CN104697634B - A kind of very high resolution spectral measurement device and method - Google Patents
A kind of very high resolution spectral measurement device and method Download PDFInfo
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- CN104697634B CN104697634B CN201510107118.9A CN201510107118A CN104697634B CN 104697634 B CN104697634 B CN 104697634B CN 201510107118 A CN201510107118 A CN 201510107118A CN 104697634 B CN104697634 B CN 104697634B
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Abstract
The invention discloses a kind of very high resolution spectral measurement device and method, spectral measurement device includes FP interferometers, SBS wave filter, detector, data acquisition module and control module；The first input end of FP interferometers is used for connecting measured signal, and the second input of FP interferometers is connected to the first outfan of control module；The first input end of SBS wave filter is connected to the outfan of FP interferometers, second input of the SBS wave filter is connected to the second outfan of control module, the input of detector is connected to the first outfan of SBS wave filter, the first input end of data acquisition module is connected to the outfan of detector, second input of data acquisition module is connected to the second outfan of SBS wave filter, and the input/output terminal of control module is connected to the I/O of data acquisition module.The present invention obtains the measurement range bigger than existing FP interferometers while can improving spectral measurement resolution.
Description
Technical field
The invention belongs to field of optical measuring technologies, more particularly, to a kind of very high resolution spectral measurement device and
Method.
Background technology
Spectral measurement plays very important role in optical communication field, in the transmitting procedure of optical signal, Ke Yitong
The spectrum of analysis optical signal is crossed being monitored to its property indices.With the increase in demand of power system capacity, orthogonal frequency
The multiplex techniques such as multiplexing (OFDM) gradually come into operation, and inter-channel frequency interval greatly reduces, and reaches 10MHz magnitudes, traditional
Spectral measurement methodses can not meet the requirement of resolution.On the other hand, the relaxation oscillation effect of observation laser instrument, photomodulator
The details such as chirping characteristics also the resolution of spectral measurement device is put forward higher requirement.Therefore, spectral measurement dress is improved
The resolution that puts is particularly important.
Traditional spectral measurement device is based on diffraction grating, is only capable of the resolution for reaching 1GHz or so；And it is based on phase
Dry detection, the spectral measurement methodses based on stimulated Brillouin scattering effect can reach the resolution of 10MHz or so.Fabry amber
Sieve (FP) interferometer can obtain the resolution better than above-mentioned spectrogrph for measurement signal spectrum, here will be better than 10MHz's
Resolution is referred to as very high resolution.FP interferometers are made up of FP etalons, piezoelectric transducer and waveform generator, be a kind of by
The multi-beam interferometer of two pieces of parallel glass plate compositions, the wherein two pieces relative inner surfacies of glass plate all have high reflectance.
When the wavelength of incident illumination meets its resonance condition, its transmission spectrum occurs very high peak value, correspond to very high absorbance.
With very high resolution, this advantage causes FP interferometers to be mainly used in the higher occasion of Measurement Resolution requirement, for example, be used for
The measurement of ultrahigh resolution laser linewidth, analytical model Structure and stability, wavelength chirp, shake and drift etc.；FP interferometers
Ultrahigh resolution spectral measurement is also used for, including chemical analyses, transmitting Absorption Line etc..Document report FP interferometer is used for measuring
Can obtain the accuracy of 1MHz in the experiment of lasing mode frequency interval, but experiment measurement range be only 10MHz～
1GHz, illustrates that FP interferometers can obtain very high resolution, but also receives the less restriction of measurement range simultaneously.
Books (Hui R, O'Sullivan M.Fiber optic measurement techniques [M]
.Academic Press, 2009:154～168) describe the fineness of FP interferometers, between Free Spectral Range and bandwidth
Relation, its advantage is to obtain the resolution higher than conventional spectrometers, but have the shortcomings that measurement wave-length coverage little,
Limit its application.United States Patent (USP) US6697159B2 discloses a kind of FP interferometers and carries out the dress of spectral measurement with reference to grating
Put, using grating measuring scope is big but resolution is low, FP interferometers high resolution but the characteristics of little measurement range, both are combined
Work, can also obtain larger measurement range while obtaining high-resolution.The program is used for the spy for detecting optical grating diffraction light
Survey device more complicated, and resolution is relevant with grating and detector, also there is certain limitation.
