CN103675470A - N*M dimension resistor network measuring device - Google Patents
N*M dimension resistor network measuring device Download PDFInfo
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- CN103675470A CN103675470A CN201310557056.2A CN201310557056A CN103675470A CN 103675470 A CN103675470 A CN 103675470A CN 201310557056 A CN201310557056 A CN 201310557056A CN 103675470 A CN103675470 A CN 103675470A
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Abstract
The invention discloses an N*M dimension resistor network measuring device which comprises a constant current source, an instrumentation amplifier circuit, a voltage acquisition circuit and four multiple-path analog switches. N resistors form a resistor network, and M resistor networks are formed. Ends of resistors in each resistor network are interconnected through leads and connection points are formed. The connection points are connected with one path of the third multiple-path analog switch respectively through a cable. The connection points are connected with one path of the fourth multiple-path analog switch respectively through another cable. The other ends of the resistors in each resistor network are respectively connected with one path of the first multiple-path analog switch and one path of the second multiple-path analog switch through two cables. The constant current source, the second multiple-path analog switch and the third multiple-path analog switch together form a current source access. The first multiple-path analog switch, the fourth multiple-path analog switch and the instrumentation amplifier circuit form a current test access. By controlling the four multiple-path analog switches, testing of each resistor in the N*M dimension resistors is realized.
Description
Technical field
The invention belongs to precision resistance fields of measurement.
Background technology
During by long testing lines precision resistance, the impedance meeting of cable impacts test result.For avoiding the impact of cable on test, conventionally adopt four-wire system test precision resistance [1-3].Four-wire system is divided into power lead-in wire and sense leads by two loops of resistance measurement.By constant current source, to power lead-in wire Injection Current, make to occur on resistance pressure drop; In the sense leads of high impedance, by magnification at high multiple and precision measurement route survey resistance drop, can measure the resistance that lead-in conductor does not disturb.This four-wire system method of testing is applicable to the precision temperature fields of measurement of high precision, stability and high conformity.
[1] a high-precision temperature measurement mechanism that utilizes platinum resistance to measure, CN200920109994.5, Space Sci. & Application Research Center, Chinese Academy of Sciences;
[2] a high-precision platinum resistor resistance automatic testing equipment, CN201120325724.5, The 49th Research Institute of CECT;
[3] a high-precision temperature measurement mechanism that utilizes platinum resistance to measure, CN200920109994.5, Space Sci. & Application Research Center, Chinese Academy of Sciences;
[4] utilize two constant current sources to measure a circuit for temperature platinum resistance, CN201120288667.8, Changchun Ltd of meteorologic instrument research institute.
But four-wire system measurement has circuit complexity, cable is many and the high limitation of cost, and therefore [4] document adopts the general mode of three-wire system four-wire system, tests precision resistance, has reduced the cost of resistance measurement.
The ion-conductance that satellite newly grinds advances circuit to adopt in a large number accurate Pt resistance as temperature probe.Pt resistance has precision, feature that rate of change is little (0.3851 Ω/℃), is subject to cable resistance (0.2 Ω-3 Ω) impact larger, needs spaceborne circuit to adopt four-wire system measuring resistance method, and Dui Mei road Pt resistance provides constant current source and magnification at high multiple circuit.When advancing a large amount of Pt of employing resistance as thermometric sensor, need the Pt resistance way of collection more, need to consume a large amount of hardware circuit resources and whole star cable.By analysis, the platinum resistance network of satellite ion propulsion, has that resistance number is many, resistance is grouped into N * feature that M distributes.If adopt traditional four-wire system resistance test network, cable circuit cost and debugging cost are higher.
Summary of the invention
Technical matters to be solved by this invention is: provide a kind of and realize simple, few, the lower-cost N * M(N of number of cables and be more than or equal to 2 integer, M is more than or equal to 2 integer) dimension resistor network measurement mechanism.
The present invention includes following technical scheme:
N * M dimension resistor network measurement mechanism, comprises constant current source, magnifier and voltage collection circuit; The first multiway analog switch, the second multiway analog switch, the 3rd multiway analog switch and the 4th multiway analog switch; The first multiway analog switch, the second multiway analog switch have N * M path analoging switch; The 3rd multiway analog switch and the 4th multiway analog switch have M path analoging switch; Every N resistance forms a resistor network, forms altogether M resistor network; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with the 3rd multiway analog switch Yi road by a cable; Described tie point is connected with the 4th multiway analog switch Yi road by another root cable; The other end of each resistance in each resistor network is connected with the first multiway analog switch Yi road, the second multiway analog switch Yi road respectively by two cables; One end of constant current source is connected with described the second multiway analog switch, and the other end of constant current source is connected with the 3rd multiway analog switch, thereby forms current source path; The first multiway analog switch is connected with an input end of magnifier, and the 4th multiway analog switch is connected with another input end of magnifier, thereby forms voltage tester path; The output terminal of magnifier is connected with voltage collection circuit; By controlling four multiway analog switches, realize the test of each resistance in N * M dimension resistance.
Described resistance is for thermometric platinum resistance.
The present invention compared with prior art tool has the following advantages:
The present invention uses 2 * N * M+2M cable grid to substitute four-wire system test, by distinguishing the mode of voltage path and current path, avoids the impact of cable resistance on resistance precision, has saved a large amount of cables; The mode that adopts timesharing to suit multiway analog switch provides respectively independent current source path and voltage tester path to N * M resistance, saves a large amount of circuit areas.Number of cable has been saved to the root of 2M * (N-1) in original design basis, circuit is saved as 1/ (N * M) of original design, can save a large amount of cables and hardware circuit meeting under the prerequisite of measuring accuracy, reduce hardware cost and debugging complicacy, cost performance is higher.
