plotting data step, the actual inductance value that data disaply moudle is corresponding according to each current value of array form draws outputting inductance-current curve; With
Step S6: inductance determining step, inductance ratings and dynamic inductance computing module are according to the load current value of input and dynamic current value, inductance-current curve is searched corresponding inductance value, and calculate the rate of change of the relative inductance ratings value of dynamic electric inductance value, and show above-mentioned numerical value by data disaply moudle.
Preferably in the method for testing of reactor of the present invention, described in step S1, voltage and current data are gathered by oscillograph.
In addition preferably, in the method for testing of reactor of the present invention, the filtering in step S3 is treated to average value filtering.
Further preferably, in the method for testing of reactor of the present invention, the method comprises input data determining step S7 further, Effective judgement is carried out to the load current value inputted in inductance ratings and dynamic inductance computing module, inductance ratings value, selected current value and filtering time, if it is invalid to be judged as, then returns and re-enter.
The proving installation additionally providing a kind of reactor of the present invention, wherein, described proving installation comprises:
Data conversion module, for converting the input voltage of input and the ratio of current sensor and voltage and current data to identifiable design data;
Data disaply moudle, for identifiable design Plotting data is become voltage-time curve and current versus time curve, and shows the number percent of inductance ratings value, dynamic electric inductance value inductance ratings value relative to dynamic electric inductance value;
Data filtering module, for carrying out filtering process according to the filtering time of input to identifiable design data;
Differential module, each current value time differential on calculating current-time curve;
Inductance computing module, calculates actual inductance value corresponding to each current value of array form for the differential value of Current versus time according to input, filtered voltage data and sampling time data;
Inductance ratings and dynamic inductance computing module, for according to the load current value inputted and dynamic current value, inductance-current curve is searched corresponding inductance value.
Utilize the present invention, the inductance value that each sampled point is corresponding can be calculated, significantly precision is improve compared with the average electrical inductance value in employing electric current section, and dynamic electric inductance value corresponding to some current values can be obtained very easily, inductance curve can be drawn out easily, thus clearly can show the saturated conditions of inductance with electric current of tested reactor.
Accompanying drawing explanation
In order to describe the present invention in more detail, be also described further with reference to specific embodiment below with reference to accompanying drawing, wherein:
Fig. 1 is the test circuit figure of prior art;
Fig. 2 is the process flow diagram according to reactor method of testing of the present invention;
Fig. 3 is the structural representation according to reactor proving installation of the present invention;
Fig. 4 is the schematic diagram of data conversion module;
Fig. 5 is the schematic diagram of data disaply moudle;
Fig. 6 is the schematic diagram of data filtering module;
Fig. 7 is the schematic diagram of differential module;
Fig. 8 is the schematic diagram of inductance computing module;
Fig. 9 is the schematic diagram of data disaply moudle; With
Figure 10 is the schematic diagram of inductance ratings and dynamic inductance computing module.
Embodiment
Describe in detail according to proving installation of the present invention and method of testing below with reference to accompanying drawing.
First with reference to Fig. 3, according to reactor proving installation 100 of the present invention, comprising: data conversion module 1; Data disaply moudle 2; Data filtering module 3; Differential module 4; Inductance computing module 5; With inductance ratings and dynamic inductance computing module 6.
Further particularly, as shown in Figure 4, data conversion module 1 is for receiving the ratio of input voltage and current sensor, and from oscillographic image data (voltage of such as tested reactor, electric current and sampling time), and the data of above-mentioned input are converted to discernible form, and the data after conversion are outputted to data disaply moudle 2.
As shown in Figure 5, data disaply moudle 2, for receiving the data after conversion from data conversion module 1, comprises voltage, electric current and sampling time, and then according to oscilloscope data drafting, output voltage-time curve and current versus time curve.
Referring again to Fig. 6, data filtering module 3 receives the filtering time of input and the data (comprising voltage and current) after conversion, and according to the filtering time inputted, carries out filtering process to data, thus generates the filtered data comprising voltage and current.