Content of the invention
For the defect of prior art, the invention provides a kind of very high resolution spectral measurement device and method, its mesh
Be obtain bigger than the existing FP interferometers measurement range while resolution for improving spectral measurement.
The invention provides a kind of very high resolution spectral measurement device, including FP interferometers, SBS wave filter, detector,
Data acquisition module and control module；The first input end of the FP interferometers is used for connecting measured signal, the FP interferometers
The second input be connected to the first outfan of the control module；The first input end of the SBS wave filter is connected to institute
The outfan of FP interferometers is stated, the second input of the SBS wave filter is connected to the second outfan of the control module；Institute
The input for stating detector is connected to the first outfan of the SBS wave filter, the first input end of the data acquisition module
The outfan of the detector is connected to, the second input of the data acquisition module is connected to the of the SBS wave filter
Two outfans；The input/output terminal of the control module is connected to the I/O of the data acquisition module；The FP does
Interferometer be used for measured signal is converted to discrete arrowband composition, due to its have very little-three dB bandwidth, therefore have high
Resolution；The SBS wave filter selects to amplify one of arrowband composition, after the backscatter signal of generation is through the detector
Current signal is converted to, the data acquisition module is acquired process to which；It is described that the control module sends signal control
FP interferometers and SBS filter synchronizations scanning, SBS gain peaks are selected successively to the transmission peaks of the FP interferometer works
Select so that measurement range is no longer limited to a Free Spectral Range (free spectral range, FSR), so as to obtain ratio
The bigger measurement range of existing FP interferometers.
Further, the FP interferometers include FP etalons, piezoelectric transducer and waveform generator；The FP standards
First input end of the first input end of tool as the FP interferometers, the outfan of the FP etalons are interfered as the FP
The outfan of instrument, the second input of the input of the waveform generator as the FP interferometers；The piezoelectric transducer
Input be connected to the outfan of the waveform generator, the second input of the FP etalons is connected to the piezoelectricity and changes
The outfan of energy device；The piezoelectric transducer is connected with a hysteroscope of the FP etalons, for long, the Jin Ergai that changes FP chambeies
Become the signal wavelength of transmission；The waveform generator provides running voltage to the piezoelectric transducer, is set to sawtooth waveforms here
Voltage, the scanning in conjunction with SBS gain peaks are selected to FP transmission peaks, obtain the measurement range bigger than existing FP interferometers.
Further, the SBS wave filter includes that isolator, nonlinear optical fiber, Polarization Controller, circulator, light are put
Big device and tunable laser；The input of the isolator as the SBS wave filter first input end be connected to described
The outfan of FP etalons, the first end of the nonlinear optical fiber are connected with the outfan of the isolator, the Polarization Control
The first end of device is connected with the second end of the nonlinear optical fiber, the second end of the circulator and the of the Polarization Controller
Two ends are connected；The input of first outfan of the 3rd end of the circulator as the SBS wave filter and the detector
Be connected, the outfan of the image intensifer is connected with the first end of the circulator；The first of the tunable laser is defeated
Go out end to be connected with the input of the image intensifer, the second outfan of the tunable laser is used as the SBS wave filter
The second outfan be connected with the second input of the data acquisition module；The input of the tunable laser is used as institute
State the second input of SBS wave filter to be connected with the first outfan of the control module.
Wherein, during work, by adjusting the parameter of the FP etalons and the tunable laser so that letter to be measured
Number certain arrowband composition alignment SBS gain peaks, and the adjacent arrowband composition in left and right be not at just-three dB bandwidth in.
Further, the running voltage of the piezoelectric transducer is sawtooth waveforms.
Further, voltage often changes a cycle, and the peak wavelength of the FP etalon transmissions will be scanned successively
To at the corresponding wavelength of next peak value, the transmission peaks of FP etalons work Backwards selection successively so that measurement range is not limited to
In a Free Spectral Range, the measurement range bigger than existing FP interferometers is obtained.
Present invention also offers a kind of very high resolution spectral measurement method, comprises the steps：
(1) measured signal is converted to by discrete arrowband composition using optical filter；
(2) one of arrowband composition is amplified using SBS wave filter；
(3) the arrowband composition conversion after adopting detector by amplification is for electric current；
(4) control module control optical filter and SBS filter gains peak are scanned to signal wavelength；
(5) data acquisition module is acquired process to electric current and obtains signal spectrum.
