CN103763022B - A kind of High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep - Google Patents

A kind of High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep Download PDF

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CN103763022B
CN103763022B CN201310662574.0A CN201310662574A CN103763022B CN 103763022 B CN103763022 B CN 103763022B CN 201310662574 A CN201310662574 A CN 201310662574A CN 103763022 B CN103763022 B CN 103763022B
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optical
frequency
modulation
sideband
frequency sweep
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CN103763022A (en
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杜江兵
何祖源
樊昕昱
刘庆文
谢峰
马麟
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Wuxi Allianstream Photon Technology Co ltd
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Nanjing Guiyuan Optoelectronic Technology Co Ltd
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Abstract

The invention discloses a kind of High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep.This system includes that swept light source part, optical system for testing part, receiver and signal processing, described swept light source part use narrow linewidth laser to produce the sideband optical signal of frequency sweep as original light source, emergent light through external modulation.During described external modulation, frequency sweep radiofrequency signal is amplified by high power RF amplifier, it is loaded into the electrooptic modulator that half-wave voltage is relatively low with high voltage, produce multistage sideband, high-order sideband is imported light path system as frequency sweep carrier wave light source by the optical sideband being filtered the broadband frequency sweep obtaining high-order by narrow band optical filter, gather backscattering and the optical signal of reflection, by local relevant detection and signal processing, it is achieved probe beam deflation analysis.Utilize high-order sideband frequency sweep can expand swept frequency range so that optical frequency domain reflectometer reaches higher spatial resolution.