Following reference diagram 7, differential module 4 receives the filtered current data of input and the sampling time data after changing, thus calculates each current value time differential on current versus time curve, and then obtains the differential value (array) of Current versus time
Because
so
obtaining inductance value only needs voltage and current to the derivative of time.
With reference to figure 8, inductance computing module 5 received current is to the time
differential value (array), the sampling time data after filtered voltage data and conversion, thus calculate the actual inductance value corresponding to each current value, obtain actual inductance value corresponding to current value (array).
With reference to figure 9, the actual inductance value (array) that data disaply moudle 2 input current value is corresponding, according to calculating Plotting data inductance curve, obtains inductance-current curve.
Referring again to Figure 10, inductance ratings and dynamic inductance computing module 6 input the basic parameter of tested reactor, comprise load current value, dynamic current value and inductance ratings value, and the actual inductance value that current value is corresponding (array), and then inductance ratings and dynamic inductance computing module 7 are according to the load current value of input and dynamic current value, inductance-current curve is searched corresponding inductance value, and calculate the rate of change of the relative inductance ratings value of dynamic electric inductance value, thus display inductance ratings value, dynamic electric inductance value inductance ratings relative to dynamic electric inductance value, complete the test to reactor.
Following reference diagram 2, the method for testing according to reactor of the present invention comprises the following steps:
Step S1: data conversion step, data conversion module 1 converts the input voltage of input and the ratio of current sensor and voltage and current data to identifiable design data.Particularly, in step S1.1, the ratio of data conversion module 1 input voltage and current sensor.In step S1.2, by the voltage and current data importing data conversion module 1 that such as gathered by oscillograph.In step S1.3, completed the conversion of data by data conversion module 1.
Step S2: data displaying, identifiable design Plotting data is become voltage-time curve and current versus time curve by data disaply moudle 2.
Step S3: data filtering step, data filtering module 3 carries out filtering process according to the filtering time of input to identifiable design data.Particularly, in step S3.1, by the filtering time input data filtering module 3 during data processing, and in step S3.2, carry out filtering process by filtration module 3 pairs of data.
Step S4: data calculation procedure, particularly in step S4.1, each current value time differential on differential module 4 calculating current-time curve, and in step S4.2, inductance computing module 5 calculates actual inductance value corresponding to each current value of array form according to the differential value of Current versus time of input, filtered voltage data and sampling time data;
Step S5: Plotting data step, the actual inductance value that data disaply moudle 2 is corresponding according to each current value of array form draws outputting inductance-current curve; With
Step S6: inductance determining step, particularly, in step S6.1, load current value and dynamic current value are imported in inductance ratings and dynamic inductance computing module 7, and in step S6.2, the current value calculating corresponding dynamic inductance is needed to be selected, in step S6.3, according to load current value and the dynamic current value of input, inductance-current curve is searched corresponding inductance value, and calculate the rate of change of the relative inductance ratings value of dynamic electric inductance value, and in step S6.4, show above-mentioned numerical value by data disaply moudle 2.
After step S3.1, S6.1 or S6.4, optionally can implement input determining step S7, to judge that whether each input is correct, if input incorrect, then re-enter.
The above is only preferred embodiment of the present invention, not does any pro forma restriction to the present invention.Although the present invention discloses as above with preferred embodiment, but and be not used to limit the present invention, any those skilled in the art, do not departing within the scope of technical solution of the present invention, make a little change when the technology contents of above-mentioned disclosure can be utilized or be modified to the Equivalent embodiments of equivalent variations, in every case be the content not departing from technical solution of the present invention, the any simple modification done above embodiment according to technical spirit of the present invention, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.