Wherein, the FP etalon transmissions peak and the SBS wave filter are equal to length scanning speed.
Wherein, SBS effects are combined using the FP interferometers, measurement signal spectrum is obtained while obtaining very high resolution
The measurement range bigger than existing FP interferometers.
The present invention can improve the resolution of spectral measurement, and with very big measurement range.Due to being interfered using FP
Instrument carries out spectral measurement with reference to SBS effects, and the resolution of device is determined by the resolution of FP interferometers, can pass through setting FP and do
The parameter of interferometer come make system obtain very high resolution；On the other hand, FP interferometer works voltage adopts sawtooth waveforms, arrange its with
The length scanning speed of tunable laser matches, and the transmission peaks that FP etalons work is carried out successively using SBS gain peaks
Select so that measurement range is no longer limited to a FSR, obtain the measurement range bigger than existing FP interferometers.
Description of the drawings
Fig. 1 is the overall flow schematic diagram of very high resolution spectral measurement method provided in an embodiment of the present invention；
Fig. 2 is the principle schematic of very high resolution spectral measurement device provided in an embodiment of the present invention；
Fig. 3 is the structural representation of very high resolution spectral measurement device provided in an embodiment of the present invention；
Fig. 4 is the time diagram of very high resolution spectral measurement device provided in an embodiment of the present invention, and wherein a represents control
Molding block sends trigger, and b represents that waveform generator running voltage, c represent that FP interferometer work wavelength, d represent laser instrument
Optical maser wavelength is sent, e represents that laser instrument trigger, f represent data acquisition module working condition.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, below in conjunction with drawings and Examples, right
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only in order to explain the present invention, not
For limiting the present invention.As long as additionally, involved technical characteristic in invention described below each embodiment that
Do not constitute conflict can just be mutually combined between this.
Fig. 1 is the overall flow schematic diagram of the very high resolution spectral measurement method that the present invention is provided.As shown in figure 1, institute
The method of stating is comprised the following steps：
(1) measured signal is converted to by discrete arrowband composition using optical filter；
(2) one of arrowband composition is amplified using SBS wave filter；
(3) the arrowband composition conversion after adopting detector by amplification is for electric current；
(4) control module control optical filter and SBS filter gains peak are scanned to signal wavelength；
(5) data acquisition module is acquired process to electric current and obtains signal spectrum.
The principle of very high resolution spectral measurement is as shown in Figure 2.Measured signal is converted into discrete after FP interferometers
Arrowband composition；An arrowband composition of the discrete arrowband composition after SBS wave filter in SBS gain spectrum peaks is by significantly
Ground amplifies, hence into follow-up detecting module.Described FP interferometers include that FP etalons, piezoelectric transducer and waveform are sent out
Raw device etc.；Described SBS wave filter includes tunable laser, image intensifer, nonlinear optical fiber, circulator, Polarization Controller
And isolator etc..The tunable laser sends one-wavelength laser, and flashlight occurs SBS effects.Which is caused by adjusting
In the signal component wavelength of an arrowband and the pump wavelength difference of laser instrument output be Brillouin shift, therefore this arrowband
Alignment SBS gain peaks, and the adjacent arrowband in left and right be not at just-three dB bandwidth in.So, one of arrowband composition by
It is exaggerated strongly in SBS effects, other compositions can be ignored relative to this composition.Laser instrument and FP etalons are simultaneously to ripple
Length carries out synchronous scanning, and different wave length composition is passed through by this arrowband successively, and is exaggerated strongly, and can obtain through process whole
Individual spectrum.
The present invention can obtain very high resolution, derive as follows.The gain spectral of SBS effects and the transmission function of FP etalons
As shown in Figure 2.When SBS-three dB bandwidth in exist just FP etalons three transmission peaks when, Free Spectral Range (FSR) has most
Little value, can now obtain highest resolution.Therefore requireResolution is
Wherein finenessIf it is 0.9 to take reflectance R, Δ υ is 10MHz；By formula (1) (2) and fineness table
Up to formula, the resolution ax υ ' for trying to achieve FP interferometers with reference to SBS means for influencings is 168KHz.Above-mentioned derivation is theoretic resolution
Rate, if combining actual existing FP interferometers product, the optical fiber FP scanning interferometers FSR of Micro Optics companies is 10MHz,
Corresponding resolution is 1MHz.It can be seen that, relative to traditional SBS effect spectrogrphs, this device can improve the resolution of spectral measurement
Rate.As SBS effects can obtain narrower bandwidth relative to grating, so this device is allowed with reference to FP interferometers relative to grating
There is less FSR, therefore have less FP bandwidth, resolution to be lifted, obtain very high resolution.