Description

A kind of high spatial resolution optical frequency domain reflectometer based on the modulation of high-order sideband frequency sweep System
Technical field
The present invention relates to the technical fields such as Electro-optical Modulation, distributing optical fiber sensing, optical reflectometer, particularly relate to one High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep.
Background technology
Transmission frequency bandwidth that fiber optic communication has due to it, the characteristics such as little is lost, has developed fast since 20 century 70s Suddenly, the extensive Commercial fibers communication system construction that China was carried out in the initial stage nineties.Optical fiber sensing technology is to lead to optical fiber The development of letter technology and develop rapidly, with light wave as carrier, optical fiber is medium, perception and the extraneous measured signal of transmission New Sensing Technology.Light wave as measured signal carrier and the optical fiber as light wave propagation medium, have a series of solely Special, other carriers are difficult to the advantage compared with medium.Light wave is not afraid of electromagnetic interference, is easily that various light-detecting device receives, can Carrying out photoelectricity or electro-optic conversion easily, easily modern electronics and computer with high development match.Fiber size is little, Lightweight, it is simple to lay and transport, material source enriches, radiationless, it is difficult to eavesdropping.Message capacity is big, long transmission distance;One The potential bandwidth of optical fiber is up to 20THz.
Optical fiber telecommunications system has become the Optical Cable trans mission networks carrying huge information capacity at present.Unobstructed for ensureing safety, need There is the instrument that can accurately measure optical fiber transmission property.Optical reflectometer is the heaviest of optical fiber link status monitoring and maintenance The means wanted.Currently used more be optical time domain reflectometer (Optical Time Domain Reflectometer, OTDR).OTDR is the propagation characteristic utilizing back-scattering light to measure optical fiber.Light source sends light beam pulse and injects optical fiber, meeting There is back scattering in a fiber.Some parameter in testing fiber can be modulated on pulsed light in scattering process, therefore profit With OTDR technique, system just can carry out the distribution of detection fiber parameter by measuring back scattering light intensity relation over time Situation, so that it is determined that the parameter distribution information of the length of optical fiber and everywhere.OTDR is the time by analyzing rear orientation light Difference and optical path difference detect.The raising of its spatial resolution needs shorten light source pulse width and increase receiver bandwidth, And the pulse width shortening light source means the reduction of signal energy, and system noise is proportional to receiver bandwidth, therefore increases Big receiver bandwidth means the reduction of Dynamic Range and signal to noise ratio, thus the resolution of OTDR system and signal to noise ratio, dynamic State scope, measurement also exist contradiction between the time, and its spatial resolution often can only achieve the magnitude of rice.In order to solve this Problem, other time domain reflection method is also in constantly research.Coherent detection, complementary Gray code such as pseudorandom detectable signal Detection etc..
In order to improve the performance such as spatial resolution and sensitivity of measurement, backscattering method is applied to light frequency domain, develops Optical frequency domain reflectometer OFDR (Optical Frequency Domain Reflectometer).The high spatial of OFDR system divides Resolution by make its be more widely used in numerous certainty of measurement is had high request field [Opt. Express 19, 19790-19796 (2011)].By swept RF signal, narrow-linewidth laser is carried out single sideband modulation, obtain the light of linear frequency sweep Signal, for corresponding OFDR system, has been realized in the wireline inspection [J. of distance and high spatial resolution Lightwave Technol. 6, 3287-3294 (2008)].But, modulated process that single sideband modulation is complicated and poor Stability limits respective performances.On the other hand, the swept frequency range of radio frequency swept-frequency signal is limited to electronic component, typically only has GHz magnitude [J. Lightwave Technol. 30,1015-1024 (2012)].And high spatial resolution to be obtained OFDR, improves the approach that swept frequency range becomes inevitable.Therefore, it is necessary to develop novel broadband swept light source technology, for real Existing high spatial resolution OFDR.
Summary of the invention
Present invention aim in OFDR system, in order to overcome, use light source internal modulation is issuable non-linear sweeps The problems such as frequency, it is possible to use source outer modulation realizes frequency sweep, currently used more be utilize that single sideband modulation obtains the Single order sideband carries out frequency sweep.Being limited by the electronic bottleneck of electronic component, radiofrequency signal range of scanned frequencies is limited, sweeps to expand Frequently scope thus improve spatial resolution, the present invention utilize high voltage modulation low half-wave voltage electrooptic modulator produce multistage limit The principle of band, it is provided that a kind of High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep.
The present invention for achieving the above object, adopts the following technical scheme that
A kind of High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep, including swept light source portion Point, optical system for testing part, receiver and signal processing;It is characterized in that: described swept light source part includes laser instrument, low Half-wave voltage electrooptic modulator, radio-frequency signal generator, circulator, Fiber Bragg Grating FBG, erbium-doped fiber amplifier and light filter Ripple device;Radiofrequency signal that the narrow-linewidth laser that described laser instrument sends sends according to radio-frequency signal generator also loads bias voltage After be connected to described electrooptic modulator and be modulated, form a broadband light comb;The light obtained comb importing is connected to optical fiber cloth The circulator of glug grating, the light wave reflected injects tunable optical filter after erbium-doped fiber amplifier amplifies;Will filter The high-order frequency sweep sideband gone out imports optical system for testing part, interferes with local light and is finally received by receiver, and at signal Reason part processes.
It is further characterized by described low half-wave voltage electrooptic modulator is that Mach increases Dare type electrooptic modulator or phase Bit-type electrooptic modulator, the half-wave voltage of electrooptic modulator is not more than 4 volts, the driving merit of the radiofrequency signal of radio-frequency signal generator Rate is not less than 27dBm.
Described optical filter is narrow band filter based on Fiber Bragg Grating FBG or the optical filter of diffraction grating.
Described Fiber Bragg Grating FBG reflectance is more than 99%, and it is shaped as Flat-top type, and its extinction ratio is not less than 40dB。
Above-mentioned swept light source equivalence sweep limits is Δ F, the radiofrequency signal that the radio-frequency signal generator of employing produces Lowest modulation frequency be flow, the radiofrequency signal rate of scanning speed of employing is γ, and the radiofrequency signal frequency sweep time of employing is τ, Centre wavelength and the bandwidth of the optical filter used are adjustable;Spatial resolution theoretical boundary is determined by Δ l=c/2n Δ F, radio frequency Signal swept frequency range Δ fRF=γ τ, the swept frequency range of the N rank sideband modulated is Δ fN=N γ τ, Δ fN< flow
The technique effect of the present invention:
1. use the electrooptic modulator of low half-wave voltage, the light frequency of many sidebands can be produced when using high voltage modulation Comb, for the optical sideband of high-order, can obtain the light swept frequency range that double amplitude is amplified.
2. use Fiber Bragg Grating FBG and tunable optical filter, certain high-order can be leached from the optical frequency comb modulated Sideband also suppresses other sidebands and noise simultaneously.
3. use high-order sideband frequency sweep light to replace the first general rank sideband frequency sweep light anti-as the light frequency domain of swept light source Penetrate meter systems and can obtain the spatial resolution that double amplitude improves.
Accompanying drawing explanation
Fig. 1 is the basic structure schematic diagram of present system;
Figure comprises: Optical frequency: optical fiber frequency;Time: the time;FL: optical fiber laser;PC: polarization control Device processed;MZ-modulator: Mach zehnder modulators;RF synthesizer: radio-frequency signal generator;Trigger Source: trigger signal;CIR: circulator;FBG: Fiber Bragg Grating FBG;Bias: bias voltage;EDFA: Erbium-doped fiber amplifier Device;BPF: optical filter;FUT: testing fiber;BPD: balance photodetector;Polarization diversity: polarization point Collection;OC:3dB photo-coupler;ADC: analog-to-digital conversion module;Computer: computer.
Fig. 2 be the present invention utilize half-wave voltage relatively low MZ Mach-Zehnder modulation obtain there is multistage sideband Optical frequency comb schematic diagram;
Power in figure: signal intensity;Optical Comb: light is combed;Wavelength: wavelength.
Fig. 3 is that the present invention uses Fiber Bragg Grating FBG and tunable optical filter to leach from the optical frequency comb modulated The tenth rank sideband spectrum schematic diagram;
Power in figure: signal intensity;Carrier: carrier wave;+ 10th order the sideband: the ten rank sideband; Wavelength: wavelength.
Fig. 4 is spatial resolution experiment value measuring method schematic diagram of the present invention;
Reflectivity in figure: reflection coefficient;Distance: distance;FWHM: Fresnel reflection peak width.
Detailed description of the invention
Embodiment one:
Fig. 1 shows the basic schematic diagram of the system structure described in the present embodiment.Laser instrument FL is through Polarization Controller PC is connected to the MZ Mach-Zehnder MZ-modulator that half-wave voltage is relatively low, according to radio-frequency signal generator RF The radiofrequency signal of synthesizer is modulated, and just can produce multistage sideband when added bias voltage Bias is higher, is formed One broadband light comb.The light obtained comb is imported the circulator CIR being connected to optical fiber bragg grating FBG, the light reflected Ripple injects tunable optical filter BPF after erbium-doped optical fiber amplifier EDFA amplifies.By designed and Prague light of coupling Fine grating FBG and tunable filter BPF, can leach required sideband under higher rejection ratio.The high-order frequency sweep that will leach Sideband imports light path system, uses single-mode fiber as testing fiber, and from testing fiber FUT, the light of reflection occurs with local light Interfere and finally detected by 8 analog-to-digital conversion module 8-bit ADC coupled computer Computer.
Fig. 2 show the present embodiment utilize half-wave voltage relatively low MZ Mach-Zehnder modulation obtain have many The optical frequency comb schematic diagram of rank sideband.In figure the highest for carrier wave, have more than 20 subcarriers seen from this optical frequency comb, expression can To leach at least the tenth rank sideband.
Fig. 3 shows that the present embodiment uses Fiber Bragg Grating FBG and tunable optical filter from the optical frequency comb modulated In the tenth rank sideband spectrum schematic diagram that leaches.Tenth rank sideband exceeds other rank more than sideband 20dB.
Fig. 4 shows the spatial resolution experiment value measuring method schematic diagram of the present embodiment.Shown method is to measure to treat Surveying the full width at half maximum of fiber end reflections Fresnel peak value, the biggest width represents the lowest spatial resolution.It is illustrated as penetrating Using the tenth rank sideband to carry out the Fresnel reflecting peak that frequency sweep obtains during the swept frequency range 800MHz of signal equivalence frequently, the half of peak value is high Overall with is as this spatial resolution experiment value, for 1.5cm.