Claims (5)
1. a method of testing for reactor, is characterized in that, the method comprises the following steps:
Step S1: data conversion step, data conversion module (1) converts the input voltage of input and the ratio of current sensor and voltage and current data to identifiable design data;
Step S2: data displaying, identifiable design Plotting data is become voltage-time curve and current versus time curve by data disaply moudle (2);
Step S3: data filtering step, data filtering module (3) carries out filtering process according to the filtering time of input to identifiable design data;
Step S4: data calculation procedure, each current value time differential on differential module (4) calculating current-time curve, and inductance computing module (5) calculates actual inductance value corresponding to each current value of array form according to the differential value of Current versus time of input, filtered voltage data and sampling time data;
Step S5: Plotting data step, the actual inductance value that data disaply moudle (2) is corresponding according to each current value of array form draws outputting inductance-current curve; With
Step S6: inductance determining step, inductance ratings and dynamic inductance computing module (7) are according to the load current value of input and dynamic current value, inductance-current curve is searched corresponding inductance value, and calculate the rate of change of the relative inductance ratings value of dynamic electric inductance value, and show above-mentioned numerical value by data disaply moudle (2).
2. the method for testing of reactor as claimed in claim 1, it is characterized in that, the data of voltage and current described in step S1 are gathered by oscillograph.
3. the method for testing of reactor as claimed in claim 1, it is characterized in that, the filtering in step S3 is treated to average value filtering.
4. the method for testing of reactor as claimed in claim, it is characterized in that, the method comprises input data determining step S7 further, Effective judgement is carried out to the load current value inputted in inductance ratings and dynamic inductance computing module, inductance ratings value, selected current value and filtering time, if it is invalid to be judged as, then returns and re-enter.
5. the proving installation (100) of a reactor, is characterized in that, described proving installation (100) comprising:
Data conversion module (1), for converting the input voltage of input and the ratio of current sensor and voltage and current data to identifiable design data;
Data disaply moudle (2), for identifiable design Plotting data is become voltage-time curve and current versus time curve, and shows the number percent of inductance ratings value, dynamic electric inductance value inductance ratings value relative to dynamic electric inductance value;
Data filtering module (3), for carrying out filtering process according to the filtering time of input to identifiable design data;
Differential module (4), each current value time differential on calculating current-time curve;
Inductance computing module (5), calculates actual inductance value corresponding to each current value of array form for the differential value of Current versus time according to input, filtered voltage data and sampling time data;
Inductance ratings and dynamic inductance computing module (7), for according to the load current value inputted and dynamic current value, inductance-current curve is searched corresponding inductance value.
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| CN201410044606.5A CN104820135B (en) | 2014-01-30 | 2014-01-30 | Reactor method of testing and test device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109342826A (en) * | 2018-11-13 | 2019-02-15 | 深圳市京泉华科技股份有限公司 | Electrical sensing test-run a machine |
| CN111262430A (en) * | 2019-12-05 | 2020-06-09 | 艾德克斯电子（南京）有限公司 | Method for dynamically correcting inductance value |
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| CN101923130A (en) * | 2010-08-16 | 2010-12-22 | 中国电力科学研究院 | Special test method for saturable reactor used for converter valve |
| CN101957161A (en) * | 2010-08-20 | 2011-01-26 | 中国电力科学研究院 | Routine testing method of saturation reactor |
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2014
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| CN101923130A (en) * | 2010-08-16 | 2010-12-22 | 中国电力科学研究院 | Special test method for saturable reactor used for converter valve |
| CN101957161A (en) * | 2010-08-20 | 2011-01-26 | 中国电力科学研究院 | Routine testing method of saturation reactor |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342826A (en) * | 2018-11-13 | 2019-02-15 | 深圳市京泉华科技股份有限公司 | Electrical sensing test-run a machine |
| CN109342826B (en) * | 2018-11-13 | 2024-03-01 | 深圳市京泉华科技股份有限公司 | Inductance tester |
| CN111262430A (en) * | 2019-12-05 | 2020-06-09 | 艾德克斯电子（南京）有限公司 | Method for dynamically correcting inductance value |
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| CN104820135B (en) | 2018-01-30 |
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