The present invention has very big wavelength measurement scope, due to combining the transmission peaks that SBS effects work to FP etalons
Selected so that measurement range is not limited solely to a FSR, so as to obtain the measurement model bigger than existing FP interferometers
Enclose.
By the method for the invention, i.e., spectral measurement is carried out using optical filter such as FP interferometers with reference to SBS effects,
Very high resolution can be obtained, this is because FP interferometers have very high resolution；Simultaneously using SBS gain peaks to FP etalons
The transmission peaks of work are selected successively so that measurement range is no longer limited to a FSR, so as to obtain than existing FP interferometers
Bigger measurement range.
In embodiments of the present invention, optical filter can select FP interferometers, because FP interferometers have high dividing
Resolution, meets the requirement of high resolution of the present invention.Piezoelectric energy-conversion in the one of hysteroscope of FP etalons of composition FP interferometers
The running voltage of device is sawtooth waveforms.Voltage often changes a cycle, and the peak wavelength of FP etalon transmissions will be scanned successively
At the corresponding wavelength of next peak value, the transmission peaks of FP etalons work Backwards selection successively can so cause measurement range
A Free Spectral Range is not limited solely to, the measurement range bigger than existing FP interferometers is obtained.
In embodiments of the present invention, SBS wave filter is by laser instrument, optical fiber, circulator, Polarization Controller and isolator etc.
Composition.The laser instrument of composition SBS wave filter is can be to the tunable laser of wavelength linear scanning, in this case SBS gains
Peak wavelength linearly changes, and the signal wavelength that the transmission peaks of FP etalons work are passed through also linearly changes；Therefore exist
In scanning process, SBS gain peaks can be directed at that transmission peaks of FP etalons work all the time, and narrow band signal composition can be successively
Scanned amplification.
In embodiments of the present invention, by controlling the running voltage of piezoelectric transducer and the scanning speed of laser wavelength,
So that the signal wavelength and laser wavelength of the selection of FP etalons carry out linear change with same speed, both protect all the time at difference
Hold as Brillouin shift.The signal wavelength that FP etalons is selected is exaggerated due to SBS effects all the time, and then
Arrive signal spectrum.By designing the structural parameters of optical fiber so that excited Brillouin frequency spectrum is single-peak structure.Because optical fiber is supported not
Same acoustic mode, therefore may contain multiple peaks in brillouin gain spectrum, and the corresponding signal in the multiple peaks of synchronization can be caused different
Wavelength components are chosen to amplify, it is impossible to accurately obtain signal spectrum.When brillouin gain spectrum is single-peak structure, it is ensured that per
One moment only one of which signal arrowband composition is chosen to amplify, and can measure very high resolution spectrum.By designing FP etalons
Parameter cause certain arrowband composition alignment SBS gain peaks, and the adjacent arrowband composition in left and right is not at-three dB bandwidth just
Interior.The former can cause measured signal arrowband composition to obtain the gain of maximum；In the latter, the adjacent arrowband composition in left and right is not little
It is to ensure that other arrowband composition gains are insufficient to interfere with the measurement of arrowband composition to be measured, no more than -3dB in-three dB bandwidth
Bandwidth is to obtain less Free Spectral Range (free spectral range, FSR), and then obtains higher resolution
Rate.
Fig. 3 is the structural representation of the measuring system constructed by a preferred embodiment of the invention.The measuring system master
To include FP etalons 1, isolator 2, nonlinear optical fiber 3, Polarization Controller 4, circulator 5, detector 6, data acquisition module
7th, piezoelectric transducer 8, image intensifer 9, tunable laser 10, waveform generator 11, control module 12.