Accompanying drawing explanation
Fig. 1 is N * M(M=2) dimension resistor network measurement dress schematic diagram.
Embodiment
Below just by reference to the accompanying drawings the present invention is described further.
N during as shown in Figure 1, for M=2 * M dimension resistor network measurement mechanism schematic diagram; Comprise constant current source A, magnifier and voltage collection circuit; Also comprise the first multiway analog switch M1, the second multiway analog switch M2, the 3rd multiway analog switch M3 and the 4th multiway analog switch M4; The first multiway analog switch M1, the second multiway analog switch M2 have N * M path analoging switch; The 3rd multiway analog switch M3 and the 4th multiway analog switch M4 have M path analoging switch; Every N resistance forms a resistor network, forms altogether M resistor network; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with the 3rd multiway analog switch M3 mono-tunnel by a cable; Described tie point is connected with the 4th multiway analog switch M4 mono-tunnel by another root cable; The other end of each resistance in each resistor network is connected with the first multiway analog switch Yi road, the second multiway analog switch Yi road respectively by two cables; One end of constant current source A is connected with described the second multiway analog switch M3, and the other end of constant current source A is connected with the 3rd multi-channel analog M3 switch, thereby forms current source path; The first multiway analog switch M1 is connected with an input end of magnifier, and the 4th multiway analog switch M4 is connected with another input end of magnifier, thereby forms voltage tester path; The output terminal of magnifier is connected with voltage collection circuit; By timesharing, switch multiway analog switch and provide current source path and voltage tester path to each in N * M dimension resistance.
Adopt voltage reference device to provide input impedance less constant current source A; Adopt amplifier chip to build high power magnifier, input impedance is greater than 40M ohm; Adopt the cable system of 2 * (N * M)+2M to N * M dimension Pt resistance simulation four-wire system connected mode; Adopt multiway analog switch M1-M4 to control conducting and the cut-out of the corresponding test circuit of every road resistance; Therein after a road conducting, because magnifier path resistance is larger, the electric current that constant current source provides will be according to flow through Pt resistance be back to constant current source loop of current return.Due to the cable resistance of electric current without pressure measurement path, so pressure measurement circuit is not subject to the impact of cable resistance on the test of Pt resistance; Test finishes rear switching multiway analog switch, opens next road resistance of test.Wire between N resistance connects impedance r1-rN can be determined by demarcation, can obtain accurate resistance.
Measurement mechanism of the present invention can be applied to satellite ion propulsion Pt Resistance Temperature Measuring Circuit, and now, above-mentioned resistor network measurement mechanism is for thermometric platinum resistance network measure device.Also can be applied to the network measure of other precision resistance.
The unspecified part of the present invention belongs to general knowledge as well known to those skilled in the art.
Claims (2)
1. N * M dimension resistor network measurement mechanism, comprises constant current source, magnifier and voltage collection circuit; It is characterized in that, also comprise the first multiway analog switch, the second multiway analog switch, the 3rd multiway analog switch and the 4th multiway analog switch; The first multiway analog switch, the second multiway analog switch have N * M path analoging switch; The 3rd multiway analog switch and the 4th multiway analog switch have M path analoging switch; Every N resistance forms a resistor network, forms altogether M resistor network; One end of each resistance in each resistor network is by wire interconnects and form tie point; Described tie point is connected with the 3rd multiway analog switch Yi road by a cable; Described tie point is connected with the 4th multiway analog switch Yi road by another root cable; The other end of each resistance in each resistor network is connected with the first multiway analog switch Yi road, the second multiway analog switch Yi road respectively by two cables; One end of constant current source is connected with described the second multiway analog switch, and the other end of constant current source is connected with the 3rd multiway analog switch, thereby forms current source path; The first multiway analog switch is connected with an input end of magnifier, and the 4th multiway analog switch is connected with another input end of magnifier, thereby forms voltage tester path; The output terminal of magnifier is connected with voltage collection circuit; By controlling four multiway analog switches, realize the test of each resistance in N * M dimension resistance.
2. N as claimed in claim 1 * M dimension resistor network measurement mechanism, is characterized in that: described resistance is for thermometric platinum resistance.
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| CN201310557056.2A CN103675470B (en) | 2013-11-11 | 2013-11-11 | A kind of N*M dimension resistor network measurement mechanism |
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| CN201310557056.2A CN103675470B (en) | 2013-11-11 | 2013-11-11 | A kind of N*M dimension resistor network measurement mechanism |
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| CN103675470A true CN103675470A (en) | 2014-03-26 |
| CN103675470B CN103675470B (en) | 2016-02-10 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103941133A (en) * | 2014-04-29 | 2014-07-23 | 西北工业大学 | Ultra-miniature parallel processor cable testing system and method |
| CN107687905A (en) * | 2016-08-04 | 2018-02-13 | 中车株洲电力机车研究所有限公司 | A kind of platinum resistance temperature harvester |
| CN112327057A (en) * | 2020-12-03 | 2021-02-05 | 常州同惠电子股份有限公司 | On-resistance testing method for wire tester |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103941133A (en) * | 2014-04-29 | 2014-07-23 | 西北工业大学 | Ultra-miniature parallel processor cable testing system and method |
| CN107687905A (en) * | 2016-08-04 | 2018-02-13 | 中车株洲电力机车研究所有限公司 | A kind of platinum resistance temperature harvester |
| CN112327057A (en) * | 2020-12-03 | 2021-02-05 | 常州同惠电子股份有限公司 | On-resistance testing method for wire tester |
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| CN103675470B (en) | 2016-02-10 |
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