CN102419653A - Method for positioning single-layer indium tin oxide (ITO) - Google Patents
Method for positioning single-layer indium tin oxide (ITO) Download PDFInfo
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- CN102419653A CN102419653A CN2011102924424A CN201110292442A CN102419653A CN 102419653 A CN102419653 A CN 102419653A CN 2011102924424 A CN2011102924424 A CN 2011102924424A CN 201110292442 A CN201110292442 A CN 201110292442A CN 102419653 A CN102419653 A CN 102419653A
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Abstract
The invention relates to a method for positioning single-layer indium tin oxide (ITO). The single-layer ITO consists of a plurality of electrode blocks, and a plurality of longitudinal rows and longitudinal lines are formed. The method comprises the following steps of: scanning the single-layer ITO and acquiring the induction values of each electrode block in two directions; finding out the electrode blocks of which the induction values in the two directions are greater than a preset threshold value; and determining the position of a touch point according to the electrode blocks with the largest induction values among the adjacent electrode blocks in the same direction. The positioning method has the advantages that: a manufacturing process is simple, cost is low, a touch screen consisting of the single-layer ITO is thin, and mutual matching performance in function is high.
Description
Technical field
the present invention relates to the localization method of ITO, refer in particular to the localization method of individual layer ITO.
Background technology
so-called ITO (indium tin oxide) is a kind of critical material that is used to produce LCD, and at present, it has all had in fields such as instrument and meter, computing machine, electronic watch, game machine and household electrical appliance very widely uses.The capacitive touch screen of big heat also is to utilize ITO to accomplish the action that detecting touches on the market in recent years; And the wiring of ITO generally is double-deck on the capacitance touch screen; Its cardinal principle is: utilize people's bulk electric field; When the user touched, the mutual capacitance (also claiming coupling capacitance) of the infall sensing unit of surface row or row can change, and finally can detect the particular location of touch point according to above-mentioned variation.
The structure of the double-deck ITO that
are common is a diamond structure; Its double-deck ITO is laid in respectively on the ipsilateral of glass substrate; For fear of the mutual conduction between the electrode; So bridge contact need be set on glass substrate, so just can double-deck ITO be laid on the same side of glass substrate.Though said method has been realized the action that detecting touches, the touch screen structure of the double-deck ITO of this employing, not only complex process, and bridge joint place damages easily, and the product yield is low, causes cost to raise.In order to overcome above-mentioned shortcoming, part manufacturer is arranged to rectangle with the structure of ITO, two-sidedly then is arranged on the two-layer of glass substrate; So, really simple much of technology, and improved the product yield; But what still adopt is the wire structures of double-deck ITO; The cost of ITO own is just higher, adds structure of two layers, and the thickness that forms touch-screen has thus also just been increased.If can overcome the limitation that double-deck ITO layouts brings, so no matter be to consider that from the cost or the structure of touch-screen individual layer ITO all has more advantages.
How
are so just to seem particularly important for industry provides a kind of method of detecting individual layer ITO touch points position.
Summary of the invention
The actual technical matters to be solved of
the present invention is how to provide a kind of technology simple, the localization method of individual layer ITO with low cost.
are in order to realize above-mentioned purpose of the present invention; The invention provides the localization method of a kind of individual layer ITO; Said individual layer ITO is made up of some electrode blocks; Form some stringers and file, its step is following: scan said individual layer ITO, obtain each electrode block influence value on both direction respectively; Find out influence value on the both direction all greater than the electrode block of preset threshold value; Judge the position of touch points according to all maximum electrode block of influence value in the adjacent electrode piece on same direction.
The localization method of
individual layer ITO of the present invention, not only manufacturing process is simple, and is with low cost, and by the touch-screen thinner thickness that individual layer ITO forms, matching performance is good each other on the function.
Description of drawings
Fig. 1 is first kind of embodiment according to individual layer ITO wiring according to the invention.
Fig. 2 is the process flow diagram according to localization method according to the invention.
Embodiment
are further described the present invention below in conjunction with accompanying drawing and embodiment.
please refer to shown in Figure 1, and ITO layer 1 of the present invention is made up of several touch-control electrode blocks 10, forms some stringers and file, and promptly each stringer or file are formed by a plurality of touch-control electrode blocks 10; Each touch-control electrode block 10 is all rectangular, and square all is arranged in the position of calculating touch points for ease, and all electrode blocks 10 all are wired on the respective pins of touch-control chip 11.
When
said ITO layer 1 scanned, scanning stringer earlier continued the scanning file then.During each scanning, scan two adjacent successively electrode blocks 10 simultaneously, thereby obtain the influence value of each electrode block 10.If said individual layer ITO has the capable N row of M; When scanning for the first time; If first electrode block of first row is set to the scanning end; Then in first row successively second adjacent electrode block of order be set to reference edge, this moment, other electrode block 10 all unsettled or ground connection was obtained the influence value of first first electrode block of row; When scanning for the second time, second electrode block of first row is set to the scanning end, and the 3rd adjacent successively electrode block is set to reference edge in first row, obtains the influence value of second electrode block of first row; Scanning is obtained till the influence value of N-1 electrode block of first row successively.Follow-up continuation sequential scanning is capable until having scanned M, and obtains the induction amount of electrode block in each row, and uses the induction amount of obtaining electrode block in each row with quadrat method scan N row, finally obtains the influence value of each electrode block on both direction.