Specifically, the output port of the FP etalons 1 is connected with the input port of the isolator 2, the isolator 2
Output port be connected with the first port of the nonlinear optical fiber 3, the second port of the nonlinear optical fiber 3 and the polarization
The first port of controller 4 is connected, and the second port of the Polarization Controller 4 is connected with the second port of the circulator 5；Can
First output port of tuned laser 10 is connected with the input port of image intensifer 9, the output port of image intensifer 9 with annular
The first port of device 5 is connected, and the 3rd port of circulator 5 is connected with the input port of detector 6, the output port of detector 6
It is connected with the first input port of data acquisition module 7；Second output port of tunable laser 10 and data acquisition module 7
The second input port be connected；First output port of the control module 12 and the input port of the tunable laser 10
It is connected, the input/output port of the control module 12 is connected with the I/O mouth of the data acquisition module 7, the control
Second output port of molding block 12 is connected with the input port of the waveform generator 11, the output of the waveform generator 11
Port is connected with the input port of the piezoelectric transducer 8, the output port of the piezoelectric transducer 8 and the FP etalons 1
The second input port be connected.By designing the parameter of the FP etalons 1 and the tunable laser 10 so as to be measured
Certain arrowband of signal composition alignment SBS gain peaks, and the adjacent arrowband composition in left and right be not at just-three dB bandwidth in.
The process that measured signal spectrum is measured using apparatus of the present invention is as follows：Measured signal passes through 1 turn of the FP etalons
Change discrete arrowband composition into, the first port for the nonlinear optical fiber 3 being injected by isolator 2, used as the signal of SBS effects
Light；The one-wavelength laser that tunable laser 10 sends injects institute through the image intensifer 9, circulator 5 and Polarization Controller 4
The second port of nonlinear optical fiber 3 is stated, as the pump light of SBS effects；Flashlight and pump light occur in nonlinear optical fiber 3
After SBS effects, the backscatter signal of generation is exported from the 3rd port of the circulator 5, is entered the detector 6 and is changed
Into electric current, 7 pairs of surveyed electric currents of data acquisition module are acquired process；One chamber of piezoelectric transducer 8 and the FP etalons 1
Mirror is connected, long for changing FP chambeies, and waveform generator 11 provides the running voltage of piezoelectric transducer, provides sawtooth waveforms electricity here
Pressure；Control module 12 sends the work shape of signal control tunable laser 10, waveform generator 11 and data acquisition module 7
State so that measured signal wavelength components are scanned measurement successively, process can obtain spectrum.
It should be noted that the explanation made for the present invention of embodiment shown in Fig. 3 is descriptively rather than determinate.
For example in Fig. 3, the FP interferometers of FP etalons 1, piezoelectric transducer 8 and waveform generator 11 composition can be with equivalence replacement into tool
There are other wave filter of identical function；Image intensifer 9 in Fig. 3 can be saved, it is also possible to be substituted for optical attenuator or light is put
Big device and the combination of optical attenuator.Because the image intensifer 9 be for make the tunable laser 10 produce laser with
Suitable power is injected in the nonlinear optical fiber 4, to reach the power threshold condition of pumping SBS effects, it is possible to spirit
Combination living；And a Polarization Controller can be connect after the isolator 2, flashlight and the polarization state of pump light is preferably reached
To unanimously.
Below the embodiment of the present invention is provided to the possibility value of some parameters.The choosing of nonlinear optical fiber nonlinear factor used
As long as take meeting SBS effects, such as desirable 10W-1km-1；The SBS gain spectrals of nonlinear optical fiber used-three dB bandwidth is
10MHz～20MHz；FP interferometers transmission peaks-three dB bandwidth used is 1MHz, and Free Spectral Range is 10MHz.
By measuring system described in the embodiment of the present invention, the resolution of spectral measurement can be improved, and with very big
Measurement range.Due to carrying out spectral measurement using FP interferometers with reference to SBS effects, the resolution of the resolution of device by FP interferometers
Rate decision, can make system obtain very high resolution by the parameter of setting FP interferometers；On the other hand, FP interferometer works
Voltage adopts sawtooth waveforms, and the length scanning speed for arranging which with tunable laser matches, using SBS gain peaks to FP standards
The transmission peaks of tool work are selected successively so that measurement range is no longer limited to a FSR, are interfered than existing FP so as to obtain
The bigger measurement range of instrument.