Claims (5)

1. a High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep, including swept light source portion Point, optical system for testing part, receiver and signal processing;It is characterized in that: described swept light source part includes laser instrument, low Half-wave voltage electrooptic modulator, radio-frequency signal generator, circulator, Fiber Bragg Grating FBG, erbium-doped fiber amplifier and light filter Ripple device;Radiofrequency signal that the narrow-linewidth laser that described laser instrument sends sends according to radio-frequency signal generator also loads bias voltage After be connected to described low half-wave voltage electrooptic modulator and be modulated, form a broadband light comb;The light comb obtained is imported even Having connect the circulator of Fiber Bragg Grating FBG, the light wave reflected injects tunable optical filter after erbium-doped fiber amplifier amplifies Ripple device;The high-order frequency sweep sideband leached is imported optical system for testing part, interferes with local light and finally received by receiver, With signal processing part divisional processing.
High-spatial-resolutoptical optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep the most according to claim 1, It is characterized in that: described low half-wave voltage electrooptic modulator is that Mach increases Dare type electrooptic modulator or phase type Electro-optical Modulation Device, the half-wave voltage of electrooptic modulator is not more than 4 volts, and the driving power of the radiofrequency signal of radio-frequency signal generator is not less than 27dBm。
High spatial resolution optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep the most according to claim 1 and 2 System, it is characterised in that: described optical filter is the light filtering of narrow band filter based on Fiber Bragg Grating FBG or diffraction grating Device.
High spatial resolution optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep the most according to claim 1 and 2 System, it is characterised in that: described Fiber Bragg Grating FBG reflectance is more than 99%, and it is shaped as Flat-top type, and its extinction ratio is the least In 40dB.
High spatial resolution optical frequency domain reflectometer system based on the modulation of high-order sideband frequency sweep the most according to claim 1 and 2 System, it is characterised in that: described swept light source equivalence sweep limits is Δ F, and what the radio-frequency signal generator of employing produced penetrates Frequently the lowest modulation frequency of signal is flow, the radiofrequency signal rate of scanning speed of employing is γ, during the radiofrequency signal frequency sweep of employing Between be τ, centre wavelength and the bandwidth of the optical filter of employing are adjustable;Spatial resolution theoretical boundary is by Δ l=c/2n Δ F certainly Fixed, radiofrequency signal swept frequency range Δ fRF=γ τ, the swept frequency range of the N rank sideband modulated is Δ fN=N γ τ, Δ fN< flow
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CN104897376B (en) * 2015-06-19 2018-01-05 湖北航天技术研究院总体设计所 A kind of laser linewidth measuring method and system
CN105490738B (en) * 2016-01-05 2017-10-03 上海交通大学 Probe beam deflation method and system based on frequency synthesis
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CN108507981B (en) * 2018-04-11 2020-09-22 南京大学 Silicon-based waveguide back reflection sensing device based on OFDR (optical frequency domain reflectometry) and measuring method thereof
CN111238550B (en) * 2020-01-17 2021-08-17 浙江大学 Optical frequency domain reflectometer system with digital modulation type frequency sweep
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