because during according to the scanning of above-mentioned scan method, and the electrode block 10 in the capable and N row of M just can not be scanned, so can not judge its concrete influence value.In order to overcome above-mentioned defective; We are when calculating outermost electrode block; Electrode blocks 10 capable for M and the N row can be with reference to the dummy electrodes piece of its setting; And the dummy electrodes piece does not participate in calculating, and just plays reference to calculating M column electrode piece and N column electrode piece, just can calculate the induction amount of the capable and electrode block 10 that N is listed as of the M of edge since so.
are when touch object such as finger touches electrode block 10, because the electrode block induction amount at finger touches place can increase suddenly, so just can judge the particular location of finger through the variation of detecting all electrode block 10 induction amounts.Please refer to shown in Figure 2ly, concrete grammar is following: at first, scan said individual layer ITO, obtain the influence value of each electrode block 10; Secondly; Find out above-mentioned influence value all greater than the electrode block 10 of preset threshold value; Wherein the preset threshold value is an empirical value; Also be fixed numbers, because each electrode block all has an influence value on both direction, so need find out on both direction influence value all greater than the electrode block of preset threshold value; At last, be exactly the position of touch points according to all maximum electrode block of influence value in the adjacent electrode piece 10 on the same direction.
are because in individual layer ITO; If finger has touching, can occur the electrode block that several influence values surpass the preset threshold value so, but the particular location of touch points can't judge; Therefore; After determining the electrode block 10 of above-mentioned all influence values, need to continue to judge the maximum electrode block of influence value in above-mentioned all electrode blocks 10 that the maximum electrode block of influence value is exactly the location point of finger practical touch so greater than the preset threshold value.
the above-mentioned position that can judge its touch points during not only to single finger touches ITO layer; For multi-point touch; Also can use said method to detect the position of each touch points; It still is to detect the electrode block 10 of all influence values greater than the preset threshold value, finds out the maximum electrode block of influence value in each adjacent electrode piece then, thereby finds out the position of each touch points.
are because in the present invention; Each electrode block 10 all has the scanning end, and is connected on the respective pins of touch-control chip 11, and when scanning; All electrode blocks 10 all are configured to absolute version; Therefore, just can determine the particular location of touch object according to each electrode block 10, and just can confirm the particular location coordinate after touch object is touched according to the variation of influence value.
individual layer ITO of the present invention goes up the localization method of detecting touch points, and not only technology is simple, with low cost, and can judge the particular location of touch points fast and effectively.Moreover the present invention not only can judge the position coordinates that singly refers to touch points, also can judge the position coordinates that refers to touch points more.
Claims (8)
1. the localization method of an individual layer ITO, said individual layer ITO is made up of some electrode blocks, forms some stringers and file, and its step is following:
Scan said individual layer ITO, obtain each electrode block influence value on both direction respectively;
Find out influence value on the both direction all greater than the electrode block of preset threshold value;
Judge the position of touch points according to all maximum electrode block of influence value in the adjacent electrode piece on same direction.
2. localization method as claimed in claim 1 is characterized in that: said touch-control electrode block all is wired on the respective pins of chip.
3. localization method as claimed in claim 1 is characterized in that: said touch-control electrode block is rectangular or square shaped.
4. localization method as claimed in claim 1 is characterized in that: during said scanning individual layer ITO, can scan an electrode block on the direction earlier, and then continue the electrode block on another direction of scanning.
5. like claim 1 or 4 described localization methods, it is characterized in that: during said scanning individual layer ITO, order scans two two adjacent electrode blocks simultaneously one by one.
6. localization method as claimed in claim 5 is characterized in that: if wherein said any electrode block is held as scanning, then another adjacent electrode block of order is held as a reference successively.
7. localization method as claimed in claim 1 is characterized in that: said preset threshold value is a fixed value.
8. localization method as claimed in claim 1 is characterized in that: the position of said touch points be exactly said on same direction all maximum electrode block of influence value in the adjacent electrode piece.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011102924424A CN102419653A (en) | 2011-09-30 | 2011-09-30 | Method for positioning single-layer indium tin oxide (ITO) |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2011102924424A CN102419653A (en) | 2011-09-30 | 2011-09-30 | Method for positioning single-layer indium tin oxide (ITO) |
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| CN102419653A true CN102419653A (en) | 2012-04-18 |
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| CN2011102924424A Pending CN102419653A (en) | 2011-09-30 | 2011-09-30 | Method for positioning single-layer indium tin oxide (ITO) |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101315590A (en) * | 2008-07-16 | 2008-12-03 | 友达光电股份有限公司 | Touch control panel device and circuit thereof |
| CN101561732A (en) * | 2008-04-18 | 2009-10-21 | 义隆电子股份有限公司 | Capacitive type touch pad for realizing two-dimensional application by using single layer sensor and positioning method thereof |
| US20100289769A1 (en) * | 2009-05-14 | 2010-11-18 | Optrex Corporation | Capacitive touch panel device |
| CN102073430A (en) * | 2011-01-24 | 2011-05-25 | 苏州瀚瑞微电子有限公司 | Method for capacitive screen to automatically adjust induction value |
-
2011
- 2011-09-30 CN CN2011102924424A patent/CN102419653A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101561732A (en) * | 2008-04-18 | 2009-10-21 | 义隆电子股份有限公司 | Capacitive type touch pad for realizing two-dimensional application by using single layer sensor and positioning method thereof |
| CN101315590A (en) * | 2008-07-16 | 2008-12-03 | 友达光电股份有限公司 | Touch control panel device and circuit thereof |
| US20100289769A1 (en) * | 2009-05-14 | 2010-11-18 | Optrex Corporation | Capacitive touch panel device |
| CN102073430A (en) * | 2011-01-24 | 2011-05-25 | 苏州瀚瑞微电子有限公司 | Method for capacitive screen to automatically adjust induction value |
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Application publication date: 20120418 |