Fig. 4 is the time diagram of the measuring system constructed by a preferred embodiment of the invention.It is control module first
Trigger (1) is sent to waveform generator and laser instrument simultaneously, is issued a signal to both from control module and is connected to signal and opens
This section of time delay of beginning work can be remained identical by the setting of cable length etc..As the displacement in FP chambeies is with being applied to FP marks
The accurate voltage for having the piezoelectric transducer (PZT) in one of hysteroscope is directly proportional, and the amount of movement of transmission peak value wavelength is with FP chambeies
Displacement be directly proportional, then the amount of movement of transmission peak value wavelength is directly proportional with the voltage that is applied on PZT.Work by PZT
Voltage is set to sawtooth waveforms, from V0Start to change, a cycle of change in voltage, each peak wavelengths of FP etalon transmissions according to
Secondary scanning is at the corresponding wavelength of next peak value；The second period of change in voltage, and from V0Start, FP etalon transmissions
Peak wavelength again from original wavelength scanning at the corresponding wavelength of next peak value；The change of voltage cycle ground, FP are marked
The peak wavelength of quasi- tool transmission cyclically sweeps to next peak from a peak.Although for the sawtooth voltage in each cycle, FP
The scope that the peak wavelength of etalon each transmission is scanned is a Free Spectral Range (FSR), but due to sawtooth waveforms
Voltage often increases a cycle, and the FP etalon transmissions peak for participating in effectively filtering changes successively backward, so interfering equivalent to FP
The signal wavelength that instrument is selected is from λ0Start always on property increase.Laser instrument is from wavelength X0' start linear scanning, wherein λ0And λ0′
Difference be Brillouin shift, can pass through control PZT running voltage and laser wavelength scanning speed so that FP standards
The signal wavelength and laser wavelength for having selection carries out linear change with same speed, and both remain Brillouin at difference
Frequency displacement.So, the different wave length composition of signal will be selected by FP etalons successively, and the laser sent with laser instrument occurs SBS
Effect, is exaggerated strongly, and enters detection system below.Laser instrument can send a trigger while starting to scan
(2), pass to data acquisition module, ensure subsequent data process in signal wavelength and corresponding data correspond to, and then exactly
Measure signal spectrum.Due to transmission peak wavelengthLength scanning speed is relevant with level time m, i.e., different peaks are to signal scanning
Speed different, and laser scans wavelength is linear change, and therefore when sweep limitss are larger, FP transmission peaks increase with SBS
Beneficial spectral peak occurs deviation, gradually misalignment.It is thus desirable to calibration once, is adjusted automatically if often scanning a segment limit (such as 5GHz)
The voltage of piezoelectric ceramics makes FP transmission peaks and current SBS gain peaks alignment.
The existing spectral measurement device based on FP interferometers obtain 1MH very high resolutions on the premise of, measurement range
It is only 10MHz～1GHz；And under equal definition case, apparatus of the present invention measurement range can expand in theory ten times greater with
On.
Based on described above, very high resolution spectral measurement device and method that the present invention is provided can improve spectral measurement
Resolution while obtain bigger than the existing FP interferometers measurement range.
As it will be easily appreciated by one skilled in the art that the foregoing is only presently preferred embodiments of the present invention, not in order to
The present invention, all any modification, equivalent and improvement that is made within the spirit and principles in the present invention etc. is limited, all should be included
Within protection scope of the present invention.
Claims (9)
1. a kind of very high resolution spectral measurement device, it is characterised in that including FP interferometers, SBS wave filter, detector, number
According to acquisition module and control module；
The first input end of the FP interferometers is used for connecting measured signal, and the second input of the FP interferometers is connected to institute
State the first outfan of control module；The FP interferometers are used for for measured signal being converted to discrete arrowband composition；
The first input end of the SBS wave filter is connected to the outfan of the FP interferometers, and the second of the SBS wave filter is defeated
Enter the second outfan that end is connected to the control module；The SBS wave filter is used for selecting to amplify one of arrowband composition
And produce backscatter signal；
The input of the detector is connected to the first outfan of the SBS wave filter, and the first of the data acquisition module
Input is connected to the outfan of the detector, and the second input of the data acquisition module is connected to the SBS filtering
Second outfan of device；The backscatter signal is converted to current signal after the detector, the data acquisition module
For gathering the current signal；
The input/output terminal of the control module is connected to the I/O of the data acquisition module；The control module is used
The FP interferometers and SBS filter synchronizations scanning are controlled in signal is sent, SBS gain peaks are to the FP interferometer works
Transmission peaks selected successively so that measurement range is no longer limited to a Free Spectral Range, so as to obtain than existing FP
The bigger measurement range of interferometer.
2. very high resolution spectral measurement device as claimed in claim 1, it is characterised in that the FP interferometers include that FP is marked
Quasi- tool (1), piezoelectric transducer (8) and waveform generator (11)；
First input end of the first input end of FP etalons (1) as the FP interferometers, FP etalons (1)
Outfan of the outfan as the FP interferometers, the input of waveform generator (11) is used as the of the FP interferometers
Two inputs；
The input of piezoelectric transducer (8) is connected to the outfan of the waveform generator (11), FP etalons (1)
The second input be connected to the outfan of the piezoelectric transducer (8)；Long by piezoelectric transducer change FP chambeies, and then change
The signal wavelength of transmission, the scanning in conjunction with SBS gain peaks are selected to FP transmission peaks, are obtained bigger than existing FP interferometers
Measurement range.
3. very high resolution spectral measurement device as claimed in claim 2, it is characterised in that the SBS wave filter include every
From device (2), nonlinear optical fiber (3), Polarization Controller (4), circulator (5), image intensifer (9) and tunable laser (10)；
The input of isolator (2) is connected to FP etalons (1) as the first input end of the SBS wave filter
Outfan, the first end of nonlinear optical fiber (3) are connected with the outfan of the isolator (2), Polarization Controller (4)
First end be connected with the second end of the nonlinear optical fiber (3), second end of circulator (5) and the Polarization Controller
(4) the second end is connected；
The input of first outfan of the 3rd end of circulator (5) as the SBS wave filter and the detector (6)
Be connected；
The outfan of image intensifer (9) is connected with the first end of the circulator (5)；Tunable laser (10)
First outfan is connected with the input of the image intensifer (9), the second outfan conduct of tunable laser (10)
Second outfan of the SBS wave filter is connected with the second input of the data acquisition module (7)；
Second input and the control module of the input of tunable laser (10) as the SBS wave filter
(12) the first outfan is connected.
4. very high resolution spectral measurement device as claimed in claim 3, it is characterised in that during work, described by adjustment
FP etalons (1) and the parameter of the tunable laser (10) so that composition alignment SBS gains of certain arrowband of measured signal
Peak value, and the adjacent arrowband composition in left and right be not at just-three dB bandwidth in.
5. very high resolution spectral measurement device as claimed in claim 2, it is characterised in that piezoelectric transducer (8)
Running voltage is sawtooth waveforms.
6. very high resolution spectral measurement device as claimed in claim 5, it is characterised in that voltage often changes a cycle,
The peak wavelength of the FP etalon transmissions will be scanned at the corresponding wavelength of next peak value successively, the work of FP etalons
Transmission peaks Backwards selection successively so that measurement range is not limited to a Free Spectral Range, obtains than existing FP interferometers more
Big measurement range.
7. a kind of very high resolution spectral measurement method of the very high resolution spectral measurement device based on described in claim 1,
Characterized in that, comprising the steps：
(1) measured signal is converted to by discrete arrowband composition using optical filter；
(2) one of arrowband composition is amplified using SBS wave filter；
(3) the arrowband composition conversion after adopting detector by amplification is for electric current；
(4) control module control optical filter and SBS filter gains peak are scanned to signal wavelength；
(5) data acquisition module is acquired process to electric current and obtains signal spectrum.
8. very high resolution spectral measurement method as claimed in claim 7, it is characterised in that FP etalon transmissions peak and described
SBS wave filter is equal to length scanning speed.
9. very high resolution spectral measurement method as claimed in claim 7, it is characterised in that combine SBS using FP interferometers
Effect, measurement signal spectrum obtain the measurement range bigger than existing FP interferometers while obtaining very high resolution.
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| CN201510107118.9A CN104697634B (en) | 2015-03-11 | 2015-03-11 | A kind of very high resolution spectral measurement device and method |
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